Littérature scientifique sur le sujet « Impedance metrology »
Créez une référence correcte selon les styles APA, MLA, Chicago, Harvard et plusieurs autres
Sommaire
Consultez les listes thématiques d’articles de revues, de livres, de thèses, de rapports de conférences et d’autres sources académiques sur le sujet « Impedance metrology ».
À côté de chaque source dans la liste de références il y a un bouton « Ajouter à la bibliographie ». Cliquez sur ce bouton, et nous générerons automatiquement la référence bibliographique pour la source choisie selon votre style de citation préféré : APA, MLA, Harvard, Vancouver, Chicago, etc.
Vous pouvez aussi télécharger le texte intégral de la publication scolaire au format pdf et consulter son résumé en ligne lorsque ces informations sont inclues dans les métadonnées.
Articles de revues sur le sujet "Impedance metrology"
Agustoni, Marco, et Frederic Overney. « Impedance Metrology : Bridging the LF–RF Gap ». IEEE Transactions on Instrumentation and Measurement 70 (2021) : 1–8. http://dx.doi.org/10.1109/tim.2020.3036062.
Texte intégralOverney, Frédéric, Nathan E. Flowers-Jacobs, Blaise Jeanneret, Alain Rüfenacht, Anna E. Fox, Paul D. Dresselhaus et Samuel P. Benz. « Dual Josephson impedance bridge : towards a universal bridge for impedance metrology ». Metrologia 57, no 6 (22 octobre 2020) : 065014. http://dx.doi.org/10.1088/1681-7575/ab948d.
Texte intégralRouane, Amar, et Paul Bru. « High frequency metrology for intracardiac ablation : in-vivo results ». Metrology and Measurement Systems 19, no 3 (1 octobre 2012) : 603–10. http://dx.doi.org/10.2478/v10178-012-0053-4.
Texte intégralCallegaro, Luca, Francesca Durbiano, Elena Orru et Bruno Trinchera. « An Impedance Spectrometer for the Metrology of Electrolytic Conductivity ». IEEE Transactions on Instrumentation and Measurement 62, no 6 (juin 2013) : 1766–70. http://dx.doi.org/10.1109/tim.2012.2230731.
Texte intégralGonzalez-Raya, Tasio, et Mikel Sanz. « Coplanar Antenna Design for Microwave Entangled Signals Propagating in Open Air ». Quantum 6 (23 août 2022) : 783. http://dx.doi.org/10.22331/q-2022-08-23-783.
Texte intégralCallegaro, Luca. « The metrology of electrical impedance at high frequency : a review ». Measurement Science and Technology 20, no 2 (17 décembre 2008) : 022002. http://dx.doi.org/10.1088/0957-0233/20/2/022002.
Texte intégralMusioł, Krzysztof. « Experimental Study of Digitizers Used in High-Precision Impedance Measurements ». Energies 15, no 11 (31 mai 2022) : 4051. http://dx.doi.org/10.3390/en15114051.
Texte intégralDeleebeeck, Lisa, et Sune Veltzé. « Electrochemical impedance spectroscopy study of commercial Li‐ion phosphate batteries : A metrology perspective ». International Journal of Energy Research 44, no 9 (15 avril 2020) : 7158–82. http://dx.doi.org/10.1002/er.5350.
Texte intégralAmoah, Papa K., Christopher E. Sunday, Chukwudi Okoro, Jungjoon Ahn, Lin You, Dmitry Veksler, Joseph Kopanski et Yaw Obeng. « (Invited) Towards the Physical Reliability of 3D-Integrated Systems : Broadband Dielectric Spectroscopic (BDS) Studies of Material Evolution and Reliability in Integrated Systems ». ECS Meeting Abstracts MA2022-02, no 17 (9 octobre 2022) : 859. http://dx.doi.org/10.1149/ma2022-0217859mtgabs.
Texte intégralInglis, Barry D. « Arthur Melville Thompson 1917–2009 ». Historical Records of Australian Science 25, no 2 (2014) : 306. http://dx.doi.org/10.1071/hr14020.
Texte intégralThèses sur le sujet "Impedance metrology"
TRAN, NGOC THANH MAI. « Novel techniques for electrical impedance metrology ». Doctoral thesis, Politecnico di Torino, 2021. http://hdl.handle.net/11583/2910078.
Texte intégralPOURDANESH, FARANAK. « Digital and build-up techniques for electrical impedance metrology ». Doctoral thesis, Politecnico di Torino, 2018. http://hdl.handle.net/11583/2705547.
Texte intégralMARZANO, MARTINA. « Novel devices and methods for quantum resistance and impedance metrology ». Doctoral thesis, Politecnico di Torino, 2020. http://hdl.handle.net/11583/2779393.
Texte intégralSindjui, Ralph. « Réalisation et caractérisation de dispositifs de mesure associés à la détermination de la constante de von Klitzing à partir d’un condensateur calculable étalon dit de Thompson-Lampard ». Thesis, Université Paris-Saclay (ComUE), 2016. http://www.theses.fr/2016SACLV053/document.
Texte intégralThe comparison of electrical quantities expressed in units of the International System of Units (SI) and the same quantities generated from quantum effects is a direct way of determining physical constants. The determination of the von Klitzing constant (quantum of resistance) from a calculable capacitor is a part of this process. The last determination of this constant was conducted at LNE in 2000 with an uncertainty of 5.10-8. To achieve a target uncertainty of 1.10-8, the LNE decided to build a new standard capacitor and improve the associated measurement chain. The work presented here is implemented in the framework of the design/amelioration and the characterization of the measurement chain leading to the relative uncertainty of 1.10-8. Exploratory studies were also conducted about the possible partial or full automation of elements of the measurement chain
Li, Kai-Chiang, et 黎凱強. « Research and development of label-free electrochemical impedance bio-affinity metrology system ». Thesis, 2012. http://ndltd.ncl.edu.tw/handle/71888116342601326223.
Texte intégral國立臺灣大學
應用力學研究所
100
With the societal advancement, living style improvement, and medical technologies development, the average human life span has increased significantly. These changes also signal the coming of aging society. The body function and metabolism of the elders are known to be weaker than grownups and children. In addition, the elders are prone to many chronic diseases or cancer. All of which indicate that home care and health care services of elders are becoming ever more important. The biosensors developed with a goal to pursue point of care are becoming more widely available. This thesis focuses on developing a label-free electrochemical biosensor that fits the point-of-care application needs. Taking novel conducting linker as the starting point and integrating it into the corresponding chip equipped with microfluidic system developed by the NTU BioMEMS team, this thesis further utilized electrochemical impedance spectroscopy to develop a complete bio-affinity metrology system. With the adoption of the innovative conducting linker developed within the team, the signal to noise ratio of traditional electrochemical bio-affinity sensor was greatly improved such that the difficulty associated with the design and the implementation cost of the interfacing circuits were minimized. In the signal processing part, we used a DAQ card (data acquisition card) to digitize the analog signal. We then employed LabVIEW to establish the lock-in amplifier for noise elimination so as to lead to precise impedance measurement. Besides, we integrated driving circuits of syringe pump into an electro-board, which was controlled by using LabVIEW to design the HMI (Human Machine Interface). Our biochips were made by micro machining process with glass as the substrate and Au as the working electrode. We also designed a locking mechanism to ease the biochips replacement and to reduce the overall system volume. Our study measures C-reactive protein, S-100 protein, successfully. These results verified the feasibility and sensitivity of our system, which was found to meet the lowest detected limits currently required by the hospital. We found that protein with bigger molecular weight may result in bigger ΔRct changes.
Actes de conférences sur le sujet "Impedance metrology"
Elmholdt Christensen, Andreas. « A versatile electrical impedance calibration laboratory based on a digital impedance bridge ». Dans 19th International Congress of Metrology (CIM2019), sous la direction de Sandrine Gazal. Les Ulis, France : EDP Sciences, 2019. http://dx.doi.org/10.1051/metrology/201911002.
Texte intégralOverney, Frederic, Nathan E. Flowers-Jacobs, Blaise Jeanneret, Alain Rufenacht, Anna E. Fox, Paul D. Dresselhaus et Samuel P. Benz. « Dual Josephson Impedance Bridge : Universal bridge for impedance metrology ». Dans 2020 Conference on Precision Electromagnetic Measurements (CPEM 2020). IEEE, 2020. http://dx.doi.org/10.1109/cpem49742.2020.9191748.
Texte intégralSedlacek, R. « Digital Compensation Unit for Impedance Metrology ». Dans 2004 Conference on Precision electromagnetic Digest. IEEE, 2004. http://dx.doi.org/10.1109/cpem.2004.305399.
Texte intégralPower, Oliver, Adam Ziolek, Andreas Elmholdt Christensen, Andrei Pokatilov, Anca Nestor, Gulay Gumez, Jan Kučera et al. « Practical Precision Electrical Impedance Measurement for the 21st Century – EMPIR Project 17RPT04 VersICal ». Dans 19th International Congress of Metrology (CIM2019), sous la direction de Sandrine Gazal. Les Ulis, France : EDP Sciences, 2019. http://dx.doi.org/10.1051/metrology/201902001.
Texte intégralAgustoni, Marco, et Frederic Overney. « Impedance Metrology : Bridging the LF-RF Gap ». Dans 2020 Conference on Precision Electromagnetic Measurements (CPEM 2020). IEEE, 2020. http://dx.doi.org/10.1109/cpem49742.2020.9191807.
Texte intégralPalafox, L., F. Raso, J. Kučera, F. Overney, L. Callegaro, P. Gournay, A. Ziołek et al. « AIM QuTE : Automated Impedance Metrology extending the Quantum Toolbox for Electricity ». Dans 16th International Congress of Metrology. Les Ulis, France : EDP Sciences, 2013. http://dx.doi.org/10.1051/metrology/201311001.
Texte intégralHassel, Juha, Leif Gronberg, Panu Helisto, Heikki Seppa, Jaani Nissila et Antti Kemppinen. « Fast Josephson Arrays for Voltage and Impedance Metrology ». Dans 2004 Conference on Precision Electromagnetic Measurements. IEEE, 2004. http://dx.doi.org/10.1109/cpem.2004.305507.
Texte intégralObrzut, J., K. Migler, L. Dong, J. Jiao, David G. Seiler, Alain C. Diebold, Robert McDonald et al. « Impedance and Capacitance Measurement of Individual Carbon Nanotubes ». Dans CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS : 2007 International Conference on Frontiers of Characterization and Metrology. AIP, 2007. http://dx.doi.org/10.1063/1.2799422.
Texte intégralSurdu, Michael, Alexander Lameko et Alexey Panich. « Improvement of the accuracy of the logometric impedance meters in wide frequency range ». Dans 16th International Congress of Metrology. Les Ulis, France : EDP Sciences, 2013. http://dx.doi.org/10.1051/metrology/201311016.
Texte intégralMoreno, J. Angel, et Pierre Gournay. « Capacitance metrology at the BIPM to support National Metrology Institutes ». Dans 19th International Congress of Metrology (CIM2019), sous la direction de Sandrine Gazal. Les Ulis, France : EDP Sciences, 2019. http://dx.doi.org/10.1051/metrology/201914001.
Texte intégral