Gotowe bibliografie tematyczne / Self healing circuits

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Gotowa bibliografia na temat „Self healing circuits”

Autor: Grafiati

Data publikacji: 6 września 2023

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Artykuły w czasopismach na temat "Self healing circuits"

Nair, Manju S., Oppili Prasad, Kruti Trivedi, Piyush Ranjan, Virendra Parab, Sreelal Pillai i Sanjiv Sambandan. "Self-healing circuits for space technology". Applied Physics Letters 119, nr 5 (2.08.2021): 054101. http://dx.doi.org/10.1063/5.0056545.

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Harikrishna, B., i S. Ravi. "Autonomous Self Healing Of Reconfigurable Circuits". i-manager's Journal on Digital Signal Processing 1, nr 2 (15.06.2013): 19–23. http://dx.doi.org/10.26634/jdp.1.2.2328.

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Chu, Kunmo, Byong Gwon Song, Yongsung Kim i Chang Seung Lee. "Smart Passivation Materials with a Microencapsulated Liquid Metal for Self-Healing Conductors in Sustainable Electronic Devices". International Symposium on Microelectronics 2018, nr 1 (1.10.2018): 000293–97. http://dx.doi.org/10.4071/2380-4505-2018.1.000293.

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Abstract Passivation and self-healing of electric circuits are of importance in the area of electronic packaging for improving durability of devices. In particular, flexible or stretchable devices are vulnerable to mechanical stimuli, such as cutting, piercing, scratching, and pressing. The damage to a circuit results in the breakdown of devices. Therefore, a passivation layer has been essential to preserve the soft circuits and provide self-healing of the electrical pathways after they are damaged.

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Lai, G. W., S. J. Chang, J. T. Lee, H. Liu i C. C. Li. "Conductive microcapsules for self-healing electric circuits". RSC Advances 5, nr 126 (2015): 104145–48. http://dx.doi.org/10.1039/c5ra22021a.

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Ding, Li, Pushkaraj Joshi, James Macdonald, Virendra Parab i Sanjiv Sambandan. "Self‐Healing Thin‐Film Transistor Circuits on Flexible Substrates". Advanced Electronic Materials 7, nr 3 (25.01.2021): 2001023. http://dx.doi.org/10.1002/aelm.202001023.

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LEE, JANGJOON, SRIKAR BHAGAVATULA, SWARUP BHUNIA, KAUSHIK ROY i BYUNGHOO JUNG. "SELF-HEALING DESIGN IN DEEP SCALED CMOS TECHNOLOGIES". Journal of Circuits, Systems and Computers 21, nr 06 (październik 2012): 1240011. http://dx.doi.org/10.1142/s0218126612400117.

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CMOS technologies are suffering from increased variability due to process, supply voltage and temperature (PVT) variations as we enter the tens-of-nanometer regime. Analog and mixed-signal circuits have failed to effectively exploit the high-speed and low-noise properties that deep scaled CMOS technologies provide due to marginality issues. Large variations in leakage current and threshold voltage also make highly integrated digital designs challenging. In addition, device aging introduces a temporal dimension to variations in circuit performance. Consequently, there is an increasing need for a new design methodology that can provide high yield and reliability under severe parametric variations. Although several post-silicon calibration and repair strategies have been proposed to address the PVT variations, no coherent design strategy for a SoC has been developed so far. We espouse a self-healing technique based on real-time sensing and built-in feedback due to its inherent advantage of dynamic adaptation to temporal variations. This tutorial paper outlines our vision of improving marginalities in deep scaled CMOS technologies using a generic and systematic self-healing design including a system-level auto-correction algorithm. It also illustrates this methodology with design examples.

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Meyyappan, S., i V. Alamelumangai. "Black Box Model based Self Healing Solution for Stuck at Faults in Digital Circuits". International Journal of Electrical and Computer Engineering (IJECE) 7, nr 5 (1.10.2017): 2451. http://dx.doi.org/10.11591/ijece.v7i5.pp2451-2458.

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<p>The paper proposes a design strategy to retain the true nature of the output in the event of occurrence of stuck at faults at the interconnect levels of digital circuits. The procedure endeavours to design a combinational architecture which includes attributes to identify stuck at faults present in the intermediate lines and involves a healing mechanism to redress the same. The simulated fault injection procedure introduces both single as well as multiple stuck-at faults at the interconnect levels of a two level combinational circuit in accordance with the directives of a control signal. The inherent heal facility attached to the formulation enables to reach out the fault free output even in the presence of faults. The Modelsim based simulation results obtained for the Circuit Under Test [CUT] implemented using a Read Only Memory [ROM], proclaim the ability of the system to survive itself from the influence of faults. The comparison made with the traditional Triple Modular Redundancy [TMR] exhibits the superiority of the scheme in terms of fault coverage and area overhead. </p>

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Bandodkar, Amay J., Cristian S. López, Allibai Mohanan Vinu Mohan, Lu Yin, Rajan Kumar i Joseph Wang. "All-printed magnetically self-healing electrochemical devices". Science Advances 2, nr 11 (listopad 2016): e1601465. http://dx.doi.org/10.1126/sciadv.1601465.

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The present work demonstrates the synthesis and application of permanent magnetic Nd2Fe14B microparticle (NMP)–loaded graphitic inks for realizing rapidly self-healing inexpensive printed electrochemical devices. The incorporation of NMPs into the printable ink imparts impressive self-healing ability to the printed conducting trace, with rapid (~50 ms) recovery of repeated large (3 mm) damages at the same or different locations without any user intervention or external trigger. The permanent and surrounding-insensitive magnetic properties of the NMPs thus result in long-lasting ability to repair extreme levels of damage, independent of ambient conditions. This remarkable self-healing capability has not been reported for existing man-made self-healing systems and offers distinct advantages over common capsule and intrinsically self-healing systems. The printed system has been characterized by leveraging crystallographic, magnetic hysteresis, microscopic imaging, electrical conductivity, and electrochemical techniques. The real-life applicability of the new self-healing concept is demonstrated for the autonomous repair of all-printed batteries, electrochemical sensors, and wearable textile-based electrical circuits, indicating considerable promise for widespread practical applications and long-lasting printed electronic devices.

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Nithya, G., i Muthiah Ramaswamy. "VLSI-based self-healing solution for delay faults in synchronous sequential circuits". International Journal of Computer Aided Engineering and Technology 15, nr 1 (2021): 67. http://dx.doi.org/10.1504/ijcaet.2021.115948.

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Ramaswamy, Muthiah, i G. Nithya. "VLSI-based self-healing solution for delay faults in synchronous sequential circuits". International Journal of Computer Aided Engineering and Technology 15, nr 1 (2021): 67. http://dx.doi.org/10.1504/ijcaet.2021.10037856.

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Rozprawy doktorskie na temat "Self healing circuits"

Howard, Duane Clarence. "Reconfigurable amplifiers and circuit components for built-in-self testing and self-healing in SiGe BiCMOS technology". Diss., Georgia Institute of Technology, 2014. http://hdl.handle.net/1853/51823.

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The design of reconfigurable microwave and millimeter-wave circuit components and on-chip testing circuitry are demonstrated. These components are designed to enable the mitigation of process faults, aging, radiation effects, and other mechanisms that lead to performance degradation in circuits and systems. The presented work is primarily based on SiGe HBTs in BiCMOS technology and harnesses the inherent resilience of SiGe to mechanisms that degrade transistor performance. However, CMOS FETs are also used in limited applications, such as in the design of switches, op-amps, and DACs. Individual circuit blocks and circuit systems are characterized with the aim of evaluating their performance under nominal conditions as well as in the context of extreme environments and other deleterious phenomena.

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Bou, Sleiman Sleiman. "Built-in-Self-Test and Digital Self-Calibration for Radio Frequency Integrated Circuits". The Ohio State University, 2011. http://rave.ohiolink.edu/etdc/view?acc_num=osu1311685013.

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Goyal, Abhilash. "Methodologies for low-cost testing and self-healing of rf systems". Diss., Georgia Institute of Technology, 2011. http://hdl.handle.net/1853/44705.

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This thesis proposes a multifaceted production test and post-manufacture yield enhancement framework for RF systems. This framework uses low-cost test and post-manufacture calibration/tuning techniques. Since the test cost and the yield of the RF circuits/sub-system directly contribute to the manufacturing cost of RF systems, the proposed framework minimizes overall RF systems' manufacturing cost by taking two approaches. In the first approach, low-cost testing methodologies are proposed for RF amplifiers and integrated RF substrates with an embedded RF passive filter and interconnect. Techniques are developed to test RF circuits by the analysis of low-frequency signal of the order of few MHz and without using any external RF test-stimulus. Oscillation principles are used to enable testing of RF circuits without any external test-stimulus. In the second approach, to increase the yield of the RF circuits for parametric defects, RF circuits are tuned to compensate for a performance loss during production test using on-board or on-chip resources. This approach includes a diagnosis algorithm to identify faulty circuits within the system, and performs a compensation process that adjusts tunable components to enhance the performance of the RF circuits. In the proposed yield improvement methodologies, the external test stimulus is not required because the stimulus is generated by the RF circuit itself with the help of additional circuitry and faulty circuits are detected using low-cost test methods developed in this research. As a result, the proposed research enables low-cost testing and self-healing of RF systems.

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Wang, Fa. "Efficient Pre-Silicon Validation and Post-Silicon Tuning of Self-Healing Analog/RF Integrated Circuits". Research Showcase @ CMU, 2015. http://repository.cmu.edu/dissertations/614.

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The advent of the nanoscale integrated circuit (IC) technology makes high performance analog and RF circuit increasingly susceptible to large-scale process variations. Process variations, including inter-die variations and local mismatches, significantly impact the parametric yield of analog/RF circuit, and must be properly handled at all levels of design hierarchy. Traditional approaches based on over-design are not sufficient to maintain high parametric yield, due to the large-scale process variations and aggressive design specifications at advanced technology nodes. In this context, the self-healing circuit has emerged as promising methodology to address the variability issue. In this thesis, we propose efficient pre-silicon validation and post-silicon tuning techniques, which are essential for the practical usage of self-healing methodology. One important problem in self-healing methodology is to efficiently and accurately predict the parametric yield in pre-silicon. The main challenge of this problem is caused by multiple circuit states related to tuning knobs. Given that these circuit states closely interact with process variations, they must be properly modeled in order to accurately estimate the parametric yield. Towards this goal, we develop an efficient performance modeling algorithm, referred to Correlated Bayesian Model Fusion (C-BMF) that explores the correlation between circuit states. Next, based on the performance model, the self-healing behavior and the parametric yield can be efficiently and accurately predicted. Another important problem in self-healing circuit is to efficiently perform post-silicon tuning. Towards this goal, indirect performance sensing methodology has recently attracted great attention. In the indirect performance sensing paradigm, the performance of interest (PoI) is not directly measured by on-chip sensor, but is instead accurately predicted from an indirect sensor model. Such indirect sensor model takes a set of other performances as inputs, which are referred to as the performances of measurements (PoMs). The PoMs are selected such that they are highly correlated with PoI and are easy to measure. Due to the process shift associated with manufacturing lines, the indirect sensor model must be calibrated from time to time. For the purpose of reducing the model calibration cost, we propose a Bayesian Model Fusion (BMF) algorithm that reuses the information collected in early stage of manufacturing. We further extend BMF to a Co-learning Bayesian Model Fusion (CL-BMF) algorithm that incorporates not only the early stage information, but also the current stage information that was not considered in the original modeling problem.

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Khairullah, Shawkat Sabah. "Toward Biologically-Inspired Self-Healing, Resilient Architectures for Digital Instrumentation and Control Systems and Embedded Devices". VCU Scholars Compass, 2018. https://scholarscompass.vcu.edu/etd/5671.

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Digital Instrumentation and Control (I&C) systems in safety-related applications of next generation industrial automation systems require high levels of resilience against different fault classes. One of the more essential concepts for achieving this goal is the notion of resilient and survivable digital I&C systems. In recent years, self-healing concepts based on biological physiology have received attention for the design of robust digital systems. However, many of these approaches have not been architected from the outset with safety in mind, nor have they been targeted for the automation community where a significant need exists. This dissertation presents a new self-healing digital I&C architecture called BioSymPLe, inspired from the way nature responds, defends and heals: the stem cells in the immune system of living organisms, the life cycle of the living cell, and the pathway from Deoxyribonucleic acid (DNA) to protein. The BioSymPLe architecture is integrating biological concepts, fault tolerance techniques, and operational schematics for the international standard IEC 61131-3 to facilitate adoption in the automation industry. BioSymPLe is organized into three hierarchical levels: the local function migration layer from the top side, the critical service layer in the middle, and the global function migration layer from the bottom side. The local layer is used to monitor the correct execution of functions at the cellular level and to activate healing mechanisms at the critical service level. The critical layer is allocating a group of functional B cells which represent the building block that executes the intended functionality of critical application based on the expression for DNA genetic codes stored inside each cell. The global layer uses a concept of embryonic stem cells by differentiating these type of cells to repair the faulty T cells and supervising all repair mechanisms. Finally, two industrial applications have been mapped on the proposed architecture, which are capable of tolerating a significant number of faults (transient, permanent, and hardware common cause failures CCFs) that can stem from environmental disturbances and we believe the nexus of its concepts can positively impact the next generation of critical systems in the automation industry.

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Calayir, Enes. "Heterogeneous Integration of AlN MEMS Contour-Mode Resonators and CMOS Circuits". Research Showcase @ CMU, 2017. http://repository.cmu.edu/dissertations/1084.

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The increasing demand for high performance and miniature high frequency electronics has motivated the development of Micro-electro Mechanical Systems (MEMS) resonators, some of which have already become a commercial success for the making of filters, duplexers and oscillators used in radio frequency (RF) front-end systems for portable electronic devices. These MEMS components not only enable size, power and cost reduction with respect to their existing counterparts, but also open exciting opportunities for implementing new functionalities when used in large arrays. Almost all MEMS resonators require interfacing with one or more Complementary Metal Oxide Semiconductor (CMOS) integrated circuit components or modules in processing raw signals from individual MEMS devices. Hence, these devices should be integrated with CMOS circuits in an efficient and robust way in order to facilitate their deployment in large arrays with minimal parasitics, delay and power losses due to signal routing and CMOS-MEMS interconnects. Among the MEMS resonators developed to date, Aluminum Nitride (AlN) MEMS Contour-Mode Resonators (CMRs) offer high electro-mechanical coupling coefficient (𝑘𝑡2) and quality factor (Q), and a center frequency (f0) that can be set lithographically by varying the device in-plane dimensions. Also, AlN MEMS CMRs can be fabricated using state-of-the-art CMOS processes and micromachining techniques. These properties allow the synthesis of multi-frequency band-pass filters (BPFs) on a single chip with a low insertion loss and the capability of direct matching to 50 Ω systems. All these advantages, along with a sufficiently mature fabrication process, make AlN CMRs one of the ideal candidates for pursuing their integration with CMOS technology and implement high performance filters with programming capability. In this work we develop for the first time a three-dimensional (3D) heterogeneously integrated AlN MEMS-CMOS platform that enables the realization of such systems as self- healing filters for RF front-ends and programmable filter arrays for cognitive radios. We collaborated with the A*STAR, Institute of Microelectronics (IME), Singapore in the development of AlN MEMS platform on an 8" silicon (Si) wafer; on the other hand, CMOS chips were fabricated in 65 nm International Business Machines Corporation (IBM) and 28 nm Samsung processes. Solder bumps were placed on CMOS chips by Tag and Label Manufacturers Institute (TLMI) under the supervision of Metal Oxide Semiconductor Implementation Service (MOSIS). We demonstrated 3D integrated chip stacks with primary RF signal routing on MEMS and on CMOS for self-healing filters, and showcased the other system via wire-bonding to off-the-shelf CMOS components on a printed circuit board (PCB) because of the inability to continue to have access to the CMOS wafers and bumping processes over the last two years of the project.

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Nair, Manju S. "Self-healing in Space Electronics Circuits". Thesis, 2022. https://etd.iisc.ac.in/handle/2005/5829.

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Self-healing in space electronics carries the possibility of creating a paradigm shift in engineering space systems with lesser complexity and mass. Space electronics plays a crucial role in the success of a mission as it acts as the brain, linking diverse systems and generating synergy. The possibility for the faults to develop is more in spacecraft due to long-duration exposure to operating environments of temperature, vacuum, radiation and cyclic operations. Space electronic packages consist of printed circuit boards, and they, in turn, have numerous crisscrossing copper tracks carrying crucial signals. Open interconnect faults that may occur in these tracks during the package operation plays a crucial role in the operational reliability of the mission. These damages can lead to degraded performance, progressive failures detrimental to the payload or the satellite itself.In space missions during the fault scenarios, troubleshooting and repair are almost impossible from the ground unless there is an automatic active healing system in the spacecraft itself. The studies in this thesis can transmute space electronics with eFASH-enabled PCBs. The research work presented in this thesis also lay the foundation for further investigations, which will be beneficial for self-healed space electronics. This thesis acts as an enabler for future space technology in the facet of the emerging space economy.

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Avula, Benzamin. "Microscopic Analysis of Self Healing Circuits Using Image Processing". Thesis, 2022. https://etd.iisc.ac.in/handle/2005/5947.

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Open circuit faults are common circuit failure mechanism in Thin Film Transistor (TFT) integrated circuits or Printed Circuit Boards (PCBs). Thin film Transistors are widely used in flexible electronics and are manufactured using roll-to-roll methods for application in flexible displays and image sensors, energy harvesters and wearable electronics. Circuits and systems on flexible substrates experience open circuit failures due to mechanical causes such as bending and stretching and electrical causes such as electro-static discharge. It is therefore important to address the problem of open circuit faults. The above problem has been conventionally addressed by the use of new interconnect geometries and stretchable materials. However, these are passive methods and do not solve the problem for non-mechanical causes of open faults. Another approach has been the self-healing of interconnects using a dispersion of conductive particles in an insulating medium. This dispersion is packaged over the interconnect. When a current carrying interconnect experiences and open-fault, the conductive particles of the dispersion are polarized and experience dipole-dipole attractive forces. This eventually leads to the particles chaining up to form a bridge that heals the fault. So far, the models are based on the macroscopic or system level behavior of the dispersion in response to an electric field. These models assume that there are two main forces at play – the dipole-dipole attractive force aiding the healing, and the viscous drag in the fluid inhibiting the motion of particles. In this work, we perform a microscopic analysis of each particle using image processing techniques. The image processing technique used is a robust pixel wise classification algorithm and a convolutional auto-encoder based image segmentation algorithm for particle segmentation. Essentially, the motion of each particle is tracked and the force versus inter-particle distance profile is obtained. This indicates the kind of forces at play. Experiments indicate the force roughly varies as the inverse fourth power of distance thereby corroborating with the model of dipole-dipole interaction.

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Tsai, Yun-Ta, i 蔡昀達. "Phase-Locked Loops Using Self-Healing Circuits and Fast-Locking Technique". Thesis, 2010. http://ndltd.ncl.edu.tw/handle/06902279819998006944.

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碩士
臺灣大學
電子工程學研究所
98
With the progress of the CMOS technologies, the demand of high-speed communication system grows gradually. The most important part of the communication system is clock system, which directly determines the speed and system performance. However, the leakage current problem in 90n or 65nm processes will degrade the performance of the clock systems, and the subject of this dissertation is to solve the problems of the clock generators in nanoscale processes. We propose the fast-locking phase-locked loop in the final part of the thesis. Phase-locked loops (PLLs) and delay-locked loops (DLLs) have been typically employed for the clock generations. PLLs are usually used in the high-speed applications due to their clock multiplication architecture. Thus, PLLs usually use the dynamic circuit to achieve the high-speed applications. However, in nanoscale processes, the large leakage current will degrade the performance of a PLL seriously. Furthermore, the leakage current may make digital dynamic circuits not to work properly. And the severe channel length modulation and the cirrent mismatch of the charge pump (CP) will produce large reference spur. These problems must be taken into account when the clock generators are implemented in nanoscale processes. In this dissertation, we propose the self-healing circuits for the dynamic TSPC. The self-healing circuits will detect the output of the TSPC. If it detects the malfunction of the TSPC, the self-healing circuits will counteract the leakage current and repair the state. Beside, the poor device matching and leakage current vary the common-mode voltage of a ring-based voltage-controlled oscillator (VCO) over a wide frequency range. It may limit the oscillation frequency range of a VCO and even causes a VCO not to oscillate. Here, we propose the self-healing circuits for the VCO. The circuits have the bottom-level detector to detect the swing voltage of the VCO and the current compensator. If the circuits detect the swing voltage too small to oscillate, it will compensate the current to the VCO. Furthermore, a digital technique is adopted to calibrate the current mismatch of the CP in phase-locked system. The amplitude of the reference spur can be reduced. Finally, we propose the fast-locking technique to reduce the locking time of the PLL by using the frequency detector circuits and the gated-ring-oscillator (GRO).

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Książki na temat "Self healing circuits"

Guo, Xinfei, i Mircea R. Stan. Circadian Rhythms for Future Resilient Electronic Systems: Accelerated Active Self-Healing for Integrated Circuits. Springer, 2019.

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Stan, Mircea R., i Xinfei Guo. Circadian Rhythms for Future Resilient Electronic Systems: Accelerated Active Self-Healing for Integrated Circuits. Springer International Publishing AG, 2020.

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Wanner, Reverend Mike. Love Energy Circuit Healing for Abused People: Victim Self-Help with Family and or Healer or Professional Assistance. Independently Published, 2019.

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Części książek na temat "Self healing circuits"

Chen, Vanessa H. C., Gokce Keskin i Lawrence T. Pileggi. "Self-Healing Circuits Using Statistical Element Selection". W Analog/RF and Mixed-Signal Circuit Systematic Design, 53–75. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-36329-0_3.

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del Rio, David, Ainhoa Rezola, Juan F. Sevillano, Igone Velez i Roc Berenguer. "Design of Wideband Up-Converters with Self-healing Capabilities". W Analog Circuits and Signal Processing, 135–76. Cham: Springer International Publishing, 2018. http://dx.doi.org/10.1007/978-3-319-93281-1_6.

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del Rio, David, Ainhoa Rezola, Juan F. Sevillano, Igone Velez i Roc Berenguer. "Design of Wideband Millimeter-Wave Power Detectors to Enable Self-healing and Digital Correction Capabilities". W Analog Circuits and Signal Processing, 213–30. Cham: Springer International Publishing, 2018. http://dx.doi.org/10.1007/978-3-319-93281-1_8.

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Sen, Shreyas, Vishwanath Natarajan i Abhijit Chatterjee. "Low-Power Adaptive Mixed Signal/RF Circuits and Systems and Self-Healing Solutions". W Low-Power Variation-Tolerant Design in Nanometer Silicon, 293–333. Boston, MA: Springer US, 2010. http://dx.doi.org/10.1007/978-1-4419-7418-1_9.

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Wang, Zuowei, Hong Zhang, Dongchao Liu, Shiping E., Kanjun Zhang, Haitao Li, Hengxuan Li i Zhigang Chen. "New Principle of Fault Data Synchronization for Intelligent Protection Based on Wavelet Analysis". W Proceeding of 2021 International Conference on Wireless Communications, Networking and Applications, 850–61. Singapore: Springer Nature Singapore, 2022. http://dx.doi.org/10.1007/978-981-19-2456-9_87.

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AbstractIn order to eliminate the influence of the delay error of the sampled value in the data link on the longitudinal differential protection device, this paper proposes a protection data self-healing synchronization algorithm based on wavelet transform to calculate the moment of sudden change. First, calculate the mutation amount of the sampled data at each end in real time. When the mutation amount threshold is exceeded, it is determined that the multi-terminal system has a short-circuit fault. Then, according to the sudden change characteristics of the collected current waveform, the wavelet modulus maximum value is used to extract the fault sudden change time of each end data, based on the fault time at one terminal, the automatic compensation for the time differences between this terminal and others are realized, thus a new sampling sequence is formed. The resynchronized sampling sequences are used to calculate the differential current and braking current after fault to ensure the correct action of the protective device. Through theoretical analysis and simulations, the correctness and effectiveness of the proposed algorithm is verified; in addition, it is shown that this algorithm can improve the reliability of actions by the intelligent protection device, thus realizing protections such as multi-terminal differential, wide-area differential, etc.

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Streszczenia konferencji na temat "Self healing circuits"

Panhofer, Thomas, i Martin Delvai. "Self-Healing Circuits for Space-Applications". W 2007 International Conference on Field Programmable Logic and Applications. IEEE, 2007. http://dx.doi.org/10.1109/fpl.2007.4380701.

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Levin, Ilya, Vladimir Ostrovsky, Sergey Ostanin i Mark Karpovsky. "Self-checking sequential circuits with self-healing ability". W the 12th ACM Great Lakes Symposium. New York, New York, USA: ACM Press, 2002. http://dx.doi.org/10.1145/505306.505322.

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Panhofer, Thomas, Werner Friesenbichler i Martin Delvai. "Optimization concepts for self-healing asynchronous circuits". W 2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems. IEEE, 2009. http://dx.doi.org/10.1109/ddecs.2009.5012100.

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Joshi, Pushkaraj, Li Ding, James Macdonald i Sanjiv Sambandan. "Self-healing of Thin Film Transistor Circuits". W 2021 IEEE International Conference on Flexible and Printable Sensors and Systems (FLEPS). IEEE, 2021. http://dx.doi.org/10.1109/fleps51544.2021.9469703.

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Yinger, Robert J. "Self-healing circuits at Southern California Edison". W 2012 IEEE/PES Transmission and Distribution Conference and Exposition (T&D). IEEE, 2012. http://dx.doi.org/10.1109/tdc.2012.6281472.

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Devarakond, Shyam Kumar, Vishwanath Natarajan, Shreyas Sen i Abhijit Chatterjee. "BIST-assisted power aware self healing RF circuits". W 2009 IEEE 15th International Mixed-Signals, Sensors, and Systems Test Workshop (IMS3TW). IEEE, 2009. http://dx.doi.org/10.1109/ims3tw.2009.5158691.

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Rhodes, R., S. Basu, I. German, C. Miners, M. Svensson i G. C. Stevens. "SELF-HEALING DIELECTRIC FLUID FOR FLUID FILLED CIRCUITS". W CIRED 2021 - The 26th International Conference and Exhibition on Electricity Distribution. Institution of Engineering and Technology, 2021. http://dx.doi.org/10.1049/icp.2021.1870.

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Wang, Hua, Kaushik Dasgupta i Ali Hajimiri. "A broadband self-healing phase synthesis scheme". W 2011 IEEE Radio Frequency Integrated Circuits Symposium (RFIC). IEEE, 2011. http://dx.doi.org/10.1109/rfic.2011.5940673.

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Bowers, Steven M., Kaushik Sengupta, Kaushik Dasgupta i Ali Hajimiri. "A fully-integrated self-healing power amplifier". W 2012 IEEE Radio Frequency Integrated Circuits Symposium (RFIC). IEEE, 2012. http://dx.doi.org/10.1109/rfic.2012.6242268.

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Ma, Desheng, Fa Foster Dai, Charles E. Stroud i Richard C. Jaeger. "A tunable wideband LNA for self-healing applications". W 2011 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM. IEEE, 2011. http://dx.doi.org/10.1109/bctm.2011.6082759.

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