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Artykuły w czasopismach na temat "Spectromètre de masse d'ions secondaires"
Noël, Mario, i Marcel Baril. "Désign d'une source d'ions alcalins pour utilisation dans un spectromètre de masse à bombardement ionique (SIMS)". Canadian Journal of Physics 64, nr 7 (1.07.1986): 843–51. http://dx.doi.org/10.1139/p86-146.
Pełny tekst źródłaMaquestiau, A., R. Flammang i P. Meyrant. "Activation Collisionnelle D'Ions Fragments Générés en Région Libre de Champ D'Un Spectromètre de Masse a Trois Secteurs". Bulletin des Sociétés Chimiques Belges 92, nr 2 (1.09.2010): 129–37. http://dx.doi.org/10.1002/bscb.19830920207.
Pełny tekst źródłaGérardin, Pauline, Clément Fritsch, Sylvain Cosgun, Maree Brennan, Stéphane Dumarçay, Francis Colin i Philippe Gérardin. "Effet de la hauteur de prélèvement sur la composition quantitative et qualitative des polyphénols de l’écorce d’Abies alba Mill." Revue forestière française 72, nr 5 (31.10.2020): 411–23. http://dx.doi.org/10.20870/revforfr.2020.5338.
Pełny tekst źródłaJomard, François, i Marcel Perdereau. "Profilométrie par spectrométrie de masse d'ions secondaires de couches alternées cobalt-cuivre. Influence des conditions de pulvérisation sur la résolution en profondeur". Microscopy Microanalysis Microstructures 8, nr 4-5 (1997): 273–86. http://dx.doi.org/10.1051/mmm:1997121.
Pełny tekst źródłaDARQUE-CERETTI, Evelyne, Marc AUCOUTURIER i Patrice LEHUéDé. "Spectrométrie de masse d'ions secondaires : SIMS et ToF-SIMS - Principes et appareillages". Techniques d'analyse, grudzień 2014. http://dx.doi.org/10.51257/a-v4-p2618.
Pełny tekst źródłaDARQUE-CERETTI, Evelyne, Marc AUCOUTURIER i Patrice LEHUÉDÉ. "Spectrométrie de masse d'ions secondaires : SIMS et ToF-SIMS - Procédures d'analyse et performances". Techniques d'analyse, marzec 2015. http://dx.doi.org/10.51257/a-v2-p2619.
Pełny tekst źródłaRozprawy doktorskie na temat "Spectromètre de masse d'ions secondaires"
Verzeroli, Elodie. "Source NAPIS et Spectromètre PSI-TOF dans le projet ANDROMEDE". Thesis, Université Paris-Saclay (ComUE), 2017. http://www.theses.fr/2017SACLS221/document.
Pełny tekst źródłaThe goal of the ANDROMEDE project is to create a new instrument for sub-micrometric ion imaging and analysis by mass spectrometry, using ion impacts on nano-objects present in the solid sample surface and more particularly on biological samples. In-vitro and in-vivo analysis of these types of samples require mostly complex preparation and even atmospheric pressure experimentation. This unique instrument opens a new path for surface analysis characterization, which is complementary to the standard methods and technics used today.In the ANDROMEDE project, two elements have been developed in our study. The NAPIS source which delivers the nanoparticles allowing the increase of the secondary ion yield and the PSI-TOF mass spectrometer for the chemical analysis of the elements emitted from the sample surface.The NAPIS source delivers a primary beam of accelerated nanoparticles in a Pelletron 4MeV accelerator which is driven to a target. The NAPIS nanoparticles source has been developed and validated independently in the ORSAY PHYSICS Company firstly before its coupling on the accelerator. The new extraction optics called ExOTOF as well as the PSI-TOF orthogonal extraction mass spectrometer have been developed for the reliable secondary ions study and the increase of the mass resolution.These instruments have been specially designed for this project. This development will allow an efficient extraction and analysis of the secondary ions emitted from the sample surface using continuous primary beams and will have applications for atmospheric pressure studies. The assembly has been completely validated and the first tests of the output beam have been successfully carried out
Marie, Yannick. "Étude de la formation des ions MCs+ en spectromètrie de masse d'ions secondaires : application à la quantification". Vandoeuvre-les-Nancy, INPL, 1995. http://www.theses.fr/1995INPL124N.
Pełny tekst źródłaVerruno, Marina. "Investigation of the enhancement of the performance of the SIMS instruments". Thesis, Université Paris-Saclay (ComUE), 2017. http://www.theses.fr/2017SACLS400/document.
Pełny tekst źródłaSecondary ion mass spectrometry (SIMS) instruments need to be improved in order to satisfy the demands of trends in many fields that require analytical tools that can map samples with both excellent resolution and high-sensitivity chemical information, but also with shorter time of analysis. The objectives of this thesis are: investigate the enhancement of the mass resolution of double focusing mass spectrometers by replacing the standard spherical sector with a novel spheroid geometry which has better focusing properties, and to investigate the reduction of the time of analysis in imaging SIMS by the proof-of-concept of the SIMS multi-ion- beam system.A comparison of the main focusing properties of the spherical sector, the spheroid geometry and a hybrid spheroid geometry, was made using the SIMION software. A comparison in a Nier-Johnson configuration between the spherical sector and the spheroid, showed that the beam presents a rotation of 90° at the exit of the magnet harming the mass resolution in the spheroid configuration. By adding an electrostatic element that can rotate the beam 90° the performance of the mass spectrometer could be improved. However, a comparison of the performances between the spherical and hybrid sectors simulated in a Mattauch-Herzog configuration, showed that when the double focusing condition is properly satisfied, better mass resolution could be achieved with the spheroid geometry.A multi-ion-beam system was investigated for SIMS analysis. A simulation through the secondary optics of a Cameca IMS XF showed successful transmission of nine beams through the optics resulting in nine well focussed spots on the multi channel plate (MCP) detector. The proof-of-concept was completed experimentally in the Cameca IMS 6F, where a multi-hole aperture was mounted in the primary column generating 9 and 16 beams of sizes between 4 μm to 10 μm. Images of an AlCu grid were obtained when t the multi-ion-beam system was scanned over the sample. These results showed that the multi-ion-beam system is a feasible technique for imaging SIMS and by optimizing the design multi-nano-ion-beams will be a solution for reducing drastically the time of analysis
Gisbert, Rémy. "Optimisation d'une source d'ions à décharge luminsescente pour spectromètre de masse". Grenoble 1, 1992. http://www.theses.fr/1992GRE10118.
Pełny tekst źródłaBoust, Fabrice. "Microscopie ionique à balayage à haute résolution spatiale : obtention simultanée d'images filtrées par un spectromètre de masses à fort pouvoir séparateur". Paris 11, 1989. http://www.theses.fr/1989PA112327.
Pełny tekst źródłaGimenez, Christian. "Etude par spectrométrie de masse d'ions secondaires de l'hydroxylation de tiO:(2) (100)". Dijon, 1985. http://www.theses.fr/1985DIJOS056.
Pełny tekst źródłaEs-Saadani, Aali. "Etude par spectrométrie de masse d'ions secondaires des contacts tungstène/silicium et tungstène/chrome/silicium". Lyon, INSA, 1988. http://www.theses.fr/1988ISAL0064.
Pełny tekst źródłaEs-Saadani, Aali. "Etude par spectrométrie de masse d'ions secondaires des contacts tungstène/silicium et tungstène/chrome/silicium". Grenoble 2 : ANRT, 1988. http://catalogue.bnf.fr/ark:/12148/cb376135329.
Pełny tekst źródłaLemaire, Joël. "Ionisation multiphotonique résonnante : application à la dissociation unimoléculaire d'ions polyatomiques". Paris 11, 1986. http://www.theses.fr/1986PA112345.
Pełny tekst źródłaAmaral, Ademir de Jesus. "Application de la spectrométrie de masse d'ions secondaires dans la détection et la mesure de l'uranium dans les milieux biologiques". Paris 12, 1997. http://www.theses.fr/1997PA120055.
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