Gotowe bibliografie tematyczne / AFM

Gotowa bibliografia na temat „AFM”

Autor: Grafiati
Data publikacji: 4 czerwca 2021
Data aktualizacji: 7 lipca 2024

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Artykuły w czasopismach na temat "AFM"

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Nuryana, Christiana Tri, Tiara Puspita Agustin, Sofia Mubarika Haryana, Yohanes Widodo Wirohadidjojo i Nur Arfian. "Achatina fulica Mucus Ameliorates UVB-induced Human Dermal Fibroblast Photoaging via the TGF-β/Smad Pathway". Indonesian Biomedical Journal 15, nr 6 (11.12.2023): 375–82. http://dx.doi.org/10.18585/inabj.v15i6.2580.

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BACKGROUND: Ultraviolet B (UVB) induces skin photoaging by reducing collagen deposition via impairment of the TGF-β/Smad signaling pathway. Achatina fulica mucus (AFM) is a native medicine acting as vehicle of anti-aging ingredients. The present investigation examined the effect of AFM on UVB-induced fibroblast photoaging by assessing TGF-β, Smad3, and Smad7 mRNA expressions.METHODS: AFM was extracted from A. fulica using electrical shock and freeze-dried into a powder. Normal human dermal fibroblast (NHDF) cultures were irradiated with/without 100 mJ/cm2 UVB and treated with/without 10% platelet-rich plasma or different concentrations of AFM: 3.9 μg/mL in AF3 group; 15.625 μg/mL in AF15 group, and 62.5 μg/mL in AF62 group. The mRNA expressions of TGF-β, Smad3, and Smad7 in NHDF were evaluated by quantitative polymerase chain reaction.RESULTS: TGF-β mRNA expressions in the AF3 (0.85±0.01), AF15 (0.94±0.02) and AF62 (1.64±0.03) groups were significantly higher (p<0.05) compared with that in the UVB group (0.55±0.04). Moreover, Smad3 expressions in the AF3 (1.42±0.25), AF15 (1.89±0.13), and AF62 (2.50±0.31) groups were significantly higher (p<0.05) compared with that in the UVB group (0.57±0.08). Furthermore, Smad7 expressions in the AF3 (1.57±0.18), AF15 (0.87±0.03), and AF62 (0.25±0.09) groups were significantly lower (p<0.05) than that in the UVB group (2.57±0.06).CONCLUSION: AFM ameliorates UVB-induced fibroblast photoaging by upregulating the TGF-β/Smad3 expressions and downregulating Smad7 expression.KEYWORDS: Achatina fulica, TGF-β, Smad, collagen, UVB, fibroblast, photoaging
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Peña, Brisa, Mostafa Adbel-Hafiz, Maria Cavasin, Luisa Mestroni i Orfeo Sbaizero. "Atomic Force Microscopy (AFM) Applications in Arrhythmogenic Cardiomyopathy". International Journal of Molecular Sciences 23, nr 7 (28.03.2022): 3700. http://dx.doi.org/10.3390/ijms23073700.

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Arrhythmogenic cardiomyopathy (ACM) is an inherited heart muscle disorder characterized by progressive replacement of cardiomyocytes by fibrofatty tissue, ventricular dilatation, cardiac dysfunction, arrhythmias, and sudden cardiac death. Interest in molecular biomechanics for these disorders is constantly growing. Atomic force microscopy (AFM) is a well-established technic to study the mechanobiology of biological samples under physiological and pathological conditions at the cellular scale. However, a review which described all the different data that can be obtained using the AFM (cell elasticity, adhesion behavior, viscoelasticity, beating force, and frequency) is still missing. In this review, we will discuss several techniques that highlight the potential of AFM to be used as a tool for assessing the biomechanics involved in ACM. Indeed, analysis of genetically mutated cells with AFM reveal abnormalities of the cytoskeleton, cell membrane structures, and defects of contractility. The higher the Young’s modulus, the stiffer the cell, and it is well known that abnormal tissue stiffness is symptomatic of a range of diseases. The cell beating force and frequency provide information during the depolarization and repolarization phases, complementary to cell electrophysiology (calcium imaging, MEA, patch clamp). In addition, original data is also presented to emphasize the unique potential of AFM as a tool to assess fibrosis in cardiac tissue.
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Madeira, Mariana De Resende, Maximiliano De Souza Martins, Gustavo Pereira Martins i Fernando Flecha Alkmim. "Caracterização faciológica e evolução sedimentar da Formação Moeda (Supergrupo Minas) na porção noroeste do Quadrilátero Ferrífero, Minas Gerais". Geologia USP. Série Científica 19, nr 3 (2.10.2019): 129–48. http://dx.doi.org/10.11606/issn.2316-9095.v19-148467.

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A Formação Moeda, ao longo da região noroeste do Quadrilátero Ferrífero, registra os primeiros estágios da Bacia Minas, desenvolvida no limite Neoarqueano/Paleoproterozoico no sul do Cráton do São Francisco (CSF). Este trabalho analisa essa unidade a partir de seis perfis estratigráficos de detalhe nos quais foram identificadas nove fácies sedimentares: quatro conglomeráticas (Gms, Gm, Gt e Gp), três essencialmente areníticas (St, Sp e Sh) e duas predominantemente pelíticas (Fl e Fsc). As seções estratigráficas foram correlacionadas, possibilitando o agrupamento das fácies em cinco associações geneticamente relacionadas. As associações de fácies AF1 e AF2 representam sistemas de leques aluviais que evoluíram para planícies fluviais entrelaçadas. AF3 está relacionada a um sistema lacustre associado a marinho raso nas porções distais. Por fim, as associações de fácies AF4 e AF5 representam planícies fluviais entrelaçadas encerradas por uma transgressão marinha no estágio final de evolução da bacia. Com o auxílio do mapeamento geológico-estrutural de detalhe dessas associações e da confecção de uma seção restaurada foi possível interpretar que as AF1, AF2, AF3 e a porção basal da AF4 foram depositadas durante os estágios iniciais do rifteamento continental, e as demais associações materializam a transição rifte-margem passiva.
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KAWAI, Akira, i Daisuke INOUE. "EffectofThermalStressonPeelPropertyofLineResistPatternAnalyzedbyAtomicForceMicroscope(AFM". Journal of The Adhesion Society of Japan 39, nr 3 (2003): 107–10. http://dx.doi.org/10.11618/adhesion.39.107.

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Bowman, Dick. "AFM/PC". ACM SIGAPL APL Quote Quad 22, nr 4 (czerwiec 1992): 12–13. http://dx.doi.org/10.1145/140660.140679.

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Vinson, V. "AFM Uncompromised". Science 344, nr 6182 (24.04.2014): 341. http://dx.doi.org/10.1126/science.344.6182.341-c.

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Barrier, Gaëlle, i Edwige Biard. "AFM-Téléthon". médecine/sciences 31 (listopad 2015): 50. http://dx.doi.org/10.1051/medsci/201531s315.

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Burnham, Nancy A., i Uwe Hartmann. "Misinterpreting AFM". Science News 142, nr 14 (3.10.1992): 211. http://dx.doi.org/10.2307/4017921.

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Higgins, Michael, Gordon G. Wallace, Amy Gelmi i Scott T. McGovern. "Electrochemical AFM". Imaging & Microscopy 11, nr 2 (maj 2009): 40–43. http://dx.doi.org/10.1002/imic.200990038.

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Koklu, Mehti. "Performance Assessment of Fluidic Oscillators Tested on the NASA Hump Model". Fluids 6, nr 2 (7.02.2021): 74. http://dx.doi.org/10.3390/fluids6020074.

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Flow separation control over a wall-mounted hump model was studied experimentally to assess the performance of fluidic oscillators (sweeping jet actuators). An array of fluidic oscillators was used to control flow separation. The results showed that the fluidic oscillators were able to achieve substantial control over the separated flow by increasing the upstream suction pressure and downstream pressure recovery. Using the data available in the literature, the performance of the fluidic oscillators was compared to other active flow control (AFC) methods such as steady blowing, steady suction, and zero-net-mass-flux (ZNMF) actuators. Several integral parameters, such as the inviscid flow comparison coefficient, pressure drag coefficient, and modified normal force coefficient, were used as quality metrics in the performance comparison of the AFC methods. These quality metrics indicated the superiority of the steady suction method, especially at lower excitation amplitudes that is followed by the fluidic oscillators, steady blowing, and the ZNMF actuators, respectively. An aerodynamic figure of merit (AFM) was also constructed using the integral parameters and AFC power usage. The AFM results revealed that, for this study, steady suction was the most efficient AFC method at lower excitation amplitudes. The steady suction loses its efficiency as the excitation amplitude increases, and the fluidic oscillators become the most efficient AFC method. Both the steady suction and the fluidic oscillators have an AFM > 1 for the range tested in this study, indicating that they provide a net benefit when the AFC power consumption is also considered. On the other hand, both the steady blowing and ZNMF actuators were found to be inefficient AFC methods (AFM < 1) for the current configuration. Although they improved the flow field by controlling flow separation, the power requirement was more than their benefit.
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Rozprawy doktorskie na temat "AFM"

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Cooper, Katherine. "AFM and C-AFM Studies of GaN Films". VCU Scholars Compass, 2005. http://scholarscompass.vcu.edu/etd/1246.

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This thesis uses the techniques of atomic force microscope (AFM) and conductive AFM (C-AFM) to study the conduction properties of n-type GaN films. A total of 16 samples were examined and grouped according to their surface morphologies and conduction behaviors. The most common type of surface morpliology was that of Ga-rich samples having undulating "hillocks" with interspersed holes. Although most of the samples had this common morphology, their local conduction behaviors were not all similar. Local I-V spectra of the tip-sample Schottky contact could be grouped according to three major types: low leakage, high leakage, and "p-type". The highest quality samples with low leakage were usually grown at moderate temperatures (~650°C). For such samples, localized leakage only occurred at screw dislocations located at small pits terminating surface hillocks. I-V spectra taken on and off such hillocks were fit in forward bias to determine whether field emission or Frenkel-Poole conduction were dominant. Although field emission is a good fit compared to Frenkel-Poole, yielding reasonable values for the barrier height, the results are not yet conclusive without variable temperature studies.
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Rossell, Jacqueline. "Protein immobilisation for AFM". Thesis, University of Nottingham, 2003. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.404144.

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Lee, Sunyoung S. M. Massachusetts Institute of Technology. "Chemical functionalization of AFM cantilevers". Thesis, Massachusetts Institute of Technology, 2005. http://hdl.handle.net/1721.1/34205.

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Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 2005.
Includes bibliographical references (p. 47-52).
Atomic force microscopy (AFM) has been a powerful instrument that provides nanoscale imaging of surface features, mainly of rigid metal or ceramic surfaces that can be insulators as well as conductors. Since it has been demonstrated that AFM could be used in aqueous environment such as in water or various buffers from which physiological condition can be maintained, the scope of the application of this imaging technique has been expanded to soft biological materials. In addition, the main usage of AFM has been to image the material and provide the shape of surface, which has also been diversified to molecular-recognition imaging - functional force imaging through force spectroscopy and modification of AFM cantilevers. By immobilizing of certain molecules at the end of AFM cantilever, specific molecules or functionalities can be detected by the combination of intrinsic feature of AFM and chemical modification technique of AFM cantilever. The surface molecule that is complementary to the molecule at the end of AFM probe can be investigated via specificity of molecule-molecule interaction.
(cont.) Thus, this AFM cantilever chemistry, or chemical functionalization of AFM cantilever for the purpose of chemomechanical surface characterization, can be considered as an infinite source of applications important to understanding biological materials and material interactions. This thesis is mainly focused on three parts: (1) AFM cantilever chemistry that introduces specific protocols in details such as adsorption method, gold chemistry, and silicon nitride cantilever modification; (2) validation of cantilever chemistry such as X-ray photoelectron spectroscopy (XPS), AFM blocking experiment, and fluorescence microscopy, through which various AFM cantilever chemistry is verified; and (3) application of cantilever chemistry, especially toward the potential of force spectroscopy and the imaging of biological material surfaces.
by Sunyoung Lee.
S.M.
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Subedi, Laxmi P. "AFM Tip-Graphene-Surface Interactions". University of Akron / OhioLINK, 2010. http://rave.ohiolink.edu/etdc/view?acc_num=akron1291144388.

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Hegrová, Veronika. "Aplikace korelativní AFM/SEM mikroskopie". Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2019. http://www.nusl.cz/ntk/nusl-402580.

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This thesis is dealing with application of Correlative Probe and Electron Microscopy. All measurements were carried out by atomic force microscope LiteScope which is designed especially to be combined with electron microscopes. Advantages of Correlative AFM/SEM Microscopy are demonstrated on selected samples from field of nanotechnology and material science. Application of the correlative imaging was proposed and then realized particularly in case of low-dimensional structures and thin films. Further, this thesis deals with the possibility of combining Correlative AFM/SEM Microscopy with other integrated techniques of an electron microscope such as Focused Ion Beam and Energy Dispersive X-rays Spectroscopy.
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Andersen, Christopher. "The construction of carbon nanotube AFM probes for high resolution AFM of novel biological systems". Thesis, University of Nottingham, 2004. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.421480.

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Sonnenberg, Lars. "AFM-basierte Desorption einzelner oberflächenadsorbierter Polyelektrolyte". Diss., lmu, 2007. http://nbn-resolving.de/urn:nbn:de:bvb:19-76109.

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Filip-Boar, Diana. "AFM-CSLM microrheology of aggregated emulsions". Enschede : University of Twente [Host], 2006. http://doc.utwente.nl/56171.

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Gröger, Roland. "Nanokontaktdrucken mit AFM-gesteuert phasenseparierten Blockcopolymerschichten". Karlsruhe Forschungszentrum Karlsruhe, 2006. http://d-nb.info/986521612/34.

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FILHO, HENRIQUE DUARTE DA FONSECA. "METALLIC NANOSTRUCTURE FABRICATION BY AFM LITHOGRAPHY". PONTIFÍCIA UNIVERSIDADE CATÓLICA DO RIO DE JANEIRO, 2004. http://www.maxwell.vrac.puc-rio.br/Busca_etds.php?strSecao=resultado&nrSeq=6061@1.

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COORDENAÇÃO DE APERFEIÇOAMENTO DO PESSOAL DE ENSINO SUPERIOR
Nesta dissertação de mestrado, nós desenvolvemos um processo de litografia baseado na técnica de microscopia de força atômica. O estudo do processo de litografia aqui utilizado inicia-se com a deposição e caracterização de filmes finos de sulfeto de arsênio amorfo (a-As2S3) em substratos de silício e a deposição de uma camada metálica de alumínio, utilizada como máscara, sobre a superfície do a-As2S3. O microscópio de força atômica é utilizado para escrever os padrões de forma controlada na camada metálica, e para tal, a influencia dos parâmetros de controle do microscópio na realização da litografia foi analisada. Para a transferência do padrão litografado realiza-se um posterior processo de fotossensibilização e dissolução química do a-As2S3 com uma solução de K2CO3. Após a dissolução, uma camada de ouro foi depositada por erosão catódica DC, seguido de uma nova dissolução, desta vez com NaOH resultando na transferência de nanoestruturas de Au para o substrato de silício.
In this dissertation, we have developed a lithography process based on the atomic force microscopy of technique. The study of the lithography process starts with the deposition and characterization of amorphous arsenic sulfide thin films (a-As2S3) in silicon substrates and the deposition of a metallic aluminum layer, used as mask, on the surface of the a-As2S3. An atomic force microscope was used to write patterns in a controlled way on the metallic layer. Therefore, the influence of microscope feedback system on the accomplishment of the lithography was analyzed. In order to transfer the lithographed pattern to a silicon substrate, the a- As2S3 was exposed to a UV light source and was dissolved with a K2CO3 solution. Then, a thin gold layer was deposited by sputtering DC, and a new dissolution, now with NaOH was performed, leading to the deposition of Au nanostructures onto the silicon substrate.
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Książki na temat "AFM"

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Suleman, A. U. M. AFM studies of cellulosic fibres. Manchester: UMIST, 1996.

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Yuan, Shuai, Lianqing Liu, Zhidong Wang i Ning Xi. AFM-Based Observation and Robotic Nano-manipulation. Singapore: Springer Singapore, 2020. http://dx.doi.org/10.1007/978-981-15-0508-9.

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Delmonte, Clive. Advances in AFM & STM applied to thenucleic acids. Northampton: Clive Delmonte Publications, 1997.

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J, Erasmus L. AFM unity in theological education?: A historical perspective. Midrand, South Africa: International Theological Institute, 1996.

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Veselý, Jozef. Nanoscale AFM and TEM Observations of Elementary Dislocation Mechanisms. Cham: Springer International Publishing, 2017. http://dx.doi.org/10.1007/978-3-319-48302-3.

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John, Ferrante, i United States. National Aeronautics and Space Administration., red. Theoretical modelling of AFM for bimetallic tip-substrate interactions. [Washington, DC]: National Aeronautics and Space Administration, 1991.

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CTI-AFM Conference (4th 1993 Leicester, England). Selected proceedings from the 4th Annual CTI-AFM Conference. Redaktorzy Williams B. C. 1950-, Nicholson Ailsa H. S i CTI Centre for Accounting, Finance and Management. Norwich: CTI Centre for Accounting Finance and Management, University of East Anglia, 1993.

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John, Ferrante, i United States. National Aeronautics and Space Administration., red. Theoretical modelling of AFM for bimetallic tip-substrate interactions. [Washington, DC]: National Aeronautics and Space Administration, 1991.

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CTI-AFM Conference (7th 1996 Brighton). Selected proceedings from the 7th Annual CTI-AFM Conference. Redaktorzy Williams B. C. 1950-, Nicholson Ailsa H. S i CTI Centre for Accounting, Finance and Management. Norwich: CTI Centre for Accounting Finance and Management, University of East Anglia, 1996.

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Cappella, Brunero. Mechanical Properties of Polymers Measured through AFM Force-Distance Curves. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-29459-9.

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Części książek na temat "AFM"

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Mehlhorn, Heinz. "AFM". W Encyclopedia of Parasitology, 67. Berlin, Heidelberg: Springer Berlin Heidelberg, 2016. http://dx.doi.org/10.1007/978-3-662-43978-4_4500.

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Mehlhorn, Heinz. "AFM". W Encyclopedia of Parasitology, 1. Berlin, Heidelberg: Springer Berlin Heidelberg, 2015. http://dx.doi.org/10.1007/978-3-642-27769-6_4500-1.

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Aliano, Antonio, Giancarlo Cicero, Hossein Nili, Nicolas G. Green, Pablo García-Sánchez, Antonio Ramos, Andreas Lenshof i in. "AFM". W Encyclopedia of Nanotechnology, 83. Dordrecht: Springer Netherlands, 2012. http://dx.doi.org/10.1007/978-90-481-9751-4_100017.

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DeJonge, Andrea, Christoph Golbeck, Shahjahan Bhuiyan, Alnoor Ebrahim, Kate Ruff, Claudia Bode-Harlass, Karun K. Singh i in. "AFM". W International Encyclopedia of Civil Society, 18. New York, NY: Springer US, 2010. http://dx.doi.org/10.1007/978-0-387-93996-4_9005.

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Ando, Toshio. "Interactive HS-AFM (iHS-AFM)". W High-Speed Atomic Force Microscopy in Biology, 97–101. Berlin, Heidelberg: Springer Berlin Heidelberg, 2022. http://dx.doi.org/10.1007/978-3-662-64785-1_6.

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Aliano, Antonio, Giancarlo Cicero, Hossein Nili, Nicolas G. Green, Pablo García-Sánchez, Antonio Ramos, Andreas Lenshof i in. "AFM Tips". W Encyclopedia of Nanotechnology, 93. Dordrecht: Springer Netherlands, 2012. http://dx.doi.org/10.1007/978-90-481-9751-4_100019.

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Aliano, Antonio, Giancarlo Cicero, Hossein Nili, Nicolas G. Green, Pablo García-Sánchez, Antonio Ramos, Andreas Lenshof i in. "AFM Probes". W Encyclopedia of Nanotechnology, 90–93. Dordrecht: Springer Netherlands, 2012. http://dx.doi.org/10.1007/978-90-481-9751-4_109.

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Bauch, Jürgen, i Rüdiger Rosenkranz. "AFM - Rasterkraftmikroskopie". W Physikalische Werkstoffdiagnostik, 16–17. Berlin, Heidelberg: Springer Berlin Heidelberg, 2017. http://dx.doi.org/10.1007/978-3-662-53952-1_8.

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Moreno-Herrero, Fernando, i Julio Gomez-Herrero. "AFM: Basic Concepts". W Atomic Force Microscopy in Liquid, 1–34. Weinheim, Germany: Wiley-VCH Verlag GmbH & Co. KGaA, 2012. http://dx.doi.org/10.1002/9783527649808.ch1.

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Espinosa, Horacio D., Nicolaie Moldovan i K. H. Kim. "Novel AFM Nanoprobes". W NanoScience and Technology, 77–134. Berlin, Heidelberg: Springer Berlin Heidelberg, 2007. http://dx.doi.org/10.1007/978-3-540-37321-6_3.

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Streszczenia konferencji na temat "AFM"

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Yi, L., M. Gallagher, S. Howells, T. Chen i D. Sarid. "Combination STM/AFM and AFM Images of Magnetic Domains". W Scanned probe microscopy. AIP, 1991. http://dx.doi.org/10.1063/1.41399.

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Skládal, P., J. Přibyl, V. Horňáková, P. Gereg, Z. Fohlerová, D. Kovář i M. Pešl. "Biosensing with AFM". W The World Congress on Recent Advances in Nanotechnology. Avestia Publishing, 2016. http://dx.doi.org/10.11159/icnb16.1.

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Tian, Xiaojun, Yuechao Wang, Ning Xi, Zaili Dong i Wenjung Li. "Accurate Positioning of AFM Probe for AFM Based Robotic Nanomanipulation System". W 2006 IEEE/RSJ International Conference on Intelligent Robots and Systems. IEEE, 2006. http://dx.doi.org/10.1109/iros.2006.282317.

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Speet, Bart G., Giampiero Gerini, Samaneh Mashaghi Tabari, Hamed Sadeghian Marnani i Fabrizio Silvestri. "Metasurface enhanced AFM cantilevers". W Metamaterials, redaktorzy Allan D. Boardman, Kevin F. MacDonald i Anatoly V. Zayats. SPIE, 2018. http://dx.doi.org/10.1117/12.2307099.

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Rokhinson, L., L. Weng, L. Zhang i Y. P. Chen. "AFM Nanolithography of Graphene". W 2009 International Conference on Solid State Devices and Materials. The Japan Society of Applied Physics, 2009. http://dx.doi.org/10.7567/ssdm.2009.g-9-1.

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Takagahara, Kazuhiko, Yusuke Takei, Eiji Iwase, Kiyoshi Matsumoto i Isao Shimoyama. "Batch fabrication of carbon nanotubes at AFM probe tips and AFM imaging". W 2008 IEEE 21st International Conference on Micro Electro Mechanical Systems. IEEE, 2008. http://dx.doi.org/10.1109/memsys.2008.4443756.

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Keeren, Kathrin, Sindy Böttcher i Sabine Diedrich. "Acute Flaccid Paralysis/Myelitis (AFM/AFP) - Results from National Enterovirus Surveillance". W Abstracts of the 45th Annual Meeting of the Society for Neuropediatrics. Georg Thieme Verlag KG, 2019. http://dx.doi.org/10.1055/s-0039-1698184.

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Bartenwerfer, M., S. Fatikow, R. Tunnell, U. Mick, C. Stolle, C. Diederichs, D. Jasper i V. Eichhorn. "Towards automated AFM-based nanomanipulation in a combined nanorobotic AFM/HRSEM/FIB system". W 2011 IEEE International Conference on Mechatronics and Automation (ICMA). IEEE, 2011. http://dx.doi.org/10.1109/icma.2011.5985651.

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Promyoo, Rapeepan, Hazim El-Mounayri i Ashlie Martini. "AFM-Based Nanomachining for Nano-Fabrication Processes: MD Simulation and AFM Experimental Verification". W ASME 2010 International Manufacturing Science and Engineering Conference. ASMEDC, 2010. http://dx.doi.org/10.1115/msec2010-34115.

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Recent developments in science and engineering have advanced the fabrication techniques for micro/nanodevices. Among them, the atomic force microscope (AFM) has already been used for nanomachining and nanofabrication such as nanolithography, nanowriting and nanopatterning. This paper describes the development and validation of computational models for AFM-based nanomachining (nanoindentation and nanoscratching). The Molecular Dynamics (MD) technique is used to model and simulate mechanical indentation and scratching at the nanoscale for the case of gold. The simulation allows for the prediction of indentation forces and the friction force at the interface between an indenter and a substrate. The effect of scratching speeds on indentation force and friction coefficient is investigated. The material deformation and indentation geometry are extracted based on the final locations of the atoms, which have been displaced by the rigid tool. In addition to the modeling, an AFM was used to conduct actual indentation at the nanoscale, and provide measurements to which the MD simulation predictions can be compared. The AFM provides resolution on the nanometer (lateral) and angstrom (vertical) scales. A three-sided pyramid indenter (with a radius of curvature ∼ 25 nm) is raster scanned on top of the surface and in contact with it. It can be observed from the MD simulation results that the indentation force increases as the depth of indentation increases, but decreases as the scratching speed increases. Moreover, the friction coefficient is found to be independent of scratching speed.
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Yao, Tsung-Fu, Andrew Duenner i Michael Cullinan. "In-Line Dimensional Metrology for Nanomanufacturing Systems". W ASME 2016 11th International Manufacturing Science and Engineering Conference. American Society of Mechanical Engineers, 2016. http://dx.doi.org/10.1115/msec2016-8566.

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One of the major challenges in nanoscale manufacturing is defect control because it is difficult to measure nanoscale features in-line with the manufacturing process. Optical inspection typically is not an option at the nanoscale level due to the diffraction limit of light, and without inspection high scrap rates can occur. Therefore, this paper presents an atomic force microscopy (AFM)-based inspection system that can be rapidly implemented in-line with other nanomanufacturing processes. Atomic force microscopy is capable of producing very high resolution (sub-nm-scale) surface topology measurements and is widely utilized in scientific and industrial applications, but has not been implemented in-line with manufacturing systems, primarily because of the large setup time typically required to take an AFM measurement. In order to overcome this limitation, we have developed a single-chip-AFM-based inspection system where a wafer can be precisely and repeatably loaded into the setup and measurements can be taken in under 60 seconds. This inspection system consists of several single-chip AFMs integrated into a positioning stage to make measurements at multiple spots on a wafer at the same time. Each single-chip AFM is a MEMS device that is approximately 2 mm wide by 1 mm tall and is capable of scanning a 10 micron by 10 micron area. Thermal actuators in the MEMS device are used to do the scanning in both the x and y directions as well as to excite the z axis of the AFM so that it can be run in taping mode. Each AFM is attached to a flexure stage in the top plate of the inspection system so that the AFM can be precisely moved to the desired inspection location on the wafer. The flexure plate is coupled to the inspection plate using a kinematic coupling so that the flexure plate can be precisely located with respect to the inspection plate after each loading operation. In order to take a measurement, the flexure plate is removed from the inspection plate, a wafer is loaded into the inspection plate using an exactly constrained, passive alignment system, and the flexure plate is then placed back onto the inspection plate. This brings the AFMs back into contact with the surface that is to be measured and the AFMs can then start taking measurements without any additional alignment operations. The overall measurement procedure takes less than one minute, which is faster than most nanomanufacturing processes. This guarantees that the inspection step will not be the bottleneck in the manufacturing process.
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Raporty organizacyjne na temat "AFM"

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Brejnholt, Nicolai F. AFM report to Coastline Optic. Office of Scientific and Technical Information (OSTI), czerwiec 2015. http://dx.doi.org/10.2172/1242007.

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Baca, Ana. AFM Insitu Heating Experiment Data. Office of Scientific and Technical Information (OSTI), maj 2020. http://dx.doi.org/10.2172/1618032.

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Swinford, Richard. An AFM-SIMS Nano Tomography Acquisition System. Portland State University Library, styczeń 2000. http://dx.doi.org/10.15760/etd.5369.

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Burgens, LaTashia. The Atomic Force Microscopic (AFM) Characterization of Nanomaterials. Fort Belvoir, VA: Defense Technical Information Center, czerwiec 2009. http://dx.doi.org/10.21236/ada550815.

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Riechers, Shawn, Alan Schemer-Kohrn, Mychailo Toloczko i Danny Edwards. Nanoscale Consequences of Irradiation Investigated by RAD-AFM. Office of Scientific and Technical Information (OSTI), czerwiec 2024. http://dx.doi.org/10.2172/2373196.

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Beaux, Miles Frank, Miguel A. Santiago Cordoba, Stephen Anthony Joyce i Igor Olegovich Usov. AFM/STM Plutonium capability, research summary and future plans. Office of Scientific and Technical Information (OSTI), czerwiec 2016. http://dx.doi.org/10.2172/1259630.

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Minne, Stephen C. Micromachines for Microchips: Bringing the AFM up to Speed. Fort Belvoir, VA: Defense Technical Information Center, wrzesień 2002. http://dx.doi.org/10.21236/ada407019.

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Minne, Stephen C. Micromachines for Microchips: Bringing the AFM up to Speed. Fort Belvoir, VA: Defense Technical Information Center, marzec 2000. http://dx.doi.org/10.21236/ada375973.

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Sarid, Dror. Novel Nanostructure Fabrication and Their Characterization by STM and AFM. Fort Belvoir, VA: Defense Technical Information Center, listopad 2000. http://dx.doi.org/10.21236/ada391137.

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Althaus, C., A. Clemens i C. Orme. ORISE Internship Report - An AFM study of Zn/MnO2 Co-deposition. Office of Scientific and Technical Information (OSTI), lipiec 2023. http://dx.doi.org/10.2172/1991463.

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