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Klymko, N. R., J. A. Casey, L. Tai, J. A. Fitzsimmons e F. Adar. "Role of Raman Microprobe Spectroscopy in the Characterization of Microelectronic Materials". Microscopy and Microanalysis 7, S2 (agosto 2001): 150–51. http://dx.doi.org/10.1017/s1431927600026829.
Busch, Brett W., Olivier Pluchery, Yves J. Chabal, David A. Muller, Robert L. Opila, J. Raynien Kwo e Eric Garfunkel. "Materials Characterization of Alternative Gate Dielectrics". MRS Bulletin 27, n. 3 (marzo 2002): 206–11. http://dx.doi.org/10.1557/mrs2002.72.
Zhou, Shenglin, Zhaohui Yang e Xiaohua Zhang. "Characterization tools of thin polymer films". International Journal of Modern Physics B 32, n. 18 (15 luglio 2018): 1840007. http://dx.doi.org/10.1142/s0217979218400076.
Huang, Zhiheng, Ziyan Liao, Kaiwen Zheng, Xin Zeng, Yuezhong Meng, Hui Yan e Yang Liu. "Microstructural Hierarchy Descriptor Enabling Interpretative AI for Microelectronic Failure Analysis". EDFA Technical Articles 26, n. 2 (1 maggio 2024): 10–18. http://dx.doi.org/10.31399/asm.edfa.2024-2.p010.
Mouro, João, Rui Pinto, Paolo Paoletti e Bruno Tiribilli. "Microcantilever: Dynamical Response for Mass Sensing and Fluid Characterization". Sensors 21, n. 1 (27 dicembre 2020): 115. http://dx.doi.org/10.3390/s21010115.
Murray, Conal E., A. J. Ying, S. M. Polvino, I. C. Noyan e Z. Cai. "Nanoscale strain characterization in microelectronic materials using X-ray diffraction". Powder Diffraction 25, n. 2 (giugno 2010): 108–13. http://dx.doi.org/10.1154/1.3394205.
Jansen, K. M. B., V. Gonda, L. J. Ernst, H. J. L. Bressers e G. Q. Zhang. "State-of-the-Art of Thermo-Mechanical Characterization of Thin Polymer Films". Journal of Electronic Packaging 127, n. 4 (22 dicembre 2004): 530–36. http://dx.doi.org/10.1115/1.2070092.
Guégan, Hervé. "Use of a Nuclear Microprobe in Electronic Device Characterization". EDFA Technical Articles 9, n. 4 (1 novembre 2007): 14–19. http://dx.doi.org/10.31399/asm.edfa.2007-4.p014.
Ruales, Mary, e Kinzy Jones. "Characterization of silicate sensors on Low Temperature Cofire Ceramic (LTCC) substrates using DSC and XRD techniques". International Symposium on Microelectronics 2012, n. 1 (1 gennaio 2012): 000598–603. http://dx.doi.org/10.4071/isom-2012-wa31.
Nguyen, T. K., L. M. Landsberger, V. Logiudice e C. Jean. "Electrical characterization of fluorine-implanted gate oxide structures". Canadian Journal of Physics 74, S1 (1 dicembre 1996): 74–78. http://dx.doi.org/10.1139/p96-836.
Coppola, Giuseppe, e Maria Antonietta Ferrara. "Polarization-Sensitive Digital Holographic Imaging for Characterization of Microscopic Samples: Recent Advances and Perspectives". Applied Sciences 10, n. 13 (29 giugno 2020): 4520. http://dx.doi.org/10.3390/app10134520.
Drouin, D., J. Beauvais e R. Gauvin. "Characterization of Variations in Schottky Barrier Height in Semiconductor Devices using EBIC Technique". Microscopy and Microanalysis 3, S2 (agosto 1997): 501–2. http://dx.doi.org/10.1017/s1431927600009399.
Malisz, Klaudia, Beata Świeczko-Żurek e Alina Sionkowska. "Preparation and Characterization of Diamond-like Carbon Coatings for Biomedical Applications—A Review". Materials 16, n. 9 (27 aprile 2023): 3420. http://dx.doi.org/10.3390/ma16093420.
Sciuto, Emanuele Luigi, Corrado Bongiorno, Antonino Scandurra, Salvatore Petralia, Tiziana Cosentino, Sabrina Conoci, Fulvia Sinatra e Sebania Libertino. "Functionalization of Bulk SiO2 Surface with Biomolecules for Sensing Applications: Structural and Functional Characterizations". Chemosensors 6, n. 4 (30 novembre 2018): 59. http://dx.doi.org/10.3390/chemosensors6040059.
Beers, Kimberly, Andrew E. Hollowell e G. Bahar Basim. "Thin Film Characterization on Cu/SnAg Solder Interface for 3D Packaging Technologies". MRS Advances 5, n. 37-38 (2020): 1929–35. http://dx.doi.org/10.1557/adv.2020.309.
Hoummada, Khalid, Dominique Mangelinck e Alain Portavoce. "Kinetic of Formation of Ni and Pd Silicides: Determination of Interfacial Mobility and Interdiffusion Coefficient by In Situ Techniques". Solid State Phenomena 172-174 (giugno 2011): 640–45. http://dx.doi.org/10.4028/www.scientific.net/ssp.172-174.640.
Cara, Eleonora, Irdi Murataj, Gianluca Milano, Natascia De Leo, Luca Boarino e Federico Ferrarese Lupi. "Recent Advances in Sequential Infiltration Synthesis (SIS) of Block Copolymers (BCPs)". Nanomaterials 11, n. 4 (13 aprile 2021): 994. http://dx.doi.org/10.3390/nano11040994.
Kumar, Ashok. "Functional Nanomaterials: From Basic Science to Emerging Applications". Solid State Phenomena 201 (maggio 2013): 1–19. http://dx.doi.org/10.4028/www.scientific.net/ssp.201.1.
Gauvin, Raynald, Mario Caron, Vincent Fortin e John F. Currie. "Characterization of Multilayered Structures Using a FEGSEM and X-Ray Microanalysis". Microscopy and Microanalysis 3, S2 (agosto 1997): 463–64. http://dx.doi.org/10.1017/s143192760000920x.
Trulli, Susan, Craig Armiento, Christopher Laighton, Elicia Harper, Mahdi Haghzadeh e Alkim Akyurtlu. "Additive Packaging for Microwave Applications". International Symposium on Microelectronics 2017, n. 1 (1 ottobre 2017): 000768–72. http://dx.doi.org/10.4071/isom-2017-thp53_148.
Pagan, Darren C., Md A. J. Rasel, Rachel E. Lim, Dina Sheyfer, Wenjun Liu e Aman Haque. "Non-destructive depth-resolved characterization of residual strain fields in high electron mobility transistors using differential aperture x-ray microscopy". Journal of Applied Physics 132, n. 14 (14 ottobre 2022): 144503. http://dx.doi.org/10.1063/5.0109606.
Portavoce, Alain, Khalid Hoummada e Lee Chow. "Coupling Secondary Ion Mass Spectrometry and Atom Probe Tomography for Atomic Diffusion and Segregation Measurements". Microscopy and Microanalysis 25, n. 2 (30 gennaio 2019): 517–23. http://dx.doi.org/10.1017/s1431927618015623.
Mustafa, M. K., U. Majeed e Y. Iqbal. "Effect on Silicon Nitride thin Films Properties at Various Powers of RF Magnetron Sputtering". International Journal of Engineering & Technology 7, n. 4.30 (30 novembre 2018): 39. http://dx.doi.org/10.14419/ijet.v7i4.30.22000.
Booth, James C., Nathan Orloff, Christian Long, Aaron Hagerstrom, Angela Stelson, Nicholas Jungwirth e Luckshitha Suriyasena Liyanage. "(Invited, Digital Presentation) Nonlinear and Electro-Thermo-Mechanical Effects in Heterogeneous Electronics at Microwave Frequencies". ECS Meeting Abstracts MA2022-02, n. 17 (9 ottobre 2022): 862. http://dx.doi.org/10.1149/ma2022-0217862mtgabs.
Youngman, R. A. "The Critical Role of Microscopy and Spectroscopy in the Development of New Materials for Microelectronics Packaging". Proceedings, annual meeting, Electron Microscopy Society of America 54 (11 agosto 1996): 634–35. http://dx.doi.org/10.1017/s042482010016563x.
Arikpo, John U., e Michael U. Onuu. "Graphene Growth and Characterization: Advances, Present Challenges and Prospects". Journal of Materials Science Research 8, n. 4 (30 settembre 2019): 37. http://dx.doi.org/10.5539/jmsr.v8n4p37.
Hu, Xiao-Yu, Jun Ouyang, Guo-Chang Liu, Meng-Juan Gao, Lai-Bo Song, Jianfeng Zang e Wei Chen. "Synthesis and Characterization of the Conducting Polymer Micro-Helix Based on the Spirulina Template". Polymers 10, n. 8 (7 agosto 2018): 882. http://dx.doi.org/10.3390/polym10080882.
Szocinski, Michal. "AFM-assisted investigation of conformal coatings in electronics". Anti-Corrosion Methods and Materials 63, n. 4 (6 giugno 2016): 289–94. http://dx.doi.org/10.1108/acmm-09-2014-1426.
Pantel, R., G. Mascarin e G. Auvert. "Defect Analysis and Process Development of Microelectronics Devices Using Focused Ion Beam and Energy Filtering Transmission Electron Microscopy." Microscopy and Microanalysis 5, S2 (agosto 1999): 900–901. http://dx.doi.org/10.1017/s1431927600017827.
Fritz, Mathias, Christian Elieser Hoess, Finn-Merlin Deckert e Andreas Bund. "Light-Induced Platinum Deposition on Silicon-Based Semiconductor Devices". ECS Meeting Abstracts MA2023-02, n. 20 (22 dicembre 2023): 1217. http://dx.doi.org/10.1149/ma2023-02201217mtgabs.
Lamia, Zarral, Djahli Farid e Ndagijimana Fabien. "Technique of Coaxial Frame in Reflection for the Characterization of Single and Multilayer Materials with Correction of Air Gap". International Journal of Antennas and Propagation 2014 (2014): 1–9. http://dx.doi.org/10.1155/2014/324727.
Baczyński, Szymon, Piotr Sobotka, Kasper Marchlewicz, Artur Dybko e Katarzyna Rutkowska. "Low-cost, widespread and reproducible mold fabrication technique for PDMS-based microfluidic photonic systems". Photonics Letters of Poland 12, n. 1 (31 marzo 2020): 22. http://dx.doi.org/10.4302/plp.v12i1.981.
Warczak, Magdalena, Marianna Gniadek, Kamil Hermanowski e Magdalena Osial. "Well-defined polyindole–Au NPs nanobrush as a platform for electrochemical oxidation of ethanol". Pure and Applied Chemistry 93, n. 4 (1 aprile 2021): 497–507. http://dx.doi.org/10.1515/pac-2020-1101.
Basit, M., M. Aslam, M. Ahmad e Z. A. Raza. "Structural, thermal and optoelectrical study of PVA/iron oxide nanocomposite films". Materialwissenschaft und Werkstofftechnik 55, n. 4 (aprile 2024): 455–65. http://dx.doi.org/10.1002/mawe.202300075.
Stefani, G. G., N. S. Goel e D. B. Jenks. "An Efficient Numerical Technique for Thermal Characterization of Printed Wiring Boards". Journal of Electronic Packaging 115, n. 4 (1 dicembre 1993): 366–72. http://dx.doi.org/10.1115/1.2909345.
Das, Rabindra, Steven Rosser e Frank Egitto. "Advanced Microelectronics Packaging Solutions for Miniaturized Medical Devices". Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) 2013, DPC (1 gennaio 2013): 001963–76. http://dx.doi.org/10.4071/2013dpc-tha24.
Cruz-Quesada, Guillermo, Maialen Espinal-Viguri, María Victoria López-Ramón e Julián J. Garrido. "Novel Silica Hybrid Xerogels Prepared by Co-Condensation of TEOS and ClPhTEOS: A Chemical and Morphological Study". Gels 8, n. 10 (20 ottobre 2022): 677. http://dx.doi.org/10.3390/gels8100677.
Alves, L. C., V. Corregidor, T. Pinheiro e L. Ferreira. "Ion Beam Microscopy: a Tool for Materials". Microscopy and Microanalysis 19, S4 (agosto 2013): 95–96. http://dx.doi.org/10.1017/s1431927613001098.
Bennett, N. S., e N. E. B. Cowern. "Doping characterization for germanium-based microelectronics and photovoltaics using the differential Hall technique". Applied Physics Letters 100, n. 17 (23 aprile 2012): 172106. http://dx.doi.org/10.1063/1.4705293.
Maraj, Mudassar, Ghulam Nabi, Khurram Usman, Engui Wang, Wenwang Wei, Yukun Wang e Wenhong Sun. "High Quality Growth of Cobalt Doped GaN Nanowires with Enhanced Ferromagnetic and Optical Response". Materials 13, n. 16 (11 agosto 2020): 3537. http://dx.doi.org/10.3390/ma13163537.
Pulici, Andrea, Stefano Kuschlan, Gabriele Seguini, Fabiana Taglietti, Marco Fanciulli, Riccardo Chiarcos, Michele Laus e Michele Perego. "Electrical Characterization of Ultra-Thin Silicon-on-Insulator Films Doped By Means of Phosphorus End-Terminated Polymers". ECS Meeting Abstracts MA2023-02, n. 30 (22 dicembre 2023): 1552. http://dx.doi.org/10.1149/ma2023-02301552mtgabs.
Dittman, Timothy, David Ebner e Alex Bailey. "Design of Experiments Approach to Evaluating the Reliability of System-in-Package Assemblies". International Symposium on Microelectronics 2017, n. 1 (1 ottobre 2017): 000619–23. http://dx.doi.org/10.4071/isom-2017-tha52_063.
Tuttle, Bruce A. "Electronic Ceramic Thin Films: Trends in Research and Development". MRS Bulletin 12, n. 7 (novembre 1987): 40–46. http://dx.doi.org/10.1557/s0883769400066938.
Leofanti, G., G. Tozzola, M. Padovan, G. Petrini, S. Bordiga e A. Zecchina. "Catalyst characterization: characterization techniques". Catalysis Today 34, n. 3-4 (febbraio 1997): 307–27. http://dx.doi.org/10.1016/s0920-5861(96)00056-9.
Eckert, Hellmut, e Manfred Rühle. "Characterization techniques". Current Opinion in Solid State and Materials Science 5, n. 2-3 (aprile 2001): 193–94. http://dx.doi.org/10.1016/s1359-0286(01)00018-3.
Fischer, John E., e Hellmut Eckert. "Characterization techniques". Current Opinion in Solid State and Materials Science 1, n. 4 (agosto 1996): 463–64. http://dx.doi.org/10.1016/s1359-0286(96)80059-3.
Eckert, Hellmut, e Manfred Rühle. "Characterization techniques". Current Opinion in Solid State and Materials Science 2, n. 4 (agosto 1997): 463–64. http://dx.doi.org/10.1016/s1359-0286(97)80090-3.
Stern, Edward A., e Richard W. Siegel. "Characterization techniques". Current Opinion in Solid State and Materials Science 4, n. 4 (agosto 1999): 321–23. http://dx.doi.org/10.1016/s1359-0286(99)00042-x.
Fournel, Frank, Loic Sanchez, Brigitte Montmayeul, Gaëlle Mauguen, Laurent Bally, Vincent Larrey, Christophe Morales et al. "(Invited) Optoelectronic and 3D Applications with Die to Wafer Direct Bonding: From Mechanisms to Applications". ECS Meeting Abstracts MA2022-02, n. 17 (9 ottobre 2022): 853. http://dx.doi.org/10.1149/ma2022-0217853mtgabs.
Rogers, John A., Martin Fuchs, Matthew J. Banet, John B. Hanselman, Randy Logan e Keith A. Nelson. "Optical system for rapid materials characterization with the transient grating technique: Application to nondestructive evaluation of thin films used in microelectronics". Applied Physics Letters 71, n. 2 (14 luglio 1997): 225–27. http://dx.doi.org/10.1063/1.119506.