Książki na temat „Integrated measurements”

Oettinger, Frank F. Thermal resistance measurements. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1990.

Oettinger, Frank F. Thermal resistance measurements. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1990.

Wiesław, Marciniak, i Przewłocki Henryk M, red. Diagnostic measurements in LSI/VLSI integrated circuits production. Singapore: World Scientific, 1991.

Magrab, Edward B. Computer integrated experimentation. Berlin: Springer-Verlag, 1991.

1954-, Rubio Antonio, red. Thermal testing of integrated circuits. Boston: Kluwer Academic Publishers, 2002.

Eisenstadt, William Richard. High frequency measurements of integrated circuit devices and interconnect. Stanford, CA: StanfordUniversity, 1986.

Corporation, Psychological, red. Integrated assessment system.: Swinging. San Antonio, Tex: Psychological Corporation, 1992.

Altet, Josep. Thermal Testing of Integrated Circuits. Boston, MA: Springer US, 2002.

Magrab, Edward B. Computer Integrated Experimentation. Berlin, Heidelberg: Springer Berlin Heidelberg, 1991.

Hoy, Bennett Marylyn, Society of Photo-optical Instrumentation Engineers., Semiconductor Equipment and Materials International. i SPIE Symposium on Microlithography (1994 : San Jose, Calif.), red. Integrated circuit metrology, inspection, and process control VIII: 28 February-2 March, San Jose, California. Bellingham, Wash., USA: SPIE, 1994.

Hoy, Bennett Marylyn, Society of Photo-optical Instrumentation Engineers., Semiconductor Equipment and Materials International. i SPIE Symposium on Microlithography (1994 : San Jose, Calif.), red. Integrated circuit metrology, inspection, and process control VIII: 28 February-2 March, San Jose, California. Bellingham, Wash., USA: SPIE, 1994.

Corporation, Psychological, red. Integrated assessment system.: Paper clips. San Antonio, Tex: Psychological Corporation, 1992.

Corporation, Psychological, red. Integrated assessment system.: Roller coasters. San Antonio, Tex: Psychological Corporation, 1992.

University of Wisconsin--Madison. Water Resources Center. i Geological Survey (U.S.). Water Resources Division. Wisconsin District., red. An integrated water-monitoring network for Wisconsin. Madison, WI: Wisconsin Water Resources Center, University of Wisconsin-Madison, 1998.

Corporation, Psychological, red. Integrated assessment system.: Clean water. San Antonio, Tex: Psychological Corp., 1992.

Corporation, Psychological, red. Integrated assessment system.: Spinning tops. San Antonio, Tex: Psychological Corporation, 1992.

Corporation, Psychological, red. Integrated assessment system.: Send it flying. San Antonio, Tex: Psychological Corporation, 1992.

Corporation, Psychological, red. Integrated assessment system.: Animals of long ago. San Antonio, Tex: Psychological Corporation, 1992.

Hoy, Bennett Marylyn, Society of Photo-optical Instrumentation Engineers. i Semiconductor Equipment and Materials International., red. Integrated circuit metrology, inspection, and process control IX: 20-22 February 1995, Santa Clara, California. Bellingham, Wash., USA: SPIE, 1995.

N, Varner Ruth, Potzick James E i National Institute of Standards and Technology (U.S.), red. Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.

N, Varner Ruth, Potzick James E i National Institute of Standards and Technology (U.S.), red. Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.

Harald, Bosse, Bodermann Bernd, Silver Richard M, Wissenschaftliche Gesellschaft Lasertechnik, SPIE Europe, European Optical Society i Society of Photo-optical Instrumentation Engineers., red. Modeling aspects in optical metrology: 18-19 June 2007, Munich, Germany. Bellingham, Wash: SPIE, 2007.

Europe, SPIE, European Optical Society, Wissenschaftliche Gesellschaft Lasertechnik i SPIE (Society), red. Modeling aspects in optical metrology II: 15-16 June 2009, Munich, Germany. Bellingham, Wash: SPIE, 2009.

IEEE International Symposium on Virtual and Intelligent Measurement Systems (7th 2002 Girdwood, Anchorage, Alaska). VIMS 2002: 2002 IEEE International Symposium on Virtual and Intelligent Measurement Systems : Distributed intelligent sensing for advanced integrated virtual environments : Alyeska resort, Girdwood, Alaska, USA, 19-20 May 2002. Piscataway, N.J: IEEE, 2002.

Dickey, Donyall D. The integrated approach to student achievement: A results-driven model for improving performance, leadership, and the culture of instruction at your school. Highlands, TX: aha Process, Inc., 2010.

Vezzetti, Carol F. Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.

Vezzetti, Carol F. Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.

Vezzetti, Carol F. Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.

Vezzetti, Carol F. Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.

Xuping, Zhang, Zhongguo yi qi yi biao xue hui, Zhongguo guang xue xue hui, SPIE (Society) i Zhongguo yi qi yi biao xue hui. Optoelectronic-Mechanic Technology and System Integration Chapter, red. 2009 International Conference on Optical Instruments and Technology: Optoelectronic devices and integration : 19-21 October 2009, Shanghai, China. Bellingham, Wash: SPIE, 2009.

Vezzetti, Carol F. Antireflecting-Chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, Md: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1992.

E, Martner Brooks, i Wave Propagation Laboratory, red. A Field evaluation of remote sensor measurements of wind, temperature, and moisture for ARM integrated sounding system research. Boulder, Colo: United States Dept. of Commerce, National Oceanic and Atmospheric Administration, Environmental Research Laboratories, Wave Propagation Laboratory, 1991.

Giannetti, Rosario. Turning up the heat!: A unit of study investigating heat energy : an integrated unit for grade 7. [Ontario: s.n.], 2001.

Vezzetti, Carol F. Bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring systems. Gaithersburg, Md: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.

Vezzetti, Carol F. Bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.

Vezzetti, Carol F. Bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring systems. Gaithersburg, Md: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.

Vezzetti, Carol F. Bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring systems. Gaithersburg, Md: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.

Seaward, P. Gareth R. Integrated maternal serum screening and nuchal skin fold thickness measurements in the second trimester prenatal diagnosis of fetal down syndrome. Ottawa: National Library of Canada, 2003.

Peters, Norman E. Hydrologic data from the Integrated-Lake Watershed Acidification Study in the west-central Adirondack Mountains, New York, October 1977 through January 1982. Denver, Colo: U.S. Dept. of the Interior, U.S. Geological Survey, 1987.

Peters, Norman E. Hydrologic data from the Integrated-Lake Watershed Acidification Study in the west-central Adirondack Mountains, New York, October 1977 through January 1982. Denver, Colo: U.S. Dept. of the Interior, U.S. Geological Survey, 1987.

S, Murdoch Peter, Dalton Frank N, University of Virginia i Geological Survey (U.S.), red. Hydrologic data from the Integrated-Lake Watershed Acidification Study in the west-central Adirondack Mountains, New York, October 1977 through January 1982. Denver, Colo: U.S. Dept. of the Interior, U.S. Geological Survey, 1987.

Rincón-Mora, Gabriel A. Voltage references: From diodes to precision high-order bandgap circuits. Piscataway, NJ: IEEE Press, 2002.

United States. National Aeronautics and Space Administration, red. Final report entitled Comparison of long-wave and shortwave irradiances at satellite altitude with integrated scanner measurements using the nimbus 7 ERB data set. [Washington, D.C: National Aeronautics and Space Administration, 1986.

House, Frederick Bishop. Final report entitled Comparison of long-wave and shortwave irradiances at satellite altitude with integrated scanner measurements using the nimbus 7 ERB data set. [Washington, D.C: National Aeronautics and Space Administration, 1986.

S, Heyman Joseph, i Electronics Reliability and Measurement Technology Workshop (1986 : NASA Langley Research Center), red. Electronics reliability and measurement technology: Nondestructive evaluation. Park Ridge, N.J., U.S.A: Noyes Data Corp., 1988.

Kourtev, Ivan S. Timing Optimization Through Clock Skew Scheduling. Boston, MA: Springer US, 2000.

Dartman, Torbjo rn. Procams integrated ego-meter system: The computer system : computerised garment distribution system for taking individual measurements of customers in shops connected on-line to garment manufacturing factories. [Go teborg?]: Chalmers Teknicka Ho gakda, 1987.

IEEE International Conference on Microelectronic Test Structures (1997 Monterey, Calif.). 1997 IEEE International Conference on Microelectronic Test Structures proceedings: March 17-20, 1997, Monterey, California. Piscataway, NJ: IEEE Service Center, 1997.

Piziali, Andrew. Functional verification coverage measurement and analysis. Boston: Kluwer Academic Publishers, 2004.

Piziali, Andrew. Functional verification coverage measurement and analysis. Boston: Kluwer Academic Publishers, 2004.