Letteratura scientifica selezionata sul tema "Diodes à avalanche à photon unique"
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Articoli di riviste sul tema "Diodes à avalanche à photon unique"
Zunino, Alessandro, Giacomo Garrè, Eleonora Perego, Sabrina Zappone, Mattia Donato e Giuseppe Vicidomini. "s2ISM: A Comprehensive Approach for Uncompromised Super-Resolution and Optical Sectioning in Image Scanning Microscopy". EPJ Web of Conferences 309 (2024): 04021. http://dx.doi.org/10.1051/epjconf/202430904021.
Testo completoLu, Z., X. Zheng, W. Sun, J. Campbell, X. Jiang e M. A. Itzler. "InGaAs/InP Single Photon Avalanche Diodes". ECS Transactions 45, n. 33 (2 aprile 2013): 37–43. http://dx.doi.org/10.1149/04533.0037ecst.
Testo completoGulinatti, Angelo. "Single photon avalanches diodes". Photoniques, n. 125 (2024): 63–68. http://dx.doi.org/10.1051/photon/202412563.
Testo completoXu, Qing Yao, Hong Pei Wang, Xiang Chao Hu, Hai Qian, Ying Cheng Peng, Xiao Hang Ren e Yan Jie Li. "Quenching Circuit of Avalanche Diodes for Single Photon Detection". Applied Mechanics and Materials 437 (ottobre 2013): 1073–76. http://dx.doi.org/10.4028/www.scientific.net/amm.437.1073.
Testo completoPetticrew, Jonathan D., Simon J. Dimler, Xinxin Zhou, Alan P. Morrison, Chee Hing Tan e Jo Shien Ng. "Avalanche Breakdown Timing Statistics for Silicon Single Photon Avalanche Diodes". IEEE Journal of Selected Topics in Quantum Electronics 24, n. 2 (marzo 2018): 1–6. http://dx.doi.org/10.1109/jstqe.2017.2779834.
Testo completoPullano, Salvatore A., Giuseppe Oliva, Twisha Titirsha, Md Maruf Hossain Shuvo, Syed Kamrul Islam, Filippo Laganà, Antonio La Gatta e Antonino S. Fiorillo. "Design of an Electronic Interface for Single-Photon Avalanche Diodes". Sensors 24, n. 17 (28 agosto 2024): 5568. http://dx.doi.org/10.3390/s24175568.
Testo completoGhioni, Massimo, Angelo Gulinatti, Ivan Rech, Franco Zappa e Sergio Cova. "Progress in Silicon Single-Photon Avalanche Diodes". IEEE Journal of Selected Topics in Quantum Electronics 13, n. 4 (2007): 852–62. http://dx.doi.org/10.1109/jstqe.2007.902088.
Testo completoZappa, F., A. Tosi, A. Dalla Mora e S. Tisa. "SPICE modeling of single photon avalanche diodes". Sensors and Actuators A: Physical 153, n. 2 (agosto 2009): 197–204. http://dx.doi.org/10.1016/j.sna.2009.05.007.
Testo completoNeri, L., S. Tudisco, F. Musumeci, A. Scordino, G. Fallica, M. Mazzillo e M. Zimbone. "Dead Time of Single Photon Avalanche Diodes". Nuclear Physics B - Proceedings Supplements 215, n. 1 (giugno 2011): 291–93. http://dx.doi.org/10.1016/j.nuclphysbps.2011.04.034.
Testo completoMita, R., G. Palumbo e P. G. Fallica. "Accurate model for single-photon avalanche diodes". IET Circuits, Devices & Systems 2, n. 2 (2008): 207. http://dx.doi.org/10.1049/iet-cds:20070180.
Testo completoTesi sul tema "Diodes à avalanche à photon unique"
Bérubé, Benoît-Louis. "Conception de matrices de diodes avalanche à photon unique sur circuits intégrés CMOS 3D". Thèse, Université de Sherbrooke, 2014. http://savoirs.usherbrooke.ca/handle/11143/92.
Testo completoB??rub??, Beno??t-Louis. "Conception de matrices de diodes avalanche ?? photon unique sur circuits int??gr??s CMOS 3D". Thèse, Universit?? de Sherbrooke, 2014. http://savoirs.usherbrooke.ca/handle/11143/92.
Testo completoHelleboid, Rémi. "Advanced modeling and simulation of Single-Photon Avalanche Diodes". Electronic Thesis or Diss., université Paris-Saclay, 2024. http://www.theses.fr/2024UPAST193.
Testo completoThis thesis advances the modeling, simulation, and optimization of Single-Photon Avalanche Diodes (SPADs), which detect individual photons with high sensitivity. SPADs are essential for applications in quantum communications, imaging, and time-of-flight measurements, where precise single-photon detection is crucial. However, SPADs operate through complex, stochastic processes such as avalanche multiplication, timing jitter, and quenching, making accurate modeling a challenge. This thesis addresses these complexities by developing advanced simulation models, applying optimization techniques, and exploring methods to enhance SPAD performance. The thesis starts by reviewing SPAD technology and principles. SPADs detect photons by triggering an avalanche process in a high electric field, which amplifies the photon's signal into a measurable pulse. This thesis extends the McIntyre model, traditionally used for avalanche devices, to three dimensions, allowing for more accurate simulations of complex SPAD geometries and electric fields. A core contribution is introducing Particle Swarm Optimization (PSO) coupled with a nonlinear Poisson solver to optimize SPAD parameters like breakdown voltage, depletion width, and timing jitter. PSO navigates the design space effectively, balancing competing performance requirements and enabling customized SPADs for different applications, from low-light imaging to fast photon counting. To improve SPAD simulation accuracy, the thesis develops an Advection-Diffusion Monte Carlo (ADMC) method, which combines advection and diffusion processes for a realistic model of carrier transport, especially in high-field regions where avalanches occur. This model overcomes limitations of traditional Monte Carlo methods, achieving accurate representations of timing jitter, breakdown probability, and dark count rate. The thesis culminates in a self-consistent Monte Carlo-Poisson model for transient SPAD simulations. By combining ADMC with a 3D Poisson solver, this model captures critical SPAD behaviors like avalanche initiation, field depletion, and quenching in real time. This feedback loop is essential for understanding transient SPAD behaviors, as carriers impact the electric field as they accumulate. The model is especially useful for studying the stochastic nature of quenching, which influences SPAD reliability and timing. In summary, this thesis makes significant contributions to SPAD modeling, simulation, and optimization. By creating a self-consistent Monte Carlo-Poisson model and integrating advanced optimization techniques, this work provides a comprehensive framework for improving SPAD performance and supports further advances in high-precision applications
Sicre, Mathieu. "Study of the noise aging mechanisms in single-photon avalanche photodiode for time-of-flight imaging". Electronic Thesis or Diss., Lyon, INSA, 2023. http://www.theses.fr/2023ISAL0104.
Testo completoSingle-Photon Avalanche Diode (SPAD) are used for Time-of-Flight (ToF) sensors to determine distance from a target by measuring the travel time of an emitted pulsed signal. These photodetectors work by triggering an avalanche of charge carriers upon photon absorption, resulting in a substantial amplification which can be detected. However, they are subject to spurious triggering by parasitic generated charge carriers, quantified as Dark Count Rate (DCR), which can compromise the accuracy of the measured distance. Therefore, it is crucial to identify and eliminate the potential source of DCR. To tackle this issue, a simulation methodology has been implemented to assess the DCR. This is achieved by simulating the avalanche breakdown probability, integrated with the carrier generation rate from defects. The breakdown probability can be simulated either in a deterministically, based on electric-field streamlines, or stochastically, by means of drift-diffusion simulation of the random carrier path. This methodology allows for the identification of the potential sources of pre-stress DCR by comparing simulation results to experimental data over a wide range of voltage and temperature. To ensure the accuracy of distance range measurements over time, it is necessary to predict the DCR level under various operating conditions. The aforementioned simulation methodology is used to identify the potential sources of post-stress DCR by comparing simulation results to stress experiments that evaluate the principal stress factors, namely temperature, voltage and irradiance. Furthermore, a Monte-Carlo study has been conducted to examine the device-to-device variation along stress duration. For an accurate Hot-Carrier Degradation (HCD) kinetics model, it is essential to consider not only the carrier energy distribution function but also the distribution of Si−H bond dissociation energy distribution at the Si/SiO2 interface. The number of available hot carriers is estimated from the carrier current density according to the carrier energy distribution simulated by means of a full-band Monte-Carlo method. The impact-ionization dissociation probability is employed to model the defect creation process, which exhibits sub-linear time dependence due to the gradual exhaustion of defect precursors. Accurate distance ranging requires distinguishing the signal from ambient noise and the DCR floor, and ensuring the target’s accumulated photon signal dominates over other random noise sources. An analytical formula allows to estimate the maximum distance ranging using the maximum signal strength, ambient noise level, and confidence levels. The impact of DCR can be estimated by considering the target’s reflectance and the ambient light conditions. In a nutshell, this work makes use of a in-depth characterization and simulation methodology to predict DCR in SPAD devices along stress duration, thereby allowing the assessment of its impact on distance range measurements
Panglosse, Aymeric. "Modélisation pour la simulation et la prédiction des performances des photodiodes à avalanche en mode Geiger pour Lidars spatiaux". Thesis, Toulouse, ISAE, 2019. http://www.theses.fr/2019ESAE0046.
Testo completoThis work focuses on modelling for simulation and prediction purposes ofCMOS SPADs performance parameters used in spaceborne Lidars. The innovative side ofthis work lies in a new methodology based on physical models for semiconductor devices,measurements performed on the targeted CMOS process and commercial simulation tools topredict CMOS SPADs performances. This method allows to get as close as possible to theprocess reality and to improve predictions. A set of SPAD has been designed and fabricated,and is used for measurements and model validation. SPAD design has been done with respectto CNES and Airbus Defence Space Lidar specification, in order to produce devices that willimprove our knowledge in terms of understanding of the involved physical mechanisms, SPADsdesign and test method, for a possible integration within their future spaceborne Lidars
Pellegrini, Sara. "InGaAs/InP single-photon avalanche diodes". Thesis, Heriot-Watt University, 2005. http://hdl.handle.net/10399/49.
Testo completoRochas, Alexis. "Single photon avalanche diodes in CMOS technology /". [S.l.] : [s.n.], 2003. http://library.epfl.ch/theses/?nr=2814.
Testo completoChitnis, Danial. "Single photon avalanche diodes for optical communications". Thesis, University of Oxford, 2013. http://ora.ox.ac.uk/objects/uuid:5fd582dd-8167-4fe4-88f8-871ba905ade1.
Testo completoAlsolami, Ibrahim. "Visible light communications with single-photon avalanche diodes". Thesis, University of Oxford, 2014. http://ora.ox.ac.uk/objects/uuid:744eeb47-8bb6-4776-8b8f-f7b6374d89bd.
Testo completoJouni, Ali. "Space radiation effects on CMOS single photon avalanche diodes (SPADs)". Electronic Thesis or Diss., Toulouse, ISAE, 2024. http://www.theses.fr/2024ESAE0012.
Testo completoThe subject of this thesis deals with the effects of space radiation on CMOS avalanche detectors, particularly on Single Photon Avalanche Diodes (SPADs). These photodiodes exhibit nearly infinite internal gain and are therefore sensitive to very low light conditions. Thus, with excellent temporal resolution, these sensors can be very interesting for space applications requiring time-of-flight measurements, such as the topography of celestial objects or space Rendezvous. However, space is a hostile environment due to radiation from the Sun, particles trapped in the Earth’s magnetosphere, and beyond the solar system. Consequently, within the framework of this thesis work, a model is established to predict thedegradation of the dark current of SPADs, the Dark Count Rate (DCR), after proton irradiations. Experimentally, two SPAD array technologies are irradiated with protons, X-rays, and γ rays. Hence, ionizing and non-ionizing effects are investigated for these avalanche sensors, and differences compared to pixels of standard image sensors are highlighted. Subsequently, the characteristics of defects induced by the creation of interface traps between oxides and silicon and atomic displacement damage in the substrate are examined, including the presence of Random Telegraph Signal (RTS) behaviors. Finally, the nature of these defects is identified through isochronal annealing after irradiations of the SPAD arrays using the three different radiation types mentioned above
Libri sul tema "Diodes à avalanche à photon unique"
Dandin, Marc, Nicole McFarlane, Md Sakibur Sajal, Fahimeh Dehghandehnavi e Babak Nouri. Single-Photon Avalanche Diodes and Photon Counting Systems. Cham: Springer Nature Switzerland, 2025. http://dx.doi.org/10.1007/978-3-031-64334-7.
Testo completoDolgos, Denis. Full-band Monte Carlo simulation of single photon avalanche diodes. Konstanz: Hartung-Gorre Verlag, 2012.
Cerca il testo completoDandin, Marc, Nicole McFarlane, Sakibur Sajal, Fahimeh Dehghandehnavi e Babak Nouri. Single-Photon Avalanche Diodes and Photon Counting Systems: From Phototransduction to Circuit Architecture. Springer, 2024.
Cerca il testo completoWright, A. G. Why photomultipliers? Oxford University Press, 2017. http://dx.doi.org/10.1093/oso/9780199565092.003.0001.
Testo completoCapitoli di libri sul tema "Diodes à avalanche à photon unique"
Dandin, Marc, Nicole McFarlane, Md Sakibur Sajal, Fahimeh Dehghandehnavi e Babak Nouri. "Perimeter-Gated Single-Photon Avalanche Diodes". In Single-Photon Avalanche Diodes and Photon Counting Systems, 21–50. Cham: Springer Nature Switzerland, 2024. http://dx.doi.org/10.1007/978-3-031-64334-7_2.
Testo completoCharbon, Edoardo, e Matthew W. Fishburn. "Monolithic Single-Photon Avalanche Diodes: SPADs". In Springer Series in Optical Sciences, 123–57. Berlin, Heidelberg: Springer Berlin Heidelberg, 2011. http://dx.doi.org/10.1007/978-3-642-18443-7_7.
Testo completoDandin, Marc, Nicole McFarlane, Md Sakibur Sajal, Fahimeh Dehghandehnavi e Babak Nouri. "Perimeter-Gated Single-Photon Avalanche Diode Imagers". In Single-Photon Avalanche Diodes and Photon Counting Systems, 73–89. Cham: Springer Nature Switzerland, 2024. http://dx.doi.org/10.1007/978-3-031-64334-7_4.
Testo completoDandin, Marc, Nicole McFarlane, Md Sakibur Sajal, Fahimeh Dehghandehnavi e Babak Nouri. "Optoelectronic Characteristics of Perimeter-Gated Single-Photon Avalanche Diodes". In Single-Photon Avalanche Diodes and Photon Counting Systems, 51–72. Cham: Springer Nature Switzerland, 2024. http://dx.doi.org/10.1007/978-3-031-64334-7_3.
Testo completoDandin, Marc, Nicole McFarlane, Md Sakibur Sajal, Fahimeh Dehghandehnavi e Babak Nouri. "Perimeter-Gated Single-Photon Avalanche Diode Arrays as Hardware Security Primitives". In Single-Photon Avalanche Diodes and Photon Counting Systems, 91–116. Cham: Springer Nature Switzerland, 2024. http://dx.doi.org/10.1007/978-3-031-64334-7_5.
Testo completoDandin, Marc, Nicole McFarlane, Md Sakibur Sajal, Fahimeh Dehghandehnavi e Babak Nouri. "Conclusions, Contributions, and Future Work". In Single-Photon Avalanche Diodes and Photon Counting Systems, 179–82. Cham: Springer Nature Switzerland, 2024. http://dx.doi.org/10.1007/978-3-031-64334-7_9.
Testo completoDandin, Marc, Nicole McFarlane, Md Sakibur Sajal, Fahimeh Dehghandehnavi e Babak Nouri. "Silicon Photomultipliers". In Single-Photon Avalanche Diodes and Photon Counting Systems, 117–34. Cham: Springer Nature Switzerland, 2024. http://dx.doi.org/10.1007/978-3-031-64334-7_6.
Testo completoDandin, Marc, Nicole McFarlane, Md Sakibur Sajal, Fahimeh Dehghandehnavi e Babak Nouri. "Dead Time Correction in Single-Photon Avalanche Diode Front Ends". In Single-Photon Avalanche Diodes and Photon Counting Systems, 165–78. Cham: Springer Nature Switzerland, 2024. http://dx.doi.org/10.1007/978-3-031-64334-7_8.
Testo completoDandin, Marc, Nicole McFarlane, Md Sakibur Sajal, Fahimeh Dehghandehnavi e Babak Nouri. "Readout Strategies and Asynchronous Architectures". In Single-Photon Avalanche Diodes and Photon Counting Systems, 135–63. Cham: Springer Nature Switzerland, 2024. http://dx.doi.org/10.1007/978-3-031-64334-7_7.
Testo completoDandin, Marc, Nicole McFarlane, Md Sakibur Sajal, Fahimeh Dehghandehnavi e Babak Nouri. "Fundamentals of Phototransduction in Semiconductors". In Single-Photon Avalanche Diodes and Photon Counting Systems, 1–19. Cham: Springer Nature Switzerland, 2024. http://dx.doi.org/10.1007/978-3-031-64334-7_1.
Testo completoAtti di convegni sul tema "Diodes à avalanche à photon unique"
Fu, Jing, Anran Guo, Hongbo Zhang, Guowei Li, Huaping Ma, Ruizhi Li e Yuwei Chen. "Modeling of Silicon Single-Photon Avalanche Diodes for Process and Design Optimization". In 2024 IEEE 17th International Conference on Solid-State & Integrated Circuit Technology (ICSICT), 1–3. IEEE, 2024. https://doi.org/10.1109/icsict62049.2024.10831093.
Testo completoCho, Youngmin, e Jinwook Burm. "Calibrating the Dark Count Rate of Single Photon Avalanche Diodes Using Linear Regression". In 2024 21st International SoC Design Conference (ISOCC), 296–97. IEEE, 2024. http://dx.doi.org/10.1109/isocc62682.2024.10762487.
Testo completoPark, Eunsung, Woo-Young Choi e Myung-Jae Lee. "Optical and Electrical Characterization of Single-Photon Avalanche Diodes Fabricated in CMOS Technology". In 2024 IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia), 1–3. IEEE, 2024. https://doi.org/10.1109/icce-asia63397.2024.10773713.
Testo completoLouis, Thomas A. "Investigation of Picosecond Time-Resolved Photoluminescence in Gallium Arsenide with 3-μm Spatial Resolution". In Picosecond Electronics and Optoelectronics. Washington, D.C.: Optica Publishing Group, 1989. http://dx.doi.org/10.1364/peo.1989.hsmt39.
Testo completoCampbell, Joe C. "Single photon avalanche diodes". In 2013 71st Annual Device Research Conference (DRC). IEEE, 2013. http://dx.doi.org/10.1109/drc.2013.6633855.
Testo completoItzler, Mark A., Xudong Jiang, Bruce Nyman, Rafael Ben-Michael e Krystyna Slomkowski. "InP-based single photon avalanche diodes". In LEOS 2008 - 21st Annual Meeting of the IEEE Lasers and Electro-Optics Society (LEOS 2008). IEEE, 2008. http://dx.doi.org/10.1109/leos.2008.4688571.
Testo completoPellegrini, S., e B. Rae. "Fully industrialised single photon avalanche diodes". In SPIE Commercial + Scientific Sensing and Imaging, a cura di Mark A. Itzler e Joe C. Campbell. SPIE, 2017. http://dx.doi.org/10.1117/12.2264364.
Testo completoAnti, Michele, Fabio Acerbi, Alberto Tosi e Franco Zappa. "Integrated simulator for single photon avalanche diodes". In 2011 11th International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD). IEEE, 2011. http://dx.doi.org/10.1109/nusod.2011.6041130.
Testo completoMahnkopf, S., A. Giudice, D. Demmer, T. Haslett e G. Simmerle. "Optoelectronic packaging of single photon avalanche diodes". In SPIE LASE, a cura di Alexei L. Glebov e Paul O. Leisher. SPIE, 2017. http://dx.doi.org/10.1117/12.2255556.
Testo completoMarisaldi, Martino, Piera Maccagnani, Francesco Moscatelli, Claudio Labanti, Fabio Fuschino, Michela Prest, Alessandro Berra et al. "Single Photon Avalanche Diodes for space applications". In 2011 IEEE Nuclear Science Symposium and Medical Imaging Conference (2011 NSS/MIC). IEEE, 2011. http://dx.doi.org/10.1109/nssmic.2011.6154465.
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