Literatura académica sobre el tema "Test signal generation"
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Artículos de revistas sobre el tema "Test signal generation"
Burdiek, B. y W. Mathis. "Test signal generation for analog circuits". Advances in Radio Science 1 (5 de mayo de 2003): 235–38. http://dx.doi.org/10.5194/ars-1-235-2003.
Texto completoDufils, M., J. L. Carbonero, P. Planelle y P. Raynaud. "Mixed-signal simulation and test generation". International Journal of Electronics 95, n.º 3 (marzo de 2008): 239–48. http://dx.doi.org/10.1080/00207210701827954.
Texto completoYin, Qizhang, William R. Eisenstadt y Tian Xia. "Wireless System for Microwave Test Signal Generation". IEEE Design & Test of Computers 25, n.º 2 (marzo de 2008): 160–66. http://dx.doi.org/10.1109/mdt.2008.57.
Texto completoUngermann, Michael, Jan Lunze y Dieter Schwarzmann. "Test signal generation for service diagnosis based on local structural properties". International Journal of Applied Mathematics and Computer Science 22, n.º 1 (1 de marzo de 2012): 55–65. http://dx.doi.org/10.2478/v10006-012-0004-y.
Texto completoHaurie, X. y G. W. Roberts. "Arbitrary-precision signal generation for mixed-signal built-in-self-test". IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing 45, n.º 11 (1998): 1425–32. http://dx.doi.org/10.1109/82.735354.
Texto completoŽivanović, Dragan, Milan Simić, Zivko Kokolanski, Dragan Denić y Vladimir Dimcev. "Generation of Long-time Complex Signals for Testing the Instruments for Detection of Voltage Quality Disturbances". Measurement Science Review 18, n.º 2 (1 de abril de 2018): 41–51. http://dx.doi.org/10.1515/msr-2018-0007.
Texto completoHuynh, S. D., Seongwon Kim, M. Soma y Jinyan Zhang. "Automatic analog test signal generation using multifrequency analysis". IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing 46, n.º 5 (mayo de 1999): 565–76. http://dx.doi.org/10.1109/82.769805.
Texto completoKuang, Jiangyu y Tao He. "Research on automatic test sequence generation method of computer interlocking test". Journal of Physics: Conference Series 2246, n.º 1 (1 de abril de 2022): 012072. http://dx.doi.org/10.1088/1742-6596/2246/1/012072.
Texto completoDufort, B. y G. W. Roberts. "On-chip analog signal generation for mixed-signal built-in self-test". IEEE Journal of Solid-State Circuits 34, n.º 3 (marzo de 1999): 318–30. http://dx.doi.org/10.1109/4.748183.
Texto completoLiu, Xin. "Conflict-Driven Learning in Test Pattern Generation". Advanced Materials Research 301-303 (julio de 2011): 1089–92. http://dx.doi.org/10.4028/www.scientific.net/amr.301-303.1089.
Texto completoTesis sobre el tema "Test signal generation"
Chowdhury, Azhar. "A probabilistic test instrument using sigma-delta phase signal generation technique for mixed signal embedded test". Thesis, McGill University, 2012. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=107696.
Texto completoUn instrument pour les tests "mixed-signal" basé sur une approche statistique est proposé. L'architecture du système ainsi que son implémentation sont présentés. L'instrument peut être utilisé afin d'injecter ou de capturer des informations en temps et voltage associé aux signaux de hautes fréquences dans les systèmes de communication. En utilisant une approche statistique, la distribution de probabilité associée à un signal peut être calculée à l'aide d'un circuit appelé « probability extraction unit » implémenté de façon digital. De plus, l'utilisation de ΣΔ pour encoder des signaux dans la phase afin de générer des signaux dans le temps ainsi que des références pour du « high speed sampling » est démontré. Les résultats expérimentaux démontrent que des variations de phase de 45 degrés avec des intervalles de1 degré est possible. Ceci permet donc plus de flexibilité pour générer des signaux de tests qui sont programmables. Un prototype de cette technique fut implémenté sur « PCB » afin de démontrer que la technique est fonctionnelle. Les résultats des tests furent également comparés à ceux obtenus avec des instruments de mesures traditionnels et démontrent une excellente corrélation entre la méthode développée et les méthodes existantes.
Huynh, Sam DuPhat. "Testability analysis for mixed analog/digital circuit test generation and design for test /". Thesis, Connect to this title online; UW restricted, 1999. http://hdl.handle.net/1773/6134.
Texto completoAhmad, Shakeel. "Stimuli Generation Techniques for On-Chip Mixed-Signal Test". Doctoral thesis, Linköpings universitet, Elektroniska komponenter, 2010. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-61712.
Texto completoAsokan, Anu. "Signal Integrity - Aware Pattern Generation for Delay Testing". Thesis, Montpellier, 2015. http://www.theses.fr/2015MONTS206/document.
Texto completoAdvancing nanometer technology scaling enables higher integration on a single chip with minimal feature size. As a consequence, the effects of signal and power integrity issues such as crosstalk noise between interconnects, power supply noise and ground bounce in the supply networks significantly increases. Also, reliability issues are eventually introduced by variations in the manufacturing process. These issues will negatively impact the timing characteristics in an integrated circuit (IC), as they give rise to delay defects. Delay-related parametric failures increase the defect escape rate, yield loss and diminish reliability rate. Hence, design-for-test techniques are employed to have a better controllability and observability on the internal nodes to easily detect and locate the faults. However, they are not always detected by the traditional fault models. In our work, we target these challenges and propose novel physical design-aware path delay test methods to deal with delay faults coming from manufacturing defects or physical design issues. They include the investigation of path delay variations in the presence of crosstalk noise, power supply noise, ground bounce and process variations. Based on this, we develop technology independent test methods for identifying the test patterns that may cause a worst-case delay on a target path. Then, we develop a dedicated test pattern generation method for path delay testing in the presence of crosstalk noise, power supply noise and ground noise. The proposed methods can be used to characterize the path speed and it helps to address the speed binning problem. Also, they can be employed in improving the classical ATPG approach of pattern generation. The application of these contributions can bring tremendous improvements to the IC test quality by ensuring better defect coverage and for an increased manufacturing yield during speed binning of IC chips
Alani, Alaa Fadhil. "A steady-state response test generation technique for mixed-signal integrated circuits". Thesis, Brunel University, 1993. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.316941.
Texto completoWoelk, Linley Elton. "Digital generation of low frequency, low distortion test waveforms". Thesis, Kansas State University, 1985. http://hdl.handle.net/2097/16049.
Texto completoGomes, Alfred Vincent. "Alternate Test Generation for Detection of Parametric Faults". Diss., Georgia Institute of Technology, 2003. http://hdl.handle.net/1853/5285.
Texto completoAouini, Sadok. "Extending test signal generation using sigma-delta encoding beyond the voltage/amplitude domain". Thesis, McGill University, 2011. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=104477.
Texto completoCette thèse étend les techniques de génération de signal se basant sur les principes d'encodage sigma-delta pour la synthèse de tous les types de signaux de test. En effet, l'encodage sigma-delta est utilisé pour générer de façon répétable et programmable des signaux ressemblant au bruit; des signaux dans le domaine de la phase, tel que des délais précis et gigue d'horloge sinusoïdale et Gaussienne; et des signaux dans le domaine fréquentielle utilisés pour une synthèse précise de fréquence.Pour la synthèse de signaux ressemblant au bruit, un bruit Gaussien avec le spectre désiré est encodé dans le domaine voltage/amplitude en software en utilisant la modulation sigma-delta. La séquence de bits résultante est par la suite capturée et appliquée cycliquement à un filtre analogique afin de reconstituer le signal de bruit avec les caractéristiques spectrales désirées (ex. une entaille dans la bande de fréquence pour le test de rapport de puissances de bruit).De plus, un nouvel algorithme de transformation bit-par-bit convertissant les signaux numériques au domaine de phase ou de fréquence est proposé. Un algorithme de conversion numérique-à-temps (CNT) est utilisé pour convertir un signal numérique au domaine de la phase, de la même manière, une conversion numérique-à-fréquence (CNF) est utilisée pour convertir un signal numérique au domaine fréquentielle. Les deux algorithmes de conversion CNT et CNF sont implantés en software conjointement avec le processus d'encodage sigma-delta, encodant ainsi de façon numérique le signal désiré dans le domaine de phase ou de fréquence. La séquence de bits résultante encodant le signal désiré dans la phase ou la fréquence est par la suite capturée et appliquée cycliquement à un de filtre de reconstruction de mode temps/fréquence. Le filtre de mode temps/fréquence est réalisé à l'aide d'une structure de boucle à verrouillage de phase ayant la fonction de transfert désiré.Toutes les méthodologies de génération de signaux (amplitude, bruit, phase et fréquence) consistent en un train de bits encodant le signal désiré et un dispositif de filtrage de reconstruction dans le domaine approprié. Utilisant les techniques et circuits proposés, des signaux de test robustes, programmables, répétables et portables peuvent être synthétisé à un coût relativement bas. Malgré que les techniques de test sont démontrés seulement dans un environnement de production utilisant un testeur à signaux mixtes commercial, la méthodologie quant à elle peut être implantée dans tous les environnements de test : test en production, conception pour le test (DFT) et test intégré (BIST).
Poling, Brian. "On-Chip Signal Generation and Response Waveform Extraction for Analog Built-In-Self-Test". Wright State University / OhioLINK, 2007. http://rave.ohiolink.edu/etdc/view?acc_num=wright1190050023.
Texto completoWang, Xian. "Enabling low cost test and tuning of difficult-to-measure device specifications: application to DC-DC converters and high speed devices". Diss., Georgia Institute of Technology, 2015. http://hdl.handle.net/1853/53521.
Texto completoLibros sobre el tema "Test signal generation"
Critchlow, E. A. J. Automatic generation of mixed-signal test programs. Manchester: UMIST, 1997.
Buscar texto completoRoberts, Gordon W. y Albert K. Lu. Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits. Boston, MA: Springer US, 1995. http://dx.doi.org/10.1007/978-1-4615-2341-3.
Texto completoRoberts, Gordon W. Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits. Boston, MA: Springer US, 1995.
Buscar texto completoRoberts, Gordon W. Analog signal generation for built-in-self-test of mixed-signal integrated circuits. Boston: Kluwer Academic Publishers, 1995.
Buscar texto completoDufort, Benoit y Gordon W. Roberts. Analog Test Signal Generation Using Periodic ΣΔ-Encoded Data Streams. Boston, MA: Springer US, 2000. http://dx.doi.org/10.1007/978-1-4615-4377-0.
Texto completoDiamant, P. E. Automatic generation of mixed signal test programs from circuitsimulation data. Manchester: UMIST, 1994.
Buscar texto completo1959-, Roberts Gordon W., ed. Analog test signal generation using periodic [sigma delta]-encoded data streams. Boston: Kluwer Academic, 2000.
Buscar texto completoDufort, Benoit. Analog test signal generation using periodic [sigma delta]-encoded data streams. New York: Springer Science+Business Media, 2000.
Buscar texto completoAlani, Alaa Fadhil. A steady-state response test generation technique for mixed-signal integrated circuits. Uxbridge: Brunel University, 1993.
Buscar texto completoGimpilevich, Yuriy. Signals and processes in radio electronics. ru: INFRA-M Academic Publishing LLC., 2024. http://dx.doi.org/10.12737/1852258.
Texto completoCapítulos de libros sobre el tema "Test signal generation"
Dufort, Benoit y Gordon W. Roberts. "Analog Signal Generation". En Analog Test Signal Generation Using Periodic ΣΔ-Encoded Data Streams, 65–95. Boston, MA: Springer US, 2000. http://dx.doi.org/10.1007/978-1-4615-4377-0_4.
Texto completoRoberts, Gordon W. y Albert K. Lu. "Analog Multi-Tone Signal Generation". En Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits, 33–51. Boston, MA: Springer US, 1995. http://dx.doi.org/10.1007/978-1-4615-2341-3_3.
Texto completoDufort, Benoit y Gordon W. Roberts. "Mixed-Signal Testing". En Analog Test Signal Generation Using Periodic ΣΔ-Encoded Data Streams, 7–26. Boston, MA: Springer US, 2000. http://dx.doi.org/10.1007/978-1-4615-4377-0_2.
Texto completoCorno, Fulvio, Maurizio Rebaudengo, Matteo Sonza Reorda y Massimo Violante. "Test Pattern Generation under Low Power Constraints". En Evolutionary Image Analysis, Signal Processing and Telecommunications, 162–70. Berlin, Heidelberg: Springer Berlin Heidelberg, 1999. http://dx.doi.org/10.1007/10704703_13.
Texto completoRoberts, Gordon W. y Albert K. Lu. "An Oversampling-Based Function Generator". En Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits, 53–71. Boston, MA: Springer US, 1995. http://dx.doi.org/10.1007/978-1-4615-2341-3_4.
Texto completoMadhavan, Sowmya y S. Sandya. "Test Signal Generation for Detecting Faults on Mil-Std 1553 Bus". En Lecture Notes in Electrical Engineering, 127–34. Singapore: Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-7251-2_14.
Texto completoRoberts, Gordon W. y Albert K. Lu. "Introduction". En Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits, 1–7. Boston, MA: Springer US, 1995. http://dx.doi.org/10.1007/978-1-4615-2341-3_1.
Texto completoRoberts, Gordon W. y Albert K. Lu. "An Oversampling-Based Analog Oscillator". En Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits, 9–32. Boston, MA: Springer US, 1995. http://dx.doi.org/10.1007/978-1-4615-2341-3_2.
Texto completoRoberts, Gordon W. y Albert K. Lu. "Conclusion". En Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits, 73–122. Boston, MA: Springer US, 1995. http://dx.doi.org/10.1007/978-1-4615-2341-3_5.
Texto completoMohamed, Khaled Salah. "New Trends in SoC Verification: UVM, Bug Localization, Scan-C0068ain-Based Methodology, GA-Based Test Generation". En Analog Circuits and Signal Processing, 121–52. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-22035-2_6.
Texto completoActas de conferencias sobre el tema "Test signal generation"
Negreiros, Marcelo, Adao Souza Jr., Luigi Carro y Altamiro Amadeu Susin. "RF Digital Signal Generation Beyond Nyquist". En 25th IEEE VLSI Test Symmposium. IEEE, 2007. http://dx.doi.org/10.1109/vts.2007.54.
Texto completoAbe, Fumitaka, Yutaro Kobayashi, Kenji Sawada, Keisuke Kato, Osamu Kobayashi y Haruo Kobayashi. "Low-distortion signal generation for ADC testing". En 2014 IEEE International Test Conference (ITC). IEEE, 2014. http://dx.doi.org/10.1109/test.2014.7035304.
Texto completoUemori, Satoshi, Takahiro J. Yamaguchi, Satoshi Ito, Yohei Tan, Haruo Kobayashi, Nobukazu Takai, Kiichi Niitsu y Nobuyoshi Ishikawa. "ADC linearity test signal generation algorithm". En APCCAS 2010-2010 IEEE Asia Pacific Conference on Circuits and Systems. IEEE, 2010. http://dx.doi.org/10.1109/apccas.2010.5774755.
Texto completoDufils, M., J. L. Carbonero, P. Planelle y P. Raynaud. "Mixed-signal simulation and test generation". En International Conference on Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006. IEEE, 2006. http://dx.doi.org/10.1109/dtis.2006.1708704.
Texto completoKim, Yongjoon, Myung-hoon Yang, Youngkyu Park, Daeyeal Lee y Sungho Kang. "An Effective Test Pattern Generation for Testing Signal Integrity". En 2006 15th Asian Test Symposium. IEEE, 2006. http://dx.doi.org/10.1109/ats.2006.261032.
Texto completoCoyette, Anthony, Baris Esen, Wim Dobbelaere, Ronny Vanhooren y Georges Gielen. "Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis". En 2016 IEEE International Test Conference (ITC). IEEE, 2016. http://dx.doi.org/10.1109/test.2016.7805867.
Texto completoCherubal, S. "Challenges in Next Generation Mixed-Signal IC Production Testing". En 14th Asian Test Symposium (ATS'05). IEEE, 2005. http://dx.doi.org/10.1109/ats.2005.34.
Texto completoKato, Keisuke, Fumitaka Abe, Kazuyuki Wakabayashi, Chuan Gao, Takafumi Yamada, Haruo Kobayashi, Osamu Kobayashi y Kiichi Niitsu. "Two-Tone Signal Generation for Communication Application ADC Testing". En 2012 21st Asian Test Symposium (ATS). IEEE, 2012. http://dx.doi.org/10.1109/ats.2012.12.
Texto completoAouini, Sadok, Kun Chuai y Gordon W. Roberts. "A low-cost ATE phase signal generation technique for test applications". En 2010 IEEE International Test Conference (ITC). IEEE, 2010. http://dx.doi.org/10.1109/test.2010.5699202.
Texto completoKawabata, Masayuki, Koji Asami, Shohei Shibuya, Tomonori Yanagida y Haruo Kobayashi. "Low-distortion signal generation for analog/mixed-signal circuit testing with digital ATE". En 2017 International Test Conference in Asia (ITC-Asia). IEEE, 2017. http://dx.doi.org/10.1109/itc-asia.2017.8097100.
Texto completoInformes sobre el tema "Test signal generation"
Saldivar-Carranza, Enrique D., Howell Li, Jijo K. Mathew, Jairaj Desai, Tom Platte, Saumabha Gayen, James Sturdevant, Mark Taylor, Charles Fisher y Darcy M. Bullock. Next Generation Traffic Signal Performance Measures: Leveraging Connected Vehicle Data. Purdue University Press, 2023. http://dx.doi.org/10.5703/1288284317625.
Texto completoMartinez, Kimberly D. y Gaojian Huang. Exploring the Effects of Meaningful Tactile Display on Perception and Preference in Automated Vehicles. Mineta Transportation Institute, octubre de 2022. http://dx.doi.org/10.31979/mti.2022.2164.
Texto completoHughes, Timothy M. A Graphically Based Test Signal Generator. Fort Belvoir, VA: Defense Technical Information Center, septiembre de 2000. http://dx.doi.org/10.21236/ada384406.
Texto completoPerl, Avichai, Bruce I. Reisch y Ofra Lotan. Transgenic Endochitinase Producing Grapevine for the Improvement of Resistance to Powdery Mildew (Uncinula necator). United States Department of Agriculture, enero de 1994. http://dx.doi.org/10.32747/1994.7568766.bard.
Texto completoTucker, Mark L., Shimon Meir, Amnon Lers, Sonia Philosoph-Hadas y Cai-Zhong Jiang. Elucidation of signaling pathways that regulate ethylene-induced leaf and flower abscission of agriculturally important plants. United States Department of Agriculture, enero de 2012. http://dx.doi.org/10.32747/2012.7597929.bard.
Texto completoBäumler, Maximilian y Matthias Lehmann. Generating representative test scenarios: The FUSE for Representativity (fuse4rep) process model for collecting and analysing traffic observation data. TU Dresden, 2024. http://dx.doi.org/10.26128/2024.2.
Texto completoKhan, Asad, Angeli Jayme, Imad Al-Qadi y Gregary Renshaw. Embedded Energy Harvesting Modules in Flexible Pavements. Illinois Center for Transportation, abril de 2024. http://dx.doi.org/10.36501/0197-9191/24-008.
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