Libri sul tema "Pattern recognition"
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Akata, Zeynep, Andreas Geiger e Torsten Sattler, a cura di. Pattern Recognition. Cham: Springer International Publishing, 2021. http://dx.doi.org/10.1007/978-3-030-71278-5.
Testo completoRoman-Rangel, Edgar, Ángel Fernando Kuri-Morales, José Francisco Martínez-Trinidad, Jesús Ariel Carrasco-Ochoa e José Arturo Olvera-López, a cura di. Pattern Recognition. Cham: Springer International Publishing, 2021. http://dx.doi.org/10.1007/978-3-030-77004-4.
Testo completoBauckhage, Christian, Juergen Gall e Alexander Schwing, a cura di. Pattern Recognition. Cham: Springer International Publishing, 2021. http://dx.doi.org/10.1007/978-3-030-92659-5.
Testo completoWallraven, Christian, Qingshan Liu e Hajime Nagahara, a cura di. Pattern Recognition. Cham: Springer International Publishing, 2022. http://dx.doi.org/10.1007/978-3-031-02444-3.
Testo completoWallraven, Christian, Qingshan Liu e Hajime Nagahara, a cura di. Pattern Recognition. Cham: Springer International Publishing, 2022. http://dx.doi.org/10.1007/978-3-031-02375-0.
Testo completoVergara-Villegas, Osslan Osiris, Vianey Guadalupe Cruz-Sánchez, Juan Humberto Sossa-Azuela, Jesús Ariel Carrasco-Ochoa, José Francisco Martínez-Trinidad e José Arturo Olvera-López, a cura di. Pattern Recognition. Cham: Springer International Publishing, 2022. http://dx.doi.org/10.1007/978-3-031-07750-0.
Testo completoAndres, Björn, Florian Bernard, Daniel Cremers, Simone Frintrop, Bastian Goldlücke e Ivo Ihrke, a cura di. Pattern Recognition. Cham: Springer International Publishing, 2022. http://dx.doi.org/10.1007/978-3-031-16788-1.
Testo completoTheodoridis, S. Pattern recognition. 2a ed. Amsterdam: Academic Press, 2003.
Cerca il testo completoCarrasco-Ochoa, Jesús Ariel, José Francisco Martínez-Trinidad, Joaquín Salas Rodríguez e Gabriella Sanniti di Baja, a cura di. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-38989-4.
Testo completoHamprecht, Fred A., Christoph Schnörr e Bernd Jähne, a cura di. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2007. http://dx.doi.org/10.1007/978-3-540-74936-3.
Testo completoLi, Shutao, Chenglin Liu e Yaonan Wang, a cura di. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2014. http://dx.doi.org/10.1007/978-3-662-45643-9.
Testo completoLi, Shutao, Chenglin Liu e Yaonan Wang, a cura di. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2014. http://dx.doi.org/10.1007/978-3-662-45646-0.
Testo completoCarrasco-Ochoa, Jesús Ariel, José Francisco Martínez-Trinidad e José Arturo Olvera-López, a cura di. Pattern Recognition. Cham: Springer International Publishing, 2017. http://dx.doi.org/10.1007/978-3-319-59226-8.
Testo completoPalaiahnakote, Shivakumara, Gabriella Sanniti di Baja, Liang Wang e Wei Qi Yan, a cura di. Pattern Recognition. Cham: Springer International Publishing, 2020. http://dx.doi.org/10.1007/978-3-030-41299-9.
Testo completoPalaiahnakote, Shivakumara, Gabriella Sanniti di Baja, Liang Wang e Wei Qi Yan, a cura di. Pattern Recognition. Cham: Springer International Publishing, 2020. http://dx.doi.org/10.1007/978-3-030-41404-7.
Testo completoLiu, Cheng-Lin, Changshui Zhang e Liang Wang, a cura di. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2012. http://dx.doi.org/10.1007/978-3-642-33506-8.
Testo completoKittler, J., a cura di. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 1988. http://dx.doi.org/10.1007/3-540-19036-8.
Testo completoFigueroa Mora, Karina Mariela, Juan Anzurez Marín, Jaime Cerda, Jesús Ariel Carrasco-Ochoa, José Francisco Martínez-Trinidad e José Arturo Olvera-López, a cura di. Pattern Recognition. Cham: Springer International Publishing, 2020. http://dx.doi.org/10.1007/978-3-030-49076-8.
Testo completoGoesele, Michael, Stefan Roth, Arjan Kuijper, Bernt Schiele e Konrad Schindler, a cura di. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2010. http://dx.doi.org/10.1007/978-3-642-15986-2.
Testo completoCarrasco-Ochoa, Jesús Ariel, José Francisco Martínez-Trinidad, Juan Humberto Sossa-Azuela, José Arturo Olvera López e Fazel Famili, a cura di. Pattern Recognition. Cham: Springer International Publishing, 2015. http://dx.doi.org/10.1007/978-3-319-19264-2.
Testo completoTan, Tieniu, Xuelong Li, Xilin Chen, Jie Zhou, Jian Yang e Hong Cheng, a cura di. Pattern Recognition. Singapore: Springer Singapore, 2016. http://dx.doi.org/10.1007/978-981-10-3002-4.
Testo completoTan, Tieniu, Xuelong Li, Xilin Chen, Jie Zhou, Jian Yang e Hong Cheng, a cura di. Pattern Recognition. Singapore: Springer Singapore, 2016. http://dx.doi.org/10.1007/978-981-10-3005-5.
Testo completoMurty, M. Narasimha, e V. Susheela Devi. Pattern Recognition. London: Springer London, 2011. http://dx.doi.org/10.1007/978-0-85729-495-1.
Testo completoFink, Gernot A., Simone Frintrop e Xiaoyi Jiang, a cura di. Pattern Recognition. Cham: Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-33676-9.
Testo completoWeickert, Joachim, Matthias Hein e Bernt Schiele, a cura di. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-40602-7.
Testo completoCree, Michael, Fay Huang, Junsong Yuan e Wei Qi Yan, a cura di. Pattern Recognition. Singapore: Springer Singapore, 2020. http://dx.doi.org/10.1007/978-981-15-3651-9.
Testo completoRigoll, Gerhard, a cura di. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2008. http://dx.doi.org/10.1007/978-3-540-69321-5.
Testo completoKropatsch, Walter G., Robert Sablatnig e Allan Hanbury, a cura di. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2005. http://dx.doi.org/10.1007/11550518.
Testo completoDenzler, Joachim, Gunther Notni e Herbert Süße, a cura di. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2009. http://dx.doi.org/10.1007/978-3-642-03798-6.
Testo completoVan Gool, Luc, a cura di. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2002. http://dx.doi.org/10.1007/3-540-45783-6.
Testo completoRadig, Bernd, e Stefan Florczyk, a cura di. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2001. http://dx.doi.org/10.1007/3-540-45404-7.
Testo completoMester, Rudolf, e Michael Felsberg, a cura di. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2011. http://dx.doi.org/10.1007/978-3-642-23123-0.
Testo completoRoth, Volker, e Thomas Vetter, a cura di. Pattern Recognition. Cham: Springer International Publishing, 2017. http://dx.doi.org/10.1007/978-3-319-66709-6.
Testo completoMartínez-Trinidad, José Francisco, Jesús Ariel Carrasco-Ochoa, José Arturo Olvera-Lopez, Joaquín Salas-Rodríguez e Ching Y. Suen, a cura di. Pattern Recognition. Cham: Springer International Publishing, 2014. http://dx.doi.org/10.1007/978-3-319-07491-7.
Testo completoGall, Juergen, Peter Gehler e Bastian Leibe, a cura di. Pattern Recognition. Cham: Springer International Publishing, 2015. http://dx.doi.org/10.1007/978-3-319-24947-6.
Testo completoMartínez-Trinidad, José Francisco, Jesús Ariel Carrasco-Ochoa, Cherif Ben-Youssef Brants e Edwin Robert Hancock, a cura di. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2011. http://dx.doi.org/10.1007/978-3-642-21587-2.
Testo completoJiang, Xiaoyi, Joachim Hornegger e Reinhard Koch, a cura di. Pattern Recognition. Cham: Springer International Publishing, 2014. http://dx.doi.org/10.1007/978-3-319-11752-2.
Testo completoMarques de Sá, Joaquim P. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2001. http://dx.doi.org/10.1007/978-3-642-56651-6.
Testo completoMartínez-Trinidad, José Francisco, Jesús Ariel Carrasco-Ochoa, José Arturo Olvera-López e Sudeep Sarkar, a cura di. Pattern Recognition. Cham: Springer International Publishing, 2018. http://dx.doi.org/10.1007/978-3-319-92198-3.
Testo completoPinz, Axel, Thomas Pock, Horst Bischof e Franz Leberl, a cura di. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2012. http://dx.doi.org/10.1007/978-3-642-32717-9.
Testo completoFranke, Katrin, Klaus-Robert Müller, Bertram Nickolay e Ralf Schäfer, a cura di. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2006. http://dx.doi.org/10.1007/11861898.
Testo completoMartínez-Trinidad, José Francisco, Jesús Ariel Carrasco-Ochoa, Victor Ayala Ramirez, José Arturo Olvera-López e Xiaoyi Jiang, a cura di. Pattern Recognition. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-39393-3.
Testo completoMichaelis, Bernd, e Gerald Krell, a cura di. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2003. http://dx.doi.org/10.1007/b12010.
Testo completoRasmussen, Carl Edward, Heinrich H. Bülthoff, Bernhard Schölkopf e Martin A. Giese, a cura di. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2004. http://dx.doi.org/10.1007/b99676.
Testo completoHomenda, Władysław, e Witold Pedrycz. Pattern Recognition. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2018. http://dx.doi.org/10.1002/9781119302872.
Testo completoBrox, Thomas, Andrés Bruhn e Mario Fritz, a cura di. Pattern Recognition. Cham: Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-12939-2.
Testo completoCarrasco-Ochoa, Jesús Ariel, José Francisco Martínez-Trinidad, José Arturo Olvera López e Kim L. Boyer, a cura di. Pattern Recognition. Berlin, Heidelberg: Springer Berlin Heidelberg, 2012. http://dx.doi.org/10.1007/978-3-642-31149-9.
Testo completoRosenhahn, Bodo, e Bjoern Andres, a cura di. Pattern Recognition. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-45886-1.
Testo completoCarrasco-Ochoa, Jesús Ariel, José Francisco Martínez-Trinidad, José Arturo Olvera-López e Joaquín Salas, a cura di. Pattern Recognition. Cham: Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-21077-9.
Testo completoGibson, William. Pattern recognition. London: Viking, 2003.
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