Libros sobre el tema "Secondary ion mass spectrometer"

van der Heide, Paul. Secondary Ion Mass Spectrometry. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2014. http://dx.doi.org/10.1002/9781118916780.

L, Bentz B. y Odom R. W, eds. Secondary ion mass spectrometry. Amsterdam: Elsevier, 1995.

Wilson, R. G. Secondary ion mass spectrometry. Chichester: Wiley, 1989.

Mahoney, Christine M., ed. Cluster Secondary Ion Mass Spectrometry. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2013. http://dx.doi.org/10.1002/9781118589335.

Benninghoven, Alfred, Richard J. Colton, David S. Simons y Helmut W. Werner, eds. Secondary Ion Mass Spectrometry SIMS V. Berlin, Heidelberg: Springer Berlin Heidelberg, 1986. http://dx.doi.org/10.1007/978-3-642-82724-2.

C, Vickerman J., Brown A. Alan y Reed Nicola M, eds. Secondary ion mass spectrometry: Principles and applications. Oxford: Clarendon Press, 1989.

A, Brown y Vickerman J. C, eds. Handbook of static secondary ion mass spectrometry. Chichester [West Sussex]: J. Wiley, 1989.

Hearn, Martin John. Polymer surface studies by secondary ion mass spectrometry. Leicester: Leicester Polytechnic, 1988.

G, Rüdenauer F. y Werner H. W, eds. Secondary ion mass spectrometry: Basic concepts, instrumental aspects, applications, and trends. New York: J. Wiley, 1987.

International Conference on Secondary Ion Mass Spectrometry (11th 1997 Orlando, Fla.). Secondary ion mass spectrometry, SIMS XI: Proceedings of the Eleventh International Conference on Secondary Ion Mass Spectrometry, Orlando, Florida, September 7-12th, 1997. Editado por Gillen G. Chichester: Wiley, 1998.

International Conference on Secondary Ion Mass Spectrometry (9th 1993 Yokahama). Secondary ion mass spectrometry: SIMS IX : proceedings of the Ninth International Conference on Secondary Ion Mass Spectrometry (SIMS IX)...,7-12 November 1993. Editado por Benninghoven A. 1932-. Chichester: Wiley, 1994.

Mai, H. Investigation of the sampling volume in secondary ion microanalysis. Dresden: Akademie der Wissenschaften der DDR, Zentralinstitut für Festkörperphysik und Werkstofforschung, 1986.

International Conference on Secondary Ion Mass Spectrometry (8th 1991 Amsterdam,Netherlands). Secondary ion mass spectrometry: SIMS VIII : proceedings of the eighth International Conference on Secondary Ion Mass Spectrometry, Amsterdam, the Netherlands, September 15-20 1991. Editado por Benninghoven A. 1932-. Chichester: Wiley, 1992.

International Conferenceon Secondary Ion Mass Spectrometry (7th 1989 California, USA). Secondary ion mass spectrometry SIMS VII: Proceedings of the seventh International Conference on Secondary Ion Mass Spectrometry (SIMS VII), Hyatt Regency Hotel, Monterey, California, USA, September 3rd-8th, 1989. Editado por Benninghoven A. 1932-. Chichester: Wiley, 1990.

International Conference on Secondary Ion Mass Spectrometry (10th 1995 Muenster, Germany). Secondary ion mass spectrometry, SIMS X: Proceedings of the Tenth International Conference on Secondary Ion Mass Spectrometry (SIMS X), University of Muenster, Muenster, Germany, October 1-6th, 1995. Editado por Benninghoven A, Hagenhoff B y Werner H. W. Chichester: Wiley, 1997.

G, Wilson Robert. Secondary ion mass spectrometry: A practical handbook for depth profiling and bulk impurity analysis. New York: Wiley, 1989.

Fayek, Mostafa. Secondary ion mass spectrometry in the earth sciences: Gleaning the big picture from a small spot. Toronto: Mineralogical Association of Canada, 2009.

International, Conference on Secondary Ion Mass Spectrometry (6th 1987 Versailles France). Secondary ion mass spectrometry: SIMS VI: proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry, Palais des Congrès, Versailles, Paris, France, September 13-18th, 1987. Chichester: Wiley, 1988.

Vargas-Aburto, Carlos. Development of a quadrupole-based secondary-ion mass spectrometry (SIMS) system at Lewis Research Center. [Washington, D.C.]: NASA, 1990.

R, Aron Paul, Liff Dale Russell y United States. National Aeronautics and Space Administration., eds. Development of a quadrupole-based secondary-ion mass spectrometry (SIMS) system at Lewis Research Center. [Washington, D.C.]: NASA, 1990.

Fox, Harvey Stuart. A study of shallow implants in silicon by secondary ion mass spectrometry. [s.l.]: typescript, 1989.

A, Hedin, Sundqvist B. U. R y Benninghoven A. 1932-, eds. Ion Formation from Organic Solids (IFOS V). Chichester: Wiley, 1990.

International Conference on Secondary Ion Mass Spectrometry (5th 1985 Washington, D.C.). Secondary ion mass spectrometry: SIMS V : proceedings of the fifth international conference, Washington, DC, September 30-October 4, 1985. Editado por Benninghoven A. Berlin: Springer-Verlag, 1986.

International Conference on Secondary Ion Mass Spectrometry. (7th 1989 Monterey, Calif.). Secondary ion mass spectrometry: SIMS VII: proceedings of the seventh International Conference on Secondary Ion Mass Spectrometry (SIMS VII), Hyatt Regency Hotel, Monterey, California, USA, September 3rd-4th, 1989. Editado por Benninghoven A, Huber Alfred 1918- y Werner H. W. Chichester: Wiley, 1990.

1930-, Czanderna Alvin Warren y Hercules David M, eds. Ion spectroscopies for surface analysis. New York: Plenum Press, 1991.

Iro, J. E. Static secondary ion mass spectrometry studies of complex toxic substances adsorbed on different subtrates. Manchester: UMIST, 1998.

Cooke, Graham Alan. The development of secondary ion mass spectrometry for two-dimensional impurity profiling in semiconductors. [s.l.]: typescript, 1992.

Czanderna, A. W. Ion Spectroscopies for Surface Analysis. Boston, MA: Springer US, 1991.

Heller-Krippendorf, Danica. Multivariate Data Analysis for Root Cause Analyses and Time-of-Flight Secondary Ion Mass Spectrometry. Wiesbaden: Springer Fachmedien Wiesbaden, 2019. http://dx.doi.org/10.1007/978-3-658-28502-9.

A, Hedin, Sundqvist B. U. R, Benninghoven A, Naturvetenskapliga forskningsrådet (Sweden), Nordic Committee for Accelerator Based Research. y International Conference on Ion Formation from Organic Solids (5th : 1989 : Lövånger, Sweden), eds. Ion formation from organic solids (IFOS V): Proceedings of the fifth international conference, Lövånger, Sweden, June 18-21, 1989. Chichester [England]: Wiley, 1990.

A, Benninghoven, ed. Ion formation from organic solids (IFOS III): Mass spectrometry of involatile material : proceedings of the third international conference, Münster, Fed. Rep. of Germany, September 16-18, 1985. Berlin: Springer-Verlag, 1986.

International Conference On Ion Formation from Organic Solids(IFOS IV) (4th 1987 Münster). Ion formation from organic solids (IFOS IV): Mass spectrometry of involatile material : proceedings of the Fourth International Conference, Münster, Federal Republic of Germany,September 21-23, 1987. Editado por Benninghoven A. 1932-. Chichester: Wiley, 1989.

Pouch, John J. Auger electron spetroscopy, secondary ion mass spectrometry and optical characterization of a-C:H and BN films. [Cleveland, Ohio: National Aeronautics and Space Administration, Lewis Research Center, 1986.

H, Zou y AECL Research, eds. The solid solubility of Ni and Co in [alpha]-Zr: A secondary Ion mass spectrometry study. Chalk River, Ontario, Canada: Reactor Materials Research Branch, Chalk River Laboratories, 1995.

1945-, Lyon Philip A. y American Chemical Society, eds. Desorption mass spectrometry: Are SIMS and FAB the same? Washington, D.C: American Chemical Society, 1985.

Herridge, D. A static secondary ion mass spectrometry (SSIMS) investigation of hetrogeneous reactions on simulated polar stratospheric cloud particles. Manchester: UMIST, 1997.

United States. National Aeronautics and Space Administration., ed. Analylsis of LDEF experiment AO137-2: Chemically and isotopic measurements of micrometeroids by secondary ion mass spectrometry. [Washington, DC: National Aeronautics and Space Administration, 1992.

G, Newman John y Hohlt Teresa A, eds. Static SIMS handbook of polymer analysis: A reference book of standard data for identification and interpretation of static SIMS data. Eden Prairie, Minn: Perkin-Elmer Corp., Physical Electronics Division, 1991.

International Conference on Secondary Ion Mass Spectrometry (5th 1985 Washington, DC). Secondary ion mass spectrometry SIMS V: Proceedings of the Fifth International Conference, Washington, DC, September 30 - October 4, 1985. Berlin: Springer, 1986.

J, Verlinden, Commission of the European Communities. Directorate-General for Science, Research and Development. y Commission of the European Communities. Joint Research Centre., eds. Rhenium filaments: Investigation of their purity by spark source and secondary ion mass spectrometry, their purification by thermal treatment. Luxembourg: Commission of the European Communities Directorate-General Information Market and Innovation, 1985.

Grasserbauer, M. Angewandte Oberflächenanalyse: Mit SIMS Sekundär-Ionen-Massenspektrometrie, AES Auger-Elektronen-Spektrometrie, XPS Röntgen-Photoelektronen-Spektrometrie. Berlin: Springer-Verlag, 1986.

Cherepin, Valentin Tikhonovich. Ionnyĭ mikrozondovyĭ analiz. Kiev: Nauk. dumka, 1992.

Surface analysis of polymers by XPS and static SIMS. Cambridge, U.K: Cambridge University Press, 1998.

United States. National Aeronautics and Space Administration., ed. Ion mass spectrometer experiment for ISIS-II spacecraft: Final report. [Washington, DC: National Aeronautics and Space Administration, 1987.

(Editor), A. Benninghoven, C. A. Evans (Editor), K. D. McKeegan (Editor), H. A. Storms (Editor) y H. W. Werner (Editor), eds. Secondary Ion Mass Spectrometry. John Wiley and Sons Ltd, 1990.

International Conference on Secondary Ion Mass Spectrometry (6th 1987 Versailles, France). Secondary ion mass spectrometry. Editado por Benninghoven A. 1932-, Huber Alfred 1918- y Werner H. W. Wiley, 1988.

FEARN, Shard. Secondary Ion Mass Spectrometry Its Aphb. Institute of Physics Publishing, 2022.

(Editor), A. Benninghoven, B. Hagenhoff (Editor) y H. W. Werner (Editor), eds. Secondary Ion Mass Spectrometry: SIMS X. John Wiley & Sons Ltd (Import), 1997.

Gillen, Edited by: G. Secondary Ion Mass Spectrometry SIMS XI. Wiley, 1998.

Benninghoven, A., R. Shimizu y Y. Nihei. Secondary Ion Mass Spectrometry: SIMS IX. John Wiley & Sons, 1994.