Articoli di riviste sul tema "Contact resistance"
Cita una fonte nei formati APA, MLA, Chicago, Harvard e in molti altri stili
Vedi i top-50 articoli di riviste per l'attività di ricerca sul tema "Contact resistance".
Accanto a ogni fonte nell'elenco di riferimenti c'è un pulsante "Aggiungi alla bibliografia". Premilo e genereremo automaticamente la citazione bibliografica dell'opera scelta nello stile citazionale di cui hai bisogno: APA, MLA, Harvard, Chicago, Vancouver ecc.
Puoi anche scaricare il testo completo della pubblicazione scientifica nel formato .pdf e leggere online l'abstract (il sommario) dell'opera se è presente nei metadati.
Vedi gli articoli di riviste di molte aree scientifiche e compila una bibliografia corretta.
Cumberbatch, E., e G. Mahinthakumar. "Contact resistance for small contacts (MOSFET)". IEEE Transactions on Electron Devices 38, n. 12 (1991): 2669–72. http://dx.doi.org/10.1109/16.158689.
Testo completoKrutova, Y. A. "Contact resistance of rectangular contact". Челябинский физико-математический журнал 6, n. 2 (2021): 162–71. http://dx.doi.org/10.47475/2500-0101-2021-16203.
Testo completoYe, Gangfeng, Kelvin Shi, Robert Burke, Joan M. Redwing e Suzanne E. Mohney. "Ti/Al Ohmic Contacts to n-Type GaN Nanowires". Journal of Nanomaterials 2011 (2011): 1–6. http://dx.doi.org/10.1155/2011/876287.
Testo completoRen, Wanbin, Yu Chen, Zhaobin Wang, Shengjun Xue e Xu Zhang. "Electrical Contact Resistance of Coated Spherical Contacts". IEEE Transactions on Electron Devices 63, n. 11 (novembre 2016): 4373–79. http://dx.doi.org/10.1109/ted.2016.2612545.
Testo completoNorberg, G., S. Dejanovic e H. Hesselbom. "Contact resistance of thin metal film contacts". IEEE Transactions on Components and Packaging Technologies 29, n. 2 (giugno 2006): 371–78. http://dx.doi.org/10.1109/tcapt.2006.875891.
Testo completoCrofton, John, John R. Williams, A. V. Adedeji, James D. Scofield, S. Dhar, Leonard C. Feldman e M. J. Bozack. "Ohmic Contacts to P-Type Epitexial and Imlanted 4H-SiC". Materials Science Forum 527-529 (ottobre 2006): 895–98. http://dx.doi.org/10.4028/www.scientific.net/msf.527-529.895.
Testo completoHemant Kagra, Hemant Kagra. "Impact of Surface Film on Electrical Contact Resistance of Silver Impregnated Graphite Contacts". Indian Journal of Applied Research 3, n. 5 (1 ottobre 2011): 234–37. http://dx.doi.org/10.15373/2249555x/may2013/71.
Testo completoGracheva, E. I., A. N. Gorlov, A. N. Alimova e P. P. Mukhanova. "Resistance change of contact groups of low-voltage electrical apparatus: Determining the laws". Vestnik MGTU 24, n. 4 (30 dicembre 2021): 350–60. http://dx.doi.org/10.21443/1560-9278-2021-24-4-350-360.
Testo completoSpiesser, A., R. Jansen, H. Saito e S. Yuasa. "Optimum contact resistance for two-terminal magnetoresistance in a lateral spin valve". Applied Physics Letters 122, n. 6 (6 febbraio 2023): 062407. http://dx.doi.org/10.1063/5.0137482.
Testo completoLOSKUTOV, S. V., M. O. SCHETININA e O. A. ZELENINA. "CONTACT RESISTANCE MODELING". Electrical Engineering and Power Engineering, n. 1 (31 maggio 2018): 22–29. http://dx.doi.org/10.15588/1607-6761-2018-1-3.
Testo completoMuzychka, Y. S., M. R. Sridhar, M. M. Yovanovich e V. W. Antonetti. "Thermal Spreading Resistance in Multilayered Contacts: Applications in Thermal Contact Resistance". Journal of Thermophysics and Heat Transfer 13, n. 4 (ottobre 1999): 489–94. http://dx.doi.org/10.2514/2.6466.
Testo completoAichi, Hisashi, Hanji Satone e Iwao Miyachi. "Contact resistance of neighboring multiple contact." IEEJ Transactions on Power and Energy 105, n. 10 (1985): 821–28. http://dx.doi.org/10.1541/ieejpes1972.105.821.
Testo completoErshov, A. A. "Contact Resistance of a Square Contact". Proceedings of the Steklov Institute of Mathematics 303, S1 (dicembre 2018): 70–78. http://dx.doi.org/10.1134/s0081543818090079.
Testo completoAndo, Yasuhiro, e Yasutaka Imori. "Contact resistance properties on plastic deformation connector contacts". Electronics and Communications in Japan (Part II: Electronics) 80, n. 3 (marzo 1997): 47–59. http://dx.doi.org/10.1002/(sici)1520-6432(199703)80:3<47::aid-ecjb6>3.0.co;2-4.
Testo completoHertel, Stefan, Andreas Finkler, Michael Krieger e Heiko B. Weber. "Graphene Ohmic Contacts to n-Type Silicon Carbide (0001)". Materials Science Forum 821-823 (giugno 2015): 933–36. http://dx.doi.org/10.4028/www.scientific.net/msf.821-823.933.
Testo completoWang, S. C., e P. S. Wei. "Modeling Dynamic Electrical Resistance During Resistance Spot Welding". Journal of Heat Transfer 123, n. 3 (28 novembre 2000): 576–85. http://dx.doi.org/10.1115/1.1370502.
Testo completoBahrami, M., J. R. Culham e M. M. Yovanovich. "Modeling Thermal Contact Resistance: A Scale Analysis Approach". Journal of Heat Transfer 126, n. 6 (1 dicembre 2004): 896–905. http://dx.doi.org/10.1115/1.1795238.
Testo completoShtern M. Yu., Karavaev I. S., Rogachev M. S., Shtern Yu. I., Mustafoev B. R., Korchagin E. P. e Kozlov A. O. "Methods for investigation of electrical contact resistance in a metal film--semiconductor structure". Semiconductors 56, n. 1 (2022): 24. http://dx.doi.org/10.21883/sc.2022.01.53115.24.
Testo completoMo, Yun, e Sumie Segawa. "THERMAL CONTACT RESISTANCE MEASUREMENTS". Journal of Enhanced Heat Transfer 19, n. 6 (2012): 561–69. http://dx.doi.org/10.1615/jenhheattransf.2012006005.
Testo completoGreenwood, J. A. "Transient thermal contact resistance". International Journal of Heat and Mass Transfer 34, n. 9 (settembre 1991): 2287–90. http://dx.doi.org/10.1016/0017-9310(91)90054-i.
Testo completoLee, Jaehyeok, Hyeongmin Cho, Bongju Kim, Myoungho Jeong, Kiyoung Lee e Kookrin Char. "Low resistance epitaxial edge contacts to buried nanometer thick conductive layers of BaSnO3". Applied Physics Letters 121, n. 14 (3 ottobre 2022): 142102. http://dx.doi.org/10.1063/5.0116527.
Testo completoChen, J. J., Soohwan Jang, T. J. Anderson, F. Ren, Yuanjie Li, Hyun-Sik Kim, B. P. Gila, D. P. Norton e S. J. Pearton. "Low specific contact resistance Ti∕Au contacts on ZnO". Applied Physics Letters 88, n. 12 (20 marzo 2006): 122107. http://dx.doi.org/10.1063/1.2187576.
Testo completoFastow, R. "Contact resistance and noise of Sn/In/HgCdTe contacts". Solid-State Electronics 35, n. 7 (luglio 1992): 1025–26. http://dx.doi.org/10.1016/0038-1101(92)90338-d.
Testo completoKempers, R., A. J. Robinson e A. Lyons. "Characterization of Thermal Contact Resistance in Metal Micro-Textured Thermal Interface Materials Using Electrical Contact Resistance Measurements". Defect and Diffusion Forum 297-301 (aprile 2010): 1190–98. http://dx.doi.org/10.4028/www.scientific.net/ddf.297-301.1190.
Testo completoA. Cividjian, Grigore. "Distorted constriction contact resistance between clamped slabs". COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering 33, n. 4 (1 luglio 2014): 1366–78. http://dx.doi.org/10.1108/compel-07-2013-0250.
Testo completoLee, Sangyoung, Hyun Cho e Yong Hoon Jang. "Multiscale electrical contact resistance in clustered contact distribution". Journal of Physics D: Applied Physics 43, n. 24 (3 giugno 2010): 249801. http://dx.doi.org/10.1088/0022-3727/43/24/c01.
Testo completoLee, Sangyoung, Hyun Cho e Yong Hoon Jang. "Multiscale electrical contact resistance in clustered contact distribution". Journal of Physics D: Applied Physics 42, n. 16 (22 luglio 2009): 165302. http://dx.doi.org/10.1088/0022-3727/42/16/165302.
Testo completoTAMAI, T. "Friction and Contact Resistance through True Contact Interface". IEICE Transactions on Electronics E89-C, n. 8 (1 agosto 2006): 1122–28. http://dx.doi.org/10.1093/ietele/e89-c.8.1122.
Testo completoJang, Yong Hoon, e J. R. Barber. "Effect of contact statistics on electrical contact resistance". Journal of Applied Physics 94, n. 11 (dicembre 2003): 7215–21. http://dx.doi.org/10.1063/1.1622995.
Testo completoYAKUBOV, A., A. SHERCHENKOV, P. LAZARENKO, A. BABICH, D. TEREKHOV e A. DEDKOVA. "CONTACT RESISTANCE MEASUREMENTS FOR THE Ge2Sb2Te5 THIN FILMS". Chalcogenide Letters 17, n. 1 (gennaio 2020): 1–8. http://dx.doi.org/10.15251/cl.2020.171.1.
Testo completoVANDAMME, L. K. J. "CHARACTERIZATION OF CONTACT INTERFACE, FILM SHEET RESISTANCE AND 1/f NOISE WITH CIRCULAR CONTACTS". Fluctuation and Noise Letters 10, n. 04 (dicembre 2011): 467–84. http://dx.doi.org/10.1142/s0219477511000740.
Testo completoTadjer, Marko J., Travis J. Anderson, Karl D. Hobart, Tatyana I. Feygelson, James E. Butler e Fritz J. Kub. "Comparative Study of Ohmic Contact Metallizations to Nanocrystalline Diamond Films". Materials Science Forum 645-648 (aprile 2010): 733–35. http://dx.doi.org/10.4028/www.scientific.net/msf.645-648.733.
Testo completode Silva, Milantha, Teruhisa Kawasaki e Shinichiro Kuroki. "Low Resistance Ti5Si3/TiC Ohmic contact on Ion-Implanted n-Type 4H-SiC C Face". Materials Science Forum 924 (giugno 2018): 409–12. http://dx.doi.org/10.4028/www.scientific.net/msf.924.409.
Testo completoSuzuki, Yu, Etsushi Taguchi, Shouhei Nagata e Masataka Satoh. "Evaluation of Specific Contact Resistance of Al, Ti, and Ni Contacts to N Ion Implanted 3C-SiC(100)". Materials Science Forum 556-557 (settembre 2007): 705–8. http://dx.doi.org/10.4028/www.scientific.net/msf.556-557.705.
Testo completoHolland, Anthony, Yue Pan, Mohammad Alnassar e Stanley Luong. "Circular test structures for determining the specific contact resistance of ohmic contacts". Facta universitatis - series: Electronics and Energetics 30, n. 3 (2017): 313–26. http://dx.doi.org/10.2298/fuee1703313h.
Testo completoIngerly, D. B., Y. A. Chang e Y. Chen. "NiIn as an Ohmic Contact to P-GaN". MRS Internet Journal of Nitride Semiconductor Research 4, S1 (1999): 745–50. http://dx.doi.org/10.1557/s1092578300003355.
Testo completoGupta, Rahul P., Robin McCarty, Jim Bierschenk e Jeff Sharp. "Practical electrical contact resistance measurement method for bulk thermoelectric devices". MRS Proceedings 1490 (2013): 153–59. http://dx.doi.org/10.1557/opl.2012.1730.
Testo completoSun, Zewen, Minsu Cho, Lei Huang, Ryota Hijiya, Yoshimine Kato e Kungen Teii. "Electrical Characteristics of Metal Contacts to Carbon Nanowalls". ECS Journal of Solid State Science and Technology 11, n. 6 (1 giugno 2022): 061012. http://dx.doi.org/10.1149/2162-8777/ac6a77.
Testo completoTamaso, Hideto, Shunsuke Yamada, Hiroyuki Kitabayashi e Taku Horii. "Ti/Al/Si Ohmic Contacts for both n-Type and p-Type 4H-SiC". Materials Science Forum 778-780 (febbraio 2014): 669–72. http://dx.doi.org/10.4028/www.scientific.net/msf.778-780.669.
Testo completoNimmala, Seshu, S. Aria Hosseini, Jackson Harter, Todd Palmer, Eric Lenz e P. Alex Greaney. "Characterizing Macroscopic Thermal Resistance Across Contacting Interfaces Through Local Understanding of Thermal Transport". MRS Advances 3, n. 44 (2018): 2735–41. http://dx.doi.org/10.1557/adv.2018.485.
Testo completoWei, P. S., e T. H. Wu. "Electrical contact resistance effect on resistance spot welding". International Journal of Heat and Mass Transfer 55, n. 11-12 (maggio 2012): 3316–24. http://dx.doi.org/10.1016/j.ijheatmasstransfer.2012.01.040.
Testo completoШтерн, М. Ю., И. С. Караваев, М. С. Рогачев, Ю. И. Штерн, Б. Р. Мустафоев, Е. П. Корчагин e А. О. Козлов. "Методики исследования электрического контактного сопротивления в структуре металлическая пленка--полупроводник". Физика и техника полупроводников 56, n. 1 (2022): 31. http://dx.doi.org/10.21883/ftp.2022.01.51808.24.
Testo completoCubukcu, M., M. B. Martin, P. Laczkowski, C. Vergnaud, A. Marty, J. P. Attané, P. Seneor et al. "Ferromagnetic tunnel contacts to graphene: Contact resistance and spin signal". Journal of Applied Physics 117, n. 8 (28 febbraio 2015): 083909. http://dx.doi.org/10.1063/1.4913710.
Testo completoHewett, C. A., M. J. Taylor, J. R. Zeidler e M. W. Geis. "Specific contact resistance measurements of ohmic contacts to semiconducting diamond". Journal of Applied Physics 77, n. 2 (15 gennaio 1995): 755–60. http://dx.doi.org/10.1063/1.358996.
Testo completoUmemura, S., K. Yasuda e T. Aoki. "Contact resistance characteristics of noble metal alloys for connector contacts". IEEE Transactions on Components, Hybrids, and Manufacturing Technology 14, n. 1 (marzo 1991): 181–86. http://dx.doi.org/10.1109/33.76529.
Testo completoParihar, S. K., e N. T. Wright. "Thermal Contact Resistance of Silicone Rubber to AISI 304 Contacts". Journal of Heat Transfer 121, n. 3 (1 agosto 1999): 700–702. http://dx.doi.org/10.1115/1.2826035.
Testo completoMohney, S. E., Y. Wang, M. A. Cabassi, K. K. Lew, S. Dey, J. M. Redwing e T. S. Mayer. "Measuring the specific contact resistance of contacts to semiconductor nanowires". Solid-State Electronics 49, n. 2 (febbraio 2005): 227–32. http://dx.doi.org/10.1016/j.sse.2004.08.006.
Testo completoHamamoto, T., T. Ozaki, M. Aoki e Y. Ishibashi. "Measurement of contact resistance distribution using a 4k-contacts array". IEEE Transactions on Semiconductor Manufacturing 9, n. 1 (1996): 9–14. http://dx.doi.org/10.1109/66.484277.
Testo completoLeong, Wei Sun, Hao Gong e John T. L. Thong. "Low-Contact-Resistance Graphene Devices with Nickel-Etched-Graphene Contacts". ACS Nano 8, n. 1 (19 dicembre 2013): 994–1001. http://dx.doi.org/10.1021/nn405834b.
Testo completoTAMAI, Terutaka, Masahiro YAMAKAWA e Yuta NAKAMURA. "Effect of Contact Lubricant on Contact Resistance Characteristics — Contact Resistance of Lubricated Surface and Observation of Lubricant Molecules —". IEICE Transactions on Electronics E99.C, n. 9 (2016): 985–91. http://dx.doi.org/10.1587/transele.e99.c.985.
Testo completo