Artykuły w czasopismach: „Diffraction des Rayons X synchrotron”

1

Ravy, Sylvain. "La diffraction cohérente des rayons X". Reflets de la physique, nr 34-35 (czerwiec 2013): 60–64. http://dx.doi.org/10.1051/refdp/201334060.

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Popescu, M., F. Sava, A. Lörinczi, I. N. Mihailescu, I. Cojocaru i G. Mihailova. "Diffraction de rayons X sur le silicium poreux". Le Journal de Physique IV 08, PR5 (październik 1998): Pr5–31—Pr5–37. http://dx.doi.org/10.1051/jp4:1998505.

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Cox, D. E. "Synchrotron X-Ray Powder Diffraction". MRS Bulletin 12, nr 1 (luty 1987): 16–20. http://dx.doi.org/10.1557/s088376940006869x.

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X-ray powder diffraction is one of the most widely used techniques by scientists engaged in the synthesis, analysis, and characterization of solids. It is estimated that there are now about 25,000 users throughout the world, of which about one third are in the United States. Any single-phase polycrystalline material gives an x-ray pattern which can be regarded as a unique “fingerprint,” and modern automated search-and-match techniques used in conjunction with the Powder Diffraction File (maintained by the International Center for Diffraction Data, Swarthmore, PA) allow routine analysis of samples in minutes. From an x-ray pattern of good quality it is possible to determine unit cell parameters with high accuracy and impurity concentrations of 1-5%, so that powder techniques are extremely valuable in phase equilibrium studies and residual stress measurements, for example. In addition, a detailed analysis of line shapes gives information about physical properties such as the size and shape of the individual crystallites, microscopic strain, and stacking disorder.In the early days of crystallography many simple (and some not-so-simple) structures were solved from x-ray powder diffraction patterns, but the obvious limitations to the number of individual reflection intensities which can be estimated and the increasing sophistication of single-crystal techniques resulted in a decline in the importance of this application in the 1950s and 1960s.

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4

Bach, M., N. Broll, A. Cornet i L. Gaide. "Diffraction X en traitements thermiques : dosage de l'austénite résiduelle par diffraction des rayons X". Le Journal de Physique IV 06, nr C4 (lipiec 1996): C4–887—C4–895. http://dx.doi.org/10.1051/jp4:1996485.

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Bourret, A. "Étude des interfaces enterrées par diffraction de rayons X". Le Journal de Physique IV 07, nr C6 (grudzień 1997): C6–19—C6–29. http://dx.doi.org/10.1051/jp4:1997602.

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6

Abbas, S., A. Raho i M. Kadi-Hanifi. "Caractérisation de solutions solides par diffraction des rayons X". Le Journal de Physique IV 10, PR10 (wrzesień 2000): Pr10–49—Pr10–54. http://dx.doi.org/10.1051/jp4:20001006.

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Kadi-Hanifi, M., H. Yousfi i A. Raho. "Caractérisation de solutions solides par diffraction des rayons X". Revue de Métallurgie 90, nr 9 (wrzesień 1993): 1116. http://dx.doi.org/10.1051/metal/199390091116.

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Grousson, Mathieu. "Amélie Juhin: tient théorie et expérience dans une seule main". Reflets de la physique, nr 57 (kwiecień 2018): 39. http://dx.doi.org/10.1051/refdp/201857039.

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Spécialiste de spectroscopie des rayons X, lauréate de la médaille de bronze du CNRS en 2016, cette physico-chimiste se sent aussi à l’aise auprès d’une ligne de lumière d’un synchrotron qu’avec des équations.

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9

Sutton, S. R., M. L. Rivers i J. V. Smith. "Synchrotron x-ray fluorescence: diffraction interference". Analytical Chemistry 58, nr 11 (sierpień 1986): 2167–71. http://dx.doi.org/10.1021/ac00124a013.

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10

Bonod, Nicolas. "Physicien célèbre : Max von Laue". Photoniques, nr 98 (wrzesień 2019): 18–19. http://dx.doi.org/10.1051/photon/20199818.

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Max von Laue est un physicien théoricien allemand spécialiste de la diffraction des ondes, de la relativité et de la superconductivité. Il propose en 1912 de sonder l’arrangement périodique de la matière avec des faisceaux de courtes longueurs d’onde, les rayons X ; et sera récompensé par le prix Nobel de Physique en 1914. La découverte de la diffraction des rayons X par des cristaux sera à l’origine d’avancées majeures dans les 100 ans qui suivirent, de la découverte de la structure de l’ADN à celle des quasi-cristaux.

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11

Brunel, M., i F. de Bergevin. "Diffraction d'un faisceau de rayons X en incidence très rasante". Acta Crystallographica Section A Foundations of Crystallography 42, nr 5 (1.09.1986): 299–303. http://dx.doi.org/10.1107/s010876738609921x.

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12

Kahloun, C., K. F. Badawi i A. Diou. "Incertitude sur l'analyse des contraintes par diffraction des rayons X". Revue de Physique Appliquée 25, nr 12 (1990): 1225–38. http://dx.doi.org/10.1051/rphysap:0199000250120122500.

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13

Bulteel, D., E. Garcia-Diaz, J. Durr, L. Khouchaf, C. Vernet i J. M. Siwak. "Étude d'un granulat alcali-réactif par diffraction des rayons X". Le Journal de Physique IV 10, PR10 (wrzesień 2000): Pr10–513—Pr10–520. http://dx.doi.org/10.1051/jp4:20001055.

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14

Louër, D. "Microstructure et profil des raies de diffraction des rayons X". Journal de Physique IV (Proceedings) 103 (luty 2003): 321–37. http://dx.doi.org/10.1051/jp4:200300013.

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15

Baruchel, José, Armelle Philip i Paul Tafforeau. "Nouvelles applications de l’imagerie aux rayons X en utilisant le rayonnement synchrotron". Reflets de la physique, nr 34-35 (czerwiec 2013): 32–37. http://dx.doi.org/10.1051/refdp/201334032.

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Riekel, C. "Microfocus diffraction with X-ray synchrotron radiation". Acta Crystallographica Section A Foundations of Crystallography 60, a1 (26.08.2004): s2. http://dx.doi.org/10.1107/s0108767304099969.

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17

Hall, C., P. Barnes, J. K. Cockcroft, S. L. Colston, D. Häusermann, S. D. M. Jacques, A. C. Jupe i M. Kunz. "Synchrotron energy-dispersive X-ray diffraction tomography". Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 140, nr 1-2 (kwiecień 1998): 253–57. http://dx.doi.org/10.1016/s0168-583x(97)00994-4.

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18

Barroso, R. C., R. T. Lopes, E. F. O. de Jesus i L. F. Oliveira. "X-ray diffraction microtomography using synchrotron radiation". Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 471, nr 1-2 (wrzesień 2001): 75–79. http://dx.doi.org/10.1016/s0168-9002(01)00918-4.

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Maehlen, J. P., V. A. Yartys, A. B. Riabov, A. Budziak, H. Figiel i J. Żukrowski. "Synchrotron X-ray diffraction study of ErMn2D2". Journal of Alloys and Compounds 437, nr 1-2 (czerwiec 2007): 140–45. http://dx.doi.org/10.1016/j.jallcom.2006.07.088.

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Parrish, William. "Advances in Synchrotron X-ray Polycrystalline Diffraction". Australian Journal of Physics 41, nr 2 (1988): 101. http://dx.doi.org/10.1071/ph880101.

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The advantages of synchrotron radiation for X-ray polycrystalline diffraction are illustrated by a number of examples. The plane wave parallel-beam X-ray optics uses a Si(lll) channel monochromator for easy wavelength selection and a set of long parallel slits to define the diffracted beam. The constant simple instrument function and the high resolution symmetrical profiles (FWHM 0.05") greatly simplify the data analysis and add a new dimension to profile broadening studies. The geometry permits uncoupling the 6-26 sample-detector relationship without changing the profile shape and makes possible new applications such as grazing angle incidence depth analysis of thin films. The same instrumentation is used for high resolution energy dispersive diffraction (BOD) by step-scanning the monochromator. The resolution is two orders of magnitude better than conventional BOD and can be used at high count rates. The easy wavelength selection yields diffraction patterns with the highest PI B and permits anomalous scattering studies.

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21

KOBAYASHI, MASAMICHI. "X-rey Diffraction: Dynamics Studied by Time-resolved Synchrotron X-ray Diffraction". Sen'i Gakkaishi 49, nr 4 (1993): P130—P134. http://dx.doi.org/10.2115/fiber.49.4_p130.

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22

de Vries, J. L. "Historique de la diffraction et de la fluorescence des rayons X". Le Journal de Physique IV 06, nr C4 (lipiec 1996): C4–695—C4–701. http://dx.doi.org/10.1051/jp4:1996467.

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23

Edhokkar, Fadhila, Ahmed Hadrich, Mohsen Graia i Tahar Mhiri. "Ba1.01Sr0.99P2O7: un nouveau site Ba2+révélé par diffraction des rayons X". Acta Crystallographica Section C Crystal Structure Communications 68, nr 12 (29.11.2012): i86—i88. http://dx.doi.org/10.1107/s0108270112047002.

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Single crystals of barium strontium diphosphate, Ba1.01Sr0.99P2O7, were prepared by a solid-state reaction. The compound is isostructural with α-Ba2P2O7, α-Sr2P2O7and BaPbP2O7. The structure has only one diphosphate group of the dichromate type that is repeated by symmetry to form sheets. These sheets present mirror planes perpendicular to theaaxis, situated atx= {1 \over 4} and {3 \over 4}. All the cations and three of the five independent O atoms are located on these mirror planes. The Ba2+cations are nine-coordinated by O atoms. The Ba2+and Sr2+cations are distributed on three different sites, in contrast with the isostructural compounds where only two sites are fully occupied. The refined site occupancies sum to a Ba:Sr ratio of 1.0133 (18):0.9867 (13), which leads to the reported deviation from the BaSrP2O7stoichiometry. The Raman spectrum of the compound is also reported and discussed.

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24

Bergmann, Uwe, Rafaella Georgiou, Pierre Gueriau, Jean-Pascal Rueff i Loïc Bertrand. "Nouvelles spectroscopies Raman X du carbone pour les matériaux anciens". Reflets de la physique, nr 63 (październik 2019): 22–25. http://dx.doi.org/10.1051/refdp/201963022.

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L’identification des composés à base de carbone, bien que difficile, est une source d’information essentielle dans de nombreuses études archéologiques et paléontologiques. La diffusion Raman de rayons X est une méthode de spectroscopie sur synchrotron qui permet d’identifier des signatures organiques, de retracer l’origine chimique des systèmes étudiés et de comprendre l’altération des composés organiques dans le temps. Cette technique, conduite de manière non destructive, dans l’air, avec une sensibilité en profondeur afin de fournir des informations non compromises par la contamination superficielle, surmonte ainsi plusieurs contraintes fondamentales à la caractérisation des matériaux organiques anciens.

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25

ITO, Masahisa. "Synchrotron Radiation. III. Measurement by Synchrotron Radiation. 9. X-Ray Magnetic Diffraction." RADIOISOTOPES 47, nr 5 (1998): 435–45. http://dx.doi.org/10.3769/radioisotopes.47.435.

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26

Fitch, Andrew N. "Applications of High-Resolution Powder X-Ray Diffraction". Solid State Phenomena 130 (grudzień 2007): 7–14. http://dx.doi.org/10.4028/www.scientific.net/ssp.130.7.

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The highly-collimated, intense X-rays produced by a synchrotron radiation source can be harnessed to build high-resolution powder diffraction instruments with a wide variety of applications. The general advantages of using synchrotron radiation for powder diffraction are discussed and illustrated with reference to the structural characterisation of crystalline materials, atomic PDF analysis, in-situ and high-throughput studies where the structure is evolving between successive scans, and the measurement of residual strain in engineering components.

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27

KAWADO, Seiji. "Historical Development of Synchrotron X-ray Diffraction Topography". Nihon Kessho Gakkaishi 54, nr 1 (2012): 2–11. http://dx.doi.org/10.5940/jcrsj.54.2.

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DiMasi, E., i M. Sarikaya. "Synchrotron x-ray microbeam diffraction from abalone shell". Journal of Materials Research 19, nr 5 (maj 2004): 1471–76. http://dx.doi.org/10.1557/jmr.2004.0196.

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Microstructured biomaterials such as mollusk shells receive much attention at present, due to the promise that advanced materials can be designed and synthesized with biomimetic techniques that take advantage of self-assembly and aqueous, ambient processing conditions. A satisfactory understanding of this process requires characterization of the microstructure not only in the mature biomaterial, but at the growth fronts where the control over crystal morphology and orientation is enacted. In this paper, we present synchrotron microbeam x-ray diffraction (XRD) and electron microscopy observations near the nacre–prismatic interface of red abalone shell. The relative orientations of calcite and aragonite grains exhibit some differences from the idealizations reported previously. Long calcite grains impinge the nacre–prismatic boundary at 45° angles, suggestive of nucleation on (104) planes followed by growth along the c axis. In the region within 100 μm of the boundary, calcite and aragonite crystals lose their bulk orientational order, but we found no evidence for qualitative changes in long-range order such as ideal powder texture or an amorphous structure factor. XRD rocking curves determined the mosaic of calcite crystals in the prismatic region to be no broader than the 0.3° resolution limit of the beamline’s capillary optics, comparable to what can be measured on geological calcite single crystals.

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29

Komizo, Y., i H. Terasaki. "In situtime resolved X‐ray diffraction using synchrotron". Science and Technology of Welding and Joining 16, nr 1 (styczeń 2011): 79–86. http://dx.doi.org/10.1179/136217110x12785889549822.

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30

Gu, Qinfen, Helen Brand i Justin Kimpton. "Battery research using synchrotron powder X-ray diffraction". Acta Crystallographica Section A Foundations and Advances 70, a1 (5.08.2014): C951. http://dx.doi.org/10.1107/s2053273314090482.

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Research and development of rechargeable batteries is critical to meet the worldwide demand for clean and sustainable energy collection and storage. A vital part of this research is to get clear understanding of how the crystal structures of electrode materials affect the the resulting properties of the batteries. As structural changes in both the anode and cathode materials play an important role in overall battery performance, synchrotron powder X-ray diffraction (PXRD), with high beam flux and resolution, is an extremely useful tool for studying the battery both in-situ and ex-situ. Several simple in-situ cell designs have been designed for synchrotron PXRD measurement. The cell is available for researchers in the field of battery research. The effectiveness and simplicity of the cell design have been demonstrated at Powder Diffraction Beamline at Australian Synchrotron for several user groups. Case studies of analysis of the lithium insertion reaction for Li0.18Sr0.66Ti0.5Nb0.5O3 defect perovskite [1], crystal structure of Li4Ti5O12–xBrx electrode material [2] and LiNi1/3Mn1/3Co1/3O2 (NMC) as a new synthesized cathode material [3] will be discussed, respectively.

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31

Dutta, Pulak. "Studies of monolayers using synchrotron X-ray diffraction". Current Opinion in Solid State and Materials Science 2, nr 5 (październik 1997): 557–62. http://dx.doi.org/10.1016/s1359-0286(97)80044-7.

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32

Kamishima, K., T. Noda, F. Kadonome, K. Kakizaki i N. Hiratsuka. "Synchrotron X-ray diffraction for pyrolytic magnetic carbon". Journal of Magnetism and Magnetic Materials 310, nr 2 (marzec 2007): e346-e348. http://dx.doi.org/10.1016/j.jmmm.2006.10.325.

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33

Barroso, R. C., M. J. Anjos, R. T. Lopes, E. F. O. de Jesus, S. M. Simabuco, D. Braz i C. R. F. Castro. "Matrix characterization using synchrotron radiation X-ray diffraction". Radiation Physics and Chemistry 61, nr 3-6 (czerwiec 2001): 739–41. http://dx.doi.org/10.1016/s0969-806x(01)00392-9.

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Cernik, R. J., i P. Barnes. "Industrial aspects of synchrotron X-ray powder diffraction". Radiation Physics and Chemistry 45, nr 3 (marzec 1995): 445–57. http://dx.doi.org/10.1016/0969-806x(94)00147-c.

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Sosnowska, I. M., i M. Shiojiri. "Oxides: neutron and synchrotron X-ray diffraction studies". Journal of Electron Microscopy 48, nr 6 (1.01.1999): 681–87. http://dx.doi.org/10.1093/oxfordjournals.jmicro.a023736.

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Carpentier, P., C. Berthet-Colominas, M. Capitan, M. L. Chesne, E. Fanchon, R. Kahn, S. Lequien i in. "Anomalous Diffraction with Soft X-ray Synchrotron Radiation". Acta Crystallographica Section A Foundations of Crystallography 56, s1 (25.08.2000): s61. http://dx.doi.org/10.1107/s0108767300022054.

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Quantock, Andrew J., Keith M. Meek, Eugene J.-M. A. Thonar i Kerry K. Assil. "Synchrotron X-ray diffraction in atypical macular dystrophy". Eye 7, nr 6 (listopad 1993): 779–84. http://dx.doi.org/10.1038/eye.1993.183.

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Katsumata, Koichi, Akiko Kikkawa, Yoshikazu Tanaka, Susumu Shimomura, Shuji Ebisu i Shoichi Nagata. "Synchrotron X-ray Diffraction Studies of α-Gd2S3". Journal of the Physical Society of Japan 74, nr 5 (15.05.2005): 1598–601. http://dx.doi.org/10.1143/jpsj.74.1598.

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Antonio, Selma Gutierrez, Fernanda Ribeiro Benini, Fabio Furlan Ferreira, Paulo César Pires Rosa i Carlos de Oliveira Paiva-Santos. "Synchrotron X-ray powder diffraction data of atorvastatin". Powder Diffraction 23, nr 4 (grudzień 2008): 350–55. http://dx.doi.org/10.1154/1.2996511.

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X-ray powder diffraction data collected in transmission and high-throughput geometries were used to analyze form I of atorvastatin. The X-ray wavelength of the synchrotron radiation used in this study was determined to be λ=1.3771 Å. Form I of atorvastatin was found to be triclinic with space group P1 and unit cell parameters a=5.4568(2) Å, b=9.8887(4) Å, c=30.3091(9) Å, α=76.801(3)°, β=99.177(5)°, γ=105.318(5)°, V=1527.1(1) Å3, Z=1, and M=1209.41 g mol−1 Alternatively, another unit cell dimension can be used to describe the same P1 crystal with a=5.4564(2) Å, b=9.8883(4) Å, c=29.6555(8) Å, α=95.745(3)°, β=94.297(5)°, γ=105.327(5)°, and V=1526.8(1) Å3.

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Kingma, Kathleen J., Ho-Kwang Mao i Russell J. Hemley. "Synchrotron X-ray diffraction of SiO2to multimegabar pressures". High Pressure Research 14, nr 4-6 (styczeń 1996): 363–74. http://dx.doi.org/10.1080/08957959608201422.

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Rieck, Wolfgang, Heinz Schulz i Monika Siedel. "X-Ray diffraction on microcrystals with synchrotron radiation". Journal of Physics and Chemistry of Solids 52, nr 10 (styczeń 1991): 1289–91. http://dx.doi.org/10.1016/0022-3697(91)90205-e.

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Parrish, W., M. Hart, C. G. Erickson, N. Masciocchi i T. C. Huang. "Instrumentation for Synchrotron X-Ray Powder Diffractometry". Advances in X-ray Analysis 29 (1985): 243–50. http://dx.doi.org/10.1154/s0376030800010326.

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AbstractThe instrumentation developed for poly crystalline diffractometry using the storage ring at the Stanford Synchrotron Radiation Laboratory is described. A pair of automated vertical scan diffractometers was used for a Si (111) channel monochromator and the powder specimens. The parallel beam powder diffraction was defined by horizontal parallel slits which had several times higher intensity than a receiving slit at the same resolution. The patterns were obtained with 2:1 scanning with’ a selected monochromatic beam, and an energy dispersive diffraction method in which the monochromator is step-scanned, and the specimen and scintillation counter are fixed. Both methods use the same instrumentation.

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43

Peng, Hong Yu, Ze Yu Chen, Ya Fei Liu, Qian Yu Cheng, Shan Shan Hu, Xian Rong Huang, Lahsen Assoufid, Balaji Raghothamachar i Michael Dudley. "Dislocation Contrast Analysis in Weak Beam Synchrotron X-Ray Topography". Materials Science Forum 1062 (31.05.2022): 356–60. http://dx.doi.org/10.4028/p-u7m9jr.

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Synchrotron monochromatic beam X-ray topography has been widely applied to characterize structural defects in SiC crystals. Using ray tracing simulations, the dislocation contrast in X-ray topography under strong diffraction conditions (diffraction takes place at or near Bragg angle) has been intensively investigated. However, the contrast and the configurations of the dislocation images recorded under weak diffraction conditions have not been fully investigated. Recently, we demonstrated that the contrast of dislocations in synchrotron grazing incidence topography under weak diffraction conditions can also be analyzed and interpreted by applying ray tracing principles. In this study, we have extended the application of the ray tracing method to analyze the dislocation contrast in weak beam synchrotron back reflection and rocking curve topography. The ray tracing method is shown to successfully simulate and correlate the contrast of threading screw dislocations at various positions on the rocking curve and thus allow to determine the signs of Burgers vectors.

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Chen, Liu Ran, Xi Chen, Ji Cai Liang i Ji Dong Zhang. "Analysis the Actual Nanostructure of α Phase Polyoctylfluorene Thin Film via Synchrotron Grazing-Incidence X-Ray Diffraction". Applied Mechanics and Materials 333-335 (lipiec 2013): 1832–35. http://dx.doi.org/10.4028/www.scientific.net/amm.333-335.1832.

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The nanostructure of α phase polyoctylfluorene thin film was characterized using normal X-ray diffraction, one-dimensional out-of-plane grazing incidence X-ray diffraction and two-dimensional grazing incidence X-ray diffraction with lab diffractometer and synchrotron diffractometer. The results show that using grazing incidence X-ray diffraction the weak diffraction signal of thin film can be observed after the elimination of background signals. Incorrect (h10) diffraction signals can be collected by lab diffractometer due to its low collimation and resolution, which can be overcome by using synchrotron diffractometer with high collimation and resolution that reveal the actual microstructure of polyoctylfluorene thin film.

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45

Authier, André. "Une découverte qui a changé le monde : la diffraction des rayons X". Reflets de la physique, nr 39 (maj 2014): 24–29. http://dx.doi.org/10.1051/refdp/201439024.

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Popescu, M., W. Hoyer, M. Stegarescu, A. Cornet i N. Broll. "Diffraction de rayons X sur les plaquettes de fer durcies par cyanuration". Journal de Physique IV (Proceedings) 118 (listopad 2004): 351–53. http://dx.doi.org/10.1051/jp4:2004118041.

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47

Chacon, C., O. Isnard i J. F. Bérar. "Étude structurale des composés YCo4-xNixB par diffraction anomale des rayons X". Journal de Physique IV (Proceedings) 118 (listopad 2004): 419–29. http://dx.doi.org/10.1051/jp4:2004118049.

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48

Maeder, G. "Développements actuels de la détermination des contraintes par diffraction des rayons X". Matériaux & Techniques 76, nr 9-10 (1988): 5–12. http://dx.doi.org/10.1051/mattech/198876090005.

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Louër, D. "La diffraction des rayons X par les poudres cent ans après Röntgen". Le Journal de Physique IV 06, nr C4 (lipiec 1996): C4–57—C4–69. http://dx.doi.org/10.1051/jp4:1996407.

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Lepore, G. O., S. Checchia, T. Baroni, M. Brunelli i F. d’Acapito. "Outstation for x-ray powder diffraction at the Italian beamline at the European synchrotron". Review of Scientific Instruments 93, nr 11 (1.11.2022): 113903. http://dx.doi.org/10.1063/5.0107024.

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LISA [ Linea Italiana per la Spettroscopia di Assorbimento X, Italian beamline for X-ray Absorption Spectroscopy (XAS)] is the Italian CRG ( Collaborating Research Group) beamline at the ESRF ( European Synchrotron Radiation Facility) dedicated to XAS [d’Acapito et al., J. Synchrotron Radiat. 26, 551–558 (2019)]. In this work, a methodical test of the LISA beamline in performing diffraction measurements is carried out. Synchrotron x-ray diffraction measurements would complement absorption spectroscopy techniques with the long-range characterization of the material under investigation, while XAS provides the short-range element selective information.

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Artykuły w czasopismach na temat „Diffraction des Rayons X synchrotron”

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