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Artykuły w czasopismach na temat "AFM cantilever"
Dannberg, Oliver, i Thomas Fröhlich. "Steifigkeitsmessungen von AFM-Cantilevern". tm - Technisches Messen 88, s1 (24.08.2021): s3—s7. http://dx.doi.org/10.1515/teme-2021-0046.
Pełny tekst źródłaSlattery, Ashley D., Adam J. Blanch, Cameron J. Shearer, Andrew J. Stapleton, Renee V. Goreham, Sarah L. Harmer, Jamie S. Quinton i Christopher T. Gibson. "Characterisation of the Material and Mechanical Properties of Atomic Force Microscope Cantilevers with a Plan-View Trapezoidal Geometry". Applied Sciences 9, nr 13 (27.06.2019): 2604. http://dx.doi.org/10.3390/app9132604.
Pełny tekst źródłaZhao, Yu Wen, Yun Peng Song, Sen Wu i Xing Fu. "Accurate and Traceable Calibration of the Stiffness of Various AFM Cantilevers". Key Engineering Materials 645-646 (maj 2015): 817–23. http://dx.doi.org/10.4028/www.scientific.net/kem.645-646.817.
Pełny tekst źródłaCho, Ki Ho, Hak Joo Lee, Jae Hyun Kim, Jong Man Kim, Yong Kweon Kim i Chang Wook Baek. "A Study of Nano-Indentation Test Using Rhombus-Shaped Cantilever in Atomic Force Microscope". Key Engineering Materials 326-328 (grudzień 2006): 207–10. http://dx.doi.org/10.4028/www.scientific.net/kem.326-328.207.
Pełny tekst źródłaDat, Le Tri, Ho Thanh Huy i Nguyen Duy Vy. "A Theoretical Study of Deflection of AFM Bimaterial Cantilevers Versus Irradiated Position". Communications in Physics 28, nr 3 (14.11.2018): 255. http://dx.doi.org/10.15625/0868-3166/28/3/12673.
Pełny tekst źródłaBoubekri, Rachida, Edmond Cambril, L. Couraud, Lorenzo Bernardi, Ali Madouri, David Martrou i Sébastien Gauthier. "High Frequency 3C-SiC AFM Cantilever Using Thermal Actuation and Metallic Piezoresistive Detection". Materials Science Forum 711 (styczeń 2012): 80–83. http://dx.doi.org/10.4028/www.scientific.net/msf.711.80.
Pełny tekst źródłaMordue, Christopher W., Jonathan M. R. Weaver i Phillip S. Dobson. "Thermal induced deflection in atomic force microscopy cantilevers: analysis & solution". Measurement Science and Technology 34, nr 12 (25.08.2023): 125013. http://dx.doi.org/10.1088/1361-6501/acf061.
Pełny tekst źródłaDamircheli, Mehrnoosh, i Babak Eslami. "Design of V-shaped cantilevers for enhanced multifrequency AFM measurements". Beilstein Journal of Nanotechnology 11 (6.10.2020): 1525–41. http://dx.doi.org/10.3762/bjnano.11.135.
Pełny tekst źródłaLiu, Hao, Zuned Ahmed, Sasa Vranjkovic, Manfred Parschau, Andrada-Oana Mandru i Hans J. Hug. "A cantilever-based, ultrahigh-vacuum, low-temperature scanning probe instrument for multidimensional scanning force microscopy". Beilstein Journal of Nanotechnology 13 (11.10.2022): 1120–40. http://dx.doi.org/10.3762/bjnano.13.95.
Pełny tekst źródłaYeh, Meng Kao, Bo Yi Chen, Nyan Hwa Tai i Chien Chao Chiu. "Force Measurement by AFM Cantilever with Different Coating Layers". Key Engineering Materials 326-328 (grudzień 2006): 377–80. http://dx.doi.org/10.4028/www.scientific.net/kem.326-328.377.
Pełny tekst źródłaRozprawy doktorskie na temat "AFM cantilever"
Dharmasena, Sajith Mevan. "A Multi-Channel Micromechanical Cantilever for Advanced Multi-Modal Atomic Force Microscopy". The Ohio State University, 2019. http://rave.ohiolink.edu/etdc/view?acc_num=osu1565883484835926.
Pełny tekst źródłaParkin, John D. "Microcantilevers : calibration of their spring constants and use as ultrasensitive probes of adsorbed mass". Thesis, University of St Andrews, 2013. http://hdl.handle.net/10023/3608.
Pełny tekst źródłaJarmusik, Keith Edward. "An Improved Model for Interpreting Molecular Scale Electrostatic Interactions". Case Western Reserve University School of Graduate Studies / OhioLINK, 2010. http://rave.ohiolink.edu/etdc/view?acc_num=case1275666964.
Pełny tekst źródłaArecco, Daniel. "Analysis and preliminary characterization of a MEMS cantilever-type chemical sensor". Digital WPI, 2004. https://digitalcommons.wpi.edu/etd-theses/806.
Pełny tekst źródłaJiao, Sai. "Etude de la croisssance CVD des films minces de 3C-SiC et élaboration du cantilever AFM en 3C-SiC avec pointe Si intégrée". Thesis, Tours, 2012. http://www.theses.fr/2012TOUR4021/document.
Pełny tekst źródłaAmong aIl the well known polytypes ofihe silicon carbide (SiC), the cubic polytype (3C-SiC) is the only one that min be grown on silicon substrates. This heterostructure 3C SiC/Si ta interesting not only for its low production cost but also for the design of tise Micro-Electro-Mechanical Systems (MEMS). The high value ofthe Young’s modulis the 3C-SiC, compared to the silicon, allows submicronic cantilevers, fabrmcated from tIse 3C-SiC thin filins, to resonate at ultra-high frequency (>100MHz). The high resonant frequency is the key to obtain s fast, ultra-sensitive non-contact AFM systein.However, there isn’t any SiC cantilevers available on the market because of the difficulty to elaborate gond quality 3C-SiC thin films, with tIse Chemical Vapor Deposition (CVD) technique being tIse most frequently used synthesis technology. Tise first reason of tIse difficulty with the CVD technology to obtain gond quality thin film rests essentially in the important lattice mismatch and the difference in thermal expansion coefficient existing between 3C SiC and Si which generate crystalline defects at the interface and propagating tilI the 3C-SiC filin surface, with the inost defective zone localizing near the interface……
Cate, Evan Derek. "Design, Implementation, and Test of a Micro Force Displacement System". DigitalCommons@CalPoly, 2014. https://digitalcommons.calpoly.edu/theses/1192.
Pełny tekst źródłaLee, Sunyoung S. M. Massachusetts Institute of Technology. "Chemical functionalization of AFM cantilevers". Thesis, Massachusetts Institute of Technology, 2005. http://hdl.handle.net/1721.1/34205.
Pełny tekst źródłaIncludes bibliographical references (p. 47-52).
Atomic force microscopy (AFM) has been a powerful instrument that provides nanoscale imaging of surface features, mainly of rigid metal or ceramic surfaces that can be insulators as well as conductors. Since it has been demonstrated that AFM could be used in aqueous environment such as in water or various buffers from which physiological condition can be maintained, the scope of the application of this imaging technique has been expanded to soft biological materials. In addition, the main usage of AFM has been to image the material and provide the shape of surface, which has also been diversified to molecular-recognition imaging - functional force imaging through force spectroscopy and modification of AFM cantilevers. By immobilizing of certain molecules at the end of AFM cantilever, specific molecules or functionalities can be detected by the combination of intrinsic feature of AFM and chemical modification technique of AFM cantilever. The surface molecule that is complementary to the molecule at the end of AFM probe can be investigated via specificity of molecule-molecule interaction.
(cont.) Thus, this AFM cantilever chemistry, or chemical functionalization of AFM cantilever for the purpose of chemomechanical surface characterization, can be considered as an infinite source of applications important to understanding biological materials and material interactions. This thesis is mainly focused on three parts: (1) AFM cantilever chemistry that introduces specific protocols in details such as adsorption method, gold chemistry, and silicon nitride cantilever modification; (2) validation of cantilever chemistry such as X-ray photoelectron spectroscopy (XPS), AFM blocking experiment, and fluorescence microscopy, through which various AFM cantilever chemistry is verified; and (3) application of cantilever chemistry, especially toward the potential of force spectroscopy and the imaging of biological material surfaces.
by Sunyoung Lee.
S.M.
Liu, Zhen. "Reconstruction and Control of Tip Position and Dynamic Sensing of Interaction Force for Micro-Cantilever to Enable High Speed and High Resolution Dynamic Atomic Force Microscopy". The Ohio State University, 2017. http://rave.ohiolink.edu/etdc/view?acc_num=osu1483629656167247.
Pełny tekst źródłaPUKHOVA, VALENTINA. "DYNAMIC ATOMIC FORCE MICROSCOPY RESOLVED BY WAVELET TRANSFORM". Doctoral thesis, Università degli Studi di Milano, 2015. http://hdl.handle.net/2434/259234.
Pełny tekst źródłaBrook, Alexander J. "Micromachined III-V cantilevers for AFM-guided scanning Hall probe microscopy". Thesis, University of Bath, 2003. https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.425887.
Pełny tekst źródłaCzęści książek na temat "AFM cantilever"
Xia, Fangzhou, Ivo W. Rangelow i Kamal Youcef-Toumi. "Nanofabrication of AFM Cantilever Probes". W Active Probe Atomic Force Microscopy, 109–50. Cham: Springer International Publishing, 2024. http://dx.doi.org/10.1007/978-3-031-44233-9_5.
Pełny tekst źródłaKiracofe, Daniel, John Melcher i Arvind Raman. "Fundamentals of AFM Cantilever Dynamics in Liquid Environments". W Atomic Force Microscopy in Liquid, 121–55. Weinheim, Germany: Wiley-VCH Verlag GmbH & Co. KGaA, 2012. http://dx.doi.org/10.1002/9783527649808.ch5.
Pełny tekst źródłaYeh, Meng Kao, Bo Yi Chen, Nyan Hwa Tai i Chien Chao Chiu. "Force Measurement by AFM Cantilever with Different Coating Layers". W Experimental Mechanics in Nano and Biotechnology, 377–80. Stafa: Trans Tech Publications Ltd., 2006. http://dx.doi.org/10.4028/0-87849-415-4.377.
Pełny tekst źródłaLange, D., M. Zimmermann, C. Hagleitner, O. Brand i H. Baltes. "CMOS 10-Cantilever Array for Constant-Force Parallel Scanning AFM". W Transducers ’01 Eurosensors XV, 1046–49. Berlin, Heidelberg: Springer Berlin Heidelberg, 2001. http://dx.doi.org/10.1007/978-3-642-59497-7_247.
Pełny tekst źródłaShie, N. C., T. L. Chen i Kai Yuan Cheng. "Use of Fiber Interferometer for AFM Cantilever Probe Displacement Control". W Key Engineering Materials, 77–82. Stafa: Trans Tech Publications Ltd., 2005. http://dx.doi.org/10.4028/0-87849-977-6.77.
Pełny tekst źródłaPark, Jeong Woo, Deug Woo Lee, Noboru Takano i Noboru Morita. "Diamond Tip Cantilever for Micro/Nano Machining Based on AFM". W Materials Science Forum, 79–84. Stafa: Trans Tech Publications Ltd., 2006. http://dx.doi.org/10.4028/0-87849-990-3.79.
Pełny tekst źródłaYabuno, Hiorshi, Masaharu Kuroda i Takashi Someya. "Contact to Sample Surface by Self-excited Micro-cantilever Probe in AFM". W IUTAM Symposium on Dynamics Modeling and Interaction Control in Virtual and Real Environments, 27–33. Dordrecht: Springer Netherlands, 2011. http://dx.doi.org/10.1007/978-94-007-1643-8_4.
Pełny tekst źródłaChui, B. W., T. W. Kenny, H. J. Mamin, B. D. Terris i D. Rugar. "Dual-Axis Piezoresistive AFM Cantilever for Independent Detection of Vertical and Lateral Forces". W Tribology Issues and Opportunities in MEMS, 301–12. Dordrecht: Springer Netherlands, 1998. http://dx.doi.org/10.1007/978-94-011-5050-7_22.
Pełny tekst źródłaKranz, Christine, Boris Mizaikoff, Alois Lugstein i Emmerich Bertagnolli. "Integrating an Ultramicroelectrode in an AFM Cantilever: Toward the Development of Combined Microsensing Imaging Tools". W Environmental Electrochemistry, 320–33. Washington, DC: American Chemical Society, 2002. http://dx.doi.org/10.1021/bk-2002-0811.ch017.
Pełny tekst źródłaArinero, Richard, i Gérard Lévêque. "One-Dimensional Finite Element Modeling of AFM Cantilevers". W Acoustic Scanning Probe Microscopy, 101–22. Berlin, Heidelberg: Springer Berlin Heidelberg, 2012. http://dx.doi.org/10.1007/978-3-642-27494-7_4.
Pełny tekst źródłaStreszczenia konferencji na temat "AFM cantilever"
Chigullapalli, Aarti, i Jason V. Clark. "Modeling the Thermomechanical Interaction Between an Atomic Force Microscope Cantilever and Laser Light". W ASME 2012 International Mechanical Engineering Congress and Exposition. American Society of Mechanical Engineers, 2012. http://dx.doi.org/10.1115/imece2012-89215.
Pełny tekst źródłaMoeini, S. A., M. H. Kahrobaiyan, M. Rahaeifard i M. T. Ahmadian. "Optimization of First Mode Sensitivity of V-Shaped AFM Cantilever Using Genetic Algorithm Method". W ASME 2009 International Mechanical Engineering Congress and Exposition. ASMEDC, 2009. http://dx.doi.org/10.1115/imece2009-12554.
Pełny tekst źródłaLee, Jungchul, Tanya L. Wright, Mark Abel, Erik Sunden, Alexei Marchenkov, Samuel Graham i William P. King. "Characterization of Heated Atomic Force Microscope Cantilevers in Air and Vacuum". W ASME 2005 Pacific Rim Technical Conference and Exhibition on Integration and Packaging of MEMS, NEMS, and Electronic Systems collocated with the ASME 2005 Heat Transfer Summer Conference. ASMEDC, 2005. http://dx.doi.org/10.1115/ipack2005-73456.
Pełny tekst źródłaShen, Sheng, Avind Narayanaswamy, Shireen Goh i Gang Chen. "Thermal Conductance of Bi-Material AFM Cantilevers". W ASME 2008 International Mechanical Engineering Congress and Exposition. ASMEDC, 2008. http://dx.doi.org/10.1115/imece2008-68078.
Pełny tekst źródłaRubio-Sierra, F. J., R. Vazquez i R. W. Stark. "Transfer Function Analysis of Atomic Force Microscope Cantilevers". W ASME 2005 International Mechanical Engineering Congress and Exposition. ASMEDC, 2005. http://dx.doi.org/10.1115/imece2005-81156.
Pełny tekst źródłaSuter, Kaspar. "Tuning Fork AFM with Conductive Cantilever". W SCANNING TUNNELING MICROSCOPY/SPECTROSCOPY AND RELATED TECHNIQUES: 12th International Conference STM'03. AIP, 2003. http://dx.doi.org/10.1063/1.1639700.
Pełny tekst źródłaDutta, Sudipta, Mahesh Kumar Singh i M. S. Bobji. "PROBING ATOMIC LEVEL INTERACTIONS IN NI NANORODS AND AFM CANTILEVER USING ATOMIC FORCE MICROSCOPY BASED F–D SPECTROSCOPY". W BALTTRIB. Aleksandras Stulginskis University, 2017. http://dx.doi.org/10.15544/balttrib.2017.34.
Pełny tekst źródłaKumanchik, Lee, Tony Schmitz, Jon Pratt i John Ziegert. "Full Field Displacement Measurements of AFM Cantilevers During Loading". W ASME 2007 International Manufacturing Science and Engineering Conference. ASMEDC, 2007. http://dx.doi.org/10.1115/msec2007-31041.
Pełny tekst źródłaKing, William P., Thomas W. Kenny i Kenneth E. Goodson. "Comparison of Piezoresistive and Thermal Detection Approaches to Atomic Force Microscopy Topography Measurement". W ASME 2002 International Mechanical Engineering Congress and Exposition. ASMEDC, 2002. http://dx.doi.org/10.1115/imece2002-33295.
Pełny tekst źródłaChakraborty, Ishita, i Balakumar Balachandran. "Noise and Contact in Dynamic AFM Operations". W ASME 2011 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. ASMEDC, 2011. http://dx.doi.org/10.1115/detc2011-47955.
Pełny tekst źródłaRaporty organizacyjne na temat "AFM cantilever"
Gates, Richard S. Certification of Standard Reference Material® 3461 Reference Cantilevers for AFM Spring Constant Calibration. Gaithersburg, MD: National Institute of Standards and Technology, 2022. http://dx.doi.org/10.6028/nist.sp.260-227.
Pełny tekst źródłaGates, Richard S. Certification of Standard Reference Material® 3461 Reference Cantilevers for AFM Spring Constant Calibration. Gaithersburg, MD: National Institute of Standards and Technology, 2023. http://dx.doi.org/10.6028/nist.sp.260-227-upd1.
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