Libri sul tema "Metrology of electromagnetism"
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G, Bradford Ann, e National Institute of Standards and Technology (U.S.), a cura di. Metrology for electromagnetic technology: A bibliography of NIST publications. Washington, DC: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.
International Symposium on Electromagnetic Metrology (1989 Beijing, China). Electromagnetic metrology: Proceedings of International Symposium on Electromagnetic Metrology, ISEM '89, August 19-22, 1989, Beijing, China. Beijing: International Academic Publishers, 1989.
Motohisa, Kanda, e United States. National Bureau of Standards, a cura di. Electromagnetic compatibility and interference metrology: M.T. Ma, M. Kanda. Gaithersburg, Md: National Bureau of Standards, 1986.
E, DeWeese Mary, e National Institute of Standards and Technology (U.S.), a cura di. Metrology for electromagnetic technology: A bibliography of NIST publications. Boulder, Colo: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.
E, Bailey A., e International Union of Radio Science., a cura di. URSI register of national standards laboratories for electromagnetic metrology. Bristol: A. Hilger, 1990.
E, DeWeese Mary, e United States. National Bureau of Standards, a cura di. Metrology for electromagnetic technology: A bibliography of NBS publications. Boulder, Colo: U.S. Dept. of Commerce, National Bureau of Standards, 1988.
M, Butler Chalmers, e National Institute of Standards and Technology (U.S.), a cura di. EMI/EMC metrology challenges for industry: A workshop on measurements, standards, calibrations, and accreditation. Boulder, Colo: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.
National Institute of Standards and Technology (U.S.), a cura di. METROLOGY FOR ELECTROMAGNETIC TECHNOLOGY: A BIBLIOGRAPHY OF NIST PUBLICATIONS... NIST 5064 ... U.S. DEPARTMENT OF COMMERCE... 1997. [S.l: s.n., 1998.
Electromagnetic compatibility and interference metrology. Gaithersburg, Md: National Bureau of Standards, 1986.
Beijing, China) International Symposium on Electromagnetic Metrology (1989 :. Electromagnetic Metrology: Proceedings of International Symposium on Electromagnetic Metrology, Isem '89, August 19-22, 1989 Beijing, China. International Academic Publishers, 1990.
Beijing, China) International Symposium on Electromagnetic Metrology (1989 :. Electromagnetic Metrology: Proceedings of International Symposium on Electromagnetic Metrology, Isem '89, August 19-22, 1989 Beijing, China. International Academic Publishers, 1990.
Metrology for electromagnetic technology: A bibliography of NIST publications. Boulder, Colo: U.S. Dept. of Commerce, National Institute of Standards, 1989.
Metrology for electromagnetic technology: A bibliography of NBS publications. [Washington, D.C.]: U.S. Dept. of Commerce, National Bureau of Standards, 1987.
Buchwald, Jed Z., e Robert Fox, a cura di. The Oxford Handbook of the History of Physics. Oxford University Press, 2017. http://dx.doi.org/10.1093/oxfordhb/9780199696253.001.0001.
Hami, Abdelkhalak El, Philippe Pougnet e Pierre-Richard Dahoo. Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties. Wiley & Sons, Incorporated, John, 2021.
Hami, Abdelkhalak El, Philippe Pougnet e Pierre-Richard Dahoo. Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties. Wiley & Sons, Incorporated, John, 2021.
Hami, Abdelkhalak El, Philippe Pougnet e Pierre-Richard Dahoo. Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties. Wiley & Sons, Incorporated, John, 2021.
Hami, Abdelkhalak El, Philippe Pougnet e Pierre-Richard Dahoo. Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties. Wiley & Sons, Incorporated, John, 2021.