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Gotowa bibliografia na temat „AFM Modes”

Autor: Grafiati

Data publikacji: 6 września 2023

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Artykuły w czasopismach na temat "AFM Modes"

Cruz Valeriano, Edgar, José Juan Gervacio Arciniega, Christian Iván Enriquez Flores, Susana Meraz Dávila, Joel Moreno Palmerin, Martín Adelaido Hernández Landaverde, Yuri Lizbeth Chipatecua Godoy, Aime Margarita Gutiérrez Peralta, Rafael Ramírez Bon i José Martín Yañez Limón. "Stochastic excitation for high-resolution atomic force acoustic microscopy imaging: a system theory approach". Beilstein Journal of Nanotechnology 11 (4.05.2020): 703–16. http://dx.doi.org/10.3762/bjnano.11.58.

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In this work, a high-resolution atomic force acoustic microscopy imaging technique is developed in order to obtain the local indentation modulus at the nanoscale level. The technique uses a model that gives a qualitative relationship between a set of contact resonance frequencies and the indentation modulus. It is based on white-noise excitation of the tip–sample interaction and uses system theory for the extraction of the resonance modes. During conventional scanning, for each pixel, the tip–sample interaction is excited with a white-noise signal. Then, a fast Fourier transform is applied to the deflection signal that comes from the photodiodes of the atomic force microscopy (AFM) equipment. This approach allows for the measurement of several vibrational modes in a single step with high frequency resolution, with less computational cost and at a faster speed than other similar techniques. This technique is referred to as stochastic atomic force acoustic microscopy (S-AFAM), and the frequency shifts of the free resonance frequencies of an AFM cantilever are used to determine the mechanical properties of a material. S-AFAM is implemented and compared with a conventional technique (resonance tracking-atomic force acoustic microscopy, RT-AFAM). A sample of a graphite film on a glass substrate is analyzed. S-AFAM can be implemented in any AFM system due to its reduced instrumentation requirements compared to conventional techniques.

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Eby, R. K., R. L. McEvoy i S. Marchese-Ragona. "AFM of polymers using force spectroscopy modes". Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 1076. http://dx.doi.org/10.1017/s042482010017311x.

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Several novel imaging modes in scanning-probe microscopy are capable of imaging the surface compliance properties of polymers. The atomic-force microscope is used with a silicon nitride cantilever, in contact mode. While scanning, the tip can be modulated with a low amplitude (25 Å) and low frequency (5 kHz), and the amplitude of tip deflection is compared with the input modulation signal. This mode, called modulated force, maps out the surface compliance of a sample, and gives pixel-to-pixel matching with a topography mode image. Alternatively, while scanning a topography mode image, a force-distance curve can be performed at each x-y pixel location. Several data points in the z-direction of the dF-dS curve can therefore be collected at each x-y data position. In result, one obtains a 3D dataset of force-distance curves with corresponding topography data. The dF-dS images that result are slices through the force-distance regime, each with pixel-to-pixel correspondence to the topography image. In this study, various polymer systems are examined with AFM force imaging modes.

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Dillon, Eoghan, Kevin Kjoller i Craig Prater. "Lorentz Contact Resonance Imaging for Atomic Force Microscopes: Probing Mechanical and Thermal Properties on the Nanoscale". Microscopy Today 21, nr 6 (listopad 2013): 18–24. http://dx.doi.org/10.1017/s1551929513000989.

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Atomic force microscopy (AFM) has been widely used in both industry and academia for imaging the surface topography of a material with nanoscale resolution. However, often little other information is obtained. Contact resonance AFM (CR-AFM) is a technique that can provide information about the viscoelastic properties of a material in contact with an AFM probe by measuring the contact stiffness between the probe and sample. In CR-AFM, an AFM cantilever is oscillated, and the amplitude and frequency of the resonance modes of the cantilever are monitored. When a probe or sample is oscillated, the tip sample interaction can be approximated as an ideal spring-dashpot system using the Voigt-Kelvin model shown in Figure 1. Contact resonance frequencies of the AFM cantilever will shift depending on the contact stiffness, k, between the tip and sample. The damping effect on the system comes from dissipative tip sample forces such as viscosity and adhesion. Damping, η, is observed in a CR-AFM system by monitoring the amplitude and Q factor of the resonant modes of the cantilever. This contact stiffness and damping information can then be used to obtain information about the viscoelastic properties of the material when fit to an applicable model.

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Xia, Fangzhou, i Kamal Youcef-Toumi. "Review: Advanced Atomic Force Microscopy Modes for Biomedical Research". Biosensors 12, nr 12 (2.12.2022): 1116. http://dx.doi.org/10.3390/bios12121116.

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Visualization of biomedical samples in their native environments at the microscopic scale is crucial for studying fundamental principles and discovering biomedical systems with complex interaction. The study of dynamic biological processes requires a microscope system with multiple modalities, high spatial/temporal resolution, large imaging ranges, versatile imaging environments and ideally in-situ manipulation capabilities. Recent development of new Atomic Force Microscopy (AFM) capabilities has made it such a powerful tool for biological and biomedical research. This review introduces novel AFM functionalities including high-speed imaging for dynamic process visualization, mechanobiology with force spectroscopy, molecular species characterization, and AFM nano-manipulation. These capabilities enable many new possibilities for novel scientific research and allow scientists to observe and explore processes at the nanoscale like never before. Selected application examples from recent studies are provided to demonstrate the effectiveness of these AFM techniques.

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Ignat, Ioan, Bernhard Schuster, Jonas Hafner, MinHee Kwon, Daniel Platz i Ulrich Schmid. "Intermodal coupling spectroscopy of mechanical modes in microcantilevers". Beilstein Journal of Nanotechnology 14 (19.01.2023): 123–32. http://dx.doi.org/10.3762/bjnano.14.13.

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Atomic force microscopy (AFM) is highly regarded as a lens peering into the next discoveries of nanotechnology. Fundamental research in atomic interactions, molecular reactions, and biological cell behaviour are key focal points, demanding a continuous increase in resolution and sensitivity. While renowned fields such as optomechanics have marched towards outstanding signal-to-noise ratios, these improvements have yet to find a practical way to AFM. As a solution, we investigate here a mechanism in which individual mechanical eigenmodes of a microcantilever couple to one another, mimicking optomechanical techniques to reduce thermal noise. We have a look at the most commonly used modes in AFM, starting with the first two flexural modes of cantilevers and asses the impact of an amplified coupling between them. In the following, we expand our investigation to the sea of eigenmodes available in the same structure and find a maximum coupling of 9.38 × 103 Hz/nm between two torsional modes. Through such findings we aim to expand the field of multifrequency AFM with innumerable possibilities leading to improved signal-to-noise ratios, all accessible with no additional hardware.

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Pishkenari, Hossein Nejat, i Ali Meghdari. "Effects of higher oscillation modes on TM-AFM measurements". Ultramicroscopy 111, nr 2 (styczeń 2011): 107–16. http://dx.doi.org/10.1016/j.ultramic.2010.10.015.

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Patel, Anisha N., i Christine Kranz. "(Multi)functional Atomic Force Microscopy Imaging". Annual Review of Analytical Chemistry 11, nr 1 (12.06.2018): 329–50. http://dx.doi.org/10.1146/annurev-anchem-061417-125716.

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Incorporating functionality to atomic force microscopy (AFM) to obtain physical and chemical information has always been a strong focus in AFM research. Modifying AFM probes with specific molecules permits accessibility of chemical information via specific reactions and interactions. Fundamental understanding of molecular processes at the solid/liquid interface with high spatial resolution is essential to many emerging research areas. Nanoscale electrochemical imaging has emerged as a complementary technique to advanced AFM techniques, providing information on electrochemical interfacial processes. While this review presents a brief introduction to advanced AFM imaging modes, such as multiparametric AFM and topography recognition imaging, the main focus herein is on electrochemical imaging via hybrid AFM-scanning electrochemical microscopy. Recent applications and the challenges associated with such nanoelectrochemical imaging strategies are presented.

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Li, Qing Fen, Li Zhu, Guo Jin i Xiu Fang Cui. "3D-Modeling and Numerical Analysis of Fracture Behavior in AFM-Specimen on Mixed-Mode I-II Loading Condition". Advanced Materials Research 450-451 (styczeń 2012): 1391–94. http://dx.doi.org/10.4028/www.scientific.net/amr.450-451.1391.

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The computational analysis of a three-dimensional (3D) finite element model of all fracture modes (AFM) specimen on mixed-mode I-II fracture was presented in this paper. The separated energy release rates (SERRs) along the crack front of the AFM-model were calculated by the modified virtual crack closure integral (MVCCI)-method and commercially available software ANSYS. The influence of finite geometry and loading angles on mixed mode I-II fracture was investigated.

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Guzman, Horacio V., Pablo D. Garcia i Ricardo Garcia. "Dynamic force microscopy simulator (dForce): A tool for planning and understanding tapping and bimodal AFM experiments". Beilstein Journal of Nanotechnology 6 (4.02.2015): 369–79. http://dx.doi.org/10.3762/bjnano.6.36.

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We present a simulation environment, dForce, which can be used for a better understanding of dynamic force microscopy experiments. The simulator presents the cantilever–tip dynamics for two dynamic AFM methods, tapping mode AFM and bimodal AFM. It can be applied for a wide variety of experimental situations in air or liquid. The code provides all the variables and parameters relevant in those modes, for example, the instantaneous deflection and tip–surface force, velocity, virial, dissipated energy, sample deformation and peak force as a function of time or distance. The simulator includes a variety of interactions and contact mechanics models to describe AFM experiments including: van der Waals, Hertz, DMT, JKR, bottom effect cone correction, linear viscoelastic forces or the standard linear solid viscoelastic model. We have compared two numerical integration methods to select the one that offers optimal accuracy and speed. The graphical user interface has been designed to facilitate the navigation of non-experts in simulations. Finally, the accuracy of dForce has been tested against numerical simulations performed during the last 18 years.

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Starodubtseva, M. N. "Atomic force microscopy of cells as a method for the study of the pathogenesis and AS THE basis for the development of methods of DISEASE DIAGNOSIS". Health and Ecology Issues, nr 4 (28.12.2017): 99–106. http://dx.doi.org/10.51523/2708-6011.2017-14-4-21.

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The application of atomic force microscopy (AFM) for the study of micro- and nanoscale areas of the cell surface allows researchers to introduce new cell parameters and to obtain qualitatively new notions about the causes and mechanisms of changes of the cell properties. The aim of the work was to assess the prospects of AFM of cells using the example of blood cells for the study and development of new methods of disease diagnosis based on the specificity of AFM modes of operation and the recent AFM data on the cell surface properties.

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Rozprawy doktorskie na temat "AFM Modes"

Devailly, Clémence. "Fluctuations thermiques - un outil pour étudier les fluides simples et binaires à l'échelle du micron". Thesis, Lyon, École normale supérieure, 2014. http://www.theses.fr/2014ENSL0976.

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Les transitions de phase près d'un point critique - dites du second ordre - sont un sujet toujours d'actualité en raison des nombreux phénomènes critiques intéressants tels que la force de Casimir critique, les problèmes de confinements ou les phénomènes hors d'équilibre suivant une trempe au point critique. Cette thèse vise à étudier expérimentalement certains phénomènes engendrés près d'un point critique. La thèse est divisée en deux axes : le premier consiste à développer plusieurs systèmes expérimentaux qui permettront de mesurer essentiellement la viscosité, par l'intermédiaire des fluctuations thermiques à l'échelle micrométrique. Le deuxième axe consiste à trouver et caractériser des mélanges binaires présentant une transition de phase du second ordre dans lesquelles on souhaite faire des mesures. Les enjeux de ces systèmes expérimentaux sont d'avoir une régulation en température précise, une sonde de mesure sensible aux fluctuations thermiques et/ou à des forces de l'ordre du pN, et un échantillon fiable et reproductible présentant un point critique accessible expérimentalement. Nous avons ainsi monté à partir d'un microscope à force atomique (AFM) déjà présent au laboratoire, un système de mesure de viscosité à sonde AFM fibrée. Malgré sa faible efficacité en terme de sonde de mesure métrologique, nous avons pu décrire et développer un modèle de couplage de modes de vibration permettant de comprendre la mécanique de microleviers AFM fibrés. J'ai également développé au laboratoire la mesure de microscopie dynamique différentielle qui permet de faire des mesures à sondes multiples contrairement au premier montage. J'ai discuté de la précision de la mesure dans le cadre de notre objectif d'étude des fluctuations critiques. En ce qui concerne l'échantillon de mesure, nous avons étudié plusieurs mélanges binaires que nous avons caractérisés par des méthodes classiques de turbidité et diffusion statique de la lumière. Cette caractérisation nous a permis de connaître les mélanges binaires pour les utiliser dans un troisième système de mesure : billes micrométriques piégées dans des pinces optiques déjà monté au laboratoire. Nous y avons rajouté un système de régulation thermique fait maison pour être exploité avec les contraintes de la pince optique. Ces tests ont fait apparaître un phénomène inattendu d'oscillations de transition de phase induites par laser. Nous avons développé un modèle pour les décrire. Enfin, des expériences préliminaires - toujours avec les pinces optiques dans les mélanges binaires - nous ont permis d'observer qualitativement des effets de l'approche au point critique par des mesures de viscosité et d'interaction type force de Casimir critique
Phase transitions near a critical point, or second order phase transitions, are still a recent object of studies because of the large amount of interesting critical phenomena as the critical Casimir force, confinements problems or out of equilibrium phenomena following a quench at the critical point. This thesis experimentally studies phenomena near a critical point. This manuscript is divided in two parts : the first one consists in building several experimental set-up which measure viscosity through thermal fluctuation at micrometric scale. The second part consists in finding and characterize binary mixtures which show a second order phase transition. Preliminary results have been done in these samples. One of the principal points of these experimental set-up are a well regulated temperature, a probe sensitive to thermal fluctuation and/or pN forces and a reproducible binary mixture which presents a critical point easy to reach experimentally. We mounted from an Atomic Force Microscope (AFM) already built in the laboratory, a hanging-fiber probe to measure viscosity of liquids. Despite its weak efficiency as a metrologic probe, we described and developed a mode coupling model which let us understand mechanics of hanging-fiber probes. I also developed in the lab the dynamic differential microscopy technique (DDM) which do measurements with several probes. I discussed about the measure precision with in mind the aim of studying critical fluctuations. For the choice of the sample, we studied several binary mixtures. We characterized them by classical methods as turbidity measurements and static light scattering. These characterizations let us learn about binary mixtures in order to use them in a third experimental set-up : beads trapped in an optical tweezers already built in the lab. We added to it a home-made thermal regulation which can be used with the constraints of optical tweezers. These tests showed an unexpected phenomenon of oscillating phase transition induce by laser. We developed a model to describe it. At last, preliminary experiments with optical tweezers in binary mixtures showed qualitative effects of an approach near a critical point on the viscosity and on interactions between beads as critical Casimir force

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Oral, Hasan Giray. "Modeling time-resolved interaction force mode AFM imaging". Thesis, Georgia Institute of Technology, 2012. http://hdl.handle.net/1853/43691.

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Intermittent contact mode atomic force microscopy has been widely employed for simultaneous topography imaging and material characterization. The work in the literature includes both qualitative and quantitative methods. Regular AFM cantilevers are generally used in these methods, yet these cantilevers come with certain limitations. These limitations result from the very nature of cantilever probes. They are passive force sensors with insufficient damping. This prevents having active and complete control on tip-sample forces, causing sample damage and inaccurate topography measurement. Ideally, an AFM probe should offer high bandwidth to resolve interaction forces, active control capability for small interaction force and stable operation, and sufficient damping to avoid transient ringing which causes undesired forces on the sample. Force sensing integrated readout and active tip (FIRAT) probe offers these properties. A special imaging mode, time-resolved interaction force (TRIF) mode imaging can be performed using FIRAT probe for simultaneous topography and material property imaging. The accuracy of topography measurement of samples with variations in elastic and adhesive properties is investigated via numerical simulations and experiments. Results indicate that employing FIRAT probe's active tip control (ATC) capability during TRIF mode imaging provides significant level of control over the tip-sample forces. This improves the accuracy of topography measurement during simultaneous material property imaging, compared to conventional methods. Moreover, Active tip control (ATC) preserves constant contact time during force control for stable contact while preventing loss of material property information such as elasticity and adhesive forces.

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Billingsley, Daniel Jeffrey. "Convergent transcription and nested gene models studied by AFM". Thesis, University of Leeds, 2012. http://etheses.whiterose.ac.uk/3149/.

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Genomic DNA is organised in complex spatial arrangements, and a given stretch of DNA may encode more than one gene. In some cases one gene may be entirely contained within a region of the DNA already occupied by another larger gene. The presence of these nested genes, often situated in introns and in the opposite orientation, poses important implications with regards to gene expression, function and regulation. A consequence of the nested gene arrangement is convergent transcription, occurring when two promoters on opposite DNA strands are active. Elucidating the mechanics of multiple interacting proteins on single DNA templates requires single molecule methods such as atomic force microscopy (AFM). AFM can accurately determine the relative positions of enzymes, such as RNA polymerase (RNAP), on individual DNA templates. The central aim of this thesis is to use AFM to study the outcomes of convergent transcription, using linear DNA templates that function as models for nested genes. Fundamental aspects of imaging DNA on mica with AFM were investigated, with a view to optimising sample preparation. The main processes involved with preparing DNA samples, ready for scanning, were examined in turn. Effective binding was achieved by introducing divalent cations into a deposition buffer. Mica ion exchanged with Ni(II) usually gave rise to kinetically-trapped DNA molecules, however short linear fragments (< 800bp) were seen to deviate from the expected behaviour, indicating that ion-exchanged mica is heterogeneous, and contains patches or domains. These findings can be used to more readily control binding of DNA to substrates. The outcomes of varying the relative humidity while imaging biomolecular systems are largely unexplored to date. Various DNA samples were imaged in conditions of varying humidity. In particular when supercoiled plasmids are scanned at very high relative humidity (> 90% RH), localised DNA backbone motions or conformational changes were observed. Humidity controlled AFM will be a useful technique for probing DNA topology without some of the drawbacks of imaging under bulk solution. Initial studies of transcription utilised templates containing two promoter sites and E. Coli RNAP. Two promoter arrangements were studied: a convergent template containing the promoter sites on opposite strands directed towards each other, and a tandem template containing the promoters in the same direction, on the same stand. It was shown that collisions between RNAPs led to similar outcomes in both cases: RNAPs are unable to pass each other and remain stalled against each other. In the convergent case, it was observed that after collision one RNAP could cause another to backtrack along the template. By end-labelling double-stranded (ds) DNA templates with a single-stranded DNA loop, the polarity of the molecules can be established in the AFM. It allowed better discrimination between outcomes of collision events on single DNA molecules and importantly, it enabled a quantitative comparison of the relative frequencies of the outcomes. The most common outcome is a collision between an actively transcribing elongation complex (EC) and a “sitting duck” (SD), which is a stalled RNAP or open promoter complex (OPC). In collisions initiated from OPCs, the most likely outcome, a collision between an EC and an SD occurs ~74% of the time. This causes sizeable back-tracking of the inactive RNAP, on average 59 nm upstream of the promoter. A significant fraction of the collisions (~15%) are between actively transcribing RNAP while the remainder (~11%) are undetermined. End-labelling of dsDNA using nucleic acid structures did not interfere with AFM sample preparation and can be used as a generic approach to studying interactions of multiple proteins on DNA templates at the single molecule level.

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Yurtsever, Ayhan. "Nanotribological surface characterization by frequency modulated torsional resonance mode AFM". Diss., kostenfrei, 2008. http://edoc.ub.uni-muenchen.de/8718/.

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Stone, Peter (Peter Robert). "A new model for electric force microscopy and its application for electrostatically generated phase difference in tapping mode AFM". Thesis, Massachusetts Institute of Technology, 2005. http://hdl.handle.net/1721.1/32855.

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Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 2005.
Includes bibliographical references (leaf 37).
The harmonic force balance method was used to model and simulate electric force microscopy (EFM) and electrostatically generated phase difference in tapping mode AFM (EPTA) measurements. Simulations show that the harmonic force balance approach matches and explains EFM and EPTA experimental results well. Simulations also show that the model depended on both geometric and materials parameters. The harmonic force balance model was subsequently used to directly simulate a previously performed EPTA experiment. Data obtained from the model showed a remarkable similarity to the experimentally obtained data, thus validating the use of the harmonic force balance model to simulate EPTA data.
by Peter Stone.
S.B.

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Nasrallah, Hussein. "Capillary adhesion and friction : an approach with the AFM Circular Mode". Phd thesis, Université du Maine, 2011. http://tel.archives-ouvertes.fr/tel-00651818.

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The aim of this thesis is concerned with the influence of sliding velocity on capillary adhesion at the nanometer scale. In ambient conditions, capillary condensation which is a thermally activated process, allows the formation of a capillary meniscus at the interface between an atomic force microscope (AFM) probe and a substrate. This capillary meniscus leads to a capillary force that acts as an additional normal load on the tip, and affects the adhesion and friction forces. The Atomic Force Microscopy (AFM) offers interesting opportunities for the measurement of surface properties at the nanometer scale. Nevertheless, in the classical imaging mode, limitations are encountered that lead to a non stationary state. These limitations are overcome by implementing a new AFM mode (called Circular AFM mode). By employing the Circular AFM mode, the evolution of the adhesion force vs. the sliding velocity was investigated in ambient conditions on model hydrophilic and hydrophobic surfaces with different physical-chemical surface properties such as hydrophilicity. For hydrophobic surfaces, the adhesion forces or mainly van der Waals forces showed no velocity dependence, whereas, in the case of hydrophilic surfaces, adhesion forces, mainly due to capillary forces follow three regimes. From a threshold value of the sliding velocity, the adhesion forces start decreasing linearly with the logarithm increase of the sliding velocity and vanish at high sliding velocities. This decrease is also observed on a monoasperity contact between a atomically flat mica surface and a smooth probe, thus eliminating the possibility of the kinetics of the capillary condensation being related to a thermally activated nucleation process as usually assumed. Therefore, we propose a model based on a thermally activated growth process of a capillary meniscus, which perfectly explains the experimental results. Based on these results, we focused on directly investigating with the Circular mode the role of capillary adhesion in friction mechanisms. We investigated the influence of the sliding velocity on the friction coefficient, and a decrease following three regimes, similar to the sliding velocity dependence of the capillary adhesion, was observed for hydrophilic surfaces that possess a roughness higher than 0.1 nm. Whereas, an increase of the friction coefficient was observed on hydrophilic (Mica) or hydrophobic (HOPG) atomically flat surfaces that posses a roughness lower than 0.1 nm. However, in this latter case, the three regimes are not established. Finally, on a rough hydrophobic surface, the friction coefficient was sliding velocity independent. A direct comparison with capillary adhesion behavior with the sliding velocity is expected to give new insights to explain this interplay.

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Hida, H., M. Shikida, K. Fukuzawa, A. Ono, K. Sato, K. Asaumi, Y. Iriye i K. Sato. "Quartz tuning-fork type AFM probe operated in Anti-phase Vibration Mode". IEEE, 2006. http://hdl.handle.net/2237/9554.

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Lin, Zhen. "AFM electrical mode development for nanostructure semiconductor study : application on Ge / Si nanostructure". Lyon, INSA, 2010. http://theses.insa-lyon.fr/publication/2010ISAL0135/these.pdf.

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Aujourd'hui, la technologie des semi-conducteurs est confrontée au défi de la réduction ultime de la taille des composants pour augmenter la performance des appareillages électroniques en les miniaturisant. Cette forte réduction d'échelle provoque un développement considérable des techniques de microscopie pour révéler de nouvelles caractéristiques physiques à l'échelle nanométrique. La compréhension de ces nouvelles propriétés à l'échelle du nanomètre est donc de première importance. Dans ce travail, l’utilisation et l’application des techniques de caractérisation des propriétés électriques par microscopie à force atomique à pointes conductrices sont développées vis-à-vis de l’application aux semi-conducteurs. Les modes électriques spécifiques, comprenant la mesure de capacité par microscopie AFM (SCM) et la spectroscopie associée (SCS), la microscopie à force électrostatique (EFM) et la microscopie à sonde locale de Kelvin (KPFM) sont utilisées à température ambiante pour étudier les propriétés électroniques de nanostructures de germanium sur silicium qui ont été fabriquées par un procédé de démouillage. Il ressort que les mesures SCM, SCS, EFM et KPFM sont bien adaptées pour la caractérisation de nanostructures semi-conductrices, en particulier pour l'étude des nanocristaux à l'échelle du nanomètre. Ces travaux de caractérisation par AFM à modes électriques sont d'une importance primordiale dans le développement de dispositifs électroniques, en particulier pour l'application de transistors à mémoire utilisant des nanoilots de Ge / Si
Nowadays, the semiconductor technology is facing a great challenge to increase the device performance while reducing its dimension. This downscaling in microelectronics industry causes a drastic development of microscopy to reveal new physical characteristics at nanoscale. The understanding of these new properties in nanometer scale is of prime importance. In this work, the AFM fundamental working principle and some typical electric property characterization techniques in semiconductor industry were introduced. The electrical AFM modes including scanning capacitance microscopy (SCM) and spectroscopy (SCS), electrostatic force microscopy (EFM) and Kelvin probe force microscopy (KPFM) were developed at room temperature to study the properties of the promising replacement of the conventional poly-silicon floating gate, Germanium nanocrystals local Ge/Si nanostructures, which were fabricated by dewetting process. SCM, SCS, EFM and KPFM were proved to be available methodologies for semiconductor nanostructures characterizations, especially the nanocrystal study in nanometer scale. These characterisation works with developed AFM electrical mode are of prime importance in developing electronic devices application, especially the memory transistors application using Ge/Si nanocrystal

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Sebinelli, Heitor Gobbi. "Estudo de proteolipossomos constituídos de Na,K-ATPase utilizando a técnica de microscopia de força atômica". Universidade de São Paulo, 2016. http://www.teses.usp.br/teses/disponiveis/59/59138/tde-21092016-140434/.

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A Na, K-ATPase (NKA) é uma proteína de membrana encontrada em organismos eucariotos multicelulares cuja atividade e funções já são amplamente discutidas na literatura. Sua unidade funcional corresponde a um heterodímero formado por duas subunidades , com regiões transmembrana. Espécies multiméricas como dímeros e tetrâmeros dessa enzima também são conhecidos por exercer atividade enzimática. As interações lipídio-proteína são intrínsecas para a NKA, por tal motivo, proteolipossomos constituídos de DPPC e DPPC:DPPE foram preparados por co-solubilização. Como controle, lipossomos de mesma composição foram produzidos por extrusão e/ou sonicação. Para as imagens de AFM, as amostras foram fixadas com glutaraldeído, para proteção mecânica e contra desidratação das vesículas. Para lipossomos de DPPC as imagens topográficas de AFM das vesículas apresentaram formato oval, superfície perfeitamente lisa e diâmetro médio de 151 + 46 nm, enquanto as vesículas de composição DPPC:DPPE, apesar de lisas, tiveram cantos pontiagudos e diâmetro médio de 98 + 28 nm. Imagens de fase de ambas as composições não apresentaram qualquer indicativo de diferenças na composição química, provavelmente devido à natureza de carga neutra dos dois fosfolipídios. As imagens de fase por AFM para os proteolipossomos tanto de DPPC-NKA, quanto DPPC:DPPE-NKA, revelaram resultados inéditos na literatura, onde a inserção da NKA aparece como nítidas regiões transições de fase de composição química distinta quando comparadas com os lipossomos. No entanto, as mudanças de fase são diferentes entre as composições estudadas, aparecendo como manchas escuras circulares para DPPC-NKA e mais visíveis como interstícios brilhantes para composição de DPPC:DPPE-NKA. As vesículas de DPPC-NKA apresentaram diâmetro médio de 390 + 326 nm e, nas imagens de topografia tridimensionais, protusões de 38 a 115 nm correspondentes às regiões de mudanças de fase, que, indicaram o diâmetro dos microdomínios relacionados à proteína. Já nas imagens para DPPC:DPPE-NKA o diâmetro médio dos proteolipossomos foi de 189 + 156 nm, e as protusões apareceram entre os interstícios, variando de 20 a 66 nm. O estudo de DSC dos lipossomos revelou que a concentração de glutaraldeído nas condições das análises de AFM, em torno de 5% (v/v), afetam as características físico-químicas para as composições com DPPE. A AFM foi eficiente para confirmar a reinserção da NKA em proteolipossomos pelas imagens de fase, e, para medir o diâmetro dos microdomínios pelas imagens de topografia.
Na, K-ATPase (NKA) is a membrane protein present in eukaryotic multicellular organisms. Its functions and activity are already widely described in the literature. Its minimal functional structure is a heterodimer of two main subunits , with transmembrane domains. However, dimers and tetramers of the enzyme are also known to have enzymatic activity. Since there are intrinsic lipid-protein interactions, NKA proteoliposomes composed of DPPC and DPPC:DPPE (1:1 molar ratio) were prepared by the co-solubilization method and liposomes of the same compositions were obtained by extrusion and/or sonication to be used as control. The samples to the AFM study were prepared using glutaraldehyde to protect the vesicles from mechanical shocks and dehydration. Liposomes composed of DPPC and DPPC:DPPE (1:1 molar ratio) were prepared by extrusion and sonication, respectively, as control. The topographical images for DPPC liposomes showed vesicles with an oval shape and smoothed surfaces with a mean diameter of 151 + 46 nm. DPPC:DPPE vesicles also presented smoothed surfaces, but with pointed corners and mean diameter of 98 + 28 nm. Phase images for both lipid compositions showed no differences in chemical composition. For DPPC:DPPE samples, this can be explained by the neutral net charge of both lipids. The proteoliposomes observed in the AFM phase images showed darker and large circular spots in the vesicles. These spots represent delays in the phase oscillation of the AFM probe and are associated with different chemical composition. The phase changes showed the reconstitution of the NKA in the proteoliposomes. When compared with topographical images, this spots matched protrusions. The mean diameter of DPPC-NKA proteoliposomes determined by AFM was 390 + 326 nm. In the three-dimensional topographical images of composition, protrusions from 38 to 115 nm near the areas of different phases indicate the diameters of the NKA microdomains. The phase changes for DPPC:DPPE-NKA appeared as bright interstices with the protrusions of the topographical images in between them. The size of these protrusions ranged from 20 to 66 nm and the mean diameter of the proteoliposomes was 189 + 156 nm. The DSC liposomes data showed that the glutaraldehyde concentration used in the AFM analysis affect the physical chemistry properties of the samples with DPPE. AFM proved to be an efficient method to confirm the reconstitution of into proteoliposomes with phase images and to determine the diameter of the protein microdomains with the topographical images.

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Horstmeier, Sebastian [Verfasser]. "Dynamische AFM-Kraftspektroskopie an Desoxyribonukleinsäure im frequenz-modulierten Modus mit konstanter Anregung / Sebastian Horstmeier". Bielefeld : Universitätsbibliothek Bielefeld, 2013. http://d-nb.info/1045878561/34.

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Książki na temat "AFM Modes"

Zmysłowski, Wojciech. Wybrane problemy syntezy sterowań w układzie ruchowym: Algorytmy transformacji programów ruchowych w sygnały sterujące. Warszawa: Polska Akademia Nauk, Instytut Biocybernetyki i Inżynierii Biomedycznej, 1987.

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Harald, Weber, i U.S. Air Force Geophysics Laboratory. Atmospheric Sciences Division., red. Validation of a surface-layer windflow model using climatology and meteorological tower data from Vandenberg AFB, California. Hanscom AFB, MA: Atmospheric Sciences Division, Air Force Geophysics Laboratory, 1987.

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Association for Computing Machinery. ACM transactions on modeling and computer simulation: A publication of the Association for Computing Machinery. New York, NY: Association for Computing Machinery, 1991.

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Applin, Zachary T. Low-speed stability and control characteristics of a transport model with aft-fuselage-mounted advanced turboprops. [Washington, D.C.]: National Aeronautics and Space Administration, Scientific and Technical Information Branch, 1986.

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Applin, Zachary T. Low-speed stability and control characteristics of a transport model with aft-fuselage-mounted advanced turboprops. Hampton, Va: Langley Research Center, 1986.

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Shepard, Larry. Rebuild & powertune Carter/Edelbrock carburetors: Covers AFB, AVS and TQ models for street, performance and racing. New York, N.Y: HPBooks, 2010.

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Environment, Alberta Alberta. Alberta climate model (ACM) to provide climate estimates (1961-1990) for any location in Alberta from its geographic coordinates. [Edmonton]: Alberta Environment, 2005.

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El-Habash, N. A. Final report of frontal barrier impacts of a 1985 Pontiac Grand AM 2-door coupe in support of Crash III damage algorithm reformation. [Washington, D.C.]: U.S. Dept. of Transportation, National Highway Traffic Safety Administration, 1988.

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A, Freeman Kerry, Rivele Richard J i Webb Ron, red. Chilton's repair manual.: All U.S. and Canadian front wheel drive models. Radnor, PA: Chilton Book Company, 1992.

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Części książek na temat "AFM Modes"

Pacheco, Louis, i Nicolas F. Martinez. "Enhanced Current Dynamic Range Using ResiScope™ and Soft-ResiScope™ AFM Modes". W Conductive Atomic Force Microscopy, 263–76. Weinheim, Germany: Wiley-VCH Verlag GmbH & Co. KGaA, 2017. http://dx.doi.org/10.1002/9783527699773.ch12.

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Aliano, Antonio, Giancarlo Cicero, Hossein Nili, Nicolas G. Green, Pablo García-Sánchez, Antonio Ramos, Andreas Lenshof i in. "AFM, Tapping Mode". W Encyclopedia of Nanotechnology, 99. Dordrecht: Springer Netherlands, 2012. http://dx.doi.org/10.1007/978-90-481-9751-4_33.

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Nakajima, Hideo. "Phase Mode SPM/AFM". W Compendium of Surface and Interface Analysis, 441–44. Singapore: Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-6156-1_72.

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Aliano, Antonio, Giancarlo Cicero, Hossein Nili, Nicolas G. Green, Pablo García-Sánchez, Antonio Ramos, Andreas Lenshof i in. "AFM, Non-contact Mode". W Encyclopedia of Nanotechnology, 93–99. Dordrecht: Springer Netherlands, 2012. http://dx.doi.org/10.1007/978-90-481-9751-4_32.

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Noel, Olivier, Nguyen Anh Dung i Pierre-Emmanuel Mazeran. "The Circular Mode AFM". W 21st Century Nanoscience – A Handbook, 5–1. Boca Raton, Florida : CRC Press, [2020]: CRC Press, 2020. http://dx.doi.org/10.1201/9780429340420-5.

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Fukuma, Takeshi, i Michael J. Higgins. "Dynamic-Mode AFM in Liquid". W Atomic Force Microscopy in Liquid, 87–119. Weinheim, Germany: Wiley-VCH Verlag GmbH & Co. KGaA, 2012. http://dx.doi.org/10.1002/9783527649808.ch4.

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Quintanilla, Miguel Angel Sánchez. "Surface Analysis Using Contact Mode AFM". W Encyclopedia of Tribology, 3401–11. Boston, MA: Springer US, 2013. http://dx.doi.org/10.1007/978-0-387-92897-5_323.

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Wang, L., K. Wu i S. I. Rokhlin. "Nanoscale Viscoelastic Characterization Using Tapping Mode AFM". W Review of Progress in Quantitative Nondestructive Evaluation, 1741–48. Boston, MA: Springer US, 1999. http://dx.doi.org/10.1007/978-1-4615-4791-4_223.

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Yuan, Shuai, Lianqing Liu, Zhidong Wang i Ning Xi. "AFM Image Reconstruction Algorithm Based on Tip Model". W AFM-Based Observation and Robotic Nano-manipulation, 83–106. Singapore: Springer Singapore, 2020. http://dx.doi.org/10.1007/978-981-15-0508-9_4.

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Diaw, Mariteuw Chimère, Joachim Nguièbouri, Bruhnel Vambi N’Tambu, Julie Gagoe Tchoko, Marie Françoise Roselle Ngo Baneg i Caroline Bilogui. "ACM and Model Forests". W Responding to Environmental Issues through Adaptive Collaborative Management, 239–73. London: Routledge, 2023. http://dx.doi.org/10.4324/9781003325932-19.

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Streszczenia konferencji na temat "AFM Modes"

Alekseev, P. A., M. S. Dunaevskiy, A. M. Monakhov, V. V. Dudelev, G. S. Sokolovskii, A. Baranov i R. Teissier. "AFM visualization of half-disk WGM laser modes". W 2016 International Conference Laser Optics (LO). IEEE, 2016. http://dx.doi.org/10.1109/lo.2016.7549730.

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Echols-Jones, Piers M., Maxim E. Dokukin, Igor Sokolov i William C. Messner. "Switched dual-actuator control for AFM subresonant tapping modes". W 2017 American Control Conference (ACC). IEEE, 2017. http://dx.doi.org/10.23919/acc.2017.7962957.

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Belikov, Sergey, i Sergei Magonov. "Simulation of Asymptotic Amplitude-Phase Dynamics for AFM Resonant Modes*". W 2019 American Control Conference (ACC). IEEE, 2019. http://dx.doi.org/10.23919/acc.2019.8815218.

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Belikov, Sergey. "Force Curves Restoration in Atomic Force Microscopy (AFM) Resonant Modes*". W 2022 American Control Conference (ACC). IEEE, 2022. http://dx.doi.org/10.23919/acc53348.2022.9867568.

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Wang, Guoliang, Baishun Sun, Xiaomin Wu, Wenxiao Zhang, Yingmin Qu, Zhengxun Song, Zuobin Wang i Dayou Li. "Imaging Quality Assessment of Different AFM Working Modes on Living Cancer Cells". W 2019 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO). IEEE, 2019. http://dx.doi.org/10.1109/3m-nano46308.2019.8947426.

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Nikooienejad, Nastaran, Mohammad Maroufi i S. O. Reza Moheimani. "A Novel Non-Raster Scan Method for AFM Imaging". W ASME 2018 Dynamic Systems and Control Conference. American Society of Mechanical Engineers, 2018. http://dx.doi.org/10.1115/dscc2018-9049.

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We report a new non-raster scan method based on a rosette pattern for high-speed atomic force microscopy (AFM). In this method, the lateral axes of the scanner are driven by the sum of two sinusoids with identical amplitudes and different frequencies. We formulate the problem so as to generate the rosette pattern and calculate scan parameters and resolution. To achieve high performance tracking, a controller is designed based on the internal model principle. The controller includes the dynamic modes of the reference signals and higher harmonics to cope with the system nonlinearities. We conduct an experiment employing the proposed method and a two degree of freedom microelectromechanical system nanopositioner to scan a circular-shaped area with a diameter of 6μm in 0.2 sec. The steady state tracking error is less than 4.48nm, i.e. only 9% of the selected resolution. AFM scanning is performed in contact mode constant height and high quality images are obtained.

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Zhang, Chuan, Oh Chong Khiam i Esther P. Y. Chen. "Conductive-AFM for Scan Logic Failure Analysis at Advanced Technology Nodes". W ISTFA 2016. ASM International, 2016. http://dx.doi.org/10.31399/asm.cp.istfa2016p0458.

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Abstract The increase in complexity of process, structure, and design not only increases the amount of failure analysis (FA) work significantly, but also leads to more complicated failure modes. To meet the need of high success rate and fast throughput FA operation at the leading-edge nodes, novel FA techniques have to be explored and incorporated into the routine FA flow. One of the novel techniques incorporated into the presented scan logic FA flow is the conductive-atomic force microscopy (CAFM) technique. This paper demonstrates CAFM technique as a powerful and efficient solution for scan logic failure analysis at advanced technology nodes. Several failure modes in scan logic FA are used as examples to illustrate how CAFM provides excellent solutions to some of the very challenging FA problems. The gate to active short in nFET devices, resistive contact, and open defect on gate contact are some modes used.

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Kim, Il Kwang, Jea Woong Jang i Soo Il Lee. "Empirical Mode Decomposition for Dynamic AFM Microcantilevers in Air and Liquid Environment". W ASME 2018 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. American Society of Mechanical Engineers, 2018. http://dx.doi.org/10.1115/detc2018-86215.

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The modal decomposition of tapping mode atomic force microscopy microcantilevers in air and liquid environment was experimentally investigated to identify their complex responses. In experiment, the flexible microcantilevers and a flat HOPG sample were used. The responses of the microcantilevers were obtained to extract the linearized modes and orthogonal values using the methods for the proper orthogonal decomposition and the smooth orthogonal decomposition. The influence of the tapping setpoints and the hydrodynamic damping forces were investigated with the multi-mode response of microcantilevers. The results show that the first mode is dominant under normal operating conditions in tapping mode. However, at lower setpoint, the flexible microcantilever behaved uncertain modal distortion near the tip on the sample. The dynamics tapping effect and the damping between microcantilever and liquid influenced their responses.

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Laxminarayana, Karthik, i Nader Jalili. "A Review of Recent Developments in Atomic Force Microscopy Systems With Application to Manufacturing and Biological Processes". W ASME 2003 International Mechanical Engineering Congress and Exposition. ASMEDC, 2003. http://dx.doi.org/10.1115/imece2003-41170.

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The atomic force microscope (AFM) system has evolved into a useful tool for direct measurements of microstructural parameters and intermolecular forces at nanoscale level with atomic-resolution characterization. Typically, these microcantilever systems are operated in three open-loop modes; non-contact mode, contact mode, and tapping mode. In order to probe electric, magnetic, and/or atomic forces of a selected sample, the non-contact mode is utilized by moving the cantilever slightly away from the sample surface and oscillating the cantilever at or near its natural resonance frequency. Alternatively, the contact mode acquires sample attributes by monitoring interaction forces while the cantilever tip remains in contact with the target sample. The tapping mode of operation combines qualities of both the contact and non-contact modes by gleaning sample data and oscillating the cantilever tip at or near its natural resonance frequency while allowing the cantilever tip to impact the target sample for a minimal amount of time. Recent research on AFM systems has focused on many fabrication and manufacturing processes at molecular levels due to its tremendous surface microscopic capabilities. This paper provides a review of such recent developments in AFM imaging systems with emphasis on operational modes, microcantilever dynamic modeling and control. Due to the important contributions of AFM systems to manufacturing, this paper also provides a comprehensive review of recent applications of different AFM systems in these important areas.

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Kahrobaiyan, M. H., M. Rahaeifard i M. T. Ahmadian. "Torsional Sensitivity of the First Four Modes of an AFM Cantilever With a Sidewall Probe Using Analytical Method". W ASME 2009 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. ASMEDC, 2009. http://dx.doi.org/10.1115/detc2009-87035.

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In this study, using analytical method, the torsional resonant frequency and torsional sensitivity of the first four modes of an AFM cantilever with sidewall probe including a horizontal cantilever and a vertical extension is analyzed and a closed form for torsional sensitivity of the probe is derived. In addition, the effect of relative parameters such as ratio of vertical extension length to horizontal cantilever length is investigated. According to this study, the results show that as contact stiffness increases, the resonant frequencies of all vibration modes increases until they reach constant values at very high values of contact stiffness. It is also can be found that low-order modes are more sensitive than high-order one. When contact stiffness increases, the torsional sensitivities of all vibration modes decrease and the graphs converge at very high values of contact stiffness. In addition, enhancement of ratio of vertical extension length to cantilever length decreases the resonant frequency of mode 1 for all values of the contact stiffness and decreases torsional sensitivity for low values of the contact stiffness. But for high values of contact stiffness, there is a peak for torsional sensitivity. Finally the result shows that increase of the tip mass, decreases the torsional sensitivity with a light slope.

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Raporty organizacyjne na temat "AFM Modes"

Davis, Brian, Ross Henning, Kyle Henik, Levi Benning, Joseph R. Vanstrom i Jacek A. Koziel. ADM Demonstration Model Sifter. Ames: Iowa State University, Digital Repository, kwiecień 2018. http://dx.doi.org/10.31274/tsm416-180814-34.

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Bohl, W. R., F. R. Parker, D. Wilhelm, J. Berthier, L. Goutagny i Ninokata. AFDM: An Advanced Fluid-Dynamics Model. Office of Scientific and Technical Information (OSTI), wrzesień 1990. http://dx.doi.org/10.2172/6664961.

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Wilhelm, D. AFDM: An Advanced Fluid-Dynamics Model. Office of Scientific and Technical Information (OSTI), wrzesień 1990. http://dx.doi.org/10.2172/6545907.

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Bohl, W. AFDM: An Advanced Fluid-Dynamics Model. Office of Scientific and Technical Information (OSTI), wrzesień 1990. http://dx.doi.org/10.2172/6636482.

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Berthier, J., D. Wilhelm i W. Bohl. AFDM: An Advanced Fluid-Dynamics Model. Office of Scientific and Technical Information (OSTI), wrzesień 1990. http://dx.doi.org/10.2172/6599591.

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Parker, F. AFDM: An Advanced Fluid-Dynamics Model. Office of Scientific and Technical Information (OSTI), wrzesień 1990. http://dx.doi.org/10.2172/6641372.

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Henneges, G., i S. Kleinheins. AFDM: An advanced fluid-dynamics model. Volume 6: EOS-AFDM interface. Office of Scientific and Technical Information (OSTI), styczeń 1994. http://dx.doi.org/10.2172/10140789.

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Louis, J. F. Testbed model and data assimilation for ARM. Office of Scientific and Technical Information (OSTI), wrzesień 1992. http://dx.doi.org/10.2172/7035239.

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Long, Douglas, i Peter Samsel. Asynchronous Transfer Mode (ATM) User Security Services. Fort Belvoir, VA: Defense Technical Information Center, czerwiec 2001. http://dx.doi.org/10.21236/ada388288.

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Thomen, D., i V. Hamilton. Amphibious Assault Model (AAM) Application Support Package (ASP). Fort Belvoir, VA: Defense Technical Information Center, luty 1995. http://dx.doi.org/10.21236/ada297704.

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