Literatura científica selecionada sobre o tema "Electron microscope"
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Artigos de revistas sobre o assunto "Electron microscope"
Möller, Lars, Gudrun Holland e Michael Laue. "Diagnostic Electron Microscopy of Viruses With Low-voltage Electron Microscopes". Journal of Histochemistry & Cytochemistry 68, n.º 6 (21 de maio de 2020): 389–402. http://dx.doi.org/10.1369/0022155420929438.
Texto completo da fonteGauvin, Raynald, e Steve Yue. "The Observation of NBC Precipitates In Steels In The Nanometer Range Using A Field Emission Gun Scanning Electron Microscope". Microscopy and Microanalysis 3, S2 (agosto de 1997): 1243–44. http://dx.doi.org/10.1017/s1431927600013106.
Texto completo da fonteRoss, Frances M. "Materials Science in the Electron Microscope". MRS Bulletin 19, n.º 6 (junho de 1994): 17–21. http://dx.doi.org/10.1557/s0883769400036691.
Texto completo da fonteKordesch, Martin E. "Introduction to emission electron microscopy for the in situ study of surfaces". Proceedings, annual meeting, Electron Microscopy Society of America 51 (1 de agosto de 1993): 506–7. http://dx.doi.org/10.1017/s0424820100148368.
Texto completo da fonteO'Keefe, Michael A., John H. Turner, John A. Musante, Crispin J. D. Hetherington, A. G. Cullis, Bridget Carragher, Ron Jenkins et al. "Laboratory Design for High-Performance Electron Microscopy". Microscopy Today 12, n.º 3 (maio de 2004): 8–17. http://dx.doi.org/10.1017/s1551929500052093.
Texto completo da fonteKONNO, Mitsuru, Toshie YAGUCHI e Takahito HASHIMOTO. "Transmission Electron Microscop and Scanning Transmission Electron Microscope". Journal of the Japan Society of Colour Material 79, n.º 4 (2006): 147–51. http://dx.doi.org/10.4011/shikizai1937.79.147.
Texto completo da fonteWatson, John H. L. "In the beginning there were electrons". Proceedings, annual meeting, Electron Microscopy Society of America 50, n.º 2 (agosto de 1992): 1068–69. http://dx.doi.org/10.1017/s0424820100129978.
Texto completo da fonteAi, R. "A Microscope-Compatible Auger Electron Spectrometer". Proceedings, annual meeting, Electron Microscopy Society of America 49 (agosto de 1991): 992–93. http://dx.doi.org/10.1017/s0424820100089275.
Texto completo da fonteKersker, M., C. Nielsen, H. Otsuji, T. Miyokawa e S. Nakagawa. "The JSM-890 ultra high resolution Scanning Electron Microscope". Proceedings, annual meeting, Electron Microscopy Society of America 47 (6 de agosto de 1989): 88–89. http://dx.doi.org/10.1017/s0424820100152410.
Texto completo da fonteSchatten, G., J. Pawley e H. Ris. "Integrated microscopy resource for biomedical research at the university of wisconsin at madison". Proceedings, annual meeting, Electron Microscopy Society of America 45 (agosto de 1987): 594–97. http://dx.doi.org/10.1017/s0424820100127451.
Texto completo da fonteTeses / dissertações sobre o assunto "Electron microscope"
Morgan, Scott Warwick. "Gaseous secondary electron detection and cascade amplification in the environmental scanning electron microscope /". Electronic version, 2005. http://adt.lib.uts.edu.au/public/adt-NTSM20060511.115302/index.html.
Texto completo da fonteMartin, Geoffrey Clive. "Virtual Scanning Electron Microscope : a web-based teaching and training solution for the Scanning Electron Microscope". Thesis, University of Cambridge, 2008. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.611878.
Texto completo da fonteDuckett, Gordon Richard. "Electron microscope studies of organic pigments". Thesis, University of Glasgow, 1987. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.305588.
Texto completo da fonteSkoupý, Radim. "Quantitative Imaging in Scanning Electron Microscope". Doctoral thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2020. http://www.nusl.cz/ntk/nusl-432610.
Texto completo da fonteLöfgren, André. "Detection of electron vortex beams : Using a scanning transmission electron microscope". Thesis, Uppsala universitet, Materialteori, 2015. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-255330.
Texto completo da fonteElektronvirvelstrålar (EVS) är elektronstrålar med en munk-liknande intensitetsprofil. Dessa bär på rörelsemängdsmoment på grund av sin fasdistribution. När de används i ett elektronmikroskop förväntas de vara effektiva för detektering av magnetiska signaler. I denna uppsats har jag undersökt high angle annular dark field (HAADF) bilder som erhållits med hjälp av EVS. Detta gjordes för 300 K och 5K. För 5 K, jämförde jag även HAADF bilder från en vanlig elektronstråle med HAADF bilder från en elektronvirvelstråle. Vad jag fann var att EVS producerade en munkformad intensitetsfördelning runt atomerna. Men när hänsyn till storleken på elektronkällan togs i beaktande kunde inte detta fenomen observeras längre. När bilder från EVS jämfördes med bilder från vanliga elektronstrålar, fann jag att intensiteten av spridda elektroner runt atomkolumnerna var bredare för EVS. Detta kunde observeras även efter att jag tagit hänsyn till elektronkällans storlek.
Chen, Li. "Fabrication of electron sources for a miniature scanning electron microscope". Thesis, University of York, 1999. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.313904.
Texto completo da fonteJohnson, Lars. "Nanoindentation in situ a Transmission Electron Microscope". Thesis, Linköping University, Department of Physics, Chemistry and Biology, 2007. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-8333.
Texto completo da fonteThe technique of Nanoindentation in situ Transmission Electron Microscope has been implemented on a Philips CM20. Indentations have been performed on Si and Sapphire (α-Al2O3) cut from wafers; Cr/Sc multilayers and Ti3SiC2 thin films. Different sample geometries and preparation methods have been evaluated. Both conventional ion and Focused Ion Beam milling were used, with different ways of protecting the sample during milling. Observations were made of bending and fracture of samples, dislocation nucleation and dislocation movement. Basal slip was observed upon unloading in Sapphire. Dislocation movement constricted along the basal planes were observed in Ti3SiC2. Post indentation electron microscopy revealed kink formation in Ti3SiC2 and layer rotation and slip across layers in Cr/Sc multilayer stacks. Limitations of the technique are presented and discussed.
Lyster, Martin. "Electron microscope studies of cadmium mercury telluride". Thesis, University of Oxford, 1989. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.238271.
Texto completo da fonteDellith, Meike. "Electron microscope investigations of defects in DRAMs". Thesis, University of Oxford, 1993. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.334379.
Texto completo da fonteChristensen, K. N. "Electron microscope studies of oxygen implanted silicon". Thesis, University of Oxford, 1990. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.292615.
Texto completo da fonteLivros sobre o assunto "Electron microscope"
Thomas, Mulvey, e Sheppard C. J. R, eds. Advances inoptical and electron microscopy. London: Academic, 1990.
Encontre o texto completo da fonteChampness, P. E. Electron diffraction in the transmission electron microscope. Oxford: BIOS Scientific Publishers, 2001.
Encontre o texto completo da fonteHayat, M. A. Basic techniques for transmission electron microscopy. Orlando: Academic Press, 1985.
Encontre o texto completo da fonteReimer, Ludwig. Scanning electron microscopy: Physics of image formation and microanalysis. 2a ed. Berlin: Springer, 1998.
Encontre o texto completo da fonteJ, Goodhew Peter, ed. Thin foil preparation for electron microscopy. Amsterdam: Elsevier, 1985.
Encontre o texto completo da fonteTomb, Howard. Microaliens: Dazzling journeys with an electron microscope. New York: Farrar, Straus and Giroux, 1993.
Encontre o texto completo da fonteEgerton, Ray F. Electron Energy-Loss Spectroscopy in the Electron Microscope. Boston, MA: Springer US, 1995. http://dx.doi.org/10.1007/978-1-4615-6887-2.
Texto completo da fonteEgerton, R. F. Electron Energy-Loss Spectroscopy in the Electron Microscope. Boston, MA: Springer US, 1996. http://dx.doi.org/10.1007/978-1-4757-5099-7.
Texto completo da fonteEgerton, R. F. Electron Energy-Loss Spectroscopy in the Electron Microscope. Boston, MA: Springer US, 2011. http://dx.doi.org/10.1007/978-1-4419-9583-4.
Texto completo da fonteEgerton, R. F. Electron energy-loss spectroscopy in the electron microscope. 2a ed. New York: Plenum Press, 1996.
Encontre o texto completo da fonteCapítulos de livros sobre o assunto "Electron microscope"
Gooch, Jan W. "Electron Microscope". In Encyclopedic Dictionary of Polymers, 889. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_13623.
Texto completo da fonteWeik, Martin H. "electron microscope". In Computer Science and Communications Dictionary, 505. Boston, MA: Springer US, 2000. http://dx.doi.org/10.1007/1-4020-0613-6_6014.
Texto completo da fonteSchmitt, Robert. "Scanning Electron Microscope". In CIRP Encyclopedia of Production Engineering, 1–5. Berlin, Heidelberg: Springer Berlin Heidelberg, 2017. http://dx.doi.org/10.1007/978-3-642-35950-7_6595-4.
Texto completo da fonteStaufer, U., L. P. Muray, D. P. Kern e T. H. P. Chang. "Miniaturized Electron Microscope". In Nanosources and Manipulation of Atoms Under High Fields and Temperatures: Applications, 101–10. Dordrecht: Springer Netherlands, 1993. http://dx.doi.org/10.1007/978-94-011-1729-6_9.
Texto completo da fonteDijkstra, Jeanne, e Cees P. de Jager. "Electron Microscope Serology". In Practical Plant Virology, 380–91. Berlin, Heidelberg: Springer Berlin Heidelberg, 1998. http://dx.doi.org/10.1007/978-3-642-72030-7_59.
Texto completo da fonteSchmitt, Robert. "Scanning Electron Microscope". In CIRP Encyclopedia of Production Engineering, 1501–5. Berlin, Heidelberg: Springer Berlin Heidelberg, 2019. http://dx.doi.org/10.1007/978-3-662-53120-4_6595.
Texto completo da fonteGooch, Jan W. "Scanning Electron Microscope". In Encyclopedic Dictionary of Polymers, 647. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_10317.
Texto completo da fonteMitome, Masanori. "Transmission Electron Microscope". In Compendium of Surface and Interface Analysis, 775–81. Singapore: Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-6156-1_124.
Texto completo da fonteKinoshita, Toyohiko. "Photoemission Electron Microscope". In Compendium of Surface and Interface Analysis, 465–69. Singapore: Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-6156-1_76.
Texto completo da fonteSchmitt, Robert. "Scanning Electron Microscope". In CIRP Encyclopedia of Production Engineering, 1085–89. Berlin, Heidelberg: Springer Berlin Heidelberg, 2014. http://dx.doi.org/10.1007/978-3-642-20617-7_6595.
Texto completo da fonteTrabalhos de conferências sobre o assunto "Electron microscope"
Yatagai, Toyohiko, Katsuyuki Ohmura e Shigeo Iwasaki. "Phase sensitive analysis of electron holograms". In Holography. Washington, D.C.: Optica Publishing Group, 1986. http://dx.doi.org/10.1364/holography.1986.wb3.
Texto completo da fonteLarionov, Yu V., e Yu A. Novikov. "Virtual scanning electron microscope". In International Conference on Micro-and Nano-Electronics 2012, editado por Alexander A. Orlikovsky. SPIE, 2013. http://dx.doi.org/10.1117/12.2016977.
Texto completo da fontePostek, Michael T. "Scanning electron microscope metrology". In Critical Review Collection. SPIE, 1994. http://dx.doi.org/10.1117/12.187461.
Texto completo da fonteMačák, Martin. "Electrohydrodynamic Model Of Electron Microscope". In STUDENT EEICT 2021. Brno: Fakulta elektrotechniky a komunikacnich technologii VUT v Brne, 2021. http://dx.doi.org/10.13164/eeict.2021.209.
Texto completo da fonteKrysztof, Michał, Marcin Białas e Tomasz Grzebyk. "Imaging Using Mems Electron Microscope". In 2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC). IEEE, 2023. http://dx.doi.org/10.1109/ivnc57695.2023.10188948.
Texto completo da fonteKrysztof, Michal, Tomasz Grzebyk, Piotr Szyszka, Karolina Laszczyk, Anna Gorccka-Drzazza e Jan Dziuban. "Electron Transparent Anode for MEMS Transmission Electron Microscope". In 2018 XV International Scientific Conference on Optoelectronic and Electronic Sensors (COE). IEEE, 2018. http://dx.doi.org/10.1109/coe.2018.8435173.
Texto completo da fonteSimonaitis, John W., Maurice A. R. Krielaart, Stewart A. Koppell, Benjamin J. Slayton, Joseph Alongi, William P. Putnam, Karl K. Berggren e Phillip D. Keathley. "Electron-Photon Interactions in a Scanning Electron Microscope". In 2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC). IEEE, 2023. http://dx.doi.org/10.1109/ivnc57695.2023.10188999.
Texto completo da fonteDemarest, James, Chris Deeb, Thomas Murray e Hong-Ying Zhai. "Energy-Dispersive X-ray Spectrometry Performance on Multiple Transmission Electron Microscope Platforms". In ISTFA 2010. ASM International, 2010. http://dx.doi.org/10.31399/asm.cp.istfa2010p0301.
Texto completo da fonteIvanov, S. N., S. N. Shilimanov e Sergei I. Shkuratov. "Design of field electron emission spectrometer, field ion microscope, and field electron emission microscope combination". In XVI International Symposium on Discharges and Electrical Insulation in Vacuum, editado por Gennady A. Mesyats. SPIE, 1994. http://dx.doi.org/10.1117/12.174564.
Texto completo da fonteAksenov, Y. Y., E. G. I. Reinders, Jan Greve, C. van Blitterswijk, J. de Bruijn e Cees Otto. "Integration of a confocal Raman microscope in an electron microscope". In EOS/SPIE European Biomedical Optics Week, editado por Karsten Koenig, Hans J. Tanke e Herbert Schneckenburger. SPIE, 2000. http://dx.doi.org/10.1117/12.410628.
Texto completo da fonteRelatórios de organizações sobre o assunto "Electron microscope"
Crewe, A. V., e O. H. Kapp. Electron microscope studies. Office of Scientific and Technical Information (OSTI), junho de 1991. http://dx.doi.org/10.2172/6000131.
Texto completo da fonteCrewe, A. V., e O. H. Kapp. Electron microscope studies. Office of Scientific and Technical Information (OSTI), julho de 1992. http://dx.doi.org/10.2172/7015892.
Texto completo da fonteKenik, E. (Intermediate voltage electron microscope). Office of Scientific and Technical Information (OSTI), novembro de 1989. http://dx.doi.org/10.2172/5356814.
Texto completo da fonteRen, Z. F. Purchase of Transmission Electron Microscope. Fort Belvoir, VA: Defense Technical Information Center, janeiro de 2001. http://dx.doi.org/10.21236/ada392051.
Texto completo da fonteHadjipansyis, George C. DURIP 00 Scanning Electron Microscope (SEM). Fort Belvoir, VA: Defense Technical Information Center, março de 2001. http://dx.doi.org/10.21236/ada388472.
Texto completo da fonteStirling, J. A. R., e G. J. Pringle. Tools of investigation: the electron microprobe and scanning electron microscope. Natural Resources Canada/ESS/Scientific and Technical Publishing Services, 1996. http://dx.doi.org/10.4095/210959.
Texto completo da fonteMarder, A., K. Barmak e D. Williams. Environmental scanning electron microscope (ESEM). Final report. Office of Scientific and Technical Information (OSTI), novembro de 1998. http://dx.doi.org/10.2172/676882.
Texto completo da fonteCollins, Kimberlee Chiyoko, Albert Alec Talin, David W. Chandler e Joseph R. Michael. Development of Scanning Ultrafast Electron Microscope Capability. Office of Scientific and Technical Information (OSTI), novembro de 2016. http://dx.doi.org/10.2172/1331925.
Texto completo da fonteFraser, Hamish L. Request for an Analytical Transmission Electron Microscope. Fort Belvoir, VA: Defense Technical Information Center, outubro de 1987. http://dx.doi.org/10.21236/ada189111.
Texto completo da fonteRuggiero, S. T. Single-electron tunneling. [Microwave scanning tunneling microscope]. Office of Scientific and Technical Information (OSTI), janeiro de 1993. http://dx.doi.org/10.2172/6854553.
Texto completo da fonte