Letteratura scientifica selezionata sul tema "Metal oxide semiconductors"
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Articoli di riviste sul tema "Metal oxide semiconductors"
Jeon, Yunchae, Donghyun Lee e Hocheon Yoo. "Recent Advances in Metal-Oxide Thin-Film Transistors: Flexible/Stretchable Devices, Integrated Circuits, Biosensors, and Neuromorphic Applications". Coatings 12, n. 2 (4 febbraio 2022): 204. http://dx.doi.org/10.3390/coatings12020204.
Testo completoPandit, Bhishma, e Jaehee Cho. "AlGaN Ultraviolet Metal–Semiconductor–Metal Photodetectors with Reduced Graphene Oxide Contacts". Applied Sciences 8, n. 11 (1 novembre 2018): 2098. http://dx.doi.org/10.3390/app8112098.
Testo completoDíaz, Carlos, Marjorie Segovia e Maria Luisa Valenzuela. "Solid State Nanostructured Metal Oxides as Photocatalysts and Their Application in Pollutant Degradation: A Review". Photochem 2, n. 3 (5 agosto 2022): 609–27. http://dx.doi.org/10.3390/photochem2030041.
Testo completoRobertson, John, e Zhaofu Zhang. "Doping limits in p-type oxide semiconductors". MRS Bulletin 46, n. 11 (novembre 2021): 1037–43. http://dx.doi.org/10.1557/s43577-021-00211-3.
Testo completoMatsumoto, Y., H. Koinuma, T. Hasegawa, I. Takeuchi, F. Tsui e Young K. Yoo. "Combinatorial Investigation of Spintronic Materials". MRS Bulletin 28, n. 10 (ottobre 2003): 734–39. http://dx.doi.org/10.1557/mrs2003.215.
Testo completoKim, Jungho, e Jiwan Kim. "Synthesis of NiO for various optoelectronic applications". Ceramist 25, n. 3 (30 settembre 2022): 320–31. http://dx.doi.org/10.31613/ceramist.2022.25.3.02.
Testo completoAdhikari, Sangeeta, e Debasish Sarkar. "Metal oxide semiconductors for dye degradation". Materials Research Bulletin 72 (dicembre 2015): 220–28. http://dx.doi.org/10.1016/j.materresbull.2015.08.009.
Testo completoSosa Lissarrague, Matías H., Sameer Alshehri, Abdullah Alsalhi, Verónica L. Lassalle e Ignacio López Corral. "Heavy Metal Removal from Aqueous Effluents by TiO2 and ZnO Nanomaterials". Adsorption Science & Technology 2023 (24 gennaio 2023): 1–15. http://dx.doi.org/10.1155/2023/2728305.
Testo completoYe, Heqing, Hyeok-Jin Kwon, Xiaowu Tang, Dong Yun Lee, Sooji Nam e Se Hyun Kim. "Direct Patterned Zinc-Tin-Oxide for Solution-Processed Thin-Film Transistors and Complementary Inverter through Electrohydrodynamic Jet Printing". Nanomaterials 10, n. 7 (3 luglio 2020): 1304. http://dx.doi.org/10.3390/nano10071304.
Testo completoGarcia-Peiro, Jose I., Javier Bonet-Aleta, Carlos J. Bueno-Alejo e Jose L. Hueso. "Recent Advances in the Design and Photocatalytic Enhanced Performance of Gold Plasmonic Nanostructures Decorated with Non-Titania Based Semiconductor Hetero-Nanoarchitectures". Catalysts 10, n. 12 (14 dicembre 2020): 1459. http://dx.doi.org/10.3390/catal10121459.
Testo completoTesi sul tema "Metal oxide semiconductors"
Peleckis, Germanas. "Studies on diluted oxide magnetic semiconductors for spin electronic applications". Access electronically, 2006. http://www.library.uow.edu.au/adt-NWU/public/adt-NWU20070821.145447/index.html.
Testo completoWu, Kehuey. "Strain effects on the valence band of silicon piezoresistance in p-type silicon and mobility enhancement in strained silicon pMOSFET /". [Gainesville, Fla.] : University of Florida, 2005. http://purl.fcla.edu/fcla/etd/UFE0008390.
Testo completoAl-Ahmadi, Ahmad Aziz. "Complementary orthogonal stacked metal oxide semiconductor a novel nanoscale complementary metal oxide semiconductor architecture /". Ohio : Ohio University, 2006. http://www.ohiolink.edu/etd/view.cgi?ohiou1147134449.
Testo completoLiu, Kou-chen. "Si1-xGex/Si vertical MOSFETs and sidewall strained Si devices : design and fabrication /". Digital version accessible at:, 1999. http://wwwlib.umi.com/cr/utexas/main.
Testo completoHöhr, Timm. "Quantum-mechanical modeling of transport parameters for MOS devices /". Konstanz : Hartnung-Gorre, 2006. http://www.loc.gov/catdir/toc/fy0707/2007358987.html.
Testo completoSummary in German and English, text in English. Includes bibliographical references (p. 123-132).
Gurcan, Zeki B. "0.18 [mu]m high performance CMOS process optimization for manufacturability /". Online version of thesis, 2005. http://hdl.handle.net/1850/5197.
Testo completoWu, Ting. "Design of terabits/s CMOS crossbar switch chip /". View Abstract or Full-Text, 2003. http://library.ust.hk/cgi/db/thesis.pl?ELEC%202003%20WU.
Testo completoIncludes bibliographical references (leaves 100-105). Also available in electronic version. Access restricted to campus users.
Wu, Xu Sheng. "Three dimensional multi-gates devices and circuits fabrication, characterization, and modeling /". View abstract or full-text, 2005. http://library.ust.hk/cgi/db/thesis.pl?ELEC%202005%20WUX.
Testo completoModzelewski, Kenneth Paul. "DC parameter extraction technique for independent double gate MOSFETs a thesis presented to the faculty of the Graduate School, Tennessee Technological University /". Click to access online, 2009. http://proquest.umi.com/pqdweb?index=11&did=1759989211&SrchMode=1&sid=1&Fmt=6&VInst=PROD&VType=PQD&RQT=309&VName=PQD&TS=1250600320&clientId=28564.
Testo completoTrivedi, Vishal P. "Physics and design of nonclassical nanoscale CMOS devices with ultra-thin bodies". [Gainesville, Fla.] : University of Florida, 2005. http://purl.fcla.edu/fcla/etd/UFE0009860.
Testo completoLibri sul tema "Metal oxide semiconductors"
Nicollian, E. H. MOS (metal oxide semiconductor) physics and technology. Hoboken, N.J: Wiley-Interscience, 2003.
Cerca il testo completoSato, Norio. Electrochemistry at metal and semiconductor electrodes. Amsterdam: Elsevier, 1998.
Cerca il testo completoZhao, Yi. Wafer level reliability of advanced CMOS devices and processes. New York: Nova Science Publishers, 2008.
Cerca il testo completoLancaster, Don. CMOS cookbook. 2a ed. Indianapolis, Ind: H.W. Sams, 1988.
Cerca il testo completoLancaster, Don. CMOS cookbook. 2a ed. Boston: Newnes, 1997.
Cerca il testo completoPfaffli, Paul. Characterisation of degradation and failure phenomena in MOS devices. Konstanz [Germany]: Hartung-Gorre, 1999.
Cerca il testo completoShoji, Masakazu. CMOS digital circuit technology. Englewood Cliffs, N.J: Prentice Hall, 1988.
Cerca il testo completoSegura, Jaume. CMOS electronics: How it works, how it fails. New York: IEEE Press, 2004.
Cerca il testo completoKwon, Min-jun. CMOS technology. Hauppauge, N.Y: Nova Science Publishers, 2010.
Cerca il testo completoHelms, Harry L. High-speed (HC/HCT) CMOS guide. Englewood Cliffs, N.J: Prentice Hall, 1989.
Cerca il testo completoCapitoli di libri sul tema "Metal oxide semiconductors"
Hussain, Aftab M. "Metal Oxide Semiconductors". In Introduction to Flexible Electronics, 81–94. Boca Raton: CRC Press, 2021. http://dx.doi.org/10.1201/9781003010715-8.
Testo completoJanotti, A., J. B. Varley, J. L. Lyons e C. G. Van de Walle. "Controlling the Conductivity in Oxide Semiconductors". In Functional Metal Oxide Nanostructures, 23–35. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-9931-3_2.
Testo completoBaratto, Camilla, Elisabetta Comini, Guido Faglia, Matteo Ferroni, Andrea Ponzoni, Alberto Vomiero e Giorgio Sberveglieri. "Transparent Metal Oxide Semiconductors as Gas Sensors". In Transparent Electronics, 417–42. Chichester, UK: John Wiley & Sons, Ltd, 2010. http://dx.doi.org/10.1002/9780470710609.ch17.
Testo completoFukumura, Tomoteru, e Masashi Kawasaki. "Magnetic Oxide Semiconductors: On the High-Temperature Ferromagnetism in TiO2- and ZnO-Based Compounds". In Functional Metal Oxides, 89–131. Weinheim, Germany: Wiley-VCH Verlag GmbH & Co. KGaA, 2013. http://dx.doi.org/10.1002/9783527654864.ch3.
Testo completoSwapnalin, Jhilmil, Prasun Banerjee, Chetana Sabbanahalli, Dinesh Rangappa, Kiran Kumar Kondamareddy e Dharmapura H. K. Murthy. "Computational Techniques on Optical Properties of Metal-Oxide Semiconductors". In Optical Properties and Applications of Semiconductors, 155–66. Boca Raton: CRC Press, 2022. http://dx.doi.org/10.1201/9781003188582-10.
Testo completoJongh, L. J. "Superconductivity by Local Pairs (Bipolarons) in Doped Metal Oxide Semiconductors". In Mixed Valency Systems: Applications in Chemistry, Physics and Biology, 223–46. Dordrecht: Springer Netherlands, 1991. http://dx.doi.org/10.1007/978-94-011-3606-8_13.
Testo completoAmeen, Sadia, M. Shaheer Akhtar, Hyung-Kee Seo e Hyung Shik Shin. "Metal Oxide Semiconductors and their Nanocomposites Application Towards Photovoltaic and Photocatalytic". In Advanced Energy Materials, 105–66. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2014. http://dx.doi.org/10.1002/9781118904923.ch3.
Testo completoHartnagel, H. L., e V. P. Sirkeli. "The Use of Metal Oxide Semiconductors for THz Spectroscopy of Biological Applications". In IFMBE Proceedings, 213–17. Cham: Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-31866-6_43.
Testo completoKörösi, L., K. Mogyorósi, R. Kun, J. Németh e I. Dékány. "Preparation and photooxidation properties of metal oxide semiconductors incorporated in layer silicates". In From Colloids to Nanotechnology, 27–33. Berlin, Heidelberg: Springer Berlin Heidelberg, 2004. http://dx.doi.org/10.1007/978-3-540-45119-8_5.
Testo completoWeik, Martin H. "metal-oxide semiconductor". In Computer Science and Communications Dictionary, 1009. Boston, MA: Springer US, 2000. http://dx.doi.org/10.1007/1-4020-0613-6_11446.
Testo completoAtti di convegni sul tema "Metal oxide semiconductors"
Seo, Young-Ho, Seung-Woo Do, Yong-Hyun Lee, Jae-Sung Lee, Jisoon Ihm e Hyeonsik Cheong. "Deuterium Process to Improve Gate Oxide Integrity in Metal-Oxide-Silicon (MOS) Structure". In PHYSICS OF SEMICONDUCTORS: 30th International Conference on the Physics of Semiconductors. AIP, 2011. http://dx.doi.org/10.1063/1.3666696.
Testo completoSatsangi, Vibha R. "Metal oxide semiconductors in PEC splitting of water". In Solar Energy + Applications, a cura di Jinghua Guo. SPIE, 2007. http://dx.doi.org/10.1117/12.734795.
Testo completoLee, Dong Uk, Seon Pil Kim, Hyo Jun Lee, Dong Seok Han, Eun Kyu Kim, Hee-Wook You, Won-Ju Cho, Young-Ho Kim, Jisoon Ihm e Hyeonsik Cheong. "Study on transparent and flexible memory with metal-oxide nanocrystals". In PHYSICS OF SEMICONDUCTORS: 30th International Conference on the Physics of Semiconductors. AIP, 2011. http://dx.doi.org/10.1063/1.3666652.
Testo completoTristiantoro, Roby, Andani Achmad e Syafaruddin. "System of Breath Analyzer based on Metal-Oxide Semiconductors". In 2022 6th International Conference on Information Technology, Information Systems and Electrical Engineering (ICITISEE). IEEE, 2022. http://dx.doi.org/10.1109/icitisee57756.2022.10057693.
Testo completoBalakumar, S., e R. Ajay Rakkesh. "Core/shell nano-structuring of metal oxide semiconductors and their photocatalytic studies". In SOLID STATE PHYSICS: PROCEEDINGS OF THE 57TH DAE SOLID STATE PHYSICS SYMPOSIUM 2012. AIP, 2013. http://dx.doi.org/10.1063/1.4790898.
Testo completoNg, A., X. Liu, Y. C. Sun, A. B. Djurišić, A. M. C. Ng e W. K. Chan. "Effect of electron collecting metal oxide layer in normal and inverted structure polymer solar cells". In THE PHYSICS OF SEMICONDUCTORS: Proceedings of the 31st International Conference on the Physics of Semiconductors (ICPS) 2012. AIP, 2013. http://dx.doi.org/10.1063/1.4848343.
Testo completoOsseily, Hassan Amine, e Ali Massoud Haidar. "Octal to binary conversion using multi-input floating gate complementary metal oxide semiconductors". In 2011 10th International Symposium on Signals, Circuits and Systems (ISSCS). IEEE, 2011. http://dx.doi.org/10.1109/isscs.2011.5978644.
Testo completoZhang, Rui, Linsen Bie, Tze-Ching Fung, Eric Kai-Hsiang Yu, Chumin Zhao e Jerzy Kanicki. "High performance amorphous metal-oxide semiconductors thin-film passive and active pixel sensors". In 2013 IEEE International Electron Devices Meeting (IEDM). IEEE, 2013. http://dx.doi.org/10.1109/iedm.2013.6724703.
Testo completoOsseily, Hassan Amine, e Ali Massoud Haidar. "Hexadecimal to binary conversion using multi-input floating gate complementary metal oxide semiconductors". In 2015 International Conference on Applied Research in Computer Science and Engineering (ICAR). IEEE, 2015. http://dx.doi.org/10.1109/arcse.2015.7338134.
Testo completoZhang, Yuqing, Zhihe Xia, Jiapeng Li, Yang Shao, Sisi Wang, Lei Lu, Shengdong Zhang, Hoi-Sing Kwok e Man Wong. "Systematic Defect Manipulation in Metal Oxide Semiconductors towards High-Performance Thin-Film Transistors". In 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM). IEEE, 2020. http://dx.doi.org/10.1109/edtm47692.2020.9117958.
Testo completoRapporti di organizzazioni sul tema "Metal oxide semiconductors"
Bryant, R. E. Two Papers on a Symbolic Analyzer for MOS (Metal-Oxide Semiconductors) Circuits. Fort Belvoir, VA: Defense Technical Information Center, dicembre 1987. http://dx.doi.org/10.21236/ada188617.
Testo completoHane, G. J., M. Yorozu, T. Sogabe e S. Suzuki. Long-term research in Japan: amorphous metals, metal oxide varistors, high-power semiconductors and superconducting generators. Office of Scientific and Technical Information (OSTI), aprile 1985. http://dx.doi.org/10.2172/5621417.
Testo completoWang, Wei. Complimentary Metal Oxide Semiconductor (CMOS)-Memristor Hybrid Nanoelectronics. Fort Belvoir, VA: Defense Technical Information Center, giugno 2011. http://dx.doi.org/10.21236/ada544310.
Testo completoLudeke, R. Spatially Resolved Transport Studies and Microscopy of Ultrathin Metal-Oxide-Semiconductor Structures. Fort Belvoir, VA: Defense Technical Information Center, agosto 1997. http://dx.doi.org/10.21236/ada329531.
Testo completoGriffin, Timothy E. Pulsed Capacitance Measurement of Silicon Carbide (SiC) Schottky Diode and SiC Metal Oxide Semiconductor. Fort Belvoir, VA: Defense Technical Information Center, novembre 2006. http://dx.doi.org/10.21236/ada458317.
Testo completoLee, Timothy C., e Robert M. Proie. A Subthreshold Digital Library Using a Dynamic-Threshold Metal-Oxide Semiconductor (DTMOS) and Transmission Gate Logic. Fort Belvoir, VA: Defense Technical Information Center, settembre 2014. http://dx.doi.org/10.21236/ada608589.
Testo completoXu, Yang. A 94GHz Temperature Compensated Low Noise Amplifier in 45nm Silicon-on-Insulator Complementary Metal-Oxide Semiconductor (SOI CMOS). Fort Belvoir, VA: Defense Technical Information Center, gennaio 2014. http://dx.doi.org/10.21236/ada596171.
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