Tesi sul tema "AFM"
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Cooper, Katherine. "AFM and C-AFM Studies of GaN Films". VCU Scholars Compass, 2005. http://scholarscompass.vcu.edu/etd/1246.
Testo completoRossell, Jacqueline. "Protein immobilisation for AFM". Thesis, University of Nottingham, 2003. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.404144.
Testo completoLee, Sunyoung S. M. Massachusetts Institute of Technology. "Chemical functionalization of AFM cantilevers". Thesis, Massachusetts Institute of Technology, 2005. http://hdl.handle.net/1721.1/34205.
Testo completoIncludes bibliographical references (p. 47-52).
Atomic force microscopy (AFM) has been a powerful instrument that provides nanoscale imaging of surface features, mainly of rigid metal or ceramic surfaces that can be insulators as well as conductors. Since it has been demonstrated that AFM could be used in aqueous environment such as in water or various buffers from which physiological condition can be maintained, the scope of the application of this imaging technique has been expanded to soft biological materials. In addition, the main usage of AFM has been to image the material and provide the shape of surface, which has also been diversified to molecular-recognition imaging - functional force imaging through force spectroscopy and modification of AFM cantilevers. By immobilizing of certain molecules at the end of AFM cantilever, specific molecules or functionalities can be detected by the combination of intrinsic feature of AFM and chemical modification technique of AFM cantilever. The surface molecule that is complementary to the molecule at the end of AFM probe can be investigated via specificity of molecule-molecule interaction.
(cont.) Thus, this AFM cantilever chemistry, or chemical functionalization of AFM cantilever for the purpose of chemomechanical surface characterization, can be considered as an infinite source of applications important to understanding biological materials and material interactions. This thesis is mainly focused on three parts: (1) AFM cantilever chemistry that introduces specific protocols in details such as adsorption method, gold chemistry, and silicon nitride cantilever modification; (2) validation of cantilever chemistry such as X-ray photoelectron spectroscopy (XPS), AFM blocking experiment, and fluorescence microscopy, through which various AFM cantilever chemistry is verified; and (3) application of cantilever chemistry, especially toward the potential of force spectroscopy and the imaging of biological material surfaces.
by Sunyoung Lee.
S.M.
Subedi, Laxmi P. "AFM Tip-Graphene-Surface Interactions". University of Akron / OhioLINK, 2010. http://rave.ohiolink.edu/etdc/view?acc_num=akron1291144388.
Testo completoHegrová, Veronika. "Aplikace korelativní AFM/SEM mikroskopie". Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2019. http://www.nusl.cz/ntk/nusl-402580.
Testo completoAndersen, Christopher. "The construction of carbon nanotube AFM probes for high resolution AFM of novel biological systems". Thesis, University of Nottingham, 2004. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.421480.
Testo completoSonnenberg, Lars. "AFM-basierte Desorption einzelner oberflächenadsorbierter Polyelektrolyte". Diss., lmu, 2007. http://nbn-resolving.de/urn:nbn:de:bvb:19-76109.
Testo completoFilip-Boar, Diana. "AFM-CSLM microrheology of aggregated emulsions". Enschede : University of Twente [Host], 2006. http://doc.utwente.nl/56171.
Testo completoGröger, Roland. "Nanokontaktdrucken mit AFM-gesteuert phasenseparierten Blockcopolymerschichten". Karlsruhe Forschungszentrum Karlsruhe, 2006. http://d-nb.info/986521612/34.
Testo completoFILHO, HENRIQUE DUARTE DA FONSECA. "METALLIC NANOSTRUCTURE FABRICATION BY AFM LITHOGRAPHY". PONTIFÍCIA UNIVERSIDADE CATÓLICA DO RIO DE JANEIRO, 2004. http://www.maxwell.vrac.puc-rio.br/Busca_etds.php?strSecao=resultado&nrSeq=6061@1.
Testo completoNesta dissertação de mestrado, nós desenvolvemos um processo de litografia baseado na técnica de microscopia de força atômica. O estudo do processo de litografia aqui utilizado inicia-se com a deposição e caracterização de filmes finos de sulfeto de arsênio amorfo (a-As2S3) em substratos de silício e a deposição de uma camada metálica de alumínio, utilizada como máscara, sobre a superfície do a-As2S3. O microscópio de força atômica é utilizado para escrever os padrões de forma controlada na camada metálica, e para tal, a influencia dos parâmetros de controle do microscópio na realização da litografia foi analisada. Para a transferência do padrão litografado realiza-se um posterior processo de fotossensibilização e dissolução química do a-As2S3 com uma solução de K2CO3. Após a dissolução, uma camada de ouro foi depositada por erosão catódica DC, seguido de uma nova dissolução, desta vez com NaOH resultando na transferência de nanoestruturas de Au para o substrato de silício.
In this dissertation, we have developed a lithography process based on the atomic force microscopy of technique. The study of the lithography process starts with the deposition and characterization of amorphous arsenic sulfide thin films (a-As2S3) in silicon substrates and the deposition of a metallic aluminum layer, used as mask, on the surface of the a-As2S3. An atomic force microscope was used to write patterns in a controlled way on the metallic layer. Therefore, the influence of microscope feedback system on the accomplishment of the lithography was analyzed. In order to transfer the lithographed pattern to a silicon substrate, the a- As2S3 was exposed to a UV light source and was dissolved with a K2CO3 solution. Then, a thin gold layer was deposited by sputtering DC, and a new dissolution, now with NaOH was performed, leading to the deposition of Au nanostructures onto the silicon substrate.
Podgaynyy, Nikolay [Verfasser]. "AFM-Untersuchungen auf Elektrodenoberflächen / Nikolay Podgaynyy". Bonn : Universitäts- und Landesbibliothek Bonn, 2013. http://d-nb.info/1044971282/34.
Testo completoRudnicki, Kamil. "MOSFET transistor fabrication on AFM tip". Thesis, University of Glasgow, 2014. http://theses.gla.ac.uk/5398/.
Testo completoTurner, Ian James. "AFM investigations of critical interactions in the Bacillus primosome and Cryogenic AFM : a new tool for structural biology". Thesis, University of Nottingham, 2006. http://eprints.nottingham.ac.uk/10188/.
Testo completoMege, Fabrice. "AFM à contact résonant : développement et modélisation". Phd thesis, Université de Grenoble, 2011. http://tel.archives-ouvertes.fr/tel-00618676.
Testo completoHugel, Thorsten. "Towards Synthetic Molecular Motors Interfaced by AFM". Diss., lmu, 2003. http://nbn-resolving.de/urn:nbn:de:bvb:19-8157.
Testo completoKufer, Stefan. "AFM-basierte Assemblierung biomolekularer Bausteine auf Festkörperoberflächen". Diss., lmu, 2008. http://nbn-resolving.de/urn:nbn:de:bvb:19-96805.
Testo completoRivera, Ahlin Alexander. "Noise squeezing and parametricamplication in dynamic AFM". Thesis, KTH, Tillämpad fysik, 2018. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-225974.
Testo completoRieger, Johannes. "AFM manipulation of damping in nanomechanical resonators". Diss., Ludwig-Maximilians-Universität München, 2013. http://nbn-resolving.de/urn:nbn:de:bvb:19-159621.
Testo completoSamsuri, Fahmi B. "Single Cell analysis using AtomicForce Microscopy (AFM)". Thesis, University of Canterbury. Electrical and Computer Engineering, 2010. http://hdl.handle.net/10092/5516.
Testo completoPearson, Anita P. "AFM investigation of single molecule force measurements". Thesis, University of Nottingham, 2007. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.441016.
Testo completoElkaseh, Akram Abdulsalam. "Fabrication of Josephson junctions using AFM nanolithography". Thesis, Stellenbosch : University of Stellenbosch, 2010. http://hdl.handle.net/10019.1/5421.
Testo completoDissertation presented for the degree of Doctor of Philosophy in Engineering at the University of Stellenbosch
ENGLISH ABSTRACT: Planar weak link structures, such as micro-bridges, variable thickness bridges and nanobridges, have always attracted a lot of attention. Their potential to behave as real Josephson elements make them useful devices, with numerous applications. Powerful techniques, such as focused ion-beam and electron-beam lithography, were successfully used and are well understood in planar weak link structure fabrication. In this dissertation the results of an experimental study on planar weak link structures are presented. For the first time these structures have been successfully fabricated using AFM nanolithography on hard high-temperature superconducting YBCO tracks, where diamond coated silicon tips were used as a ploughing tool. Superconducting YBCO thin films were deposited on different substrates, using inverted cylindrical magnetron sputtering. The films were used to fabricate micro-bridges, variable thickness bridges and nano-bridges, by using conventional photolithography, argon ion-beam milling and AFM nanolithography. The measured I-V characteristics of the fabricated micro-bridges (width down to 1.9 µm), variable thickness bridges (thickness down to 15 nm) and nano-bridge (width down to 490 nm) showed well defined DC and AC Josephson effect characteristics. For better understanding of the behaviour of these types of weak links, critical current versus temperature measurements, and magnetic field modulation of the critical current measurements, were also performed, with the results and discussions given inside the chapters. The major challenges that were experienced in the laboratory during the fabrication processes and the operation of the fabricated devices are also discussed, with the solutions given where appropriate.
AFRIKAANSE OPSOMMING: Swak-skakel vlakstrukture, soos mikrobr.ue, br.ue met veranderlike dikte en nanobr.ue, het nog altyd baie aandag getrek. Hul het die potensiaal om soos werklike Josephson-elemente te kan funksioneer en is, as gevolg hiervan, nuttige toestelle met veelvuldige toepassings. Kragtige tegnieke, soos gefokuste ioonstraal- en elektronstraal litografie, is suksesvol gebruik en word goed verstaan in die vervaardiging van swak-skakel vlakstrukture. In hierdie proefskrif word die resultate van ¡¦n eksperimentele studie van swak-skakel vlakstrukture voorgel.e. Vir die eerste keer is hierdie strukture suksesvol vervaardig, deur gebruik te maak AFMnanolitografie op harde, ho¡Le-temperatuur supergeleier YBCO (Yttrium Barium Koperoksied) spore, waar diamantbedekte silikonpunte gebruik is as ploeginstrument. ¡¦n Dun lagie van supergeleidende YBCO is op verskillende substrate gedeponeer, deur gebruik te maak van omgekeerde silindriese magnetron verstuiwing. Die dun lagies is gebruik in die vervaardiging van mikrobr.ue, br.ue met veranderlike dikte en nanobr.ue, deur die gebruik van gewone fotolitografie, argon-ioonstraal frees en AFM nanolitografie. Die gemete I-V eienskappe van die vervaardigde mikrobr.ue (met breedte so laag as 1.9 µm), veranderlike-dikte br.ue (dikte tot 15 nm) en nanobr.ue (breedte so min as 490 nm) toon goed gedefinieerde GS en WS eienskappe van die Josephson-effek. Ten einde die gedrag van hierdie tipes swak-skakels beter te kan verstaan, is metings gedoen van kritieke stroom teenoor temperatuur, asook magnetiese veld modulasie van die kritieke stroom. Hierdie resultate en besprekings daarvan word binne die toepaslike hoofstukke aangebied. Die grootste uitdagings wat in die laboratorium, sowel as met die toetsing van die vervaardigde toestelle ondervind is, word ook bespreek. Waar moontlik, word toepaslike oplossings voorgestel.
Pavelec, Jiří. "Vývoj lineárního posuvu pro UHV STM/AFM". Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2011. http://www.nusl.cz/ntk/nusl-229812.
Testo completoJang, Chang-Hyun. "AFM-Assisted Nanofabrication using Self-Assembled Monolayers". Diss., Virginia Tech, 2003. http://hdl.handle.net/10919/11103.
Testo completoPh. D.
Neugirg, Benedikt R., Sean R. Koebley, Hannes C. Schniepp e Andreas Fery. "AFM-based mechanical characterization of single nanofibres". Royal Society of Chemistry, 2016. https://tud.qucosa.de/id/qucosa%3A36361.
Testo completoSwinford, Richard William. "An AFM-SIMS Nano Tomography Acquisition System". PDXScholar, 2017. https://pdxscholar.library.pdx.edu/open_access_etds/3485.
Testo completoKábrtová, Denisa. "Studium vlastností synteticky připraveného thaumasitu". Master's thesis, Vysoké učení technické v Brně. Fakulta stavební, 2018. http://www.nusl.cz/ntk/nusl-372197.
Testo completoKolaja, Filip. "Sledování termodynamické stability ettringitu v závislosti na zvolených vnitřních a vnějších parametrech". Master's thesis, Vysoké učení technické v Brně. Fakulta stavební, 2019. http://www.nusl.cz/ntk/nusl-392342.
Testo completoGamsjaeger, Roland. "AFM and SPR on biological systems applying atomic force microscopy (AFM) and surface plasmon resonance (SPR) to biologically important systems". Saarbrücken VDM Verlag Dr. Müller, 2007. http://d-nb.info/988909820/04.
Testo completoLe, Sueur Hélène. "Un AFM-STM cryogénique pour la physique mésoscopique". Phd thesis, Université Pierre et Marie Curie - Paris VI, 2007. http://tel.archives-ouvertes.fr/tel-00261434.
Testo completoAu cours de cette thèse, nous avons développé un microscope permettant d'effectuer la spectroscopie tunnel résolue spatialement (10 nm) de nanocircuits individuels, avec une résolution en énergie inégalée (10 µeV). Cet appareil combine les fonctions de Microscopie par Force Atomique (mode AFM) et de spectroscopie Tunnel locale (mode STM), et fonctionne à 30 mK. Dans le mode AFM, la topographie de l'échantillon est imagée grâce à un diapason en quartz piézoélectrique, ce qui permet de repérer les circuits. La spectroscopie tunnel peut ensuite être faite sur les zones conductrices.
Avec ce microscope, nous avons mesuré la DoS locale dans une structure hybride Supraconducteur-métal Normal-Supraconducteur (S-N-S). Dans un tel circuit, les propriétés électroniques de N et de S sont modifiées par l'effet de proximité supraconducteur. Notamment, pour des fils N courts, nous avons pu observer -comme prédit- la présence d'un gap dans sa DoS, indépendant de la position dans la structure : le “minigap”. De plus, en modulant la phase supraconductrice entre les deux S, nous avons mesuré la modification de ce gap, et sa disparition lorsque la différence de phase vaut π.
Nos résultats expérimentaux pour la DoS, ainsi que ses dépendances en phase, en position, et en longueur de N sont en accord quantitatif avec les prédictions de la théorie quasiclassique de la supraconductivité. Certaines de ces prédictions sont observées pour la première fois.
Oral, Hasan Giray. "Modeling time-resolved interaction force mode AFM imaging". Thesis, Georgia Institute of Technology, 2012. http://hdl.handle.net/1853/43691.
Testo completoGröger, Roland [Verfasser]. "Nanokontaktdrucken mit AFM-gesteuert phasenseparierten Blockcopolymerschichten / Roland Gröger". Karlsruhe : Forschungszentrum Karlsruhe, 2007. http://d-nb.info/986521612/34.
Testo completoRamanujan, Chandra Sekar. "AFM and nanomechanics in ambient and liquid environments". Thesis, University of Oxford, 2004. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.414222.
Testo completoDunlop, Alex William. "Towards polymer sequencing using AFM-based force spectroscopy". Thesis, University of Bristol, 2008. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.493471.
Testo completoÁlvarez-Asencio, Rubén. "Nanotribology, Surface Interactions and Characterization : An AFM Study". Doctoral thesis, KTH, Yt- och korrosionsvetenskap, 2014. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-145727.
Testo completoQC 20140603
Elmouelhi, Ahmed (Ahmed M. ). 1979. "Genome scanning : an AFM-based DNA sequencing technique". Thesis, Massachusetts Institute of Technology, 2003. http://hdl.handle.net/1721.1/34149.
Testo completoIncludes bibliographical references (p. 157-160).
Genome Scanning is a powerful new technique for DNA sequencing. The method presented in this thesis uses an atomic force microscope with a functionalized cantilever tip to sequence single stranded DNA immobilized to a mica surface. The functionalized cantilever tip hybridizes with only one base type (A, C, T, or G) and results in distinct peaks in the AFM-produced image. Genome Scanning has been successful at identifying 40 base strands of synthesized DNA and has been shown to detect a particular base type on 48 kilobase strands of lambda DNA. Currently, Genome Scanning is only accurate to 3-26 bases at a time, however, it can achieve a sequencing speed of 6000 bases/sec. In other words, Genome Scanning can be used to sequence the 3 billion bases of the human genome in 5.78 days.
by Ahmed Elmouelhi.
S.M.
Wang, XiuZhu. "Investigation of biological and chemical interactions by AFM". Thesis, University of Cambridge, 2004. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.615986.
Testo completoPinto, Diego Kops. "Nano-oxidação do silício utilizando sonda de AFM". Universidade de São Paulo, 2007. http://www.teses.usp.br/teses/disponiveis/3/3140/tde-09012008-154136/.
Testo completoLocal anodic oxidation of silicon using Atomic Force Microscopy (AFM) was investigated by applying a negative voltage between silicon nitride tip and Si surfaces. All samples were cleaned with an ammonium-based solution known in literature as standard cleaning 1 (SC1) or a dip in a diluted hydrofluoric acid solution followed by SC1 or, also, boiling in isopropyl alcohol. Localized squares patterns of oxide, 0.25 µm² in area, were formed by growing parallel lines with constant interlinear spacing and length and several scans in the same area. From AFM analysis with non-biased tip, it was obtained 3D and section profiles, which were used to obtain the oxide thickness as a function of the applied voltage, number of scans and interval of time after SC1 cleaning. It was noteworthy that thickness increases with the applied negative voltage and with the number of scans. Simulations were performed in order to model voltage and electric field distributions of the system tip-air-silicon or tip-air-oxide-silicon(substrate) indicating a local oxidation assisted by high electrical field and local ionic diffusion of species. It was simulated the effect of tip termination, circular or sharpen, on the electric field and voltage distributions. In addition, oxidations were performed using Au coated tips onto Si surfaces previously dipped in diluted hydrofluoric acid solution followed or not by SC1 cleaning process. Finally, infrared absorption analysis (FTIR) were performed in order to analise the structure of the obtained anodic oxides. The anodic oxidation using silicon nitride tips has occurred only after SC1 precleaning step, being catalized by high electric field (_ 106 V/cm), having as reagents, the adsorbed water species and hydrolized native oxide on the surface after the SC1 cleaning step.
Eskandari, K., e H. Ghourchian. "AFM Investigation of Epoxy Fracture Surfaces Indicating Nanoplasticity". Thesis, Sumy State University, 2015. http://essuir.sumdu.edu.ua/handle/123456789/42511.
Testo completoHaba, D., M. Barbezat e A. J. Brunner. "AFM Investigation of Epoxy Fracture Surfaces Indicating Nanoplasticity". Thesis, Sumy State University, 2015. http://essuir.sumdu.edu.ua/handle/123456789/42653.
Testo completoWang, Jialin. "AFM surface force measurements between hydrophobized gold surfaces". Diss., Virginia Tech, 2008. http://hdl.handle.net/10919/29031.
Testo completoPh. D.
LI, LI. "NANOSCALE CHARGE DENSITY MEASUREMENT IN LIQUID WITH AFM". Case Western Reserve University School of Graduate Studies / OhioLINK, 2020. http://rave.ohiolink.edu/etdc/view?acc_num=case1599744539112356.
Testo completoSchwab, Lucien. "Sonde opto-mécaniques pour la microscopie AFM rapide". Thesis, Toulouse, INSA, 2020. http://www.theses.fr/2020ISAT0016.
Testo completoIn the field of microscopy, the atomic force microscope (AFM) invented in 1986 was brought little, but nonetheless impressive, incremental developments since then. This instrument’s performances, and in particular imaging speed, are mainly limited by its cantilever-type force probe whose resonance frequency peaks at a few MHz. This thesis work presents a new concept of AFM probe, an optomechanical (OM) one, and custom instrument’s components to exploit its performances. Indeed, the 100+ MHz vibrating OM probes tested in this manuscript demonstrate an exquisite thermomechanical limit of detection of 4.5x1E-17 m/√Hz at room temperature, lower than any other AFM probe detection, and an instrument-limited 10 pm vibration amplitude. This OM probe consists of a suspended silicon ring with a 10 µm radius, acting as a mechanical resonator and a whispering-gallery-mode optical resonator. The two are intimately coupled by the ring shape: when the ring vibrates in a breathing mode, the optical cavity length varies and so does its resonance wavelength around its central value 1.55 µm. Characterization of numerous OM probes with different designs are investigated to find optimal designs, that is a 100 nm to 200 nm evanescent-coupling-gap and spokes width below 100 nm. Through deep characterization, acute phenomenon is also highlighted as the super-mode. Two alternatives to put the probe in vibration are compared: capacitive and optical. Stability and noise study of the probe help identify an additional noise source in optical actuation, that seem to be related to the optical background signal. Each developed component of the AFM instrument is detailed from piezoelectric scanner to data acquisition and processing. Because of a fabrication technological lock, the tip of the OM probe could not approach any surface as it did not protrude from the substrate on which the probe is made. A conventional AFM lever is therefore used to interact mechanically with the AFM probe. The instrument’s bandwidth is then characterized in operation, demonstrating a state-of-the-art 100 kHz feedback-loop bandwidth. Finally, a first pseudo-image is achieved with such probes, demonstrating the whole instrument operation
Starr, Michael J. "AFM-FTIR A New Technique for Materials Characterization /". Cincinnati, Ohio : University of Cincinnati, 2008. http://rave.ohiolink.edu/etdc/view.cgi?acc_num=ucin1227192819.
Testo completoAdvisor: James Boerio. Title from electronic thesis title page (viewed Feb.16, 2009). Includes abstract. Keywords: AFM; FTIR spectroscopy; atomic force microscopy; interphase; adhesive analysis; interferogram. Includes bibliographical references.
Dickinson, Laura Rickard. "Characterization of Interfacial Interactions By Functionalized Afm Probes". W&M ScholarWorks, 2016. https://scholarworks.wm.edu/etd/1477067892.
Testo completoPospíšilová, Klára. "Studium vlastností thaumasitu v dlouhodobém horizontu". Master's thesis, Vysoké učení technické v Brně. Fakulta stavební, 2018. http://www.nusl.cz/ntk/nusl-372084.
Testo completoDI, SANTO GIOVANNI. "Functionalization of c-Silicon surfaces for nanoscopic devices". Doctoral thesis, La Sapienza, 2005. http://hdl.handle.net/11573/917310.
Testo completoMutschler, Tina. "Charakterisierung bio- und chemosensitiver Schichten mit Ellipsometrie und AFM". [S.l. : s.n.], 2004. http://deposit.ddb.de/cgi-bin/dokserv?idn=972308059.
Testo completoSarangapani, Krishna Kumar. "Characterizing selectin-ligand bonds using atomic force microscopy (AFM)". Diss., Georgia Institute of Technology, 2005. http://hdl.handle.net/1853/11650.
Testo completoIden, Simon Riis. "Exploring possibilities in AFM studies of InAs/GaAs QDs". Thesis, Norges teknisk-naturvitenskapelige universitet, Institutt for fysikk, 2012. http://urn.kb.se/resolve?urn=urn:nbn:no:ntnu:diva-16356.
Testo completoMihai, Nicoleta D. "UV/Ozone Cleaning Studies of AFM Force Sensor Tips". Fogler Library, University of Maine, 2006. http://www.library.umaine.edu/theses/pdf/MihaiND2006.pdf.
Testo completo