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Artykuły w czasopismach na temat „Electronic secondary emission”

Autor: Grafiati
Data publikacji: 14 września 2024
Data aktualizacji: 5 lipca 2025

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1

Yater, J. E. "Secondary electron emission and vacuum electronics." Journal of Applied Physics 133, no. 5 (2023): 050901. http://dx.doi.org/10.1063/5.0130972.

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Secondary electron emission serves as the foundation for a broad range of vacuum electronic devices and instrumentation, from particle detectors and multipliers to high-power amplifiers. While secondary yields of at least 3–4 are required in practical applications, the emitter stability can be compromised by surface dynamics during operation. As a result, the range of practical emitter materials is limited. The development of new emitter materials with high yield and robust operation would advance the state-of-the-art and enable new device concepts and applications. In this Perspective article, I first present an analysis of the secondary emission process, with an emphasis on the influence of material properties. From this analysis, ultra-wide bandgap (UWBG) semiconductors and oxides emerge as superior emitter candidates owing to exceptional surface and transport properties that enable a very high yield of low-energy electrons with narrow energy spread. Importantly, exciting advances are being made in the development of promising UWBG semiconductors such as diamond, cubic boron nitride (c-BN), and aluminum nitride (AlN), as well as UWBG oxides with improved conductivity and crystallinity. These advances are enabled by epitaxial growth techniques that provide control over the electronic properties critical to secondary electron emission, while advanced theoretical tools provide guidance to optimize these properties. Presently, H-terminated diamond offers the greatest opportunity because of its thermally stable negative electron affinity (NEA). In fact, an electron amplifier under development exploits the high yield from this NEA surface, while more robust NEA diamond surfaces are demonstrated with potential for high yields in a range of device applications. Although c-BN and AlN are less mature, they provide opportunities to design novel heterostructures that can enhance the yield further.
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2

Neugebauer, R., R. Wuensch, T. Jalowy, et al. "Secondary electron emission near the electronic stopping power maximum." Physical Review B 59, no. 17 (1999): 11113–16. http://dx.doi.org/10.1103/physrevb.59.11113.

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3

Klochkov, V. P., and V. L. Bogdanov. "Secondary emission accompanying excitation of high electronic states (Review)." Journal of Applied Spectroscopy 43, no. 1 (1985): 699–714. http://dx.doi.org/10.1007/bf00660572.

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4

Fitting, H. J., and D. Hecht. "Secondary electron field emission." Physica Status Solidi (a) 108, no. 1 (1988): 265–73. http://dx.doi.org/10.1002/pssa.2211080127.

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5

Howie, A. "Threshold Energy Effects in Secondary Electron Emission." Microscopy and Microanalysis 5, S2 (1999): 662–63. http://dx.doi.org/10.1017/s1431927600016639.

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The work function ϕ, the bandgap Eg, the threshold energy level Et, for the inelastic scattering of excited electrons and the threshold energy transfer Ed for the onset of structural ionisation damage are clearly of major significance in various actively developing forms of hot carrier imaging. Two exciting examples here are the ability to image small and dynamic local changes in work function by PEEM and as well as mapping the variations in electronic structure between p and n-type regions of a semiconductor by SE imaging in the SEM. More recently still there have been indications that the SE signal in the ESEM might be sensitive to local changes in bandgap and suggestions that it might be even possible to image spatial variations in pH. It is increasingly clear that if these attractive opportunities are to be efficiently explored and developed, systematic and preferably quantitative observations are needed. Such work requires specimens whose atomic and electronic structure is either fully known beforehand or can be deduced from other signals available in a situation where the physical processes in the microscope are well understood.
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6

Novikov, Yu A. "Modern Scanning Electron Microscopy. 1. Secondary Electron Emission." Поверхность. Рентгеновские, синхротронные и нейтронные исследования, no. 5 (May 1, 2023): 80–94. http://dx.doi.org/10.31857/s102809602305014x.

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The development of modern technologies, including nanotechnology, is based on application of diagnostic methods of objects used in technologies processes. For this purpose most perspective are methods realized in a scanning electron microscope. Thus one of basic methods is the measurement of linear sizes of relief structures of micrometer and nanometer ranges used in micro- and nanoelectronic. In a basis of a scanning electron microscope job the secondary electronic issue of firm body lays. However, practically all researches were spent on surfaces, which relief was neglected. The review of theoretical and experimental materials to researches of a secondary electron emission is given. Practically all known laws are checked up in experiments and have received the physical explanation. However, the application of a secondary electronic emission in a scanning electron microscopy, used in micro- both nanoelectronic and nanotechnology, requires knowledge of laws, which are shown on relief surfaces. Is demonstrated, what laws can be applied in a scanning electron microscope to measurement of linear sizes of relief structures. Is judged necessity of an influence study of a surface relief on a secondary electron emission.
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7

Vaughan, J. R. M. "A new formula for secondary emission yield." IEEE Transactions on Electron Devices 36, no. 9 (1989): 1963–67. http://dx.doi.org/10.1109/16.34278.

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8

Huang, Ling, and Qian Wang. "Study on Secondary Electron Yield of Dielectric Materials." Journal of Physics: Conference Series 2433, no. 1 (2023): 012002. http://dx.doi.org/10.1088/1742-6596/2433/1/012002.

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Abstract The secondary electron emission coefficient of dielectric materials will have an important impact on the performance of electronic devices and equipment. In order to understand the secondary electron emission coefficient of common dielectric materials, the collection electrode negative bias method is introduced in this study. First, the measurement method of secondary electron emission coefficient of dielectric materials is analyzed, and 20 common dielectric materials are introduced, the secondary electron emission coefficients of 20 kinds of common dielectric materials were measured and analyzed, which laid the foundation for the subsequent application of dielectric materials. The results show that among common dielectric materials, the secondary electron emission coefficients of alumina, silica and muscovite are relatively high, while those of polyimide, polycarbonate and polyester are relatively low; The surface roughness of the material will also have an important impact on the secondary electron emission coefficient. With the gradual increase of the surface roughness of the material, the undulation of the material surface will have a shielding effect and absorption effect on the secondary electrons, which will eventually lead to the gradual reduction of the secondary electron emission coefficient of the material. The research results can provide data support for the establishment of the database of secondary electron emission characteristics of common dielectric materials.
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9

Pintao, Carlos. "Mylar secondary emission-energy distribution and yields." IEEE Transactions on Dielectrics and Electrical Insulation 21, no. 1 (2014): 311–16. http://dx.doi.org/10.1109/tdei.2014.6740754.

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10

Michizono, Shinichiro. "Secondary electron emission from alumina RF windows." IEEE Transactions on Dielectrics and Electrical Insulation 14, no. 3 (2007): 583–92. http://dx.doi.org/10.1109/tdei.2007.369517.

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11

Langbein, W. "Speckle Analysis of Resonant Secondary Emission." physica status solidi (b) 234, no. 1 (2002): 84–95. http://dx.doi.org/10.1002/1521-3951(200211)234:1<84::aid-pssb84>3.0.co;2-y.

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12

Budd, P. A., B. Javidi, and J. W. Robinson. "Secondary Electron Emission from a Charged Dielectric." IEEE Transactions on Electrical Insulation EI-20, no. 3 (1985): 485–91. http://dx.doi.org/10.1109/tei.1985.348771.

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13

KITANO, Naomu, Namio MATUDA, Takeshi AZAMI, and Hironori MATUURA. "Secondary Electron Emission from Copper Surface." SHINKU 41, no. 3 (1998): 239–41. http://dx.doi.org/10.3131/jvsj.41.239.

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14

Goncharov, I. N., E. N. Kozyrev, and I. V. Tvauri. "Modeling of Electronic Amplification Processes in Channels of Multipliers on Porous Structures of Aluminum Oxide." Proceedings of Universities. Electronics 25, no. 5 (2020): 402–9. http://dx.doi.org/10.24151/1561-5405-2020-25-5-402-409.

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The secondary-emission multiplier of spatial-distributed flows of electrons – microchannel membrane – determines along with the photocathode, luminescent screen, electron-optical system determines the amplifying characteristics of the electron-optical transformers, photoelectronic multipliers. This, in its turn, determines the application areas and the operating range of the items. The actual task is an improvement of the microchannel membrane parameters and the search for new approaches to manufacture on alternative materials of the secondary-emission multipliers. In the paper the use of self-organizing high-ordered porous anode structures of aluminum oxide as the secondary-electronic emitters have been considered. The theoretical and practical approaches to development and the implementation of the computer models of processes of multiplying electrons in the channel of the based on aluminum oxide, have been offered. Based on the results of the calculations, performed using this model, the amplifying ability of such channels has been determined, their optimal caliber is 25, and the supply voltage is 300 V. A comparative analysis of these characteristics of secondary electron multipliers with corresponding parameters of microchannel plates based on lead silicate glass has been performed. It has been determined that that porous anodized alumina may be suitable for the manufacture of secondary electron multipliers. Its secondary emission ability is comparable to lead silicate glass.
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15

Chiarello, G., R. G. Agostino, A. Amoddeo, L. S. Caputi, and E. Colavita. "Unoccupied electronic states of CuO and Cu2O studied by secondary electron emission." Journal of Electron Spectroscopy and Related Phenomena 70, no. 1 (1994): 45–50. http://dx.doi.org/10.1016/0368-2048(94)02206-f.

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16

Thr�nhardt, A., S. Kuckenburg, A. Knorr, and S. W. Koch. "Coherent and Incoherent Contributions to Secondary Emission." physica status solidi (b) 221, no. 1 (2000): 227–30. http://dx.doi.org/10.1002/1521-3951(200009)221:1<227::aid-pssb227>3.0.co;2-u.

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17

Chenakin, S. P., V. T. Cherepin, A. L. Pivovarov, and M. A. Vasilev. "Secondary Ion Emission from Amorphous Metallic Alloys." physica status solidi (a) 96, no. 1 (1986): K21—K26. http://dx.doi.org/10.1002/pssa.2210960149.

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18

Mashchenko, V. E., V. F. Kharsik, and S. V. Brezhneva. "Secondary emission of excitons in CuCl polycrystals." physica status solidi (b) 135, no. 1 (1986): 201–6. http://dx.doi.org/10.1002/pssb.2221350120.

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19

González-Berríos, Adolfo, Vladimir I. Makarov, Yamila Goenaga-Vázquez, Gerardo Morell, and Brad R. Weiner. "Secondary electron emission from nanocomposite carbon films." Journal of Materials Science: Materials in Electronics 20, no. 10 (2008): 996–1000. http://dx.doi.org/10.1007/s10854-008-9822-y.

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20

Huerta, C. E., M. I. Patino, and R. E. Wirz. "Secondary electron emission from textured surfaces." Journal of Physics D: Applied Physics 51, no. 14 (2018): 145202. http://dx.doi.org/10.1088/1361-6463/aab1ac.

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21

Dvorkin, V. V., N. N. Dzbanovsky, N. V. Suetin, et al. "Secondary electron emission from CVD diamond films." Diamond and Related Materials 12, no. 12 (2003): 2208–18. http://dx.doi.org/10.1016/s0925-9635(03)00320-0.

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22

Gross, B., H. Seggern, and A. Berraissoul. "Surface Chargine of Dielectrics by Secondary Emission and the Determination of Emission Yield." IEEE Transactions on Electrical Insulation EI-22, no. 1 (1987): 23–28. http://dx.doi.org/10.1109/tei.1987.298959.

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23

Feller, W. B. "The dynodized microchannel plate model and secondary electron emission." IEEE Transactions on Electron Devices 32, no. 11 (1985): 2479–81. http://dx.doi.org/10.1109/t-ed.1985.22297.

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24

Heimann, P. A., and J. Blakeslee. "Secondary Electron Emission during Ion Implantation." Journal of The Electrochemical Society 133, no. 4 (1986): 779–80. http://dx.doi.org/10.1149/1.2108675.

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25

NOVÁK, S., R. HRACH, and B. CALUSINSKT. "Study of secondary electron emission from plasma polymerized materials†." International Journal of Electronics 78, no. 1 (1995): 139–42. http://dx.doi.org/10.1080/00207219508926147.

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26

Sekioka, T., M. Terasawa, T. Mitamura, M. P. Stöckli, U. Lehnert, and C. Fehrenbach. "Electronic excitation effects on secondary ion emission in highly charged ion–solid interaction." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 182, no. 1-4 (2001): 121–26. http://dx.doi.org/10.1016/s0168-583x(01)00664-4.

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27

Schwanz, Daphne, Math Bollen, Oscar Lennerhag, and Anders Larsson. "Harmonic Transfers for Quantifying Propagation of Harmonics in Wind Power Plants." Energies 14, no. 18 (2021): 5798. http://dx.doi.org/10.3390/en14185798.

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In this paper, primary and secondary emissions in wind power plants are studied by using transfer admittance and current transfer functions between turbines and the public grid. The use of such transfer functions allows harmonic propagation studies without knowledge of the emission from individual turbines or the background voltage distortion. The transfer functions are calculated for one synthetic and one existing wind power plant, and results are discussed. Primary emission, secondary emission from other turbines and secondary emission from the public grid are shown to be of the same order of magnitude. Furthermore, the paper addresses the impact of turbine converter modelling, public grid impedance and the change in the aggregation exponent with frequency on the propagation. All three are shown to have a significant impact and should be considered. The main challenge for future studies is in obtaining relevant models for turbine impedance versus frequency.
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28

Choi, Chul Hwan, Seon Hyo Kim, Hyo Jin Lee, Yoon Hee Jeong, and Myung Hwa Jung. "Structural, optical, and electronic properties of room temperature ferromagnetic GaCuN film grown by hybrid physical-chemical vapor deposition." Journal of Materials Research 24, no. 5 (2009): 1716–21. http://dx.doi.org/10.1557/jmr.2009.0204.

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Ferromagnetic Cu-doped GaN film was grown on a GaN-buffered sapphire (0001) substrate by a hybrid physical-chemical-vapor-deposition method (HPCVD). The GaCuN film (Cu: 3.6 at.%) has a highly c-axis-oriented hexagonal wurtzite crystal structure, which is similar to GaN buffer but without any secondary phases such as metallic Cu, CuxNy, and CuxGay compounds. Two weak near-band edge (NBE) emissions at 3.38 eV and donor-acceptor-pair (DAP) transition at 3.2 eV with a typical strong broad yellow emission were observed in photoluminescence spectra for GaN buffer. In contrast, the yellow emission was completely quenched in GaCuN film because Ga vacancies causing the observed yellow emission in undoped GaN were substituted by Cu atoms. In addition, GaCuN film exhibits a blue shift of NBE emission, which could be explained with the +2 oxidation state of Cu ions, replacing +3 Ga ions resulting in band gap increment. The valance sate of Cu in GaCuN film was also confirmed by x-ray photoelectron spectroscopy (XPS) analysis. The GaCuN film shows ferromagnetic ordering and possesses a residual magnetization of 0.12 emu/cm3 and a coercive field of 264 Oe at room temperature. The unpaired spins in Cu2+ ions (d9) are most likely to be responsible for the observed ferromagnetism in GaCuN.
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29

Savona, V., and E. Runge. "Two Decades of Secondary Emission in Quantum Wells." physica status solidi (b) 234, no. 1 (2002): 96–106. http://dx.doi.org/10.1002/1521-3951(200211)234:1<96::aid-pssb96>3.0.co;2-k.

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30

Frentrup, W., M. Griepentrog, and U. Müller-Jahreis. "Negative Secondary Ion Emission Influenced by Alkali Atoms." physica status solidi (a) 91, no. 2 (1985): 447–52. http://dx.doi.org/10.1002/pssa.2210910213.

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31

Kuznetsova, T. I. "Secondary Emission of Photonic Crystals under Intense Optical Pumping." Bulletin of the Lebedev Physics Institute 48, no. 11 (2021): 357–62. http://dx.doi.org/10.3103/s1068335621110063.

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32

Aguilera, L., I. Montero, M. E. Dávila, et al. "CuO nanowires for inhibiting secondary electron emission." Journal of Physics D: Applied Physics 46, no. 16 (2013): 165104. http://dx.doi.org/10.1088/0022-3727/46/16/165104.

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33

Li, Jing, Qiu Ting Yu, Yun Dong Cao, Xiao Ming Liu, and Chong Xu. "A Microscopic Study of Before-Arc Process in Metal Vapor Plasma's Proximal Cathode Region. Part II the Influence of Macroscopic Parameters on the Proximal Cathode Region." Applied Mechanics and Materials 325-326 (June 2013): 1343–46. http://dx.doi.org/10.4028/www.scientific.net/amm.325-326.1343.

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The moment of vacuum breaker contacts opening to arc creating process is an unbalanced gaseous breakdown process. This before-arc process is the foundation of studying arc process. The mechanism of the metal vapor arc is different from other gas medium and contains complex electrode process. The proximal cathode region is the important area for vacuum arc forming and it is affected by many factors. The influences of the different electrode separations, different secondary emission coefficient on electronic density, electronic temperature and electric potential, were analysed in this paper. The simulation results show that the change of electrode separations barely impacts the thickness of sheath and the decrease of electrode separations will lead to the decrease of electronic energy near the cathode sheath. The increase of secondary electron emission will increase charged particles energy, which is the important condition of forming cathode sheath.
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34

Imal, Khasanul, and Zulfikar Zulfikar. "Application of the R Program for CO2 Emission Calculations Based on Secondary Carbon Footprint at MTs Bahrul Ulum." NEWTON: Networking and Information Technology 3, no. 2 (2024): 29–34. http://dx.doi.org/10.32764/newton.v3i2.4926.

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Global warming is partly caused by the increasing amount of greenhouse gas emissions accumulating in the Earth's atmosphere, leading to a rise in surface temperatures over time. Carbon dioxide (CO2) emissions are the main component of greenhouse gases. The largest CO2 emissions from the energy sector come from the use of electricity generated by building activities. This study aims to analyze the CO2 emissions produced from electricity use at MTs Bahrul Ulum. Data collection on electricity usage was conducted by measuring the power consumption of air conditioners, lights, PCs, and laptops used during operational hours, particularly in the MTs Bahrul Ulum school building. CO2 emissions from the electricity consumption of electronic equipment were calculated using emission factors according to the regulations of the Directorate General of Electricity, Ministry of Energy and Mineral Resources (ESDM). The method used is a carbon footprint study. The results show that electricity usage at the location is 6,954.792 kWh/year, and the emissions generated from this electricity usage amount to 8,507.243784 kgCO2/year. This study also developed an application using the R program to facilitate the calculation and analysis of CO2 emissions based on secondary carbon footprints. The application is designed to help users identify and reduce CO2 emissions resulting from daily activities in the school environment.
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35

Michizono, Shinichiro, Yoshio Saito, Takayuki Sato, and Shinichi Kobayashi. "Annealing Effects on Secondary Emission and Charging of Alumina Ceramics." IEEJ Transactions on Fundamentals and Materials 119, no. 5 (1999): 562–67. http://dx.doi.org/10.1541/ieejfms1990.119.5_562.

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36

NISHIWAKI, Michiru, and Shigeki KATO. "Study on Secondary Electron Emission from Carbon Materials." Shinku 48, no. 3 (2005): 118–20. http://dx.doi.org/10.3131/jvsj.48.118.

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37

Wünsch, R., R. Neugebauer, T. Jalowy, D. Hofmann, H. Rothard, and K. O. Groeneveld. "Velocity effect in secondary electron emission below and above the electronic stopping power maximum." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 146, no. 1-4 (1998): 82–87. http://dx.doi.org/10.1016/s0168-583x(98)00487-x.

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38

Goldmann, A., G. Rosina, E. Bertel, and F. P. Netzer. "The electronic structure of Rhodium: Angle-resolved studies of photoelectron and secondary electron emission." Zeitschrift f�r Physik B Condensed Matter 73, no. 4 (1989): 479–87. http://dx.doi.org/10.1007/bf01319376.

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39

Reichert, Gabriel, and Christoph Schmidl. "SWOT Analysis of Non-Technical and Technical Measures towards “(Nearly) Zero-Emission Stove Technologies”." Energies 16, no. 3 (2023): 1388. http://dx.doi.org/10.3390/en16031388.

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Firewood stoves are widespread and popular for renewable heat supply in Europe. Several new technological measures have been developed recently that aim at improving the appliance performance in terms of emissions and efficiency. In order to support the trend towards “(nearly) zero-emissions technologies”, the objective of this study was to provide a profound overview of the most relevant technical primary and secondary measures for emission reduction and to analyze their functionality, the relevant framework conditions for their application and their costs. Since user behavior is essential for emission and efficiency performance, the state of knowledge about user behavior is summarized and the latest measures for its optimization are evaluated as non-technical primary measures. Primary and secondary measures were analyzed separately, but also potentially promising combinations of primary and secondary optimization were evaluated using SWOT analysis. The results showed that complementary application of primary and secondary measures will be necessary in order to achieve “(nearly) zero-emission technologies”. The paper is useful for manufacturers and provides them with guidance and recommendations for future developments. They can specifically select appropriate measures for their products and applications not only based on technical aspects, but also with a strong focus on user behavior and user comfort.
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40

Ghodrat, Maryam, Bijan Samali, Muhammad Rhamdhani, and Geoffrey Brooks. "Thermodynamic-Based Exergy Analysis of Precious Metal Recovery out of Waste Printed Circuit Board through Black Copper Smelting Process." Energies 12, no. 7 (2019): 1313. http://dx.doi.org/10.3390/en12071313.

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Exergy analysis is one of the useful decision-support tools in assessing the environmental impact related to waste emissions from fossil fuel. This paper proposes a thermodynamic-based design to estimate the exergy quantity and losses during the recycling of copper and other valuable metals out of electronic waste (e-waste) through a secondary copper recycling process. The losses related to recycling, as well as the quality losses linked to metal and oxide dust, can be used as an index of the resource loss and the effectiveness of the selected recycling route. Process-based results are presented for the emission exergy of the major equipment used, which are namely a reduction furnace, an oxidation furnace, and fire-refining, electrorefining, and precious metal-refining (PMR) processes for two scenarios (secondary copper recycling with 50% and 30% waste printed circuit boards in the feed). The results of the work reveal that increasing the percentage of waste printed circuit boards (PCBs) in the feed will lead to an increase in the exergy emission of CO2. The variation of the exergy loss for all of the process units involved in the e-waste treatment process illustrated that the oxidation stage is the key contributor to exergy loss, followed by reduction and fire refining. The results also suggest that a fundamental variation of the emission refining through a secondary copper recycling process is necessary for e-waste treatment.
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41

Gorelik, V. S., and E. Yu Nechaeva. "Secondary emission of chiral (mirror symmetric) phases of amino acids." Bulletin of the Lebedev Physics Institute 37, no. 5 (2010): 162–63. http://dx.doi.org/10.3103/s1068335610050106.

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42

Tomashpolsky, Yu Ya, and N. V. Sadovskaya. "Secondary electron emission from oxides: Part III. HT superconductors." Ferroelectrics 163, no. 1 (1995): 129–34. http://dx.doi.org/10.1080/00150199508208271.

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43

Slangen, Tim, Thijs van Wijk, Vladimir Ćuk, and Sjef Cobben. "The Propagation and Interaction of Supraharmonics from Electric Vehicle Chargers in a Low-Voltage Grid." Energies 13, no. 15 (2020): 3865. http://dx.doi.org/10.3390/en13153865.

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The recent increase in large converter-based devices like electric vehicles and photovoltaics increases supraharmonic emissions in low-voltage grids, potentially affecting customer equipment and the grid. This paper aims to give an overview of the different factors influencing supraharmonic emissions from electric vehicles and studies the propagation of supraharmonic currents through a small, low-voltage grid. Measurements in an unique lab representing a possible future household gave valuable insight on the possible developments in primary and secondary supraharmonic emissions in a conventional or power-electronic-dominated system. Emission is, for some vehicles, influenced by the type of grid connection, whereas others show no difference in emission. The supraharmonic currents mainly stay within the local installation due to absorption of nearby devices. The level of voltage distortion is dependent on the connection impedance. During the measurements, another type of interaction between devices is observed in the form of “frequency beating” and intermodulation, in some cases resulting in the tripping of residual current devices. This interaction is further analyzed in order to better understand the possible impact it can have on the grid.
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Alam, M. K., S. P. Eslami, and A. Nojeh. "Secondary electron emission from single-walled carbon nanotubes." Physica E: Low-dimensional Systems and Nanostructures 42, no. 2 (2009): 124–31. http://dx.doi.org/10.1016/j.physe.2009.09.012.

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Boubaya, M., and G. Blaise. "Charging regime of PMMA studied by secondary electron emission." European Physical Journal Applied Physics 37, no. 1 (2006): 79–86. http://dx.doi.org/10.1051/epjap:2006128.

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Boldasov, V. S., A. I. Kuz'michev, D. S. Fillipychev, and A. Yu Shabarov. "Nitrogen gas-discharge electron source with secondary-emission cathode." Radiophysics and Quantum Electronics 37, no. 4 (1994): 319–25. http://dx.doi.org/10.1007/bf01046033.

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Aravosis, G. D. "Twenty-First Century Truck Electronics—Today's Global Challenge." Proceedings of the Institution of Mechanical Engineers, Part D: Journal of Automobile Engineering 203, no. 1 (1989): 1–9. http://dx.doi.org/10.1243/pime_proc_1989_203_141_02.

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The main catalyst for use of state-of-the-art electronics in commercial trucks in the United States is the need to meet EPA emission standards for the 1990s. Important secondary catalysts are fuel economy, anti-lock brake systems and fleet/driver expectations. There are also myriad other forces related to safety, maintainability, servicing and communication which will be satisfied once electronic systems are installed in trucks. The principal economic justification for incurring the cost of electronics at this time is to satisfy these more stringent gaseous emission and particulate regulatory standards. Using electronics, these standards can be met without producing a severe reduction in fuel economy while, as a by-product, interfacing with other truck components, such as brakes, transmissions, safety controls etc. This paper will address the applications of electronics today for diesel engine controls as well as the applications of electronics in areas such as smart power switches, anti-jackknife controls, voice-recognition systems and other future system applications. The exploding use of electronics in trucks will require solutions to many complex problems which are not unique to any one company, geographic area, country or technical society.
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Huang, Tao, Zhong-hai Yang, Yong-bing Jin, Xiao-lin Jin, Quan Hu, and Yu-kun Qin. "The Emission Model of Secondary Electron in Multistage Depressed Collector CAD." Journal of Electronics & Information Technology 30, no. 5 (2011): 1247–50. http://dx.doi.org/10.3724/sp.j.1146.2006.01733.

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Avtomonov, N. I., D. M. Vavriv, and S. V. Sosnytsky. "Theoretical study of cold start of magnetrons with secondary emission cathode." Radioelectronics and Communications Systems 53, no. 1 (2010): 1–6. http://dx.doi.org/10.3103/s0735272710010012.

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Suharyanto, Yasushi Yamano, Shinichi Kobayashi, Shinichiro Michizono, Yoshio Saito, and Tumiran. "Effect of mechanical finishes on secondary electron emission of alumina ceramics." IEEE Transactions on Dielectrics and Electrical Insulation 14, no. 3 (2007): 620–26. http://dx.doi.org/10.1109/tdei.2007.369522.

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