Littérature scientifique sur le sujet « Telegraph process »
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Articles de revues sur le sujet "Telegraph process"
NOAKES, RICHARD J. « Telegraphy is an occult art : Cromwell Fleetwood Varley and the diffusion of electricity to the other world ». British Journal for the History of Science 32, no 4 (décembre 1999) : 421–59. http://dx.doi.org/10.1017/s0007087499003763.
Texte intégralRatanov, Nikita, et Mikhail Turov. « On Local Time for Telegraph Processes ». Mathematics 11, no 4 (12 février 2023) : 934. http://dx.doi.org/10.3390/math11040934.
Texte intégralPogorui, Anatoliy A., Anatoliy Swishchuk et Ramón M. Rodríguez-Dagnino. « Transformations of Telegraph Processes and Their Financial Applications ». Risks 9, no 8 (17 août 2021) : 147. http://dx.doi.org/10.3390/risks9080147.
Texte intégralORSINGHER, E., et XUELEI ZHAO. « THE SPACE-FRACTIONAL TELEGRAPH EQUATION AND THE RELATED FRACTIONAL TELEGRAPH PROCESS ». Chinese Annals of Mathematics 24, no 01 (janvier 2003) : 45–56. http://dx.doi.org/10.1142/s0252959903000050.
Texte intégralBshouty, Daoud, Antonio Di Crescenzo, Barbara Martinucci et Shelemyahu Zacks. « Generalized Telegraph Process with Random Delays ». Journal of Applied Probability 49, no 3 (septembre 2012) : 850–65. http://dx.doi.org/10.1239/jap/1346955338.
Texte intégralDi Crescenzo, Antonio, Antonella Iuliano, Barbara Martinucci et Shelemyahu Zacks. « Generalized Telegraph Process with Random Jumps ». Journal of Applied Probability 50, no 2 (juin 2013) : 450–63. http://dx.doi.org/10.1239/jap/1371648953.
Texte intégralBshouty, Daoud, Antonio Di Crescenzo, Barbara Martinucci et Shelemyahu Zacks. « Generalized Telegraph Process with Random Delays ». Journal of Applied Probability 49, no 03 (septembre 2012) : 850–65. http://dx.doi.org/10.1017/s002190020000958x.
Texte intégralDi Crescenzo, Antonio, Antonella Iuliano, Barbara Martinucci et Shelemyahu Zacks. « Generalized Telegraph Process with Random Jumps ». Journal of Applied Probability 50, no 02 (juin 2013) : 450–63. http://dx.doi.org/10.1017/s0021900200013486.
Texte intégralD'Arrigo, A., G. Falci et E. Paladino. « Dynamical decoupling of random telegraph noise in a two-qubit gate ». International Journal of Quantum Information 12, no 02 (mars 2014) : 1461008. http://dx.doi.org/10.1142/s0219749914610085.
Texte intégralWoods, Robert O. « A Cable to Shrink the Earth ». Mechanical Engineering 133, no 01 (1 janvier 2011) : 40–44. http://dx.doi.org/10.1115/1.2011-jan-5.
Texte intégralThèses sur le sujet "Telegraph process"
Iuliano, Antonella. « Analysis of a birth and death process with alternating rates and of a telegraph process with underlying random walk ». Doctoral thesis, Universita degli studi di Salerno, 2012. http://hdl.handle.net/10556/311.
Texte intégralMy thesis for the Doctoral Programme in Mathematics (November 1, 2008 - October 31, 2011) at University of Salerno, Italy, has been oriented to the analysis of two stochastic models, with particular emphasis on the de- termination of their probability laws and related properties. The discussion of the doctoral dissertation will be given in 20 March 2012. The first part of the thesis is devoted to the analysis of a birth and death process with alternating rates. We recall that an extensive survey on birth- death processes (BDP) has been provided by Parthasarathy and Lenin [3]. In this work the authors adopt standard methods of analysis (such as power series technique and Laplace transforms) to find explicit expressions for the transient and stationary distributions of BDPs and provide applications of such results to specific fields (communication systems, chemical and biolog- ical models). In particular, in Section 9 they use BDPs to describe the time changes in the concentrations of the components of a chemical reaction and discuss the role of BDPs in the study of diatomic molecular chains. More- over, the paper by StockMayer et al. [4] gives an example of application of stochastic processes in the study of chain molecular diffusion. In this work a molecule is modeled as a freely-joined chain of two regularly alternating kinds of atoms. All bonds have the same length but the two kinds of atoms have alternating jump rates, i.e. the forward and backward jump rates for even labeled beads are α and β, respectively, and these rates are reversed for odd labeled beads. The authors obtain the exact timedependent aver- age length of bond vectors. Inspired by this works, Conolly [1] studied an infinitely long chain of atoms joined by links of equal length. The links are assumed to be subject to random shocks, that force the atoms to move and the molecule to diffuse. The shock mechanism is different according to whether the atom occupies an odd or an even position on the chain. The originating stochastic model is a randomized random walk on the integers with an unusual exponential pattern for the inter-step time intervals. The authors analyze some features of this process and investigate also its queue counterpart, where the walk is confined to the non negative integers. Stimulated by the above researches, a birth and death process N(t) on the integers with a transition rate λ from even states and a possibly different rate μ from odd states has been studied in the first part of the thesis. A de- tailed description of the model is performed, and the Chapman-Kolmogorov equations are introduced. Then, the probability generating functions of even and odd states are then obtained. These allow to evaluate the transition probabilities of the process for arbitrary integer initial state. Certain sym- metry properties of the transition probabilities are also pinpointed. Then, the birth and death process obtained by superimposing a reecting bound- ary in the zero-state is analyzed. In particular, by making use of a Laplace transform approach, the probability of a transition from state 0 or state 1 to the zero-state is obtained. Formulas for mean and variance of both processes are finally provided. The second part of the thesis is devoted to the analysis of a generalized telegraph process with an underlying random walk. The classical telegraph process describes a random motion on the real line characterized by two _nite velocities with opposite directions, where the velocity changes are governed by a time-homogeneous Poisson process (see Orsingher [2]). The novelty in the proposed model consists in the use of new rules for velocity changes, which are now governed by a sequence of Bernoulli trials. This implies that the random times separating consecutive changes of direction of the mov- ing particle have a general distribution and form a non-regular alternating renewal process. Starting from the origin, the running particle performs an alternating motion with velocities c and -v (c; v > 0). The direction of the motion (forward and backward) is determined by the velocity sign. The particle changes the direction according to the outcome of a Bernoulli trial. Hence, this defines a (possibly asymmetric) random walk governing the choice of the velocity at any epoch. By adopting techniques based on renewal theory, the general form of probability law is determined as well as the mean of the process. Furthermore, two instances are investigated in detail, in which the random intertimes between consecutive velocity changes are exponentially distributed with (i) constant rates and with (ii) linearly increasing rates. In the first case, explicit expressions of the transition den- sity and of the conditional mean of the process are expressed as series of Gauss hypergeometric functions. The second case leads to a damped ran- dom motion, for which we obtain the transition density in closed form. It is interesting to note that the latter case yields a logistic stationary density. References [1] Conolly B.W. (1971) On randomized random walks. SIAM Review, 13, 81-99. [2] Orsingher, E. (1990) Probability law, flow functions, maximum distri- bution of wave-governed random motions and their connections with Kirchoff's laws. Stoch. Process. Appl., 34, 49-66. [3] Parthasarathy P.R. and Lenin R.B. (2004) Birth and death process (BDP) models with applications-queueing, communication systems, chemical models, biological models: the state-of the- art with a time- dependent perspective. American Series in Mathematical and Manage- ment Sciences, vol. 51, American Sciences Press, Columbus (2004) [4] Stockmayer W.H., Gobush W. and Norvich R. (1971) Local-jump mod- els for chain dynamics. Pure Appl. Chem., 26, 555-561. NOTE The thesis consists of four chapters: Chapter 1. Some definitions and properties of stochastic processes. Chapter 2. Analysis of birth-death processes on the set of integers, char- acterized by alternating rates. Chapter 3. Results on the standard telegraph process. Chapter 4. Study of the telegraph process with an underlying random walk governing the velocity changes. [edited by author]
X n.s.
Chien, Ming-Hung, et 簡銘宏. « The influence of different process on the Random Telegraph Noise of the NAND Flash Memory ». Thesis, 2018. http://ndltd.ncl.edu.tw/handle/zew6yr.
Texte intégral國立清華大學
積體電路設計與製程開發產業碩士專班
106
In the past two decades, flash memory has played an important role in the storage market, and NAND flash memory has become the best solution for massive storage due to its low cost and high density. However, as the medium CMOS technology progresses, the size of a memory cell becomes smaller and smaller, and the developers face with severe challenges in terms of memory durability, reliability, and device lifetime, when experience frequent erasing and programming during oper-ation. In programming and erasing cycle tests, defects are created on the channel oxide film. These defects occur at the interface between the oxide layer and the substrate which converse to phase noise that affects the per-formance of memory array. The above behavior caused the capture and re-lease of electrons, which in turn changed the current of the channel, lead-ing to random telegraph noise. Also, as the chip size shrinks, signal to noise ratio decreases which cause additional challenges in readout circuit design much more difficult. Therefore, analysis on the influence of process and experiment on random telegraph noise is very important. With the miniaturization of devices, the impact of random telegraph noise cannot be ignored. Therefore, this study employed 1X nanometer NAND flash memory as test subject, and discuss under the circumstances which one can induced random telegraph noise the most easily. Moreover, the effects of different manufacturing processes on RTN on 2D NAND flash memory arrays.
Liao, Chen-Hsuan, et 廖晨瑄. « Modeling the Statistical Variability of Process and Random Telegraph Signals Induced Threshold Voltage Shifts in Nanoscale MOSFETs and FinFETs ». Thesis, 2016. http://ndltd.ncl.edu.tw/handle/33925910257458133100.
Texte intégral國立交通大學
電子研究所
105
The trapping and de-trapping of a single electron at the Si-SiO2 interface of planar bulk metal -oxide-semiconductor field effect transistors (MOSFETs) and fin-shape field effect transistors (FinFETs), which is called random telegraph signals (RTSs), has been a well-known issue for the reliability of the nanoscale device. In this work, with the help of Matlab and 3-D technology-aided design (TCAD), we not only reproduce RTS experimental data but also make a prediction of possible worst case threshold-voltage fluctuation amplitude in both MOSFETs and FinFETs. We also propose a mloc-σloc boundary where mloc and σloc are the mean and the standard deviation, respectively, of the channel local current density. The critical mloc-loc curve divides the plot into the allowed and forbidden region. The allowed region includes all possible (mloc, σloc) sets that help us to reproduce experimental data. Furthermore, we take metal gate granularity (MGG) percolation into account. RTS under MGG percolation causes the device threshold-voltage fluctuating more serious. Necessarily, a large number of simulation tasks are carried out to investigate it. Different device sizes and different average metal grain sizes are considered in this work. By statistics, we can finely reproduce Intel’s data and even give a next-generation guide-line for circuit designers.
Sparre, Kirsten. « Peacemaking journalism at a time of community conflict : The Bradford Telegraph & ; Argus and the Bradford Riots ». 1998. http://hdl.handle.net/10454/2317.
Texte intégralTACI, YLLI. « Il palazzo delle Poste e Telegrafi. Considerazioni sul processo tipologico di un edificio speciale contemporaneo ». Doctoral thesis, 2018. http://hdl.handle.net/11573/1295246.
Texte intégralLivres sur le sujet "Telegraph process"
Ma, Shaoling. The Stone and the Wireless. Duke University Press, 2021. http://dx.doi.org/10.1215/9781478013051.
Texte intégralHeadrick, Daniel R. When Information Came of Age. Oxford University Press, 2001. http://dx.doi.org/10.1093/oso/9780195135978.001.0001.
Texte intégralChapitres de livres sur le sujet "Telegraph process"
Kolesnik, Alexander D., et Nikita Ratanov. « Functionals of Telegraph Process ». Dans Telegraph Processes and Option Pricing, 45–68. Berlin, Heidelberg : Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-40526-6_3.
Texte intégralRatanov, Nikita, et Alexander D. Kolesnik. « Functionals of Telegraph Process ». Dans Telegraph Processes and Option Pricing, 223–96. Berlin, Heidelberg : Springer Berlin Heidelberg, 2022. http://dx.doi.org/10.1007/978-3-662-65827-7_5.
Texte intégralKolesnik, Alexander D., et Nikita Ratanov. « Telegraph Process on the Line ». Dans Telegraph Processes and Option Pricing, 19–44. Berlin, Heidelberg : Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-40526-6_2.
Texte intégralRatanov, Nikita, et Alexander D. Kolesnik. « Symmetric Telegraph Process on the Line ». Dans Telegraph Processes and Option Pricing, 31–64. Berlin, Heidelberg : Springer Berlin Heidelberg, 2022. http://dx.doi.org/10.1007/978-3-662-65827-7_2.
Texte intégralDe Gregorio, Alessandro, et Claudio Macci. « Large Deviations for a Damped Telegraph Process ». Dans EAA Series, 275–89. Cham : Springer International Publishing, 2014. http://dx.doi.org/10.1007/978-3-319-06653-0_17.
Texte intégralMeoli, Alessandra. « Some Results on Generalized Accelerated Motions Driven by the Telegraph Process ». Dans SEMA SIMAI Springer Series, 223–37. Cham : Springer International Publishing, 2021. http://dx.doi.org/10.1007/978-3-030-69236-0_12.
Texte intégralKolesnik, Alexander D., et Nikita Ratanov. « Asymmetric Jump-Telegraph Processes ». Dans Telegraph Processes and Option Pricing, 69–88. Berlin, Heidelberg : Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-40526-6_4.
Texte intégralRatanov, Nikita, et Alexander D. Kolesnik. « Asymmetric Jump-Telegraph Processes ». Dans Telegraph Processes and Option Pricing, 65–188. Berlin, Heidelberg : Springer Berlin Heidelberg, 2022. http://dx.doi.org/10.1007/978-3-662-65827-7_3.
Texte intégralKolesnik, Alexander D., et Nikita Ratanov. « Preliminaries ». Dans Telegraph Processes and Option Pricing, 1–18. Berlin, Heidelberg : Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-40526-6_1.
Texte intégralKolesnik, Alexander D., et Nikita Ratanov. « Financial Modelling and Option Pricing ». Dans Telegraph Processes and Option Pricing, 89–125. Berlin, Heidelberg : Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-40526-6_5.
Texte intégralActes de conférences sur le sujet "Telegraph process"
Rizk, C., P. Julian, A. Pasciaroni, H. Radhakrishnan, J. Wilson et P. Pouliquen. « Device Mismatching and Random Telegraph Signal In Digital Pixel Imagers On 90-nm CMOS Process ». Dans 2020 Argentine Conference on Electronics (CAE). IEEE, 2020. http://dx.doi.org/10.1109/cae48787.2020.9046364.
Texte intégralZhao, Chunshan, Bai Kang, Wuzhi Zhang, Yamin Cao et Wei Zhou. « Reduction of random telegraph signal noise by optimizing deep trench isolation process for backside illuminated CMOS image sensor ». Dans 2021 China Semiconductor Technology International Conference (CSTIC). IEEE, 2021. http://dx.doi.org/10.1109/cstic52283.2021.9461499.
Texte intégralJo, B. S., H. J. Kang, S. M. Joe, M. K. Jeong, S. K. Park, K. R. Han, B. G. Park et J. H. Lee. « Characterization RTN(Random Telegraph Noise) Generated by Process and Cycling Stress Induced Traps in 26nm NAND Flash Memory ». Dans 2012 International Conference on Solid State Devices and Materials. The Japan Society of Applied Physics, 2012. http://dx.doi.org/10.7567/ssdm.2012.b-2-2.
Texte intégralMulder, Randal. « Time Domain Nanoprobe Analysis of RTS Popcorn Noise in Analog Circuits ». Dans ISTFA 2018. ASM International, 2018. http://dx.doi.org/10.31399/asm.cp.istfa2018p0403.
Texte intégralChen, Yuqi, James M. McDonough et Kaveh A. Tagavi. « A Hyperbolic Phase-Field Approach for Solidification With Supercooling ». Dans ASME 1999 International Mechanical Engineering Congress and Exposition. American Society of Mechanical Engineers, 1999. http://dx.doi.org/10.1115/imece1999-1026.
Texte intégralScherer, P. O. J. « Noise induced intramolecular electron transfer processes in polar media. » Dans International Conference on Ultrafast Phenomena. Washington, D.C. : Optica Publishing Group, 1992. http://dx.doi.org/10.1364/up.1992.fc4.
Texte intégralSonoda, Ken'ichiro, Motoaki Tanizawa, Kiyoshi Ishikawa et Yasuo Inoue. « Modeling statistical distribution of random telegraph noise magnitude ». Dans 2011 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD). IEEE, 2011. http://dx.doi.org/10.1109/sispad.2011.6035039.
Texte intégralVinogradova, Anna Y. « TELEGRAM IMPLEMENTATION POTENTIAL IN THE PROCESS OF TEACHING ENGLISH IN HIGHER EDUCATION ». Dans Люди речисты - 2021. Ulyanovsk State Pedagogical University named after I. N. Ulyanov, 2021. http://dx.doi.org/10.33065/978-5-907216-49-5-2021-354-358.
Texte intégralJun-Myung Woo, Hong-Hyun Park, Hong Shick Min, Young June Park, Sung-Min Hong et Chan Hyeong Park. « Statistical analysis of random telegraph noise in CMOS image sensors ». Dans 2008 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2008). IEEE, 2008. http://dx.doi.org/10.1109/sispad.2008.4648241.
Texte intégralSonoda, Ken'ichiro, Kiyoshi Ishikawa, Takahisa Eimori et Osamu Tsuchiya. « Modeling of Discrete Dopant Effects on Threshold Voltage Shift by Random Telegraph Signal ». Dans 2006 International Conference on Simulation of Semiconductor Processes and Devices. IEEE, 2006. http://dx.doi.org/10.1109/sispad.2006.282851.
Texte intégralRapports d'organisations sur le sujet "Telegraph process"
Priadko, Andrii O., Kateryna P. Osadcha, Vladyslav S. Kruhlyk et Volodymyr A. Rakovych. Development of a chatbot for informing students of the schedule. [б. в.], février 2020. http://dx.doi.org/10.31812/123456789/3744.
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