Gotowe bibliografie tematyczne / F noise spectroscopy

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Gotowa bibliografia na temat „F noise spectroscopy”

Autor: Grafiati

Data publikacji: 6 września 2023

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Artykuły w czasopismach na temat "F noise spectroscopy"

Kale, Uma, and Edward Voigtman. "Gated Integration of Transient Signals in 1/f Noise." Applied Spectroscopy 46, no. 11 (1992): 1636–43. http://dx.doi.org/10.1366/0003702924926916.

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The Mueller optical calculus is used to model common spectrometric experimental schemes. The effects of source and preamplifier noise on the precision of the measurement are investigated, and the effect of gate width variation for gated integration of Gaussian signal peaks in the presence of white or 1/ f type noise is evaluated. The results indicate that, for integration of a transient absorbance signal, the choice of gate width depends upon the type of noise, but not its source. For a transmittance (or emission) type of experiment, both the type and the source of the noise determine the gate width to be used for integration of the signal.

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Lübbe, Jannis, Matthias Temmen, Philipp Rahe, and Michael Reichling. "Noise in NC-AFM measurements with significant tip–sample interaction." Beilstein Journal of Nanotechnology 7 (December 1, 2016): 1885–904. http://dx.doi.org/10.3762/bjnano.7.181.

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The frequency shift noise in non-contact atomic force microscopy (NC-AFM) imaging and spectroscopy consists of thermal noise and detection system noise with an additional contribution from amplitude noise if there are significant tip–sample interactions. The total noise power spectral density D Δ f (f m) is, however, not just the sum of these noise contributions. Instead its magnitude and spectral characteristics are determined by the strongly non-linear tip–sample interaction, by the coupling between the amplitude and tip–sample distance control loops of the NC-AFM system as well as by the characteristics of the phase locked loop (PLL) detector used for frequency demodulation. Here, we measure D Δ f (f m) for various NC-AFM parameter settings representing realistic measurement conditions and compare experimental data to simulations based on a model of the NC-AFM system that includes the tip–sample interaction. The good agreement between predicted and measured noise spectra confirms that the model covers the relevant noise contributions and interactions. Results yield a general understanding of noise generation and propagation in the NC-AFM and provide a quantitative prediction of noise for given experimental parameters. We derive strategies for noise-optimised imaging and spectroscopy and outline a full optimisation procedure for the instrumentation and control loops.

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Achtenberg, Krzysztof, Janusz Mikołajczyk, Zbigniew Bielecki, and Jacek Wojtas. "Cross-correlation method for noise measurements of photodetectors used for laser absorption spectroscopy." Bulletin of the Military University of Technology 69, no. 4 (2020): 73–83. http://dx.doi.org/10.5604/01.3001.0015.3826.

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The paper presents noise measurements of low-resistance photon detectors with a specially developed system. These measurements are significant for many applications. This issue is particularly critical for laser absorption spectroscopy systems to detect trace amounts of gases. In these systems, the detection limit is determined by noise origins, e.g., light source, background, and detector noise and its readout electronics. The use of some specially designed components of the system (low-noise - 3.6 × 10-19 V2/Hz for f >1 kHz) cross-correlation signal processing provides to obtain a measuring floor noise below 10-18 V2/Hz for f > 10 Hz and below 10-19 V2/Hz for f > 1 kHz after ten minutes’ analysis. Measurements of some reference resistors have verified the system’s performance. Finally, the system was also applied to determine the spectral noise density of the II -Type SuperLattice photodetector made of InAs / InAsSb.

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Stadler, Adam, and Andrzej Dziedzic. "Virtual instruments in low-frequency noise spectroscopy experiments." Facta universitatis - series: Electronics and Energetics 28, no. 1 (2015): 17–28. http://dx.doi.org/10.2298/fuee1501017s.

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Low-frequency noise spectroscopy (LFNS) is an experimental technique to study noise spectra, typically below 10 kHz, as a function of temperature. Results of LFNS may be presented as the ?so-called? noise maps, giving a detailed insight into fluctuating phenomena in electronic devices and materials. The authors show the usefulness of virtual instrument concept in developing and controlling the measurement setup for LFNS experiments. An example of a noise map obtained for polymer thick-film resistors (PTFRs), made of commercial compositions, for temperature range 77 K - 300 K has been shown. The experiments proved that 1/f noise caused by resistance fluctuations is the dominant noise component in the studied samples. However, the obtained noise map revealed also thermally activated noise sources. Furthermore, parameters describing noise properties of resistive materials and components have been introduced and calculated using data from LFNS. The results of the work may be useful for comparison of noise properties of different resistive materials, giving also directions for improvement of thick-film technology in order to manufacture reliable, low-noise and stable PTFRs.

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Kawahara, Toshio, Satarou Yamaguchi, Yasuhide Ohno, et al. "Diameter dependence of 1/f noise in carbon nanotube field effect transistors using noise spectroscopy." Applied Surface Science 267 (February 2013): 101–5. http://dx.doi.org/10.1016/j.apsusc.2012.08.003.

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Monnig, Curtis A., and Gary M. Hieftje. "An Investigation of Noise Amplitude Spectra Produced by a Direct-Current Plasma." Applied Spectroscopy 43, no. 5 (1989): 742–46. http://dx.doi.org/10.1366/0003702894202283.

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Noise amplitude spectra for direct-current plasma atomic emission spectrometry (DCP-AES) were acquired. Flicker (1/ f) noise dominates the signal at low frequencies, and white noise prevails at higher frequencies. Broad-band audio-frequency (af) noise was observed in the plasma continuum emission when the nebulizer gas was directed into the discharge. By increasing the electrode-gas flows, it was possible to narrow the frequency range and increase the amplitude of this af noise. The introduction of an easily ionized element into the plasma had little effect on the noise characteristics of the source.

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Stadler, Adam Witold, Zbigniew Zawiślak, Andrzej Dziedzic, and Damian Nowak. "NOISE SPECTROSCOPY OF RESISTIVE COMPONENTS AT ELEVATED TEMPERATURE." Metrology and Measurement Systems 21, no. 1 (2014): 15–26. http://dx.doi.org/10.2478/mms-2014-0002.

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Abstract Studies of electrical properties, including noise properties, of thick-film resistors prepared from various resistive and conductive materials on LTCC substrates have been described. Experiments have been carried out in the temperature range from 300 K up to 650 K using two methods, i.e. measuring (i) spectra of voltage fluctuations observed on the studied samples and (ii) the current noise index by a standard meter, both at constant temperature and during a temperature sweep with a slow rate. The 1/f noise component caused by resistance fluctuations occurred to be dominant in the entire range of temperature. The dependence of the noise intensity on temperature revealed that a temperature change from 300 K to 650 K causes a rise in magnitude of the noise intensity approximately one order of magnitude. Using the experimental data, the parameters describing noise properties of the used materials have been calculated and compared to the properties of other previously studied thick-film materials.

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Lebedev, Alexander A., Vitalii V. Kozlovski, Leonid Fursin, et al. "Impact of Proton Irradiation on Power 4H-SiC MOSFETs." Materials Science Forum 1004 (July 2020): 1074–80. http://dx.doi.org/10.4028/www.scientific.net/msf.1004.1074.

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Impact of 15 MeV proton irradiation on electrical characteristics and low frequency noise has been studied in high-power vertical 4H-SiC MOSFETs of 1.2 kV-class at doses 1012 £ F £ 1014 cm-2. The maximum value of the field-effect mobility µFЕ depends weakly on F up to F = 2×1013 cm-2. At F = 4×1013 cm-2, the character of the µFЕ(Vg) dependence changes radically. The maximum µFЕ decreases approximately threefold. The dose Fcr corresponding to the complete degradation of the device is about 1014 cm-2. It can be estimated as Fcr» he/n0, where he is the electron removal rate and n0 is the initial electron concentration in the drift layer. In the entire frequency range of analysis f, gate voltages, and drain-source biases, the frequency dependence of the current spectral noise density SI(f) follows the law SI ~ 1/f. From the data of noise spectroscopy, the density of traps in the gate oxide Ntv has been estimated. In non-irradiated structures, Ntv » 5.4×1018 cm-3eV-1. At Ф = 6×1013 cm-2, the Ntv value increases to Ntv » 7.2×1019cm-3eV-1. The non-monotonic behavior of the output current Id and the level of low frequency noise on dose F has been demonstrated.

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Holmberg, Måns, and Nikku Madhusudhan. "Exoplanet spectroscopy with JWST NIRISS: diagnostics and case studies." Monthly Notices of the Royal Astronomical Society 524, no. 1 (2023): 377–402. http://dx.doi.org/10.1093/mnras/stad1580.

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ABSTRACT The JWST is ushering in a new era in remote sensing of exoplanetary atmospheres. Atmospheric retrievals of exoplanets can be highly sensitive to high-precision JWST data. It is, therefore, imperative to characterize the instruments and noise sources using early observations to enable robust characterization of exoplanetary atmospheres using JWST-quality spectra. This work is a step in that direction, focusing on the Near Infrared Imager and Slitless Spectrograph (NIRISS) Single Object Slitless Spectroscopy (SOSS) instrument mode, with a wavelength coverage of 0.6–2.8 $\mu$m and R ∼ 700. Using a custom-built pipeline, JExoRES, we investigate key diagnostics of NIRISS SOSS with observations of two giant exoplanets, WASP-39 b and WASP-96 b, as case studies. We conduct a detailed evaluation of the different aspects of the data reduction and analysis, including sources of contamination, 1/f noise, and system properties such as limb darkening. The slitless nature of NIRISS SOSS makes it susceptible to contamination due to background sources. We present a method to model and correct for dispersed field stars that can significantly improve the accuracy of the observed spectra. In doing so, we also report an empirically determined throughput function for the instrument. We find significant correlated noise in the derived spectra, which may be attributed to 1/f noise, and discuss its implications for spectral binning. We quantify the covariance matrix that would enable the consideration of correlated noise in atmospheric retrievals. Finally, we conduct a comparative assessment of NIRISS SOSS spectra of WASP-39 b reported using different pipelines and highlight important lessons for exoplanet spectroscopy with JWST NIRISS.

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Zheng-Chao, Dong. "Spin-Polarized Tunneling Spectroscopy and Shot Noise in Ferromagnet/ f -Wave Superconductor Junctions." Communications in Theoretical Physics 41, no. 5 (2004): 775–80. http://dx.doi.org/10.1088/0253-6102/41/5/775.

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