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Artykuły w czasopismach na temat "AFM PROCESS"
Walia, R. S., H. S. Shan i P. Kumar. "Enhancing AFM process productivity through improved fixturing". International Journal of Advanced Manufacturing Technology 44, nr 7-8 (4.02.2009): 700–709. http://dx.doi.org/10.1007/s00170-008-1893-7.
Pełny tekst źródłaFite, Kelby, E. Thomas Smiley, John McIntyre i Christina Wells. "Evaluation of a Soil Decompaction and Amendment Process for Urban Trees". Arboriculture & Urban Forestry 37, nr 6 (1.11.2011): 293–300. http://dx.doi.org/10.48044/jauf.2011.038.
Pełny tekst źródłaBao, Tim. "Traceable Dimension Metrology by AFM for Nanoscale Process Control". Key Engineering Materials 381-382 (czerwiec 2008): 549–52. http://dx.doi.org/10.4028/www.scientific.net/kem.381-382.549.
Pełny tekst źródłaMangesh, Gharat Saurabh, i Aviral Misra. "Finite element analysis of viscoelastic media used in abrasive flow machining process". IOP Conference Series: Materials Science and Engineering 1248, nr 1 (1.07.2022): 012005. http://dx.doi.org/10.1088/1757-899x/1248/1/012005.
Pełny tekst źródłaMekid, Samir. "In-Process Atomic-Force Microscopy (AFM) Based Inspection". Sensors 17, nr 6 (31.05.2017): 1194. http://dx.doi.org/10.3390/s17061194.
Pełny tekst źródłaBabicz, S., A. Zieliński, J. Smulko i K. Darowicki. "Corrosion process monitoring by AFM higher harmonic imaging". Measurement Science and Technology 28, nr 11 (18.10.2017): 114001. http://dx.doi.org/10.1088/1361-6501/aa844a.
Pełny tekst źródłaCambel, V., J. Martaus, J. Šoltýs, R. Kúdela i D. Gregušová. "AFM nanooxidation process – Technology perspective for mesoscopic structures". Surface Science 601, nr 13 (lipiec 2007): 2717–23. http://dx.doi.org/10.1016/j.susc.2006.12.058.
Pełny tekst źródłaHu, Xiaodong, i Xiaotang Hu. "Analysis of the process of anodization with AFM". Ultramicroscopy 105, nr 1-4 (listopad 2005): 57–61. http://dx.doi.org/10.1016/j.ultramic.2005.06.018.
Pełny tekst źródłaSato, Takashi, Stephen Wan i Yu Jing Ang. "Study of Process Characteristics of Abrasive Flow Machining (AFM) for Ti-6Al-4V and Validation with Process Model". Advanced Materials Research 797 (wrzesień 2013): 411–16. http://dx.doi.org/10.4028/www.scientific.net/amr.797.411.
Pełny tekst źródłaGupta, Ravi, Rahul O. Vaishya, Dr R. S. Walia Dr. R.S Walia i Dr P. K. Kalra Dr. P.K Kalra. "Experimental Study of Process Parameters On Material Removal Mechanism in Hybrid Abrasive Flow Machining Process (AFM)". International Journal of Scientific Research 2, nr 6 (1.06.2012): 234–37. http://dx.doi.org/10.15373/22778179/june2013/75.
Pełny tekst źródłaRozprawy doktorskie na temat "AFM PROCESS"
Al-Musawi, Raheem. "Theoretical and experimental investigations about the AFM tip-based nanomachining process". Thesis, Cardiff University, 2016. http://orca.cf.ac.uk/99795/.
Pełny tekst źródłaCOSENTINO, MICHELA. "AFM-STED correlative nanoscopy provides a new view on the formation process of misfolded protein aggregates". Doctoral thesis, Università degli studi di Genova, 2019. http://hdl.handle.net/11567/939919.
Pełny tekst źródłaDHULL, SACHIN. "INVESTIGATION OF HYBRID ELECTROCHEMICAL AND MAGNETIC FIELD ASSISTED ABRASIVE FLOW FINISHING PROCESS". Thesis, DELHI TECHNOLOGICAL UNIVERSITY, 2021. http://dspace.dtu.ac.in:8080/jspui/handle/repository/18780.
Pełny tekst źródłaPIANIGIANI, MICHELE. "Nano Imprinting Lithography Ultrafast process and its chemical and physical effects on advanced plastic materials". Doctoral thesis, Università degli Studi di Trieste, 2017. http://hdl.handle.net/11368/2908135.
Pełny tekst źródłaHoward, Mitchell James. "Development of a machine-tooling-process integrated approach for abrasive flow machining (AFM) of difficult-to-machine materials with application to oil and gas exploration componenets". Thesis, Brunel University, 2014. http://bura.brunel.ac.uk/handle/2438/9262.
Pełny tekst źródłaSörensen, Malin Helena. "Mesostructured particulate silica materials with tunable pore size : Synthesis, characterization and applications". Doctoral thesis, KTH, Ytkemi (stängd 20081231), 2009. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-10089.
Pełny tekst źródłaQC 20100811
Martin, Lucile. "Etude de l'oxyde de cuivre CuO, matériau de conversion en film mince pour microbatteries au lithium : caractérisation des processus électrochimiques et chimiques en cyclage". Thesis, Pau, 2013. http://www.theses.fr/2013PAUU3027/document.
Pełny tekst źródłaThe miniaturization of electronic components and the increasing number of their functionalities lead to the development of suitable energy microsources, among which lithium microbatteries appear. Despite the excellent performances of these all-solid-state electrochemical power sources, one main limitation that remains is their surface capacity. Its value being intrinsically connected to the nature of electrode materials, we chose to focus on CuO thin films which are characterized by a theoretical volumetric capacity (426 µAh .cm-2.µm-1) in far larger than the one of conventional intercalation materials used today. Indeed, this material reacts with lithium according to a particular mechanism, referred as conversion reaction, inducing the formation of a multiphase nanostructured system with a high complexity. In the framework of this study, understanding of electrochemical and chemical mechanisms which take place during the cycling of copper oxide thin films (CuO) was the main objective. This one has required a fine characterization of the electrode active material and the generated interfaces (solid/solid interfaces and solid/electrolyte interface). These studies have been mainly carried out with X-ray Photoelectron Spectroscopy (XPS), Atomic Force Microscopy (AFM) and theoretical approaches based on quantum chemistry methods. The chemical and morphological properties of the cycled CuO thin films have been linked to their electrochemical behavior. An important influence of their initial structure and morphology was then evidenced
Combes, Julien. "Etude de l'adhésion d'ostéoblastes sur substituts apatitiques par microscopie à force atomique". Phd thesis, Ecole Nationale Supérieure des Mines de Saint-Etienne, 2009. http://tel.archives-ouvertes.fr/tel-00445705.
Pełny tekst źródłaDoskočilová, Veronika. "Využití agentů v business procesech". Master's thesis, Vysoká škola ekonomická v Praze, 2011. http://www.nusl.cz/ntk/nusl-124783.
Pełny tekst źródłaDario, Alan de Genaro. "Processos de Cox com intensidade difusiva afim". Universidade de São Paulo, 2011. http://www.teses.usp.br/teses/disponiveis/45/45133/tde-01052013-111713/.
Pełny tekst źródłaThis Thesis deals with the Cox Process when its intensity belongs to a family of affine diffusions. The form of the probability density function of the Cox process is obtained when the density is described by an arbitrary d-dimensional affine diffusion. Coupling and convergence results are also addressed for a general Cox process with affine intensity. We adopted the Feller diffusion for driving the underlying intensity of the Cox Process to illustrate our results. Additionally the parameters of the underlying intensity processes are estimated by means of the Kalman Filter in conjunction with Quasi-Maximum Likelihood estimation.
Książki na temat "AFM PROCESS"
editor, Malik Lokendra, i Arora Manish editor, red. The chief justice speaks: Selected judicial and extra-judicial reflections of Justice A.M. Ahmadi. Gurgaon, Haryana, India: Universal Law Publishing, an imprint of LexisNexis, 2016.
Znajdź pełny tekst źródłaMaryLynn, Jacobs, i Austin Noelle, red. Splinting the hand and upper extremity: Principles and process. Baltimore, Md: Lippincott Williams & Wilkins, 2003.
Znajdź pełny tekst źródłaUnited States. Department of Justice, red. Address of the Honorable Edwin Meese III, Attorney General of the United States before the American Bar Association, 10: 30 A.M., Tuesday, July 9, 1985, Sheraton Washington Hotel, Washington, D.C. [Washington, D.C.?]: Department of Justice, 1985.
Znajdź pełny tekst źródłaMeese, Edwin. Address of the Honorable Edwin Meese III, Attorney General of the United States before the American Bar Association, 10:30 A.M., Tuesday, July 9, 1985, Sheraton Washington Hotel, Washington, D.C. [Washington, D.C.?]: Dept. of Justice, 1985.
Znajdź pełny tekst źródłaSaral, Melek. Turkey's 'Self' and 'Other' Definitions in the Course of the EU Accession Process. NL Amsterdam: Amsterdam University Press, 2017. http://dx.doi.org/10.5117/9789462981171.
Pełny tekst źródłaBabalis, Dimitra, red. Ecological design for an effective urban regeneration. Florence: Firenze University Press, 2004. http://dx.doi.org/10.36253/88-8453-146-2.
Pełny tekst źródłaLangbein, Hermann. Auschwitz przed sądem: Proces w Frankfurcie nad Menem 1963-1965 : dokumentacja. Wrocław: Via Nova, 2011.
Znajdź pełny tekst źródłaUnited States. National Aeronautics and Space Administration., red. Final test report for the qualification of the gristblast assembly and process for the inside diameter of the RSRM forward and aft domes. Brigham City, UT: Thiokol Corporation Space Operations, 1992.
Znajdź pełny tekst źródłaCompliance review process and missile defense: Hearing before the Subcommittee on International Security, Proliferation, and Federal Services of the Committee on Governmental Affairs, United States Senate, One Hundred Fifth Congress, first session, July 21, 1997. Washington: U.S. G.P.O., 1997.
Znajdź pełny tekst źródłaConference on Thermal Analysis of Molten Aluminum (1984 Rosemont, Ill.). Thermal analysis of molten aluminum: A new in-process technique for quality control : proceedings of the AFS/CMI Conference, December 11-12, 1984, Sheraton International at O'Hare, Rosemont, Illinois. Des Plaines, IL: Cast Metals Institute, 1985.
Znajdź pełny tekst źródłaCzęści książek na temat "AFM PROCESS"
Yan, Yong Da, Tao Sun i Shen Dong. "Study on Effects of the Feed on AFM-Based Nanomachining Process". W Materials Science Forum, 257–60. Stafa: Trans Tech Publications Ltd., 2006. http://dx.doi.org/10.4028/0-87849-421-9.257.
Pełny tekst źródłaMatsumoto, Kazuhiko. "Room-Temperature Single-Electron Devices formed by AFM Nano-Oxidation Process". W Applied Scanning Probe Methods, 459–67. Berlin, Heidelberg: Springer Berlin Heidelberg, 2004. http://dx.doi.org/10.1007/978-3-642-35792-3_16.
Pełny tekst źródłaYan, Yong Da, Tao Sun, Shen Dong i Ying Chun Liang. "MD Analysis on Tip Geometry Effects in AFM-Based Lithography Process". W Progress of Precision Engineering and Nano Technology, 228–33. Stafa: Trans Tech Publications Ltd., 2007. http://dx.doi.org/10.4028/0-87849-430-8.228.
Pełny tekst źródłaKim, Y. S., S. O. Choi, S. R. Lee i J. Kim. "An Atomic Simulation of AFM-Based Nano Lithography Process for Nano Patterning". W Solid Mechanics and its Applications, 331–41. Dordrecht: Springer Netherlands, 2004. http://dx.doi.org/10.1007/978-1-4020-2111-4_32.
Pełny tekst źródłaChaturvedi, Rishabh, i Pankaj Kumar Singh. "Analysis of the Factors Affecting MRR in AFM and Centrifugal Process Using Taguchi Method". W Lecture Notes in Mechanical Engineering, 393–99. Singapore: Springer Nature Singapore, 2023. http://dx.doi.org/10.1007/978-981-99-1328-2_36.
Pełny tekst źródłaKrüger, Daniel, Roger Rousseau, Dominik Marx, Harald Fuchs i Michele Parrinello. "Car-Parrinello Density Functional Calculations of the Bond Rupture Process of Thiolate on Gold in AFM Measurements: Progress and First Results". W High Performance Computing in Science and Engineering 2000, 257–72. Berlin, Heidelberg: Springer Berlin Heidelberg, 2001. http://dx.doi.org/10.1007/978-3-642-56548-9_20.
Pełny tekst źródłaSem, Helle Frisak, Steinar Carlsen i Gunnar John Coll. "On Two Approaches to ACM". W Business Process Management Workshops, 12–23. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-36285-9_3.
Pełny tekst źródłaSwenson, Keith D. "Position: BPMN Is Incompatible with ACM". W Business Process Management Workshops, 55–58. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-36285-9_7.
Pełny tekst źródłaGroßmann, K., A. Hardtmann, H. Wiemer, L. Penter i S. Kriechenbauer. "Advanced Forming Process Model - AFPM". W Lecture Notes in Production Engineering, 383–401. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-32448-2_17.
Pełny tekst źródłaTran Thi Kim, Thanh, Erhard Weiss, Christoph Ruhsam, Christoph Czepa, Huy Tran i Uwe Zdun. "Embracing Process Compliance and Flexibility Through Behavioral Consistency Checking in ACM". W Business Process Management Workshops, 43–54. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-42887-1_4.
Pełny tekst źródłaStreszczenia konferencji na temat "AFM PROCESS"
Kizu, Ryosuke, Ichiko Misumi, Akiko Hirai i Satoshi Gonda. "Photoresist shrinkage observation by a metrological tilting-AFM". W Metrology, Inspection, and Process Control XXXVII, redaktorzy John C. Robinson i Matthew J. Sendelbach. SPIE, 2023. http://dx.doi.org/10.1117/12.2655566.
Pełny tekst źródłavan Reijzen, Maarten E., Mehmet S. Tamer, Maarten H. van Es, Martijn M. C. J. M. van Riel, Sasan Keyvani, Hamed Sadeghian i Marco van der Lans. "Improved sub-surface AFM using photothermal actuation". W Metrology, Inspection, and Process Control for Microlithography XXXIII, redaktorzy Ofer Adan i Vladimir A. Ukraintsev. SPIE, 2019. http://dx.doi.org/10.1117/12.2515441.
Pełny tekst źródłaHu, Z. J., Y. D. Yan, Y. H. Zhang, T. Sun i S. Dong. "Penetrating Process Analysis of AFM Diamond Tip". W 2007 First International Conference on Integration and Commercialization of Micro and Nanosystems. ASMEDC, 2007. http://dx.doi.org/10.1115/mnc2007-21109.
Pełny tekst źródłaPromyoo, Rapeepan, Hazim El-Mounayri i Kody Varahramyan. "AFM-Based Nanoindentation Process: A Comparative Study". W ASME 2012 International Manufacturing Science and Engineering Conference collocated with the 40th North American Manufacturing Research Conference and in participation with the International Conference on Tribology Materials and Processing. American Society of Mechanical Engineers, 2012. http://dx.doi.org/10.1115/msec2012-7356.
Pełny tekst źródłaBreton, Mary A., Jennifer Fullam, Lan Yu, Dexin Kong, Daniel Schmidt, Andrew Greene, Liying Jiang, Sean Hand i Jason Osborne. "AFM characterization for Gate-All-Around (GAA) devices". W Metrology, Inspection, and Process Control for Microlithography XXXIV, redaktorzy Ofer Adan i John C. Robinson. SPIE, 2020. http://dx.doi.org/10.1117/12.2551931.
Pełny tekst źródłaCao, Zhenle, Wyatt Sullivan, Benjamin D. Bunday i David Morris. "Parallel MEMS AFM for high-throughput semiconductor metrology and inspection". W Metrology, Inspection, and Process Control XXXVII, redaktorzy John C. Robinson i Matthew J. Sendelbach. SPIE, 2023. http://dx.doi.org/10.1117/12.2658485.
Pełny tekst źródłaCerbu, Dorin, Kristof Paredis, Alain Moussa, Anne-Laure Charley i Philippe Leray. "Deep learning-enabled vertical drift artefact correction for AFM images". W Metrology, Inspection, and Process Control XXXVI, redaktorzy John C. Robinson i Matthew J. Sendelbach. SPIE, 2022. http://dx.doi.org/10.1117/12.2614029.
Pełny tekst źródłaCao, Zhenle, Wyatt Sullivan, Benjamin D. Bunday i David Morris. "Parallel MEMS AFM for high-throughput semiconductor metrology and inspection (Erratum)". W Metrology, Inspection, and Process Control XXXVII, redaktorzy John C. Robinson i Matthew J. Sendelbach. SPIE, 2023. http://dx.doi.org/10.1117/12.3005374.
Pełny tekst źródłaLiu, Hao-Chih, David Fong, Gregory A. Dahlen, Marc Osborn, Sean Hand i Jason R. Osborne. "Carbon nanotube AFM probes for microlithography process control". W SPIE 31st International Symposium on Advanced Lithography, redaktor Chas N. Archie. SPIE, 2006. http://dx.doi.org/10.1117/12.656807.
Pełny tekst źródłaKizu, Ryosuke, Ichiko Misumi, Akiko Hirai i Satoshi Gonda. "Comparison of SEM and AFM performances for LER reference metrology". W Metrology, Inspection, and Process Control for Microlithography XXXIV, redaktorzy Ofer Adan i John C. Robinson. SPIE, 2020. http://dx.doi.org/10.1117/12.2551468.
Pełny tekst źródłaRaporty organizacyjne na temat "AFM PROCESS"
Hedgecock, Nancy S. Hexavalent Chromium Reduction Pretreatment Process Evaluation, Randolph AFB, Texas. Fort Belvoir, VA: Defense Technical Information Center, wrzesień 1990. http://dx.doi.org/10.21236/ada228805.
Pełny tekst źródłaSisterson, Douglas. ARM Lead Mentor Selection Process and Key Roles and Responsibilities. Office of Scientific and Technical Information (OSTI), styczeń 2018. http://dx.doi.org/10.2172/1418462.
Pełny tekst źródłaBaca, Ana. Assessment of AFM - KPFM and SSRM for Measuring and Characterizing Materials Aging Processes. Office of Scientific and Technical Information (OSTI), listopad 2020. http://dx.doi.org/10.2172/1733233.
Pełny tekst źródłaSmith, F. G. Am/Cm Vitrification Process: Vitrification Material Balance Calculations. Office of Scientific and Technical Information (OSTI), luty 2001. http://dx.doi.org/10.2172/775070.
Pełny tekst źródłaSmith, F. G. Am/Cm Vitrification Process: Pretreatment Material Balance Calculations. Office of Scientific and Technical Information (OSTI), luty 2001. http://dx.doi.org/10.2172/775071.
Pełny tekst źródłaSmith, F. G. Am/Cm Vitrification Process: Vitrification Material Balance Calculations. Office of Scientific and Technical Information (OSTI), sierpień 2000. http://dx.doi.org/10.2172/760271.
Pełny tekst źródłaSmith, F. G. Am/Cm Vitrification Process: Pretreatment Material Balance Calculations. Office of Scientific and Technical Information (OSTI), sierpień 2000. http://dx.doi.org/10.2172/760272.
Pełny tekst źródłaMcHale, James, Timothy A. Chick i Eugene Miluk. Implementation Guidance for the Accelerated Improvement Method (AIM). Software Engineering Process Management: Special Report. Fort Belvoir, VA: Defense Technical Information Center, grudzień 2010. http://dx.doi.org/10.21236/ada536176.
Pełny tekst źródłaKroll, Joshua A. ACM TechBrief: Facial Recognition Technology. ACM, luty 2022. http://dx.doi.org/10.1145/3520137.
Pełny tekst źródłaDooraghi, Michael R., Afshin M. Andreas, Mark C. Kutchenreiter, Ibrahim M. Reda, Marta Stoddard, Manajit Sengupta i Aron M. Habte. Broadband Outdoor Radiometer Calibration (BORCAL) Process for the Atmospheric Radiation Measurement (ARM) Program: Second Edition. Office of Scientific and Technical Information (OSTI), luty 2019. http://dx.doi.org/10.2172/1494284.
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