Littérature scientifique sur le sujet « FILM THICKNESS SIMULATION »
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Articles de revues sur le sujet "FILM THICKNESS SIMULATION"
Markov, A. B., A. V. Solovyov, E. V. Yakovlev, E. A. Pesterev, V. I. Petrov et M. S. Slobodyan. « Computer simulation of temperature fields in the Cr (film)-Zr (substrate) system during pulsed electron-beam irradiation ». Journal of Physics : Conference Series 2064, no 1 (1 novembre 2021) : 012058. http://dx.doi.org/10.1088/1742-6596/2064/1/012058.
Texte intégralGrigoriev, Fedor V., Vladimir B. Sulimov et Alexander V. Tikhonravov. « Atomistic Simulation of Stresses in Growing Silicon Dioxide Films ». Coatings 10, no 3 (29 février 2020) : 220. http://dx.doi.org/10.3390/coatings10030220.
Texte intégralDu, Run, Anying Zhang, Zhihua Du et Xiaoyu Zhang. « Molecular Dynamics Simulation on Thin-Film Lubrication of a Mixture of Three Alkanes ». Materials 13, no 17 (20 août 2020) : 3689. http://dx.doi.org/10.3390/ma13173689.
Texte intégralWang, Ben, Xiuhua Fu, Shigeng Song, Hin Chu, Desmond Gibson, Cheng Li, Yongjing Shi et Zhentao Wu. « Simulation and Optimization of Film Thickness Uniformity in Physical Vapor Deposition ». Coatings 8, no 9 (16 septembre 2018) : 325. http://dx.doi.org/10.3390/coatings8090325.
Texte intégralYan, Ying, Jiarun Li, Qiuyu Liu et Ping Zhou. « Evaporation Effect on Thickness Distribution for Spin-Coated Films on Rectangular and Circular Substrates ». Coatings 11, no 11 (29 octobre 2021) : 1322. http://dx.doi.org/10.3390/coatings11111322.
Texte intégralWang, Kaijie, Yongzhi Cao, Yaowen Cui, Aiying Ye, Shaofan Yi et Zhenjiang Hu. « Study on Parameter Correlation of Thickness and Performance of Anodizing Film on 6061 Aluminum Alloy Frame in High Energy Laser System ». Coatings 12, no 12 (16 décembre 2022) : 1978. http://dx.doi.org/10.3390/coatings12121978.
Texte intégralP, Ramesh, et James Gunasekaran E. « Numerical Simulation of Film Thickness Formation in a PFI Engine Under Motoring Conditions ». Bonfring International Journal of Industrial Engineering and Management Science 9, no 3 (30 septembre 2019) : 11–15. http://dx.doi.org/10.9756/bijiems.9032.
Texte intégralHU, ZHAN-NING, et V. C. LO. « THICKNESS DEPENDENCE OF THE COERCIVE FIELD IN FERROELECTRIC THIN FILMS ». International Journal of Modern Physics B 20, no 22 (10 septembre 2006) : 3223–31. http://dx.doi.org/10.1142/s0217979206035424.
Texte intégralKhaneft, Alexander V., Vadim A. Dolgachev et Svyatoslav A. Rybin. « The Effect of Metal Film Thickness on Ignition of Organic Explosives with a Laser Pulse ». Molecules 24, no 24 (16 décembre 2019) : 4600. http://dx.doi.org/10.3390/molecules24244600.
Texte intégralXiong, Min, Chuanxin Teng, Ming Chen, Yu Cheng, Shijie Deng, Fuwang Li, Hongchang Deng, Houquan Liu et Libo Yuan. « Simulation Study of High Sensitivity Fiber SPR Temperature Sensor with Liquid Filling ». Sensors 22, no 15 (30 juillet 2022) : 5713. http://dx.doi.org/10.3390/s22155713.
Texte intégralThèses sur le sujet "FILM THICKNESS SIMULATION"
Іващенко, Максим Миколайович, Максим Николаевич Иващенко, Maksym Mykolaiovych Ivashchenko, Олександр Дмитрович Погребняк, Александр Дмитриевич Погребняк, Oleksandr Dmytrovych Pohrebniak, S. N. Abdulla et A. A. K. Muhammed. « Design and Fabrication Heterojunction Solarcell of Si-CdS-ZnO Thin Film ». Thesis, Sumy State University, 2012. http://essuir.sumdu.edu.ua/handle/123456789/35487.
Texte intégralŽonda, Peter. « Konstrukce simulátoru kyčelního kloubu ». Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2016. http://www.nusl.cz/ntk/nusl-241896.
Texte intégralPolnický, Vojtěch. « Konstrukce simulátoru kolenního kloubu ». Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2017. http://www.nusl.cz/ntk/nusl-318786.
Texte intégralSommer, Oliver. « Ein Beitrag zur Untersuchung des Verhaltens dünner Flüssigkeitsfilme nahe gekrümmten Substratoberflächen ». Doctoral thesis, Universitätsbibliothek Chemnitz, 2014. http://nbn-resolving.de/urn:nbn:de:bsz:ch1-qucosa-154946.
Texte intégralIn this study the behaviour of a thin liquid layer at a curved solid edge was examined by experimental coating investigations based on the laser-induced fluorescence technique and by numerical film simulations based on the Volume-of-Fluid multiphase flow model, respectively. The main motivation was to find optimal combinations of influencing quantities to reduce the fat-edge effect. Therefore a study of these quantities was performed, in which application parameters like edge radii of curvature and application layer thicknesses as well as determining liquid properties like viscosity and surface tension have been varied. Results are described qualitatively at corresponding fat-edge shapes and quantified by suitable fat-edge parameters, which had to be identified and selected. It could be shown that adverse and appropriate influencing parameter combinations exist, which generate conspicuous and less distinctive fat-edges, respectively - especially in laboratory experiments. The experimental findings and proportionalities regarding fat-edge shapes and dimensions are found to be physically plausible. Furthermore an order of significance of the influencing quantities established. Eventually, a dimensionless quantity was derived by dimensional analysis, which describes the fat-edge effect. Thus, the fat-edge effect has also been described by the application of similarity theory and the corresponding dimenionless number, respectively
Tsai, Dian-Yang, et 蔡典洋. « Simulation of Polysilicon Thin Film Transistor Characteristics with LDD and Field Plate Thickness Variation Design ». Thesis, 2019. http://ndltd.ncl.edu.tw/handle/fs79pe.
Texte intégral逢甲大學
電子工程學系
107
Abstract Polycrystalline silicon thin-film transistors(Poly-Si) are widely used in various field ,including active-matrix liquid crystal displays(AM-LCDs), solar cells and three-dimensional(3-D) integrated circuit because they have high carrier mobility and driving current. It is widely known that the high electric field induced near the drain causes several undesirable effects in the device electrical characteristics, such as the large leakage current, kink effect, and hot carrier effect. In recent years,many groups which research TFTs have made efforts in the issue of electric field distribution. The non-ideal effects of high electric-field at drain were improved by various structure designs, including offset structure. This study was continued and changed the novel structure previously proposed by the laboratory with increasing the thickness of the field plate which will improve the dispersion of currents, avoid high electric fields, and reduce ion collisions. We use ISE-TCAD to simulate the electric field, electron current density, and impact ionization distributions of the novel -TFT to do analyses of the device performances. We found that the novel -TFT has a lower leakage current, higher breakdown voltage, and reduces impact ionization. Further more,it improves kink effect. Finally, our experimental results demonstrated novel-TFT effectively improved the kink effect and leakage current effects. In addition, for the device stability, the FPRSD-TFT degraded slower than conventional TFT, because of a combination of field plate and RSD.
LU, JYUN-HONG, et 盧俊宏. « Dynamically Monitoring the Thickness of Film using Envelope Analysis─The Preliminary Simulation of Uniformity of Large-Area Ta2O5 Thin Film Deposited by RF Magnetron Sputtering ». Thesis, 2007. http://ndltd.ncl.edu.tw/handle/05507665771991951389.
Texte intégral輔仁大學
物理學系
95
It’s extremely important that getting a stably optical characteristic to coat a optical thin film, especially for the uniformity of large-area optical thin film. In this thesis, I use a self-made mode to move and roll the substrate. At the same time, I choose the specific programming language, called LabVIEW to code optical monitoring programs, which is based on envelope analysis. Furthermore, I build a wideband dynamic film thickness control system on RF magnetron sputtering coater and use the substrate, which is a disc in shape to simulate the large-area coating. In the end, I analyze the uniformity of film thickness and the reason of the inaccuracy.
GAUR, SHAILENDRA KUMAR. « HEAT & ; MASS TRANSFER ANALYSIS OF GOLD, TIN & ; INDIUM THIN LAYER DEPOSITION ON SURFACE ». Thesis, 2016. http://dspace.dtu.ac.in:8080/jspui/handle/repository/14778.
Texte intégralKuo-Wei, Huang, et 黃國瑋. « Dynamically Monitoring the Thickness of Film using Wideband Optical Monitoring –The Preliminary Simulation of Uniformity of Large-Area TiN and Si Thin Film Deposited by RF Magnetron Sputtering ». Thesis, 2007. http://ndltd.ncl.edu.tw/handle/80265786159512487551.
Texte intégral輔仁大學
物理學系
96
Since the uniform of thickness is different in every position on the thin film, useful area maybe small in a large area thin film application. The main subject in this study is to construct an optical monitoring system in magnetron sputtering system. Using Wideband Optical Monitoring as the monitoring method, we decrease the thickness errors at modified ceased point. Moreover, we cooperate dynamic film thickness control device to coat TiN and Si thin film and discuss the uniform. The experiments proof that, we got success in using this monitoring method to control the thickness and coating uniform film.
Yu, Jia-Cong, et 余佳璁. « Dynamically Monitoring and Compensating the Thickness of Film using Turning Point Value Analysis-The Preliminary Simulation of Uniformity of Large-Area Ta2O5 Thin Film Deposited by RF Magnetron Sputtering ». Thesis, 2008. http://ndltd.ncl.edu.tw/handle/07958095493905949383.
Texte intégral輔仁大學
物理學系
96
The thickness of film has to reach the specific degree of uniformity, because it effects optical characteristic directly by itself. However, the bigger size of the substrate is, the harder demand of uniformity reach. The thesis mainly concerns the situation of the uniformity in the thickness of Ta2O5 film being deposited on the circular substrate whose diameter is 180mm. The research method is to set up Dynamical Monitoring which optical monitors with turning point value analysis on RF magnetron sputtering coater. The major findings were as follow: (1)The fineness of the uniformity in the thickness of Ta2O5 films which are in the same radius and different degrees. (2)The whole thickness is thicker than the planned thickness, however, the researcher correct the inaccuracy through modifying the monitoring wavelength.
Chao, Wei-Siang, et 趙偉翔. « Effects of mainstream Reynolds number, boundary layer thickness, and turbulence intensity on film cooling with a fan-shaped hole by direct numerical simulation ». Thesis, 2018. http://ndltd.ncl.edu.tw/handle/63287w.
Texte intégral國立交通大學
機械工程系所
106
The aim of this thesis is to investigate film cooling problems with a fan-shaped cooling hole. In order to simulate this subject realistically, the viscosity and compressibility of the gas are taken into consideration simultaneously. Several methods, such as Roe scheme, preconditioning and dual time stepping matching the LUSGS method, are adopted in the current CFD code to solve compressible flow problems. Firstly, the mainstream Reynolds number is varied to study its effect on film cooling. Results indicate that the blow-off phenomenon happens when the mainstream Reynolds number equals to 480. On the contrary, at the higher Reynolds number, the coolant jet is deflected by the mainstream fluid. Thus, a better film cooling performance is achieved with higher mainstream Reynolds number (Re=3200). A detailed comparison of the vortex structure is presented in this study. Secondly, the Boundary layer thickness is varied to study its influence on film cooling. Results reveal that a horseshoe vortex appears with a thicker mainstream boundary layer, and thus the lateral coverage of the coolant fluid is increased significantly. Also, the increase of turbulence intensity eliminates the blow-off phenomenon, which happens in a thin mainstream boundary layer condition.
Chapitres de livres sur le sujet "FILM THICKNESS SIMULATION"
Peter, Johannes M. F., et Markus J. Kloker. « Numerical Simulation of Film Cooling in Supersonic Flow ». Dans Notes on Numerical Fluid Mechanics and Multidisciplinary Design, 79–95. Cham : Springer International Publishing, 2020. http://dx.doi.org/10.1007/978-3-030-53847-7_5.
Texte intégralPotyka, Johanna, Johannes Kromer, Muyuan Liu, Kathrin Schulte et Dieter Bothe. « Modelling and Numerical Simulation of Binary Droplet Collisions Under Extreme Conditions ». Dans Fluid Mechanics and Its Applications, 127–47. Cham : Springer International Publishing, 2022. http://dx.doi.org/10.1007/978-3-031-09008-0_7.
Texte intégralMoroz, L. I., E. M. Veselova et A. G. Maslovskaya. « Simulation of Thickness-Dependent Polarization Switching in Ferroelectric Thin Films Using COMSOL Multiphysics ». Dans SMART Automatics and Energy, 49–57. Singapore : Springer Singapore, 2022. http://dx.doi.org/10.1007/978-981-16-8759-4_6.
Texte intégralErkkilä, Anna-Leena, Jukka Räbinä, Ilkka Pölönen, Timo Sajavaara, Esa Alakoski et Tero Tuovinen. « Using Wave Propagation Simulations and Convolutional Neural Networks to Retrieve Thin Film Thickness from Hyperspectral Images ». Dans Intelligent Systems, Control and Automation : Science and Engineering, 261–75. Cham : Springer International Publishing, 2021. http://dx.doi.org/10.1007/978-3-030-70787-3_17.
Texte intégralMo, Guowei, Yunxian Cui, Junwei Yin, Pengfei Gao et Babak Safaei. « Design and Simulation of Smart Bolt Based on Zno Piezoelectric Thin Film Sensor ». Dans Proceedings of the 2022 International Conference on Smart Manufacturing and Material Processing (SMMP2022). IOS Press, 2022. http://dx.doi.org/10.3233/atde220828.
Texte intégralRaniero, Walter, Gianantonio Della Mea et Matteo Campostrini. « Functionalization of Surfaces with Optical Coatings Produced by PVD Magnetron Sputtering ». Dans Research Perspectives on Functional Micro- and Nanoscale Coatings, 170–207. IGI Global, 2016. http://dx.doi.org/10.4018/978-1-5225-0066-7.ch007.
Texte intégralXu, Fangwei, et Xiaojian Liu. « Dynamic Texture Design Method Based on Fresnel Optical Principle ». Dans Frontiers in Artificial Intelligence and Applications. IOS Press, 2023. http://dx.doi.org/10.3233/faia220709.
Texte intégralTchangnwa Nya, Fridolin, et Guy Maurel Dzifack Kenfack. « Thin-Film Solar Cells Performances Optimization : Case of Cu (In, Ga) Se2-ZnS ». Dans Solar Cells [Working Title]. IntechOpen, 2021. http://dx.doi.org/10.5772/intechopen.93817.
Texte intégralActes de conférences sur le sujet "FILM THICKNESS SIMULATION"
Washizu, Hitoshi, Shuzo Sanda, Shi-Aki Hyodo, Toshihide Ohmori, Noriaki Nishino et Atsushi Suzuki. « All-Atom Molecular Dynamics Simulation of Submicron Thickness EHL Oil Film ». Dans ASME/STLE 2007 International Joint Tribology Conference. ASMEDC, 2007. http://dx.doi.org/10.1115/ijtc2007-44179.
Texte intégralWang, Xinwei, et Cecil Lawrence. « Molecular Dynamics Simulation of Thermal Conductivity of Silicon Films Using Environment-Dependent Interatomic Potential ». Dans ASME 2004 Heat Transfer/Fluids Engineering Summer Conference. ASMEDC, 2004. http://dx.doi.org/10.1115/ht-fed2004-56725.
Texte intégralMartini, A., Y. Liu, R. Q. Snurr et Q. Wang. « Integration of a Molecular Viscosity Model and a Continuum EHL Solution for Simulation of Thin Film Lubrication ». Dans World Tribology Congress III. ASMEDC, 2005. http://dx.doi.org/10.1115/wtc2005-63091.
Texte intégralSverdlov, Viktor, Oskar Baumgartner, Thomas Windbacher, Franz Schanovsky et Siegfried Selberherr. « Thickness Dependence of the Effective Masses in a Strained Thin Silicon Film ». Dans 2009 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD). IEEE, 2009. http://dx.doi.org/10.1109/sispad.2009.5290252.
Texte intégralJi, Pengfei, Mengzhe He, Yiming Rong, Yuwen Zhang et Yong Tang. « Multiscale Investigation of Thickness Dependent Melting Thresholds of Nickel Film Under Femtosecond Laser Heating ». Dans ASME 2018 International Mechanical Engineering Congress and Exposition. American Society of Mechanical Engineers, 2018. http://dx.doi.org/10.1115/imece2018-86947.
Texte intégralLiu, Qi-Xin, Pei-Xue Jiang et Heng Xiang. « Molecular Dynamics Simulation of Non-Fourier Heat Conduction ». Dans 2007 First International Conference on Integration and Commercialization of Micro and Nanosystems. ASMEDC, 2007. http://dx.doi.org/10.1115/mnc2007-21151.
Texte intégralKakimpa, B., H. P. Morvan et S. Hibberd. « The Numerical Simulation of Multi-Scale Oil Films Using Coupled VOF and Eulerian Thin-Film Models ». Dans ASME Turbo Expo 2016 : Turbomachinery Technical Conference and Exposition. American Society of Mechanical Engineers, 2016. http://dx.doi.org/10.1115/gt2016-56747.
Texte intégralLan, H., M. Friedrich, B. F. Armaly et J. A. Drallmeier. « Three-Dimensional Shear Driven Thin Liquid Film in a Duct ». Dans ASME 2006 International Mechanical Engineering Congress and Exposition. ASMEDC, 2006. http://dx.doi.org/10.1115/imece2006-15113.
Texte intégralHuang, Zhengxing, Zhenan Tang, Suyuan Bai et Jun Yu. « Temperature Dependence of Thermal Conductivity of Amorphous and Crystal Thin Film by Molecular Dynamics Simulation ». Dans ASME 2007 5th International Conference on Nanochannels, Microchannels, and Minichannels. ASMEDC, 2007. http://dx.doi.org/10.1115/icnmm2007-30085.
Texte intégralGada, Vinesh H., et Atul Sharma. « Simulation of Multi-Mode Film Boiling Using Level Set Method ». Dans ASME 2009 International Mechanical Engineering Congress and Exposition. ASMEDC, 2009. http://dx.doi.org/10.1115/imece2009-11161.
Texte intégral