Articoli di riviste sul tema "Metrologie augmentée"
Cita una fonte nei formati APA, MLA, Chicago, Harvard e in molti altri stili
Vedi i top-29 articoli di riviste per l'attività di ricerca sul tema "Metrologie augmentée".
Accanto a ogni fonte nell'elenco di riferimenti c'è un pulsante "Aggiungi alla bibliografia". Premilo e genereremo automaticamente la citazione bibliografica dell'opera scelta nello stile citazionale di cui hai bisogno: APA, MLA, Harvard, Chicago, Vancouver ecc.
Puoi anche scaricare il testo completo della pubblicazione scientifica nel formato .pdf e leggere online l'abstract (il sommario) dell'opera se è presente nei metadati.
Vedi gli articoli di riviste di molte aree scientifiche e compila una bibliografia corretta.
Poon, Ting-Chung, Yaping Zhang, Liangcai Cao e Hiroshi Yoshikawa. "Editorial on Special Issue “Holography, 3-D Imaging and 3-D Display”". Applied Sciences 10, n. 20 (11 ottobre 2020): 7057. http://dx.doi.org/10.3390/app10207057.
Testo completoSiv, Julie, Rafael Mayer, Guillaume Beaugrand, Guillaume Tison, Rémy Juvénal e Guillaume Dovillaire. "Testing and characterization of challenging optics and optical systems with Shack Hartmann wavefront sensors". EPJ Web of Conferences 215 (2019): 06003. http://dx.doi.org/10.1051/epjconf/201921506003.
Testo completoYoung, Woo Han, e Mike Marshall. "IMPROVE CONTROL AMIDST DIE SHRINKAGE AND 3D PACKAGE COMPLICATION". International Symposium on Microelectronics 2019, n. 1 (1 ottobre 2019): 000260–67. http://dx.doi.org/10.4071/2380-4505-2019.1.000260.
Testo completoKerst, Thomas, Mohammad Bitarafan, Laura Jokinen, Ilkka Alasaarela, Seppo Tillanen, David Zautasvili e Nikhil Pachhandara. "82‐3: Rapid AR/VR Device Eye‐Box Measurement Using a Wide‐FOV Lens". SID Symposium Digest of Technical Papers 54, n. 1 (giugno 2023): 1155–57. http://dx.doi.org/10.1002/sdtp.16779.
Testo completoShiue, Ren-Jye, Dmitri K. Efetov, Gabriele Grosso, Cheng Peng, Kin Chung Fong e Dirk Englund. "Active 2D materials for on-chip nanophotonics and quantum optics". Nanophotonics 6, n. 6 (15 marzo 2017): 1329–42. http://dx.doi.org/10.1515/nanoph-2016-0172.
Testo completoNawab, Rahma, e Angela Davies Allen. "Low-Cost AR-Based Dimensional Metrology for Assembly". Machines 10, n. 4 (30 marzo 2022): 243. http://dx.doi.org/10.3390/machines10040243.
Testo completoArpaia, Pasquale, Egidio De Benedetto, Concetta Anna Dodaro, Luigi Duraccio e Giuseppe Servillo. "Metrology-Based Design of a Wearable Augmented Reality System for Monitoring Patient’s Vitals in Real Time". IEEE Sensors Journal 21, n. 9 (1 maggio 2021): 11176–83. http://dx.doi.org/10.1109/jsen.2021.3059636.
Testo completoGonçalves, GL, JU Delgado e FB Razuck. "The use of Augmented Reality for the teaching of dosimetry and metrology of ionizing radiation at IRD". Journal of Physics: Conference Series 1826, n. 1 (1 marzo 2021): 012041. http://dx.doi.org/10.1088/1742-6596/1826/1/012041.
Testo completoHo, P. T., J. A. Albajez, J. A. Yagüe e J. Santolaria. "Preliminary study of Augmented Reality based manufacturing for further integration of Quality Control 4.0 supported by metrology". IOP Conference Series: Materials Science and Engineering 1193, n. 1 (1 ottobre 2021): 012105. http://dx.doi.org/10.1088/1757-899x/1193/1/012105.
Testo completoPrusakov, A. N., V. V. Popadyev e V. F. Pankin. "The Working Week of the International Federation of Surveyors under the motto “From digitalization to augmented reality”". Geodesy and Cartography 926, n. 8 (20 settembre 2017): 25–38. http://dx.doi.org/10.22389/0016-7126-2017-926-8-25-38.
Testo completoZhao, Lei, e Chaohao Wang. "50.2: Invited Paper: A Closer Look: Advancements in Near‐Eye Display Testing and Metrology". SID Symposium Digest of Technical Papers 54, S1 (aprile 2023): 354–60. http://dx.doi.org/10.1002/sdtp.16303.
Testo completoVicentini, Edoardo, Zhenhai Wang, Kasper Van Gasse, Theodor W. Hänsch e Nathalie Picqué. "Dual-comb hyperspectral digital holography". Nature Photonics 15, n. 12 (22 novembre 2021): 890–94. http://dx.doi.org/10.1038/s41566-021-00892-x.
Testo completoHo, Phuong Thao, José Antonio Albajez, Jorge Santolaria e José A. Yagüe-Fabra. "Study of Augmented Reality Based Manufacturing for Further Integration of Quality Control 4.0: A Systematic Literature Review". Applied Sciences 12, n. 4 (13 febbraio 2022): 1961. http://dx.doi.org/10.3390/app12041961.
Testo completoĆirić, Ivan, Milan Banić, Miloš Simonović, Aleksandar Miltenović, Dušan Stamenković e Vlastimir Nikolić. "TOWARDS MACHINE VISION BASED RAILWAY ASSETS PREDICTIVE MAINTENANCE". Facta Universitatis, Series: Automatic Control and Robotics 19, n. 2 (8 dicembre 2020): 125. http://dx.doi.org/10.22190/fuacr2002125c.
Testo completoFisher, William P. "Bateson and Wright on Number and Quantity: How to Not Separate Thinking from Its Relational Context". Symmetry 13, n. 8 (3 agosto 2021): 1415. http://dx.doi.org/10.3390/sym13081415.
Testo completoAbbasi, W. A., S. C. Ridgeway, P. D. Adsit, C. D. Crane e J. Duffy. "Investigation of a Special 6-6 Parallel Platform for Contour Milling". Journal of Manufacturing Science and Engineering 122, n. 1 (1 gennaio 1998): 132–39. http://dx.doi.org/10.1115/1.538927.
Testo completoGarcia-González, Wendy, Wendy Flores-Fuentes, Oleg Sergiyenko, Julio C. Rodríguez-Quiñonez, Jesús E. Miranda-Vega e Daniel Hernández-Balbuena. "Shannon Entropy Used for Feature Extractions of Optical Patterns in the Context of Structural Health Monitoring". Entropy 25, n. 8 (14 agosto 2023): 1207. http://dx.doi.org/10.3390/e25081207.
Testo completoLemesle, Julie, Clement Moreau, Raphael Deltombe, François Blateyron, Joseph Martin, Maxence Bigerelle e Christopher A. Brown. "Top-down Determination of Fluctuations in Topographic Measurements". Materials 16, n. 2 (4 gennaio 2023): 473. http://dx.doi.org/10.3390/ma16020473.
Testo completoAnderson, Stephen A. "Innovative digital inspection methodology". APPEA Journal 60, n. 1 (2020): 77. http://dx.doi.org/10.1071/aj19109.
Testo completoSalido-Monzú, D., e A. Wieser. "AN INSTRUMENTAL BASIS FOR MULTISPECTRAL LIDAR WITH SPECTRALLY-RESOLVED DISTANCE MEASUREMENTS". ISPRS - International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences XLII-2/W13 (5 giugno 2019): 1121–26. http://dx.doi.org/10.5194/isprs-archives-xlii-2-w13-1121-2019.
Testo completoLee, Dong Hun, Yuxuan Zhang, Kwangsoo No, Han Wook Song e Sunghwan Lee. "(Digital Presentation) Multimodal Encapsulation of p-SnOx to Engineer the Carrier Density for Thin Film Transistor Applications". ECS Meeting Abstracts MA2022-02, n. 15 (9 ottobre 2022): 821. http://dx.doi.org/10.1149/ma2022-0215821mtgabs.
Testo completoBooth, James C., Nathan Orloff, Christian Long, Aaron Hagerstrom, Angela Stelson, Nicholas Jungwirth e Luckshitha Suriyasena Liyanage. "(Invited, Digital Presentation) Nonlinear and Electro-Thermo-Mechanical Effects in Heterogeneous Electronics at Microwave Frequencies". ECS Meeting Abstracts MA2022-02, n. 17 (9 ottobre 2022): 862. http://dx.doi.org/10.1149/ma2022-0217862mtgabs.
Testo completoEngel, Thomas. "3D-optical measurement techniques". Measurement Science and Technology, 2 dicembre 2022. http://dx.doi.org/10.1088/1361-6501/aca818.
Testo completoZhang, Wen-Hao, Jing-Wei Yu, Wule Zhu e Bing-Feng Ju. "Unified framework for geometric error compensation and shape-adaptive scanning in five-axis metrology systems". Measurement Science and Technology, 16 maggio 2024. http://dx.doi.org/10.1088/1361-6501/ad4c83.
Testo completoNguyen, Vinh, Xiaofeng Liu e Jeremy Marvel. "Augmented Reality Interface for Robot-Sensor Coordinate Registration". Journal of Computing and Information Science in Engineering, 8 agosto 2023, 1–7. http://dx.doi.org/10.1115/1.4063131.
Testo completoSchen, Michael A., G. T. Davis, F. I. Mopsik, W. L. Wu, W. E. Wallace, Jr Manning, C. A. Handwerker e D. T. Read. "Electronics Packaging Materials Research at NIST". MRS Proceedings 390 (1995). http://dx.doi.org/10.1557/proc-390-19.
Testo completoTóbiás, Roland, Tibor Furtenbacher, Irén Simkó, Attila G. Császár, Meissa L. Diouf, Frank M. J. Cozijn, Joey M. A. Staa, Edcel J. Salumbides e Wim Ubachs. "Spectroscopic-network-assisted precision spectroscopy and its application to water". Nature Communications 11, n. 1 (6 aprile 2020). http://dx.doi.org/10.1038/s41467-020-15430-6.
Testo completoMurray, Myles P., Laura S. Bruckman e Roger H. French. "Durability of Materials in a Stress-Response Framework: Acrylic Materials for Photovoltaic Systems". MRS Proceedings 1391 (2012). http://dx.doi.org/10.1557/opl.2012.1241.
Testo completoJuethner, Konrad, Ted Rose, Senthil Kumar, Jianming Cao, Gregory Savela, Chris J. Zuck e Parag Mathuria. "Finite Element Analysis of Bent Rotors". Journal of Engineering for Gas Turbines and Power, 2 settembre 2022. http://dx.doi.org/10.1115/1.4055452.
Testo completo