Artigos de revistas sobre o tema "Dual-beam FIB-SEM"
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Gu, Lixin, Nian Wang, Xu Tang e H. G. Changela. "Application of FIB-SEM Techniques for the Advanced Characterization of Earth and Planetary Materials". Scanning 2020 (25 de julho de 2020): 1–15. http://dx.doi.org/10.1155/2020/8406917.
Texto completo da fonteGiannuzzi, Lucille A. "FIB/SEM Dual Beam Instrumentation: Slicing, Dicing, Imaging, and More". Microscopy and Microanalysis 7, S2 (agosto de 2001): 796–97. http://dx.doi.org/10.1017/s1431927600030051.
Texto completo da fonteLee, E., R. Williams, G. B. Viswanathan, R. Banerjee e H. L. Fraser. "3D Materials Characterization using Dual-Beam FIB/SEM Techniques". Microscopy and Microanalysis 10, S02 (agosto de 2004): 1128–29. http://dx.doi.org/10.1017/s1431927604884204.
Texto completo da fonteSIVEL, V. G. M., J. VAN DEN BRAND, W. R. WANG, H. MOHDADI, F. D. TICHELAAR, P. F. A. ALKEMADE e H. W. ZANDBERGEN. "Application of the dual-beam FIB/SEM to metals research". Journal of Microscopy 214, n.º 3 (junho de 2004): 237–45. http://dx.doi.org/10.1111/j.0022-2720.2004.01329.x.
Texto completo da fonteCarl, Matthew, Chris A. Smith e Marcus L. Young. "Dual-Beam Scanning Electron Microscope (SEM) and Focused Ion Beam (FIB): A Practical Method for Characterization of Small Cultural Heritage Objects". MRS Proceedings 1656 (15 de setembro de 2014): 355–69. http://dx.doi.org/10.1557/opl.2014.873.
Texto completo da fonteMahmoud, Morsi M. "Characterization of the Native Oxide Shell of Copper Metal Powder Spherical Particles". Materials 15, n.º 20 (17 de outubro de 2022): 7236. http://dx.doi.org/10.3390/ma15207236.
Texto completo da fonteGrandfield, Kathryn, e Håkan Engqvist. "Focused Ion Beam in the Study of Biomaterials and Biological Matter". Advances in Materials Science and Engineering 2012 (2012): 1–6. http://dx.doi.org/10.1155/2012/841961.
Texto completo da fonteLin, Jui-Ching, William Heeschen, John Reffner e John Hook. "Three-Dimensional Characterization of Pigment Dispersion in Dried Paint Films Using Focused Ion Beam–Scanning Electron Microscopy". Microscopy and Microanalysis 18, n.º 2 (1 de fevereiro de 2012): 266–71. http://dx.doi.org/10.1017/s143192761101244x.
Texto completo da fonteRepetto, Luca, Renato Buzio, Carlo Denurchis, Giuseppe Firpo, Emanuele Piano e Ugo Valbusa. "Fast three-dimensional nanoscale metrology in dual-beam FIB–SEM instrumentation". Ultramicroscopy 109, n.º 11 (outubro de 2009): 1338–42. http://dx.doi.org/10.1016/j.ultramic.2009.06.009.
Texto completo da fonteKotula, Paul G., Michael R. Keenan e Joseph R. Michael. "Tomographic Spectral Imaging with a Dual-Beam FIB/SEM: 3D Microanalysis". Microscopy and Microanalysis 10, S02 (agosto de 2004): 1132–33. http://dx.doi.org/10.1017/s1431927604880619.
Texto completo da fonteUchic, Michael D., Michael Groeber, Robert Wheeler IV, Frank Scheltens e Dennis M. Dimiduk. "Augmenting the 3D Characterization Capability of the Dual Beam FIB-SEM". Microscopy and Microanalysis 10, S02 (agosto de 2004): 1136–37. http://dx.doi.org/10.1017/s1431927604886859.
Texto completo da fonteMiller, M. K., e K. F. Russell. "Atom probe specimen preparation with a dual beam SEM/FIB miller". Ultramicroscopy 107, n.º 9 (setembro de 2007): 761–66. http://dx.doi.org/10.1016/j.ultramic.2007.02.023.
Texto completo da fonteWEST, G. D., e R. C. THOMSON. "Combined EBSD/EDS tomography in a dual-beam FIB/FEG-SEM". Journal of Microscopy 233, n.º 3 (março de 2009): 442–50. http://dx.doi.org/10.1111/j.1365-2818.2009.03138.x.
Texto completo da fonteYao, Bao Yin, Hu Luo, Li Shuang Feng, Zhen Zhou, Rong Ming Wang e Yuan Yuan Chi. "Fabrication of Nano-Grating by Focused Ion Beam / Scanning Electron Microscopy Dual-Beam System". Key Engineering Materials 483 (junho de 2011): 66–69. http://dx.doi.org/10.4028/www.scientific.net/kem.483.66.
Texto completo da fonteYoung, Richard J. "Site-Specific Analysis of Advanced Packaging Enabled by Focused Ion Beams". EDFA Technical Articles 13, n.º 1 (1 de fevereiro de 2011): 12–19. http://dx.doi.org/10.31399/asm.edfa.2011-1.p012.
Texto completo da fonteJeanvoine, Nicolas, Christian Holzapfel, Flavio Soldera e Frank Mücklich. "3D Investigations of Plasma Erosion Craters using FIB/SEM Dual-Beam Techniques". Practical Metallography 43, n.º 9 (setembro de 2006): 470–82. http://dx.doi.org/10.3139/147.100314.
Texto completo da fonteIwai, Hiroshi, Naoki Shikazono, Toshiaki Matsui, Hisanori Teshima, Masashi Kishimoto, Ryo Kishida, Daisuke Hayashi et al. "Quantification of SOFC anode microstructure based on dual beam FIB-SEM technique". Journal of Power Sources 195, n.º 4 (fevereiro de 2010): 955–61. http://dx.doi.org/10.1016/j.jpowsour.2009.09.005.
Texto completo da fonteUchic, MD, e PA Shade. "Serial Sectioning of Deformed Microcrystals using a Dual-Beam FIB-SEM Microscope". Microscopy and Microanalysis 15, S2 (julho de 2009): 610–11. http://dx.doi.org/10.1017/s1431927609099498.
Texto completo da fonteJeanvoine, N., C. Holzapfel, F. Soldera e F. Mücklich. "Microstructure Characterisation of Electrical Discharge Craters using FIB/SEM Dual Beam Techniques". Advanced Engineering Materials 10, n.º 10 (outubro de 2008): 973–77. http://dx.doi.org/10.1002/adem.200800108.
Texto completo da fonteReagan, Brandon C., Paul J. Y. Kim, Preston D. Perry, John R. Dunlap e Tessa M. Burch-Smith. "Spatial distribution of organelles in leaf cells and soybean root nodules revealed by focused ion beam-scanning electron microscopy". Functional Plant Biology 45, n.º 2 (2018): 180. http://dx.doi.org/10.1071/fp16347.
Texto completo da fonteDravid, Vinayak P., Steven Kim e Luke N. Brewer. "Focused Ion Beam (FIB): More than Just a Fancy Ion Beam Thinner". Microscopy and Microanalysis 6, S2 (agosto de 2000): 504–5. http://dx.doi.org/10.1017/s1431927600035017.
Texto completo da fonteGrünewald, Lukas, Daniel Nerz, Marco Langer, Sven Meyer, Nico Beisig, Pablo Cayado, Ruslan Popov, Jens Hänisch, Bernhard Holzapfel e Dagmar Gerthsen. "Analysis of superconducting thin films in a modern FIB/SEM dual-beam instrument". Microscopy and Microanalysis 27, S1 (30 de julho de 2021): 1056–58. http://dx.doi.org/10.1017/s1431927621003986.
Texto completo da fonteIwai, Hiroshi, Naoki Shikazono, Toshiaki Matsui, Hisanori Teshima, Masashi Kishimoto, Ryo Kishida, Daisuke Hayashi et al. "Quantification of Ni-YSZ Anode Microstructure Based on Dual Beam FIB-SEM Technique". ECS Transactions 25, n.º 2 (17 de dezembro de 2019): 1819–28. http://dx.doi.org/10.1149/1.3205723.
Texto completo da fonteIgnatov, A., A. Komissar e R. Geurts. "On-line Scanned Probe Microscopy Transparently Integrated with Dual Beam SEM/FIB Systems". Microscopy and Microanalysis 18, S2 (julho de 2012): 640–41. http://dx.doi.org/10.1017/s1431927612005053.
Texto completo da fonteUchic, M. "How to use the Dual Beam FIB-SEM to Characterize Microstructure in 3D". Microscopy and Microanalysis 12, S02 (31 de julho de 2006): 122–23. http://dx.doi.org/10.1017/s1431927606069054.
Texto completo da fonteYang, G. Y., P. J. Moses, E. C. Dickey e C. A. Randall. "Local impedance and microchemical analysis of electrical heterogeneities in multilayer electroceramic devices". Journal of Materials Research 22, n.º 12 (dezembro de 2007): 3507–15. http://dx.doi.org/10.1557/jmr.2007.0443.
Texto completo da fonteJakubéczyová, Dagmar, e Beáta Ballóková. "The Analyse of Nanocomposite Thin Coatings Using Specimens Prepared by Focused Ion Beam Milling". Materials Science Forum 891 (março de 2017): 579–85. http://dx.doi.org/10.4028/www.scientific.net/msf.891.579.
Texto completo da fonteCao, Shan Shan, Minoru Nishida e Dominique Schryvers. "FIB/SEM Applied to Quantitative 3D Analysis of Precipitates in Ni-Ti". Solid State Phenomena 172-174 (junho de 2011): 1284–89. http://dx.doi.org/10.4028/www.scientific.net/ssp.172-174.1284.
Texto completo da fonteDravid, Vinayak P. "Focused Ion Beam (FIB): More than Just a Fancy Ion Beam Thinner". Microscopy and Microanalysis 7, S2 (agosto de 2001): 926–27. http://dx.doi.org/10.1017/s1431927600030701.
Texto completo da fonteKazak, Andrey, Kirill Simonov e Victor Kulikov. "Machine-Learning-Assisted Segmentation of Focused Ion Beam-Scanning Electron Microscopy Images with Artifacts for Improved Void-Space Characterization of Tight Reservoir Rocks". SPE Journal 26, n.º 04 (8 de março de 2021): 1739–58. http://dx.doi.org/10.2118/205347-pa.
Texto completo da fonteLiu, Mei Hua, Di Feng, Yan Li, Bao Yin Yao, Shuai Zhong e Li Shuang Feng. "The Experiment Research of Gas-Assisted Ion Etching Nanograting". Key Engineering Materials 609-610 (abril de 2014): 32–38. http://dx.doi.org/10.4028/www.scientific.net/kem.609-610.32.
Texto completo da fonteJang, Seungsoo, Kyung Taek Bae, Dongyeon Kim, Hyeongmin Yu, Seeun Oh, Ha-Ni Im e Kang Taek Lee. "Microstructural Analysis of Solid Oxide Electrochemical Cells via 3D Reconstruction Using a FIB-SEM Dual Beam System". ECS Transactions 111, n.º 6 (19 de maio de 2023): 1265–69. http://dx.doi.org/10.1149/11106.1265ecst.
Texto completo da fonteChen, Yi Qing, Feng Zai Tang e Liang Chi Zhang. "A Preparation Method of Diamond Specimens Using an Advanced FIB Microscopy for Micro and Nanoanalysis". Key Engineering Materials 531-532 (dezembro de 2012): 592–95. http://dx.doi.org/10.4028/www.scientific.net/kem.531-532.592.
Texto completo da fonteTseluyko, S. S., V. Ya Shklover, V. A. Kurushin e P. R. Kazanskiy. "3D-RECONSTRUCTION OF THE MUCOUS MEMBRANE OF THE TRACHEA WITH THE USE OF DUAL BEAM FIB/ SEM QUANTA 3D FEG". Amur Medical Journal, n.º 15-16 (2016): 112–15. http://dx.doi.org/10.22448/amj.2016.15-16.112-115.
Texto completo da fonteUchic, Michael D., Michael A. Groeber, Dennis M. Dimiduk e J. P. Simmons. "3D microstructural characterization of nickel superalloys via serial-sectioning using a dual beam FIB-SEM". Scripta Materialia 55, n.º 1 (julho de 2006): 23–28. http://dx.doi.org/10.1016/j.scriptamat.2006.02.039.
Texto completo da fonteGoto, Toichiro, Nahoko Kasai, Rick Lu, Roxana Filip e Koji Sumitomo. "Scanning Electron Microscopy Observation of Interface Between Single Neurons and Conductive Surfaces". Journal of Nanoscience and Nanotechnology 16, n.º 4 (1 de abril de 2016): 3383–87. http://dx.doi.org/10.1166/jnn.2016.12311.
Texto completo da fonteZhang, G. P., Bin Zhang, Q. Y. Yu e J. Tan. "In Situ Thermal-Mechanical Fatigue Testing of Thin Au Lines". Key Engineering Materials 353-358 (setembro de 2007): 2916–19. http://dx.doi.org/10.4028/www.scientific.net/kem.353-358.2916.
Texto completo da fonteOllivier, Maelig, Laurence Latu-Romain, Edwige Bano, Arnaud Mantoux e Thierry Baron. "Conversion of Si Nanowires into SiC Nanotubes". Materials Science Forum 717-720 (maio de 2012): 1275–78. http://dx.doi.org/10.4028/www.scientific.net/msf.717-720.1275.
Texto completo da fonteOliveira, Marcos L. S., Diana Pinto, Maria Eliza Nagel-Hassemer, Leila Dal Moro, Giana de Vargas Mores, Brian William Bodah e Alcindo Neckel. "Brazilian Coal Tailings Projects: Advanced Study of Sustainable Using FIB-SEM and HR-TEM". Sustainability 15, n.º 1 (23 de dezembro de 2022): 220. http://dx.doi.org/10.3390/su15010220.
Texto completo da fonteSingh, R., A. R. Akhgar, P. C. Sui, K. J. Lange e N. Djilali. "Dual-Beam FIB/SEM Characterization, Statistical Reconstruction, and Pore Scale Modeling of a PEMFC Catalyst Layer". Journal of The Electrochemical Society 161, n.º 4 (2014): F415—F424. http://dx.doi.org/10.1149/2.036404jes.
Texto completo da fonteChee, K. W. A., R. Beanland, P. A. Midgley e C. J. Humphreys. "Site-selective dopant profiling of p-n junction specimens in the dual-beam FIB/SEM system". Journal of Physics: Conference Series 209 (1 de fevereiro de 2010): 012069. http://dx.doi.org/10.1088/1742-6596/209/1/012069.
Texto completo da fonteZhou, Qinghua, Lechun Xie, Xueli Wang, Xiaoqing Jin, Zhanjiang Wang, Jiaxu Wang, Zhihong Jia, Leon M. Keer e Qian Wang. "Modeling rolling contact fatigue lives of composite materials based on the dual beam FIB/SEM technique". International Journal of Fatigue 83 (fevereiro de 2016): 201–8. http://dx.doi.org/10.1016/j.ijfatigue.2015.10.014.
Texto completo da fonteNovo, Sergi, Leonardo Barrios, Elena Ibáñez e Carme Nogués. "The Zona Pellucida Porosity: Three-Dimensional Reconstruction of Four Types of Mouse Oocyte Zona Pellucida Using a Dual Beam Microscope". Microscopy and Microanalysis 18, n.º 6 (dezembro de 2012): 1442–49. http://dx.doi.org/10.1017/s1431927612013487.
Texto completo da fonteJang, Seungsoo, Kyung Taek Bae, Dongyeon Kim, Hyeongmin Yu, Seeun Oh, Ha-Ni Im e Kang Taek Lee. "Microstructural Analysis of Solid Oxide Electrochemical Cells via 3D Reconstruction Using a FIB-SEM Dual Beam System". ECS Meeting Abstracts MA2023-01, n.º 54 (28 de agosto de 2023): 194. http://dx.doi.org/10.1149/ma2023-0154194mtgabs.
Texto completo da fonteLim, Seungmin, Han-Seung Lee e Shiho Kawashima. "Pore structure refinement of cement paste incorporating nanosilica: Study with dual beam scanning electron microscopy/focused ion beam (SEM/FIB)". Materials Characterization 145 (novembro de 2018): 323–28. http://dx.doi.org/10.1016/j.matchar.2018.08.045.
Texto completo da fonteBae, Kyung Taek, Joonam Park, Dong Woo Joh, Jeong Hwa Park, Dohwan Kim, Wooyoung Jeong, Ji-Eun Nam et al. "Quantitative Analysis of Solid-State Energy Devices Via 3D Reconstruction Using a FIB/SEM Dual Beam System". ECS Meeting Abstracts MA2021-03, n.º 1 (23 de julho de 2021): 253. http://dx.doi.org/10.1149/ma2021-031253mtgabs.
Texto completo da fonteTordoff, B., C. Hartfield, S. Krauss, L. Abdellaoui, S. Kelly e H. Bale. "10 years of LaserFIB: The Latest Developments in a Dual Chamber, 3 Beam FIB-SEM for Large Volume Material Removal and Semi-Automated FIB Integration". Microscopy and Microanalysis 29, Supplement_1 (22 de julho de 2023): 547. http://dx.doi.org/10.1093/micmic/ozad067.258.
Texto completo da fonteSchryvers, Dominique, Wim Tirry e Shan Shan Cao. "Advanced TEM and SEM Methods Applied to 3D Nano- and Microstructural Investigations of Ni4Ti3 Precipitates in Ni-Ti (SMA)". Solid State Phenomena 172-174 (junho de 2011): 229–35. http://dx.doi.org/10.4028/www.scientific.net/ssp.172-174.229.
Texto completo da fonteZhao, Y. Z., Q. J. Wang, P. K. Tan, H. H. Yap, B. H. Liu, H. Feng, H. Tan et al. "Application of Fast Laser Deprocessing Techniques on large cross-sectional view area sample with FIB-SEM dual beam system". Microelectronics Reliability 64 (setembro de 2016): 362–66. http://dx.doi.org/10.1016/j.microrel.2016.07.060.
Texto completo da fonteClarke, James S., Michael B. Schmidt e Ndubuisi G. Orji. "Photoresist cross-sectioning with negligible damage using a dual-beam FIB-SEM: A high throughput method for profile imaging". Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 25, n.º 6 (2007): 2526. http://dx.doi.org/10.1116/1.2804516.
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