Artículos de revistas sobre el tema "TCAD ANALYSIS"
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Wang, Ke, Haodong Jiang, Yiming Liao, Yue Xu, Feng Yan y Xiaoli Ji. "Degradation Prediction of GaN HEMTs under Hot-Electron Stress Based on ML-TCAD Approach". Electronics 11, n.º 21 (2 de noviembre de 2022): 3582. http://dx.doi.org/10.3390/electronics11213582.
Texto completoPan, Zijin, Cheng Li, Mengfu Di, Feilong Zhang y Albert Wang. "3D TCAD Analysis Enabling ESD Layout Design Optimization". IEEE Journal of the Electron Devices Society 8 (2020): 1289–96. http://dx.doi.org/10.1109/jeds.2020.3027034.
Texto completoGupta, Vaibhav. "Performance Analysis of TFET and VDSTFET for Low Power Application using the Work Function Engineering". International Journal for Research in Applied Science and Engineering Technology 9, n.º VI (25 de junio de 2021): 2722–27. http://dx.doi.org/10.22214/ijraset.2021.35534.
Texto completoKim, Won-Young, Gee Young Suh, Jin Won Huh, Sung-Han Kim, Min-ju Kim, Yun Seong Kim, Hye-Ryoun Kim et al. "Triple-Combination Antiviral Drug for Pandemic H1N1 Influenza Virus Infection in Critically Ill Patients on Mechanical Ventilation". Antimicrobial Agents and Chemotherapy 55, n.º 12 (3 de octubre de 2011): 5703–9. http://dx.doi.org/10.1128/aac.05529-11.
Texto completoPasseri, D., M. Baroncini, P. Ciampolini, G. M. Bilei, A. Santocchia, B. Checcucci y E. Fiandrini. "TCAD-based analysis of radiation-hardness in silicon detectors". IEEE Transactions on Nuclear Science 45, n.º 3 (junio de 1998): 602–8. http://dx.doi.org/10.1109/23.682456.
Texto completoScheinemann, Artur y Andreas Schenk. "TCAD-based DLTS simulation for analysis of extended defects". physica status solidi (a) 211, n.º 1 (enero de 2014): 136–42. http://dx.doi.org/10.1002/pssa.201300233.
Texto completoLi, Fuxing, Changchun Chai, Yuqian Liu, Yanxing Song, Lei Wang y Yintang Yang. "Study on ESD Protection Circuit by TCAD Simulation and TLP Experiment". Micromachines 14, n.º 3 (4 de marzo de 2023): 600. http://dx.doi.org/10.3390/mi14030600.
Texto completoHajj, Ibrahim N. "Extended Nodal Analysis". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 31, n.º 1 (enero de 2012): 89–100. http://dx.doi.org/10.1109/tcad.2011.2167330.
Texto completoJongyoon Jung y Taewhan Kim. "Variation-Aware False Path Analysis Based on Statistical Dynamic Timing Analysis". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 31, n.º 11 (noviembre de 2012): 1684–97. http://dx.doi.org/10.1109/tcad.2012.2202392.
Texto completoVytyaz, Igor, David C. Lee, Pavan Kumar Hanumolu, Un-Ku Moon y Kartikeya Mayaram. "Sensitivity Analysis for Oscillators". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 27, n.º 9 (septiembre de 2008): 1521–34. http://dx.doi.org/10.1109/tcad.2008.927731.
Texto completoKobayashi, Koji, Ryosuke Okuyama, Takeshi Kadono, Ayumi Onaka-Masada, Ryo Hirose, Akihiro Suzuki, Yoshihiro Koga, Koji Sueoka y Kazunari Kurita. "TEM Image Analysis and Simulation Physics for Two-Step Recrystallization of Discretely Amorphized C3H5-Molecular-Ion-Implanted Silicon Substrate Surface". Crystals 14, n.º 2 (24 de enero de 2024): 112. http://dx.doi.org/10.3390/cryst14020112.
Texto completoRigaud-Minet, Florian, Julien Buckley, William Vandendaele, Matthew Charles, Marie-Anne Jaud, Elise Rémont, Hervé Morel et al. "Capacitance Temperature Dependence Analysis of GaN-on-Si Power Transistors". Energies 15, n.º 19 (26 de septiembre de 2022): 7062. http://dx.doi.org/10.3390/en15197062.
Texto completoBoufouss, E., J. Alvarado y D. Flandre. "Compact modeling of the high temperature effect on the single event transient current generated by heavy ions in SOI 6T-SRAM". Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) 2010, HITEC (1 de enero de 2010): 000077–82. http://dx.doi.org/10.4071/hitec-eboufouss-ta25.
Texto completoVakili, Aref, Lucio Pancheri, Mahsa Farasat, Antonino La Magna, David Mascali y Matteo Bregoli. "Analysis of the performance of low gain avalanche diodes for future particle detectors". Journal of Instrumentation 18, n.º 07 (1 de julio de 2023): P07052. http://dx.doi.org/10.1088/1748-0221/18/07/p07052.
Texto completoBryant, R. E. "Boolean Analysis of MOS Circuits". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 6, n.º 4 (julio de 1987): 634–49. http://dx.doi.org/10.1109/tcad.1987.1270310.
Texto completoGnudi, A., P. Ciampolini, R. Guerrieri, M. Rudan y G. Baccarani. "Sensitivity Analysis for Device Design". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 6, n.º 5 (septiembre de 1987): 879–85. http://dx.doi.org/10.1109/tcad.1987.1270330.
Texto completoJianwen Zhu y S. Calman. "Context sensitive symbolic pointer analysis". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 24, n.º 4 (abril de 2005): 516–31. http://dx.doi.org/10.1109/tcad.2005.844092.
Texto completoVygen, J. "Slack in static timing analysis". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 25, n.º 9 (septiembre de 2006): 1876–85. http://dx.doi.org/10.1109/tcad.2005.858348.
Texto completoKouroussis, D., R. Ahmadi y F. N. Najm. "Voltage-Aware Static Timing Analysis". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 25, n.º 10 (octubre de 2006): 2156–69. http://dx.doi.org/10.1109/tcad.2005.860953.
Texto completoSinha, Debjit y Hai Zhou. "Statistical Timing Analysis With Coupling". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 25, n.º 12 (diciembre de 2006): 2965–75. http://dx.doi.org/10.1109/tcad.2006.882482.
Texto completoChoudhury, M. R. y K. Mohanram. "Reliability Analysis of Logic Circuits". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 28, n.º 3 (marzo de 2009): 392–405. http://dx.doi.org/10.1109/tcad.2009.2012530.
Texto completoYe, Zuochang, Zhenhai Zhu y Joel R. Phillips. "Incremental Large-Scale Electrostatic Analysis". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 28, n.º 11 (noviembre de 2009): 1641–53. http://dx.doi.org/10.1109/tcad.2009.2030267.
Texto completoFinder, Alexander, Andre Sulflow y Gorschwin Fey. "Latency Analysis for Sequential Circuits". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 33, n.º 4 (abril de 2014): 643–47. http://dx.doi.org/10.1109/tcad.2013.2292501.
Texto completoLu, Zhonghai y Xueqian Zhao. "xMAS-Based QoS Analysis Methodology". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 37, n.º 2 (febrero de 2018): 364–77. http://dx.doi.org/10.1109/tcad.2017.2706561.
Texto completoJung, Hakkee. "Analysis of Subthreshold Swing of Symmetric Junctionless Double Gate MOSFET Using Gaussian Doping Profile". International Journal of Emerging Technology and Advanced Engineering 12, n.º 1 (16 de enero de 2022): 23–30. http://dx.doi.org/10.46338/ijetae0122_03.
Texto completoJeong, Jee-Hun, Ogyun Seok y Ho-Jun Lee. "Analysis of Electrical Characteristics in 4H-SiC Trench-Gate MOSFETs with Grounded Bottom Protection p-Well Using Analytical Modeling". Applied Sciences 11, n.º 24 (18 de diciembre de 2021): 12075. http://dx.doi.org/10.3390/app112412075.
Texto completoHerrera-Moreno, Alfonso, José Luis García-Gervacio, Héctor Villacorta-Minaya y Héctor Vázquez-Leal. "TCAD analysis and modeling for NBTI mechanism in FinFET transistors". IEICE Electronics Express 15, n.º 14 (2018): 20180502. http://dx.doi.org/10.1587/elex.15.20180502.
Texto completoPetrosyants, K. O., A. A. Pugachev, I. A. Kharitinov y B. G. Lvov. "I-V- Characteristics analysis of betavoltaic microbatteries using TCAD model". Journal of Physics: Conference Series 1353 (noviembre de 2019): 012093. http://dx.doi.org/10.1088/1742-6596/1353/1/012093.
Texto completoWang, Jinghui, Padhraic L. Mulligan y Lei R. Cao. "Transient current analysis of a GaN radiation detector by TCAD". Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 761 (octubre de 2014): 7–12. http://dx.doi.org/10.1016/j.nima.2014.05.098.
Texto completoHanson, D. A., R. J. G. Goossens, M. Redford, J. McGinty, J. K. Kibarian y K. W. Michaels. "Analysis of mixed-signal manufacturability with statistical technology CAD (TCAD)". IEEE Transactions on Semiconductor Manufacturing 9, n.º 4 (1996): 478–88. http://dx.doi.org/10.1109/66.542163.
Texto completoFleury, C., G. Notermans, H. M. Ritter y D. Pogany. "TIM, EMMI and 3D TCAD analysis of discrete-technology SCRs". Microelectronics Reliability 76-77 (septiembre de 2017): 698–702. http://dx.doi.org/10.1016/j.microrel.2017.06.070.
Texto completoKenrow, J. A. "Characterization and Analysis of OFET Devices Based on TCAD Simulations". IEEE Transactions on Electron Devices 52, n.º 9 (septiembre de 2005): 2034–41. http://dx.doi.org/10.1109/ted.2005.854281.
Texto completoCeric, Hajdin, Orio de, Wolfhard Zisser y Siegfried Selberherr. "Microstructural impact on electromigration: A TCAD study". Facta universitatis - series: Electronics and Energetics 27, n.º 1 (2014): 1–11. http://dx.doi.org/10.2298/fuee1401001c.
Texto completoBlaauw, D., V. Zolotov y S. Sundareswaran. "Slope propagation in static timing analysis". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 21, n.º 10 (octubre de 2002): 1180–95. http://dx.doi.org/10.1109/tcad.2002.802274.
Texto completoVrudhula, S., D. T. Blaauw y S. Sirichotiyakul. "Probabilistic analysis of interconnect coupling noise". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 22, n.º 9 (septiembre de 2003): 1188–203. http://dx.doi.org/10.1109/tcad.2003.816212.
Texto completoHongliang Chang y S. S. Sapatnekar. "Statistical timing analysis under spatial correlations". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 24, n.º 9 (septiembre de 2005): 1467–82. http://dx.doi.org/10.1109/tcad.2005.850834.
Texto completoHaifeng Qian, S. R. Nassif y S. S. Sapatnekar. "Power grid analysis using random walks". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 24, n.º 8 (agosto de 2005): 1204–24. http://dx.doi.org/10.1109/tcad.2005.850863.
Texto completoTseng, K. y M. Horowitz. "False coupling exploration in timing analysis". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 24, n.º 11 (noviembre de 2005): 1795–805. http://dx.doi.org/10.1109/tcad.2005.852435.
Texto completoRuibing Lu y Cheng-Kok Koh. "Performance analysis of latency-insensitive systems". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 25, n.º 3 (marzo de 2006): 469–83. http://dx.doi.org/10.1109/tcad.2005.854636.
Texto completoZhang, M. y N. R. Shanbhag. "Soft-Error-Rate-Analysis (SERA) Methodology". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 25, n.º 10 (octubre de 2006): 2140–55. http://dx.doi.org/10.1109/tcad.2005.862738.
Texto completoMiskov-Zivanov, Natasa y Diana Marculescu. "Circuit Reliability Analysis Using Symbolic Techniques". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 25, n.º 12 (diciembre de 2006): 2638–49. http://dx.doi.org/10.1109/tcad.2006.882592.
Texto completoLasbouygues, Benoit, Robin Wilson, Nadine Azemard y Philippe Maurine. "Temperature- and Voltage-Aware Timing Analysis". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 26, n.º 4 (abril de 2007): 801–15. http://dx.doi.org/10.1109/tcad.2006.884860.
Texto completoJongeun Lee y Aviral Shrivastava. "Static Analysis of Register File Vulnerability". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 30, n.º 4 (abril de 2011): 607–16. http://dx.doi.org/10.1109/tcad.2010.2095630.
Texto completoMakarenko, D. D. y J. Tartar. "A Statistical Analysis of PLA Folding". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 5, n.º 1 (enero de 1986): 39–51. http://dx.doi.org/10.1109/tcad.1986.1270176.
Texto completoFeiten, Linus, Matthias Sauer, Tobias Schubert, Victor Tomashevich, Ilia Polian y Bernd Becker. "Formal Vulnerability Analysis of Security Components". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 34, n.º 8 (agosto de 2015): 1358–69. http://dx.doi.org/10.1109/tcad.2015.2448687.
Texto completoHua, Wenmian y Rajit Manohar. "Exact Timing Analysis for Asynchronous Systems". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 37, n.º 1 (enero de 2018): 203–16. http://dx.doi.org/10.1109/tcad.2017.2693268.
Texto completoBryant, R. E. "Algorithmic Aspects of Symbolic Switch Network Analysis". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 6, n.º 4 (julio de 1987): 618–33. http://dx.doi.org/10.1109/tcad.1987.1270309.
Texto completoGang Li y N. R. Aluru. "Efficient mixed-domain analysis of electrostatic MEMS". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 22, n.º 9 (septiembre de 2003): 1228–42. http://dx.doi.org/10.1109/tcad.2003.816210.
Texto completoHashimoto, M., Y. Yamada y H. Onodera. "Equivalent Waveform Propagation for Static Timing Analysis". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 23, n.º 4 (abril de 2004): 498–508. http://dx.doi.org/10.1109/tcad.2004.825858.
Texto completoRan, Y., A. Kondratyev, K. H. Tseng, Y. Watanabe y M. Marek-Sadowska. "Eliminating false positives in crosstalk noise analysis". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 24, n.º 9 (septiembre de 2005): 1406–19. http://dx.doi.org/10.1109/tcad.2005.850829.
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