Artículos de revistas sobre el tema "Test signal generation"
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Burdiek, B. y W. Mathis. "Test signal generation for analog circuits". Advances in Radio Science 1 (5 de mayo de 2003): 235–38. http://dx.doi.org/10.5194/ars-1-235-2003.
Texto completoDufils, M., J. L. Carbonero, P. Planelle y P. Raynaud. "Mixed-signal simulation and test generation". International Journal of Electronics 95, n.º 3 (marzo de 2008): 239–48. http://dx.doi.org/10.1080/00207210701827954.
Texto completoYin, Qizhang, William R. Eisenstadt y Tian Xia. "Wireless System for Microwave Test Signal Generation". IEEE Design & Test of Computers 25, n.º 2 (marzo de 2008): 160–66. http://dx.doi.org/10.1109/mdt.2008.57.
Texto completoUngermann, Michael, Jan Lunze y Dieter Schwarzmann. "Test signal generation for service diagnosis based on local structural properties". International Journal of Applied Mathematics and Computer Science 22, n.º 1 (1 de marzo de 2012): 55–65. http://dx.doi.org/10.2478/v10006-012-0004-y.
Texto completoHaurie, X. y G. W. Roberts. "Arbitrary-precision signal generation for mixed-signal built-in-self-test". IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing 45, n.º 11 (1998): 1425–32. http://dx.doi.org/10.1109/82.735354.
Texto completoŽivanović, Dragan, Milan Simić, Zivko Kokolanski, Dragan Denić y Vladimir Dimcev. "Generation of Long-time Complex Signals for Testing the Instruments for Detection of Voltage Quality Disturbances". Measurement Science Review 18, n.º 2 (1 de abril de 2018): 41–51. http://dx.doi.org/10.1515/msr-2018-0007.
Texto completoHuynh, S. D., Seongwon Kim, M. Soma y Jinyan Zhang. "Automatic analog test signal generation using multifrequency analysis". IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing 46, n.º 5 (mayo de 1999): 565–76. http://dx.doi.org/10.1109/82.769805.
Texto completoKuang, Jiangyu y Tao He. "Research on automatic test sequence generation method of computer interlocking test". Journal of Physics: Conference Series 2246, n.º 1 (1 de abril de 2022): 012072. http://dx.doi.org/10.1088/1742-6596/2246/1/012072.
Texto completoDufort, B. y G. W. Roberts. "On-chip analog signal generation for mixed-signal built-in self-test". IEEE Journal of Solid-State Circuits 34, n.º 3 (marzo de 1999): 318–30. http://dx.doi.org/10.1109/4.748183.
Texto completoLiu, Xin. "Conflict-Driven Learning in Test Pattern Generation". Advanced Materials Research 301-303 (julio de 2011): 1089–92. http://dx.doi.org/10.4028/www.scientific.net/amr.301-303.1089.
Texto completoShi, Dawei, Hongliang Zhao y Xiuwen Shao. "A Pipeline Leakage Signal Simulation and Generation System". E3S Web of Conferences 257 (2021): 03070. http://dx.doi.org/10.1051/e3sconf/202125703070.
Texto completoHurst, S. L. "Analog signal generation for built-in self-test of mixed-signal integrated circuits". Microelectronics Journal 27, n.º 1 (febrero de 1996): 103–4. http://dx.doi.org/10.1016/s0026-2692(96)90016-6.
Texto completoLoukusa, Veikko. "Behavioral test generation modeling approach for mixed-signal IC verification". Microelectronics Journal 34, n.º 10 (octubre de 2003): 907–12. http://dx.doi.org/10.1016/s0026-2692(03)00164-2.
Texto completoL'Esperance, Nicholai, Timothy Platt, Mustapha Slamani y Tian Xia. "OFDM Multitone Signal Generation Technique for Analog Circuitry Test Characterization". IEEE Transactions on Circuits and Systems II: Express Briefs 63, n.º 6 (junio de 2016): 583–87. http://dx.doi.org/10.1109/tcsii.2016.2531218.
Texto completoZhou, Qin Ling. "The Study on Electric Parameters Automatic Test System". Applied Mechanics and Materials 416-417 (septiembre de 2013): 1068–71. http://dx.doi.org/10.4028/www.scientific.net/amm.416-417.1068.
Texto completoLiao, Lida y Qi Tan. "Study of the Tensile Damage of 321 Stainless Steel for Solar Thermal Power Generation by Acoustic Emission". International Journal of Photoenergy 2020 (10 de enero de 2020): 1–9. http://dx.doi.org/10.1155/2020/8450737.
Texto completoUngermann, Michael, Jan Lunze y Dieter Scharzmann. "Model-Based Test Signal Generation for Service Diagnosis of Automotive Systems". IFAC Proceedings Volumes 43, n.º 7 (julio de 2010): 117–22. http://dx.doi.org/10.3182/20100712-3-de-2013.00029.
Texto completoZarroo, M. B. y Zhao Zhi-fan. "Sequential Test Signal Generation for Parameter Estimation in Continuous-time Systems". IFAC Proceedings Volumes 21, n.º 9 (agosto de 1988): 903–11. http://dx.doi.org/10.1016/s1474-6670(17)54844-2.
Texto completoŽivanović, Dragan, Milan Simić, Dragan Denić y Živko Kokolanski. "SCRIPT FILES APPROACH IN THE POWER QUALITY EVENTS GENERATION". Facta Universitatis, Series: Automatic Control and Robotics 17, n.º 2 (28 de diciembre de 2018): 93. http://dx.doi.org/10.22190/fuacr1802093z.
Texto completoMeister, Michael y Marco Reinhard. "A modular application specific active test environment for high-temperature wafer test up to 300 °C". Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) 2019, HiTen (1 de julio de 2019): 000122–25. http://dx.doi.org/10.4071/2380-4491.2019.hiten.000122.
Texto completoMartínez-Quintero, Juan Carlos, Edith Paola Estupiñán-Cuesta y Víctor Daniel Rodríguez-Ortega. "Raspberry PI 3 RF signal generation system". Visión electrónica 13, n.º 2 (26 de julio de 2019): 294–99. http://dx.doi.org/10.14483/22484728.15160.
Texto completoZhao, Yuan, Bingliang Hu, Zhen-An He, Wenjia Xie y Xiaohui Gao. "Generation and coherent detection of QPSK signal using a novel method of digital signal processing". Modern Physics Letters B 32, n.º 04 (9 de febrero de 2018): 1850103. http://dx.doi.org/10.1142/s0217984918501038.
Texto completoYU, Ying-yang y Tong-min JIANG. "Generation of Non-Gaussian Random Vibration Excitation Signal for Reliability Enhancement Test". Chinese Journal of Aeronautics 20, n.º 3 (junio de 2007): 236–39. http://dx.doi.org/10.1016/s1000-9361(07)60038-7.
Texto completoNAHHAL, Tarik y Thao Dang. "Test Generation for Analog and Mixed-Signal Circuits Using Hybrid System Models". International Journal of VLSI Design & Communication Systems 2, n.º 3 (30 de septiembre de 2011): 21–38. http://dx.doi.org/10.5121/vlsic.2011.2302.
Texto completoXia, Tian, Rohit Shetty, Timothy Platt y Mustapha Slamani. "Low Cost Time Efficient Multi-tone Test Signal Generation Using OFDM Technique". Journal of Electronic Testing 29, n.º 6 (26 de octubre de 2013): 893–901. http://dx.doi.org/10.1007/s10836-013-5414-8.
Texto completoZhang, Peng, Hou Jun Wang, Li Li y Ping Wang. "Design and Implementation of Intermediate Frequency Generation and Analysis Module for Avionics Test". Advanced Materials Research 1049-1050 (octubre de 2014): 1147–53. http://dx.doi.org/10.4028/www.scientific.net/amr.1049-1050.1147.
Texto completoAl Hamadi, Hussam, Amjad Gawanmeh y Mahmoud Al-Qutayri. "Guided Test Case Generation for Enhanced ECG Bio-Sensors Functional Verification". International Journal of E-Health and Medical Communications 8, n.º 4 (octubre de 2017): 1–20. http://dx.doi.org/10.4018/ijehmc.2017100101.
Texto completoKramer, Jeffrey A., Emily O’Neill, Megan E. Phillips, Debra Bruce, Traci Smith, Melinda M. Albright, Sairam Bellum et al. "Early Toxicology Signal Generation in the Mouse". Toxicologic Pathology 38, n.º 3 (19 de marzo de 2010): 452–71. http://dx.doi.org/10.1177/0192623310364025.
Texto completoLu, Xu Guang, Ji Hua Tian, Xiao Han y Jin Ping Sun. "A High Bandwidth Signal Generation System Based on FPGA". Applied Mechanics and Materials 198-199 (septiembre de 2012): 1743–47. http://dx.doi.org/10.4028/www.scientific.net/amm.198-199.1743.
Texto completoZhang, Xiao Long, Fan Li y Jian Hui Zhao. "New Test System of Infrared Earth Sensor". Applied Mechanics and Materials 789-790 (septiembre de 2015): 536–39. http://dx.doi.org/10.4028/www.scientific.net/amm.789-790.536.
Texto completoZhao, Hong-Ze, Guang-Hui Wei, Xiao-Dong Pan, Xue Du y Xu-Xu Lyu. "Generation Mechanism and Characteristic Analysis of Dual-Frequency Pseudo-Signal Interference of the Swept-Frequency Radar". International Journal of Antennas and Propagation 2022 (20 de octubre de 2022): 1–14. http://dx.doi.org/10.1155/2022/2363224.
Texto completoPETRACCHI, DONATELLA, MICHELE BARBI, SANTI CHILLEMI, ELENI PANTAZELOU, DAVID PIERSON, CHRIS DAMES, LON WILKENS y FRANK MOSS. "A TEST FOR A BIOLOGICAL SIGNAL ENCODED BY NOISE". International Journal of Bifurcation and Chaos 05, n.º 01 (febrero de 1995): 89–100. http://dx.doi.org/10.1142/s0218127495000077.
Texto completoHe, Fei, Jiabei Shen, Zhi Tang, Xiaomeiao Qi y Haoran Li. "Influencing Factors of Rock Electrical Signal Analysis Based on Artificial Intelligence". Mobile Information Systems 2021 (21 de octubre de 2021): 1–9. http://dx.doi.org/10.1155/2021/1165686.
Texto completoCoyette, Anthony, Baris Esen, Nektar Xama, Georges Gielen, Wim Dobbelaere y Ronny Vanhooren. "ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed- Signal Integrated Circuits". IEEE Design & Test 35, n.º 3 (junio de 2018): 24–30. http://dx.doi.org/10.1109/mdat.2018.2799800.
Texto completoTripathi, Gyanendra Nath y Hiroaki Wagatsuma. "PCA-Based Algorithms to Find Synergies for Humanoid Robot Motion Behavior". International Journal of Humanoid Robotics 13, n.º 02 (25 de mayo de 2016): 1550037. http://dx.doi.org/10.1142/s0219843615500371.
Texto completoLi, Huai Jian, Si Song Feng y Xin Bo Wu. "Research on the Design Method of the Navigation Message for GLONASS Signal Simulator". Applied Mechanics and Materials 568-570 (junio de 2014): 1312–17. http://dx.doi.org/10.4028/www.scientific.net/amm.568-570.1312.
Texto completoWei, Shuangjiao, Bin’ai Li, Min Xue, Wenbin Zhao, Zhenglan Bian y Fenghong Chu. "Research on An Improved Phase Generation Carrier Demodulation Algorithm". Journal of Physics: Conference Series 2219, n.º 1 (1 de abril de 2022): 012033. http://dx.doi.org/10.1088/1742-6596/2219/1/012033.
Texto completoBae, Youngseok, Sunghoon Jang, Sungjun Yoo, Minwoo Yi, Joonhyung Ryoo y Jinwoo Shin. "Automatic Bias Control Technique of Dual-Parallel Mach–Zehnder Modulator Based on Simulated Annealing Algorithm for Quadrupled Signal Generation". Photonics 8, n.º 3 (17 de marzo de 2021): 80. http://dx.doi.org/10.3390/photonics8030080.
Texto completoM. Nanak Zakaria, Achmad Setiawan, Ahmad Wilda Y y Lis Diana Mustafa. "Gaussian Distributed Noise Generator Design Using MCU-STM32". Jurnal RESTI (Rekayasa Sistem dan Teknologi Informasi) 6, n.º 2 (20 de abril de 2022): 183–89. http://dx.doi.org/10.29207/resti.v6i2.3684.
Texto completoChen, Zhang Wei, Xiang Wen y Dong Jiao Chen. "Application Research for Super-Gaussian Random Vibration Test Control Strategy". Applied Mechanics and Materials 141 (noviembre de 2011): 83–87. http://dx.doi.org/10.4028/www.scientific.net/amm.141.83.
Texto completoStryhun, V., R. Barvinok, O. Bilous y V. Tolmachov. "IMPROVEMENT OF METHODS FOR TESTING OF NAVIGATION USER EQUIPMENT OF GLOBAL NAVIGATION SATELLITE SYSTEMS USING A NAVIGATION SIGNAL SIMULATOR". Наукові праці Державного науково-дослідного інституту випробувань і сертифікації озброєння та військової техніки, n.º 6 (30 de diciembre de 2020): 95–102. http://dx.doi.org/10.37701/dndivsovt.6.2020.11.
Texto completoWang, Li, Wenli Chen, Kai Chen, Renjun He y Wenjian Zhou. "The Research on the Signal Generation Method and Digital Pre-Processing Based on Time-Interleaved Digital-to-Analog Converter for Analog-to-Digital Converter Testing". Applied Sciences 12, n.º 3 (7 de febrero de 2022): 1704. http://dx.doi.org/10.3390/app12031704.
Texto completoPan, Zhong Liang y Ling Chen. "Test Generation for Glitch Faults of Crosstalk Effects in Digital Circuits Based on Genetic Algorithm with Niche". Applied Mechanics and Materials 20-23 (enero de 2010): 647–52. http://dx.doi.org/10.4028/www.scientific.net/amm.20-23.647.
Texto completoKnappe, Sabine, Susanne Till, Gabriele Gerstenbauer, Friedrich Scheiflinger y Michael Dockal. "The Application of Thrombin Generation Test Is Compromised By Antithrombin III Deficiency". Blood 126, n.º 23 (3 de diciembre de 2015): 4663. http://dx.doi.org/10.1182/blood.v126.23.4663.4663.
Texto completoFlores, Maria da Glória, Marcelo Negreiros, Luigi Carro y Altamiro Susin. "A Noise Generator for Embedded Circuits Testing". Journal of Integrated Circuits and Systems 1, n.º 1 (16 de noviembre de 2004): 38–43. http://dx.doi.org/10.29292/jics.v1i1.253.
Texto completoZhou, Jingyu, Shulin Tian, Chenglin Yang y Xuelong Ren. "Test Generation Algorithm for Fault Detection of Analog Circuits Based on Extreme Learning Machine". Computational Intelligence and Neuroscience 2014 (2014): 1–11. http://dx.doi.org/10.1155/2014/740838.
Texto completoLu, Yong Xing y Jia Hua Guo. "Method Based on Bi-Spectrum Research on Driving Signal Generation in Multi Random Vibration Test". Applied Mechanics and Materials 543-547 (marzo de 2014): 2614–18. http://dx.doi.org/10.4028/www.scientific.net/amm.543-547.2614.
Texto completoZhong, Zijia y Joyoung Lee. "Virtual Guide Dog: Next-generation pedestrian signal for the visually impaired". Advances in Mechanical Engineering 12, n.º 3 (marzo de 2020): 168781401988309. http://dx.doi.org/10.1177/1687814019883096.
Texto completoZmysłowski, Dariusz y Jan M. Kelner. "Mobile Network Operators’ Assessment Based on Drive-Test Campaign in Urban Area for iPerf Scenario". Applied Sciences 14, n.º 3 (3 de febrero de 2024): 1268. http://dx.doi.org/10.3390/app14031268.
Texto completoLiu, G. P., P. H. Mu, G. Guo, X. T. Liu y G. S. Hu. "High-quality random bit generation based on a cascade-coupled nano-laser system". Laser Physics Letters 21, n.º 3 (29 de enero de 2024): 035206. http://dx.doi.org/10.1088/1612-202x/ad1f4f.
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