Bibliographies thématiques / Augmented Metrology

Littérature scientifique sur le sujet « Augmented Metrology »

Auteur : Grafiati
Publié le 7 juillet 2024
Mis à jour le 7 juillet 2024

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Articles de revues sur le sujet "Augmented Metrology"

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Poon, Ting-Chung, Yaping Zhang, Liangcai Cao et Hiroshi Yoshikawa. « Editorial on Special Issue “Holography, 3-D Imaging and 3-D Display” ». Applied Sciences 10, no 20 (11 octobre 2020) : 7057. http://dx.doi.org/10.3390/app10207057.

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Modern holographic techniques have been successfully applied in many important areas, such as 3D inspection, 3D microscopy, metrology and profilometry, augmented reality, and industrial informatics [...]
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Siv, Julie, Rafael Mayer, Guillaume Beaugrand, Guillaume Tison, Rémy Juvénal et Guillaume Dovillaire. « Testing and characterization of challenging optics and optical systems with Shack Hartmann wavefront sensors ». EPJ Web of Conferences 215 (2019) : 06003. http://dx.doi.org/10.1051/epjconf/201921506003.

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The Shack-Hartman wavefront sensor is a common metrology tool in the field of laser, adaptive optics and astronomy. However, this technique is still scarcely used in optics and optical system metrology. With the development of manufacturing techniques and the increasing need for optical characterization in the industry, the Shack-Hartmann wavefront sensor emerges as an efficient complementary tool to the well-established Fizeau interferometry for optical system metrology. Moreover, the raise of smart vehicles equipped with optical sensors and augmented reality, the optical characterization of glass and transparent flat materials becomes an issue that can be addressed with Shack-Hartmann sensors. Aberration measurements of challenging optics will be presented such as optical filters, thin flat optics, aspheric lenses and large optical assemblies.
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Nawab, Rahma, et Angela Davies Allen. « Low-Cost AR-Based Dimensional Metrology for Assembly ». Machines 10, no 4 (30 mars 2022) : 243. http://dx.doi.org/10.3390/machines10040243.

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The goal of this study was to create and demonstrate a system to perform fast and inexpensive quality dimensional inspection for industrial assembly line applications with submillimeter uncertainty. Our focus is on the positional errors of the assembled pieces on a larger part as it is assembled. This is achieved by using an open-source photogrammetry architecture to gather a point cloud data of an assembled part and then comparing this to a computer-aided design (CAD) model. The point cloud comparison to the CAD model is used to quantify errors in position using the iterative closest point (ICP) algorithm. Augmented reality is utilized to view the errors in a live-video feed and effectively display said errors. The initial demonstration showed an assembled position error of 9 mm ± 0.4 mm for a 40-mm high post.
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Kerst, Thomas, Mohammad Bitarafan, Laura Jokinen, Ilkka Alasaarela, Seppo Tillanen, David Zautasvili et Nikhil Pachhandara. « 82‐3 : Rapid AR/VR Device Eye‐Box Measurement Using a Wide‐FOV Lens ». SID Symposium Digest of Technical Papers 54, no 1 (juin 2023) : 1155–57. http://dx.doi.org/10.1002/sdtp.16779.

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We present a method to rapidly and accurately measure the eye box of Augmented Reality (AR) and Virtual Reality (VR) eyewear. We demonstrate that this rapid method measures the eye box with a fidelity comparable to slower, traditional methods. The presented rapid method uses a lens that mimics the human eye in core aspects like pupil position, pupil size and field of view to get an impression of the eyewear performance as it appears to a human user with single image capture. By combining as few as three such image captures with such a lens, one can rapidly and accurately measure the entire eye box geometry of any given AR or VR eyewear. We further demonstrate the advantages of adopting this new method by referencing the display metrology industry, where this method has already been adopted as the new metrology standard.
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Arpaia, Pasquale, Egidio De Benedetto, Concetta Anna Dodaro, Luigi Duraccio et Giuseppe Servillo. « Metrology-Based Design of a Wearable Augmented Reality System for Monitoring Patient’s Vitals in Real Time ». IEEE Sensors Journal 21, no 9 (1 mai 2021) : 11176–83. http://dx.doi.org/10.1109/jsen.2021.3059636.

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Gonçalves, GL, JU Delgado et FB Razuck. « The use of Augmented Reality for the teaching of dosimetry and metrology of ionizing radiation at IRD ». Journal of Physics : Conference Series 1826, no 1 (1 mars 2021) : 012041. http://dx.doi.org/10.1088/1742-6596/1826/1/012041.

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Ho, P. T., J. A. Albajez, J. A. Yagüe et J. Santolaria. « Preliminary study of Augmented Reality based manufacturing for further integration of Quality Control 4.0 supported by metrology ». IOP Conference Series : Materials Science and Engineering 1193, no 1 (1 octobre 2021) : 012105. http://dx.doi.org/10.1088/1757-899x/1193/1/012105.

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Abstract Augmented Reality (AR) is a key technology enabling Industry 4.0, which enriches human perspectives by overlaying digital information onto the real world. The maturity of AR technology has grown recently. As processes in the automotive and aeronautic sectors require high quality and near-zero error rates to ensure the safety of end-users, AR can be implemented to facilitate workers with immersive interfaces to enhance productivity, accuracy and autonomy in the quality sector. In order to analyse whether there is a real and growing interest in the use of AR as assisting technology for manufacturing sector in general and quality control in particular, two specific research questions are defined. In addition, two well-known research databases (Scopus, Web of Science) are used for the paper selection phase in accordance with the Preferred Reporting Items for Systematic Reviews and Meta-Analyses (PRISMA) methodology to conduct a preliminary study and evaluate the current development of AR applications in manufacturing sector in order to answer the defined questions. It is found that while the development of AR technology has widely implemented to assign real-time information to several systems and processes in assembly and maintenance sectors, this tendency has only emerged in the quality sector over the last few years. However, AR-based quality control has proved its advantages in improving productivity, accuracy and precision of operators as well as benefits to manufacturing in terms of product and process quality control across different manufacturing phases.
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Zhao, Lei, et Chaohao Wang. « 50.2 : Invited Paper : A Closer Look : Advancements in Near‐Eye Display Testing and Metrology ». SID Symposium Digest of Technical Papers 54, S1 (avril 2023) : 354–60. http://dx.doi.org/10.1002/sdtp.16303.

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This paper discusses the importance of optical testing metrology for near‐eye displays (NED) used in virtual reality (VR) and augmented reality (AR) environments. The accuracy of parameters such as resolution, contrast, field of view, and color accuracy is critical to the effectiveness of NED. However, existing testing methods for these parameters may not consider the visual characteristics of NED. The paper proposes innovative testing methods for evaluating contrast, pupil swim, and pixel per degree (PPD) in NED. The proposed ANSI contrast test method is found to be more suitable for evaluating the contrast of VR headsets than traditional methods. The paper also proposes two advanced PPD testing methods that take into account lens design and image rendering, providing a more accurate and comprehensive evaluation of pixel distribution on screens at different viewing angles. These testing methods have the potential to improve the development of high‐resolution displays and advance our understanding of the perception of visual stimuli.
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Prusakov, A. N., V. V. Popadyev et V. F. Pankin. « The Working Week of the International Federation of Surveyors under the motto “From digitalization to augmented reality” ». Geodesy and Cartography 926, no 8 (20 septembre 2017) : 25–38. http://dx.doi.org/10.22389/0016-7126-2017-926-8-25-38.

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The information on the last regular Working week, International Federation of Surveyors (FIG) 2017 hold in May-June 2017 in Helsinki (Finland) was given. The article reflects a brief summary of the scientific program of the Working week, which was implemented in the framework of 3 Plenary sessions and 10 technical committees of the International Federation of surveyors (FIG). Also, within sectional meetings organized by the FIG together with its partners, for example, the World Bank and FIG, and the Inspirational Short Sessions (ISS). Information on the technical exhibition, attended by 24 manufacturers of survey equipment, software and accessories is provided. The main areas of developing geodetic science, production and education, and suggested ways of integration by scientists and specialists of the FSBE “Centre of geodesy, cartography and SDI” in the activities of the International Federation of surveyors (FIG) were summarized. The information on the working meeting between the delegation of the FSBE "Centre of geodesy, cartography and SDI" and Finnish Geospatial Research Institute of data on scientific and technical cooperation between the two organizations in the field of geodesy, gravimetry, geodynamics, metrology and standardization was given.
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Ćirić, Ivan, Milan Banić, Miloš Simonović, Aleksandar Miltenović, Dušan Stamenković et Vlastimir Nikolić. « TOWARDS MACHINE VISION BASED RAILWAY ASSETS PREDICTIVE MAINTENANCE ». Facta Universitatis, Series : Automatic Control and Robotics 19, no 2 (8 décembre 2020) : 125. http://dx.doi.org/10.22190/fuacr2002125c.

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The main goal of this paper is to present novel technologies that can contribute to safety, competitiveness, efficiency and operational reliability of Railway infrastructure through the development of innovative solutions for measuring and monitoring of railway assets based on machine vision. Measuring the transversal position of the wheels on the rail, as well as identification of the defects of the wheel and the rail (such as deformation of rail head edge, lateral wear, worn wheels, cracks in wheel and rail, rolling contact fatigue, corrugation and other irregularities) can increase reliability and lower maintenance costs. Currently, there is a need on the market for the innovative solution, namely the on-board high-speed stereo camera system augmented with a system that projects custom pattern (fringe scanner system) for measuring the transversal position of the wheels on the rail, robust to environmental conditions and waste along the track that can provide reliable measurements of transversal position of the wheels up to 200 km/h. New trends in Precise Industrial 3D Metrology are showing that stereo vision is an absolute must have in modern specialized optical precision measuring systems for the three-dimensional coordinate measurement.
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Thèses sur le sujet "Augmented Metrology"

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Bourguignon, Thibaut. « Implémentation et évaluation de la mesure Overlay in-situ par microscopie électronique pour la production de puces électroniques ». Electronic Thesis or Diss., Université Grenoble Alpes, 2024. http://www.theses.fr/2024GRALT001.

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Les circuits intégrés sont fabriqués via un empilement de diverses couches. L’alignement précis de ces niveaux, dit « overlay (OVL)», est critique pour assurer la fiabilité des puces. Les spécifications sont très strictes : sur une plaque de 300mm de diamètre, chaque motif doit être aligné avec une précision de quelques nanomètres. Les méthodes actuelles, basées sur l'observation optique de mires dédiées, montrent leurs limites en termes de représentativité et d'évaluation de la variabilité locale.Cette thèse propose une approche novatrice, exploitant la microscopie électronique à balayage (SEM), afin de mesurer avec précision ces variations locales et d'appréhender les biais induits par les mires. Pour cela, un algorithme innovant permettant la mesure de l’overlay à partir de contours SEM a été développé. Par le recalage de contours de référence sur les contours extraits, l’overlay est mesuré directement sur le produit, nécessiter de mire spécifique, même en présence de niveaux partiellement masqués.Suite à l'évaluation de cette méthode sur des images synthétiques, son application sur des plaques de production a permis de quantifier la variabilité locale de l'overlay sur le produit, de mettre en évidence les écarts par rapport aux mesures en ligne, tout en révélant les limites de la métrologie SEM-OVL
Integrated circuits are manufactured via a stack of various layers. The precise alignment of these layers, known as "overlay" (OVL), is critical to chip reliability. The specifications are very strict: on a 300mm-diameter wafer, each pattern must be aligned to within a few nanometres. Current methods, based on optical observation of dedicated test patterns, show their limitations in terms of representativeness and assessment of local variability.This thesis proposes an innovative approach, using scanning electron microscopy (SEM), to accurately measure these local variations and to understand the biases induced by the test patterns. To this end, an algorithm for measuring the overlay from SEM contours has been developed. By registering reference contours on the extracted contours, the overlay is measured directly on the product, without the need for a specific test pattern, even in the presence of partially masked levels.Following the evaluation of this method on synthetic images, its application to production wafers enabled us to quantify the local variability of the overlay on the product, highlighting deviations from on-line measurements, while revealing the limits of SEM-OVL metrology
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Actes de conférences sur le sujet "Augmented Metrology"

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Schmid, Stephan, et Dieter Fritsch. « Precision analysis of triangulations using forward-facing vehicle-mounted cameras for augmented reality applications ». Dans SPIE Optical Metrology, sous la direction de Fabio Remondino et Mark R. Shortis. SPIE, 2017. http://dx.doi.org/10.1117/12.2269716.

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Migukin, Artem, Vladimir Katkovnik et Jaakko Astola. « Optimal phase retrieval from multiple observations with Gaussian noise : augmented Lagrangian algorithm for phase objects ». Dans SPIE Optical Metrology, sous la direction de Peter H. Lehmann, Wolfgang Osten et Kay Gastinger. SPIE, 2011. http://dx.doi.org/10.1117/12.889118.

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Gaglione, S., A. Angrisano, G. Castaldo, C. Gioia, A. Innac, L. Perrotta, G. Del Core et S. Troisi. « GPS/Barometer augmented navigation system : Integration and integrity monitoring ». Dans 2015 IEEE Metrology for Aerospace (MetroAeroSpace). IEEE, 2015. http://dx.doi.org/10.1109/metroaerospace.2015.7180647.

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Winters, Daniel, Masashi Mitsui, Masamichi Ueda, Sven Sassning, Mohit Yadav, Patrik Langehanenberg et Jan-Hinrich Eggers. « High-precision 3D metrology for stacked diffractive augmented reality waveguides ». Dans Optifab 2023, sous la direction de Jessica DeGroote Nelson et Blair L. Unger. SPIE, 2023. http://dx.doi.org/10.1117/12.2688509.

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Plopski, Alexander, Varunyu Fuvattanasilp, Jarkko Poldi, Takafumi Taketomi, Christian Sandor et Hirokazu Kato. « Efficient In-Situ Creation of Augmented Reality Tutorials ». Dans 2018 Workshop on Metrology for Industry 4.0 and IoT. IEEE, 2018. http://dx.doi.org/10.1109/metroi4.2018.8428320.

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Hua, Hong. « Lightweight, Low-cost Augmented Reality Displays Enabled by Freeform Optical Technology ». Dans Applied Industrial Optics : Spectroscopy, Imaging and Metrology. Washington, D.C. : OSA, 2013. http://dx.doi.org/10.1364/aio.2013.aw1b.4.

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Notaros, Jelena, Milica Notaros, Manan Raval, Christopher V. Poulton, Matthew J. Byrd, Nanxi Li, Zhan Su et al. « Integrated Optical Phased Arrays for LiDAR, Communications, Augmented Reality, and Beyond ». Dans Applied Industrial Optics : Spectroscopy, Imaging and Metrology. Washington, D.C. : OSA, 2021. http://dx.doi.org/10.1364/aio.2021.m2a.3.

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Macmahon, Nelson Sosa, Juan Manuel Ramírez Cortés et Leopoldo Altamirano Robles. « Simulator in Augmented Reality Environment for Natural Interaction for Assembling Electrical Equipment ». Dans Applied Industrial Optics : Spectroscopy, Imaging and Metrology. Washington, D.C. : OSA, 2012. http://dx.doi.org/10.1364/aio.2012.jtu5a.22.

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Kellogg, James, Kathleen Andrea-Liner, Jennifer Jennings, Steven Timms, Robert C. Keramidas, Johnnie Berry, Tony DeLaCruz et al. « Augmented reality assisted astronaut operations in space to upgrade the cold atom lab instrument ». Dans Quantum Sensing, Imaging, and Precision Metrology, sous la direction de Selim M. Shahriar et Jacob Scheuer. SPIE, 2023. http://dx.doi.org/10.1117/12.2650750.

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Neagu, Carina Sonia, Andreea Codruta Cojocariu, Cristian Zaharia, Mihai Rominu, Meda-Lavinia Negrutiu, Virgil-Florin Duma et Cosmin Sinescu. « The evaluation of dental adhesives augmented with magnetic nanoparticles ». Dans Advances in 3OM : Opto-Mechatronics, Opto-Mechanics, and Optical Metrology, sous la direction de Jannick P. Rolland, Virgil-Florin Duma et Adrian G. H. Podoleanu. SPIE, 2022. http://dx.doi.org/10.1117/12.2613382.

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