Artigos de revistas sobre o tema "Characterization techniques for microelectroniq"
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Klymko, N. R., J. A. Casey, L. Tai, J. A. Fitzsimmons e F. Adar. "Role of Raman Microprobe Spectroscopy in the Characterization of Microelectronic Materials". Microscopy and Microanalysis 7, S2 (agosto de 2001): 150–51. http://dx.doi.org/10.1017/s1431927600026829.
Texto completo da fonteBusch, Brett W., Olivier Pluchery, Yves J. Chabal, David A. Muller, Robert L. Opila, J. Raynien Kwo e Eric Garfunkel. "Materials Characterization of Alternative Gate Dielectrics". MRS Bulletin 27, n.º 3 (março de 2002): 206–11. http://dx.doi.org/10.1557/mrs2002.72.
Texto completo da fonteZhou, Shenglin, Zhaohui Yang e Xiaohua Zhang. "Characterization tools of thin polymer films". International Journal of Modern Physics B 32, n.º 18 (15 de julho de 2018): 1840007. http://dx.doi.org/10.1142/s0217979218400076.
Texto completo da fonteHuang, Zhiheng, Ziyan Liao, Kaiwen Zheng, Xin Zeng, Yuezhong Meng, Hui Yan e Yang Liu. "Microstructural Hierarchy Descriptor Enabling Interpretative AI for Microelectronic Failure Analysis". EDFA Technical Articles 26, n.º 2 (1 de maio de 2024): 10–18. http://dx.doi.org/10.31399/asm.edfa.2024-2.p010.
Texto completo da fonteMouro, João, Rui Pinto, Paolo Paoletti e Bruno Tiribilli. "Microcantilever: Dynamical Response for Mass Sensing and Fluid Characterization". Sensors 21, n.º 1 (27 de dezembro de 2020): 115. http://dx.doi.org/10.3390/s21010115.
Texto completo da fonteMurray, Conal E., A. J. Ying, S. M. Polvino, I. C. Noyan e Z. Cai. "Nanoscale strain characterization in microelectronic materials using X-ray diffraction". Powder Diffraction 25, n.º 2 (junho de 2010): 108–13. http://dx.doi.org/10.1154/1.3394205.
Texto completo da fonteJansen, K. M. B., V. Gonda, L. J. Ernst, H. J. L. Bressers e G. Q. Zhang. "State-of-the-Art of Thermo-Mechanical Characterization of Thin Polymer Films". Journal of Electronic Packaging 127, n.º 4 (22 de dezembro de 2004): 530–36. http://dx.doi.org/10.1115/1.2070092.
Texto completo da fonteGuégan, Hervé. "Use of a Nuclear Microprobe in Electronic Device Characterization". EDFA Technical Articles 9, n.º 4 (1 de novembro de 2007): 14–19. http://dx.doi.org/10.31399/asm.edfa.2007-4.p014.
Texto completo da fonteRuales, Mary, e Kinzy Jones. "Characterization of silicate sensors on Low Temperature Cofire Ceramic (LTCC) substrates using DSC and XRD techniques". International Symposium on Microelectronics 2012, n.º 1 (1 de janeiro de 2012): 000598–603. http://dx.doi.org/10.4071/isom-2012-wa31.
Texto completo da fonteNguyen, T. K., L. M. Landsberger, V. Logiudice e C. Jean. "Electrical characterization of fluorine-implanted gate oxide structures". Canadian Journal of Physics 74, S1 (1 de dezembro de 1996): 74–78. http://dx.doi.org/10.1139/p96-836.
Texto completo da fonteCoppola, Giuseppe, e Maria Antonietta Ferrara. "Polarization-Sensitive Digital Holographic Imaging for Characterization of Microscopic Samples: Recent Advances and Perspectives". Applied Sciences 10, n.º 13 (29 de junho de 2020): 4520. http://dx.doi.org/10.3390/app10134520.
Texto completo da fonteDrouin, D., J. Beauvais e R. Gauvin. "Characterization of Variations in Schottky Barrier Height in Semiconductor Devices using EBIC Technique". Microscopy and Microanalysis 3, S2 (agosto de 1997): 501–2. http://dx.doi.org/10.1017/s1431927600009399.
Texto completo da fonteMalisz, Klaudia, Beata Świeczko-Żurek e Alina Sionkowska. "Preparation and Characterization of Diamond-like Carbon Coatings for Biomedical Applications—A Review". Materials 16, n.º 9 (27 de abril de 2023): 3420. http://dx.doi.org/10.3390/ma16093420.
Texto completo da fonteSciuto, Emanuele Luigi, Corrado Bongiorno, Antonino Scandurra, Salvatore Petralia, Tiziana Cosentino, Sabrina Conoci, Fulvia Sinatra e Sebania Libertino. "Functionalization of Bulk SiO2 Surface with Biomolecules for Sensing Applications: Structural and Functional Characterizations". Chemosensors 6, n.º 4 (30 de novembro de 2018): 59. http://dx.doi.org/10.3390/chemosensors6040059.
Texto completo da fonteBeers, Kimberly, Andrew E. Hollowell e G. Bahar Basim. "Thin Film Characterization on Cu/SnAg Solder Interface for 3D Packaging Technologies". MRS Advances 5, n.º 37-38 (2020): 1929–35. http://dx.doi.org/10.1557/adv.2020.309.
Texto completo da fonteHoummada, Khalid, Dominique Mangelinck e Alain Portavoce. "Kinetic of Formation of Ni and Pd Silicides: Determination of Interfacial Mobility and Interdiffusion Coefficient by In Situ Techniques". Solid State Phenomena 172-174 (junho de 2011): 640–45. http://dx.doi.org/10.4028/www.scientific.net/ssp.172-174.640.
Texto completo da fonteCara, Eleonora, Irdi Murataj, Gianluca Milano, Natascia De Leo, Luca Boarino e Federico Ferrarese Lupi. "Recent Advances in Sequential Infiltration Synthesis (SIS) of Block Copolymers (BCPs)". Nanomaterials 11, n.º 4 (13 de abril de 2021): 994. http://dx.doi.org/10.3390/nano11040994.
Texto completo da fonteKumar, Ashok. "Functional Nanomaterials: From Basic Science to Emerging Applications". Solid State Phenomena 201 (maio de 2013): 1–19. http://dx.doi.org/10.4028/www.scientific.net/ssp.201.1.
Texto completo da fonteGauvin, Raynald, Mario Caron, Vincent Fortin e John F. Currie. "Characterization of Multilayered Structures Using a FEGSEM and X-Ray Microanalysis". Microscopy and Microanalysis 3, S2 (agosto de 1997): 463–64. http://dx.doi.org/10.1017/s143192760000920x.
Texto completo da fonteTrulli, Susan, Craig Armiento, Christopher Laighton, Elicia Harper, Mahdi Haghzadeh e Alkim Akyurtlu. "Additive Packaging for Microwave Applications". International Symposium on Microelectronics 2017, n.º 1 (1 de outubro de 2017): 000768–72. http://dx.doi.org/10.4071/isom-2017-thp53_148.
Texto completo da fontePagan, Darren C., Md A. J. Rasel, Rachel E. Lim, Dina Sheyfer, Wenjun Liu e Aman Haque. "Non-destructive depth-resolved characterization of residual strain fields in high electron mobility transistors using differential aperture x-ray microscopy". Journal of Applied Physics 132, n.º 14 (14 de outubro de 2022): 144503. http://dx.doi.org/10.1063/5.0109606.
Texto completo da fontePortavoce, Alain, Khalid Hoummada e Lee Chow. "Coupling Secondary Ion Mass Spectrometry and Atom Probe Tomography for Atomic Diffusion and Segregation Measurements". Microscopy and Microanalysis 25, n.º 2 (30 de janeiro de 2019): 517–23. http://dx.doi.org/10.1017/s1431927618015623.
Texto completo da fonteMustafa, M. K., U. Majeed e Y. Iqbal. "Effect on Silicon Nitride thin Films Properties at Various Powers of RF Magnetron Sputtering". International Journal of Engineering & Technology 7, n.º 4.30 (30 de novembro de 2018): 39. http://dx.doi.org/10.14419/ijet.v7i4.30.22000.
Texto completo da fonteBooth, James C., Nathan Orloff, Christian Long, Aaron Hagerstrom, Angela Stelson, Nicholas Jungwirth e Luckshitha Suriyasena Liyanage. "(Invited, Digital Presentation) Nonlinear and Electro-Thermo-Mechanical Effects in Heterogeneous Electronics at Microwave Frequencies". ECS Meeting Abstracts MA2022-02, n.º 17 (9 de outubro de 2022): 862. http://dx.doi.org/10.1149/ma2022-0217862mtgabs.
Texto completo da fonteYoungman, R. A. "The Critical Role of Microscopy and Spectroscopy in the Development of New Materials for Microelectronics Packaging". Proceedings, annual meeting, Electron Microscopy Society of America 54 (11 de agosto de 1996): 634–35. http://dx.doi.org/10.1017/s042482010016563x.
Texto completo da fonteArikpo, John U., e Michael U. Onuu. "Graphene Growth and Characterization: Advances, Present Challenges and Prospects". Journal of Materials Science Research 8, n.º 4 (30 de setembro de 2019): 37. http://dx.doi.org/10.5539/jmsr.v8n4p37.
Texto completo da fonteHu, Xiao-Yu, Jun Ouyang, Guo-Chang Liu, Meng-Juan Gao, Lai-Bo Song, Jianfeng Zang e Wei Chen. "Synthesis and Characterization of the Conducting Polymer Micro-Helix Based on the Spirulina Template". Polymers 10, n.º 8 (7 de agosto de 2018): 882. http://dx.doi.org/10.3390/polym10080882.
Texto completo da fonteSzocinski, Michal. "AFM-assisted investigation of conformal coatings in electronics". Anti-Corrosion Methods and Materials 63, n.º 4 (6 de junho de 2016): 289–94. http://dx.doi.org/10.1108/acmm-09-2014-1426.
Texto completo da fontePantel, R., G. Mascarin e G. Auvert. "Defect Analysis and Process Development of Microelectronics Devices Using Focused Ion Beam and Energy Filtering Transmission Electron Microscopy." Microscopy and Microanalysis 5, S2 (agosto de 1999): 900–901. http://dx.doi.org/10.1017/s1431927600017827.
Texto completo da fonteFritz, Mathias, Christian Elieser Hoess, Finn-Merlin Deckert e Andreas Bund. "Light-Induced Platinum Deposition on Silicon-Based Semiconductor Devices". ECS Meeting Abstracts MA2023-02, n.º 20 (22 de dezembro de 2023): 1217. http://dx.doi.org/10.1149/ma2023-02201217mtgabs.
Texto completo da fonteLamia, Zarral, Djahli Farid e Ndagijimana Fabien. "Technique of Coaxial Frame in Reflection for the Characterization of Single and Multilayer Materials with Correction of Air Gap". International Journal of Antennas and Propagation 2014 (2014): 1–9. http://dx.doi.org/10.1155/2014/324727.
Texto completo da fonteBaczyński, Szymon, Piotr Sobotka, Kasper Marchlewicz, Artur Dybko e Katarzyna Rutkowska. "Low-cost, widespread and reproducible mold fabrication technique for PDMS-based microfluidic photonic systems". Photonics Letters of Poland 12, n.º 1 (31 de março de 2020): 22. http://dx.doi.org/10.4302/plp.v12i1.981.
Texto completo da fonteWarczak, Magdalena, Marianna Gniadek, Kamil Hermanowski e Magdalena Osial. "Well-defined polyindole–Au NPs nanobrush as a platform for electrochemical oxidation of ethanol". Pure and Applied Chemistry 93, n.º 4 (1 de abril de 2021): 497–507. http://dx.doi.org/10.1515/pac-2020-1101.
Texto completo da fonteBasit, M., M. Aslam, M. Ahmad e Z. A. Raza. "Structural, thermal and optoelectrical study of PVA/iron oxide nanocomposite films". Materialwissenschaft und Werkstofftechnik 55, n.º 4 (abril de 2024): 455–65. http://dx.doi.org/10.1002/mawe.202300075.
Texto completo da fonteStefani, G. G., N. S. Goel e D. B. Jenks. "An Efficient Numerical Technique for Thermal Characterization of Printed Wiring Boards". Journal of Electronic Packaging 115, n.º 4 (1 de dezembro de 1993): 366–72. http://dx.doi.org/10.1115/1.2909345.
Texto completo da fonteDas, Rabindra, Steven Rosser e Frank Egitto. "Advanced Microelectronics Packaging Solutions for Miniaturized Medical Devices". Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) 2013, DPC (1 de janeiro de 2013): 001963–76. http://dx.doi.org/10.4071/2013dpc-tha24.
Texto completo da fonteCruz-Quesada, Guillermo, Maialen Espinal-Viguri, María Victoria López-Ramón e Julián J. Garrido. "Novel Silica Hybrid Xerogels Prepared by Co-Condensation of TEOS and ClPhTEOS: A Chemical and Morphological Study". Gels 8, n.º 10 (20 de outubro de 2022): 677. http://dx.doi.org/10.3390/gels8100677.
Texto completo da fonteAlves, L. C., V. Corregidor, T. Pinheiro e L. Ferreira. "Ion Beam Microscopy: a Tool for Materials". Microscopy and Microanalysis 19, S4 (agosto de 2013): 95–96. http://dx.doi.org/10.1017/s1431927613001098.
Texto completo da fonteBennett, N. S., e N. E. B. Cowern. "Doping characterization for germanium-based microelectronics and photovoltaics using the differential Hall technique". Applied Physics Letters 100, n.º 17 (23 de abril de 2012): 172106. http://dx.doi.org/10.1063/1.4705293.
Texto completo da fonteMaraj, Mudassar, Ghulam Nabi, Khurram Usman, Engui Wang, Wenwang Wei, Yukun Wang e Wenhong Sun. "High Quality Growth of Cobalt Doped GaN Nanowires with Enhanced Ferromagnetic and Optical Response". Materials 13, n.º 16 (11 de agosto de 2020): 3537. http://dx.doi.org/10.3390/ma13163537.
Texto completo da fontePulici, Andrea, Stefano Kuschlan, Gabriele Seguini, Fabiana Taglietti, Marco Fanciulli, Riccardo Chiarcos, Michele Laus e Michele Perego. "Electrical Characterization of Ultra-Thin Silicon-on-Insulator Films Doped By Means of Phosphorus End-Terminated Polymers". ECS Meeting Abstracts MA2023-02, n.º 30 (22 de dezembro de 2023): 1552. http://dx.doi.org/10.1149/ma2023-02301552mtgabs.
Texto completo da fonteDittman, Timothy, David Ebner e Alex Bailey. "Design of Experiments Approach to Evaluating the Reliability of System-in-Package Assemblies". International Symposium on Microelectronics 2017, n.º 1 (1 de outubro de 2017): 000619–23. http://dx.doi.org/10.4071/isom-2017-tha52_063.
Texto completo da fonteTuttle, Bruce A. "Electronic Ceramic Thin Films: Trends in Research and Development". MRS Bulletin 12, n.º 7 (novembro de 1987): 40–46. http://dx.doi.org/10.1557/s0883769400066938.
Texto completo da fonteLeofanti, G., G. Tozzola, M. Padovan, G. Petrini, S. Bordiga e A. Zecchina. "Catalyst characterization: characterization techniques". Catalysis Today 34, n.º 3-4 (fevereiro de 1997): 307–27. http://dx.doi.org/10.1016/s0920-5861(96)00056-9.
Texto completo da fonteEckert, Hellmut, e Manfred Rühle. "Characterization techniques". Current Opinion in Solid State and Materials Science 5, n.º 2-3 (abril de 2001): 193–94. http://dx.doi.org/10.1016/s1359-0286(01)00018-3.
Texto completo da fonteFischer, John E., e Hellmut Eckert. "Characterization techniques". Current Opinion in Solid State and Materials Science 1, n.º 4 (agosto de 1996): 463–64. http://dx.doi.org/10.1016/s1359-0286(96)80059-3.
Texto completo da fonteEckert, Hellmut, e Manfred Rühle. "Characterization techniques". Current Opinion in Solid State and Materials Science 2, n.º 4 (agosto de 1997): 463–64. http://dx.doi.org/10.1016/s1359-0286(97)80090-3.
Texto completo da fonteStern, Edward A., e Richard W. Siegel. "Characterization techniques". Current Opinion in Solid State and Materials Science 4, n.º 4 (agosto de 1999): 321–23. http://dx.doi.org/10.1016/s1359-0286(99)00042-x.
Texto completo da fonteFournel, Frank, Loic Sanchez, Brigitte Montmayeul, Gaëlle Mauguen, Laurent Bally, Vincent Larrey, Christophe Morales et al. "(Invited) Optoelectronic and 3D Applications with Die to Wafer Direct Bonding: From Mechanisms to Applications". ECS Meeting Abstracts MA2022-02, n.º 17 (9 de outubro de 2022): 853. http://dx.doi.org/10.1149/ma2022-0217853mtgabs.
Texto completo da fonteRogers, John A., Martin Fuchs, Matthew J. Banet, John B. Hanselman, Randy Logan e Keith A. Nelson. "Optical system for rapid materials characterization with the transient grating technique: Application to nondestructive evaluation of thin films used in microelectronics". Applied Physics Letters 71, n.º 2 (14 de julho de 1997): 225–27. http://dx.doi.org/10.1063/1.119506.
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