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Artykuły w czasopismach na temat "Electron microscopy Methodology"
Iha, Luiz Cesar Nakao, Andre Aguillera, Flavio Faria, Cristiane Akemi Kasse, Oswaldo Laercio Mendonça Cruz i Edna Frey Muller. "R147: Scanning Electron Microscopy: Alternatives in Methodology". Otolaryngology–Head and Neck Surgery 135, nr 2_suppl (sierpień 2006): P156. http://dx.doi.org/10.1016/j.otohns.2006.06.901.
Pełny tekst źródłaDowning, Kenneth H. "Instrumentation and methodology for electron crystallography". Proceedings, annual meeting, Electron Microscopy Society of America 49 (sierpień 1991): 420–21. http://dx.doi.org/10.1017/s0424820100086404.
Pełny tekst źródłaLiang, Alice F., Chris Petzold, Kristen Dancel-Manning, Yan Deng i Michael Cammer. "Methodology Development at NYULMC Microscopy Core - Correlative Light and Electron Microscopy Applications". Microscopy and Microanalysis 21, S3 (sierpień 2015): 879–80. http://dx.doi.org/10.1017/s143192761500519x.
Pełny tekst źródłaLeppard, GG, A. Heissenberger i GJ Herndl. "Ultrastructure of marine snow. I. Transmission electron microscopy methodology". Marine Ecology Progress Series 135 (1996): 289–98. http://dx.doi.org/10.3354/meps135289.
Pełny tekst źródłaDanev, Radostin, Haruaki Yanagisawa i Masahide Kikkawa. "Cryo-Electron Microscopy Methodology: Current Aspects and Future Directions". Trends in Biochemical Sciences 44, nr 10 (październik 2019): 837–48. http://dx.doi.org/10.1016/j.tibs.2019.04.008.
Pełny tekst źródłaSicignano, A., i M. Vaez Iravani. "Methodology and practice of in situ differential scanning electron microscopy". Scanning 12, nr 2 (1990): 61–68. http://dx.doi.org/10.1002/sca.4950120203.
Pełny tekst źródłaAsher, Lucas, i Jessica Hata. "Platelet Electron Microscopy: Utilizing LEAN Methodology to Optimize Laboratory Workflow". Pediatric and Developmental Pathology 23, nr 5 (19.05.2020): 356–61. http://dx.doi.org/10.1177/1093526620915361.
Pełny tekst źródłaKammers, A. D., i S. Daly. "Digital Image Correlation under Scanning Electron Microscopy: Methodology and Validation". Experimental Mechanics 53, nr 9 (11.07.2013): 1743–61. http://dx.doi.org/10.1007/s11340-013-9782-x.
Pełny tekst źródłaMenteş, T. O., G. Zamborlini, A. Sala i A. Locatelli. "Cathode lens spectromicroscopy: methodology and applications". Beilstein Journal of Nanotechnology 5 (27.10.2014): 1873–86. http://dx.doi.org/10.3762/bjnano.5.198.
Pełny tekst źródłaYang, Jinfeng, i Yoichi Yoshida. "Relativistic Ultrafast Electron Microscopy: Single-Shot Diffraction Imaging with Femtosecond Electron Pulses". Advances in Condensed Matter Physics 2019 (2.05.2019): 1–6. http://dx.doi.org/10.1155/2019/9739241.
Pełny tekst źródłaRozprawy doktorskie na temat "Electron microscopy Methodology"
Distasi, Matthew R. "The 3D characterization of the annulate lamellae : the development of a new methodology incorporating 3D-anaglyph techniques and serial transmission electron microscopy". Virtual Press, 2003. http://liblink.bsu.edu/uhtbin/catkey/1266020.
Pełny tekst źródłaZhou, Dan [Verfasser], Peter A. van [Akademischer Betreuer] Aken i Christoph T. [Akademischer Betreuer] Koch. "Aberration-Corrected Analytical Transmission Electron Microscopy of Light Elements in Complex Oxides: Application and Methodology / Dan Zhou. Betreuer: Peter A. van Aken ; Christoph T. Koch". Darmstadt : Universitäts- und Landesbibliothek Darmstadt, 2016. http://d-nb.info/1112044884/34.
Pełny tekst źródłaJespersson, Niklas, i Torbjörn Sandberg. "Evaluation of different non-metallic inclusions in steel chips by using electrolytic extraction : Evaluation of a methodology for electrolytic extraction and scanning electron microscopy - energy dispersive spectroscopy (SEM-EDS) analysis". Thesis, KTH, Materialvetenskap, 2021. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-298419.
Pełny tekst źródłaKonventionell mikroskopi kan lätt ge felaktig information vid analys av icke- metalliska inneslutningar (NMI), men bättre resultat kan uppnås om metall- matrisen löses upp med elektrolytisk extraktion (EE), så att inneslutningarna frigörs och kan samlas upp på ett filter. Denna metod att studera NMI testades på ett spån av 157C-stål, med trefaldig EE på samma yta och successivt ökande maximal laddning. Sambandet mellan laddning och upplöst lagerdjup undersöktes för att möjliggöra extraktion av NMI från givna djup. Ett urval av de frigjorda inneslutningarna fotograferades i ett SEM och sammansättningarna fastslogs av EDS. Dessa data låg till grund för en undersökning av två klassifikationsmetoder för NMI: manuell klassificering, till största del bildbaserad, och en halvautomatisk klassificering där en algoritm sorterar efter sammansättningar. Denna studie antyder att ett 157C-stål kan lösas upp till önskat djup genom att åläggas en laddning proportionell mot djupet, men den nuvarande metoden introducerar ett fel som kan ha betydande påverkan på noggrannheten. Den aktuella metoden saknar ett systematiskt sätt att välja NMI för mikroskopfotografi, och ingen lösning har kunnat framföras på detta problem. Den halvautomatiska klassifikationsalgoritmen rubbades av störningar i EDS-resultaten och kunde inte undersökas till fullo.
Ihiawakrim, Dris. "Etude par les techniques avancées de microscopie électronique en transmission de matériaux fragiles". Thesis, Strasbourg, 2019. http://www.theses.fr/2019STRAE005/document.
Pełny tekst źródłaThe present manuscript shows the importance of methodological and technical development to identify and to unblock locks preventing the analysis of hybrid and complex materials that undergo degradation under electron beam irradiation. We have shown that beam-induced damage to the sample only appears above some specific threshold of current density. Such a threshold depends on the nature of the material and on its morphological and structural characteristics. These developments in synergy with the use of Cryo-EM, allowed us to expose the architecture of carbon-based hybrid materials, measure the variation of the lamellar distance in a perovskite according to the molecular spacer and to the positioning of the metal, identify the interactions at the interface between two molecular crystals, and the 3D quantification of the functionalization within a MOF. Lastly, we brought to light the processes of nucleation and growth of iron oxide by in-situ liquid phase TEM
Andrikopoulos, Pavlos. "Direct electric field visualization in semiconductor planar structures". Thesis, Monterey, Calif. : Naval Postgraduate School, 2006. http://bosun.nps.edu/uhtbin/hyperion.exe/06Dec%5FAndrikopoulos.pdf.
Pełny tekst źródłaThesis Advisor(s): Nancy M. Haegel, David Jenn. "December 2006." Includes bibliographical references (p. 125). Also available in print.
Avery, Meredith Ryan. "Multivariate Analysis of Volcanic Particle Morphology: Methodology and Application of a Quantitative System of Fragmentation Mechanism Classification". Bowling Green State University / OhioLINK, 2015. http://rave.ohiolink.edu/etdc/view?acc_num=bgsu1428939377.
Pełny tekst źródłaZhou, Dan. "Aberration-Corrected Analytical Transmission Electron Microscopy of Light Elements in Complex Oxides: Application and Methodology". Phd thesis, 2016. https://tuprints.ulb.tu-darmstadt.de/5236/1/Dan%20PhD%20thesis%202016%20January%2013.pdf.
Pełny tekst źródła"Study of Chinese antique objects by surface science techniques =: 中國古物之表面科學技術硏究". 1999. http://library.cuhk.edu.hk/record=b5890150.
Pełny tekst źródłaThesis (M.Phil.)--Chinese University of Hong Kong, 1999.
Includes bibliographical references.
Text in English; abstracts in English and Chinese.
by Yeung Sau Lai Catherine.
Acknowledgments --- p.i
Abstract --- p.ii
Table of Contents --- p.iv
List of Figures --- p.vii
List of Tables --- p.ix
Chapter Chapter1 --- Introduction to the Study of Chinese antique objects using surface science techniques
Chapter 1.1 --- Surface Science --- p.1
Chapter 1.2 --- Surface Science Techniques --- p.1
Chapter 1.3 --- Study of Antiques Objects --- p.2
Chapter 1.4 --- Chinese Antique --- p.4
Chapter 1.5 --- Aims of the current study --- p.4
Chapter 1.6 --- Reference --- p.7
Chapter Chapter 2 --- Silicon on Chinese Bronze Seals
Chapter 2.1 --- Introduction --- p.8
Chapter 2.2 --- Basic Principles of the analytical techniques --- p.9
Chapter 2.2.1 --- Scanning electron microscopy (SEM) --- p.9
Chapter 2.2.2 --- Energy dispersive x-ray analysis (EDX) --- p.9
Chapter 2.2.3 --- X-ray Photoelectron spectroscopy (XPS) --- p.13
Chapter 2.3 --- Sample --- p.16
Chapter 2.4 --- Experimental --- p.18
Chapter 2.4.1 --- Instrument --- p.18
Chapter 2.4.2 --- Sampling --- p.18
Chapter 2.5 --- Results and Discussion --- p.20
Chapter 2.5.1 --- Chemical Composition --- p.20
Chapter 2.5.2 --- Silicon content --- p.21
Chapter 2.5.3 --- Sources of silicon --- p.21
Chapter 2.5.4 --- Implication of high silicon content --- p.25
Chapter 2.6 --- Conclusion --- p.28
Chapter 2.7 --- Related studies --- p.28
Chapter 2.8 --- Reference --- p.29
Chapter Chapter 3 --- Surface analysis of Chinese Jade using Fourier Transform Infrared Spectroscopy with fixed angle reflectance technique
Chapter 3.1 --- Introduction --- p.30
Chapter 3.2 --- principles of FTIR and specular reflectance technique --- p.31
Chapter 3.2.1 --- General principles --- p.31
Chapter 3.2.2 --- IR spectrometer --- p.31
Chapter 3.2.3 --- Specular (External) Reflectance Technique --- p.33
Chapter 3.2.4 --- Kramers-Kronig Transformation --- p.33
Chapter 3.3 --- Sample (Chinese Jade from the Liang-zhu Culture) --- p.36
Chapter 3.3.1 --- Background on use of Jade in China --- p.36
Chapter 3.3.2 --- Nomenclature --- p.39
Chapter 3.3.3 --- Mineralogy of Jade --- p.39
Chapter 3.3.4 --- Liang-zhu Culture --- p.40
Chapter 3.4 --- Experimental --- p.40
Chapter 3.4.1 --- Instrument --- p.40
Chapter 3.4.2 --- Sampling --- p.44
Chapter 3.4.3 --- Data Treatment --- p.44
Chapter 3.5 --- Results and Discussion --- p.44
Chapter 3.5.1 --- Characteristic of Specular reflectance spectrum of Nephrite --- p.44
Chapter 3.5.2 --- Reflectance spectrum of Liangzhu samples --- p.57
Chapter 3.5.2.1 --- Comparison within sample --- p.57
Chapter 3.5.2.2 --- Comparison among sample --- p.57
Chapter 3.5.3 --- "Reflectance spectrum of heirloom pieces from the Art Museum, CUHK" --- p.58
Chapter 3.5.4 --- Absorption peaks at 3000-2800cm-1 --- p.58
Chapter 3.6 --- Conclusion --- p.58
Chapter 3.7 --- Related studies --- p.61
Chapter 3.8 --- Reference --- p.61
Chapter Chapter 4 --- SIMS and TIMS Analysis on Lead Isotopes Ratio in Ancient Chinese Metallic Artifacts
Chapter 4.1 --- Introduction --- p.63
Chapter 4.2 --- Background --- p.64
Chapter 4.2.1 --- Lead isotope --- p.64
Chapter 4.2.2 --- Aims of this study --- p.66
Chapter 4.3 --- Basic principle of TIMS and SIMS --- p.67
Chapter 4.4 --- Experimental --- p.68
Chapter 4.4.1 --- Sample --- p.68
Chapter 4.4.2 --- Instrument --- p.68
Chapter 4.4.2.1 --- Thermal Ionisation mass spectrometry --- p.68
Chapter 4.4.2.2 --- Secondary ion mass spectroscopy --- p.70
Chapter 4.5 --- Results and Discussion --- p.72
Chapter 4.5.1 --- Data Interpretation --- p.72
Chapter 4.5.2 --- Standard deviation of SIMS data --- p.74
Chapter 4.5.3 --- Possible use of SIMS data --- p.74
Chapter 4.6 --- Conclusion --- p.76
Chapter 4.7 --- References --- p.76
Chapter Chapter 5 --- Analysis by Particle Induced X-ray emission technique
Chapter 5.1 --- Introduction --- p.79
Chapter 5.2 --- Basic principle --- p.80
Chapter 5.2.1 --- General principle --- p.80
Chapter 5.2.2 --- Fundamental Set up --- p.80
Chapter 5.2.3 --- Data analysis --- p.82
Chapter 5.3 --- Experimental --- p.82
Chapter 5.3.1 --- PIXE --- p.82
Chapter 5.3.2 --- Sample --- p.82
Chapter 5.4 --- Result --- p.85
Chapter 5.5 --- Further studies --- p.85
Chapter 5.6 --- Reference --- p.85
Chapter Chapter 6 --- Conclusion
Chapter 6.1 --- Conclusion --- p.88
Chapter 6.2 --- Further studies --- p.89
Książki na temat "Electron microscopy Methodology"
Schatten, Heide. Scanning electron microscopy for the life sciences. Cambridge: Cambridge University Press, 2012.
Znajdź pełny tekst źródłaAyache, Jeanne. Sample preparation handbook for transmission electron microscopy: Methodology. New York: Springer, 2010.
Znajdź pełny tekst źródłaHayat, M. A. Negative staining. New York: McGraw-Hill Pub. Co., 1990.
Znajdź pełny tekst źródłaAyache, Jeanne, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret i Danièle Laub. Sample Preparation Handbook for Transmission Electron Microscopy: Methodology. Springer, 2014.
Znajdź pełny tekst źródłaAyache, Jeanne, Luc Beaunier i Jacqueline Boumendil. Sample Preparation Handbook for Transmission Electron Microscopy: Methodology. Springer, 2011.
Znajdź pełny tekst źródła(Editor), Prajna Das Gupta, i Hiroshi Yamamoto (Editor), red. Electron Microscopy in Medicine and Biology. Science Publishers, 2000.
Znajdź pełny tekst źródłaJ, Sommerville, i Scheer U, red. Electron microscopy in molecular biology: A practical approach. Oxford, England: IRL Press, 1987.
Znajdź pełny tekst źródła(Editor), J. Sommerville, i U. Scheer (Editor), red. Electron Microscopy in Molecular Biology: A Practical Approach. Oxford University Press, USA, 1986.
Znajdź pełny tekst źródłaHandbook of cryo-preparation methods for electron microscopy. Boca Raton: CRC Press, 2008.
Znajdź pełny tekst źródła(Editor), Annie Cavalier, Daniele Spehner (Editor) i Bruno M. Humbel (Editor), red. Handbook of Cryopreparation Methods for Electron Microscopy (Methods in Visualization). CRC, 2008.
Znajdź pełny tekst źródłaCzęści książek na temat "Electron microscopy Methodology"
Ayache, Jeanne, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret i Danièle Laub. "Methodology: General Introduction". W Sample Preparation Handbook for Transmission Electron Microscopy, 1–2. New York, NY: Springer New York, 2010. http://dx.doi.org/10.1007/978-0-387-98182-6_1.
Pełny tekst źródłaZemlin, F. "Cryoelectron Microscopy of Protein Crystals. Some Remarks on the Methodology". W Electron Crystallography of Organic Molecules, 305–8. Dordrecht: Springer Netherlands, 1991. http://dx.doi.org/10.1007/978-94-011-3278-7_25.
Pełny tekst źródłaAfsari, Bijan, i Gregory S. Chirikjian. "A Methodology for Deblurring and Recovering Conformational States of Biomolecular Complexes from Single Particle Electron Microscopy". W Lecture Notes in Computer Science, 643–53. Cham: Springer International Publishing, 2015. http://dx.doi.org/10.1007/978-3-319-25040-3_69.
Pełny tekst źródłaMorel, Gérard, Annie Cavalier i Lynda Williams. "Principles of Methodology". W in situ Hybridization in Electron Microscopy, 47–64. CRC Press, 2001. http://dx.doi.org/10.1201/9781420042504-2.
Pełny tekst źródłaYONG, S. C. "PREPARATION, PROCESSING, SECTIONING AND STAINING FOR ELECTRON MICROSCOPY". W Research Methodology in Orthopaedics and Reconstructive Surgery, 161–70. WORLD SCIENTIFIC, 2002. http://dx.doi.org/10.1142/9789812778338_0009.
Pełny tekst źródłaMortimer, Catherine, i Martin Stoney. "A Methodology for Punchmark Analysis Using Electron Microscopy". W Archaeological Sciences 1995, 119–22. Oxbow Books, 2017. http://dx.doi.org/10.2307/j.ctvh1dtz1.23.
Pełny tekst źródłaN. Hattori, Azusa, i Ken Hattori. "Creation and Evaluation of Atomically Ordered Side- and Facet-Surface Structures of Three-Dimensional Silicon Nano-Architectures". W 21st Century Surface Science - a Handbook. IntechOpen, 2020. http://dx.doi.org/10.5772/intechopen.92860.
Pełny tekst źródłaAllen, Jessica L., Cari L. Johnson, Matthew J. Heumann, Jared Gooley i William Gallin. "New technology and methodology for assessing sandstone composition: A preliminary case study using a quantitative electron microscope scanner (QEMScan)". W Mineralogical and Geochemical Approaches to Provenance. Geological Society of America, 2012. http://dx.doi.org/10.1130/2012.2487(11).
Pełny tekst źródłaStreszczenia konferencji na temat "Electron microscopy Methodology"
Toh, Suey Li, i Rong Ji. "Maximizing the Electron Microscopy Contrasts for Analysis". W ISTFA 2017. ASM International, 2017. http://dx.doi.org/10.31399/asm.cp.istfa2017p0345.
Pełny tekst źródłaKang, H. C., J. T. Lim, J. S. Choi, T. Y. Lee, B. H. Lee, S. B. Chin i D. H. Cho. "Methodology and mechanism study on high aspect ratio (HAR) contact bottom image in scanning electron microscopy". W Microlithography 2005, redaktor Richard M. Silver. SPIE, 2005. http://dx.doi.org/10.1117/12.596832.
Pełny tekst źródłaCourbon, Franck, Sergei Skorobogatov i Christopher Woods. "Direct Charge Measurement in Floating Gate Transistors of Flash EEPROM Using Scanning Electron Microscopy". W ISTFA 2016. ASM International, 2016. http://dx.doi.org/10.31399/asm.cp.istfa2016p0327.
Pełny tekst źródłaLai, Li-Lung, HungLing Chen i Huimin Gao. "Methodology and Application of Backside Physical Failure Analysis". W ISTFA 2011. ASM International, 2011. http://dx.doi.org/10.31399/asm.cp.istfa2011p0428.
Pełny tekst źródłaYu, Huisheng, Shuqing Duan, Ming Li, Qihua Zhang i Wei-Ting Kary Chien. "Productive Polishing TEM Sample Preparation Methodology Development". W ISTFA 2014. ASM International, 2014. http://dx.doi.org/10.31399/asm.cp.istfa2014p0420.
Pełny tekst źródłaLee, Tan-Chen, Jui-Yen Huang, Li-Chien Chen, Ruey-Lian Hwang i David Su. "Methodology for TEM Analysis of Barrier Profiles". W ISTFA 2002. ASM International, 2002. http://dx.doi.org/10.31399/asm.cp.istfa2002p0689.
Pełny tekst źródłaYounan, Hua, Shen Yue, Chen Yixin, Fu Chao i Li Xiaomin. "Studies on a Qualification Method (OSSD) for Microchip Al Bondpads". W ISTFA 2015. ASM International, 2015. http://dx.doi.org/10.31399/asm.cp.istfa2015p0295.
Pełny tekst źródłaShen, Cha-Ming, Tsan-Chen Chuang, Shi-Chen Lin, Lian-Fon Wen i Chen-May Huang. "Combining the Nano-Probing Technique with Mathematics to Model and Identify Non-Visual Failures". W ISTFA 2007. ASM International, 2007. http://dx.doi.org/10.31399/asm.cp.istfa2007p0214.
Pełny tekst źródłaLiu, Chin Kai, Chi Jen. Chen, Jeh Yan.Chiou i David Su. "A Methodology to Reduce Ion Beam Induced Damage in TEM Specimens Prepared by FIB". W ISTFA 2002. ASM International, 2002. http://dx.doi.org/10.31399/asm.cp.istfa2002p0313.
Pełny tekst źródłaCowan, J., i T. Taylor. "SEM Equipment Capabilities Evaluated for Sub-Half Micron Semiconductor Applications". W ISTFA 1997. ASM International, 1997. http://dx.doi.org/10.31399/asm.cp.istfa1997p0329.
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