Artículos de revistas sobre el tema "TEM ANALYSIS"
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Du, Z. W., A. S. Liu, B. L. Shao, Z. Y. Zhang, X. S. Zhang y Z. M. Sun. "TEM analysis of Gd5Si1.85Ge2.15 alloy". Materials Characterization 59, n.º 9 (septiembre de 2008): 1241–44. http://dx.doi.org/10.1016/j.matchar.2007.10.005.
Texto completoRajan, Krishna y Peter Sewell. "Surface Analysis in the TEM". JOM 38, n.º 10 (octubre de 1986): 34–35. http://dx.doi.org/10.1007/bf03258578.
Texto completoMizunaga, Hideki y Toshiaki Tanaka. "Development of Temtool for TEM analysis". BUTSURI-TANSA(Geophysical Exploration) 67, n.º 2 (2014): 135–42. http://dx.doi.org/10.3124/segj.67.135.
Texto completoOkamoto, Tatsuki, Masaki Kanegami y Naohiro Hozumi. "TEM Analysis of Polyethylene with EELS". IEEJ Transactions on Fundamentals and Materials 118, n.º 7-8 (1998): 767–72. http://dx.doi.org/10.1541/ieejfms1990.118.7-8_767.
Texto completoHIROSE, Yukinori y Koji FUKUMOTO. "Evaluation and Analysis Technique Using TEM". Journal of the Surface Finishing Society of Japan 54, n.º 1 (2003): 21–25. http://dx.doi.org/10.4139/sfj.54.21.
Texto completoStöger-Pollach, M., A. Steiger-Thirsfeld y S. Schwarz. "Low voltage TEM for semiconductor analysis". Journal of Physics: Conference Series 326 (9 de noviembre de 2011): 012027. http://dx.doi.org/10.1088/1742-6596/326/1/012027.
Texto completoRowlands, Neil y Simon Burgess. "Energy dispersive analysis in the TEM". Materials Today 12 (2010): 46–48. http://dx.doi.org/10.1016/s1369-7021(10)70145-0.
Texto completoDahmen, U., N. Thangaraj y R. Kilaas. "Quantitative TEM analysis of microstructural anisotropy". Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 682–83. http://dx.doi.org/10.1017/s0424820100171146.
Texto completoBauer, Natalie, Jyoti Rai, Hairu Chen, Lillianne Harris, Lalita Shevde, Tim Moore y Judy King. "Microparticles/Exosomes: Isolation and TEM Analysis". Microscopy Today 17, n.º 2 (marzo de 2009): 42–45. http://dx.doi.org/10.1017/s1551929500054493.
Texto completoNeumann, Wolfgang, Holm Kirmse, Ines Häusler, Reinhard Otto y Irmela Hähnert. "Quantitative TEM analysis of quantum structures". Journal of Alloys and Compounds 382, n.º 1-2 (noviembre de 2004): 2–9. http://dx.doi.org/10.1016/j.jallcom.2004.05.066.
Texto completoCho, Yong-Heui. "Dispersion Analysis for Rectangular Coaxial Line and TEM Cell". Journal of the Korea Contents Association 7, n.º 1 (28 de enero de 2007): 124–30. http://dx.doi.org/10.5392/jkca.2007.7.1.124.
Texto completoLi, Xiaoguang y Yangmei Li. "Error Analysis of TEM-4 Dictation and Teaching Suggestions to TEM-4 Dictation". Open Journal of Social Sciences 04, n.º 11 (2016): 187–93. http://dx.doi.org/10.4236/jss.2016.411015.
Texto completoBalzuweit, Karla, Thais MIlagres, Von Braun Nascimento, Vagner de Carvalho, Edmar Soares y Luiz Ladeira. "LEED and TEM analysis of Bismuth Telluride". Acta Crystallographica Section A Foundations and Advances 70, a1 (5 de agosto de 2014): C194. http://dx.doi.org/10.1107/s2053273314098052.
Texto completoKomoto, Tadashi. "TEM Analysis of Tribology of Polymeric Materials." Kobunshi 43, n.º 2 (1994): 104–5. http://dx.doi.org/10.1295/kobunshi.43.104.
Texto completoEfimova, N. A., V. A. Kaloshin y E. A. Skorodumova. "Analysis of a horn-lens TEM antenna". Journal of Communications Technology and Electronics 57, n.º 9 (septiembre de 2012): 1031–38. http://dx.doi.org/10.1134/s1064226912090045.
Texto completoLi, Huafang, Parag Banerjee y Kathy Flores. "Understanding EDXS Analysis of Nanostructures in TEM". Microscopy and Microanalysis 23, S1 (julio de 2017): 1086–87. http://dx.doi.org/10.1017/s1431927617006092.
Texto completoRossouw, D., T. Mirkovic, GD Scholes y GA Botton. "TEM Analysis of EuS/CdSe Nano Heterostructures". Microscopy and Microanalysis 16, S2 (julio de 2010): 1292–93. http://dx.doi.org/10.1017/s1431927610062951.
Texto completoHangas, J. y A. D. Roche. "TEM Analysis of a Thermal Sprayed Steel". Microscopy and Microanalysis 8, S02 (agosto de 2002): 1276–77. http://dx.doi.org/10.1017/s1431927602104818.
Texto completoLingle, Wilma L., Ronald P. Clay y David Porter. "TEM analysis of basidiosporogenesis in Panellus stypticus". Proceedings, annual meeting, Electron Microscopy Society of America 50, n.º 1 (agosto de 1992): 874–75. http://dx.doi.org/10.1017/s042482010012477x.
Texto completoShaffer, O. L., M. S. El-Aasser y J. W. Vanderhoff. "TEM analysis of core/shell latex morphology". Proceedings, annual meeting, Electron Microscopy Society of America 45 (agosto de 1987): 502–3. http://dx.doi.org/10.1017/s0424820100127153.
Texto completoCole, M. W., J. F. Harvey, R. A. Lux y D. W. Eckart. "TEM analysis of light emitting porous silicon". Proceedings, annual meeting, Electron Microscopy Society of America 50, n.º 2 (agosto de 1992): 1398–99. http://dx.doi.org/10.1017/s0424820100131620.
Texto completoRozeveld, S., DA Blom, LF Allard, T. Richardson, C. Todd y JH Blackson. "Analysis of Catalysts using Aberration-Corrected TEM". Microscopy and Microanalysis 14, S2 (agosto de 2008): 1390–91. http://dx.doi.org/10.1017/s1431927608085887.
Texto completoKC, Bilash, Jinglong Guo, Robert Klie, D. Bruce Buchholz, Guennadi Evmenenko, Jae Jin Kim, Timothy Fister y Brian Ingram. "TEM Analysis of Multivalent Ion Battery Cathode". Microscopy and Microanalysis 26, S2 (30 de julio de 2020): 3170–72. http://dx.doi.org/10.1017/s1431927620024058.
Texto completoLi, X., J. Xingxing, W. Zi-qin, R. J. Lee, G. R. Dunmyre y K. L. Anderson. "Thin film standardless analysis used in TEM asbestos EDS analysis". Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 966–67. http://dx.doi.org/10.1017/s0424820100106892.
Texto completoHlavenková, Zuzana, Dimple Karia, Miloš Malínský, Daniel Němeček, Fanis Grollios, Vojtěch Doležal, Ondřej Sháněl et al. "Thermo Scientific™ Tundra Cryo-TEM: 100kV Cryo-TEM dedicated for Single Particle Analysis". Microscopy and Microanalysis 27, S1 (30 de julio de 2021): 1330–32. http://dx.doi.org/10.1017/s1431927621004967.
Texto completoYoon, Byungun y Yongtae Park. "Development of New Technology Forecasting Algorithm: Hybrid Approach for Morphology Analysis and Conjoint Analysis of Patent Information". IEEE Transactions on Engineering Management 54, n.º 3 (agosto de 2007): 588–99. http://dx.doi.org/10.1109/tem.2007.900796.
Texto completoArlet, Guillaume, Sylvie Goussard, Patrice Courvalin y Alain Philippon. "Sequences of the Genes for the TEM-20, TEM-21, TEM-22, and TEM-29 Extended-Spectrum β-Lactamases". Antimicrobial Agents and Chemotherapy 43, n.º 4 (1 de abril de 1999): 969–71. http://dx.doi.org/10.1128/aac.43.4.969.
Texto completoBooker, Jane M. y Maurice C. Bryson. "Decision analysis in project management: An overview". IEEE Transactions on Engineering Management EM-32, n.º 1 (1985): 3–9. http://dx.doi.org/10.1109/tem.1985.6447630.
Texto completoLiberatore, Matthew J. "Critical Path Analysis With Fuzzy Activity Times". IEEE Transactions on Engineering Management 55, n.º 2 (mayo de 2008): 329–37. http://dx.doi.org/10.1109/tem.2008.919678.
Texto completoLerch, Martin y Patrick Spieth. "Innovation Project Portfolio Management: A Qualitative Analysis". IEEE Transactions on Engineering Management 60, n.º 1 (febrero de 2013): 18–29. http://dx.doi.org/10.1109/tem.2012.2201723.
Texto completoChipulu, Maxwell, Jun Guan Neoh, Udechukwu Ojiako y Terry Williams. "A Multidimensional Analysis of Project Manager Competences". IEEE Transactions on Engineering Management 60, n.º 3 (agosto de 2013): 506–17. http://dx.doi.org/10.1109/tem.2012.2215330.
Texto completoDhir, Krishna S. "Formulating management policies for value engineering/value analysis". IEEE Transactions on Engineering Management EM-34, n.º 3 (agosto de 1987): 161–71. http://dx.doi.org/10.1109/tem.1987.6498877.
Texto completoAbbas, A. E. "Entropy methods for joint distributions in decision analysis". IEEE Transactions on Engineering Management 53, n.º 1 (febrero de 2006): 146–59. http://dx.doi.org/10.1109/tem.2005.861803.
Texto completoBasole, Rahul C., Hyunwoo Park y Raul O. Chao. "Visual Analysis of Venture Similarity in Entrepreneurial Ecosystems". IEEE Transactions on Engineering Management 66, n.º 4 (noviembre de 2019): 568–82. http://dx.doi.org/10.1109/tem.2018.2855435.
Texto completoTomiya, Shigetaka. "TEM Analysis of Degraded ZnCdSe Quantum Well Strructures". Materia Japan 40, n.º 12 (2001): 1002. http://dx.doi.org/10.2320/materia.40.1002.
Texto completoGoyal, Garima. "Analysis of Alignment of TEM Image using ECC". IOSR Journal of Computer Engineering 16, n.º 3 (2014): 112–15. http://dx.doi.org/10.9790/0661-1633112115.
Texto completoGuo, Wen-Bo, Guo-Qiang Xue, Xiu Li y Yin-Ai Liu. "Correlation analysis and imaging technique of TEM data". Exploration Geophysics 43, n.º 3 (septiembre de 2012): 137–48. http://dx.doi.org/10.1071/eg11034.
Texto completoSong, Xiangyun, Yanbao Fu, Chengyu Song y Vincent Battaglia. "TEM failure analysis of electrochemically delithiated LiNi0.5Mn1.5O4 spinel". MRS Advances 5, n.º 27-28 (2020): 1405–13. http://dx.doi.org/10.1557/adv.2020.105.
Texto completoMoreaud, Maxime, Renaud Revel, Dominique Jeulin y Vincent Morard. "SIZE OF BOEHMITE NANOPARTICLES BY TEM IMAGES ANALYSIS". Image Analysis & Stereology 28, n.º 3 (3 de mayo de 2011): 187. http://dx.doi.org/10.5566/ias.v28.p187-193.
Texto completoReyes-Gasga, José y Nancy Vargas-Becerril. "TEM Phase Transitions Analysis in Human Tooth Enamel". Microscopy and Microanalysis 26, S1 (marzo de 2020): 169–70. http://dx.doi.org/10.1017/s1431927620001063.
Texto completoFalke, M., A. Kaeppel, S. Scheller, W. Hahn, R. Terborg, M. Rohde, Q. Ramasse et al. "SDD-EDS: Element Analysis of Nanostructures in TEM". Microscopy and Microanalysis 18, S2 (julio de 2012): 1058–59. http://dx.doi.org/10.1017/s1431927612007143.
Texto completoLewis, Nathan, Krishna Shenai y Ernest L. Hall. "TEM analysis of TiSi2 on Si and polysilicon". Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 886–87. http://dx.doi.org/10.1017/s0424820100106491.
Texto completoBrennan, M., Masaru Kuno y S. Rouvimov. "TEM Analysis of CsPbBr3 Nanocrystals: Challenges and Perspectives." Microscopy and Microanalysis 23, S1 (julio de 2017): 2096–97. http://dx.doi.org/10.1017/s143192761701114x.
Texto completoPark, S., NT Nuhfer, DE Laughlin y J.-G. Zhu. "Complementary Analytical TEM Analysis of Perpendicular Recording Media". Microscopy and Microanalysis 15, S2 (julio de 2009): 1318–19. http://dx.doi.org/10.1017/s1431927609096871.
Texto completoGeiss, RH, E. Mansfield y JA Fagan. "Methods for TEM Analysis of NIST’s SWCNT SRM". Microscopy and Microanalysis 16, S2 (julio de 2010): 1792–93. http://dx.doi.org/10.1017/s1431927610062331.
Texto completoButtry, R. W., C. R. Hills, G. C. Nelson y T. Tribble. "Auger and TEM analysis of multilayer IC contacts". Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 818–19. http://dx.doi.org/10.1017/s0424820100171821.
Texto completoScheerschmidt, Kurt y Volker Kuhlmann. "Nanostructures simulated by molecular dynamics for TEM analysis". Microscopy and Microanalysis 9, S03 (septiembre de 2003): 232–33. http://dx.doi.org/10.1017/s1431927603022268.
Texto completoMartinez, L., J. M. Briceño-Valero, S. A. López-Rivera, K. Moore y J. T. Thorthon. "Micropattern analysis of ZnIn2S4 using AFM and TEM". Proceedings, annual meeting, Electron Microscopy Society of America 53 (13 de agosto de 1995): 476–77. http://dx.doi.org/10.1017/s0424820100138750.
Texto completoOlivier, E. J. y J. H. Neethling. "TEM analysis of planar defects in β-SiC". International Journal of Refractory Metals and Hard Materials 27, n.º 2 (marzo de 2009): 443–48. http://dx.doi.org/10.1016/j.ijrmhm.2008.09.013.
Texto completoSHIMIZU, Yuko, Takao SHINKAWA, Miyuki TSUDA, Yoshikazu SASAKI y Munetaka Nakata. "Analysis of TEM Images Using Akaike's Information Criterion". Hyomen Kagaku 33, n.º 4 (2012): 242–46. http://dx.doi.org/10.1380/jsssj.33.242.
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