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Articoli di riviste sul tema "Films minces nanométriques"
Noel, Laurent, Amine Khitous, Quentin Kirscher, Céline Molinaro, Dominique Berling e Olivier Soppera. "Écriture laser de materiaux fonctionnels inorganiques preparés par voie sol-gel". Photoniques, n. 112 (2022): 43–47. http://dx.doi.org/10.1051/photon/202211243.
Testo completoTesi sul tema "Films minces nanométriques"
Nemouchi, Fabrice. "Réactivité de films nanométriques de nickel sur substrats silicium-germanium". Aix-Marseille 3, 2005. http://www.theses.fr/2005AIX30052.
Testo completoWe present a study on the reactivity between thin films of nickel with several substrates : silicon, germanium and silicon-germanium. The formation sequence, the formation kinetic and the stability of silicides, germanides, and germano-silicides have been studied by "in situ" measurements and real time using XRD, DSC and four points probes resistance. We developed, in particularly, an original method to measure the heat flow during thin films on substrate reactions by DSC measurements. We observed different behavior of silicides versus gremanides. Indeed, silicides have overall a sequential growth with nevertheless some transient phases (Ni31Si12 and Ni3Si2) that appear and disappear rapidly. In contrary of silicides, germinides display a simultaneous growth of Ni5Ge3 and NiGe. In both systems, we realised original measurement of interfacial reaction rates of Ni rich phases (Ni2Si and Ni5Ge3) by simulating the kinetics by a linear-parabolic law (diffusion and interfacial reaction control). The formation of germano-silicides is sequential as silicides one. We observed that the Si rich phase (NiSi2) does not appear in presence of germanium. Moreover, during the Ni(Si1-xGex) formation, Ge is rejected from this phase. It could be explained by the thermodynamic equilibrium between Ni(Si1-xGex) and Si1-xGex with different concentration of germanium in both phases. This study provides new elements for the understanding of the fundamental phenomena needed for metallization of nanoelectronic devices
Zappone, Bruno. "Films nanométriques de cristaux liquides étudiés par mesure de force SFA et AFM". Bordeaux 1, 2004. http://www.theses.fr/2004BOR12787.
Testo completoUsing a surface force apparatus (SFA) and an atomic force microscope in "Force Spectroscopy" mode (SP-AFM) we have studied the behaviour under nanometric confinement of nematic and smectic liquid crystals (LC). First, we have considered the confinement-induced layering in a lyotropic LC composed of biaxial micellae, organized in different nematic phases depending on the temperature: calamitic C, biaxial Bx and discotic D. We have characterized the layering in term of the layer thickness and of the strength and the range of the induced order. We observe some variation between the C and D phase. The D-phase deviates more than the C phase from the theoretical behaviour. For strongly birefringent LC, the interferometric method usually employed to measure the film thickness (FECO) is no longer valid. We have developed a numerical approach to identify the LC configuration across the confinement using the FECO data. We have used these data as a starting point to interpretate the force profiles obtained for two nematic biphenyls, subjected to different anchoring conditions: homeotropic, twisted planar and hybrid planar/homeotropic. The force profiles are compared to a model, including the nematic elasticity and the anchoring energy at the surfaces. The agreement is good for the planar samples, if we consider a very high anchoringenergy that is particularly high. For hybrid anchoring conditions, the force does not follow the same kind of model. We do not observe the anchoring transition to a uniform-director configuration, predicted for small thicknesses. We measure a strong attraction for a thickness of about 100 angstroms, probably due to tensor order gradients across the confinement. Using the SP-AFM we have measured the layer thickness and compressibility of two smectic A and C* materials, with a resolution comparable to that of other techniques, more specific but also slower and more expensive
Scarafagio, Marion. "Élaboration et caractérisation de couches nanométriques d'oxyde d'yttrium dopées terres rares pour les technologies quantiques". Electronic Thesis or Diss., Sorbonne université, 2019. http://www.theses.fr/2019SORUS503.
Testo completoRare earth ion-doped oxidized materials are attracting increasing interest in quantum technologies. The consistent manipulation of quantum states being sensitive to the fluctuations of the outer environment, the use of rare earth ions helps to partially solve this problem since their 4f electrons are knocked out by other sub-elements layers. At present the most advanced results have been obtained on single crystals whose use has a number of disadvantages. This doctoral work aims to determine whether the nanoscale thin layers of Y2O3 doped with rare earth ions can be considered as an alternative: they will make it possible to create new interfaces between light and matter, raising certain limitations encountered in macroscopic systems. In addition, their use facilitates scalability, miniaturization, nano-structuring, integration and interconnection with other microscopic quantum components. The main objective of this work is to develop and optimize the deposition of nanometric films doped rare earth by ALD with simultaneous analysis of structure (DRX), and optical properties (PL, fluorescence declines, heterogeneous widths). These measurements determined the optimum deposition parameters for a substrate Si(100). The key parameters are the deposition temperature and annealing stage. Under optimal conditions, a very fine 200 GHz line was obtained for the orange transition of the Eu3+ ions. These results were then extended to alternative substrates. Diffusion and location of dopants were also studied
Buda, Liliana-Daniela. "Developpement d'un code de calcul micromagnetique 2D et 3D: Application a des systemes reels de types films, plots et fils". Phd thesis, Université Louis Pasteur - Strasbourg I, 2001. http://tel.archives-ouvertes.fr/tel-00003049.
Testo completoHajj, Bassam. "Imagerie électro-optique Pockels aux échelles micro et nanométriques en physique et biophysique". Phd thesis, École normale supérieure de Cachan - ENS Cachan, 2010. http://tel.archives-ouvertes.fr/tel-00562142.
Testo completoRavinet, Nolann. "Développement de revêtements interférentiels pour des imageurs X à haute résolution". Electronic Thesis or Diss., université Paris-Saclay, 2024. http://www.theses.fr/2024UPASP127.
Testo completoInertial Confinement Fusion (ICF) is a preferred experimental approach to access extreme matter conditions, through the implosion of a laser-driven target. To characterize the implosion symmetry, a micrometer-resolution microscope, operating in the hard X-ray range, is being developed by the CEA (Commissariat à l'énergie atomique). TXI (Toroidal X-ray Imager), which will be installed at the NIF (National Ignition Facility), is a Wolter-type X-ray diagnostic where conical mirrors are replaced by toroidal mirrors. It is also a multi-channel diagnostic, operating at a nominal grazing angle of 0.6°, allowing imaging at 8.7 keV, 13 keV, and 17.5 keV. The required thicknesses of the multilayer coatings must become increasingly thin to image these energies. Different multilayer formulas (alternating two materials whose total period allows reflection of a certain wavelength, according to Bragg's law) have been optimized to meet TXI's specifications. The instrument's optical response was simulated using ray-tracing software. The coatings were then produced by sputtering deposition. For the next phase of the thesis, a preliminary study was conducted on designing an imager capable of operating up to 60 keV, as well as a pre-study on HiPIMS (High Power Impulse Magnetron Sputtering) technology to assess its benefits for thin-film quality
Sarrazin, Baptiste. "Propriétés mécaniques de bicouches et de capsules polymères résolues à l'échelle nanométrique. Etude par microscopie à force atomique". Thesis, Paris 6, 2015. http://www.theses.fr/2015PA066565/document.
Testo completoThe mechanical properties of complex objects at the nanometric scale are of great interest in many fields such as nanobiotechnology. Atomic Force Microscopy (AFM) is the ideal tool to measure forces at the nanometer scale and to perform indentation experiments onto isolated objects. This PhD work takes place in the context of the development of a nano-object intended to theranostic applications. These nanoparticules are composed of a glassy polymeric capsule containing a liquid fluorinated core. The mechanical properties of these capsules are fully deployed for the transportation in biological media as well as for the bouncing of ultrasound imaging and their localized destruction. The complexity of those systems, both in term of geometry and composite aspect, makes it difficult to assess their mechanical properties, in particular their elasticity. Giving the fact that composite objects show a variation of their elasticity according to the indentation depth, a semi-analytical method (CHIMER : Coated Half-space Indentation Model for Elastic Response) has been implemented to interpret the apparent elasticity of such system. In order to support this method, polydimethylsiloxane (PDMS) based bilayers have been investigated by AFM nanoindentation. A good agreement between the model and the experimental data has been found and the elastic behavior of a rigid film laid over a soft substrate has been well described at the nanometer scale. This model has also been used to investigate the apparent elasticity of polymeric capsules. The influence of the shell thickness and of the bulk elasticity of the polymer has been therefore shown. Moreover, this original approach has been used to describe the effects of temperature and frequency on the apparent elasticity of polymeric capsules filled with a fluorinated liquid core
Hemel, Audrey. "Propriétés mécaniques de membranes d’épaisseur nanométriques : construction et mise au point d’un essai de gonflement". Thesis, Vandoeuvre-les-Nancy, INPL, 2010. http://www.theses.fr/2010INPL060N/document.
Testo completoA new mechanical testing device of free standing membranes by Bulge Test has been built at Institute Jean Lamour in order to investigate the mechanical properties of thin films of nanometric thickness. The Bulge Test measures the deflection of a free standing membrane to which a differential atmospheric pressure has been applied. (The specimens are prepared from film on substrate deposits by cutting a window within the substrate by standard microelectronic techniques.) We aim of achieve tests from room temperature to ~ 900°C. The main technical difficulty met during this work was to develop a non perturbating method of measurement of the film bulge. Two different techniques were tested: point measurement and 2D interferometry using a spherical reference. The first technique, however simple, was difficult to practice, especially in the case of buckling membranes. The second method required a detailed analysis of the whole optical system (image distorsion, calculation of interferograms) leading to a simple measurement method, suitable for integration in the acquisition and command chain of the device, followed by an off line full treatment.The operating method was used on two different sets of specimens: fragile silicon nitride and silicon membranes in order to test the reproducibility of the device. Polycrystalline gold thin films were then used to study the early stage of plastic strain
Borowiak, Alexis. "Contribution à la compréhension du contraste lors de la caractérisation à l'échelle nanométrique des couches minces ferroélectriques par Piezoresponse Force Microscopy". Thesis, Lyon, INSA, 2013. http://www.theses.fr/2013ISAL0167.
Testo completoPiezoresponse Force Microscopy (PFM) is a powerful tool for the characterization of ferroelectric materials thanks to its ability to map and control in a non destructive way domain structures in ferroelectric films. Most of the time, the ferroelectric behaviour of a film is tested by writing domains of opposite polarization with the Atomic Force Microscope (AFM) tip and/or by performing hysteresis loops with the AFM tip as a top electrode. A given sample is declared ferroelectric when domains of opposite direction have been detected; corresponding to zones of distinct contrast on the PFM image, or when an open hysteresis loop is obtained. More prudently in certain cases, the ferroelectricity is at last attested only when the contrast is stable within several hours. But as the thickness of the films studied by PFM decrease, data become difficult to interpret. In particular, charges trapped after current injection due to leakage currents and electrochemical phenomena due to the water layer under the tip may contribute in a non-negligible way to the final contrast of PFM images. In this thesis, some PFM measurements are performed on ferroelectric PbZrTiO3, BaTiO3 thin films and BiFeO3 nanostructures. Different parameters used in PFM measurements are discussed with special attention on the buckling first harmonic PFM measurements which allow the amplification of the PFM signal. The impact of electrochemical effects on the PFM contrast are discussed and are shown experimentally. Then, the standard procedure which is used in order to show the ferroelectricity of a film is applied to a non-ferroelectric sample with apparently the same results. To do so, we use a LaAlO3, Gd2O3 and SiO2 amorphous dielectric films and apply similar voltages as for artificially written ferroelectric domains. The resulting pattern is imaged by PFM and exhibit zones of distinct PFM contrasts, stable with time, similar to the one obtained with ferroelectric samples. These results are explained and is compared with results obtained on BaTiO3 thin films prepared by Molecular Beam Epitaxy which are supposed to be ferroelectric. In order to confirm the ferroelectricity of our thin films, several macroscopic electrical techniques are introduced. The aim of this study is to establish a reliable procedure which would remove any ambiguity in the characterization of the ferroelectric nature of such samples
Foissac, Romain. "Etude à l'échelle nanométrique par sonde locale de la fiabilité et de la dégradation de films minces d'oxyde pour applications MOS et MIM". Thesis, Université Grenoble Alpes (ComUE), 2015. http://www.theses.fr/2015GREAT047/document.
Testo completoIntegration of High-k dielectrics in gate oxides of MOS raised new issues concerning the reliability of futur technology nodes. The constant miniaturisation of devices leads to thinner gate oxides, making their electrical caracterisation more complex at the device scale. To solve this problem, an atomic force microscope in conductive mode under ultra high vacuum can be used thanks to the readuce contact area between the tip and the sample which allow a drastic decrease of the tunneling current and thus the study of the degradation and the dielectric breakdown of ultra-thin oxides. The systematic comparaison of the TDDB distributions obtained on the High-k gate oxide of the 28nm technology node on one side and obtained on the Interfacial layer alone revealed that the failure probability of High-k oxides is governed by the failure probability of each layer present in the stack. This allow to give an extrapolation law of the High-k gate oxide lifetime as a function of the applied voltage and the electrode area and to predict the failure statistic of the 28nm tehcnology node. The impact of voltage pre-stress with a microseconde range of duration on the TDDB and VBD distributions of both single layer and High-k gate oxides is given is the manuscript. The results are then interpreted by an invasive degradation nucleating from an interface during a stress and leading to a local thinned oxide. Pre-breakdown negative differential resistance have been studied and modeled for several oxide thickness, using a growing mecanism of the elctrical degradation. An analytic expression linking the growth caracteristic time of the filament and the mean time to breakdown observed on the statistical distributions has then been given. Finally, C-AFM measurements developped in this work has been extended to MIM structures used for oxide resistive random access memories (OxRAM). A self healing has been observed at the nanometric scale for these samples