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Gotowe bibliografie tematyczne / Optical beam deflection

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Gotowa bibliografia na temat „Optical beam deflection”

Autor: Grafiati

Data publikacji: 6 września 2023

Data aktualizacji: 7 września 2023

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Artykuły w czasopismach na temat "Optical beam deflection"

1

Faris, Gregory W., i Robert L. Byer. "Beam-deflection optical tomography". Optics Letters 12, nr 2 (1.02.1987): 72. http://dx.doi.org/10.1364/ol.12.000072.

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Fei Pan, Fei Pan, Lingjiang Kong Lingjiang Kong, Xiaobo Yang Xiaobo Yang, Yue Ai Yue Ai i Yan Zhou Yan Zhou. "Dual beam deflection of liquid crystal optical phased array". Chinese Optics Letters 10, s2 (2012): S20502–320506. http://dx.doi.org/10.3788/col201210.s20502.

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Kucherenko, Oleg K. "DETERMINATION OF THE ACOUSTO-OPTICAL DEFLECTOR PARAMETERS FOR A LASER-RADIATION ROCKET GUIDANCE SYSTEM". Bulletin of Kyiv Polytechnic Institute. Series Instrument Making, nr 62(2) (24.12.2021): 17–22. http://dx.doi.org/10.20535/1970.62(2).2021.249110.

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The work is devoted to the development of an acousto-optic deflector for a laser-beam guidance system (LLSN) of missiles. LLSN is used in semiautomatic portable missile systems to destroy hostile targets of various types. An analysis of the methods for constructing such systems has shown that the most promising devices with pulse-code modulation using semiconductor pulsed lasers. The article provides a diagram and describes the principle of operation of the LLSN with pulse-code modulation. A problematic issue in the implementation of such a system is the development of a device for deflecting a laser beam, through which the missile is guided to a target. Scanning mechanical devices that are currently in use have a complex design, significant dimensions and weight, and limited performance. The article proposes to use an acousto-optic deflector to deflect the laser beam within the information field of the guidance system, which is devoid of these disadvantages, since it replaces the mechanical scanning device with an electronic one. The purpose of the article is to determine the main parameters of the acousto-optical deflector. The article discusses the principle of operation of an acousto-optic deflector. It is noted that glasses based on germanium chalcogenides, in particular, glass with the composition Ge2.17As39.13S58.70, have especially low values of acoustic losses (α <1 dB / cm). The largest deflection angle of the laser beam will be observed with Bragg diffraction. Relationships are given that can be used to determine the main characteristics of the deflector: the angle of deflection of the laser beam, the modulation frequency of the acoustic wave, resolution, speed, and others. When using the above ratios for the typical parameters of the existing guidance system, the values of the indicated characteristics are calculated.

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Hayden, Victor C., i Luc Y. Beaulieu. "Modeling Rectangular Cantilevers during Torsion and Deflection for Application to Frictional Force Microscopy". Microscopy and Microanalysis 15, nr 3 (22.05.2009): 259–64. http://dx.doi.org/10.1017/s1431927609090382.

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AbstractA numerical and experimental analysis of the optical beam deflection system used to monitor microcantilevers subjected to simultaneous deflection and twisting such as in lateral or frictional force microscopy was performed. This study focused on two optical beam deflection orientations where in the first case the optical beam and the detector are at a right angle to the length of the cantilever and the second case, which is the more standard orientation, the optical beam is parallel to the length of the lever. This study finds that it is possible to model the twist and the deflection separately and treat each motion independently. Simulations have shown that the above-mentioned systems are equivalent in accuracy and sensitivity for monitoring the simultaneous twist and deflection of cantilevers.

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Verly, Pierre G. "Low-loss liquid-crystal-clad waveguide switch with a large angular separation of the optical beams". Canadian Journal of Physics 65, nr 5 (1.05.1987): 476–83. http://dx.doi.org/10.1139/p87-064.

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We propose a new nematic liquid-crystal-clad electrooptic waveguide beamsplitter simultaneously capable of very high beam deflections and relatively low losses. A trade-off between the deflection and the cross talk due to unswitched spatial frequencies of a realistic diverging beam is discussed with respect to waveguide materials and geometries.

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Caron, James N., James B. Mehl i Karl V. Steiner. "Acoustic‐wave detection by optical beam deflection". Journal of the Acoustical Society of America 103, nr 5 (maj 1998): 2795. http://dx.doi.org/10.1121/1.421838.

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Faris, Gregory W., i Robert L. Byer. "Beam-deflection optical tomography of a flame". Optics Letters 12, nr 3 (1.03.1987): 155. http://dx.doi.org/10.1364/ol.12.000155.

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Sakamoto, João M. S., Renan B. Marques, Cláudio Kitano, Nicolau A. S. Rodrigues i Rudimar Riva. "Optical beam deflection sensor: design and experiments". Applied Optics 56, nr 28 (29.09.2017): 8005. http://dx.doi.org/10.1364/ao.56.008005.

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Salloum, Akil, i Yomen Atassi. "On calorimetry by optical beam deflection method". Thermochimica Acta 409, nr 1 (styczeń 2004): 87–93. http://dx.doi.org/10.1016/s0040-6031(03)00330-7.

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Matsuoka, Tatsuro, Akihiro Kumata, Shinobu Koda i Hiroyasu Nomura. "Ultrasonic Velocity Measurement Using Optical Beam Deflection". Japanese Journal of Applied Physics 34, Part 1, No. 5B (30.05.1995): 2778–80. http://dx.doi.org/10.1143/jjap.34.2778.

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Rozprawy doktorskie na temat "Optical beam deflection"

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Thomas, James A. "Optical phased array beam deflection using lead lanthanum zirconate titanate /". Diss., Connect to a 24 p. preview or request complete full text in PDF format. Access restricted to UC campuses, 1998. http://wwwlib.umi.com/cr/ucsd/fullcit?p9907669.

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Glenn, Timothy Scott 1971. "Velocity measurement of laser energy induced Rayleigh surface waves on bulk substrates employing the optical beam deflection (knife-edge detection) method". Thesis, Massachusetts Institute of Technology, 1995. http://hdl.handle.net/1721.1/49947.

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Münnich, Matthias. "Beam Deflection". Master's thesis, University of Central Florida, 2013. http://digital.library.ucf.edu/cdm/ref/collection/ETD/id/5823.

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In order to fully understand the third order nonlinear optical response of materials under high irradiance excitation it is necessary to study the temporal and polarization dependence of nonlinear refraction and absorption. There are several existing approaches such as Z-scan and pump-probe techniques to determine those responses. As part of this work, these approaches will be briefly outlined before presenting beam deflection, applied from photothermal beam deflection, as an alternative experimental technique to determine the nonlinear refraction with its temporal and polarization dynamics. This technique measures the angle of the probe beam deflected via the index gradient of the material induced by strong excitation beam, to determine both the sign and magnitude of the nonlinear refraction. The temporal and tensor properties of the nonlinear refractive index can be determined by introducing a delay line, and by varying the polarization of the excitation and probe beam, respectively. To demonstrate the practicality of the beam deflection technique, we performed measurements on Fused Silica, Carbon Disulfide and Zinc Oxide. Each of these samples shows quite different nonlinear responses. Amorphous fused silica exhibits nonlinear refraction purely from instantaneous electronic contribution; while Carbon Disulfide shows a much slower response, originating not only from the electronic contribution but also from non-instantaneous nuclear movements (e.g. molecular orientation). These two contributions can be separated by varying the polarization direction of the excitation and probe beam. By introducing lock-in detection technique, a sensitivity of /5500 can be achieved. In Zinc Oxide, a wide-bandgap semiconductor, we measure both nonlinear refraction and two-photon absorption simultaneously. Therefore the beam deflection is a sensitive technique, which can be used to measure the time and polarization dynamics of the nonlinear response of the material.
M.S.
Masters
Optics and Photonics
Optics and Photonics
Optics; International

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Kočvara, Pavel. "Měření mechanické stability budov a stožárů využívaných pro FSO spoje". Master's thesis, Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií, 2015. http://www.nusl.cz/ntk/nusl-221236.

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The Master's thesis deals with the determination of measurement method of deflection the axis of the optical beam from its ideal position, which is caused by action of force of strong winds affecting the positional stability of the building or supporting structure (tower) used for placement of FSO links'heads. The thesis informs the readers about the other causes of deflection of beam axis in a real environment, about methods of determining the position of the beam axis in the plane perpendicular to the beam axis and the basic properties and parameters of the Gauss beams, including the phenomenon of diffraction on the output aperture of the laser transmitter.

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Kern, Michal. "Optický systém pro torzně detekovanou elektronovou spinovou rezonanční spektroskopii". Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2015. http://www.nusl.cz/ntk/nusl-232014.

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Táto diplomová práca sa venuje vylepšeniu spektroskopu Torzne Detegovanej Elektrónovej Spinovej Rezonancie (TDESR) výmenou aktuálnej kapacitnej detekcie výchylky ohybného ramienka za optické metódy. Práca popisuje základy Elektrónovej Spinovej Rezonančnej (ESR) spektroskopie s dôrazom na TDESR a tému magnetizmu jednomolekulových magnetov. Následne je vysvetlená detekcia výchylky ramienka pomocou odrazu laserového zväzku a interferometrie. Všetky kroky nutné k skonštruovaniu spektrometra a jeho uvedenia do prevádzky sú podrobne popísané. Pomocou detekcie odrazu laserového zväzku sme úspešne získali vysoko kvalitné TDESR spektrá kryštálu jednomolekulového magnetu Fe4. Týmto meraním sme dokázali vhodnosť použitia tejto metódy a jej výraznú prevahu nad pôvodnou kapacitnou detekciou, najmä v oblasti kvality, rozlíšenia a rýchlosti. Zároveň sme na ďaľšie vylepšenie TDESR spektrometra navrhli a zostrojili zostavu využívajúcu na detekciu výchylky interferometer.

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Khan, Sajjad. "Liquid Crystal Optics for Communications, Signal Processing and 3-D Microscopic Imaging". Doctoral diss., University of Central Florida, 2005. http://digital.library.ucf.edu/cdm/ref/collection/ETD/id/3389.

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This dissertation proposes, studies and experimentally demonstrates novel liquid crystal (LC) optics to solve challenging problems in RF and photonic signal processing, freespace and fiber optic communications and microscopic imaging. These include free-space optical scanners for military and optical wireless applications, variable fiber-optic attenuators for optical communications, photonic control techniques for phased array antennas and radar, and 3-D microscopic imaging. At the heart of the applications demonstrated in this thesis are LC devices that are non-pixelated and can be controlled either electrically or optically. Instead of the typical pixel-by-pixel control as is custom in LC devices, the phase profile across the aperture of these novel LC devices is varied through the use of high impedance layers. Due to the presence of the high impedance layer, there forms a voltage gradient across the aperture of such a device which results in a phase gradient across the LC layer which in turn is accumulated by the optical beam traversing through this LC device. The geometry of the electrical contacts that are used to apply the external voltage will define the nature of the phase gradient present across the optical beam. In order to steer a laser beam in one angular dimension, straight line electrical contacts are used to form a one dimensional phase gradient while an annular electrical contact results in a circularly symmetric phase profile across the optical beam making it suitable for focusing the optical beam. The geometry of the electrical contacts alone is not sufficient to form the linear and the quadratic phase profiles that are required to either deflect or focus an optical beam. Clever use of the phase response of a typical nematic liquid crystal (NLC) is made such that the linear response region is used for the angular beam deflection while the high voltage quadratic response region is used for focusing the beam. Employing an NLC deflector, a device that uses the linear angular deflection, laser beam steering is demonstrated in two orthogonal dimensions whereas an NLC lens is used to address the third dimension to complete a three dimensional (3-D) scanner. Such an NLC deflector was then used in a variable optical attenuator (VOA), whereby a laser beam coupled between two identical single mode fibers (SMF) was mis-aligned away from the output fiber causing the intensity of the output coupled light to decrease as a function of the angular deflection. Since the angular deflection is electrically controlled, hence the VOA operation is fairly simple and repeatable. An extension of this VOA for wavelength tunable operation is also shown in this dissertation. A LC spatial light modulator (SLM) that uses a photo-sensitive high impedance electrode whose impedance can be varied by controlling the light intensity incident on it, is used in a control system for a phased array antenna. Phase is controlled on the Write side of the SLM by controlling the intensity of the Write laser beam which then is accessed by the Read beam from the opposite side of this reflective SLM. Thus the phase of the Read beam is varied by controlling the intensity of the Write beam. A variable fiber-optic delay line is demonstrated in the thesis which uses wavelength sensitive and wavelength insensitive optics to get both analog as well as digital delays. It uses a chirped fiber Bragg grating (FBG), and a 1xN optical switch to achieve multiple time delays. The switch can be implemented using the 3-D optical scanner mentioned earlier. A technique is presented for ultra-low loss laser communication that uses a combination of strong and weak thin lens optics. As opposed to conventional laser communication systems, the Gaussian laser beam is prevented from diverging at the receiving station by using a weak thin lens that places the transmitted beam waist mid-way between a symmetrical transmitter-receiver link design thus saving prime optical power. LC device technology forms an excellent basis to realize such a large aperture weak lens. Using a 1-D array of LC deflectors, a broadband optical add-drop filter (OADF) is proposed for dense wavelength division multiplexing (DWDM) applications. By binary control of the drive signal to the individual LC deflectors in the array, any optical channel can be selectively dropped and added. For demonstration purposes, microelectromechanical systems (MEMS) digital micromirrors have been used to implement the OADF. Several key systems issues such as insertion loss, polarization dependent loss, wavelength resolution and response time are analyzed in detail for comparison with the LC deflector approach. A no-moving-parts axial scanning confocal microscope (ASCM) system is designed and demonstrated using a combination of a large diameter LC lens and a classical microscope objective lens. By electrically controlling the 5 mm diameter LC lens, the 633 nm wavelength focal spot is moved continuously over a 48 [micro]m range with measured 3-dB axial resolution of 3.1 [micro]m using a 0.65 numerical aperture (NA) micro-objective lens. The ASCM is successfully used to image an Indium Phosphide twin square optical waveguide sample with a 10.2 [micro]m waveguide pitch and 2.3 [micro]m height and width. Using fine analog electrical control of the LC lens, a super-fine sub-wavelength axial resolution of 270 nm is demonstrated. The proposed ASCM can be useful in various precision three dimensional imaging and profiling applications.
Ph.D.
Optics and Photonics
Optics

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Pandey, Piyush kumar. "Multi-Axis Motion Measurement Systems Based on Optical Beam Deflection". Thesis, 2021. https://etd.iisc.ac.in/handle/2005/5748.

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Multi-axis motion measurement is indispensable for precision motion control, and characterization of dynamic response of mechanical structures. This work describes the development and applications of a 5-axis high bandwidth motion measurement system based on optical beam deflection. The system can measure in-plane and out-of-plane motion of both macro- and micro-scale objects, namely, one- axis out-of-plane linear displacement, two-axis in-plane linear displacement and two-axis out-of-plane angular displacement. The system can measure transient motion of a target with a measurement bandwidth of over 1MHz. The measurement resolution can be less than a nanometre along the linear degrees of freedom (DOF) and less than a micro-radian along the angular DOF. The design and analysis of the measurement system will be discussed first. The sensitivity of the system for displacements along 5 axes has been derived and subsequently employed to optimize the system. The achievable resolution with this system would also be discussed. Next, the development, calibration, and evaluation of the measurement system would be presented. This includes a discussion of a novel calibration strategy, along with estimation of the bandwidth and range of the system. Subsequently, development of multi-point motion measurement capability for the system would be discussed. In particular, the design and evaluation of a novel calibration stage that enables automated calibration and measurement of motion at multiple points on the target would be discussed. The system has been employed to capture the deformation profiles of a micro-cantilever beam as it was excited at its first and second Eigen modes. Finally, the applications of the system for measurement of in-plane and out-of-plane motion of various macro- and micro-scale devices, whose motion is otherwise difficult to characterize, would be presented. These include measurement and control of in-plane displacement of a high-speed XY nano-positioning stage, characterization of a piezo-based 2-axis nano-positioner and simultaneous characterization of rigid body translational and rotational transient responses of RF MEMS switches. Finally, the measurement system has been utilized as part of a novel atomic force microscope (AFM) which enables active cancellation of base vibration of cantilever beam. The applicability of this AFM for elimination of artifacts due to the vibration would be presented.

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Phani, Arindam. "Novel Diffraction Based Deflection Profiling For Microcantilever Sensor Technology". Thesis, 2011. https://etd.iisc.ac.in/handle/2005/2433.

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A novel optical diffraction based technique is proposed and demonstrated to measure deflections of the order of ~1nm in microcantilevers (MC) designed for sensing ultra-small forces of stress. The proposed method employs a double MC structure where one of the cantilevers acts as the active sensor beam, while the other as a reference. The active beam can respond to any minute change of stress, for example, molecular recognition induced surface stress, through bending (~1nm) relative to the other fixed beam. Optical diffraction patterns obtained from this double slit aperture mask with varying slit width, which is for the bending of MC due to loading, carries the deflection profile of the active beam. A significant part of the present work explores the possibility of connecting diffraction minima (or maxima) to the bending profile of the MC structure and thus the possibility to measure induced surface stress. To start with, it is also the aim to develop double MC sensors using PHDDA (Poly – Hexane diol diacrylate) because this material has the potential to achieve high mechanical deformation sensitivity in even moderately scaled down structures by virtue of its very low Young’s modulus. Moreover, the high thermal stability of PHDDA also ensures low thermally induced noise floors in microcantilever sensors. To demonstrate the proposed optical diffraction-based profiling technique, a bent microcantilever structure is designed and fabricated by an in-house developed Microstereolithography (MSL) system where, essentially one of the microcantilevers is fabricated with a bent profile by varying the gap between the two structures at each cured 2D patterned layer. The diffraction pattern obtained on transilluminating the fabricated structure by a spherical wavefront is analyzed and the possibility of obtaining the deflections at each cross section is ascertained. Since the proposed profiling technique relies on the accurate detection and measurement of shifts of intensity minima on the image plane, analysis of the minimum detectable shift in intensity minima for the employed optical interrogation setup with respect to the minimum detectable contrast and SNR of the optical measurement system is carried out, in order to justify the applicability of the proposed minima intensity shift measurement technique. The proposed novel diffraction based profiling technique can provide vital clue on the origins of surface stress at the atomic and molecular level by virtue of the entire bent profile due to adsorption induced bending thereby establishing microcantilever sensor technology as a more reliable and competitive approach for sensing ultra-low concentrations of biological and chemical agents.

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Phani, Arindam. "Novel Diffraction Based Deflection Profiling For Microcantilever Sensor Technology". Thesis, 2011. http://hdl.handle.net/2005/2433.

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A novel optical diffraction based technique is proposed and demonstrated to measure deflections of the order of ~1nm in microcantilevers (MC) designed for sensing ultra-small forces of stress. The proposed method employs a double MC structure where one of the cantilevers acts as the active sensor beam, while the other as a reference. The active beam can respond to any minute change of stress, for example, molecular recognition induced surface stress, through bending (~1nm) relative to the other fixed beam. Optical diffraction patterns obtained from this double slit aperture mask with varying slit width, which is for the bending of MC due to loading, carries the deflection profile of the active beam. A significant part of the present work explores the possibility of connecting diffraction minima (or maxima) to the bending profile of the MC structure and thus the possibility to measure induced surface stress. To start with, it is also the aim to develop double MC sensors using PHDDA (Poly – Hexane diol diacrylate) because this material has the potential to achieve high mechanical deformation sensitivity in even moderately scaled down structures by virtue of its very low Young’s modulus. Moreover, the high thermal stability of PHDDA also ensures low thermally induced noise floors in microcantilever sensors. To demonstrate the proposed optical diffraction-based profiling technique, a bent microcantilever structure is designed and fabricated by an in-house developed Microstereolithography (MSL) system where, essentially one of the microcantilevers is fabricated with a bent profile by varying the gap between the two structures at each cured 2D patterned layer. The diffraction pattern obtained on transilluminating the fabricated structure by a spherical wavefront is analyzed and the possibility of obtaining the deflections at each cross section is ascertained. Since the proposed profiling technique relies on the accurate detection and measurement of shifts of intensity minima on the image plane, analysis of the minimum detectable shift in intensity minima for the employed optical interrogation setup with respect to the minimum detectable contrast and SNR of the optical measurement system is carried out, in order to justify the applicability of the proposed minima intensity shift measurement technique. The proposed novel diffraction based profiling technique can provide vital clue on the origins of surface stress at the atomic and molecular level by virtue of the entire bent profile due to adsorption induced bending thereby establishing microcantilever sensor technology as a more reliable and competitive approach for sensing ultra-low concentrations of biological and chemical agents.

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Yung, Ching-Long Ou, i 歐陽慶龍. "Position Control of the Optical Beam Deflector". Thesis, 2001. http://ndltd.ncl.edu.tw/handle/04150744673145644501.

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碩士
中原大學
機械工程研究所
89
ABSTRACT In this paper, the optical beam deflector is composed of two piezoelectric layers, one sandwiched brass layer in the middle with both ends clamped and a mirror attached to the upper surface of the top piezoelectric layer in the central position. This structure is designed to deflect the mirror to a certain angular position by applying external voltage supply to piezo-layers. This study proposes an optimal angular position control scheme of the attached mirror. The governing partial differential equations are first derived for the ensuing analysis and control design, which is followed by the establishment of finite element model in ten nodes specified at some longitudinal points of the optical beam deflector. In order to achieve a faster convergent rate for the deflector to reach the desired angular position, the optimal control of LQR (Linear quadratic regulator) with final states free is employed to explore the possibility of shorter transient response and less cost of control effort and states. Besides, the pole-placement control with observer is employed to control the angular position. The optimal feedback control is obtained based on solving Riccati equation in steady state time. The numerical simulation results are finally provided to validate the theoretical control design.

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Książki na temat "Optical beam deflection"

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Williams, B. A. Optical beam deflection techniques for material characterisation. Manchester: UMIST, 1995.

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F, Marshall Gerald, Beiser Leo, Society of Photo-optical Instrumentation Engineers. i IS & T--the Society for Imaging Science and Technology., red. Beam deflection and scanning technologies: 25 February-1 March, 1991. Bellingham, Wash., USA: SPIE, 1991.

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Części książek na temat "Optical beam deflection"

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Murphy, J. C., J. W. Maclachlan Spicer, R. B. Givens, L. C. Aamodt i G. Chang. "Optical Beam Deflection in Semiconductors with Electron Beam Excitation". W Photoacoustic and Photothermal Phenomena II, 249–53. Berlin, Heidelberg: Springer Berlin Heidelberg, 1990. http://dx.doi.org/10.1007/978-3-540-46972-8_62.

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Aamodt, L. C., J. C. Murphy i J. W. Maclachlan. "Image Distortion in Optical-Beam-Deflection Imaging". W Photoacoustic and Photothermal Phenomena, 385–88. Berlin, Heidelberg: Springer Berlin Heidelberg, 1988. http://dx.doi.org/10.1007/978-3-540-48181-2_101.

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McBride, S. E., i G. C. Wetsel. "Surface-Displacement Imaging Using Optical Beam Deflection". W Review of Progress in Quantitative Nondestructive Evaluation, 909–16. Boston, MA: Springer US, 1990. http://dx.doi.org/10.1007/978-1-4684-5772-8_115.

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Wang, Y. Z., W. G. Huang, Y. D. Cheng i L. Liu. "Test of Photon Statistics by Atomic Beam Deflection". W Springer Series in Optical Sciences, 238–41. Berlin, Heidelberg: Springer Berlin Heidelberg, 1985. http://dx.doi.org/10.1007/978-3-540-39664-2_74.

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Murphy, J. C., G. C. Wetsel, J. W. Maclachlan i J. B. Spicer. "Nondestructive Evaluation and Materials Characterization Using Photothermal-Optical-Beam-Deflection Imaging". W Review of Progress in Quantitative Nondestructive Evaluation, 713–19. Boston, MA: Springer US, 1986. http://dx.doi.org/10.1007/978-1-4615-7763-8_74.

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Geßner, Felix, Matthias Weigold i Eberhard Abele. "Investigation on Tool Deflection During Tapping". W Lecture Notes in Mechanical Engineering, 104–14. Cham: Springer International Publishing, 2021. http://dx.doi.org/10.1007/978-3-030-77256-7_10.

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AbstractTapping is a challenging process at the end of the value chain. Hence, tool failure is associated with rejected components or expensive rework. For modelling the tapping process we choose a mechanistic approach. In the present work, we focus on the tool model, which describes the deflection and inclination of the tool as a result of the radial forces during tapping. Since radial forces always occur during tapping due to the uneven load distribution on the individual teeth, the tool model represents an essential part of the entire closed-loop model. Especially in the entry phase of the tap, when the guidance within the already cut thread is not yet given, radial forces can lead to deflection of the tool. Therefore, the effects of geometric uncertainty in the thread geometry are experimentally investigated, using optical surface measurement to evaluate the position of the thread relative to the pre-drilled bore. Based on the findings, the tool deflection during tapping is mapped using a cylindrical cantilever beam model, which is calibrated using experimental data. The model is then validated and the implementation within an existing model framework is described.

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Chang, G. Y., R. B. Givens, J. W. M. Spicer i J. C. Murphy. "Electron-Induced Ionization and Thermalization in CdS Using Optical Beam Deflection Imaging". W Photoacoustic and Photothermal Phenomena III, 363–65. Berlin, Heidelberg: Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-540-47269-8_93.

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Wetsel, G. C., i Z. M. Liu. "Frequency Dependence of Amplitude and Phase of Photothermal-Optical-Beam-Deflection Signal". W Photoacoustic and Photothermal Phenomena II, 170–72. Berlin, Heidelberg: Springer Berlin Heidelberg, 1990. http://dx.doi.org/10.1007/978-3-540-46972-8_42.

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Iwasińska-Kowalska, Olga. "Liquid-filled adjustable optical wedge applied for deflection of the laser beam". W Advanced Mechatronics Solutions, 319–22. Cham: Springer International Publishing, 2015. http://dx.doi.org/10.1007/978-3-319-23923-1_48.

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Liu, Z. M., G. C. Wetsel i T. M. Moore. "Characterization of Semiconductor Thin Films Using High-Frequency Photothermal-Optical-Beam-Deflection Imaging". W Photoacoustic and Photothermal Phenomena II, 27–29. Berlin, Heidelberg: Springer Berlin Heidelberg, 1990. http://dx.doi.org/10.1007/978-3-540-46972-8_6.

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Streszczenia konferencji na temat "Optical beam deflection"

1

Faris, G. W., i Robert L. Byer. "Optical beam deflection tomography". W Conference on Lasers and Electro-Optics. Washington, D.C.: OSA, 1986. http://dx.doi.org/10.1364/cleo.1986.fj4.

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2

Retsky, Michael W. "Testing an electron beam deflection innovation". W International Symposium on Optical Science and Technology, redaktorzy Olivier Delage, Eric Munro i John A. Rouse. SPIE, 2001. http://dx.doi.org/10.1117/12.451282.

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3

Goering, Rolf, Wolfgang Berner i Ernst-Bernhard Kley. "Miniaturized optical systems for beam deflection and modulation". W SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, redaktorzy Neal C. Gallagher, Jr. i Chandrasekhar Roychoudhuri. SPIE, 1993. http://dx.doi.org/10.1117/12.165707.

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4

Ivanov, Valery I., Vladimir Krylov, Vladimir Khe i Galina Ivanova. "Optical beam deflection method for the diagnostics of nanosuspension". W Asia-Pacific Conference on Fundamental Problems of Opto- and Microelectronics 2017, redaktorzy Roman V. Romashko, Yuri N. Kulchin i Jyh-Chiang Jiang. SPIE, 2019. http://dx.doi.org/10.1117/12.2314752.

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Gao, Yiqing, XingDao He i Yongqing Gong. "Radon transform iteration based on beam-deflection optical tomography". W Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, redaktorzy FeiJun Song, Frank Chen, Michael Y. Y. Hung i H. M. Shang. SPIE, 2000. http://dx.doi.org/10.1117/12.402637.

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Sell, Jeffrey A. "Optical ray tracing for crossed beam photothermal deflection spectroscopy". W AIP Conference Proceedings Volume 160. AIP, 1987. http://dx.doi.org/10.1063/1.36790.

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Choi, Pak-Kon. "Broadband measurements of ultrasonic waves using optical beam deflection". W 15th international symposium on nonlinear acoustics: Nonlinear acoustics at the turn of the millennium. AIP, 2000. http://dx.doi.org/10.1063/1.1309233.

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Sell, Jeffrey A. "Optical ray tracing for crossed beam photothermal deflection spectroscopy". W International Laser Science Conference. Washington, D.C.: Optica Publishing Group, 1986. http://dx.doi.org/10.1364/ils.1986.thd3.

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Streszczenie:

A geometrical algorithm for optical ray tracing is used to trace the trajectories of probe laser beam rays in photothermal deflection spectroscopy (PDS) of a static gas. Rays are traced as a function of various parameters such as time, pump beam energy, radius, pulse duration, and absorber gas concentration. The exit angle is also computed and compared with the deflection angle calculated analytically, with very good agreement for a pump pulse duration shorter than the thermal diffusion time. For a long pump pulse duration, the analytical expression is inaccurate due to the neglect of thermal diffusion during the pump pulse. Probe beam ray crossing is examined and found to be unimportant for most common PDS situations. The saturation of the PD signal is found for high absorber concentration or pump pulse energy; this is due to excessive heating of the absorber. Finally, the maximum probe beam deflection occurs when the deflection is measured at a time corresponding to the end of the pump pulse.

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9

Heshmat, Barmak, Thomas Edward Darcie, Hamid Pahlevaninezhad i Keith Taylor. "Improved interaction geometries for efficient acousto-optic beam deflection sensing in air". W Optical Sensors. Washington, D.C.: OSA, 2012. http://dx.doi.org/10.1364/sensors.2012.sm2f.3.

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Ogata, S., H. Hosokawa i T. Yamashita. "LiNbO3 blazed grating fabricated by reactive ion-beam etching". W Integrated and Guided Wave Optics. Washington, D.C.: Optica Publishing Group, 1988. http://dx.doi.org/10.1364/igwo.1988.tud5.

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A guided-wave acousto-optic device will certainly serve important functions such as deflection, modulation and switching of laser light beams in future optical communication and processing systems. We had experimentally demonstrated, for the first time, a high-performance guided-wave acousto-optic light beam deflector by employing blazed grating couplers as shown in Fig.11. In order to realize their high coupling efficiency, the blazed grating couplers had been developed by the reactive ion-beam etching(RIBE) technique using holographically produced photoresist gratings as masks2.

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