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Articles de revues sur le sujet « High-Resolution X-Ray imaging »

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Auteur : Grafiati
Publié le 25 mai 2024

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1

Huang, Wenjun, Junyu Chen, Yi Li, Yueyue Wu, Lianjie Li, Liping Chen et Hai Guo. « Tb3+-doped borosilicate glass scintillators for high-resolution X-ray imaging ». Chinese Optics Letters 21, no 7 (2023) : 071601. http://dx.doi.org/10.3788/col202321.071601.

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Strüder, L. « High-resolution imaging X-ray spectrometers ». Nuclear Instruments and Methods in Physics Research Section A : Accelerators, Spectrometers, Detectors and Associated Equipment 454, no 1 (novembre 2000) : 73–113. http://dx.doi.org/10.1016/s0168-9002(00)00811-1.

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Si, Haoxuan, Lianqiang Shan, Huiyao Du, Li Jiang, Shengzhen Yi, Weimin Zhou et Zhanshan Wang. « High-resolution Mo Kα X-ray monochromatic backlight imaging using a toroidal crystal ». Chinese Optics Letters 21, no 10 (2023) : 103401. http://dx.doi.org/10.3788/col202321.103401.

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4

Carpenter, D. A., et M. A. Taylor. « Fast, High-Resolution X-ray Microfluorescence Imaging ». Advances in X-ray Analysis 34 (1990) : 217–21. http://dx.doi.org/10.1154/s0376030800014506.

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X-ray micro fluorescence imaging refers to the use of an x-ray beam as a probe to excite XRF in a specimen and produce a spatially resolved image of the element distribution. The advantages of high sensitivity and low background, together with the nondestructive nature of the measurement, have lead to applications of x-ray microfluorescence analysis in biology, geology, materials science, as well as in the area of nondestructive evaluation. Previous reports have described the development of an x-ray microprobe which uses a conventional source of x-rays to produce a 10-μm beam. This paper describes improvements to the microprobe which have increased the beam power and the solid angle of detection. The data collection and display software have also been enhanced.
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Ou, Xiangyu, Xian Qin, Bolong Huang, Jie Zan, Qinxia Wu, Zhongzhu Hong, Lili Xie et al. « High-resolution X-ray luminescence extension imaging ». Nature 590, no 7846 (17 février 2021) : 410–15. http://dx.doi.org/10.1038/s41586-021-03251-6.

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Fewster, Paul F., Marina V. Baidakova et Reginald Kyutt. « High-resolution X-ray diffraction and imaging ». Journal of Applied Crystallography 46, no 4 (18 juillet 2013) : 841. http://dx.doi.org/10.1107/s0021889813016415.

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Schulman, Eric, et Joel N. Bregman. « High-resolution X-ray imaging of M33 ». Astrophysical Journal 441 (mars 1995) : 568. http://dx.doi.org/10.1086/175383.

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Schopper, Florian, J. Ninkovic, R. Richter, G. Schaller, T. Selle et J. Treis. « High resolution X-ray imaging with pnCCDs ». Nuclear Instruments and Methods in Physics Research Section A : Accelerators, Spectrometers, Detectors and Associated Equipment 912 (décembre 2018) : 11–15. http://dx.doi.org/10.1016/j.nima.2017.10.004.

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Strueder, L. « High resolution imaging silicon-x-ray spectrometers ». Nuclear Instruments and Methods in Physics Research Section A : Accelerators, Spectrometers, Detectors and Associated Equipment 522, no 1-2 (avril 2004) : 146. http://dx.doi.org/10.1016/j.nima.2004.01.034.

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PLOURABOUE, F., P. CLOETENS, C. FONTA, A. STEYER, F. LAUWERS et J. P. MARC-VERGNES. « X-ray high-resolution vascular network imaging ». Journal of Microscopy 215, no 2 (août 2004) : 139–48. http://dx.doi.org/10.1111/j.0022-2720.2004.01362.x.

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Larson, Bennett C., et Bruno Lengeler. « High-Resolution Three-Dimensional X-Ray Microscopy ». MRS Bulletin 29, no 3 (mars 2004) : 152–56. http://dx.doi.org/10.1557/mrs2004.52.

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AbstractThis issue of MRS Bulletin focuses on the rapid progress that is ongoing in the development of hard x-ray microscopies with three-dimensional spatial resolutions ranging from micrometers to nanometers. The individual articles provide a crosscut of developments in hard x-ray projection tomography microscopy for imaging density and chemical fluctuations in crystalline and noncrystalline materials; large-angle diffractionbased, spatially resolved imaging of local structure, orientation, and strain distributions in crystalline materials; and emerging coherent diffraction imaging for nanometer-range Fourier transform imaging of crystalline and noncrystalline materials.
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Schültke, Elisabeth, Ralf Menk, Bernd Pinzer, Alberto Astolfo, Marco Stampanoni, Fulvia Arfelli, Laura-Adela Harsan et Guido Nikkhah. « Single-cell resolution in high-resolution synchrotron X-ray CT imaging with gold nanoparticles ». Journal of Synchrotron Radiation 21, no 1 (11 décembre 2013) : 242–50. http://dx.doi.org/10.1107/s1600577513029007.

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Gold nanoparticles are excellent intracellular markers in X-ray imaging. Having shown previously the suitability of gold nanoparticles to detect small groups of cells with the synchrotron-based computed tomography (CT) technique bothex vivoandin vivo, it is now demonstrated that even single-cell resolution can be obtained in the brain at leastex vivo. Working in a small animal model of malignant brain tumour, the image quality obtained with different imaging modalities was compared. To generate the brain tumour, 1 × 105C6 glioma cells were loaded with gold nanoparticles and implanted in the right cerebral hemisphere of an adult rat. Raw data were acquired with absorption X-ray CT followed by a local tomography technique based on synchrotron X-ray absorption yielding single-cell resolution. The reconstructed synchrotron X-ray images were compared with images obtained by small animal magnetic resonance imaging. The presence of gold nanoparticles in the tumour tissue was verified in histological sections.
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13

Momose, Atsushi. « Development toward high-resolution X-ray phase imaging ». Journal of Electron Microscopy 66, no 3 (18 avril 2017) : 155–66. http://dx.doi.org/10.1093/jmicro/dfx013.

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Favre-Nicolin, Vincent, José Baruchel, Hubert Renevier, Joël Eymery et András Borbély. « XTOP : high-resolution X-ray diffraction and imaging ». Journal of Applied Crystallography 48, no 3 (31 mai 2015) : 620. http://dx.doi.org/10.1107/s160057671500895x.

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Schroer, Christian G., Peter Cloetens, Mark Rivers, Anatoly Snigirev, Akahisa Takeuchi et Wenbing Yun. « High-Resolution 3D Imaging Microscopy Using Hard X-Rays ». MRS Bulletin 29, no 3 (mars 2004) : 157–65. http://dx.doi.org/10.1557/mrs2004.53.

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AbstractThe key strength of hard x-ray full-field microscopy is the large penetration depth of hard x-rays into matter, which allows one to image the interior of opaque objects. Combined with tomographic techniques, the three-dimensional inner structure of an object can be reconstructed without the need for difficult and destructive sample preparation. Projection microscopy and microtomography are now routinely available at synchrotron radiation sources. The resolution of these techniques is limited by that of the detector to 1 µm or slightly less. X-ray images and tomograms at higher spatial resolution can be obtained by x-ray optical magnification, for example, by using parabolic refractive x-ray lenses as a magnifying optic. Combining magnifying x-ray imaging with tomography allows one to reconstruct the three-dimensional structure of an object, such as a microprocessor chip, with resolution well below 1 µm. In x-ray scanning microscopy, the sample is scanned through a small-diameter beam. The great advantage of scanning microscopy is that x-ray analytical techniques such as fluorescence analysis, diffraction, and absorption spectroscopy can be used as contrast mechanisms in the microscope. In combination with tomography, fluorescence analysis makes it possible to reconstruct the distribution of different chemical elements inside an object (fluorescence microtomography), while combining absorption spectroscopy with tomography yields the distribution of different oxidation states of atomic species.
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Nakashima, Yoshito, Hidekazu Hirai, Atsushi Koishikawa et Tomoyuki Ohtani. « Three-dimensional imaging of arrays of fluid inclusions in fluorite by high-resolution X-ray CT ». Neues Jahrbuch für Mineralogie - Monatshefte 1997, no 12 (12 novembre 1997) : 559–68. http://dx.doi.org/10.1127/njmm/1997/1997/559.

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Jeong, Heon Yong, Hyung San Lim, Ju Hyuk Lee, Jun Heo, Hyun Nam Kim et Sung Oh Cho. « ZnWO4 Nanoparticle Scintillators for High Resolution X-ray Imaging ». Nanomaterials 10, no 9 (31 août 2020) : 1721. http://dx.doi.org/10.3390/nano10091721.

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The effect of scintillator particle size on high-resolution X-ray imaging was studied using zinc tungstate (ZnWO4) particles. The ZnWO4 particles were fabricated through a solid-state reaction between zinc oxide and tungsten oxide at various temperatures, producing particles with average sizes of 176.4 nm, 626.7 nm, and 2.127 μm; the zinc oxide and tungsten oxide were created using anodization. The spatial resolutions of high-resolution X-ray images, obtained from utilizing the fabricated particles, were determined: particles with the average size of 176.4 nm produced the highest spatial resolution. The results demonstrate that high spatial resolution can be obtained from ZnWO4 nanoparticle scintillators that minimize optical diffusion by having a particle size that is smaller than the emission wavelength.
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18

KAWAI, Jun, Kuniko MAEDA et Takahisa YAMANE. « Imaging-Plate X-Ray Spectrometer for High-Resolution Particle-Induced X-Ray Emission. » Analytical Sciences 9, no 2 (1993) : 179–84. http://dx.doi.org/10.2116/analsci.9.179.

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19

Cash, Webster. « X-ray optics : a technique for high resolution imaging ». Applied Optics 26, no 14 (15 juillet 1987) : 2915. http://dx.doi.org/10.1364/ao.26.002915.

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van Silfhout, Roelof, Anton Kachatkou, Nicholas Kyele, Peter Scott, Thierry Martin et Sergey Nikitenko. « High-resolution transparent x-ray beam location and imaging ». Optics Letters 36, no 4 (15 février 2011) : 570. http://dx.doi.org/10.1364/ol.36.000570.

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21

Förster, E., R. J. Hutcheon, O. Renner, I. Uschmann, M. Vollbrecht, M. Nantel, A. Klisnick et P. Jaeglé. « High-resolution x-ray imaging of extended lasing plasmas ». Applied Optics 36, no 4 (1 février 1997) : 831. http://dx.doi.org/10.1364/ao.36.000831.

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22

Hormozan, Yashar, Ilya Sychugov et Jan Linnros. « High-resolution x-ray imaging using a structured scintillator ». Medical Physics 43, no 2 (13 janvier 2016) : 696–701. http://dx.doi.org/10.1118/1.4939258.

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23

McNulty, I., J. Kirz, C. Jacobsen, E. H. Anderson, M. R. Howells et D. P. Kern. « High-Resolution Imaging by Fourier Transform X-ray Holography ». Science 256, no 5059 (15 mai 1992) : 1009–12. http://dx.doi.org/10.1126/science.256.5059.1009.

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24

Ng, C. Y., B. M. Gaensler, S. S. Murray, P. O. Slane, S. Park, L. Staveley-Smith, R. N. Manchester et D. N. Burrows. « HIGH-RESOLUTION X-RAY IMAGING OF SUPERNOVA REMNANT 1987A ». Astrophysical Journal 706, no 1 (2 novembre 2009) : L100—L105. http://dx.doi.org/10.1088/0004-637x/706/1/l100.

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Nagarkar, Vivek V., Valeriy Gaysinskiy, Olena E. Ovechkina, Stuart Miller, Bipin Singh, Liang Guo et Thomas Irving. « Bright Semiconductor Scintillator for High Resolution X-Ray Imaging ». IEEE Transactions on Nuclear Science 57, no 3 (juin 2010) : 923–30. http://dx.doi.org/10.1109/tns.2010.2048125.

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26

Deumel, Sarah, Albert van Breemen, Gerwin Gelinck, Bart Peeters, Joris Maas, Roy Verbeek, Santhosh Shanmugam et al. « High-sensitivity high-resolution X-ray imaging with soft-sintered metal halide perovskites ». Nature Electronics 4, no 9 (septembre 2021) : 681–88. http://dx.doi.org/10.1038/s41928-021-00644-3.

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AbstractTo realize the potential of artificial intelligence in medical imaging, improvements in imaging capabilities are required, as well as advances in computing power and algorithms. Hybrid inorganic–organic metal halide perovskites, such as methylammonium lead triiodide (MAPbI3), offer strong X-ray absorption, high carrier mobilities (µ) and long carrier lifetimes (τ), and they are promising materials for use in X-ray imaging. However, their incorporation into pixelated sensing arrays remains challenging. Here we show that X-ray flat-panel detector arrays based on microcrystalline MAPbI3 can be created using a two-step manufacturing process. Our approach is based on the mechanical soft sintering of a freestanding absorber layer and the subsequent integration of this layer on a pixelated backplane. Freestanding microcrystalline MAPbI3 wafers exhibit a sensitivity of 9,300 µC Gyair–1 cm–2 with a μτ product of 4 × 10–4 cm2 V–1, and the resulting X-ray imaging detector, which has 508 pixels per inch, combines a high spatial resolution of 6 line pairs per millimetre with a low detection limit of 0.22 nGyair per frame.
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Garratt-Reed, Anthony J. « Applications of High-Resolution X-ray Mapping ». Proceedings, annual meeting, Electron Microscopy Society of America 48, no 2 (12 août 1990) : 454–55. http://dx.doi.org/10.1017/s0424820100135873.

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It has been well established that x-ray imaging (mapping) of samples at high magnification in a field-emission analytical electron microscope is a viable technique when some form of correction is employed to compensate for the unavoidable image drift which occurs during the somewhat extended acquisition time of the images. The technique is only of practical use, however, if the time spent in acquiring the image results in data which would not otherwise have been obtained. It is the purpose of this paper to present examples where high-resolution mapping did provide data which was unique and essential to solve the problems under investigation.All experiments were performed in a VG Microscopes HB5 STEM, with a field-emission gun operating at 100kV. For most experiments, the probe size was of the order of 2 nm, and the probe current was 0.2-0.4 nA. The x-ray detector was a Link Analytical LZ5 windowless energydispersive x-ray spectrometer with a resolution of 137eV at 5.9kV, subtending a solid angle of 0.078Sr at the sample.
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Hoshino, Masato, Kentaro Uesugi, Ryuji Shikaku et Naoto Yagi. « High-energy, high-resolution x-ray imaging for metallic cultural heritages ». AIP Advances 7, no 10 (octobre 2017) : 105122. http://dx.doi.org/10.1063/1.5003162.

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Schneider, G. « High Resolution X-ray Microscopy of Frozen Hydrated Samples ». Microscopy and Microanalysis 4, S2 (juillet 1998) : 350–51. http://dx.doi.org/10.1017/s1431927600021875.

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X-ray microscopy is a rapidly developing field stimulated by the development of brilliant X-ray sources and high resolution X-ray lenses. It provides higher resolution than optical microscopy and higher penetration power than electron microscopy. Therefore, X-ray microscopy allows high resolution imaging of thick hydrated samples. The two dominating processes determining the contrast in X-ray microscopy are photoelectric absorption and phase shift. For this reason X-ray microscopy can be performed in amplitude and phase contrast. The Göttingen X-ray microscope at the BESSY electron storage ring in Berlin is operating in both contrast modes and is used for different application fields, for example in biology, biophysics, medicine, colloid chemistry, and soil sciences.Especially biological objects are sensitive to ionizing radiation. Theoretical investigations show that X-ray images of frozen-hydrated specimen can be obtained without radiation induced artifacts. Therefore, an object stage for cryogenic specimen was developed and implemented on the Gottingen transmission X-ray microscope (TXM) at the electron storage ring BESSY.
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Ryon, R. W., H. E. Martz, J. M. Hernandez, J. J. Haskins, R. A. Day, J. M. Brase, Brian Cross et David Wherry. « X-Ray Imaging : Status and Trends ». Advances in X-ray Analysis 31 (1987) : 35–52. http://dx.doi.org/10.1154/s0376030800021820.

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There is a veritable renaissance occurring in x-ray imaging. X-ray imaging by radiography has been a highly developed technology in medicine and industry for many years. However, high resolution imaging has not generally been practical because sources have been relatively dim and diffuse, optical elements have been nonexistant for most applications, and detectors have been slow and of low resolution. Materials analysis needs have therefore gone unmet. Rapid progress is now taking place because we are able to exploit developments in microelectronics and related material fabrication techniques, and because of the availability of intense x-ray sources.
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Hirano, Keiichi, et Atsushi Momose. « Development of an X-Ray Interferometer for High-Resolution Phase-Contrast X-Ray Imaging ». Japanese Journal of Applied Physics 38, Part 2, No. 12B (15 décembre 1999) : L1556—L1558. http://dx.doi.org/10.1143/jjap.38.l1556.

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Li, Rui Hong, et Yue Ping Han. « Developments of X-Ray Grating Imaging Technology ». Advanced Materials Research 898 (février 2014) : 614–17. http://dx.doi.org/10.4028/www.scientific.net/amr.898.614.

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The present paper reviews the X-ray grating imaging systems at home and abroad from the aspects of technological characterizations and the newest researching focus. First, not only the imaging principles and the frameworks of the typical X-ray grating imaging system based on Talbot-Lau interferometry method, but also the algorithms of retrieving the signals of attenuation, refraction and small-angle scattering are introduced. Second, the system optimizing methods are discussed, which involves mainly the relaxing the requirement of high positioning resolution and strict circumstances for gratings and designing large field of view with high resolution. Third, two and four-dimensional grating-based X-ray imaging techniques are introduced.
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Haddad, W. S., I. McNulty, J. E. Trebes, E. H. Anderson, L. Yang et J. M. Brase. « Demonstration of ultra-high-resolution soft x-ray tomography using a scanning transmission x-ray microscope ». Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994) : 312–13. http://dx.doi.org/10.1017/s0424820100169298.

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X-ray microscopy has been an active area of research for many years, but it is now beginning to emerge as a viable imaging tool for microbiologists and materials scientists. Several groups have developed x-ray microscopes of various types using synchrotron sources laser plasma sources, and x-ray lasers. The most productive systems have been the scanning transmission x-ray microscopes (STXM). Near diffraction limited performance can be achieved with such instruments. There are however no x-ray optics having sufficiently high numerical aperture (NA) to achieve resolution in depth that is comparable with the transverse resolution. Currently the best x-ray zone plates have a NA < 0.1 for radiation in the water window. The ratio of depth resolution to transverse resolution ∂l\∂t ≈ 2/NA > 20 for present state-of-the-art zone plates.In order to improve the depth resolution, it is necessary to effectively increase the NA of the imaging system. This can be done by recording several views of the object over a large angular range. If each of the views is taken with low NA optics such that the longitudinal extent of the object is less than the depth resolution of the imaging system, then each view will be a 2-D projection of the object.
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Cash, Webster. « X-ray Interferometry ». Symposium - International Astronomical Union 205 (2001) : 457–62. http://dx.doi.org/10.1017/s0074180900221761.

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X-rays have tremendous potential for imaging at the highest angular resulution. The high surface brightness of many x-ray sources will reveal angular scales heretofore thought unreachable. The short wavelengths make instrumentation compact and baselines short. We discuss how practical x-ray interferometers can be built for astronomy using existing technology. We describe the Maxim Pathfinder and Maxim missions which will achieve 100 and 0.1 micro-arcsecond imaging respectively. The science to be tackled with resolution of up to one million times that of HST will be outlined, with emphasis on eventually imaging the event horizon of a black hole.
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Nugent, K. A., G. J. Williams, B. Abbey, A. G. Peele, M. Pfeifer, J. N. Clark, M. De Jonge et I. McNulty. « Coherent diffractive imaging : a new tool for high-resolution X-ray imaging ». Acta Crystallographica Section A Foundations of Crystallography 64, a1 (23 août 2008) : C129. http://dx.doi.org/10.1107/s0108767308095846.

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Espes, Emil, et Anasuya Adibhatla. « Increasing Resolution of X-ray Imaging at High Acceleration Voltages ». Microscopy and Microanalysis 28, S1 (22 juillet 2022) : 234. http://dx.doi.org/10.1017/s1431927622001775.

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Bregman, Joel N., Eric Schulman et Kohji Tomisaka. « High-resolution X-ray imaging of the Starburst Galaxy M82 ». Astrophysical Journal 439 (janvier 1995) : 155. http://dx.doi.org/10.1086/175160.

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Fujiwara, T., Y. Mitsuya et H. Toyokawa. « Fine-pitch glass GEM for high-resolution X-ray imaging ». Journal of Instrumentation 11, no 12 (19 décembre 2016) : C12050. http://dx.doi.org/10.1088/1748-0221/11/12/c12050.

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Beuville, E., R. Cahn, B. Cederstrom, M. Danielsson, A. Hall, B. Hasegawa, L. Luo et al. « High resolution X-ray imaging using a silicon strip detector ». IEEE Transactions on Nuclear Science 45, no 6 (1998) : 3059–63. http://dx.doi.org/10.1109/23.737664.

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Yang, Fei, Julius Hallstedt, Ulf Lundstrom, Mikael Otendal, Tomi Tuohimaa, Daniel Larsson et Anasuya Adibhatla. « X-ray Sources for High Throughput and Extreme Resolution Imaging ». Microscopy and Microanalysis 24, S2 (août 2018) : 318–19. http://dx.doi.org/10.1017/s1431927618013909.

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Labriet, Hélène, Caroline Bissardon, Hervé Mathieu, Ilyas Khan, Laurent Charlet, Sébastien Bérujon, Sylvain Bohic et Emmanuel Brun. « High Resolution X-Ray Phase Contrast Imaging of Maturating Cartilage. » Microscopy and Microanalysis 24, S2 (août 2018) : 382–83. http://dx.doi.org/10.1017/s1431927618014198.

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42

Hormozan, Yashar, Sang-Ho Yun, Olof Svenonius et Jan Linnros. « Towards High-Resolution X-Ray Imaging Using a Structured Scintillator ». IEEE Transactions on Nuclear Science 59, no 1 (février 2012) : 19–23. http://dx.doi.org/10.1109/tns.2011.2177477.

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43

Steiner, Bruce, Ronald C. Dobbyn, David Black, Harold Burdette, Masao Kuriyama, Richard Spal, Richard Simchick et Archibald Fripp. « High resolution X-ray diffraction imaging of lead tin telluride ». Journal of Crystal Growth 114, no 4 (décembre 1991) : 707–14. http://dx.doi.org/10.1016/0022-0248(91)90420-a.

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Adibhatla, Anasuya, Tomi Tuohimaa et Fei Yang. « High-resolution Nano-imaging with Transmission Nanofocus X-ray Source ». Microscopy and Microanalysis 26, S2 (30 juillet 2020) : 2722. http://dx.doi.org/10.1017/s1431927620022552.

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van der Heyden, K. J., E. Behar, J. Vink, A. P. Rasmussen, J. S. Kaastra, J. A. M. Bleeker, S. M. Kahn et R. Mewe. « High-Resolution X-ray imaging and spectroscopy of N 103B ». Astronomy & ; Astrophysics 392, no 3 (septembre 2002) : 955–62. http://dx.doi.org/10.1051/0004-6361:20020963.

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Dennis, B. R., G. K. Skinner, M. J. Li et A. Y. Shih. « Very High-Resolution Solar X-Ray Imaging Using Diffractive Optics ». Solar Physics 279, no 2 (12 juin 2012) : 573–88. http://dx.doi.org/10.1007/s11207-012-0016-7.

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Kim, Felix H., Dayakar Penumadu, Jens Gregor, Nikolay Kardjilov et Ingo Manke. « High-Resolution Neutron and X-Ray Imaging of Granular Materials ». Journal of Geotechnical and Geoenvironmental Engineering 139, no 5 (mai 2013) : 715–23. http://dx.doi.org/10.1061/(asce)gt.1943-5606.0000809.

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Wang, Zhentian, Zhifeng Huang, Li Zhang, Kejun Kang et Peiping Zhu. « Fast X-Ray Phase-Contrast Imaging Using High Resolution Detector ». IEEE Transactions on Nuclear Science 56, no 3 (juin 2009) : 1383–88. http://dx.doi.org/10.1109/tns.2009.2014163.

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Snoeren, Rudolph M., Michael Söderman, Johannes N. Kroon, Ruben B. Roijers, Peter H. N. de With et Drazenko Babic. « High-resolution 3D X-ray imaging of intracranial nitinol stents ». Neuroradiology 54, no 2 (18 février 2011) : 155–62. http://dx.doi.org/10.1007/s00234-011-0839-1.

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Shatokhin, A. N., A. O. Kolesnikov, V. N. Mikhailov, V. P. Ratushnyi et E. N. Ragozin. « High-Resolution Imaging Spectrograph for the Ultrasoft X-ray Range ». Bulletin of the Lebedev Physics Institute 50, S1 (juillet 2023) : S78—S84. http://dx.doi.org/10.3103/s1068335623130134.

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