Letteratura scientifica selezionata sul tema "Electronic Microscope and microscopy"
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Articoli di riviste sul tema "Electronic Microscope and microscopy"
Chen, Xiaodong, Bin Zheng e Hong Liu. "Optical and Digital Microscopic Imaging Techniques and Applications in Pathology". Analytical Cellular Pathology 34, n. 1-2 (2011): 5–18. http://dx.doi.org/10.1155/2011/150563.
Testo completoDaberkow, I., e M. Schierjott. "Possibilities And Examples For Remote Microscopy Including Digital Image Acquisition, Transfer, and Archiving". Microscopy and Microanalysis 4, S2 (luglio 1998): 2–3. http://dx.doi.org/10.1017/s1431927600020134.
Testo completoLiu, J., e J. R. Ebner. "Nano-Characterization of Industrial Heterogeneous Catalysts". Microscopy and Microanalysis 4, S2 (luglio 1998): 740–41. http://dx.doi.org/10.1017/s1431927600023825.
Testo completoKordesch, Martin E. "Introduction to emission electron microscopy for the in situ study of surfaces". Proceedings, annual meeting, Electron Microscopy Society of America 51 (1 agosto 1993): 506–7. http://dx.doi.org/10.1017/s0424820100148368.
Testo completoVilà, Anna, Sergio Moreno, Joan Canals e Angel Diéguez. "A Compact Raster Lensless Microscope Based on a Microdisplay". Sensors 21, n. 17 (3 settembre 2021): 5941. http://dx.doi.org/10.3390/s21175941.
Testo completoKondo, Y., K. Yagi, K. Kobayashi, H. Kobayashi e Y. Yanaka. "Construction Of UHV-REM-PEEM for Surface Studies". Proceedings, annual meeting, Electron Microscopy Society of America 48, n. 1 (12 agosto 1990): 350–51. http://dx.doi.org/10.1017/s0424820100180501.
Testo completoKatoh, Kazuo. "Software-Based Three-Dimensional Deconvolution Microscopy of Cytoskeletal Proteins in Cultured Fibroblast Using Open-Source Software and Open Hardware". Journal of Imaging 5, n. 12 (23 novembre 2019): 88. http://dx.doi.org/10.3390/jimaging5120088.
Testo completoSchwarzer, Robert. "Orientation Microscopy Using the Analytical Scanning Electron Microscope". Practical Metallography 51, n. 3 (17 marzo 2014): 160–79. http://dx.doi.org/10.3139/147.110280.
Testo completoDantas de Oliveira, Allisson, Carles Rubio Maturana, Francesc Zarzuela Serrat, Bruno Motta Carvalho, Elena Sulleiro, Clara Prats, Anna Veiga et al. "Development of a low-cost robotized 3D-prototype for automated optical microscopy diagnosis: An open-source system". PLOS ONE 19, n. 6 (21 giugno 2024): e0304085. http://dx.doi.org/10.1371/journal.pone.0304085.
Testo completoFaruqi, A. R., e Sriram Subramaniam. "CCD detectors in high-resolution biological electron microscopy". Quarterly Reviews of Biophysics 33, n. 1 (febbraio 2000): 1–27. http://dx.doi.org/10.1017/s0033583500003577.
Testo completoTesi sul tema "Electronic Microscope and microscopy"
Yu, Enhua. "Crossed and uncrossed retinal fibres in normal and monocular hamsters : light and electron microscopic studies /". [Hong Kong : University of Hong Kong], 1990. http://sunzi.lib.hku.hk/hkuto/record.jsp?B13014316.
Testo completoMorgan, Scott Warwick. "Gaseous secondary electron detection and cascade amplification in the environmental scanning electron microscope /". Electronic version, 2005. http://adt.lib.uts.edu.au/public/adt-NTSM20060511.115302/index.html.
Testo completoHarland, C. J. "Detector and electronic developments for scanning electron microscopy". Thesis, University of Sussex, 1985. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.370435.
Testo completo于恩華 e Enhua Yu. "Crossed and uncrossed retinal fibres in normal and monocular hamsters: light and electron microscopic studies". Thesis, The University of Hong Kong (Pokfulam, Hong Kong), 1990. http://hub.hku.hk/bib/B31232449.
Testo completoBélisle, Jonathan. "Design and assembly of a multimodal nonlinear laser scanning microscope". Thesis, McGill University, 2006. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=100765.
Testo completoEl, Hajraoui Khalil. "Études in-situ dans un microscope électronique en transmission des réactions à l’état solide entre métal et nanofil de Ge". Thesis, Université Grenoble Alpes (ComUE), 2017. http://www.theses.fr/2017GREAY012/document.
Testo completoSemiconductor nanowires (NWs) are promising candidates for many device applications ranging from electronics and optoelectronics to energy conversion and spintronics. However, typical NW devices are fabricated using electron beam lithography and therefore source, drain and channel length still depend on the spatial resolution of the lithography. In this work we show fabrication of NW devices in a transmission electron microscope (TEM) where we can obtain atomic resolution on the channel length using in-situ propagation of a metallic phase in the semiconducting NW independent of the lithography resolution. We show results on semiconducting NW devices fabricated on two different electron transparent Si3N4 membranes: a planar membrane and a membrane where devices are suspended over holes. First we show the process of making lithographically defined reliable electrical contacts on individual NWs. Second we show first results on in-situ propagation of a metal-semiconductor phase in Ge NWs by joule heating, while measuring the current through the device. Two different devices are studied: one with platinum metal contacts and one with copper contacts. Different phenomena can occur in CuGe NWs during phase propagation
Romero, Leiro Freddy José. "Poly-articulated microrobotics for correlative AFM-in-SEM microscopy". Electronic Thesis or Diss., Sorbonne université, 2023. https://accesdistant.sorbonne-universite.fr/login?url=https://theses-intra.sorbonne-universite.fr/2023SORUS520.pdf.
Testo completoCorrelative microscopy is the result of the combination of two or more microscopy techniques to provide complementary information on a sample. When using a scanning electron microscope (SEM) and an atomic force microscope (AFM), AFM-in-SEM correlative microscopy not only enables the 3D characterization of samples observed inside a SEM, but also the manipulation of micro- and nanostructures with an extremely high precision. This technique can be applied to various samples in biology, electronics and materials science. Although existing AFM-in-SEM solutions in the current state of the art are powerful, they require expert users; they are not versatile enough to be used for different types of tasks; and they use Cartesian AFM robots that severely limit the dexterity and performance of the imaging system. The aim of this thesis is to study and experiment an original concept of an AFM based on poly- articulated robotics for AFM-in-SEM correlative microscopy. A homemade 6 DoF (3 translations and 3 rotations) robotic AFM system is developed and integrated inside a SEM. The ability to control 3 positions and 3 rotations of a micrometer sized AFM probe while keeping the center of rotation at the close proximity of a micro-structure is very challenging. This is mainly due to the uncertainties inherent to the assembly of micro-robotic systems and clearances in the joints of the robot that are of the same order of magnitude as the required AFM probe positioning accuracy. Robot calibration methods and control theory can however overcome these limitations as demonstrated in the thesis. Control strategies and a user interface are studied to operate the multi DoF correlative imaging system in a versatile and intuitive way for low-level end users while keeping it enough powerful for high-level end users. Several key features that go beyond the state of the art are implemented, including - Vision based control for fast and automated landing of an AFM probe on a micrometer sized sample with robustness with respect to the SEM magnification. The user can select any region of interest (ROI) on a sample by simply performing a mouse click on the SEM screen. Whatever the SEM magnification, the control algorithm ensures a safe landing of the AFM probe on the ROI. The surface of the sample can be as high as several square centimeters and the positioning can be achieved with a micrometric precision. - In-plane and out-of-plane rotation of a sample relatively to the AFM probe while keeping the center of rotation around the tip of the AFM. The center of rotation is defined by the user with a mouse click on the SEM screen. This feature is useful for manipulation and topography tasks, as well as for multi-angle observations of a sample inside a SEM. - Trajectory/speed selection modes. Low speed AFM mode for a detailed topography imaging. Fast AFM mode (4fps) for dynamic observations at the nanoscale. The users also have access to the control parameters. They can be modified to suit their needs. - Mosaic AFM mode to extend the topography scanning area inside a SEM. All these features rely on research works in robotics, mechatronics and control made during the thesis. The latter has the potential to opens the door to a new era of poly-articulated atomic force microscopes used in correlative microscopy
Leane, Robert B. "Scanning tunnelling microscopy". Thesis, University of Cambridge, 1990. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.291716.
Testo completoMarturi, Naresh. "Vison and visual servoing for nanomanipulation and nanocharacterization using scanning electron microscope". Thesis, Besançon, 2013. http://www.theses.fr/2013BESA2014/document.
Testo completoWith the latest advances in nanotechnology, it became possible to design novel nanoscale devicesand systems with increasing efficiency. The consequence of this fact is an increase in the need for developing reliable and cutting edge processes for nanomanipulation and nanocharacterization. Since the human direct sensing is not a feasible option at this particular scale, the tasks are usually performedby an expert human operator using a scanning electron microscope (SEM) equipped withmicro-nanorobotic devices. However, due to the lack of effective processes, these tasks are always challenging and often tiresome to perform. Through this work we show that, this problem can be tackle deffectively up to an extent using the microscopic vision information. It is concerned about using the SEM vision to develop reliable automated methods in order to perform accurate and efficient nanomanipulation and nano characterization. Since, SEM imaging is affected by the non-linearities and instabilities present in the electron column, real time methods to monitor the imaging quality and to compensate the time varying distortion were developed. Later, these images were used in the development of visual servoing control laws. The developed visual servoing-based autofocusing method ensures a constant focus throughout the process and was used for estimating the inter-object depth that is highly challenging to compute using a SEM. Two visual servoing schemes were developed toperform accurate nanopositioning using a nanorobotic station positioned inside SEM. They are basedon the direct use of global pixel intensities and Fourier spectral information respectively. The positioning accuracies achieved by both the methods at different experimental conditions were satisfactory.The achieved results facilitate in developing accurate and reliable applications such as topographic analysis, nanoprobing and sample lift-out using SEM
Tomic, Aleksandra T. "Scanning tunneling microscopy of complex electronic materials". Diss., Connect to online resource - MSU authorized users, 2008.
Cerca il testo completoTitle from PDF t.p. (viewed on Mar. 27, 2009) Includes bibliographical references (p. 95-102). Also issued in print.
Libri sul tema "Electronic Microscope and microscopy"
The principles and practice of electron microscopy. Cambridge [Cambridgeshire]: Cambridge University Press, 1985.
Cerca il testo completoDoane, Frances W. Canadian contributions to microscopy: An historical account of the development of the first electron microscope in North America and the first 20 years of the Microscopical Society of Canada/Société de microscopie du Canada. Toronto: Microscopical Society of Canada, 1993.
Cerca il testo completoW, Doane F., Simon G. T e Watson J. H. L, a cura di. Canadian contributions to microscopy: An historical account of the development of the first electron microscope in North America and the first 20 years of the Microscopical Society of Canada / Société de Microscopie du Canada. Toronto, Ont: Microscopial Society of Canada, 1993.
Cerca il testo completoReimer, Ludwig. Scanning electron microscopy: Physics of image formation and microanalysis. 2a ed. Berlin: Springer, 1998.
Cerca il testo completoScanning electron microscopy: Physics of image formation and microanalysis. Berlin: Springer-Verlag, 1985.
Cerca il testo completoJ, Goodhew Peter, a cura di. Thin foil preparation for electron microscopy. Amsterdam: Elsevier, 1985.
Cerca il testo completoHayat, M. A. Basic techniques for transmission electron microscopy. Orlando: Academic Press, 1985.
Cerca il testo completoChampness, P. E. Electron diffraction in the transmission electron microscope. Oxford: BIOS Scientific Publishers, 2001.
Cerca il testo completoR, Lewis P., a cura di. Biological specimen preparation for transmission electron microscopy. Princeton, N.J: Princeton University Press, 1998.
Cerca il testo completoAyache, Jeanne. Sample preparation handbook for transmission electron microscopy: Techniques. New York: Springer, 2010.
Cerca il testo completoCapitoli di libri sul tema "Electronic Microscope and microscopy"
Badiye, Ashish, Neeti Kapoor e Ritesh K. Shukla. "Forensic Applications of Electron Microscope". In Forensic Microscopy, 251–70. Boca Raton: CRC Press, 2022. http://dx.doi.org/10.4324/9781003120995-20.
Testo completoMilne, R. H. "Reflection Microscopy in a Scanning Transmission Electron Microscope". In NATO ASI Series, 317–28. Boston, MA: Springer US, 1988. http://dx.doi.org/10.1007/978-1-4684-5580-9_23.
Testo completoSims, Paul, Ralph Albrecht, James B. Pawley, Victoria Centonze, Thomas Deerinck e Jeff Hardin. "When Light Microscope Resolution Is Not Enough:Correlational Light Microscopy and Electron Microscopy". In Handbook Of Biological Confocal Microscopy, 846–60. Boston, MA: Springer US, 2006. http://dx.doi.org/10.1007/978-0-387-45524-2_49.
Testo completoWilliams, David B., e C. Barry Carter. "The Transmission Electron Microscope". In Transmission Electron Microscopy, 3–22. Boston, MA: Springer US, 2009. http://dx.doi.org/10.1007/978-0-387-76501-3_1.
Testo completoWilliams, David B., e C. Barry Carter. "The Transmission Electron Microscope". In Transmission Electron Microscopy, 3–17. Boston, MA: Springer US, 1996. http://dx.doi.org/10.1007/978-1-4757-2519-3_1.
Testo completoGerber, Ch, G. Binnig, H. Fechs, O. Marti e H. Rohrer. "Scanning tunneling microscope combined with a scanning electron microscope". In Scanning Tunneling Microscopy, 79–82. Dordrecht: Springer Netherlands, 1986. http://dx.doi.org/10.1007/978-94-011-1812-5_8.
Testo completoReimer, Ludwig. "Electron Optics of a Scanning Electron Microscope". In Scanning Electron Microscopy, 13–56. Berlin, Heidelberg: Springer Berlin Heidelberg, 1985. http://dx.doi.org/10.1007/978-3-662-13562-4_2.
Testo completoReimer, Ludwig. "Elements of a Transmission Electron Microscope". In Transmission Electron Microscopy, 79–142. Berlin, Heidelberg: Springer Berlin Heidelberg, 1997. http://dx.doi.org/10.1007/978-3-662-14824-2_4.
Testo completoReimer, Ludwig. "Elements of a Transmission Electron Microscope". In Transmission Electron Microscopy, 86–135. Berlin, Heidelberg: Springer Berlin Heidelberg, 1993. http://dx.doi.org/10.1007/978-3-662-21556-2_4.
Testo completoReimer, Ludwig. "Elements of a Transmission Electron Microscope". In Transmission Electron Microscopy, 86–135. Berlin, Heidelberg: Springer Berlin Heidelberg, 1989. http://dx.doi.org/10.1007/978-3-662-21579-1_4.
Testo completoAtti di convegni sul tema "Electronic Microscope and microscopy"
Monachon, C., M. S. Zielinski, D. Gachet, S. Sonderegger, S. Muckenhirn, J. Berney, D. Poppitz, A. Graff, S. Breuer e L. Kirste. "Failure Analysis and Defect Inspection of Electronic Devices by High-Resolution Cathodoluminescence". In ISTFA 2017. ASM International, 2017. http://dx.doi.org/10.31399/asm.cp.istfa2017p0349.
Testo completoYatagai, Toyohiko, Katsuyuki Ohmura e Shigeo Iwasaki. "Phase sensitive analysis of electron holograms". In Holography. Washington, D.C.: Optica Publishing Group, 1986. http://dx.doi.org/10.1364/holography.1986.wb3.
Testo completoBaibyrin, V. B., P. I. Anisimov, N. P. Konnov, A. A. Shcherbakov e U. P. Volkov. "Near field scanning optical microscope for biological applications". In Laser Applications to Chemical and Environmental Analysis. Washington, D.C.: Optica Publishing Group, 1996. http://dx.doi.org/10.1364/lacea.1996.lwd.9.
Testo completoWebb, Robert H. "Microlaser microscope". In OSA Annual Meeting. Washington, D.C.: Optica Publishing Group, 1990. http://dx.doi.org/10.1364/oam.1990.mpp4.
Testo completoVillarraga-Gómez, Herminso, Kyle Crosby, Masako Terada e Mansoureh Norouzi Rad. "Assessing Electronics with Advanced 3D X-ray Microscopy Techniques and Electron Microscopy". In ISTFA 2023. ASM International, 2023. http://dx.doi.org/10.31399/asm.cp.istfa2023p0554.
Testo completoSandoz, P., J. L. Pretet, R. Zeggari, L. Froehly, C. Mougin e M. P. Bernal. "Micro-patterned microscope slides for position referencing in optical microscopy". In 2007 European Conference on Lasers and Electro-Optics and the International Quantum Electronics Conference. IEEE, 2007. http://dx.doi.org/10.1109/cleoe-iqec.2007.4386655.
Testo completoLarkin, Kieran G., Carol J. Cogswell, John W. O'Byrne e Matthew R. Arnison. "High-resolution, multiple optical mode confocal microscope: II. Theoretical aspects of confocal transmission microscopy". In IS&T/SPIE 1994 International Symposium on Electronic Imaging: Science and Technology, a cura di Carol J. Cogswell e Kjell Carlsson. SPIE, 1994. http://dx.doi.org/10.1117/12.172106.
Testo completoPostek, Michael T., András E. Vladár, William Keery, Michael Bishop, Benjamin Bunday e John Allgair. "NEW scanning electron microscope magnification calibration reference material (RM) 8820". In Scanning Microscopy 2010, a cura di Michael T. Postek, Dale E. Newbury, S. Frank Platek e David C. Joy. SPIE, 2010. http://dx.doi.org/10.1117/12.859118.
Testo completoMiyasaka, C., e B. R. Tittmann. "Application of Scanning Acoustic Microscopy to Electric and Electronic Parts". In ISTFA 2000. ASM International, 2000. http://dx.doi.org/10.31399/asm.cp.istfa2000p0303.
Testo completoSchmahl, Gunter. "X-ray microscopy studies of biological specimens in their natural state". In OSA Annual Meeting. Washington, D.C.: Optica Publishing Group, 1991. http://dx.doi.org/10.1364/oam.1991.tuee1.
Testo completoRapporti di organizzazioni sul tema "Electronic Microscope and microscopy"
De Lozanne, Alejandro. Nanofabrication of Electronic Devices With the Scanning Tunneling Microscope. Fort Belvoir, VA: Defense Technical Information Center, ottobre 1994. http://dx.doi.org/10.21236/ada292463.
Testo completoCobden, David. Combined microscopy studies of complex electronic materials. Final report. Office of Scientific and Technical Information (OSTI), ottobre 2019. http://dx.doi.org/10.2172/1570390.
Testo completoLeRoy, Brian. Understanding and Controlling the Electronic Properties of Graphene Using Scanning Probe Microscopy. Fort Belvoir, VA: Defense Technical Information Center, luglio 2014. http://dx.doi.org/10.21236/ada612223.
Testo completoYazdani, Ali. Probing Electronic States of Magnetic Semiconductors Using Atomic Scale Microscopy & Spectroscopy. Fort Belvoir, VA: Defense Technical Information Center, dicembre 2013. http://dx.doi.org/10.21236/ada614343.
Testo completoDavis, Seamus, e Paul L. McEuen. Electronic Wavefunction Imaging and Spectroscopy in Metallic and Magnetic Nanostructures by Millikelvin Scanning Tunneling Microscopy. Fort Belvoir, VA: Defense Technical Information Center, maggio 2002. http://dx.doi.org/10.21236/ada414343.
Testo completoWilliams, Clayton, e Christoph Boehme. Room Temperature Single-Spin Tunneling Force Microscopy for Characterization of Paramagnetic Defects in Electronic Materials. Fort Belvoir, VA: Defense Technical Information Center, aprile 2014. http://dx.doi.org/10.21236/ada604959.
Testo completoBarbara, Paul F. Ultrafast Near-Field Scanning Optical Microscopy (NSOM) of Emerging Display Technology Media: Solid State Electronic Structure and Dynamics,. Fort Belvoir, VA: Defense Technical Information Center, maggio 1995. http://dx.doi.org/10.21236/ada294879.
Testo completoWolf, E. L. Control of the Residual Sub-Electronic Charge on a Mesoscopic Conductor by Means of a Scanning Tunneling Microscope Tip. Fort Belvoir, VA: Defense Technical Information Center, marzo 1994. http://dx.doi.org/10.21236/ada277290.
Testo completoCrewe, A. V., e O. H. Kapp. Electron microscope studies. Office of Scientific and Technical Information (OSTI), giugno 1991. http://dx.doi.org/10.2172/6000131.
Testo completoCrewe, A. V., e O. H. Kapp. Electron microscope studies. Office of Scientific and Technical Information (OSTI), luglio 1992. http://dx.doi.org/10.2172/7015892.
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