Artykuły w czasopismach na temat „Grazing incidence X-ray diffraction (GIXD)”
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Takagi, Yasuo, i Masao Kimura. "Generalized grazing-incidence-angle X-ray diffraction (G-GIXD) using image plates". Journal of Synchrotron Radiation 5, nr 3 (1.05.1998): 488–90. http://dx.doi.org/10.1107/s090904959800123x.
Pełny tekst źródłaKainz, Manuel Peter, Lukas Legenstein, Valentin Holzer, Sebastian Hofer, Martin Kaltenegger, Roland Resel i Josef Simbrunner. "GIDInd: an automated indexing software for grazing-incidence X-ray diffraction data". Journal of Applied Crystallography 54, nr 4 (30.07.2021): 1256–67. http://dx.doi.org/10.1107/s1600576721006609.
Pełny tekst źródłaBreiby, Dag W., Oliver Bunk, Jens W. Andreasen, Henrik T. Lemke i Martin M. Nielsen. "Simulating X-ray diffraction of textured films". Journal of Applied Crystallography 41, nr 2 (8.03.2008): 262–71. http://dx.doi.org/10.1107/s0021889808001064.
Pełny tekst źródłaKhasanah, Khasanah, Isao Takahashi, Kummetha Raghunatha Reddy i Yukihiro Ozaki. "Crystallization of ultrathin poly(3-hydroxybutyrate) films in blends with small amounts of poly(l-lactic acid): correlation between film thickness and molecular weight of poly(l-lactic acid)". RSC Advances 7, nr 83 (2017): 52651–60. http://dx.doi.org/10.1039/c7ra10996b.
Pełny tekst źródłaHafidi, K., M. Azizan, Y. Ijdiyaou i E. L. Ameziane. "Ètude des interfaces SiO2/TiO2 et TiO2/SiO2 dans la structure SiO2/TiO2/SiO2/c-Si préparée par pulvérisation cathodique radio fréquence". Canadian Journal of Physics 85, nr 7 (1.07.2007): 763–76. http://dx.doi.org/10.1139/p07-053.
Pełny tekst źródłaIshida, Kenji, Akinori Kita, Kouichi Hayashi, Toshihisa Horiuchi, Shoichi Kal i Kazumi Matsushige. "Energy Dispersive Grazing Incidence X-ray Diffraction Study on Organic Thin Films EpitaxiaHy Grown on Crystalline Substrate". Advances in X-ray Analysis 39 (1995): 659–64. http://dx.doi.org/10.1154/s0376030800023090.
Pełny tekst źródłaGobato, Ricardo, Marcia Regina Risso Gobato, Alireza Heidari i Abhijit Mitra. "Unrestricted hartree-fock computational simulation in a protonated rhodochrosite crystal". Physics & Astronomy International Journal 3, nr 6 (6.11.2019): 220–28. http://dx.doi.org/10.15406/paij.2019.03.00187.
Pełny tekst źródłaHolzer, Valentin, Benedikt Schrode, Josef Simbrunner, Sebastian Hofer, Luisa Barba, Roland Resel i Oliver Werzer. "Impact of sample misalignment on grazing incidence x-ray diffraction patterns and the resulting unit cell determination". Review of Scientific Instruments 93, nr 6 (1.06.2022): 063906. http://dx.doi.org/10.1063/5.0088176.
Pełny tekst źródłaYoshida, Masahiro, Yasunori Kutsuma, Daichi Dohjima, Kenji Ohwada, Toshiya Inami, Noboru Ohtani, Tadaaki Kaneko i Jun'ichiro Mizuki. "Development of the Compact Furnace for the In Situ Observation under Ultra-High Temperature by Synchrotron x-Ray Surface Diffraction". Materials Science Forum 858 (maj 2016): 505–8. http://dx.doi.org/10.4028/www.scientific.net/msf.858.505.
Pełny tekst źródłaSilva, Gonçalo M. C., Pedro Morgado, Pedro Lourenço, Michel Goldmann i Eduardo J. M. Filipe. "Spontaneous self-assembly and structure of perfluoroalkylalkane surfactant hemimicelles by molecular dynamics simulations". Proceedings of the National Academy of Sciences 116, nr 30 (5.07.2019): 14868–73. http://dx.doi.org/10.1073/pnas.1906782116.
Pełny tekst źródłaYazdanmehr, Amir, i Hamid Jahed. "On the Surface Residual Stress Measurement in Magnesium Alloys Using X-Ray Diffraction". Materials 13, nr 22 (17.11.2020): 5190. http://dx.doi.org/10.3390/ma13225190.
Pełny tekst źródłaCyboroń, Jolanta. "Residual stress analysis after machining in composite materials based on aluminum alloy with ceramic additive". Mechanik 91, nr 1 (8.01.2018): 28–30. http://dx.doi.org/10.17814/mechanik.2018.1.4.
Pełny tekst źródłaTanigaki, Nobutaka, Chikayo Takechi, Shuichi Nagamatsu, Toshiko Mizokuro i Yuji Yoshida. "Oriented Thin Films of Insoluble Polythiophene Prepared by the Friction Transfer Technique". Polymers 13, nr 15 (21.07.2021): 2393. http://dx.doi.org/10.3390/polym13152393.
Pełny tekst źródłaForan, Garry J., Richard F. Garrett, Ian R. Gentle, Dudley C. Creagh, Jian Bang Peng i Geoffrey T. Barnes. "Focusing monochromator and imaging-plate camera for grazing-incidence diffraction studies of thin films". Journal of Synchrotron Radiation 5, nr 3 (1.05.1998): 500–502. http://dx.doi.org/10.1107/s0909049597017287.
Pełny tekst źródłaSimbrunner, Josef, Clemens Simbrunner, Benedikt Schrode, Christian Röthel, Natalia Bedoya-Martinez, Ingo Salzmann i Roland Resel. "Indexing of grazing-incidence X-ray diffraction patterns: the case of fibre-textured thin films". Acta Crystallographica Section A Foundations and Advances 74, nr 4 (1.07.2018): 373–87. http://dx.doi.org/10.1107/s2053273318006629.
Pełny tekst źródłaTakayama, Toru, i Yoshiro Matsumoto. "Effects of Refraction and Reflection on Analysis of Thin Films by the Grazing-Incidence X-ray Diffraction Method". Advances in X-ray Analysis 33 (1989): 109–20. http://dx.doi.org/10.1154/s0376030800019492.
Pełny tekst źródłaChang, Chenyuan, Zhenbo Wei, Hui Jiang, Hangjian Ni, Wentao Song, Jialian He, Simeng Xiang, Zhanshan Wang, Zhe Zhang i Zhong Zhang. "Effect of Annealing on Stress, Microstructure, and Interfaces of NiV/B4C Multilayers". Coatings 14, nr 4 (20.04.2024): 513. http://dx.doi.org/10.3390/coatings14040513.
Pełny tekst źródłaZhu, X., P. Predecki, M. Eatough i R. Goebner. "Residual Stress Depth Profiling on Ground and on Polished Surfaces of an Al2O3/SiC(w) Composite". Advances in X-ray Analysis 39 (1995): 371–80. http://dx.doi.org/10.1154/s0376030800022783.
Pełny tekst źródłaSuturin, S. M., V. V. Fedorov, A. M. Korovin, G. A. Valkovskiy, S. G. Konnikov, M. Tabuchi i N. S. Sokolov. "A look inside epitaxial cobalt-on-fluorite nanoparticles with three-dimensional reciprocal space mapping using GIXD, RHEED and GISAXS". Journal of Applied Crystallography 46, nr 4 (7.06.2013): 874–81. http://dx.doi.org/10.1107/s0021889813008777.
Pełny tekst źródłaBallard, B. L., P. K. Predecki i D. N. Braski. "Stress-Depth Profiles in Magnetron Sputtered Mo Films Using Grazing Incidence X-Ray Diffraction (GIXD)". Advances in X-ray Analysis 37 (1993): 189–96. http://dx.doi.org/10.1154/s0376030800015688.
Pełny tekst źródłaGidalevitz, D., R. Feidenhans'l i L. Leiserowitz. "Determination of the crystal growth units by grazing incidence X-ray diffraction (GIXD) and AFM". Acta Crystallographica Section A Foundations of Crystallography 52, a1 (8.08.1996): C514. http://dx.doi.org/10.1107/s0108767396079019.
Pełny tekst źródłaPredecki, Paul, X. Zhu i B. Ballard. "Proposed Methods for Depth Profiling of Residual Stresses using Grazing Incidence X-Ray Diffraction (GIXD)". Advances in X-ray Analysis 36 (1992): 237–45. http://dx.doi.org/10.1154/s037603080001884x.
Pełny tekst źródłaCantelli, V., O. Geaymond, O. Ulrich, T. Zhou, N. Blanc i G. Renaud. "TheIn situgrowth of Nanostructures on Surfaces (INS) endstation of the ESRF BM32 beamline: a combined UHV–CVD and MBE reactor forin situX-ray scattering investigations of growing nanoparticles and semiconductor nanowires". Journal of Synchrotron Radiation 22, nr 3 (9.04.2015): 688–700. http://dx.doi.org/10.1107/s1600577515001605.
Pełny tekst źródłaZhu, Xiaojing, i Paul Predecki. "Development of a Numerical Procedure for Determining the Depth Profiles of X-Ray Diffraction Data". Advances in X-ray Analysis 37 (1993): 197–203. http://dx.doi.org/10.1154/s037603080001569x.
Pełny tekst źródłaHafidi, K., M. Azizan, Y. Ijdiyaou i E. L. Ameziane. "Déposition par Pulvé Risation Cathodique Radio Fréquence et Caracté Risation Électronique, Structurale et Optique de Couches Minces du Dioxyde de Titane". Active and Passive Electronic Components 27, nr 3 (2004): 169–81. http://dx.doi.org/10.1080/08827510310001616885.
Pełny tekst źródłaMukhopadhyay, Arun Kumar, Avishek Roy, Gourab Bhattacharjee, Sadhan Chandra Das, Abhijit Majumdar, Harm Wulff i Rainer Hippler. "Surface Stoichiometry and Depth Profile of Tix-CuyNz Thin Films Deposited by Magnetron Sputtering". Materials 14, nr 12 (9.06.2021): 3191. http://dx.doi.org/10.3390/ma14123191.
Pełny tekst źródłaHąc-Wydro, Katarzyna, Michał Flasiński, Marcin Broniatowski, Patrycja Dynarowicz-Łątka i Jarosław Majewski. "Properties of β-sitostanol/DPPC monolayers studied with Grazing Incidence X-ray Diffraction (GIXD) and Brewster Angle Microscopy". Journal of Colloid and Interface Science 364, nr 1 (grudzień 2011): 133–39. http://dx.doi.org/10.1016/j.jcis.2011.08.030.
Pełny tekst źródłaNikolaev, K. V., I. A. Makhotkin, S. N. Yakunin, R. W. E. van de Kruijs, M. A. Chuev i F. Bijkerk. "Specular reflection intensity modulated by grazing-incidence diffraction in a wide angular range". Acta Crystallographica Section A Foundations and Advances 74, nr 5 (1.09.2018): 545–52. http://dx.doi.org/10.1107/s2053273318008963.
Pełny tekst źródłaNakayama, Yasuo, Masaki Iwashita, Mitsuru Kikuchi, Ryohei Tsuruta, Koki Yoshida, Yuki Gunjo, Yusuke Yabara i in. "Electronic and Crystallographic Examinations of the Homoepitaxially Grown Rubrene Single Crystals". Materials 13, nr 8 (23.04.2020): 1978. http://dx.doi.org/10.3390/ma13081978.
Pełny tekst źródłaLandree, E., L. D. Marks i P. Zschack. "Structure of the TiO2(100)-1X3 Surface Determined by Direct Methods". Microscopy and Microanalysis 3, S2 (sierpień 1997): 1045–46. http://dx.doi.org/10.1017/s1431927600012113.
Pełny tekst źródłaCUI, S. F., Z. H. MAI, C. Y. WANG, L. S. WU, J. T. OUYANG i J. H. LI. "X-RAY ANALYSIS OF Si1−xGex/Si SUPERLATTICES". Modern Physics Letters B 05, nr 23 (10.10.1991): 1591–97. http://dx.doi.org/10.1142/s0217984991001891.
Pełny tekst źródłaRavanbakhsh, Arsalan, Fereshteh Rashchi, M. Heydarzadeh Sohi i Rasoul Khayyam Nekouei. "Synthesis of Nanostructured Zinc Oxide Thin Films by Anodic Oxidation Method". Advanced Materials Research 829 (listopad 2013): 347–51. http://dx.doi.org/10.4028/www.scientific.net/amr.829.347.
Pełny tekst źródłaYunin P. A., Nazarov A. A. i Potanina E. A. "Application of the GIXRD Technique to Investigation of Damaged Layers in NaNd(WO_4)-=SUB=-2-=/SUB=- and NaNd(MoO_4)-=SUB=-2-=/SUB=- Ceramics Irradiated with High-Energy Ions". Technical Physics 92, nr 8 (2022): 956. http://dx.doi.org/10.21883/tp.2022.08.54556.69-22.
Pełny tekst źródłaGunjo, Yuki, Hajime Kamebuchi, Ryohei Tsuruta, Masaki Iwashita, Kana Takahashi, Riku Takeuchi, Kaname Kanai i in. "Interface Structures and Electronic States of Epitaxial Tetraazanaphthacene on Single-Crystal Pentacene". Materials 14, nr 5 (26.02.2021): 1088. http://dx.doi.org/10.3390/ma14051088.
Pełny tekst źródłaMagdans, Uta, Hermann Gies, Xavier Torrelles i Jordi Rius. "Investigation of the {104} surface of calcite under dry and humid atmospheric conditions with grazing incidence X-ray diffraction (GIXRD)". European Journal of Mineralogy 18, nr 1 (6.03.2006): 83–92. http://dx.doi.org/10.1127/0935-1221/2006/0018-0083.
Pełny tekst źródłaStabenow, Rainer, i Alfried Haase. "New Tools for Grazing Incidence Diffraction Measurements: Comparison of Different Primary and Secondary Beam Conditioners". Advances in X-ray Analysis 39 (1995): 87–94. http://dx.doi.org/10.1154/s0376030800022485.
Pełny tekst źródłaWang, Po-Wen. "Structural Characterization of Magnetic Recording Media by Using Grazing Incident and Conventional X-Ray Diffraction". Advances in X-ray Analysis 36 (1992): 197–202. http://dx.doi.org/10.1154/s0376030800018796.
Pełny tekst źródłaBallard, B. L., X. Zhu, P. K. Predecki, D. Albin, A. Gabor, J. Turtle i R. Noufi. "Determination of Composition and Phase Depth-Profiles in Multilayer and Gradient Solid Solution Photovoltaic Films Using Grazing Incidence X-ray Diffraction". Advances in X-ray Analysis 38 (1994): 269–76. http://dx.doi.org/10.1154/s0376030800017882.
Pełny tekst źródłaTakayama, Shinji. "Measurement of Internal Stresses Exerted in an Each Layer of Multiple Layer's Film with Temperature Using a Grazing Incidence X-Ray Diffraction". ECS Meeting Abstracts MA2022-01, nr 23 (7.07.2022): 1131. http://dx.doi.org/10.1149/ma2022-01231131mtgabs.
Pełny tekst źródłaAliouat, Mouaad Yassine, Dmitriy Ksenzov, Stephanie Escoubas, Jörg Ackermann, Dominique Thiaudière, Cristian Mocuta, Mohamed Cherif Benoudia, David Duche, Olivier Thomas i Souren Grigorian. "Direct Observations of the Structural Properties of Semiconducting Polymer: Fullerene Blends under Tensile Stretching". Materials 13, nr 14 (10.07.2020): 3092. http://dx.doi.org/10.3390/ma13143092.
Pełny tekst źródłaBallard, B. L., P. K. Predecki, T. R. Watkins, K. J. Kozaczek, D. N. Braski i C. R. Hubbard. "Depth Profiling Biaxial Stresses in Sputter Deposited Molybdenum Films; Use of the Cos2φ Method". Advances in X-ray Analysis 39 (1995): 363–70. http://dx.doi.org/10.1154/s0376030800022771.
Pełny tekst źródłaEatough, Michael O., i Raymond P. Gochner. "The Effects of Using Long Soller Slits as “Parallel Beam Optics” for Gixrd on Diffraction Data". Advances in X-ray Analysis 37 (1993): 167–73. http://dx.doi.org/10.1154/s0376030800015652.
Pełny tekst źródłaAchilli, Elisabetta, Filippo Annoni, Nicola Armani, Maddalena Patrini, Marina Cornelli, Leonardo Celada, Melanie Micali, Antonio Terrasi, Paolo Ghigna i Gianluca Timò. "Capabilities of Grazing Incidence X-ray Diffraction in the Investigation of Amorphous Mixed Oxides with Variable Composition". Materials 15, nr 6 (15.03.2022): 2144. http://dx.doi.org/10.3390/ma15062144.
Pełny tekst źródłaSuturin, S. M., V. V. Fedorov, A. M. Korovin, N. S. Sokolov, A. V. Nashchekin i M. Tabuchi. "Epitaxial Ni nanoparticles on CaF2(001), (110) and (111) surfaces studied by three-dimensional RHEED, GIXD and GISAXS reciprocal-space mapping techniques". Journal of Applied Crystallography 50, nr 3 (16.05.2017): 830–39. http://dx.doi.org/10.1107/s160057671700512x.
Pełny tekst źródłaHuang, Wenjie, Meng Sun, Wen Wen, Junfeng Yang, Zhuoming Xie, Rui Liu, Xianping Wang, Xuebang Wu, Qianfeng Fang i Changsong Liu. "Strain Profile in the Subsurface of He-Ion-Irradiated Tungsten Accessed by S-GIXRD". Crystals 12, nr 5 (12.05.2022): 691. http://dx.doi.org/10.3390/cryst12050691.
Pełny tekst źródłaVeder, Jean-Pierre, Ayman Nafady, Graeme Clarke, Roland De Marco i Alan M. Bond. "A Combined Voltammetric and Synchrotron Radiation-Grazing Incidence X-ray Diffraction Study of the Electrocrystallization of Zinc Tetracyanoquinodimethane". Australian Journal of Chemistry 65, nr 3 (2012): 236. http://dx.doi.org/10.1071/ch11361.
Pełny tekst źródłaWroński, S., K. Wierzbanowski, A. Baczmański, A. Lodini, Ch Braham i W. Seiler. "X-ray grazing incidence technique—corrections in residual stress measurement—a review". Powder Diffraction 24, S1 (czerwiec 2009): S11—S15. http://dx.doi.org/10.1154/1.3139054.
Pełny tekst źródłaGrossner, Ulrike, Marco Servidori, Marc Avice, Ola Nilsen, Helmer Fjellvåg, Roberta Nipoti i Bengt Gunnar Svensson. "X-Ray and AFM Analysis of Al2O3 Deposited by ALCVD on n-Type 4H-SiC". Materials Science Forum 556-557 (wrzesień 2007): 683–86. http://dx.doi.org/10.4028/www.scientific.net/msf.556-557.683.
Pełny tekst źródłaNovák, Patrik, Aleksandr Gokhman, Edmund Dobročka, Jozef Bokor i Stanislav Pecko. "Investigation Of Helium Implanted Fe–Cr Alloys By Means Of X–Ray Diffraction And Positron Annihilation Spectroscopy". Journal of Electrical Engineering 66, nr 6 (1.11.2015): 334–38. http://dx.doi.org/10.2478/jee-2015-0055.
Pełny tekst źródłaYi, Jian, Xiao Dong He, Yue Sun, Zhi Peng Xie, Wei Jiang Xue i Fen Yan Cao. "GIAXD and XPS Characterization of sp3C Doped SiC Superhard Nanocomposite Film". Key Engineering Materials 512-515 (czerwiec 2012): 971–74. http://dx.doi.org/10.4028/www.scientific.net/kem.512-515.971.
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