Littérature scientifique sur le sujet « Metallized film capacitor »
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Articles de revues sur le sujet "Metallized film capacitor"
Jia Zhanqiang, 贾占强, 蔡金燕 Cai Jinyan, 梁玉英 Liang Yuying et 韩春辉 Han Chunhui. « Reliability assessment of metallized film pulse capacitor ». High Power Laser and Particle Beams 23, no 1 (2011) : 272–76. http://dx.doi.org/10.3788/hplpb20112301.0272.
Texte intégralVuillermet, Y., O. Chadebec, J. M. Lupin, A. Saker, G. Meunier et J. L. Coulomb. « Optimization of Low-Voltage Metallized Film Capacitor Geometry ». IEEE Transactions on Magnetics 43, no 4 (avril 2007) : 1569–72. http://dx.doi.org/10.1109/tmag.2007.892473.
Texte intégralHo, Janet, T. Jow et Steven Boggs. « Implications of advanced capacitor dielectrics for performance of metallized film capacitor windings ». IEEE Transactions on Dielectrics and Electrical Insulation 15, no 6 (décembre 2008) : 1754–60. http://dx.doi.org/10.1109/tdei.2008.4712681.
Texte intégralDu, Guoqiang, et Jie Zhang. « Capacitance Evaluation of Metallized Polypropylene Film Capacitors Considering Cumulative Self-Healing Damage ». Electronics 13, no 14 (22 juillet 2024) : 2886. http://dx.doi.org/10.3390/electronics13142886.
Texte intégralLi Hua, Lin Fuchang, Zhong Heqing, Dai Ling, Han Yongxia et Kong Zhonghua. « Study on Metallized Film Capacitor and Its Voltage Maintaining Performance ». IEEE Transactions on Magnetics 45, no 1 (janvier 2009) : 327–30. http://dx.doi.org/10.1109/tmag.2008.2008863.
Texte intégralChen Yaohong, 陈耀红, 章妙 Zhang Miao, 李化 Li Hua, 林福昌 Lin Fuchang, 李智威 Li Zhiwei, 吕霏 Lü Fei et 刘德 Liu De. « Insulation resistance characteristics of metallized film capacitor under high electric field ». High Power Laser and Particle Beams 24, no 4 (2012) : 797–800. http://dx.doi.org/10.3788/hplpb20122404.0797.
Texte intégralKong, M. G., et Y. P. Lee. « Impact of surface discharge plasmas on performance of a metallized film capacitor ». Journal of Applied Physics 90, no 6 (15 septembre 2001) : 3069–78. http://dx.doi.org/10.1063/1.1389072.
Texte intégralLi, Hua, Yaohong Chen, Fuchang Lin, Bo Peng, Fei Lv, Miao Zhang et Zhiwei Li. « The capacitance loss mechanism of metallized film capacitor under pulsed discharge condition ». IEEE Transactions on Dielectrics and Electrical Insulation 18, no 6 (décembre 2011) : 2089–94. http://dx.doi.org/10.1109/tdei.2011.6118648.
Texte intégralDai, Xiying, Zhaoliang Xing, Wei Yang, Chong Zhang, Fei Li, Xin Chen, Chen Li, Jianjun Zhou et Lin Li. « The Effect of Annealing on the Structure and Electric Performance of Polypropylene Films ». International Journal of Polymer Science 2022 (8 novembre 2022) : 1–12. http://dx.doi.org/10.1155/2022/5970484.
Texte intégralYoon, Jung-Rag, Young-Kwang Kim, Serk-Won Lee et Heun-Young Lee. « The Design and Reliability Evaluation of Metallized Film Capacitor for Power Electronic Applications ». Journal of the Korean Institute of Electrical and Electronic Material Engineers 24, no 5 (1 mai 2011) : 381–86. http://dx.doi.org/10.4313/jkem.2011.24.5.381.
Texte intégralThèses sur le sujet "Metallized film capacitor"
Mello, Tiago Chaves. « Influência dos parâmetros do processo de serramento no corte de capacitores de filme metalizado ultrafino ». reponame:Biblioteca Digital de Teses e Dissertações da UFRGS, 2015. http://hdl.handle.net/10183/127878.
Texte intégralIn order to determine the optimal values for the sawing process of wound rings of metalized ultra-thin film with dielectric of polyester from current conditions of capacitor manufacturing process by Epcos company in Brazil, it was performed the evaluation of different types of circular saws varying the rotational speed (n) and the cutting time (tc). Developed experiment design methodology for these three factors in order to get the result of the interactions between them regarding to the insulation resistance (Riso) of cut parts. Through the analysis of the main effects, the cemented carbide saw with 160 teeth and diamond-like carbon (DLC) film coating showed the best results in terms of "Riso" above 0,378 G and regarding to the number of parts with value below the specified. It was found that "n" does not influence significantly the distribution of "Riso"; however, generates fewer parts below the specified. Now "tc" does not significantly influence the process. Regarding the tooth type, straight profile obtained better results for saw blades with 80 teeth and curved profile for blades with 160 teeth. However the thickness of the blade did not influence significantly the process. The high speed steel blade presented adhesion of aluminum on the side of the saw body and, consequently, adhesion of material on the cutting surface. The cemented carbide blades uncoated presented failures on metalized film because of the friction generated between the cutting surface and the side of the blade; this drawback is eliminated when it is coated with DLC film presenting improvements to the parts "Riso" for lower "n". There was also aluminum adhesion on the bottom of the tooth due to a delamination of the DLC film layer.
Lee, Yuen-Pen. « Electrically and thermally activated ageing mechanisms in metallised polymer film capacitors ». Thesis, Loughborough University, 2001. https://dspace.lboro.ac.uk/2134/33870.
Texte intégralBrown, Robert Winston, et rwb@rmit edu au. « Electrical and Thermal Modelling of Low Power Metallised Polypropylene Capacitors ». RMIT University. Electrical and Computer Engineering, 2007. http://adt.lib.rmit.edu.au/adt/public/adt-VIT20080130.155318.
Texte intégralRochefort, Claire. « Analyse du vieillissement, estimation de la durée de vie et méthode de surveillance de l’état de santé des condensateurs à film métallisé ». Electronic Thesis or Diss., Lyon 1, 2024. http://www.theses.fr/2024LYO10183.
Texte intégralWidely used, the metallized film capacitors are a common cause of electronic system failure. Some of their failures can lead to serious accidents and severe damage to their surroundings, such as explosions or fires. In addition to these safety issues, the failures analysis is justified by the economic issues related to the maintenance of these systems. The objective is to estimate the remaining useful lifetime and to prevent the sudden failures. Nowadays, the most used ageing laws require performing preliminary ageing tests to identify their parameters and enable their extrapolation. These parameters strongly depend on the series and the manufacturer of the capacitor itself. For these reasons, these ageing laws are costly to use and not robust. Other types of laws based on stochastic processes and related to failure mechanisms are emerging. However, their robustness and predictive capability need to be evaluated. Finally, even if measures are implemented to reduce the occurrence of catastrophic failures, risks persist. There is a need to prevent these types of failures without solely relying on the internal characteristics and the background of the capacitors. To address these issues, this work was carried out in collaboration with Schneider Electric as part of a CIFRE contract. Several accelerated ageing tests were carried out on a total of 111 capacitors from different manufacturers. The first test campaign focused on ageing under fixed conditions of alternating voltage and temperature, while the second added the additional constraint of humidity. Post-mortem analysis revealed that the different ageing campaigns led to the prevalence of a specific type of failure mechanism. The first campaign highlighted the effects of self-healing, and the second, those of corrosion. Based on these results, models of the capacitance evolution according to these two mechanisms were established. These were validated by the data in comparison to some existing laws. A first model based on the metallization resistance degradation due to self-healing effects was also proposed. Simultaneously, a large number of thermal runaways on capacitors were observed. Through real-time health indicator measurements, an in-depth study of the process was conducted. Early signs of thermal breakdown were identified. These results enable the early detection of thermal runaway and the implementation of damage prevention measures. Based on this principle, a generic method for preventing the risk of thermal breakdown was proposed. Its feasibility has been demonstrated and experimentally evaluated
Makdessi, Maawad. « Modélisation, vieillissement et surveillance de l'état de santé des condensateurs films utilisés dans des applications avioniques ». Phd thesis, Université Claude Bernard - Lyon I, 2014. http://tel.archives-ouvertes.fr/tel-01058227.
Texte intégralChapitres de livres sur le sujet "Metallized film capacitor"
Yu, Hongyu, Li Ran, Hao Feng et Jinxiao Wei. « Design of Increasing Dielectric Constant of Metallized Film Capacitor to Reduce Its Volume in MMC ». Dans The Proceedings of 2022 International Conference on Wireless Power Transfer (ICWPT2022), 975–82. Singapore : Springer Nature Singapore, 2023. http://dx.doi.org/10.1007/978-981-99-0631-4_97.
Texte intégralXiao, Meng, Boxue Du, Ranran Xu, Zhaoyu Ran, Haoliang Liu, Jiwen Xing et Kailun Fan. « Improvement of Dielectric Properties of Polypropylene Film for HVDC Metallized Film Capacitors ». Dans Polymer Insulation Applied for HVDC Transmission, 627–51. Singapore : Springer Singapore, 2020. http://dx.doi.org/10.1007/978-981-15-9731-2_25.
Texte intégralYan, Fei, et Xiang Huang. « Study on Factors Influencing Self-healing Energy of Metallized Film Capacitors ». Dans Lecture Notes in Electrical Engineering, 111–23. Singapore : Springer Nature Singapore, 2024. http://dx.doi.org/10.1007/978-981-99-7401-6_11.
Texte intégralCui, Yanjie, Yong Sun, Wenhao Lu, Cheng Yao et Chunhong Zhou. « Research on the Influence of Safety Film on the Thermal Field Distribution of Metallized Film Capacitors ». Dans Lecture Notes in Electrical Engineering, 447–55. Singapore : Springer Nature Singapore, 2023. http://dx.doi.org/10.1007/978-981-99-7413-9_42.
Texte intégralCui, Huize, Zhaoliang Xing et Chong Zhang. « Influence Mechanism of Hot-Press Setting Time and Winding Tension on the Performance of Metallized Film Capacitors ». Dans Lecture Notes in Electrical Engineering, 713–22. Singapore : Springer Nature Singapore, 2023. http://dx.doi.org/10.1007/978-981-99-7413-9_68.
Texte intégralActes de conférences sur le sujet "Metallized film capacitor"
Zhang, Jie, Feipeng Wang, Jian Zhou, Yushuang He et Guoqiang Du. « Dependence of Self-Healing Arc on Metal Vaporization Contributions for Metallized Film Capacitor ». Dans 2024 IEEE 5th International Conference on Dielectrics (ICD), 1–4. IEEE, 2024. http://dx.doi.org/10.1109/icd59037.2024.10613128.
Texte intégralXiao, Meng, Liangtian Zhang, Xiaodan Du, Xiangyu Dong et Boxue Du. « Study on Partial Discharge Characteristics of Dielectric Films for Metallized Film Capacitors ». Dans 2024 IEEE 5th International Conference on Dielectrics (ICD), 1–4. IEEE, 2024. http://dx.doi.org/10.1109/icd59037.2024.10613102.
Texte intégralYi, Chengqian, Bo Zhang, Chaoran Li et Yufan Yao. « Charge-discharge current distribution among elements in metallized film capacitors used for MMC ». Dans 2024 IEEE International Conference on High Voltage Engineering and Applications (ICHVE), 1–4. IEEE, 2024. http://dx.doi.org/10.1109/ichve61955.2024.10676226.
Texte intégralXiao, Meng, Liangtian Zhang, Zhiyuan Zhang, Yuyan Cheng, Zening Lu et Boxue Du. « Research on Partial Discharge and Self-Healing Characteristics for Metallized Film of Capacitors ». Dans 2024 IEEE 5th International Conference on Dielectrics (ICD), 1–4. IEEE, 2024. http://dx.doi.org/10.1109/icd59037.2024.10613348.
Texte intégralZuo, Qianglin, Yanjun Zhao et Xu Han. « Research on Application of Self-Healing Metallized Film Capacitors of DC Filter for HVDC System ». Dans 2024 International Conference on HVDC (HVDC), 347–54. IEEE, 2024. http://dx.doi.org/10.1109/hvdc62448.2024.10723079.
Texte intégralHo, J., T. R. Jow et S. A. Boggs. « Implications of Advanced Capacitor Dielectrics for Performance of Metallized Film Capacitor Windings ». Dans 2008 IEEE International Power Modulators and High Voltage Conference (IPMC). IEEE, 2008. http://dx.doi.org/10.1109/ipmc.2008.4743718.
Texte intégralLi, Hua, Fuchang Lin, Heqing Zhong, Ling Dai, Yongxia Han et Zhonghua Kong. « Study on Metallized Film Capacitor and its Voltage Maintaining Performance ». Dans 2008 14th Symposium on Electromagnetic Launch Technology. IEEE, 2008. http://dx.doi.org/10.1109/elt.2008.81.
Texte intégralHe, Yushuang, Feipeng Wang, Jianyu Pan, Haider M. Umran, Li Ran et Zhengyong Huang. « Effect of Temperature on Dielectric Properties of Metallized Film Capacitor ». Dans 2021 International Conference on Electrical Materials and Power Equipment (ICEMPE). IEEE, 2021. http://dx.doi.org/10.1109/icempe51623.2021.9509161.
Texte intégralSun, Yuting, Mingyu Wang et Li Ran. « Capacitance Monitoring Method for Metallized Polypropylene Film Capacitor in MMC ». Dans 2019 IEEE Sustainable Power and Energy Conference (iSPEC). IEEE, 2019. http://dx.doi.org/10.1109/ispec48194.2019.8974877.
Texte intégralPan, Wei, Junni Su, Qihao Zhong, Lingfeng Wei et Jianhao Zhou. « Reliable Application of Metallized Film Capacitor for Flexible HVDC Valve ». Dans 2022 IEEE 5th International Conference on Automation, Electronics and Electrical Engineering (AUTEEE). IEEE, 2022. http://dx.doi.org/10.1109/auteee56487.2022.9994446.
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