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Livros sobre o tema "Characterization techniques for microelectroniq"

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Autor: Grafiati

Publicado: 7 de julho de 2024

Última modificação: 7 de julho de 2024

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1

John, Lowell, Chen Ray T, Mathur Jagdish P e Society of Photo-optical Instrumentation Engineers., eds. Optical characterization techniques for high-performance microelectronic device manufacturing II: 25-26 October 1995, Austin, Texas. Bellingham, Wash: SPIE, 1995.

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2

Damon, DeBusk, Ajuria Sergio, Society of Photo-optical Instrumentation Engineers., Semiconductor Equipment and Materials International., Solid State Technology (Organization) e Electrochemical Society, eds. In-line characterization techniques for performance and yield enhancement in microelectronic manufacturing: 1-2 October 1997, Austin, Texas. Bellingham, Wash., USA: SPIE, 1997.

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3

Sergio, Ajuria, Hossain Tim Z, Society of Photo-optical Instrumentation Engineers. e Solid State Technology (Organization), eds. In-line characterization techniques for performance and yield enhancement in microelectronic manufacturing II: 23-24 September, 1998, Santa Clara, California. Bellingham, Washington: SPIE, 1998.

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4

Maliva, Robert G. Aquifer Characterization Techniques. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-32137-0.

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5

Campbell, D. Polymer characterization: Physical techniques. London: Chapman and Hall, 1989.

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6

Mike, Resso, e Bogatin Eric, eds. Signal integrity characterization techniques. Chicago, Ill: International Engineering Consortium, 2008.

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7

D, Campbell. Polymer characterization: Physical techniques. London: Chapman and Hall, 1989.

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8

D, Campbell. Polymer characterization: Physical techniques. 2^a ed. Cheltenham, Glos., U.K: S. Thornes, 2000.

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9

Ortiz Ortega, Euth, Hamed Hosseinian, Ingrid Berenice Aguilar Meza, María José Rosales López, Andrea Rodríguez Vera e Samira Hosseini. Material Characterization Techniques and Applications. Singapore: Springer Singapore, 2022. http://dx.doi.org/10.1007/978-981-16-9569-8.

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10

Provder, Theodore, Marek W. Urban e Howard G. Barth, eds. Hyphenated Techniques in Polymer Characterization. Washington, DC: American Chemical Society, 1994. http://dx.doi.org/10.1021/bk-1994-0581.

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11

Mittal, Vikas, ed. Characterization Techniques for Polymer Nanocomposites. Weinheim, Germany: Wiley-VCH Verlag GmbH & Co. KGaA, 2012. http://dx.doi.org/10.1002/9783527654505.

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12

Galina, H., Y. Ikada, K. Kato, R. Kitamaru, J. Lechowicz, Y. Uyama e C. Wu, eds. Grafting/Characterization Techniques/Kinetic Modeling. Berlin, Heidelberg: Springer Berlin Heidelberg, 1998. http://dx.doi.org/10.1007/3-540-69685-7.

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13

Kumar, Challa S. S. R., ed. Magnetic Characterization Techniques for Nanomaterials. Berlin, Heidelberg: Springer Berlin Heidelberg, 2017. http://dx.doi.org/10.1007/978-3-662-52780-1.

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14

Miyoshi, Kazuhisa. Surface characterization techniques: An overview. [Cleveland, Ohio]: National Aeronautics and Space Administration, Glenn Research Center, 2002.

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15

Povey, M. J. W. Ultrasonic techniques for fluids characterization. San Diego: Academic Press, 1997.

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16

H, Galina, ed. Grafting, characterization techniques, kinetic modeling. Berlin: Springer, 1998.

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17

Pacific Coast Regional Meeting (41st 1988 San Francisco, Calif.). Advanced characterization techniques for ceramics. Westerville, Ohio: American Ceramic Society, 1989.

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18

Dr, Tyagi A. K., ed. Advanced techniques for materials characterization. Stafa-Zuerich: Trans Tech, 2009.

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19

Dr, Tyagi A. K., ed. Advanced techniques for materials characterization. Stafa-Zuerich: Trans Tech, 2009.

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20

Franco, Victorino, e Brad Dodrill, eds. Magnetic Measurement Techniques for Materials Characterization. Cham: Springer International Publishing, 2021. http://dx.doi.org/10.1007/978-3-030-70443-8.

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21

Kumar, Challa S. S. R., ed. In-situ Characterization Techniques for Nanomaterials. Berlin, Heidelberg: Springer Berlin Heidelberg, 2018. http://dx.doi.org/10.1007/978-3-662-56322-9.

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22

Nair, Raveendranath U., Maumita Dutta, Mohammed Yazeen P.S. e K. S. Venu. EM Material Characterization Techniques for Metamaterials. Singapore: Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-6517-0.

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23

Solomah, Ahmad G., ed. Indentation Techniques in Ceramic Materials Characterization. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2006. http://dx.doi.org/10.1002/9781118407042.

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24

Rincon, Jesus Ma, e Maximina Romero, eds. Characterization Techniques of Glasses and Ceramics. Berlin, Heidelberg: Springer Berlin Heidelberg, 1999. http://dx.doi.org/10.1007/978-3-662-03871-0.

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25

Ma, Rincon Jesús, e Romero M. 1966-, eds. Characterization techniques of glasses and ceramics. Berlin: Springer, 1999.

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26

Jenkins, Tudor E. Semiconductor science: Growth and characterization techniques. New York: Prentice Hall, 1995.

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27

Cheremisinoff, Nicholas P. Polymer characterization: Laboratory techniques and analysis. Westwood, N.J: Noyes Publications, 1996.

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28

Hirsch, Herbert L. Statistical signal characterization. Boston: Artech House, 1992.

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29

Mittal, Vikas, e Nadejda B. Matsko. Analytical Imaging Techniques for Soft Matter Characterization. Berlin, Heidelberg: Springer Berlin Heidelberg, 2012. http://dx.doi.org/10.1007/978-3-642-30400-2.

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30

Houlding, Simon W. 3D geosciencemodeling: Computer techniques for geological characterization. Berlin: Springer-Verlag, 1994.

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31

1954-, Tong Ho-ming Herbert, e Nguyen Luu T, eds. New characterization techniques for thin polymer films. New York: Wiley, 1990.

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32

Mittal, Vikas. Analytical Imaging Techniques for Soft Matter Characterization. Berlin, Heidelberg: Springer Berlin Heidelberg, 2012.

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33

Prasankumar, Rohit P., e Antoinette J. Taylor. Optical techniques for solid-state materials characterization. Boca Raton: CRC Press, 2011.

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34

B, Imelik, e Védrine Jacques C, eds. Catalyst characterization: Physical techniques for solid materials. New York: Plenum Press, 1994.

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35

1965-, Milling Andrew J., ed. Surface characterization methods: Principles, techniques, and applications. New York: Marcel Dekker, 1999.

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36

Stangoni, Maria Virginia. Scanning probe techniques for dopant profile characterization. Konstanz: Hartung-Gorre Verlag, 2005.

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37

Advanced microelectronic processing techniques: 28-30 November 2000, Singapore. Bellingham, Wash: SPIE, 2000.

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38

Optical characterization techniques for high-performance microelectronic device manufacturing: 20 October 1994, Austin, Texas. Bellingham, Wash., USA: SPIE, 1994.

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39

Debusk, Damon. Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing III: 16-17 October 1996, Austin, Texas. SPIE-International Society for Optical Engine, 1996.

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40

Kumar, Ashok, Lin Li e Sam Zhang. Materials Characterization Techniques. Taylor & Francis Group, 2008.

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41

Li, Lin, e Sam Zhang. Materials Characterization Techniques. CRC, 2008.

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42

Kumar, Rawesh. Surface Characterization Techniques. De Gruyter, 2022. http://dx.doi.org/10.1515/9783110656480.

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43

Zhang, Sam, Lin Li e Ashok Kumar. Materials Characterization Techniques. CRC Press, 2008. http://dx.doi.org/10.1201/9781420042955.

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44

Ramamurthy, Karthik. Opamp characterization techniques. 1993.

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45

Kumar, Ashok, Lin Li e Sam Zhang. Materials Characterization Techniques. Taylor & Francis Group, 2008.

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46

Dinger, Dennis R. Characterization Techniques for Ceramists. Dennis Dinger, 2005.

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47

(Editor), D. Campbell, J. R. White (Editor) e R. A. Pethrick (Editor), eds. Polymer Characterization: Physical Techniques. 2^a ed. International Thomson Publishing Services Ltd, 1999.

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48

Povey, Malcolm J. W. Ultrasonic Techniques for Fluids Characterization. Elsevier Science & Technology Books, 1997.

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49

Ozaki, Yukihiro, e Harumi Sato, eds. Spectroscopic Techniques for Polymer Characterization. Wiley, 2021. http://dx.doi.org/10.1002/9783527830312.

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50

Ultrasonic Techniques for Fluids Characterization. Elsevier, 1997. http://dx.doi.org/10.1016/b978-0-12-563730-5.x5000-4.

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