Livros sobre o tema "22~nm"
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Veja os 16 melhores livros para estudos sobre o assunto "22~nm".
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IEEE, International Nonvolatile Memory Technology Conference (7th 1998 Albuquerque New Mexico). Seventh biennial IEEE Nonvolatile Memory Technology Conference: Proceedings : 1998 conference : June 22-24, 1998, Albuquerque, NM, USA. Piscataway, N.J: IEEE, 1998.
Encontre o texto completo da fonteIEEE Geoscience and Remote Sensing Society., Lasers and Electro-optics Society (Institute of Electrical and Electronics Engineers) e IEEE Microwave Theory and Techniques Society., eds. Topical Symposium on Combined Optical-microwave Earth and Atmosphere Sensing: Conference proceedings, March 22-25, 1993, Albuquerque, NM. Piscataway, NJ: Institute of Electrical and Electronics Engineers, 1993.
Encontre o texto completo da fonteWang, Guilei. Investigation on SiGe Selective Epitaxy for Source and Drain Engineering in 22 nm CMOS Technology Node and Beyond. Singapore: Springer Singapore, 2019. http://dx.doi.org/10.1007/978-981-15-0046-6.
Texto completo da fonteSymposium, on Time-of-Flight Diffraction at Pulsed Neutron Sources (1993 Albuquerque N. M. ). Proceedings of the Symposium on Time-of-Flight Diffraction at Pulsed Neutron Sources: At Albuquerque Convention Center, Albuquerque, NM, May 22-28, 1993. Buffalo, NY: American Crystallographic Association, 1994.
Encontre o texto completo da fonteCenter for Nonlinear Studies. International Conference. Nonlinearity in materials science: Proceedings of the twelfth annual International Conference of the Center for Nonlinear Studies, Los Alamos, NM 87545, USA, 18-22 May 1992. Editado por Bishop Alan, Ecke R e Gubernatis James. Amsterdam: North-Holland, 1993.
Encontre o texto completo da fonteCenter of Nonlinear Studies. International Conference. Nonlinearity in biology and medicine: Proceedings of theseventh annual international conference of the Center for Nonlinear Studies, Los Alamos National Laboratory, Los Alamos, NM 87545, USA, May 18-22, 1987. Editado por Perelson Alan S. New York: Elsevier, 1988.
Encontre o texto completo da fonteLabor, United States Congress House Committee on Education and. Civil Rights Restoration Act of 1985: Joint hearings before the Committee on Education and Labor, and the Subcommittee on Civil and Constitutional Rights of the Committee on the Judiciary, House of Representatives, Ninety-ninth Congress, first session on H.R. 700 ... hearings held in Philadelphia, PA, March 4; Washington, DC, March 7, 27, 28, and April 2; Atlanta, GA, March 11; Chicago, Il, March 15; Los Angeles, CA, March 22; and Santa Fe, NM, March 25, 1985. Washington: U.S. G.P.O., 1986.
Encontre o texto completo da fonteBalasinski, Artur. Design for Manufacturability: From 1d to 4D for 90 22 NM Technology Nodes. Springer New York, 2016.
Encontre o texto completo da fonteBalasinski, Artur. Design for Manufacturability: From 1D to 4D for 90–22 nm Technology Nodes. Springer, 2013.
Encontre o texto completo da fonteBalasinski, Artur. Design for Manufacturability: From 1D to 4D for 90-22 Nm Technology Nodes. Springer London, Limited, 2013.
Encontre o texto completo da fonteSeventh biennial IEEE Nonvolatile Memory Technology Conference: Proceedings : 1998 conference : June 22-24, 1998, Albuquerque, NM, USA. IEEE, 1998.
Encontre o texto completo da fonteTopical Symposium on Combined Optical-microwave Earth and Atmosphere Sensing: Conference proceedings, March 22-25, 1993, Albuquerque, NM. Institute of Electrical and Electronics Engineers, 1993.
Encontre o texto completo da fonteWang, Guilei. Investigation on SiGe Selective Epitaxy for Source and Drain Engineering in 22 nm CMOS Technology Node and Beyond. Springer, 2019.
Encontre o texto completo da fonteNew Mexico) IEEE International Nonvolatile Memory Technology Conference (7th : 1998 : Albuquerque. Seventh Biennial IEEE International Nonvolatile Memory Technology Conference: Proceedings 1998 Converence June 22-24, 1998 Albuquerque, Nm USA. Institute of Electrical & Electronics Enginee, 1998.
Encontre o texto completo da fonteWang, Guilei. Investigation on Sige Selective Epitaxy for Source and Drain Engineering in 22 Nm CMOS Technology Node and Beyond. Springer Singapore Pte. Limited, 2020.
Encontre o texto completo da fonteConference Proceedings: Topical Symposium on Combined Optical-Microwave Earth and Atmosphere Sensing March 22-25, 1993 Albuquerque, Nm/93Th0519-9. Ieee, 1993.
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