Gotowa bibliografia na temat „STM lithography”
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Artykuły w czasopismach na temat "STM lithography"
Dobrik, G., L. Tapasztó, P. Nemes-Incze, Ph Lambin i L. P. Biró. "Crystallographically oriented high resolution lithography of graphene nanoribbons by STM lithography". physica status solidi (b) 247, nr 4 (15.01.2010): 896–902. http://dx.doi.org/10.1002/pssb.200982953.
Pełny tekst źródłaMarrian, C. R. K., i E. A. Dobisz. "High-resolution lithography with a vacuum STM". Ultramicroscopy 42-44 (lipiec 1992): 1309–16. http://dx.doi.org/10.1016/0304-3991(92)90440-u.
Pełny tekst źródłaZhang, L. B., J. X. Shi, Ju Long Yuan, Shi Ming Ji i M. Chang. "The Advancement of SPM-Based Nanolithography". Materials Science Forum 471-472 (grudzień 2004): 353–57. http://dx.doi.org/10.4028/www.scientific.net/msf.471-472.353.
Pełny tekst źródłaYang, Ye, i Wan Sheng Zhao. "Fabrication of the Nanoscale Flat-Bottomed and Lamellar Structures on HOPG Surface by STM-Based Electric Lithography". Key Engineering Materials 562-565 (lipiec 2013): 45–51. http://dx.doi.org/10.4028/www.scientific.net/kem.562-565.45.
Pełny tekst źródłaKleineberg, U., A. Brechling, M. Sundermann i U. Heinzmann. "STM Lithography in an Organic Self-Assembled Monolayer". Advanced Functional Materials 11, nr 3 (czerwiec 2001): 208–12. http://dx.doi.org/10.1002/1616-3028(200106)11:3<208::aid-adfm208>3.0.co;2-x.
Pełny tekst źródłaVetrone, J., i Y. W. Chung. "Changes in tip structure measured during STM lithography". Applied Surface Science 78, nr 3 (lipiec 1994): 331–38. http://dx.doi.org/10.1016/0169-4332(94)90022-1.
Pełny tekst źródłaDobrik, Gergely, Levente Tapasztó i László Biró. "Nanometer wide ribbons and triangles by STM lithography of graphene". Nanopages 7, nr 1 (czerwiec 2012): 1–7. http://dx.doi.org/10.1556/nano.2010.00001.
Pełny tekst źródłaTucker, J. R., i T. C. Shen. "Prospects for atomically ordered device structures based on STM lithography". Solid-State Electronics 42, nr 7-8 (lipiec 1998): 1061–67. http://dx.doi.org/10.1016/s0038-1101(97)00302-x.
Pełny tekst źródłaKASU, Makoto, i Naoki KOBAYASHI. "Nanoscale Semiconductor Processes Using STM and AFM Lithographies. Nanometer-scale GaAs Selective Growth Using STM Lithography." Hyomen Kagaku 19, nr 11 (1998): 734–41. http://dx.doi.org/10.1380/jsssj.19.734.
Pełny tekst źródłaLeuschner, R., E. Günther, G. Falk, A. Hammerschmidt, K. Kragler, I. W. Rangelow i J. Zimmermann. "Bilayer resist process for exposure with low-voltage electrons (STM-lithography)". Microelectronic Engineering 30, nr 1-4 (styczeń 1996): 447–50. http://dx.doi.org/10.1016/0167-9317(95)00284-7.
Pełny tekst źródłaRozprawy doktorskie na temat "STM lithography"
Ruess, Frank Joachim Physics Faculty of Science UNSW. "Atomically controlled device fabrication using STM". Awarded by:University of New South Wales. Physics, 2006. http://handle.unsw.edu.au/1959.4/24855.
Pełny tekst źródłaLakcher, Amine. "Nouvelles perspectives de métrologie dimensionnelle par imagerie de microscope électronique pour le contrôle de la variabilité des procédés de fabrication des circuits intégrés". Thesis, Université Grenoble Alpes (ComUE), 2018. http://www.theses.fr/2018GREAT052/document.
Pełny tekst źródłaIn advanced technological nodes as well as derived technologies, aggressive design rules are needed. This leads to a complexity of structures in the current integrated circuits. Such structures pose a significant challenge to chip manufacturing processes, in particular patterning steps of lithography and etching. In order to improve and optimize these structures, designers need to rely on the rules and knowledge that engineers have about their processes. These rules need to be fed by complex dimensional and structural information: corner rounding, tip to tip distances, line end shortening, etc. Metrology must evolve so that engineers are able to measure and quantify the dimensions of the most complex structures in order to assess the process variability. Currently the variability is mainly quantified using data from the inline monitoring of simple structures as they are the only ones to guarantee a robust and reproducible measurement. But, they can hardly be considered as representative of the process or the circuit. Using CD-SEM metrology to measure complex structures in a robust way is a technical challenge. The creation of measurement recipes is complex, time consuming and does not guarantee a stable measurement. However, a significant amount of information is contained in the SEM image. The analysis tools provided by the equipment manufacturers allow to extract the SEM contours of a structure present in the image. Thus, the CD-SEM takes images and the metrology part is performed offline to estimate the variability.This thesis offers engineers new possibilities of dimensional metrology in order to apply it for process control of complex structures. SEM contours are used as a source of information and used to generate new metrics
Konijn, Mark. "Multilevel Nanoengineering for Imprint Lithography". Thesis, University of Canterbury. Electrical and Computer Engineering, 2005. http://hdl.handle.net/10092/1071.
Pełny tekst źródłaPerring, Mathew Ian. "Functionalization and patterning of monolayers on silicon(111) and polydicyclopentadiene". Diss., University of Iowa, 2010. https://ir.uiowa.edu/etd/722.
Pełny tekst źródłaCosta, Juliano Nunes. "Projeto, fabricação e teste de uma microbomba sem valvulas". [s.n.], 2006. http://repositorio.unicamp.br/jspui/handle/REPOSIP/264091.
Pełny tekst źródłaDissertação (mestrado) - Universidade Estadual de Campinas, Faculdade de Engenharia Mecanica
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Resumo: Hoje em dia, os microssistemas eletromecânicos (MEMS) constituem uma das áreas mais promissoras e de rápido crescimento entre as novas tecnologias. Uma área de destaque na utilização de MEMS é a microfluídica, onde diversos tipos de equipamentos miniaturizados são necessários. As microbombas têm um papel fundamental neste tipo de microdispositivos, devido a sua função de prover quantidades muito pequenas de fluidos de maneira segura e uniforme. O presente trabalho apresenta o processo de desenvolvimento de uma microbomba de diafragma oscilante sem válvulas e com atuação pneumática. Para se construir a microbomba sem válvulas, primeiramente foi feito um estudo sobre os elementos bocaljdifusor, que representam na microbomba o papel das válvulas. Com o objetivo de se analisar o comportamento da microbomba, foi feita uma simulação numérica utilizando-se a analogia por circuitos elétricos equivalentes, reconhecidamente um método simples e eficiente' de simulação de sistemas multidomínios, onde a grande maioria dos microdispositivos podem ser classificados. Por fim, foram projetados e montados protótipos da microbomba utilizahdo-se a tecnologia de microfabricação Litografia Profunda em polímeros flexográficos, onde se faz o uso de radiação ultravioleta. Tal opção se deve a que esta é uma tecnologia de baixo custo e de fácil utilização. Foi feito em seguida o levantamento de desempenho da microbomba, onde vários testes foram realizados para se conhecer a relação de pressão versus vazão
Abstract: Nowadays, Micro-Electromechanical systems (MEMS) constitute one of the most promising and fast expanding fields among the new technologies. Microfiuidic systems are a noteworthy sub-area of MEMS, demanding several types of microdevices to be developed. Micropumps have a fundamental role in thee systems, due to the need of supplying minimal amounts of fiuid in a guaranteed and uniform way. This work presents the process of development of. prototypes of aval veless micropump based upon reciprocating diaphragm and pneumatic actuation. To construct the valveless micropump, firstly it was made a study on the nozzlej diffuser elements, which represent in these micropumps the valve function. Aiming to analyse the behavior of the micropump, a numeric simulation was studied using electrical equivalent networks, known as a simple and eflicient method of simulation of multidomain systems, a classification most MEMS follow. Finally, it was designed and constructed prototypes of the micropumps using the Deep Lithography in fiexographics polymers micro-manufacture technology. This option is due to the low cost characteristic of this technology and also because it is very easy to learn how to produce the prototypes. ln the sequence, the nerformance of the micropump was studied through several experimental tests in order to know its pressure and fiow behavior
Mestrado
Mecanica dos Sólidos e Projeto Mecanico
Mestre em Engenharia Mecânica
Kim, Eun Jung. "Surface Microtopography Modulation of Biomaterials for Bone Tissue Engineering Applications". Cleveland State University / OhioLINK, 2010. http://rave.ohiolink.edu/etdc/view?acc_num=csu1273557062.
Pełny tekst źródłaCheng, Zhe Annie. "Biological multi-functionalization and surface nanopatterning of biomaterials". Thesis, Bordeaux 1, 2013. http://www.theses.fr/2013BOR15202/document.
Pełny tekst źródłaThe aim of biomaterials design is to create an artificial environment that mimics the in vivo extracellular matrix for optimized cell interactions. A precise synergy between the scaffolding material, bioactivity, and cell type must be maintained in an effective biomaterial. In this work, we present a technique of nanofabrication that creates chemically nanopatterned bioactive silicon surfaces for cell studies. Using nanoimprint lithography, RGD and mimetic BMP-2 peptides were covalently grafted onto silicon as nanodots of various dimensions, resulting in a nanodistribution of bioactivity. To study the effects of spatially distributed bioactivity on cell behavior, mesenchymal stem cells (MSCs) were cultured on these chemically modified surfaces, and their adhesion and differentiation were studied. MSCs are used in regenerative medicine due to their multipotent properties, and well-controlled biomaterial surface chemistries can be used to influence their fate. We observe that peptide nanodots induce differences in MSC behavior in terms of cytoskeletal organization, actin stress fiber arrangement, focal adhesion (FA) maturation, and MSC commitment in comparison with homogeneous control surfaces. In particular, FA area, distribution, and conformation were highly affected by the presence of peptide nanopatterns. Additionally, RGD and mimetic BMP-2 peptides influenced cellular behavior through different mechanisms that resulted in changes in cell spreading and FA maturation. These findings have remarkable implications that contribute to the understanding of cell-extracellular matrix interactions for clinical biomaterials applications
Scott, Kevin. "Fabrication and Characterization of Magnetic Nanostructures". Scholar Commons, 2014. https://scholarcommons.usf.edu/etd/5437.
Pełny tekst źródłaBlom, Tobias. "Fabrication and Applications of a Focused Ion Beam Based Nanocontact Platform for Electrical Characterization of Molecules and Particles". Doctoral thesis, Uppsala universitet, Experimentell fysik, 2010. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-122940.
Pełny tekst źródłaCheng, Zhe. "Biological multi-functionalization and surface nanopatterning of biomaterials". Phd thesis, Université Sciences et Technologies - Bordeaux I, 2013. http://tel.archives-ouvertes.fr/tel-01016695.
Pełny tekst źródłaKsiążki na temat "STM lithography"
Sam, Francis. Sam Francis: Special proofs 1959-1990 : lithographs and screenprints from the estate of the artist. London: Alan Cristea Gallery in association with Jonathan Novak Contemporary Art, 2001.
Znajdź pełny tekst źródłaCzęści książek na temat "STM lithography"
Koops, H. W. P., M. Rudolph, J. Kretz i M. Weber. "Nano-Lithography in 3 Dimensions with Electron Beam Induced Deposition". W NANOLITHOGRAPHY: A Borderland between STM, EB, IB, and X-Ray Lithographies, 87–93. Dordrecht: Springer Netherlands, 1994. http://dx.doi.org/10.1007/978-94-015-8261-2_10.
Pełny tekst źródłaMarrian, C. R. K., F. K. Perkins, S. L. Brandow, T. S. Koloski, E. A. Dobisz i J. M. Calvert. "Low Voltage e-Beam Lithography with the Scanning Tunneling Microscope". W NANOLITHOGRAPHY: A Borderland between STM, EB, IB, and X-Ray Lithographies, 175–88. Dordrecht: Springer Netherlands, 1994. http://dx.doi.org/10.1007/978-94-015-8261-2_18.
Pełny tekst źródłaHeyvaert, I., E. Osquiguil, C. Van Haesendonck i Y. Bruynseraede. "Lithography of YBa2Cu3O7 Superconducting Thin Films with a Scanning Tunneling Microscope". W NANOLITHOGRAPHY: A Borderland between STM, EB, IB, and X-Ray Lithographies, 207–12. Dordrecht: Springer Netherlands, 1994. http://dx.doi.org/10.1007/978-94-015-8261-2_21.
Pełny tekst źródłaLangheinrich, Wolfram, i Heinz Beneking. "Sub-10nm Electron Beam Lithography: -AIF3-Doped Lithium Fluoride as a Resist". W NANOLITHOGRAPHY: A Borderland between STM, EB, IB, and X-Ray Lithographies, 53–66. Dordrecht: Springer Netherlands, 1994. http://dx.doi.org/10.1007/978-94-015-8261-2_5.
Pełny tekst źródłaIls, P., M. Michel, A. Forchel, I. Gyuro, P. Speier i E. Zielinski. "Fabrication of Ultrasmall InGaAs/InP Nanostructures by High Voltage Electron Beam Lithography and Wet Chemical Etching". W NANOLITHOGRAPHY: A Borderland between STM, EB, IB, and X-Ray Lithographies, 77–80. Dordrecht: Springer Netherlands, 1994. http://dx.doi.org/10.1007/978-94-015-8261-2_8.
Pełny tekst źródłaSchmidt, A., F. Faller i A. Forchel. "Patterning of InGaAs/GaAs Quantum Dots Using E-Beam Lithography and Selective Removal of the Top Barrier". W NANOLITHOGRAPHY: A Borderland between STM, EB, IB, and X-Ray Lithographies, 73–76. Dordrecht: Springer Netherlands, 1994. http://dx.doi.org/10.1007/978-94-015-8261-2_7.
Pełny tekst źródłaStockman, L., C. Haesendonck, G. Neuttiens i Y. Bruynseraede. "SUB-20 nm Lithographic Patterning with the STM". W NANOLITHOGRAPHY: A Borderland between STM, EB, IB, and X-Ray Lithographies, 197–205. Dordrecht: Springer Netherlands, 1994. http://dx.doi.org/10.1007/978-94-015-8261-2_20.
Pełny tekst źródłaLi, Ning, Siming Guo i Michael A. Sutton. "Recent Progress in E-Beam Lithography for SEM Patterning". W MEMS and Nanotechnology, Volume 2, 163–66. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-8825-6_23.
Pełny tekst źródłaCheng, Z. A., O. F. Zouani, K. Glinel, A. M. Jonas i M. C. Durrieu. "Bioactive Nanoimprint Lithography: A Study of Human Mesenchymal Stem Cell Behavior and Fate". W IFMBE Proceedings, 1817–20. Cham: Springer International Publishing, 2014. http://dx.doi.org/10.1007/978-3-319-00846-2_448.
Pełny tekst źródłaKrishnan, Kannan M. "Scanning Probe Microscopy". W Principles of Materials Characterization and Metrology, 745–802. Oxford University Press, 2021. http://dx.doi.org/10.1093/oso/9780198830252.003.0011.
Pełny tekst źródłaStreszczenia konferencji na temat "STM lithography"
Marrian, C. R. K., E. A. Dobisz i R. J. Colton. "Lithography with a Vacuum STM". W Scanned probe microscopy. AIP, 1991. http://dx.doi.org/10.1063/1.41387.
Pełny tekst źródłaLi, Nan, Tatsuo Yoshinobu i Hiroshi Iwasaki. "STM Nano-Lithography with SiO2 Mask". W 1998 International Conference on Solid State Devices and Materials. The Japan Society of Applied Physics, 1998. http://dx.doi.org/10.7567/ssdm.1998.c-2-3.
Pełny tekst źródłaMcCord, Mark A., i Roger Fabian W. Pease. "Principles and techniques of STM lithography". W SPIE Institutes for Advanced Optical Technologies 10, redaktor Christie R. K. Marrian. SPIE, 1993. http://dx.doi.org/10.1117/12.183194.
Pełny tekst źródłaChang, T. H. Philip, Lawrence P. Muray, Urs Staufer, Mark A. McCord i Dieter P. Kern. "Arrayed lithography using STM-based microcolumns". W SPIE Institutes for Advanced Optical Technologies 10, redaktor Christie R. K. Marrian. SPIE, 1993. http://dx.doi.org/10.1117/12.183200.
Pełny tekst źródłaMarrian, Christie R., Elizabeth A. Dobisz i John A. Dagata. "Low voltage E-beam lithography with the STM". W SPIE Institutes for Advanced Optical Technologies 10, redaktor Christie R. K. Marrian. SPIE, 1993. http://dx.doi.org/10.1117/12.183196.
Pełny tekst źródłaSob, Wilder, Atalar i Quate. "Fabrication Of 100 nm pMOSFETS With Hybrid AFW / STM Lithography". W Symposium on VLSI Technology. IEEE, 1997. http://dx.doi.org/10.1109/vlsit.1997.623732.
Pełny tekst źródłaLott, Travis, i Russell J. Elias. "Sub-nanometer CD- SEM matching". W Advanced Lithography, redaktor Chas N. Archie. SPIE, 2007. http://dx.doi.org/10.1117/12.712213.
Pełny tekst źródłaBunday, Benjamin, John Allgair, Bryan J. Rice, Jeff Byers, Yohanan Avitan, Ram Peltinov, Maayan Bar-zvi, Ofer Adan, John Swyers i Roni Z. Shneck. "SEM metrology for advanced lithographies". W Advanced Lithography, redaktor Chas N. Archie. SPIE, 2007. http://dx.doi.org/10.1117/12.714203.
Pełny tekst źródłaLawson, Richard A., i Clifford L. Henderson. "Investigating SEM metrology effects using a detailed SEM simulation and stochastic resist model". W SPIE Advanced Lithography, redaktorzy Jason P. Cain i Martha I. Sanchez. SPIE, 2015. http://dx.doi.org/10.1117/12.2086051.
Pełny tekst źródłaLevitov, F., A. Karabekov, G. Eytan i G. Golan. "Charging measurement using SEM embedded energy filter". W Advanced Lithography, redaktor Chas N. Archie. SPIE, 2007. http://dx.doi.org/10.1117/12.711747.
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