Libros sobre el tema "Thin film interconnects"
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International Symposium on Thin Film Materials, Processes, and Reliability (2003 Paris, France). Thin film materials, processes, and reliability: Plasma processing for the 100 nm node and copper interconnects with low-k inter-level dielectric films : proceedings of the international symposium. Editado por Mathad G. S, Electrochemical Society. Dielectric Science and Technology Division., Electrochemical Society Electronics Division y Electrochemical Society Meeting. Pennington, NJ: Electrochemical Society, 2003.
Buscar texto completoRee, Moonhor. Low-k nanoporous interdielectrics: Materials, thin film fabrications, structures and properties. Hauppauge, N.Y: Nova Science Publishers, 2010.
Buscar texto completoS, Ho P., ed. Stress-induced phenomena in metallization: Seventh International Workshop on Stress-Induced Phenomena in Metallization, Austin, Texas, 14-16 June 2004. Melville, N.Y: American Institute of Physics, 2004.
Buscar texto completoR, Besser Paul y Materials Research Society. Meeting Symposium B, eds. Materials, technology and reliability for advanced interconnects--2005: Symposium held March 28-April 1, 2005, San Francisco, California, U.S.A. Warrendale, Pa: Materials Research Society, 2005.
Buscar texto completoT, Chen Ray y Society of Photo-optical Instrumentation Engineers., eds. Optoelectronic interconnects: 18-20 January 1993, Los Angeles, California. Bellingham, Wash., USA: SPIE, 1993.
Buscar texto completo1948-, Carter R. J., Materials Research Society Meeting y Symposim on Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics (2004 : San Francisco, Calif.), eds. Materials, technology, and reliability for advanced interconnects and low-k dielectrics--2004: Symposium held April 13-15, 2004, San Francisco, California, U.S.A. Warrendale, Pa: Materials Research Society, 2004.
Buscar texto completoElectromigration in thin films and electronic devices: Materials and reliability. Oxford: Woodhead Publishing, 2011.
Buscar texto completoGuynes, Sean y Dan Hassler-Forest, eds. Star Wars and the History of Transmedia Storytelling. NL Amsterdam: Amsterdam University Press, 2017. http://dx.doi.org/10.5117/9789462986213.
Texto completo(Editor), Paul S. Ho, Shefford P. Baker (Editor), Tomoji Nakamura (Editor) y Cynthia A. Volkert (Editor), eds. Stress-Induced Phenomena in Metallization: Seventh International Workshop on Stress-Induced Phenomena in Metallization (AIP Conference Proceedings / AIP ... Phenomena Metallizat.). American Institute of Physics, 2004.
Buscar texto completoVLSI and Post-CMOS Electronics: Devices, Circuits and Interconnects. Institution of Engineering & Technology, 2019.
Buscar texto completoDhiman, Rohit y Rajeevan Chandel. VLSI and Post-CMOS Electronics: Devices, Circuits and Interconnects, Volume 2. Institution of Engineering & Technology, 2019.
Buscar texto completoOgawa, S., K. Maex, G. S. Oehrlein, J. T. Wetzel y Y. C. Joo. Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics: Volume 612. University of Cambridge ESOL Examinations, 2014.
Buscar texto completoCarter, R. J., C. S. Hau-Riege, G. M. Kloster, T. M. Lu y S. E. Schulz. Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics - 2004. University of Cambridge ESOL Examinations, 2014.
Buscar texto completoCarter, R. J. Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics--2004: Symposium Held April 13-15, 2004, San Francisco, Califor. Materials Research Society, 2004.
Buscar texto completoKim, Choong-Un. Electromigration in Thin Films and Electronic Devices: Materials and Reliability. Woodhead Publishing, 2016.
Buscar texto completoAdvanced Technologies for Next Generation Integrated Circuits. Institution of Engineering & Technology, 2020.
Buscar texto completoStead, Lisa. Reframing Vivien Leigh. Oxford University Press, 2021. http://dx.doi.org/10.1093/oso/9780190906504.001.0001.
Texto completoWagoner, Brady, ed. Handbook of Culture and Memory. Oxford University Press, 2017. http://dx.doi.org/10.1093/oso/9780190230814.001.0001.
Texto completoFleury, James, Bryan Hikari Hartzheim y Stephen Mamber, eds. The Franchise Era. Edinburgh University Press, 2019. http://dx.doi.org/10.3366/edinburgh/9781474419222.001.0001.
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