Literatura académica sobre el tema "TEM ANALYSIS"
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Artículos de revistas sobre el tema "TEM ANALYSIS"
Du, Z. W., A. S. Liu, B. L. Shao, Z. Y. Zhang, X. S. Zhang y Z. M. Sun. "TEM analysis of Gd5Si1.85Ge2.15 alloy". Materials Characterization 59, n.º 9 (septiembre de 2008): 1241–44. http://dx.doi.org/10.1016/j.matchar.2007.10.005.
Texto completoRajan, Krishna y Peter Sewell. "Surface Analysis in the TEM". JOM 38, n.º 10 (octubre de 1986): 34–35. http://dx.doi.org/10.1007/bf03258578.
Texto completoMizunaga, Hideki y Toshiaki Tanaka. "Development of Temtool for TEM analysis". BUTSURI-TANSA(Geophysical Exploration) 67, n.º 2 (2014): 135–42. http://dx.doi.org/10.3124/segj.67.135.
Texto completoOkamoto, Tatsuki, Masaki Kanegami y Naohiro Hozumi. "TEM Analysis of Polyethylene with EELS". IEEJ Transactions on Fundamentals and Materials 118, n.º 7-8 (1998): 767–72. http://dx.doi.org/10.1541/ieejfms1990.118.7-8_767.
Texto completoHIROSE, Yukinori y Koji FUKUMOTO. "Evaluation and Analysis Technique Using TEM". Journal of the Surface Finishing Society of Japan 54, n.º 1 (2003): 21–25. http://dx.doi.org/10.4139/sfj.54.21.
Texto completoStöger-Pollach, M., A. Steiger-Thirsfeld y S. Schwarz. "Low voltage TEM for semiconductor analysis". Journal of Physics: Conference Series 326 (9 de noviembre de 2011): 012027. http://dx.doi.org/10.1088/1742-6596/326/1/012027.
Texto completoRowlands, Neil y Simon Burgess. "Energy dispersive analysis in the TEM". Materials Today 12 (2010): 46–48. http://dx.doi.org/10.1016/s1369-7021(10)70145-0.
Texto completoDahmen, U., N. Thangaraj y R. Kilaas. "Quantitative TEM analysis of microstructural anisotropy". Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 682–83. http://dx.doi.org/10.1017/s0424820100171146.
Texto completoBauer, Natalie, Jyoti Rai, Hairu Chen, Lillianne Harris, Lalita Shevde, Tim Moore y Judy King. "Microparticles/Exosomes: Isolation and TEM Analysis". Microscopy Today 17, n.º 2 (marzo de 2009): 42–45. http://dx.doi.org/10.1017/s1551929500054493.
Texto completoNeumann, Wolfgang, Holm Kirmse, Ines Häusler, Reinhard Otto y Irmela Hähnert. "Quantitative TEM analysis of quantum structures". Journal of Alloys and Compounds 382, n.º 1-2 (noviembre de 2004): 2–9. http://dx.doi.org/10.1016/j.jallcom.2004.05.066.
Texto completoTesis sobre el tema "TEM ANALYSIS"
Foo, Seng-Lee. "Analysis of electromagnetic fields in loaded TEM cells". Thesis, University of Ottawa (Canada), 1988. http://hdl.handle.net/10393/5170.
Texto completoKylberg, Gustaf. "Automatic Virus Identification using TEM : Image Segmentation and Texture Analysis". Doctoral thesis, Uppsala universitet, Avdelningen för visuell information och interaktion, 2014. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-217328.
Texto completoHajduček, Jan. "Zobrazování metamagnetických tenkých vrstev pomocí TEM". Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2021. http://www.nusl.cz/ntk/nusl-443233.
Texto completoNord, Magnus Kristofer. "Quantitative (S)TEM analysis of intermediate band solar cell materials". Thesis, Norges teknisk-naturvitenskapelige universitet, Institutt for fysikk, 2011. http://urn.kb.se/resolve?urn=urn:nbn:no:ntnu:diva-13655.
Texto completoElFallagh, Fathi Ali. "3D Analysis of Indentation Damage by FIB tomography and TEM". Thesis, University of Sheffield, 2008. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.500111.
Texto completoMcLaughlin, Kirsten Kathleen. "TEM diffraction analysis of the deformation underneath low load indentations". Thesis, University of Cambridge, 2007. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.613392.
Texto completoSears, Jasmine, Ricky Gibson, Michael Gehl, Sander Zandbergen, Patrick Keiffer, Nima Nader, Joshua Hendrickson, Alexandre Arnoult y Galina Khitrova. "TEM EDS analysis of epitaxially-grown self-assembled indium islands". AMER INST PHYSICS, 2017. http://hdl.handle.net/10150/624718.
Texto completoIssa, Inas. "In situ TEM nanocompression and mechanical analysis of ceramic nanoparticles". Thesis, Lyon, 2016. http://www.theses.fr/2016LYSEI008/document.
Texto completoIn this study, we propose an innovative mechanical observation protocol of ceramics nanoparticles in the 100nm size range. This Protocol consists of in situ TEM nanocompression tests of isolated nanoparticles. Load–real displacements curves, obtained by Digital Image Correlation, are analyzed and these analyses are correlated with Molecular Dynamics simulations. By this protocol a constitutive law with its mechanical parameters (Young modulus, Yield stress...) of the studied material at the nano-scale can be obtained. In situ TEM nano-compression tests on magnesium oxide nanocubes are performed. Magnesium oxide is a model material and its plasticity is very well known at bulk. The MgO nanocubes show large plastic deformation, more than 50% of plastic strain without any fracture. The TEM results are correlated to MD simulations and the deformation mechanism can be identified.The size effect and the electron beam effect on the yield strength are investigated. In a second part of the dissertation, we present a study on transition alumina nanoparticles compacted in a Diamond Anvil Cell at different uniaxial pressures. Thin Foils of these compacted nanoparticles are prepared by FIB for HRTEM Observations. Their analysis reveals the plastic deformation of the nanoparticles. The crystallographic texture observed inthese compacted nanoparticles in DAC shows a preferred orientation of the {110} lattice planes, orientated perpendicular to the compression direction. This is compatible with the slip system. This argument was reinforced with a preferred orientation of slip bands observed during in situ TEM nano-compression tests. Moreover, electron diffraction patterns (Debye Scherrer) analysis on these compacted transition alumina nanoparticles reveals the decrease of the presence of gamma-alumina and the increase of delta-alumina with increasing pressure. This reveals the phase transformation with increasing pressure from gamma to delta* alumina
King, Jason Peters King. "An investigation of spin-valves and related films by TEM". Thesis, University of Glasgow, 1999. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.301949.
Texto completoWoonbumroong, Apinya. "Fresnel contrast analysis and analytical TEM study of grain boundaries in electroceramics". Thesis, University of Cambridge, 1999. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.624490.
Texto completoLibros sobre el tema "TEM ANALYSIS"
Henning, K. H. Electron micrographs (TEM, SEM) of clays and clay minerals. Berlin: Akademie-Verlag, 1986.
Buscar texto completoHaron, Sharifah Zabidah. Aspects of tea analysis. Salford: University of Salford, 1991.
Buscar texto completoClemente, Filipe Manuel, Fernando Manuel Lourenço Martins y Rui Sousa Mendes. Social Network Analysis Applied to Team Sports Analysis. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-25855-3.
Texto completoPassos, Pedro. Performance Analysis in Team Sports. Abingdon, Oxon ; New York, NY : Routledge is an imprint of the: Routledge, 2016. http://dx.doi.org/10.4324/9781315739687.
Texto completo1973-, Coliva Annalisa, ed. Filosofia analitica: Temi e problemi. Roma: Carocci, 2007.
Buscar texto completoChen, Yen-Sen. Lox manifold tee analysis: Final report. Huntsville, Ala: SECA, Inc., 1990.
Buscar texto completoCommerce, Ceylon Chamber of. Tea sector statistical analysis, 2012-2013. Colombo: The Ceylon Chamber of Commerce, 2014.
Buscar texto completoGuzʹ, Aleksandr Nikolaevich. Trekhmernai͡a︡ teorii͡a︡ ustoĭchivosti deformiruemykh tel. Kiev: Nauk. dumka, 1985.
Buscar texto completoUnited States. National Aeronautics and Space Administration., ed. Transient Ejector Analysis (TEA) code user's guide. [Washington, DC: National Aeronautics and Space Administration, 1993.
Buscar texto completoGeological Survey (U.S.), ed. Geologic hazards team. [Reston, Va.?]: U.S. Dept. of the Interior, U.S. Geological Survey, 1997.
Buscar texto completoCapítulos de libros sobre el tema "TEM ANALYSIS"
McHendry, P., AJ Craven y LJ Murphy. "TEM studies of organic pigments". En Electron Microscopy and Analysis 1997, 665–68. Boca Raton: CRC Press, 2022. http://dx.doi.org/10.1201/9781003063056-172.
Texto completoRambousky, R. y H. Garbe. "Analysis of Open TEM-Waveguide Structures". En Ultra-Wideband, Short-Pulse Electromagnetics 10, 49–58. New York, NY: Springer New York, 2013. http://dx.doi.org/10.1007/978-1-4614-9500-0_4.
Texto completoLi, Xiu, Guoqiang Xue y Changchun Yin. "Velocity Analysis of TEM Pseudo Wave Field". En Migration Imaging of the Transient Electromagnetic Method, 105–23. Singapore: Springer Singapore, 2016. http://dx.doi.org/10.1007/978-981-10-2708-6_6.
Texto completoKirkland, A. I., W. O. Saxton y R. Meyer. "Super resolved microscopy and aberration determination in the TEM." En Electron Microscopy and Analysis 1997, 105–8. Boca Raton: CRC Press, 2022. http://dx.doi.org/10.1201/9781003063056-26.
Texto completoVoelkl, E., L. F. Allard, J. Bruley, V. J. Keast y D. B. Williams. "The teaching of TEM by telepresence microscopy over the internet". En Electron Microscopy and Analysis 1997, 45–48. Boca Raton: CRC Press, 2022. http://dx.doi.org/10.1201/9781003063056-10.
Texto completoKondo, Y., H. Ohnishi, Q. Ru, H. Kimata y K. Takayanagi. "Newly developed UHV-FE-HR-TEM for particle surface studies". En Electron Microscopy and Analysis 1997, 241–44. Boca Raton: CRC Press, 2022. http://dx.doi.org/10.1201/9781003063056-62.
Texto completoBlank, V. D., B. A. Kulnitskiy, Ye V. Tatyanin y O. M. Zhigalina. "TEM study of the crystalline and amorphous phases in C60". En Electron Microscopy and Analysis 1997, 593–96. Boca Raton: CRC Press, 2022. http://dx.doi.org/10.1201/9781003063056-154.
Texto completoKylberg, Gustaf, Ida-Maria Sintorn y Gunilla Borgefors. "Towards Automated TEM for Virus Diagnostics: Segmentation of Grid Squares and Detection of Regions of Interest". En Image Analysis, 169–78. Berlin, Heidelberg: Springer Berlin Heidelberg, 2009. http://dx.doi.org/10.1007/978-3-642-02230-2_18.
Texto completoGupta, Anindya, Amit Suveer, Joakim Lindblad, Anca Dragomir, Ida-Maria Sintorn y Nataša Sladoje. "Convolutional Neural Networks for False Positive Reduction of Automatically Detected Cilia in Low Magnification TEM Images". En Image Analysis, 407–18. Cham: Springer International Publishing, 2017. http://dx.doi.org/10.1007/978-3-319-59126-1_34.
Texto completoMacLaren, I. y C. B. Ponton. "TEM investigation of hydrothermally synthesised Ba(Mg1/3Ta2/3)O3, powders". En Electron Microscopy and Analysis 1997, 531–34. Boca Raton: CRC Press, 2022. http://dx.doi.org/10.1201/9781003063056-137.
Texto completoActas de conferencias sobre el tema "TEM ANALYSIS"
Chong, H. B., Brandon Van Leer, V. Narang y M. Y. Ho. "Sideways FIB TEM sample preparation for improved construction analysis in TEM". En 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012). IEEE, 2012. http://dx.doi.org/10.1109/ipfa.2012.6306257.
Texto completoChen, S. Y., W. Yang, G. F. Xu y C. T. Liu. "TEM EELS analysis for DRAM failure analysis". En 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). IEEE, 2021. http://dx.doi.org/10.1109/ipfa53173.2021.9617371.
Texto completoIanconescu, Reuven y Vladimir Vulfin. "TEM transmission line radiation losses analysis". En 2016 46th European Microwave Conference (EuMC). IEEE, 2016. http://dx.doi.org/10.1109/eumc.2016.7824381.
Texto completoXiaoding Cai. "Analysis of longitudinal characteristics TEM cells". En International Symposium on Electromagnetic Compatibility. IEEE, 1989. http://dx.doi.org/10.1109/isemc.1989.240866.
Texto completoEsa, S. R., R. Yahya, A. Hassan y G. Omar. "Copper oxidation study by TEM". En 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012). IEEE, 2012. http://dx.doi.org/10.1109/ipfa.2012.6306315.
Texto completoLin, Ching-Chun, Jay Wang y Kim Hsu. "TEM applications for III-V material analysis". En 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). IEEE, 2017. http://dx.doi.org/10.1109/ipfa.2017.8060204.
Texto completoDu, A. Y., J. Zhu, Y. K. Zhou, B. H. Liu, Eddie Er, Z. Q. Mo, S. P. Zhao y Jeffrey Lam. "Advanced TEM applications in semiconductor devices". En 2014 IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). IEEE, 2014. http://dx.doi.org/10.1109/ipfa.2014.6898193.
Texto completoZhu, Xiangqin, Weiqing Chen, Zaigao Chen y Jianguo Wang. "Analysis of TEM Horn with Dielectric Loaded". En 2018 IEEE International Conference on Computational Electromagnetics (ICCEM). IEEE, 2018. http://dx.doi.org/10.1109/compem.2018.8496637.
Texto completoLee, Tan-Chen, Jui-Yen Huang, Li-Chien Chen, Ruey-Lian Hwang y David Su. "Methodology for TEM Analysis of Barrier Profiles". En ISTFA 2002. ASM International, 2002. http://dx.doi.org/10.31399/asm.cp.istfa2002p0689.
Texto completoFuhrmann, T., J. Pletzer y A. Uhl. "Computer assisted morphometric analysis of TEM images". En IET 3rd International Conference MEDSIP 2006. Advances in Medical, Signal and Information Processing. IEE, 2006. http://dx.doi.org/10.1049/cp:20060362.
Texto completoInformes sobre el tema "TEM ANALYSIS"
Kass, M. A., Yaoguo Li, Richard Krahenbuhl, Misac Nabighian y Douglas Oldenburg. Enhancement of TEM Data and Noise Characterization by Principal Component Analysis. Fort Belvoir, VA: Defense Technical Information Center, mayo de 2010. http://dx.doi.org/10.21236/ada571505.
Texto completoGerberich, W. W. Micromechanisms of brittle fracture: STM, TEM and electron channeling analysis. Final report. Office of Scientific and Technical Information (OSTI), enero de 1997. http://dx.doi.org/10.2172/463626.
Texto completoPercival, J. B., T. Jensen, K. Wasyliuk, G. Drever, J. Sader, M. Sarfi, P A Hunt, C. Bibby, S. Wong y A. Enright. EXTECH IV mineralogical database: XRD, infrared and TEM analyses. Natural Resources Canada/ESS/Scientific and Technical Publishing Services, 2012. http://dx.doi.org/10.4095/292112.
Texto completoCalahorra-Jimenez, Maria. Contracting Strategies: A Different Approach to Address Long-term Performance. Mineta Transportation Institute, julio de 2022. http://dx.doi.org/10.31979/mti.2021.2130.
Texto completoCalahorra-Jimenez, Maria. Contracting Strategies: A Different Approach to Address Long-term Performance. Mineta Transportation Institute, julio de 2022. http://dx.doi.org/10.31979/mti.2022.2130.
Texto completoAponte, C. I. Supernate source term analysis: Revision 1. Office of Scientific and Technical Information (OSTI), octubre de 1994. http://dx.doi.org/10.2172/10105057.
Texto completoAuthor, Not Given. Vehicle Systems Analysis Technical Team Roadmap. Office of Scientific and Technical Information (OSTI), junio de 2013. http://dx.doi.org/10.2172/1220129.
Texto completoAllison, Ralph E. y Jr. Analysis of First-Term Army Attrition. Fort Belvoir, VA: Defense Technical Information Center, abril de 1999. http://dx.doi.org/10.21236/ada362968.
Texto completoCanto, Patricia, ed. Lessons to be learnt for initiatives to promote cross-border collaboration: an experience in the New Aquitaine-Euskadi-Navarre euroregion. Universidad de Deusto, 2022. http://dx.doi.org/10.18543/xjrt7954.
Texto completoSawan, M. E., G. L. Kulcinski y D. L. Henderson. Nuclear Analysis for Near Term Fusion Devices. Office of Scientific and Technical Information (OSTI), abril de 2007. http://dx.doi.org/10.2172/901591.
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