Libros sobre el tema "Semiconductor metal interface"
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Bell, L. D. Evidence of momentum conservation at a nonepitaxial metal/semiconductor interface using ballistic electron emission microscopy. [Washington, DC: National Aeronautics and Space Administration, 1996.
Buscar texto completoBell, L. D. Evidence of momentum conservation at a nonepitaxial metal/semiconductor interface using ballistic electron emission microscopy. [Washington, DC: National Aeronautics and Space Administration, 1996.
Buscar texto completoA, Hiraki, ed. Metal-semiconductor interfaces. Tokyo, Japan: Ohmsha, 1995.
Buscar texto completoBatra, Inder P., ed. Metallization and Metal-Semiconductor Interfaces. Boston, MA: Springer US, 1989. http://dx.doi.org/10.1007/978-1-4613-0795-2.
Texto completoMunich), NATO Advanced Research Workshop on Metallization and Metal-Semiconductor Interfaces (1988 Technical University of. Metallization and metal-semiconductor interfaces. New York: Plenum Press, 1989.
Buscar texto completoBatra, Inder P. Metallization and Metal-Semiconductor Interfaces. Boston, MA: Springer US, 1989.
Buscar texto completoMaani, Colette. A study of some metal-semiconductor interfaces. [s.l: The Author], 1988.
Buscar texto completoSin, Wai-Cheong D. Effects of shock waves on metal-semiconductor interfaces. [S.l.]: [s.n.], 1989.
Buscar texto completoW, Wilmsen Carl, ed. Physics and chemistry of III-V compound semiconductor interfaces. New York: Plenum Press, 1985.
Buscar texto completoEynde, Frank Op't. Analog interfaces for digitalsignal processing systems. Boston: Kluwer, 1993.
Buscar texto completoMeeting, Materials Research Society y Symposium C, "CMOS Gate-Stack Scaling-- Materials, Interfaces and Reliability Implications" (2009 : San Francisco, Calif.), eds. CMOS gate-stack scaling-- materials, interfaces and reliability implications: Symposium held April 14-16, 2009, San Francisco, california, U.S.A. Warrendale, Pa: Materials Research Society, 2009.
Buscar texto completoC, Sansen Willy M., ed. Analog interfaces for digital signal processing systems. Boston: Kluwer Academic Publishers, 1993.
Buscar texto completoR, Abernathy C., Materials Research Society Meeting y Symposium on Fundamentals of Novel/Oxide Semiconductor Interfaces (2003 : Boston, Mass.), eds. Fundamentals of novel oxide/semiconductor interfaces: Symposium held December 1-4, 2003, Boston, Massachusetts, U.S.A. Warrendale, Pa: Materials Research Society, 2004.
Buscar texto completoUnimolecular and supramolecular electronics: Chemistry and physics meet at metal-molecule interfaces. Heidelberg: Springer, 2012.
Buscar texto completoSymposium, D. on Organic Materials for Electronics: Polymer Interfaces with Metals and Semiconductors (1994 Strasbourg France). Organic materials for electronics: Proceedings of Symposium D on Organic Materials for Electronics: Polymer Interfaces with Metals and Semiconductors of the 1994 E-MRS Spring Conference. Amsterdam: North-Holland, 1994.
Buscar texto completoSymposium D on Organic Materials for Electronics: Polymer Interfaces with Metals and Semiconductors (1994 Strasbourg, France). Organic materials for electronics: Proceedings of Symposium D on Organic Materials for Electronics: Polymer Interfaces with Metals and Semiconductors of the 1994 E-MRS Spring Conference, Strasbourg, France, May 24-27, 1994. Amsterdam: North-Holland, 1994.
Buscar texto completoChang, Yun-Shan. Investigation of interface properties and hot carrier degradation effects in silicon-on-insulator materials and devices. 1995.
Buscar texto completoHiraki, A. Metal-Semiconductor Interfaces,. Ios Pr Inc, 1995.
Buscar texto completoAndo, K. y E. Saitoh. Incoherent spin current. Oxford University Press, 2017. http://dx.doi.org/10.1093/oso/9780198787075.003.0002.
Texto completoMetallization and Metal-Semiconductor Interfaces. Springer, 2011.
Buscar texto completoBatra, Inder P. Metallization and Metal-Semiconductor Interfaces. Springer, 2011.
Buscar texto completoSchmickler, Wolfgang. Interfacial Electrochemistry. Oxford University Press, 1996. http://dx.doi.org/10.1093/oso/9780195089325.001.0001.
Texto completoBatra, Inder P. Metallization and Metal-Conductor Interfaces. Springer, 1989.
Buscar texto completoBasu, Prasanta Kumar, Bratati Mukhopadhyay y Rikmantra Basu. Semiconductor Nanophotonics. Oxford University PressOxford, 2022. http://dx.doi.org/10.1093/oso/9780198784692.001.0001.
Texto completoManoli, Yiannos y Dominic Maurath. CMOS Circuits for Electromagnetic Vibration Transducers: Interfaces for Ultra-Low Voltage Energy Harvesting. Springer Netherlands, 2016.
Buscar texto completoManoli, Yiannos y Dominic Maurath. CMOS Circuits for Electromagnetic Vibration Transducers: Interfaces for Ultra-Low Voltage Energy Harvesting. Springer London, Limited, 2015.
Buscar texto completoManoli, Yiannos y Dominic Maurath. CMOS Circuits for Electromagnetic Vibration Transducers: Interfaces for Ultra-Low Voltage Energy Harvesting. Springer, 2014.
Buscar texto completoManoli, Yiannos y Dominic Maurath. CMOS Circuits for Electromagnetic Vibration Transducers: Interfaces for Ultra-Low Voltage Energy Harvesting. Springer, 2014.
Buscar texto completoBill, Taylor, Alexander A. Demkov, H. Rusty Harris, Jeffery W. Butterbaugh y Willy Rachmady. CMOS Gate-Stack Scaling Vol. 1155: Materials, Interfaces and Reliability Implications. University of Cambridge ESOL Examinations, 2014.
Buscar texto completoBiocmos Interfaces And Codesign. Springer, 2012.
Buscar texto completoWang, Xiaolei y Shengkai Wang. MOS Interface Physics, Process and Characterization. Taylor & Francis Group, 2021.
Buscar texto completoWang, Xiaolei y Shengkai Wang. MOS Interface Physics, Process and Characterization. Taylor & Francis Group, 2021.
Buscar texto completoWang, Xiaolei y Shengkai Wang. MOS Interface Physics, Process and Characterization. Taylor & Francis Group, 2021.
Buscar texto completo(Editor), W. L. Mochan, ed. Proceedings of the International Workshop on Electrodynamics of Interfaces and Composite Systems: Taxco, Mexico Aug 10-14, 1987 (Advanced Series in). World Scientific Pub Co Inc, 1988.
Buscar texto completoVibrational Properties of Defective Oxides and 2D Nanolattices: Insights from First-Principles Simulations. Springer, 2014.
Buscar texto completoScalise, Emilio. Vibrational Properties of Defective Oxides and 2D Nanolattices: Insights from First-Principles Simulations. Springer International Publishing AG, 2016.
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