Literatura científica selecionada sobre o tema "Augmented Metrology"
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Artigos de revistas sobre o assunto "Augmented Metrology"
Poon, Ting-Chung, Yaping Zhang, Liangcai Cao e Hiroshi Yoshikawa. "Editorial on Special Issue “Holography, 3-D Imaging and 3-D Display”". Applied Sciences 10, n.º 20 (11 de outubro de 2020): 7057. http://dx.doi.org/10.3390/app10207057.
Texto completo da fonteSiv, Julie, Rafael Mayer, Guillaume Beaugrand, Guillaume Tison, Rémy Juvénal e Guillaume Dovillaire. "Testing and characterization of challenging optics and optical systems with Shack Hartmann wavefront sensors". EPJ Web of Conferences 215 (2019): 06003. http://dx.doi.org/10.1051/epjconf/201921506003.
Texto completo da fonteNawab, Rahma, e Angela Davies Allen. "Low-Cost AR-Based Dimensional Metrology for Assembly". Machines 10, n.º 4 (30 de março de 2022): 243. http://dx.doi.org/10.3390/machines10040243.
Texto completo da fonteKerst, Thomas, Mohammad Bitarafan, Laura Jokinen, Ilkka Alasaarela, Seppo Tillanen, David Zautasvili e Nikhil Pachhandara. "82‐3: Rapid AR/VR Device Eye‐Box Measurement Using a Wide‐FOV Lens". SID Symposium Digest of Technical Papers 54, n.º 1 (junho de 2023): 1155–57. http://dx.doi.org/10.1002/sdtp.16779.
Texto completo da fonteArpaia, Pasquale, Egidio De Benedetto, Concetta Anna Dodaro, Luigi Duraccio e Giuseppe Servillo. "Metrology-Based Design of a Wearable Augmented Reality System for Monitoring Patient’s Vitals in Real Time". IEEE Sensors Journal 21, n.º 9 (1 de maio de 2021): 11176–83. http://dx.doi.org/10.1109/jsen.2021.3059636.
Texto completo da fonteGonçalves, GL, JU Delgado e FB Razuck. "The use of Augmented Reality for the teaching of dosimetry and metrology of ionizing radiation at IRD". Journal of Physics: Conference Series 1826, n.º 1 (1 de março de 2021): 012041. http://dx.doi.org/10.1088/1742-6596/1826/1/012041.
Texto completo da fonteHo, P. T., J. A. Albajez, J. A. Yagüe e J. Santolaria. "Preliminary study of Augmented Reality based manufacturing for further integration of Quality Control 4.0 supported by metrology". IOP Conference Series: Materials Science and Engineering 1193, n.º 1 (1 de outubro de 2021): 012105. http://dx.doi.org/10.1088/1757-899x/1193/1/012105.
Texto completo da fonteZhao, Lei, e Chaohao Wang. "50.2: Invited Paper: A Closer Look: Advancements in Near‐Eye Display Testing and Metrology". SID Symposium Digest of Technical Papers 54, S1 (abril de 2023): 354–60. http://dx.doi.org/10.1002/sdtp.16303.
Texto completo da fontePrusakov, A. N., V. V. Popadyev e V. F. Pankin. "The Working Week of the International Federation of Surveyors under the motto “From digitalization to augmented reality”". Geodesy and Cartography 926, n.º 8 (20 de setembro de 2017): 25–38. http://dx.doi.org/10.22389/0016-7126-2017-926-8-25-38.
Texto completo da fonteĆirić, Ivan, Milan Banić, Miloš Simonović, Aleksandar Miltenović, Dušan Stamenković e Vlastimir Nikolić. "TOWARDS MACHINE VISION BASED RAILWAY ASSETS PREDICTIVE MAINTENANCE". Facta Universitatis, Series: Automatic Control and Robotics 19, n.º 2 (8 de dezembro de 2020): 125. http://dx.doi.org/10.22190/fuacr2002125c.
Texto completo da fonteTeses / dissertações sobre o assunto "Augmented Metrology"
Bourguignon, Thibaut. "Implémentation et évaluation de la mesure Overlay in-situ par microscopie électronique pour la production de puces électroniques". Electronic Thesis or Diss., Université Grenoble Alpes, 2024. http://www.theses.fr/2024GRALT001.
Texto completo da fonteIntegrated circuits are manufactured via a stack of various layers. The precise alignment of these layers, known as "overlay" (OVL), is critical to chip reliability. The specifications are very strict: on a 300mm-diameter wafer, each pattern must be aligned to within a few nanometres. Current methods, based on optical observation of dedicated test patterns, show their limitations in terms of representativeness and assessment of local variability.This thesis proposes an innovative approach, using scanning electron microscopy (SEM), to accurately measure these local variations and to understand the biases induced by the test patterns. To this end, an algorithm for measuring the overlay from SEM contours has been developed. By registering reference contours on the extracted contours, the overlay is measured directly on the product, without the need for a specific test pattern, even in the presence of partially masked levels.Following the evaluation of this method on synthetic images, its application to production wafers enabled us to quantify the local variability of the overlay on the product, highlighting deviations from on-line measurements, while revealing the limits of SEM-OVL metrology
Trabalhos de conferências sobre o assunto "Augmented Metrology"
Schmid, Stephan, e Dieter Fritsch. "Precision analysis of triangulations using forward-facing vehicle-mounted cameras for augmented reality applications". In SPIE Optical Metrology, editado por Fabio Remondino e Mark R. Shortis. SPIE, 2017. http://dx.doi.org/10.1117/12.2269716.
Texto completo da fonteMigukin, Artem, Vladimir Katkovnik e Jaakko Astola. "Optimal phase retrieval from multiple observations with Gaussian noise: augmented Lagrangian algorithm for phase objects". In SPIE Optical Metrology, editado por Peter H. Lehmann, Wolfgang Osten e Kay Gastinger. SPIE, 2011. http://dx.doi.org/10.1117/12.889118.
Texto completo da fonteGaglione, S., A. Angrisano, G. Castaldo, C. Gioia, A. Innac, L. Perrotta, G. Del Core e S. Troisi. "GPS/Barometer augmented navigation system: Integration and integrity monitoring". In 2015 IEEE Metrology for Aerospace (MetroAeroSpace). IEEE, 2015. http://dx.doi.org/10.1109/metroaerospace.2015.7180647.
Texto completo da fonteWinters, Daniel, Masashi Mitsui, Masamichi Ueda, Sven Sassning, Mohit Yadav, Patrik Langehanenberg e Jan-Hinrich Eggers. "High-precision 3D metrology for stacked diffractive augmented reality waveguides". In Optifab 2023, editado por Jessica DeGroote Nelson e Blair L. Unger. SPIE, 2023. http://dx.doi.org/10.1117/12.2688509.
Texto completo da fontePlopski, Alexander, Varunyu Fuvattanasilp, Jarkko Poldi, Takafumi Taketomi, Christian Sandor e Hirokazu Kato. "Efficient In-Situ Creation of Augmented Reality Tutorials". In 2018 Workshop on Metrology for Industry 4.0 and IoT. IEEE, 2018. http://dx.doi.org/10.1109/metroi4.2018.8428320.
Texto completo da fonteHua, Hong. "Lightweight, Low-cost Augmented Reality Displays Enabled by Freeform Optical Technology". In Applied Industrial Optics: Spectroscopy, Imaging and Metrology. Washington, D.C.: OSA, 2013. http://dx.doi.org/10.1364/aio.2013.aw1b.4.
Texto completo da fonteNotaros, Jelena, Milica Notaros, Manan Raval, Christopher V. Poulton, Matthew J. Byrd, Nanxi Li, Zhan Su et al. "Integrated Optical Phased Arrays for LiDAR, Communications, Augmented Reality, and Beyond". In Applied Industrial Optics: Spectroscopy, Imaging and Metrology. Washington, D.C.: OSA, 2021. http://dx.doi.org/10.1364/aio.2021.m2a.3.
Texto completo da fonteMacmahon, Nelson Sosa, Juan Manuel Ramírez Cortés e Leopoldo Altamirano Robles. "Simulator in Augmented Reality Environment for Natural Interaction for Assembling Electrical Equipment". In Applied Industrial Optics: Spectroscopy, Imaging and Metrology. Washington, D.C.: OSA, 2012. http://dx.doi.org/10.1364/aio.2012.jtu5a.22.
Texto completo da fonteKellogg, James, Kathleen Andrea-Liner, Jennifer Jennings, Steven Timms, Robert C. Keramidas, Johnnie Berry, Tony DeLaCruz et al. "Augmented reality assisted astronaut operations in space to upgrade the cold atom lab instrument". In Quantum Sensing, Imaging, and Precision Metrology, editado por Selim M. Shahriar e Jacob Scheuer. SPIE, 2023. http://dx.doi.org/10.1117/12.2650750.
Texto completo da fonteNeagu, Carina Sonia, Andreea Codruta Cojocariu, Cristian Zaharia, Mihai Rominu, Meda-Lavinia Negrutiu, Virgil-Florin Duma e Cosmin Sinescu. "The evaluation of dental adhesives augmented with magnetic nanoparticles". In Advances in 3OM: Opto-Mechatronics, Opto-Mechanics, and Optical Metrology, editado por Jannick P. Rolland, Virgil-Florin Duma e Adrian G. H. Podoleanu. SPIE, 2022. http://dx.doi.org/10.1117/12.2613382.
Texto completo da fonte