Gotowe bibliografie tematyczne / Surface analysis

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Gotowa bibliografia na temat „Surface analysis”

Autor: Grafiati

Data publikacji: 4 czerwca 2021

Data aktualizacji: 18 maja 2024

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Artykuły w czasopismach na temat "Surface analysis"

Chan, Chi-Ming, Lu-Tao Wang i Lin Li. "Applications of Surface Analysis Techniques in Surface Characterization of Polymer Surfaces and Interfaces". Journal of The Adhesion Society of Japan 38, nr 5 (2002): 173–92. http://dx.doi.org/10.11618/adhesion.38.173.

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Gautier-Soyer, M., H. Cruguel, M. J. Guittet, O. Kerjan, F. Bart i L. Bois. "Surface Analysis of Oxide Glass Surfaces:". Journal of Surface Analysis 9, nr 3 (2002): 446–50. http://dx.doi.org/10.1384/jsa.9.446.

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Bowditch, Brian H. "Atoroidal Surface Bundles Over Surfaces". Geometric and Functional Analysis 19, nr 4 (27.11.2009): 943–88. http://dx.doi.org/10.1007/s00039-009-0033-3.

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BAYKUR, R. İNANÇ, i DAN MARGALIT. "INDECOMPOSABLE SURFACE BUNDLES OVER SURFACES". Journal of Topology and Analysis 05, nr 02 (20.05.2013): 161–81. http://dx.doi.org/10.1142/s179352531350009x.

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For each pair of integers g ≥ 2 and h ≥ 1, we explicitly construct infinitely many fiber sum and section sum indecomposable genus g surface bundles over genus h surfaces whose total spaces are pairwise homotopy inequivalent.

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Meshkini Far, R., A. Dyachenko, O. Bieda i O. Ischenko. "Surface species investigation of Ni-Fe catalysts of CO2 hydrogenation by TD MS analysis". Surface 9(24) (30.12.2017): 104–10. http://dx.doi.org/10.15407/surface.2017.09.104.

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Koguchi, Hideo. "Adhesion Analysis Considering Surface Energy and Surface Stresses". Key Engineering Materials 297-300 (listopad 2005): 1736–41. http://dx.doi.org/10.4028/www.scientific.net/kem.297-300.1736.

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A new formulation for an adhesive force between a substrate and an indenter is presented. The boundary condition taking into account surface stresses is used for the present analysis. The surface stress is originated from surface energy. A paraboloidal indenter is pressed to the substrate, and then adhesion occurs between both surfaces. Surface energy and surface stress will vary at the adhesion surface, and then the surfaces deform in a concave way. An attractive force occurs to keep the contact of two adhesion surfaces. In the present paper, an effect of surface stress on the adhesive force will be clarified.

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HOSHI, Takahiro. "Surface Analysis". Journal of the Japan Society of Colour Material 76, nr 5 (2003): 204–9. http://dx.doi.org/10.4011/shikizai1937.76.204.

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Yarwood, J. "Surface analysis". Analytical Proceedings 30, nr 1 (1993): 13. http://dx.doi.org/10.1039/ap9933000013.

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Lyman, Charles. "Surface Analysis". Microscopy Today 24, nr 2 (marzec 2016): 7. http://dx.doi.org/10.1017/s1551929515001285.

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Sommer, D., i H. P. Dickhoven. "Surface analysis on industrial surfaces ? now comparable". Fresenius' Journal of Analytical Chemistry 353, nr 5-8 (1995): 541–43. http://dx.doi.org/10.1007/bf00321318.

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Rozprawy doktorskie na temat "Surface analysis"

Gul-E-Saman. "Surface analysis using polarisation". Thesis, University of York, 2012. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.583351.

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Unpolarised light incident on a surface acquires partial polarisation due to the orientation of the dipoles in the scatterer. This thesis focuses on the use of polarised light for diffuse reflectance for surface analysis. Since, the state of polarisation is acquired on interaction with the surface, the polarised light contains information about the surface properties (of the scatterer). A great amount of research has been carried out in computer vision for surface analysis using image analysis techniques. Recently, the trend has been to combine optical techniques with computer vision in order to arrive at better analysis techniques by methods that analyse the intrinsic qualities of the surfaces under study. An overview of the recent work that has been carried out in the field is given in Chapter 2 in context to this thesis. The contributions of this thesis are: 1. the robust computation of polarisation image using M-estimators, the smoothing of phase of polarisation by using directional statistics and using the calculated parameters for effective surface recovery, 2. estimation of the refractive index of a diverse set of surfaces of known and unknown refractive indices and using the estimates for segmentation, 3. estimating the complex refractive index which incorporates the phenomenon of absorption by two methods existing in literature, using a. ellipsometry and b. multiple polarisation measurements while building up on the case of surface analysis being related to its optical properties and 4. carrying out a preliminary study by modifying the geometric factor of the polarimetric bidirectional reflectance distribution function. Experimental evidence has been presented in the thesis for the methods that have been used for a variety of objects with varying geometrical and surface properties. The approach in this thesis has been to adopt simple and adaptable techniques that can be easily employed without the use of sophisticated equipment.

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Lund, Christopher Paul. "Surface spectroscopy and Auger lineshape analysis studies of amorphous silicon surfaces". Thesis, Lund, Christopher Paul (1993) Surface spectroscopy and Auger lineshape analysis studies of amorphous silicon surfaces. PhD thesis, Murdoch University, 1993. https://researchrepository.murdoch.edu.au/id/eprint/42221/.

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This work deals with the experimental investigation of the surface of one of the most interesting and important new semiconductor materials, hydrogenated amorphous silicon (a-Si:H). Ultra-high vacuum surface spectroscopy methods, especially Auger lineshape analysis and X-ray photoelectron spectroscopy (XPS), have been used with a view to studying the effect on the local densities of states at the surface of various preparation methods and subsequent treatments. X-ray excited Si L2,3VV and Si L1L2,3V Auger lines as well as XPS valence band (XPS VB) spectra have been measured for a number of silicon materials and surfaces prepared in different ways. These materials included crystalline silicon (c-Si), amorphous silicon (a-Si) and hydrogenated amorphous silicon (a-Si:H). Preparation techniques used included atmospheric pressure chemical vapour deposition (APCVD), glow discharge (GD) or plasma enhanced CVD and radio frequency (RF) sputtering. Surface treatments included disordering of c-Si by argon ion bombardment, hydrogenation by hydrogen ion bombardment, annealing and rehydrogenation from the bulk. Methods have been developed and thoroughly tested to enable X-ray excited silicon Auger spectra to be treated routinely using numerical debroadening and deconvolution to obtain an indication of the valence band transition densities of states (VBTDOS). These show good agreement with previously published results for electron initiated Auger spectra and theoretical results. In particular a method has been developed for treating the experimentally difficult Si L1L2,3V Auger line. Techniques have been developed to remove the sloping background and Coster-Kronig broadening to enable an indication of the transition densities of states. The L1L2,3V derived VBTDOS approximates closely to the theoretical DOS and the experimental results obtained from UPS and XPS. It is shown that because of this the Si L1L2,3V line is a more effective method of monitoring changes in the surface VBTDOS of a-Si:H due to various treatments than the more commonly used but harder to interpret Si L2,3VV line. A method based on the simplex algorithm has been applied to enable the Si L2,3VV and Si L1L2,3V spectra to be decomposed (decoupled) into their component (p-, sp- and s/L2H like) peaks. Changes in the relative contributions of these components have been compared with changes induced by disordering and hydrogenation. It is shown that both the Si L2,3VV and Si L1L2,3V lines give a semiquantitative method for monitoring hydrogen incorporation and changes in the localised states near the valence band edge. Results are presented for varying amounts of disorder (or amorphousness) produced by argon ion bombardment of the surface. A number of results are ·presented· for artificial and naturally hydrogenated surfaces as well as for different deposition techniques. AES and XPS are shown to be very sensitive to changes in disorder (amorphousness) and hydrogen bonding in a-Si:H. The L1L2,3V Auger spectrum is found to be particularly sensitive. Both the AES and XPS VB spectra for a disordered c-Si sample give new information on the affect of disorder on the DOS. The L1L2,3V Auger line is also shown to be sensitive to varying degrees of disorder. Si L2,3VV and L1L2,3V spectra are successfully used to study the effect of several rehydrogenation methods on a-Si. These methods are shown to lead to different amounts of hydrogen in the surface as well as differences in the type of hydrogen bonding. A-Si:H prepared using different techniques is shown to have differences in the amount of order and hydrogen present in the films produced. The deposition technique is also seen to effect the type of hydrogen bonding present in the surface. A novel transfer vessel has been constructed to enable samples prepared in one system to be analysed in another UHV system without exposure to air and the subsequent contamination of the surface. Results are presented for a pure, 'as deposited' surface of a-Si:H prepared by GD. The 'as deposited' surface is shown to be significantly different to one that has been argon ion cleaned and then rehydrogenated. Also using the transfer method changes in the Si L1L2,3V, Si L2,3VV and XPS VB spectra were studied for an a-Si:H surface after heating above the first desorption threshold for hydrogen. This enables the effect of different Si-H bonding configurations on the VBDOS to be studied.

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Perkins, John Bigelow Jones Lawrence R. "Surface ship overhaul decision analysis". Monterey, Calif. : Springfield, Va. : Naval Postgraduate School ; Available from National Technical Information Service, 1992. http://handle.dtic.mil/100.2/ADA260623.

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Duncan, S. "Ion erosion in surface analysis". Thesis, Loughborough University, 1985. https://dspace.lboro.ac.uk/2134/28023.

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Low energy ion bombardment is a process used in surface analysis and in the electronics and telecommunications industries. Techniques such as Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS) and Secondary Ion Mass Spectroscopy (SIMS) employ ion bombardment for surface cleaning and for the provision of composition-depth profiles.

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LaBute, Gerard Joseph. "Pseudo-Bayesian response surface analysis". Thesis, National Library of Canada = Bibliothèque nationale du Canada, 1998. http://www.collectionscanada.ca/obj/s4/f2/dsk2/tape15/PQDD_0001/MQ34971.pdf.

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Taylor, Michael. "Surface analysis of polymer microarrays". Thesis, University of Nottingham, 2009. http://eprints.nottingham.ac.uk/10717/.

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Polymers have been used as biomaterials for nearly a century and have recently become the material of choice for use in tissue engineering. However, the classes of biodegradable and biocompatible polymers available for use in biomedical devices and as tissue engineering scaffolds are limited. This lack of available polymers with suitable properties could inhibit the development of biomedical devices with improved biocompatibility and hinder the growth of the fledgling tissue engineering field. Researchers in the polymer and biomaterials fields have tried to remedy this problem by applying combinatorial and high throughput methods developed in drug discovery to the search for new polymers. A recent advance has been the development of combinatorial polymer libraries printed as microarrays. This format allows the polymers to be readily screened for their cell adhesion and differentiation properties, allowing ‘hit’ materials with ideal properties to be identified. However, without knowledge of the surface properties of these novel polymers it is impossible to rationalise their biological properties. The surface characterisation of such microarrays presents numerous practical problems included small sample size, sample number and even analysis of such large amounts of data. It is the aim of this thesis to develop methods for the characterisation of the surface chemistry, wettability and protein adsorption properties of polymers in situ in microarray format and within realistic timeframes. The thesis will explore multivariate statistics in the form of PCA and PLS as methods of analysing the large amount of data acquired. The first part of this thesis describes the surface chemical analysis of a polymer microarray using ToF-SIMS and XPS. A comparison of the polymers’ surface to bulk chemistries by XPS indicated that 64 % of the polymers had a surface chemistry which differed from the bulk. This reinforces the need for characterisation of the polymers’ surface chemistries, as it is obvious that this can not be inferred from their bulk chemistries. ToF-SIMS imaging was shown to be an ideal method of studying the distribution of specific ion species across the array and to confirm that the microarray was printed in the intended layout. Principal component analysis is shown to be an ideal technique to analyse both ToF-SIMS and XPS spectral data from the arrays, allowing similarities and differences in the surface chemistry of the polymers to be easily visualised. To estimate the surface energies of the arrayed polymers it is necessary to use picolitre volume droplets to make contact angle measurements. In Chapter 4 it is shown that contact angle measurements taken from picolitre volume water droplets are equivalent to those measured from more conventional microlitre droplets. In Chapter 5 picolitre contact angle measurements are used to estimate the polar and dispersive surface energies of a polymer microarray, which has been specifically designed to exhibit a maximum range of surface energy values. The analysis shows that there is indeed great variation in the WCA and polar surface energies of the polymers, demonstrating the power of intelligently designed combinatorial libraries. To understand the chemical basis of this large range of surface energies the results are compared to surface chemical data from ToF-SIMS and XPS. Surface atomic and functional data from XPS is unable to provide any definitive explanations for the range of surface energies observed. However, information about the molecular structure of the surface from ToF-SIMS gives an insight into what surface functionalities are responsible for high and low surface energies. In Chapter 6 PLS regression is investigated further as a method for investigating surface structure-property relationships in large polymer libraries. Specifically two issues are investigated: the influence of sample number on the results obtained and the ability of PLS to make quantitative predictions. The ToF-SIMS and surface energy dataset discussed in Chapter 5 is used for this task. It is demonstrated that the results obtained from PLS models of large polymer libraries are equivalent to those obtained from much smaller datasets, in terms of the ions identified in the regression vector. Using various test sets of polymers it is shown that there is a limit to the predictive ability of PLS: specifically, as the difference between the training and test sets increases, the quality of the predictions decreases. Potential problems with data pre-processing and re-scaling are also identified. In the final experimental chapter two methods are described for investigating protein adhesion and adsorption to micro-arrayed polymers using AFM and fluorescently labelled proteins. Both methods indicate a wide range of protein adsorption properties within the group of polymers analysed. A good correlation between the two sets of data was observed which appears to validate both methods. In summary the work described in this thesis has demonstrated the feasibility of the characterisation of the surface chemistry, energetics and protein adsorption properties of a micro-arrayed polymer library within realistic time-frames. PCA and PLS have been shown to be useful tools for analysing the data obtained. It is hoped that the methods described in this thesis will allow the biological data from polymer microarrays to be rationalised using the surface properties of the polymers, allowing the design of new biomaterials.

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Perkins, John Bigelow. "Surface ship overhaul decision analysis". Thesis, Monterey, California. Naval Postgraduate School, 1992. http://hdl.handle.net/10945/30591.

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Approved for public release; distribution is unlimited.
Efficient Surface Ship Maintenance and repair is vital to the U.S. Navy. With defense budgets tightening, accurate and economically sound decision making in this program is essential. To improve decision making, it would be helpful to have an accurate analysis program to evaluate the adequacy of ship maintenance and repair decisions. This system should use available overhaul information to identify errors made during the overhaul process. This thesis analyses current Navy ship maintenance and repair feedback processes to determine if any system is used presently that adequately measures the accuracy of decisions made within the Surface Ship Maintenance Program. Further, this thesis develops an overhaul decision analysis model to assess the present Navy surface ship decision process. Finally, this thesis draws conclusions based on application of the model. These findings address both cost and equipment readiness issues to demonstrate the benefits of an an effective surface ship decision analysis program.... Surface ship overhaul decision process, Surface ship overhaul feedback systems.

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Jackson, Stuart Thomas. "Surface analysis of polymer blends". Thesis, University of Sheffield, 1993. http://etheses.whiterose.ac.uk/14740/.

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Hughes, Gareth Martin. "Surface analysis of orthopaedic implants". Thesis, University of Bristol, 2003. http://hdl.handle.net/1983/03628cc5-0770-4017-97c4-7753d184e308.

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Staggemeier, Bethany Ann. "Dynamic surface tension detection : novel applications to continuous flow analysis and interfacial analysis /". Thesis, Connect to this title online; UW restricted, 2004. http://hdl.handle.net/1773/11584.

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Książki na temat "Surface analysis"

1948-, Briggs D., i Seah M. P, red. Practical surface analysis. Wyd. 2. Chichester: Wiley, 1990.

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D, Briggs. Practical surface analysis. Wyd. 2. Chichester: Wiley, 1994.

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Surface analytical techniques. Oxford [England]: Clarendon Press, 1990.

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1930-, Czanderna Alvin Warren, i Hercules David M, red. Ion spectroscopies for surface analysis. New York: Plenum Press, 1991.

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Miyoshi, Kazuhisa. Surface analysis and tools. Cleveland, Ohio: National Aeronautics and Space Administration, Glenn Research Center, 2002.

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Holze, Rudolf. Surface and Interface Analysis. Berlin, Heidelberg: Springer Berlin Heidelberg, 2009. http://dx.doi.org/10.1007/978-3-540-49829-2.

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Miyoshi, Kazuhisa. Surface analysis and tools. Cleveland, Ohio: National Aeronautics and Space Administration, Glenn Research Center, 2002.

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M, Walls J., red. Methods of surface analysis. Cambridge [Cambridgeshire]: Cambridge University Press, 1989.

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Hellmann, Hubert. Analysis of surface waters. Chichester: E. Horwood, 1987.

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1931-, Brune Dag, red. Surface characterization: A user's sourcebook. [Oslo]: Scandinavian Science Publisher, 1997.

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Części książek na temat "Surface analysis"

Kleber, Christoph, i Manfred Schreiner. "Surface Analysis". W Modern Methods for Analysing Archaeological and Historical Glass, 247–74. Oxford, UK: John Wiley & Sons Ltd, 2013. http://dx.doi.org/10.1002/9781118314234.ch11.

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Böer, Karl W. "Surface Analysis". W Survey of Semiconductor Physics, 41–98. Dordrecht: Springer Netherlands, 1992. http://dx.doi.org/10.1007/978-94-011-2912-1_3.

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Poerio, Teresa. "Surface Analysis". W Encyclopedia of Membranes, 1863–64. Berlin, Heidelberg: Springer Berlin Heidelberg, 2016. http://dx.doi.org/10.1007/978-3-662-44324-8_1748.

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Hirai, Nobumitsu. "Surface Analysis". W Corrosion Control and Surface Finishing, 47–56. Tokyo: Springer Japan, 2016. http://dx.doi.org/10.1007/978-4-431-55957-3_5.

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Kawaguchi, Daisuke, i Keiji Tanaka. "Surface Analysis". W Molecular Soft-Interface Science, 101–14. Tokyo: Springer Japan, 2019. http://dx.doi.org/10.1007/978-4-431-56877-3_6.

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Poerio, Teresa. "Surface Analysis". W Encyclopedia of Membranes, 1–2. Berlin, Heidelberg: Springer Berlin Heidelberg, 2015. http://dx.doi.org/10.1007/978-3-642-40872-4_1748-1.

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Bruno, Thomas J., James W. Robinson, Eileen M. Skelly Frame i George M. Frame. "Surface Analysis". W Undergraduate Instrumental Analysis, 883–911. Wyd. 8. New York: CRC Press, 2023. http://dx.doi.org/10.1201/9781003188544-16.

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Rusiński, Eugeniusz, Jerzy Czmochowski, Przemysław Moczko i Damian Pietrusiak. "Failure Analysis". W Surface Mining Machines, 85–128. Cham: Springer International Publishing, 2017. http://dx.doi.org/10.1007/978-3-319-47792-3_4.

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Sykes, David. "Surface Chemical Analysis". W Springer Handbook of Electronic and Photonic Materials, 1. Cham: Springer International Publishing, 2017. http://dx.doi.org/10.1007/978-3-319-48933-9_18.

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Brown, Christopher A., i Han Haitjema. "Multiscale Surface Analysis". W CIRP Encyclopedia of Production Engineering, 1–8. Berlin, Heidelberg: Springer Berlin Heidelberg, 2019. http://dx.doi.org/10.1007/978-3-642-35950-7_16869-1.

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Streszczenia konferencji na temat "Surface analysis"

Ratner, Buddy D., i David G. Castner. "Surface analysis for biomaterials and biological systems". W The 8th Latin American congress on surface science: Surfaces , vacuum, and their applications. AIP, 1996. http://dx.doi.org/10.1063/1.51193.

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Pregliasco, R. G., J. E. Gayone, E. A. Sánchez i O. Grizzi. "TOF-Ion scattering spectrometer for surface analysis: Application to a GaAs (110) surface". W The 8th Latin American congress on surface science: Surfaces , vacuum, and their applications. AIP, 1996. http://dx.doi.org/10.1063/1.51182.

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Pemberton, Jeanne E. "Surface Raman Scattering as a Probe of Metal Surface Chemistry". W Laser Applications to Chemical Analysis. Washington, D.C.: Optica Publishing Group, 1992. http://dx.doi.org/10.1364/laca.1992.thb1.

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Raman scattering is an attractive probe of surface and interfacial chemistry at metals due to the high degree of molecular specificity inherent in the results. One aspect of Raman scattering that enhances its utility for the study of metal surfaces is the ability to deduce orientational information about molecules at these metal surfaces from the presence of oriented electric fields at these surfaces with which selective vibrational modes can couple. These "surface selection rules" have been both theoretically described and experimentally validated for a variety of metal surfaces. Given the wealth of information available from such studies, potential applications for surface Raman scattering span the range from electrochemical to catalytic systems. Thus, considerable effort has been expended in an attempt to develop Raman scattering for the study of surface and interfacial phenomena. These efforts have largely been focused on overcoming problems attendant to sensitivity and selectivity for the interface in the presence of the bulk environment.

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Bristow, Thomas C. "Surface Measurements and Frequency Analysis". W Surface Roughness and Scattering. Washington, D.C.: Optica Publishing Group, 1992. http://dx.doi.org/10.1364/surs.1992.smb2.

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The measurement of surface roughness is typically an important parameter for describing the quality of fine finished parts. Examples include measurements of finely polished flat and curved optics, computer hard disks, semiconductor wafers and optical disks. Most often an RMS or RA roughness value is reported for the part, typically by the high spatial information. Other surface information can also be of interest, including mid-spatial roughness and figure information. Three basic surface profiles are generally used to define the surface, including total profile, waviness and roughness. A different approach is to examine the spatial information on the surface by using the power spectrum or the autocovariance function. Both of these functions can be calculated over any user selected spatial frequency region.

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Arnellis, Yerizon, Media Rosha, Elita Zusti Jamaan i Nonong Amalita. "Analysis of concept understanding students’ real analysis course by using realistic mathematics education approach". W THE PHYSICS OF SURFACES: Aspects of the Kinetics and Dynamics of Surface Reaction. AIP, 2023. http://dx.doi.org/10.1063/5.0122449.

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Mansilla, C., V. Ocelík i J. Th M. De Hosson. "Statistical analysis of SEM image noise". W CONTACT AND SURFACE 2013. Southampton, UK: WIT Press, 2013. http://dx.doi.org/10.2495/secm130021.

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Helma, Helma, i Dewi Murni. "The effect of using flow proof in conducting preliminary analysis in real analysis courses to improve mathematics problem solving". W THE PHYSICS OF SURFACES: Aspects of the Kinetics and Dynamics of Surface Reaction. AIP, 2023. http://dx.doi.org/10.1063/5.0122334.

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Zawada-Tomkiewicz, A., i B. Storch. "Comparative analysis of the machined surface image after the process of burnishing rolling". W CONTACT/SURFACE 2009. Southampton, UK: WIT Press, 2009. http://dx.doi.org/10.2495/secm090101.

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Leiro, M., i E. S. Ayllón. "Long lasting time outdoor atmospheric corrosion tests: electrochemical analysis". W CONTACT AND SURFACE 2011. Southampton, UK: WIT Press, 2011. http://dx.doi.org/10.2495/secm110031.

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Winanda, Rara Sandhy, Defri Ahmad, Ariana Putri i Saddam Al Aziz. "Dynamical analysis of viral infection with cytotoxic T responses". W THE PHYSICS OF SURFACES: Aspects of the Kinetics and Dynamics of Surface Reaction. AIP, 2023. http://dx.doi.org/10.1063/5.0122430.

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Raporty organizacyjne na temat "Surface analysis"

Brown, Jeff L. Optical Surface Analysis. Fort Belvoir, VA: Defense Technical Information Center, sierpień 1996. http://dx.doi.org/10.21236/ada375788.

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Rousculp, Christopher L. PHELIX Liner Surface Analysis. Office of Scientific and Technical Information (OSTI), styczeń 2014. http://dx.doi.org/10.2172/1114415.

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Hurtubise, R. J. Solid-surface luminescence analysis. Office of Scientific and Technical Information (OSTI), styczeń 1991. http://dx.doi.org/10.2172/5838859.

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Montalvo, H. R. Repository surface design site layout analysis. Office of Scientific and Technical Information (OSTI), luty 1998. http://dx.doi.org/10.2172/290858.

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HECTOR MONTALVO. REPOSITORY SURFACE DESIGN SITE LAYOUT ANALYSIS. Office of Scientific and Technical Information (OSTI), październik 1997. http://dx.doi.org/10.2172/776720.

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Burton, R. N. Data analysis for surface plate calibration. Office of Scientific and Technical Information (OSTI), sierpień 1997. http://dx.doi.org/10.2172/650156.

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Montalvo, H. R. Repository Surface Design Site Layout Analysis. Office of Scientific and Technical Information (OSTI), luty 1998. http://dx.doi.org/10.2172/762940.

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Kwon, K. C. Liquid chromatographic analysis of coal surface properties. Office of Scientific and Technical Information (OSTI), grudzień 1992. http://dx.doi.org/10.2172/7148930.

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Gmur, N. F. Analysis of surface contaminants on beryllium windows. Office of Scientific and Technical Information (OSTI), grudzień 1986. http://dx.doi.org/10.2172/7168458.

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Shen, I. Y., i Per G. Reinhall. Surface Damping Treatments: Innovation, Design and Analysis. Fort Belvoir, VA: Defense Technical Information Center, czerwiec 2001. http://dx.doi.org/10.21236/ada394472.

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