Rozprawy doktorskie na temat „Electron microscope”
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Morgan, Scott Warwick. "Gaseous secondary electron detection and cascade amplification in the environmental scanning electron microscope /". Electronic version, 2005. http://adt.lib.uts.edu.au/public/adt-NTSM20060511.115302/index.html.
Pełny tekst źródłaMartin, Geoffrey Clive. "Virtual Scanning Electron Microscope : a web-based teaching and training solution for the Scanning Electron Microscope". Thesis, University of Cambridge, 2008. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.611878.
Pełny tekst źródłaDuckett, Gordon Richard. "Electron microscope studies of organic pigments". Thesis, University of Glasgow, 1987. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.305588.
Pełny tekst źródłaSkoupý, Radim. "Quantitative Imaging in Scanning Electron Microscope". Doctoral thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2020. http://www.nusl.cz/ntk/nusl-432610.
Pełny tekst źródłaLöfgren, André. "Detection of electron vortex beams : Using a scanning transmission electron microscope". Thesis, Uppsala universitet, Materialteori, 2015. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-255330.
Pełny tekst źródłaElektronvirvelstrålar (EVS) är elektronstrålar med en munk-liknande intensitetsprofil. Dessa bär på rörelsemängdsmoment på grund av sin fasdistribution. När de används i ett elektronmikroskop förväntas de vara effektiva för detektering av magnetiska signaler. I denna uppsats har jag undersökt high angle annular dark field (HAADF) bilder som erhållits med hjälp av EVS. Detta gjordes för 300 K och 5K. För 5 K, jämförde jag även HAADF bilder från en vanlig elektronstråle med HAADF bilder från en elektronvirvelstråle. Vad jag fann var att EVS producerade en munkformad intensitetsfördelning runt atomerna. Men när hänsyn till storleken på elektronkällan togs i beaktande kunde inte detta fenomen observeras längre. När bilder från EVS jämfördes med bilder från vanliga elektronstrålar, fann jag att intensiteten av spridda elektroner runt atomkolumnerna var bredare för EVS. Detta kunde observeras även efter att jag tagit hänsyn till elektronkällans storlek.
Chen, Li. "Fabrication of electron sources for a miniature scanning electron microscope". Thesis, University of York, 1999. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.313904.
Pełny tekst źródłaJohnson, Lars. "Nanoindentation in situ a Transmission Electron Microscope". Thesis, Linköping University, Department of Physics, Chemistry and Biology, 2007. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-8333.
Pełny tekst źródłaThe technique of Nanoindentation in situ Transmission Electron Microscope has been implemented on a Philips CM20. Indentations have been performed on Si and Sapphire (α-Al2O3) cut from wafers; Cr/Sc multilayers and Ti3SiC2 thin films. Different sample geometries and preparation methods have been evaluated. Both conventional ion and Focused Ion Beam milling were used, with different ways of protecting the sample during milling. Observations were made of bending and fracture of samples, dislocation nucleation and dislocation movement. Basal slip was observed upon unloading in Sapphire. Dislocation movement constricted along the basal planes were observed in Ti3SiC2. Post indentation electron microscopy revealed kink formation in Ti3SiC2 and layer rotation and slip across layers in Cr/Sc multilayer stacks. Limitations of the technique are presented and discussed.
Lyster, Martin. "Electron microscope studies of cadmium mercury telluride". Thesis, University of Oxford, 1989. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.238271.
Pełny tekst źródłaDellith, Meike. "Electron microscope investigations of defects in DRAMs". Thesis, University of Oxford, 1993. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.334379.
Pełny tekst źródłaChristensen, K. N. "Electron microscope studies of oxygen implanted silicon". Thesis, University of Oxford, 1990. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.292615.
Pełny tekst źródłaElliott, Sarah Louise. "Dopant profiling with the scanning electron microscope". Thesis, University of Cambridge, 2001. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.270885.
Pełny tekst źródłaBabich, I. M. "Short history of the scanning electron microscope". Thesis, Видавництво СумДУ, 2012. http://essuir.sumdu.edu.ua/handle/123456789/27513.
Pełny tekst źródłaAgarwal, Akshay. "A nanofabricated amplitude-division electron interferometer in a transmission electron microscope". Thesis, Massachusetts Institute of Technology, 2016. http://hdl.handle.net/1721.1/107101.
Pełny tekst źródła"September 2016." Cataloged from PDF version of thesis.
Includes bibliographical references (pages 56-62).
Wavefront-division electron interferometry with the electron biprism has enabled many applications such as electron holography, exit-wave reconstruction, and demonstration of the Aharonov-Bohm effect. However, wavefront-division interferometry is limited by the requirement of high source coherence. Amplitude-division electron interferometers, first demonstrated by Marton and co-workers in 1954, can overcome this limitation. The implementation of these interferometers is hindered by the precise rotational and translational alignment required. This thesis develops a self-aligned, monolithic electron interferometer consisting of two 45 nm thick silicon layers separated by 20 gm and fabricated from a single crystal silicon cantilever on a transmission electron microscope grid by gallium focused ion-beam milling. Using this interferometer, beam path-separation and interference fringes of lattice periodicity and a maximum contrast of 15% in an unmodified 200 kV transmission electron microscope was demonstrated. This interferometer design can potentially be scaled to millimeter-scale and used in electron holography. It can also be applied to perform fundamental physics experiments such as interaction-free measurement with electrons, with the aim of significantly reducing the damage suffered by biological samples during high-resolution microscopy. Thus, the interferometer can serve as a proof-of-concept of the recently proposed 'Quantum Electron Microscope'.
by Akshay Agarwal.
S.M.
Caldwell, N. H. M. "Knowledge-based engineering for the scanning electron microscope". Thesis, University of Cambridge, 1998. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.597224.
Pełny tekst źródłaAli, Saleh Mahdi. "Quantitative analysis of information in electron-microscope images". Thesis, King's College London (University of London), 1986. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.401716.
Pełny tekst źródłaMcLaren, Mathew Jonathon. "Transmission electron microscope characterisation of iron-rhodium epilayers". Thesis, University of Leeds, 2014. http://etheses.whiterose.ac.uk/8281/.
Pełny tekst źródłaRosolen, Grahame Craig. "The development of a combined scanning electron microscope and scanning tunnelling microscope for nanotechnology". Thesis, University of Cambridge, 1992. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.241061.
Pełny tekst źródłaYu, Enhua. "Crossed and uncrossed retinal fibres in normal and monocular hamsters : light and electron microscopic studies /". [Hong Kong : University of Hong Kong], 1990. http://sunzi.lib.hku.hk/hkuto/record.jsp?B13014316.
Pełny tekst źródłaMarturi, Naresh. "Vison and visual servoing for nanomanipulation and nanocharacterization using scanning electron microscope". Thesis, Besançon, 2013. http://www.theses.fr/2013BESA2014/document.
Pełny tekst źródłaWith the latest advances in nanotechnology, it became possible to design novel nanoscale devicesand systems with increasing efficiency. The consequence of this fact is an increase in the need for developing reliable and cutting edge processes for nanomanipulation and nanocharacterization. Since the human direct sensing is not a feasible option at this particular scale, the tasks are usually performedby an expert human operator using a scanning electron microscope (SEM) equipped withmicro-nanorobotic devices. However, due to the lack of effective processes, these tasks are always challenging and often tiresome to perform. Through this work we show that, this problem can be tackle deffectively up to an extent using the microscopic vision information. It is concerned about using the SEM vision to develop reliable automated methods in order to perform accurate and efficient nanomanipulation and nano characterization. Since, SEM imaging is affected by the non-linearities and instabilities present in the electron column, real time methods to monitor the imaging quality and to compensate the time varying distortion were developed. Later, these images were used in the development of visual servoing control laws. The developed visual servoing-based autofocusing method ensures a constant focus throughout the process and was used for estimating the inter-object depth that is highly challenging to compute using a SEM. Two visual servoing schemes were developed toperform accurate nanopositioning using a nanorobotic station positioned inside SEM. They are basedon the direct use of global pixel intensities and Fourier spectral information respectively. The positioning accuracies achieved by both the methods at different experimental conditions were satisfactory.The achieved results facilitate in developing accurate and reliable applications such as topographic analysis, nanoprobing and sample lift-out using SEM
Tanaka, H., T. Kojima, H. Tsuruta, J. Chen, T. Tanji i M. Ichihashi. "Development of a Real-Time Stereo Transmission Electron Microscope". Cambridge University Press, 2005. http://hdl.handle.net/2237/10297.
Pełny tekst źródłaMeaden, Graham M. "Cathodoluminescence studies of diamond in the scanning electron microscope". Thesis, University of Bristol, 1993. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.357826.
Pełny tekst źródłaFarley, A. N. "An environmental control stage for the scanning electron microscope". Thesis, University of Bristol, 1987. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.379674.
Pełny tekst źródłaVaughn, Joel M. "Manipulation Of Nanoscale Objects in the Transmission Electron Microscope". Ohio University / OhioLINK, 2007. http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1191525305.
Pełny tekst źródłaGaudenzi, de faria Marcelo. "Robust control for manipulation inside a scanning electron microscope". Thesis, Besançon, 2016. http://www.theses.fr/2016BESA2068/document.
Pełny tekst źródłaThis work studies the nano-positioning problem inside the scanning electron microscope (SEM). To acquire fast and accurate positional information, a dedicated setup was implemented consisting of a vibrometer placed inside the SEM. This approach differs from methods based on image processing, as it allows to capture real-time data on the dynamic behavior of structures. In a first study, the mechanical disturbances acting inside the microscope’s vacuum chamber were characterized and its sources were identified. This demonstrated how external mechanical vibrations and acoustic noises can largely influence the components inside the SEM through mechanical coupling, limiting the effective positioning precision of manipulators. Next, a commercial micro-gripper was studied, both in air and in vacuum, and the differences between its response were highlighted. This allowed to obtain two dynamic models for this end-effector, one for each environment. Two control laws were proposed (H-infinity control and Extended State Observer based control) for the system, to obtain a real-time, precise positioning in the vacuum environment and to attenuate the effects of the external mechanical disturbances. Results were demonstrated through simulation and experimental validation
Mattiazzo, Serena. "Performances of the Ion Electron Emission Microscope at SIRAD". Doctoral thesis, Università degli studi di Padova, 2008. http://hdl.handle.net/11577/3425031.
Pełny tekst źródłaBélisle, Jonathan. "Design and assembly of a multimodal nonlinear laser scanning microscope". Thesis, McGill University, 2006. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=100765.
Pełny tekst źródłaGass, Mhairi Hope. "Low-loss electron energy loss spectroscopy in a scanning transmission electron microscope of GaInNAs". Thesis, University of Liverpool, 2004. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.415656.
Pełny tekst źródłaChang, Michael Ming Yuen. "A computer-controlled system in transmission electron microscopy". Thesis, University of Cambridge, 1988. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.292941.
Pełny tekst źródłaSomodi, Philippa Katherine. "Interpretation of electron holograms of doped semiconductors and phase retrieval in the transmission electron microscope". Thesis, University of Cambridge, 2006. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.613846.
Pełny tekst źródłaHurm, Christian. "Towards an unambiguous electron magnetic chiral dichroism (EMCD) measurement in a transmission electron microscope (TEM)". Berlin Logos-Verl, 2008. http://d-nb.info/992155444/04.
Pełny tekst źródłaStaniewicz, Lech Thomas Leif. "Transmission-mode imaging in the environmental scanning electron microscope (ESEM". Thesis, University of Cambridge, 2012. https://www.repository.cam.ac.uk/handle/1810/242281.
Pełny tekst źródłaMurphy, Michael James. "Low-dimensional electron systems fabricated with an atomic force microscope". Thesis, University of Cambridge, 2007. https://www.repository.cam.ac.uk/handle/1810/265511.
Pełny tekst źródłaGold, Daniel Patrick. "Transmission electron microscope studies of emitters of silicon bipolar transistors". Thesis, University of Oxford, 1989. http://ora.ox.ac.uk/objects/uuid:ec5f58c3-ced6-44fe-8f1f-d042cdb7b7b7.
Pełny tekst źródłaRavichandran, M. V. "Electron microscope investigation of SiC-whisker reinforced-oxide ceramic composites". Thesis, University of Cambridge, 1991. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.239253.
Pełny tekst źródłaKazemian, Payam. "Progress towards quantitative dopant profiling with the scanning electron microscope". Thesis, University of Cambridge, 2006. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.613999.
Pełny tekst źródłaPratt, Neil Victor. "Luminescence and scanning electron microscope studies of III-V semiconductors". Thesis, Imperial College London, 1988. http://hdl.handle.net/10044/1/47222.
Pełny tekst źródła于恩華 i Enhua Yu. "Crossed and uncrossed retinal fibres in normal and monocular hamsters: light and electron microscopic studies". Thesis, The University of Hong Kong (Pokfulam, Hong Kong), 1990. http://hub.hku.hk/bib/B31232449.
Pełny tekst źródłaSasaki, Katsuhiro, i Hiroyasu Saka. "A simple method of the electric/magnetic field observation by a conventional transmission electron microscope". Trans Tech Publications Inc, 2005. http://hdl.handle.net/2237/5299.
Pełny tekst źródłaArai, Shigeo, Shunsuke Muto, Takayoshi Tanji, Katuhiro Sasaki, Yahachi Saito, Michiko Kusunoki, Jiro Usukura i Nobuo Tanaka. "Development of an environmental high-voltage electron microscope for reaction science". Oxford University Press, 2013. http://hdl.handle.net/2237/20833.
Pełny tekst źródłaBuggy, T. W. "Theoretical and experimental studies using a prototype scanning transmission electron microscope". Thesis, University of Glasgow, 1985. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.375453.
Pełny tekst źródłaReid, Stephen Alastair. "A study of human skeletal maturation using the scanning electron microscope". Thesis, University College London (University of London), 2001. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.288391.
Pełny tekst źródłaJackson, Michael David. "Scanning tunnelling microscope and electron spectroscopy studies of selected GaAs systems". Thesis, University of Liverpool, 1996. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.338676.
Pełny tekst źródłaKenny, Peter Gerard. "The acquisition and analysis of multi-spectral analytical electron microscope images". Thesis, University of York, 1990. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.276346.
Pełny tekst źródłaRogers, Peter John. "Backscatter Electron Microscope, palynofacies and geochemical analysis of Mesozoic black shales". Thesis, University of Southampton, 1995. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.296422.
Pełny tekst źródłaChuah, Joon Huang. "A multi-pixel CMOS photon detector for the scanning electron microscope". Thesis, University of Cambridge, 2013. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.608077.
Pełny tekst źródłaAntypas, Ioanna. "Theoretical approaches to magnetic induction mapping in the transmission electron microscope". Thesis, University of Cambridge, 2008. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.611855.
Pełny tekst źródłaZaggout, Fatima Nouh. "Quantification of SE dopant contrast in low voltage scanning electron microscope". Thesis, University of York, 2007. http://etheses.whiterose.ac.uk/11013/.
Pełny tekst źródłaNye, Philip. "Computer instrumentation for voltage contrast measurement in the scanning electron microscope". Thesis, University of Edinburgh, 1990. http://hdl.handle.net/1842/15545.
Pełny tekst źródłaWorlock, Stephen. "A model of VLSI specimen charging in the scanning electron microscope". Thesis, University of Edinburgh, 1992. http://hdl.handle.net/1842/14704.
Pełny tekst źródłaCornille, Olivier. "Accurate 3D shape and displacement measurement using a scanning electron microscope". Toulouse, INSA, 2005. http://www.theses.fr/2005ISAT0021.
Pełny tekst źródłaWith the current development of nano-technology, there exists an increasing demand for three-dimensional shape and deformation measurements at this reduced-length scale in the field of materials research. Images acquired by Scanning Electron Microscope (SEM) systems coupled with analysis by Digital Image Correlation (DIC) is an interesting combination for development of a high magnification measurement system. However, a SEM is designed for visualization, not for metrological studies, and the application of DIC to the micro- or nano-scale with such a system faces the challenges of calibrating the imaging system and correcting the spatially-varying and time-varying distortions in order to obtain accurate measurements. Moreover, the SEM provides only a single sensor and recovering 3D information is not possible with the classical stereo-vision approach. But the specimen being mounted on the mobile SEM stage, images can be acquired from multiple viewpoints and 3D reconstruction is possible using the principle of videogrammetry for recovering the unknown rigid-body motions undergone by the specimen. The dissertation emphasizes the new calibration methodology that has been developed because it is a major contribution for the accuracy of 3D shape and deformation measurements at reduced-length scale. It proves that, unlike previous works, image drift and distortion must be taken into account if accurate measurements are to be made with such a system. Necessary background and required theoretical knowledge for the 3D shape measurement using videogrammetry and for in-plane and out-of-plane deformation measurement are presented in details as well. In order to validate our work and demonstrate in particular the obtained measurement accuracy, experimental results resulting from different applications are presented throughout the different chapters. At last, a software gathering different computer vision applications has been developed