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Artykuły w czasopismach na temat "Integrated circuits"
Wu, Jian, Yi-an Liu i Tingting Luo. "Research on Talents Training Mode for integrated circuit major under the Background of the Science-education and Industry-education Integration". SHS Web of Conferences 171 (2023): 03028. http://dx.doi.org/10.1051/shsconf/202317103028.
Pełny tekst źródłaShepherd, Paul, Dillon Kaiser, Michael Glover, Sonia Perez, A. Matt Francis i H. Alan Mantooth. "Integrated Protection Circuits for an NMOS Silicon Carbide Gate Driver Integrated Circuit". Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) 2014, HITEC (1.01.2014): 000218–23. http://dx.doi.org/10.4071/hitec-wp14.
Pełny tekst źródłaJackson, Keit, i JeffreyA Niehaus. "4752729 Test circuit for VSLI integrated circuits". Microelectronics Reliability 29, nr 2 (styczeń 1989): 291. http://dx.doi.org/10.1016/0026-2714(89)90600-8.
Pełny tekst źródłaLi, Zihan. "Application of Integrated Circuits in Cardiac Pacemakers". Highlights in Science, Engineering and Technology 62 (27.07.2023): 84–89. http://dx.doi.org/10.54097/hset.v62i.10428.
Pełny tekst źródłaM., Kalmuratov, i Dauletmuratova R. "INTEGRATED CIRCUITS AND THEIR APPLICATIONS IN ELECTRONICS". American Journal of Applied Science and Technology 4, nr 4 (1.04.2024): 24–27. http://dx.doi.org/10.37547/ajast/volume04issue04-05.
Pełny tekst źródłaMoldovan, Emilia, Nazih Khaddaj Mallat i Serioja Ovidiu Tatu. "MHMIC Six-port Interferometer for W-band Transceivers: Design and Characterization". International Journal of Electrical and Computer Engineering (IJECE) 9, nr 4 (1.08.2019): 2703. http://dx.doi.org/10.11591/ijece.v9i4.pp2703-2714.
Pełny tekst źródłaGuang, Yang, Bin Yu i Huang Hai. "Design of a High Performance CMOS Bandgap Voltage Reference". Advanced Materials Research 981 (lipiec 2014): 90–93. http://dx.doi.org/10.4028/www.scientific.net/amr.981.90.
Pełny tekst źródłaLim, Taek-Kyu, Kunal Sandip Garud, Jae-Hyeong Seo, Moo-Yeon Lee i Dong-Yeon Lee. "Experimental Study on Heating Performances of Integrated Battery and HVAC System with Serial and Parallel Circuits for Electric Vehicle". Symmetry 13, nr 1 (7.01.2021): 93. http://dx.doi.org/10.3390/sym13010093.
Pełny tekst źródłaLim, Taek-Kyu, Kunal Sandip Garud, Jae-Hyeong Seo, Moo-Yeon Lee i Dong-Yeon Lee. "Experimental Study on Heating Performances of Integrated Battery and HVAC System with Serial and Parallel Circuits for Electric Vehicle". Symmetry 13, nr 1 (7.01.2021): 93. http://dx.doi.org/10.3390/sym13010093.
Pełny tekst źródłaKoo, Jae-Mo, Sungjun Im, Linan Jiang i Kenneth E. Goodson. "Integrated Microchannel Cooling for Three-Dimensional Electronic Circuit Architectures". Journal of Heat Transfer 127, nr 1 (1.01.2005): 49–58. http://dx.doi.org/10.1115/1.1839582.
Pełny tekst źródłaRozprawy doktorskie na temat "Integrated circuits"
Загулов, Станіслав Русланович. "Flexible integrated circuits". Thesis, Київський національний університет технологій та дизайну, 2020. https://er.knutd.edu.ua/handle/123456789/15297.
Pełny tekst źródłaPettazzi, Federico. "Integrated soliton circuits". Besançon, 2008. http://www.theses.fr/2008BESA2001.
Pełny tekst źródłaIn the present thesis the development of three dimensional integrated optical circuits exploiting the technique of photorefractive bright spatial solitons is addressed. The considered host material is Lithium Niobate (LiNbO3) that benefits from a well developed technological standard and possesses a large photorefractive response. Ln the first part, main problems related to optical interconnections are identified, and a solution based on photorefractive bright spatial solitons is proposed. Ln a second Chapter, after a brief review of the material properties, the formation of photorefractive bright solitons is demonstrated both tlleoretically and experimentally. Subsequently, the occurrence of photorefractive self-focusing via second hannonic generation is investigated in conditions near and far from perfect phase matching. Experimetal and numerical analysis shows that, in the case near phase matching, a complexe interaction between nonlinear quadratic process and photorefractivity causes multimode propagation inside self induced waveguide. Proper initial conditions can however lead to stable singlemode operation with high second harmonic conversion efficiency. For strongly mismatched condition we demonstrate that self-focusing effect can occur in the near infrared spectrum due to the weak second harmonic generated signal. Finally, the potentiality of erbium doped LiNbO3 has been tested by performing material characterization and self-focusing experiments. Results show that erbium doped crystals are suitable for formation of self-induced waveguides. Realisation of optical ciruits performing optical amplification and lasing in self-induced waveguides can be envisioned
Gustard, N. C. "Optimizes switched-capacitor filter circuits for integrated circuit realization". Thesis, University of Essex, 1995. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.294667.
Pełny tekst źródłaKapur, Kishen Narain. "Mechanical and electrical characterization of IC leads during fatigue cycling". Diss., Online access via UMI:, 2009.
Znajdź pełny tekst źródłaIncludes bibliographical references.
Lee, Kyung Tek. "Crosstalk fault test generation and hierarchical timing verification in VLSI digital circuits /". Digital version accessible at:, 1999. http://wwwlib.umi.com/cr/utexas/main.
Pełny tekst źródłaFayed, Ayman Adel. "Adaptive techniques for analog and mixed signal integrated circuits". Connect to this title online, 2004. http://rave.ohiolink.edu/etdc/view?acc%5Fnum=osu1097519730.
Pełny tekst źródłaTitle from first page of PDF file. Document formatted into pages; contains xix, 232 p.; also includes graphics (some col.). Includes bibliographical references (p. 222-230).
Bakir, Muhannad S. "Sea of Leads electrical-optical polymer pillar chip I/O interconnections for gigascale integration". Diss., Available online, Georgia Institute of Technology, 2004:, 2003. http://etd.gatech.edu/theses/available/etd-04082004-180010/unrestricted/bakir%5Fmuhannad%5Fs%5F200312%5Fphd.pdf.
Pełny tekst źródłaQazi, Masood. "Circuit design for embedded memory in low-power integrated circuits". Thesis, Massachusetts Institute of Technology, 2012. http://hdl.handle.net/1721.1/75645.
Pełny tekst źródłaCataloged from PDF version of thesis.
Includes bibliographical references (p. 141-152).
This thesis explores the challenges for integrating embedded static random access memory (SRAM) and non-volatile memory-based on ferroelectric capacitor technology-into lowpower integrated circuits. First considered is the impact of process variation in deep-submicron technologies on SRAM, which must exhibit higher density and performance at increased levels of integration with every new semiconductor generation. Techniques to speed up the statistical analysis of physical memory designs by a factor of 100 to 10,000 relative to the conventional Monte Carlo Method are developed. The proposed methods build upon the Importance Sampling simulation algorithm and efficiently explore the sample space of transistor parameter fluctuation. Process variation in SRAM at low-voltage is further investigated experimentally with a 512kb 8T SRAM test chip in 45nm SOI CMOS technology. For active operation, an AC coupled sense amplifier and regenerative global bitline scheme are designed to operate at the limit of on current and off current separation on a single-ended SRAM bitline. The SRAM operates from 1.2 V down to 0.57 V with access times from 400ps to 3.4ns. For standby power, a data retention voltage sensor predicts the mismatch-limited minimum supply voltage without corrupting the contents of the memory. The leakage power of SRAM forces the chip designer to seek non-volatile memory in applications such as portable electronics that retain significant quantities of data over long durations. In this scenario, the energy cost of accessing data must be minimized. This thesis presents a ferroelectric random access memory (FRAM) prototype that addresses the challenges of sensing diminishingly small charge under conditions favorable to low access energy with a time-to-digital sensing scheme. The 1 Mb IT1C FRAM fabricated in 130 nm CMOS operates from 1.5 V to 1.0 V with corresponding access energy from 19.2 pJ to 9.8 pJ per bit. Finally, the computational state of sequential elements interspersed in CMOS logic, also restricts the ability to power gate. To enable simple and fast turn-on, ferroelectric capacitors are integrated into the design of a standard cell register, whose non-volatile operation is made compatible with the digital design flow. A test-case circuit containing ferroelectric registers exhibits non-volatile operation and consumes less than 1.3 pJ per bit of state information and less than 10 clock cycles to save or restore with no minimum standby power requirement in-between active periods.
by Masood Qazi.
Ph.D.
Paroski, Andrew John. "Deform a new approach for redistributing placements /". Diss., Online access via UMI:, 2006.
Znajdź pełny tekst źródłaAgnihotri, Ameya Ramesh. "Combinatorial optimization techniques for VLSI placement". Diss., Online access via UMI:, 2007.
Znajdź pełny tekst źródłaKsiążki na temat "Integrated circuits"
Components, Philips. Integrated circuits. London: Philips Components Ltd, 1990.
Znajdź pełny tekst źródłaComponents, Philips. Integrated circuits. London: Philips Components Ltd, 1991.
Znajdź pełny tekst źródłaComponents, Philips. Integrated circuits. London: Philips Components Ltd, 1990.
Znajdź pełny tekst źródłaComponents, Philips. Integrated circuits. London: Philips Components Ltd, 1990.
Znajdź pełny tekst źródłaSemiconductors, Philips. Integrated circuits. Eindhoven: Philips Semiconductors, 1991.
Znajdź pełny tekst źródłaSemiconductors, Philips. Integrated circuits. Eindhoven: Philips Semiconductors, 1991.
Znajdź pełny tekst źródłaComponents, Philips. Integrated circuits. London: Philips Components Ltd, 1990.
Znajdź pełny tekst źródłaSemiconductors, Philips. Integrated circuits. Eindhoven: Philips Semiconductors, 1992.
Znajdź pełny tekst źródłaComponents, Philips. Integrated circuits. London: Philips Components Ltd, 1991.
Znajdź pełny tekst źródłaComponents, Philips. Integrated circuits. London: Philips Components Ltd, 1990.
Znajdź pełny tekst źródłaCzęści książek na temat "Integrated circuits"
Sangwine, S. J. "Integrated circuits". W Electronic Components and Technology, 27–48. Boston, MA: Springer US, 1994. http://dx.doi.org/10.1007/978-1-4899-6934-7_3.
Pełny tekst źródłaSparkes, J. J. "Integrated circuits". W Semiconductor Devices, 173–88. Boston, MA: Springer US, 1994. http://dx.doi.org/10.1007/978-1-4899-7128-9_5.
Pełny tekst źródłaWarnes, Lionel. "Integrated circuits". W Electronic and Electrical Engineering, 190–96. London: Macmillan Education UK, 1998. http://dx.doi.org/10.1007/978-1-349-15052-6_10.
Pełny tekst źródłaCraig, Edwin C. "Integrated Circuits". W Electronics via Waveform Analysis, 237–78. New York, NY: Springer New York, 1993. http://dx.doi.org/10.1007/978-1-4612-4338-0_12.
Pełny tekst źródłaWarnes, Lionel. "Integrated circuits". W Electronic and Electrical Engineering, 193–200. London: Macmillan Education UK, 2003. http://dx.doi.org/10.1007/978-0-230-21633-4_10.
Pełny tekst źródłaGinsberg, Gerald L. "Integrated Circuits". W Electronic Equipment Packaging Technology, 29–43. Boston, MA: Springer US, 1992. http://dx.doi.org/10.1007/978-1-4615-3542-3_2.
Pełny tekst źródłaBorel, J. "Integrated Circuits". W Silicon, 363–74. Berlin, Heidelberg: Springer Berlin Heidelberg, 2004. http://dx.doi.org/10.1007/978-3-662-09897-4_17.
Pełny tekst źródłaBarnes, John R. "Integrated Circuits". W Robust Electronic Design Reference Book, 424–513. New York, NY: Springer US, 2004. http://dx.doi.org/10.1007/1-4020-7830-7_20.
Pełny tekst źródłaSnepscheut, Jan L. A. "Integrated Circuits". W What Computing Is All About, 75–99. New York, NY: Springer New York, 1993. http://dx.doi.org/10.1007/978-1-4612-2710-6_5.
Pełny tekst źródłaWinnacker, Albrecht. "Integrated Circuits". W The Physics Behind Semiconductor Technology, 221–37. Cham: Springer International Publishing, 2022. http://dx.doi.org/10.1007/978-3-031-10314-8_14.
Pełny tekst źródłaStreszczenia konferencji na temat "Integrated circuits"
Brown, J. J., J. T. Gardner i S. R. Forrest. "Optically powered monolithically integrated logic circuits". W Integrated Photonics Research. Washington, D.C.: Optica Publishing Group, 1991. http://dx.doi.org/10.1364/ipr.1991.tuc5.
Pełny tekst źródłaChandrasekhar, S., J. C. Campbell, A. G. Dentai, C. H. Joyner, G. J. Qua, A. H. Gnauck i M. D. Feuer. "An Integrated InP/InGaAs Heterojunction Biploar Photoreceiver". W Integrated and Guided Wave Optics. Washington, D.C.: Optica Publishing Group, 1989. http://dx.doi.org/10.1364/igwo.1989.tucc3.
Pełny tekst źródłaRodwell, M. J. W., K. J. Weingarten i D. M. Bloom. "Picosecond Sampling of Integrated Circuits". W Picosecond Electronics and Optoelectronics. Washington, D.C.: Optica Publishing Group, 1987. http://dx.doi.org/10.1364/peo.1987.wa2.
Pełny tekst źródłaGrebel, H., i W. Zhong. "Holographic integrated optical circuits". W OSA Annual Meeting. Washington, D.C.: Optica Publishing Group, 1992. http://dx.doi.org/10.1364/oam.1992.me3.
Pełny tekst źródła"Integrated Circuits". W 2006 International Semiconductor Conference. IEEE, 2006. http://dx.doi.org/10.1109/smicnd.2006.284031.
Pełny tekst źródła"Integrated Circuits". W 2019 International Semiconductor Conference (CAS). IEEE, 2019. http://dx.doi.org/10.1109/smicnd.2019.8923890.
Pełny tekst źródłaБогданов, Даниил Сергеевич, i Светлана Анатольевна Микаева. "INTEGRATED CIRCUITS". W Высокие технологии и инновации в науке: сборник избранных статей Международной научной конференции (Санкт-Петербург, Май 2022). Crossref, 2022. http://dx.doi.org/10.37539/vt197.2022.42.90.008.
Pełny tekst źródła"Integrated Circuits". W 2023 International Semiconductor Conference (CAS). IEEE, 2023. http://dx.doi.org/10.1109/cas59036.2023.10303675.
Pełny tekst źródłaKeyes, Edward, i Jason Abt. "An Advanced Integrated Circuit Analysis System". W ISTFA 2006. ASM International, 2006. http://dx.doi.org/10.31399/asm.cp.istfa2006p0398.
Pełny tekst źródłaValdmanis, J. A. "Progress in electrooptic sampling of highspeed devices and integrated circuits". W OSA Annual Meeting. Washington, D.C.: Optica Publishing Group, 1988. http://dx.doi.org/10.1364/oam.1988.tue2.
Pełny tekst źródłaRaporty organizacyjne na temat "Integrated circuits"
Gunn, Cary. Nanophotonic Integrated Circuits. Fort Belvoir, VA: Defense Technical Information Center, maj 2003. http://dx.doi.org/10.21236/ada423912.
Pełny tekst źródłaRamaswamy, Ramu V. Optoelectronic Integrated Circuits. Fort Belvoir, VA: Defense Technical Information Center, marzec 1998. http://dx.doi.org/10.21236/ada340630.
Pełny tekst źródłaFetterman, Harold. Nonlinear Optoelectronic Integrated Circuits. Fort Belvoir, VA: Defense Technical Information Center, listopad 1998. http://dx.doi.org/10.21236/ada386985.
Pełny tekst źródłaMittra, Raj. Millimeter-Wave Integrated Circuits. Fort Belvoir, VA: Defense Technical Information Center, październik 1985. http://dx.doi.org/10.21236/ada161444.
Pełny tekst źródłaHeimlich, Michael, Karu Esselle i L. Matekovits. 2D Electrically Tuneable EBG Integrated Circuits. Fort Belvoir, VA: Defense Technical Information Center, kwiecień 2014. http://dx.doi.org/10.21236/ada605325.
Pełny tekst źródłaMcColl, Malcolm. Voltage-Tunable Microwave Monolithic Integrated Circuits. Fort Belvoir, VA: Defense Technical Information Center, marzec 1988. http://dx.doi.org/10.21236/ada193003.
Pełny tekst źródłaKurdahi, F. J., i A. C. Parker. Area Estimation of VLSI Integrated Circuits. Fort Belvoir, VA: Defense Technical Information Center, lipiec 1985. http://dx.doi.org/10.21236/ada160335.
Pełny tekst źródłaLynn, D. K., i J. B. McCormick. Progress in radiation immune thermionic integrated circuits. Office of Scientific and Technical Information (OSTI), sierpień 1985. http://dx.doi.org/10.2172/6345437.
Pełny tekst źródłaMartin, Alain J., Mika Nystroem i Catherine G. Wong. Design Tools for Integrated Asynchronous Electronic Circuits. Fort Belvoir, VA: Defense Technical Information Center, czerwiec 2003. http://dx.doi.org/10.21236/ada417138.
Pełny tekst źródłaShakouri, Ali, Bin Liu, Patrick Abraham i John E. Bowers. 3D Photonic Integrated Circuits for WDM Applications. Fort Belvoir, VA: Defense Technical Information Center, styczeń 1998. http://dx.doi.org/10.21236/ada461796.
Pełny tekst źródła