Gotowa bibliografia na temat „TEM ANALYSIS”
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Artykuły w czasopismach na temat "TEM ANALYSIS"
Du, Z. W., A. S. Liu, B. L. Shao, Z. Y. Zhang, X. S. Zhang i Z. M. Sun. "TEM analysis of Gd5Si1.85Ge2.15 alloy". Materials Characterization 59, nr 9 (wrzesień 2008): 1241–44. http://dx.doi.org/10.1016/j.matchar.2007.10.005.
Pełny tekst źródłaRajan, Krishna, i Peter Sewell. "Surface Analysis in the TEM". JOM 38, nr 10 (październik 1986): 34–35. http://dx.doi.org/10.1007/bf03258578.
Pełny tekst źródłaMizunaga, Hideki, i Toshiaki Tanaka. "Development of Temtool for TEM analysis". BUTSURI-TANSA(Geophysical Exploration) 67, nr 2 (2014): 135–42. http://dx.doi.org/10.3124/segj.67.135.
Pełny tekst źródłaOkamoto, Tatsuki, Masaki Kanegami i Naohiro Hozumi. "TEM Analysis of Polyethylene with EELS". IEEJ Transactions on Fundamentals and Materials 118, nr 7-8 (1998): 767–72. http://dx.doi.org/10.1541/ieejfms1990.118.7-8_767.
Pełny tekst źródłaHIROSE, Yukinori, i Koji FUKUMOTO. "Evaluation and Analysis Technique Using TEM". Journal of the Surface Finishing Society of Japan 54, nr 1 (2003): 21–25. http://dx.doi.org/10.4139/sfj.54.21.
Pełny tekst źródłaStöger-Pollach, M., A. Steiger-Thirsfeld i S. Schwarz. "Low voltage TEM for semiconductor analysis". Journal of Physics: Conference Series 326 (9.11.2011): 012027. http://dx.doi.org/10.1088/1742-6596/326/1/012027.
Pełny tekst źródłaRowlands, Neil, i Simon Burgess. "Energy dispersive analysis in the TEM". Materials Today 12 (2010): 46–48. http://dx.doi.org/10.1016/s1369-7021(10)70145-0.
Pełny tekst źródłaDahmen, U., N. Thangaraj i R. Kilaas. "Quantitative TEM analysis of microstructural anisotropy". Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 682–83. http://dx.doi.org/10.1017/s0424820100171146.
Pełny tekst źródłaBauer, Natalie, Jyoti Rai, Hairu Chen, Lillianne Harris, Lalita Shevde, Tim Moore i Judy King. "Microparticles/Exosomes: Isolation and TEM Analysis". Microscopy Today 17, nr 2 (marzec 2009): 42–45. http://dx.doi.org/10.1017/s1551929500054493.
Pełny tekst źródłaNeumann, Wolfgang, Holm Kirmse, Ines Häusler, Reinhard Otto i Irmela Hähnert. "Quantitative TEM analysis of quantum structures". Journal of Alloys and Compounds 382, nr 1-2 (listopad 2004): 2–9. http://dx.doi.org/10.1016/j.jallcom.2004.05.066.
Pełny tekst źródłaRozprawy doktorskie na temat "TEM ANALYSIS"
Foo, Seng-Lee. "Analysis of electromagnetic fields in loaded TEM cells". Thesis, University of Ottawa (Canada), 1988. http://hdl.handle.net/10393/5170.
Pełny tekst źródłaKylberg, Gustaf. "Automatic Virus Identification using TEM : Image Segmentation and Texture Analysis". Doctoral thesis, Uppsala universitet, Avdelningen för visuell information och interaktion, 2014. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-217328.
Pełny tekst źródłaHajduček, Jan. "Zobrazování metamagnetických tenkých vrstev pomocí TEM". Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2021. http://www.nusl.cz/ntk/nusl-443233.
Pełny tekst źródłaNord, Magnus Kristofer. "Quantitative (S)TEM analysis of intermediate band solar cell materials". Thesis, Norges teknisk-naturvitenskapelige universitet, Institutt for fysikk, 2011. http://urn.kb.se/resolve?urn=urn:nbn:no:ntnu:diva-13655.
Pełny tekst źródłaElFallagh, Fathi Ali. "3D Analysis of Indentation Damage by FIB tomography and TEM". Thesis, University of Sheffield, 2008. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.500111.
Pełny tekst źródłaMcLaughlin, Kirsten Kathleen. "TEM diffraction analysis of the deformation underneath low load indentations". Thesis, University of Cambridge, 2007. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.613392.
Pełny tekst źródłaSears, Jasmine, Ricky Gibson, Michael Gehl, Sander Zandbergen, Patrick Keiffer, Nima Nader, Joshua Hendrickson, Alexandre Arnoult i Galina Khitrova. "TEM EDS analysis of epitaxially-grown self-assembled indium islands". AMER INST PHYSICS, 2017. http://hdl.handle.net/10150/624718.
Pełny tekst źródłaIssa, Inas. "In situ TEM nanocompression and mechanical analysis of ceramic nanoparticles". Thesis, Lyon, 2016. http://www.theses.fr/2016LYSEI008/document.
Pełny tekst źródłaIn this study, we propose an innovative mechanical observation protocol of ceramics nanoparticles in the 100nm size range. This Protocol consists of in situ TEM nanocompression tests of isolated nanoparticles. Load–real displacements curves, obtained by Digital Image Correlation, are analyzed and these analyses are correlated with Molecular Dynamics simulations. By this protocol a constitutive law with its mechanical parameters (Young modulus, Yield stress...) of the studied material at the nano-scale can be obtained. In situ TEM nano-compression tests on magnesium oxide nanocubes are performed. Magnesium oxide is a model material and its plasticity is very well known at bulk. The MgO nanocubes show large plastic deformation, more than 50% of plastic strain without any fracture. The TEM results are correlated to MD simulations and the deformation mechanism can be identified.The size effect and the electron beam effect on the yield strength are investigated. In a second part of the dissertation, we present a study on transition alumina nanoparticles compacted in a Diamond Anvil Cell at different uniaxial pressures. Thin Foils of these compacted nanoparticles are prepared by FIB for HRTEM Observations. Their analysis reveals the plastic deformation of the nanoparticles. The crystallographic texture observed inthese compacted nanoparticles in DAC shows a preferred orientation of the {110} lattice planes, orientated perpendicular to the compression direction. This is compatible with the slip system. This argument was reinforced with a preferred orientation of slip bands observed during in situ TEM nano-compression tests. Moreover, electron diffraction patterns (Debye Scherrer) analysis on these compacted transition alumina nanoparticles reveals the decrease of the presence of gamma-alumina and the increase of delta-alumina with increasing pressure. This reveals the phase transformation with increasing pressure from gamma to delta* alumina
King, Jason Peters King. "An investigation of spin-valves and related films by TEM". Thesis, University of Glasgow, 1999. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.301949.
Pełny tekst źródłaWoonbumroong, Apinya. "Fresnel contrast analysis and analytical TEM study of grain boundaries in electroceramics". Thesis, University of Cambridge, 1999. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.624490.
Pełny tekst źródłaKsiążki na temat "TEM ANALYSIS"
Henning, K. H. Electron micrographs (TEM, SEM) of clays and clay minerals. Berlin: Akademie-Verlag, 1986.
Znajdź pełny tekst źródłaHaron, Sharifah Zabidah. Aspects of tea analysis. Salford: University of Salford, 1991.
Znajdź pełny tekst źródłaClemente, Filipe Manuel, Fernando Manuel Lourenço Martins i Rui Sousa Mendes. Social Network Analysis Applied to Team Sports Analysis. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-25855-3.
Pełny tekst źródłaPassos, Pedro. Performance Analysis in Team Sports. Abingdon, Oxon ; New York, NY : Routledge is an imprint of the: Routledge, 2016. http://dx.doi.org/10.4324/9781315739687.
Pełny tekst źródła1973-, Coliva Annalisa, red. Filosofia analitica: Temi e problemi. Roma: Carocci, 2007.
Znajdź pełny tekst źródłaChen, Yen-Sen. Lox manifold tee analysis: Final report. Huntsville, Ala: SECA, Inc., 1990.
Znajdź pełny tekst źródłaCommerce, Ceylon Chamber of. Tea sector statistical analysis, 2012-2013. Colombo: The Ceylon Chamber of Commerce, 2014.
Znajdź pełny tekst źródłaGuzʹ, Aleksandr Nikolaevich. Trekhmernai͡a︡ teorii͡a︡ ustoĭchivosti deformiruemykh tel. Kiev: Nauk. dumka, 1985.
Znajdź pełny tekst źródłaUnited States. National Aeronautics and Space Administration., red. Transient Ejector Analysis (TEA) code user's guide. [Washington, DC: National Aeronautics and Space Administration, 1993.
Znajdź pełny tekst źródłaGeological Survey (U.S.), red. Geologic hazards team. [Reston, Va.?]: U.S. Dept. of the Interior, U.S. Geological Survey, 1997.
Znajdź pełny tekst źródłaCzęści książek na temat "TEM ANALYSIS"
McHendry, P., AJ Craven i LJ Murphy. "TEM studies of organic pigments". W Electron Microscopy and Analysis 1997, 665–68. Boca Raton: CRC Press, 2022. http://dx.doi.org/10.1201/9781003063056-172.
Pełny tekst źródłaRambousky, R., i H. Garbe. "Analysis of Open TEM-Waveguide Structures". W Ultra-Wideband, Short-Pulse Electromagnetics 10, 49–58. New York, NY: Springer New York, 2013. http://dx.doi.org/10.1007/978-1-4614-9500-0_4.
Pełny tekst źródłaLi, Xiu, Guoqiang Xue i Changchun Yin. "Velocity Analysis of TEM Pseudo Wave Field". W Migration Imaging of the Transient Electromagnetic Method, 105–23. Singapore: Springer Singapore, 2016. http://dx.doi.org/10.1007/978-981-10-2708-6_6.
Pełny tekst źródłaKirkland, A. I., W. O. Saxton i R. Meyer. "Super resolved microscopy and aberration determination in the TEM." W Electron Microscopy and Analysis 1997, 105–8. Boca Raton: CRC Press, 2022. http://dx.doi.org/10.1201/9781003063056-26.
Pełny tekst źródłaVoelkl, E., L. F. Allard, J. Bruley, V. J. Keast i D. B. Williams. "The teaching of TEM by telepresence microscopy over the internet". W Electron Microscopy and Analysis 1997, 45–48. Boca Raton: CRC Press, 2022. http://dx.doi.org/10.1201/9781003063056-10.
Pełny tekst źródłaKondo, Y., H. Ohnishi, Q. Ru, H. Kimata i K. Takayanagi. "Newly developed UHV-FE-HR-TEM for particle surface studies". W Electron Microscopy and Analysis 1997, 241–44. Boca Raton: CRC Press, 2022. http://dx.doi.org/10.1201/9781003063056-62.
Pełny tekst źródłaBlank, V. D., B. A. Kulnitskiy, Ye V. Tatyanin i O. M. Zhigalina. "TEM study of the crystalline and amorphous phases in C60". W Electron Microscopy and Analysis 1997, 593–96. Boca Raton: CRC Press, 2022. http://dx.doi.org/10.1201/9781003063056-154.
Pełny tekst źródłaKylberg, Gustaf, Ida-Maria Sintorn i Gunilla Borgefors. "Towards Automated TEM for Virus Diagnostics: Segmentation of Grid Squares and Detection of Regions of Interest". W Image Analysis, 169–78. Berlin, Heidelberg: Springer Berlin Heidelberg, 2009. http://dx.doi.org/10.1007/978-3-642-02230-2_18.
Pełny tekst źródłaGupta, Anindya, Amit Suveer, Joakim Lindblad, Anca Dragomir, Ida-Maria Sintorn i Nataša Sladoje. "Convolutional Neural Networks for False Positive Reduction of Automatically Detected Cilia in Low Magnification TEM Images". W Image Analysis, 407–18. Cham: Springer International Publishing, 2017. http://dx.doi.org/10.1007/978-3-319-59126-1_34.
Pełny tekst źródłaMacLaren, I., i C. B. Ponton. "TEM investigation of hydrothermally synthesised Ba(Mg1/3Ta2/3)O3, powders". W Electron Microscopy and Analysis 1997, 531–34. Boca Raton: CRC Press, 2022. http://dx.doi.org/10.1201/9781003063056-137.
Pełny tekst źródłaStreszczenia konferencji na temat "TEM ANALYSIS"
Chong, H. B., Brandon Van Leer, V. Narang i M. Y. Ho. "Sideways FIB TEM sample preparation for improved construction analysis in TEM". W 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012). IEEE, 2012. http://dx.doi.org/10.1109/ipfa.2012.6306257.
Pełny tekst źródłaChen, S. Y., W. Yang, G. F. Xu i C. T. Liu. "TEM EELS analysis for DRAM failure analysis". W 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). IEEE, 2021. http://dx.doi.org/10.1109/ipfa53173.2021.9617371.
Pełny tekst źródłaIanconescu, Reuven, i Vladimir Vulfin. "TEM transmission line radiation losses analysis". W 2016 46th European Microwave Conference (EuMC). IEEE, 2016. http://dx.doi.org/10.1109/eumc.2016.7824381.
Pełny tekst źródłaXiaoding Cai. "Analysis of longitudinal characteristics TEM cells". W International Symposium on Electromagnetic Compatibility. IEEE, 1989. http://dx.doi.org/10.1109/isemc.1989.240866.
Pełny tekst źródłaEsa, S. R., R. Yahya, A. Hassan i G. Omar. "Copper oxidation study by TEM". W 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012). IEEE, 2012. http://dx.doi.org/10.1109/ipfa.2012.6306315.
Pełny tekst źródłaLin, Ching-Chun, Jay Wang i Kim Hsu. "TEM applications for III-V material analysis". W 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). IEEE, 2017. http://dx.doi.org/10.1109/ipfa.2017.8060204.
Pełny tekst źródłaDu, A. Y., J. Zhu, Y. K. Zhou, B. H. Liu, Eddie Er, Z. Q. Mo, S. P. Zhao i Jeffrey Lam. "Advanced TEM applications in semiconductor devices". W 2014 IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). IEEE, 2014. http://dx.doi.org/10.1109/ipfa.2014.6898193.
Pełny tekst źródłaZhu, Xiangqin, Weiqing Chen, Zaigao Chen i Jianguo Wang. "Analysis of TEM Horn with Dielectric Loaded". W 2018 IEEE International Conference on Computational Electromagnetics (ICCEM). IEEE, 2018. http://dx.doi.org/10.1109/compem.2018.8496637.
Pełny tekst źródłaLee, Tan-Chen, Jui-Yen Huang, Li-Chien Chen, Ruey-Lian Hwang i David Su. "Methodology for TEM Analysis of Barrier Profiles". W ISTFA 2002. ASM International, 2002. http://dx.doi.org/10.31399/asm.cp.istfa2002p0689.
Pełny tekst źródłaFuhrmann, T., J. Pletzer i A. Uhl. "Computer assisted morphometric analysis of TEM images". W IET 3rd International Conference MEDSIP 2006. Advances in Medical, Signal and Information Processing. IEE, 2006. http://dx.doi.org/10.1049/cp:20060362.
Pełny tekst źródłaRaporty organizacyjne na temat "TEM ANALYSIS"
Kass, M. A., Yaoguo Li, Richard Krahenbuhl, Misac Nabighian i Douglas Oldenburg. Enhancement of TEM Data and Noise Characterization by Principal Component Analysis. Fort Belvoir, VA: Defense Technical Information Center, maj 2010. http://dx.doi.org/10.21236/ada571505.
Pełny tekst źródłaGerberich, W. W. Micromechanisms of brittle fracture: STM, TEM and electron channeling analysis. Final report. Office of Scientific and Technical Information (OSTI), styczeń 1997. http://dx.doi.org/10.2172/463626.
Pełny tekst źródłaPercival, J. B., T. Jensen, K. Wasyliuk, G. Drever, J. Sader, M. Sarfi, P A Hunt, C. Bibby, S. Wong i A. Enright. EXTECH IV mineralogical database: XRD, infrared and TEM analyses. Natural Resources Canada/ESS/Scientific and Technical Publishing Services, 2012. http://dx.doi.org/10.4095/292112.
Pełny tekst źródłaCalahorra-Jimenez, Maria. Contracting Strategies: A Different Approach to Address Long-term Performance. Mineta Transportation Institute, lipiec 2022. http://dx.doi.org/10.31979/mti.2021.2130.
Pełny tekst źródłaCalahorra-Jimenez, Maria. Contracting Strategies: A Different Approach to Address Long-term Performance. Mineta Transportation Institute, lipiec 2022. http://dx.doi.org/10.31979/mti.2022.2130.
Pełny tekst źródłaAponte, C. I. Supernate source term analysis: Revision 1. Office of Scientific and Technical Information (OSTI), październik 1994. http://dx.doi.org/10.2172/10105057.
Pełny tekst źródłaAuthor, Not Given. Vehicle Systems Analysis Technical Team Roadmap. Office of Scientific and Technical Information (OSTI), czerwiec 2013. http://dx.doi.org/10.2172/1220129.
Pełny tekst źródłaAllison, Ralph E., i Jr. Analysis of First-Term Army Attrition. Fort Belvoir, VA: Defense Technical Information Center, kwiecień 1999. http://dx.doi.org/10.21236/ada362968.
Pełny tekst źródłaCanto, Patricia, red. Lessons to be learnt for initiatives to promote cross-border collaboration: an experience in the New Aquitaine-Euskadi-Navarre euroregion. Universidad de Deusto, 2022. http://dx.doi.org/10.18543/xjrt7954.
Pełny tekst źródłaSawan, M. E., G. L. Kulcinski i D. L. Henderson. Nuclear Analysis for Near Term Fusion Devices. Office of Scientific and Technical Information (OSTI), kwiecień 2007. http://dx.doi.org/10.2172/901591.
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