Articoli di riviste sul tema "Linear integrated circuits"
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Silva, M. M. "Linear integrated circuits". Proceedings of the IEEE 73, n. 8 (1985): 1340. http://dx.doi.org/10.1109/proc.1985.13290.
Testo completoBARNABY, H. J. "TOTAL DOSE EFFECTS IN LINEAR BIPOLAR INTEGRATED CIRCUITS". International Journal of High Speed Electronics and Systems 14, n. 02 (giugno 2004): 519–41. http://dx.doi.org/10.1142/s0129156404002491.
Testo completoRax, B. G., A. H. Johnston e C. I. Lee. "Proton damage effects in linear integrated circuits". IEEE Transactions on Nuclear Science 45, n. 6 (1998): 2632–37. http://dx.doi.org/10.1109/23.736507.
Testo completoRax, B. G., A. H. Johnston e T. Miyahira. "Displacement damage in bipolar linear integrated circuits". IEEE Transactions on Nuclear Science 46, n. 6 (1999): 1660–65. http://dx.doi.org/10.1109/23.819135.
Testo completoJantos, P., D. Grzechca e J. Rutkowski. "Evolutionary algorithms for global parametric fault diagnosis in analogue integrated circuits". Bulletin of the Polish Academy of Sciences: Technical Sciences 60, n. 1 (1 marzo 2012): 133–42. http://dx.doi.org/10.2478/v10175-012-0019-4.
Testo completoAbraitis, Vidas, e Žydrūnas Tamoševičius. "Transition Test Patterns Generation for BIST Implemented in ASIC and FPGA". Solid State Phenomena 144 (settembre 2008): 214–19. http://dx.doi.org/10.4028/www.scientific.net/ssp.144.214.
Testo completoVosper, J. V. "Book Review: Linear Integrated Circuits: Operation and Applications". International Journal of Electrical Engineering & Education 23, n. 2 (aprile 1986): 184. http://dx.doi.org/10.1177/002072098602300223.
Testo completoJain, L. C. "Book Review: Operational Amplifiers and Linear Integrated Circuits:". International Journal of Electrical Engineering & Education 29, n. 2 (aprile 1992): 162. http://dx.doi.org/10.1177/002072099202900212.
Testo completoBuchner, Stephen, e Dale McMorrow. "Single-Event Transients in Bipolar Linear Integrated Circuits". IEEE Transactions on Nuclear Science 53, n. 6 (dicembre 2006): 3079–102. http://dx.doi.org/10.1109/tns.2006.882497.
Testo completoJohnston, A. H., e R. E. Plaag. "Models for Total Dose Degradation of Linear Integrated Circuits". IEEE Transactions on Nuclear Science 34, n. 6 (1987): 1474–80. http://dx.doi.org/10.1109/tns.1987.4337502.
Testo completoSun, Zhi, Weijia Wei, Mingyue Zhang, Wenjia Shi, Yeqing Zong, Yihua Chen, Xiaojing Yang, Bo Yu, Chao Tang e Chunbo Lou. "Synthetic robust perfect adaptation achieved by negative feedback coupling with linear weak positive feedback". Nucleic Acids Research 50, n. 4 (15 febbraio 2022): 2377–86. http://dx.doi.org/10.1093/nar/gkac066.
Testo completoZikumaru, Yushi. "NQR Spectrometer with a Two Integrated Circuits Radio Frequency Head". Zeitschrift für Naturforschung A 45, n. 3-4 (1 aprile 1990): 591–94. http://dx.doi.org/10.1515/zna-1990-3-467.
Testo completoZhang, Xiao Feng, Fo Chang Xie, Guo Wei Yang e Wei Zhang. "The Transceiver Circuit Design of Digital Ultrasonic System". Advanced Materials Research 834-836 (ottobre 2013): 968–73. http://dx.doi.org/10.4028/www.scientific.net/amr.834-836.968.
Testo completoParandin, Fariborz, Saeed Olyaee, Reza Kamarian e Mohamadreza Jomour. "Design and Simulation of Linear All-Optical Comparator Based on Square-Lattice Photonic Crystals". Photonics 9, n. 7 (29 giugno 2022): 459. http://dx.doi.org/10.3390/photonics9070459.
Testo completoWidemann, C., S. Stegemann, W. John e W. Mathis. "Analytic investigations on the susceptibility of nonlinear analog circuits to substrate noise". Advances in Radio Science 11 (4 luglio 2013): 171–75. http://dx.doi.org/10.5194/ars-11-171-2013.
Testo completoSingh, Jagmeet, Hugh Morison, Zhimu Guo, Bicky A. Marquez, Omid Esmaeeli, Paul R. Prucnal, Lukas Chrostowski, Sudip Shekhar e Bhavin J. Shastri. "Neuromorphic photonic circuit modeling in Verilog-A". APL Photonics 7, n. 4 (1 aprile 2022): 046103. http://dx.doi.org/10.1063/5.0079984.
Testo completoMukherjee, Parijat, G. Peter Fang, Rod Burt e Peng Li. "Efficient Identification of Unstable Loops in Large Linear Analog Integrated Circuits". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 31, n. 9 (settembre 2012): 1332–45. http://dx.doi.org/10.1109/tcad.2012.2194492.
Testo completoJohnston, A. H., G. M. Swift e B. G. Rax. "Total dose effects in conventional bipolar transistors and linear integrated circuits". IEEE Transactions on Nuclear Science 41, n. 6 (dicembre 1994): 2427–36. http://dx.doi.org/10.1109/23.340598.
Testo completoJohnston, A. H., B. G. Rax e C. I. Lee. "Enhanced damage in linear bipolar integrated circuits at low dose rate". IEEE Transactions on Nuclear Science 42, n. 6 (1995): 1650–59. http://dx.doi.org/10.1109/23.488762.
Testo completoLubecke, V. M., W. r. McGrath, Yu-Chong Tai e D. B. Rutledge. "Microfabrication of linear translator tuning elements in submillimeter-wave integrated circuits". Journal of Microelectromechanical Systems 7, n. 4 (1998): 404–10. http://dx.doi.org/10.1109/84.735348.
Testo completoJohnston, A. H., e B. G. Rax. "Testing and Qualifying Linear Integrated Circuits for Radiation Degradation in Space". IEEE Transactions on Nuclear Science 53, n. 4 (agosto 2006): 1779–86. http://dx.doi.org/10.1109/tns.2006.878291.
Testo completoLiu, Zhuang Jian, Yong Wei Zhang, Ji Zhou Song, Dae Hyeong Kim, Yong Gang Huang e John Rogers. "Numerical Simulation of Stretchable and Foldable Silicon Integrated Circuits". Advanced Materials Research 74 (giugno 2009): 197–200. http://dx.doi.org/10.4028/www.scientific.net/amr.74.197.
Testo completoNeudeck, Philip G., David J. Spry, Liang Yu Chen, Carl W. Chang, Glenn M. Beheim, Robert S. Okojie, Laura J. Evans et al. "Prolonged 500 °C Operation of 6H-SiC JFET Integrated Circuitry". Materials Science Forum 615-617 (marzo 2009): 929–32. http://dx.doi.org/10.4028/www.scientific.net/msf.615-617.929.
Testo completoSavchenko, Andrey, A. Kulay, I. Strukov, K. Chubur, Sergey Grechanyy e Konstantin Zolnikov. "A PHYSICAL MODEL FOR ESTIMATING THE INTENSITY OF SINGLE EVENTS WHEN EXPOSED TO INDIVIDUAL NUCLEAR PARTICLES". Modeling of systems and processes 12, n. 4 (23 gennaio 2020): 78–83. http://dx.doi.org/10.12737/2219-0767-2020-12-4-78-83.
Testo completoBAUMGARTNER, C., e O. A. PALUSINSKI. "METHODOLOGY FOR FORMULATION OF CIRCUIT EQUATIONS FOR SPECTRAL ANALYSIS". Journal of Circuits, Systems and Computers 02, n. 02 (giugno 1992): 187–206. http://dx.doi.org/10.1142/s0218126692000131.
Testo completoShaw, Brian M. "Book Review: Op-Amps and Linear Integrated Circuits (3rd Edition): A. GAYAKWAD". International Journal of Electrical Engineering & Education 32, n. 2 (aprile 1995): 190–91. http://dx.doi.org/10.1177/002072099503200220.
Testo completoJohnston, Allan H., e B. G. Rax. "Failure Modes and Hardness Assurance for Linear Integrated Circuits in Space Applications". IEEE Transactions on Nuclear Science 57, n. 4 (agosto 2010): 1966–72. http://dx.doi.org/10.1109/tns.2010.2049583.
Testo completoGorelick, J. L., R. Ladbury e L. Ka. "The effects of neutron irradiation on gamma sensitivity of linear integrated circuits". IEEE Transactions on Nuclear Science 51, n. 6 (dicembre 2004): 3679–85. http://dx.doi.org/10.1109/tns.2004.839245.
Testo completoEranosyan, V. Ts. "Automated installation for measuring low-frequency noise parameters of linear integrated circuits". Measurement Techniques 30, n. 6 (giugno 1987): 570–72. http://dx.doi.org/10.1007/bf00866854.
Testo completoKAMEDA, SEIJI, AKIRA HONDA e TETSUYA YAGI. "REAL TIME IMAGE PROCESSING WITH AN ANALOG VISION CHIP SYSTEM". International Journal of Neural Systems 09, n. 05 (ottobre 1999): 423–28. http://dx.doi.org/10.1142/s0129065799000423.
Testo completoWang, Han, Yi Cheng Zeng e Zhi Jun Li. "Current Mode Maximum and Minimum Circuit". Applied Mechanics and Materials 577 (luglio 2014): 478–81. http://dx.doi.org/10.4028/www.scientific.net/amm.577.478.
Testo completoPiqueira, José R. C., Maurízio Q. de Oliveira e Luiz H. A. Monteiro. "Linear Approach for Synchronous State Stability in Fully Connected PLL Networks". Mathematical Problems in Engineering 2008 (2008): 1–13. http://dx.doi.org/10.1155/2008/364084.
Testo completoSaleh, Alaa, Abdel Kader El Rafei, Mountakha Dieng, Tibault Reveyrand, Raphael Sommet, Jean-Michel Nebus e Raymond Quere. "Compact RF non-linear electro thermal model of SiGe HBT for the design of broadband ADC's". International Journal of Microwave and Wireless Technologies 4, n. 6 (29 agosto 2012): 569–78. http://dx.doi.org/10.1017/s1759078712000566.
Testo completoDimopoulos, K. Z., J. N. Avaritsiotis e S. J. White. "Electrical Modelling of Multilevel On-Chip Interconnections for High-Speed Integrated Circuits". Active and Passive Electronic Components 14, n. 4 (1992): 199–218. http://dx.doi.org/10.1155/1992/13545.
Testo completoZhao, San Ping. "A Pressure Sensor with Electrical Readout Based on IL Electrofluidic Circuit". Applied Mechanics and Materials 66-68 (luglio 2011): 1936–41. http://dx.doi.org/10.4028/www.scientific.net/amm.66-68.1936.
Testo completoDeval, Y., H. Lapuyade, R. Fouillat, H. Barnaby, F. Darracq, R. Briand, D. Lewis e R. D. Schrimpf. "Evaluation of a design methodology dedicated to dose-rate-hardened linear integrated circuits". IEEE Transactions on Nuclear Science 49, n. 3 (giugno 2002): 1468–73. http://dx.doi.org/10.1109/tns.2002.1039685.
Testo completoBorys, Andrzej. "On Definition of Operator o for Weakly Nonlinear Circuits". International Journal of Electronics and Telecommunications 62, n. 3 (1 settembre 2016): 253–59. http://dx.doi.org/10.1515/eletel-2016-0034.
Testo completoWeng, T., S. Stegemann, W. John e W. Mathis. "An identification procedure of multi-input Wiener models for the distortion analysis of nonlinear circuits". Advances in Radio Science 11 (4 luglio 2013): 165–70. http://dx.doi.org/10.5194/ars-11-165-2013.
Testo completoMcMORROW, DALE, JOSEPH S. MELINGER e ALVIN R. KNUDSON. "SINGLE-EVENT EFFECTS IN III-V SEMICONDUCTOR ELECTRONICS". International Journal of High Speed Electronics and Systems 14, n. 02 (giugno 2004): 311–25. http://dx.doi.org/10.1142/s0129156404002375.
Testo completoPrakht, V. A., V. V. Goman e A. S. Paramonov. "Design Optimization of Secondary Element of Single-Sided Linear Induction Motors Using a Genetic Algorithm". ENERGETIKA. Proceedings of CIS higher education institutions and power engineering associations 64, n. 6 (6 dicembre 2021): 505–16. http://dx.doi.org/10.21122/1029-7448-2021-64-6-505-516.
Testo completoCaselli, Michele, Marco Ronchi e Andrea Boni. "Power Management Circuits for Low-Power RF Energy Harvesters". Journal of Low Power Electronics and Applications 10, n. 3 (19 settembre 2020): 29. http://dx.doi.org/10.3390/jlpea10030029.
Testo completoWang, San-Fu. "A 5 V-to-3.3 V CMOS Linear Regulator with Three-Output Temperature-Independent Reference Voltages". Journal of Sensors 2016 (2016): 1–7. http://dx.doi.org/10.1155/2016/1436371.
Testo completoLiu, Lun Cai, Xiao Zong Huang e Wen Gang Huang. "An Integrated Optical Sensor Receiver with the Sensitivity of 0.7 μA Fabricated with Standard CMOS Process". Applied Mechanics and Materials 251 (dicembre 2012): 206–9. http://dx.doi.org/10.4028/www.scientific.net/amm.251.206.
Testo completoDaems, W., W. Verhaegen, P. Wambacq, G. Gielen e W. Sansen. "Evaluation of error-control strategies for the linear symbolic analysis of analog integrated circuits". IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications 46, n. 5 (maggio 1999): 594–606. http://dx.doi.org/10.1109/81.762925.
Testo completoKoga, R., S. H. Penzin, K. B. Crawford, W. R. Crain, S. C. Moss, S. D. Pinkerton, S. D. LaLumondiere e M. C. Maher. "Single event upset (SEU) sensitivity dependence of linear integrated circuits (ICs) on bias conditions". IEEE Transactions on Nuclear Science 44, n. 6 (1997): 2325–32. http://dx.doi.org/10.1109/23.659055.
Testo completoFlament, O., J. L. Autran, P. Roche, J. L. Leray, O. Musseau, R. Truche e E. Orsier. "Enhanced total dose damage in junction field effect transistors and related linear integrated circuits". IEEE Transactions on Nuclear Science 43, n. 6 (1996): 3060–67. http://dx.doi.org/10.1109/23.556905.
Testo completoRizkalla, Shrief, Ralph Prestros e Christoph F. Mecklenbrauker. "Optimal Card Design for Non-Linear HF RFID Integrated Circuits With Guaranteed Standard-Compliance". IEEE Access 6 (2018): 47843–56. http://dx.doi.org/10.1109/access.2018.2867290.
Testo completoBoch, J., F. Saigne, R. D. Schrimpf, J. R. Vaille, L. Dusseau, S. Ducret, M. Bernard, E. Lorfevre e C. Chatry. "Estimation of low-dose-rate degradation on bipolar linear integrated circuits using switching experiments". IEEE Transactions on Nuclear Science 52, n. 6 (dicembre 2005): 2616–21. http://dx.doi.org/10.1109/tns.2005.860711.
Testo completoBülow, H., F. Buchali, W. Baumert, R. Ballentin e T. Wehren. "PMD mitigation at 10 Gbit/s using linear and nonlinear integrated electronic equaliser circuits". Electronics Letters 36, n. 2 (2000): 163. http://dx.doi.org/10.1049/el:20000175.
Testo completoSun, Shaofei, Hongxin Zhang, Xiaotong Cui, Qiang Li, Liang Dong e Xing Fang. "Analysis of Electromagnetic Information Leakage Based on Cryptographic Integrated Circuits". Entropy 23, n. 11 (13 novembre 2021): 1508. http://dx.doi.org/10.3390/e23111508.
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