Artículos de revistas sobre el tema "Scanning Tunneling Microscopy [Tool]"
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Chiang, Shirley y Robert J. Wilson. "Scanning Tunneling Microscopy: A Surface Structural Tool". Analytical Chemistry 59, n.º 21 (noviembre de 1987): 1267A—1270A. http://dx.doi.org/10.1021/ac00148a748.
Texto completoStemmer, A., A. Engel, R. Häring, R. Reichelt y U. Aebi. "Scanning tunneling microscopy of biomacromolecules". Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 444–45. http://dx.doi.org/10.1017/s0424820100104285.
Texto completoDenley, D. R. "Practical applications of scanning tunneling microscopy". Proceedings, annual meeting, Electron Microscopy Society of America 47 (6 de agosto de 1989): 18–19. http://dx.doi.org/10.1017/s0424820100152069.
Texto completovan de Walle, G. F. A., B. J. Nelissen, L. L. Soethout y H. van Kempen. "Scanning tunneling microscopy: A powerful tool for surface analysis". Fresenius' Zeitschrift für analytische Chemie 329, n.º 2-3 (enero de 1987): 108–12. http://dx.doi.org/10.1007/bf00469119.
Texto completoRohrer, H. "Scanning tunneling microscopy: a surface science tool and beyond". Surface Science 299-300 (enero de 1994): 956–64. http://dx.doi.org/10.1016/0039-6028(94)90709-9.
Texto completoBracker, CE y P. K. Hansma. "Scanning tunneling microscopy and atomic force microscopy: New tools for biology". Proceedings, annual meeting, Electron Microscopy Society of America 47 (6 de agosto de 1989): 778–79. http://dx.doi.org/10.1017/s0424820100155864.
Texto completoEdel’man, V. S. "The scanning tunneling microscopy combined with the scanning electron microscopy—A tool for the nanometry". Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 9, n.º 2 (marzo de 1991): 618. http://dx.doi.org/10.1116/1.585471.
Texto completoBetzig, E., M. Isaacson, H. Barshatzky, K. Lin y A. Lewis. "Progress in near-field scanning optical microscopy (NSOM)". Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 436–37. http://dx.doi.org/10.1017/s0424820100104248.
Texto completoElings, Virgil. "Scanning probe microscopy: A new technology takes off". Proceedings, annual meeting, Electron Microscopy Society of America 48, n.º 3 (12 de agosto de 1990): 959. http://dx.doi.org/10.1017/s0424820100162363.
Texto completoXIE, XIAN NING, HONG JING CHUNG y ANDREW THYE SHEN WEE. "SCANNING PROBE MICROSCOPY BASED NANOSCALE PATTERNING AND FABRICATION". COSMOS 03, n.º 01 (noviembre de 2007): 1–21. http://dx.doi.org/10.1142/s0219607707000207.
Texto completoSONG, SHAOTANG, JIE SU, XINNAN PENG, XINBANG WU y MYKOLA TELYCHKO. "RECENT ADVANCES IN BOND-RESOLVED SCANNING TUNNELING MICROSCOPY". Surface Review and Letters 28, n.º 08 (25 de marzo de 2021): 2140007. http://dx.doi.org/10.1142/s0218625x21400072.
Texto completoMcCord, M. A. y R. F. W. Pease. "Scanning tunneling microscope as a micromechanical tool". Applied Physics Letters 50, n.º 10 (9 de marzo de 1987): 569–70. http://dx.doi.org/10.1063/1.98137.
Texto completoYu, Edward T. "Cross-Sectional Scanning Tunneling Microscopy of Semiconductor Heterostructures". MRS Bulletin 22, n.º 8 (agosto de 1997): 22–26. http://dx.doi.org/10.1557/s0883769400033765.
Texto completoFarrell, H. H. y M. Levinson. "Scanning tunneling microscope as a structure-modifying tool". Physical Review B 31, n.º 6 (15 de marzo de 1985): 3593–98. http://dx.doi.org/10.1103/physrevb.31.3593.
Texto completoReiss, G. y H. Brückl. "Electronic transport in metallic films — a tool for scanning tunneling microscopy investigations". Superlattices and Microstructures 11, n.º 2 (enero de 1992): 171–74. http://dx.doi.org/10.1016/0749-6036(92)90245-z.
Texto completoGarcía-García, Ricardo y Juan JoséSáenz. "Is scanning tunneling microscopy a useful tool for probing the surface potential?" Surface Science Letters 251-252 (julio de 1991): A320. http://dx.doi.org/10.1016/0167-2584(91)90859-p.
Texto completoGarcía-García, Ricardo y Juan José Sáenz. "Is scanning tunneling microscopy a useful tool for probing the surface potential?" Surface Science 251-252 (julio de 1991): 223–27. http://dx.doi.org/10.1016/0039-6028(91)90986-3.
Texto completoVang, Ronnie T., Jeppe V. Lauritsen, Erik Lægsgaard y Flemming Besenbacher. "Scanning tunneling microscopy as a tool to study catalytically relevant model systems". Chemical Society Reviews 37, n.º 10 (2008): 2191. http://dx.doi.org/10.1039/b800307f.
Texto completoLiu, J. B., Boyd Clark y R. M. Fisher. "Applications of Scanning Tunneling Microscopy in the Materials Characterization Laboratory". Proceedings, annual meeting, Electron Microscopy Society of America 48, n.º 1 (12 de agosto de 1990): 316–17. http://dx.doi.org/10.1017/s0424820100180331.
Texto completoMack, James F., Philip B. Van Stockum, Hitoshi Iwadate y Fritz B. Prinz. "A combined scanning tunneling microscope–atomic layer deposition tool". Review of Scientific Instruments 82, n.º 12 (diciembre de 2011): 123704. http://dx.doi.org/10.1063/1.3669774.
Texto completoShedd, G. M. y P. Russell. "The scanning tunneling microscope as a tool for nanofabrication". Nanotechnology 1, n.º 1 (1 de julio de 1990): 67–80. http://dx.doi.org/10.1088/0957-4484/1/1/012.
Texto completoHesjedal, T. "Scanning acoustic tunneling microscopy and spectroscopy: A probing tool for acoustic surface oscillations". Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 15, n.º 4 (julio de 1997): 1569. http://dx.doi.org/10.1116/1.589402.
Texto completoÁvila Bernal, Alba Graciela y Ruy Sebastián Bonilla Osorio. "A study of surfaces using a scanning tunneling microscope (STM)". Ingeniería e Investigación 29, n.º 3 (1 de septiembre de 2009): 121–27. http://dx.doi.org/10.15446/ing.investig.v29n3.15194.
Texto completoHsu, Julia W. P. "Semiconductor Defect Studies Using Scanning Probes". Microscopy and Microanalysis 6, S2 (agosto de 2000): 704–5. http://dx.doi.org/10.1017/s1431927600036011.
Texto completoJoy, David C. "The Resolution of the SEM". Microscopy and Microanalysis 3, S2 (agosto de 1997): 1173–74. http://dx.doi.org/10.1017/s1431927600012757.
Texto completoChernoff, Donald A. "Atomic-force microscopy: Exotic invention or practical tool?" Proceedings, annual meeting, Electron Microscopy Society of America 51 (1 de agosto de 1993): 526–27. http://dx.doi.org/10.1017/s0424820100148460.
Texto completoSchönenberger, C., S. F. Alvarado y C. Ortiz. "Scanning tunneling microscopy as a tool to study surface roughness of sputtered thin films". Journal of Applied Physics 66, n.º 9 (noviembre de 1989): 4258–61. http://dx.doi.org/10.1063/1.343967.
Texto completoJu, Bing-Feng, Wu-Le Zhu, Shunyao Yang y Keji Yang. "Scanning tunneling microscopy-basedin situmeasurement of fast tool servo-assisted diamond turning micro-structures". Measurement Science and Technology 25, n.º 5 (14 de marzo de 2014): 055004. http://dx.doi.org/10.1088/0957-0233/25/5/055004.
Texto completoFisher, Knute A. "Scanned Probe Microscopy: Past, present, and future". Proceedings, annual meeting, Electron Microscopy Society of America 50, n.º 1 (agosto de 1992): 18–19. http://dx.doi.org/10.1017/s0424820100120497.
Texto completoDrost, Robert, Maximilian Uhl, Piotr Kot, Janis Siebrecht, Alexander Schmid, Jonas Merkt, Stefan Wünsch et al. "Combining electron spin resonance spectroscopy with scanning tunneling microscopy at high magnetic fields". Review of Scientific Instruments 93, n.º 4 (1 de abril de 2022): 043705. http://dx.doi.org/10.1063/5.0078137.
Texto completoBilger, R., H. J. Cantow, J. Heinze y S. Magonov. "Scanning tunneling microscope images of doped polypyrrole on ITO glass". Proceedings, annual meeting, Electron Microscopy Society of America 47 (6 de agosto de 1989): 16–17. http://dx.doi.org/10.1017/s0424820100152057.
Texto completoRatner, Buddy D., Reto Luginbühll, Rene Overney, Michael Garrison y Thomas Boland. "Recognition, Specificity, Scanning Probe Microscopy and Biomaterials". Microscopy and Microanalysis 7, S2 (agosto de 2001): 130–31. http://dx.doi.org/10.1017/s1431927600026726.
Texto completoBonnell, Dawn A. y Qian Zhong. "Local geometric and electronic structure of oxides using scanning tunneling microscopy/spectroscopy". Proceedings, annual meeting, Electron Microscopy Society of America 50, n.º 2 (agosto de 1992): 1480–81. http://dx.doi.org/10.1017/s0424820100132030.
Texto completoYao, J. E. y G. Y. Shang. "A Simple Scanning Tunneling Microscope with Very Wide Scanning Range". Proceedings, annual meeting, Electron Microscopy Society of America 48, n.º 1 (12 de agosto de 1990): 314–15. http://dx.doi.org/10.1017/s042482010018032x.
Texto completoWang, Xuewen, Xuexia He, Hongfei Zhu, Linfeng Sun, Wei Fu, Xingli Wang, Lai Chee Hoong et al. "Subatomic deformation driven by vertical piezoelectricity from CdS ultrathin films". Science Advances 2, n.º 7 (julio de 2016): e1600209. http://dx.doi.org/10.1126/sciadv.1600209.
Texto completoKossakovski, Dmitri A., John D. Baldeschwieler y J. L. Beauchamp. "Chemical Imaging With a Scanning Probe Microscope". Microscopy and Microanalysis 5, S2 (agosto de 1999): 970–71. http://dx.doi.org/10.1017/s1431927600018171.
Texto completoRevel, Jean-Paul. "Attaboy! Attoboys, or the new Zeptoscopists". Microscopy Today 1, n.º 8 (diciembre de 1993): 2–3. http://dx.doi.org/10.1017/s1551929500069029.
Texto completoLi, Weixuan, Jihao Wang, Jing Zhang, Wenjie Meng, Caihong Xie, Yubin Hou, Zhigang Xia y Qingyou Lu. "Atomic-Resolution Imaging of Micron-Sized Samples Realized by High Magnetic Field Scanning Tunneling Microscopy". Micromachines 14, n.º 2 (22 de enero de 2023): 287. http://dx.doi.org/10.3390/mi14020287.
Texto completoWang, Meng-Jiao, Siegfried Wolff y Burkhard Freund. "Filler-Elastomer Interactions. Part XI. Investigation of the Carbon-Black Surface by Scanning Tunneling Microscopy". Rubber Chemistry and Technology 67, n.º 1 (1 de marzo de 1994): 27–41. http://dx.doi.org/10.5254/1.3538665.
Texto completoRakovan, John y F. Hochella Michael. "Heterogeneous Oxidation and Precipitation of Aqueous Mn(II) at the Goethite Surface: A SPM Study". Microscopy and Microanalysis 4, S2 (julio de 1998): 600–601. http://dx.doi.org/10.1017/s1431927600023126.
Texto completoAle Crivillero, Maria Victoria, Jean C. Souza, Vicky Hasse, Marcus Schmidt, Natalya Shitsevalova, Slavomir Gabáni, Konrad Siemensmeyer, Karol Flachbart y Steffen Wirth. "Detection of Surface States in Quantum Materials ZrTe2 and TmB4 by Scanning Tunneling Microscopy". Condensed Matter 8, n.º 1 (16 de enero de 2023): 9. http://dx.doi.org/10.3390/condmat8010009.
Texto completoBogy, D. B. "Surface Modification and Measurement Using a Scanning Tunneling Microscope With a Diamond Tip". Journal of Tribology 114, n.º 3 (1 de julio de 1992): 493–98. http://dx.doi.org/10.1115/1.2920910.
Texto completoBarbier, Luc y Denis Gratias. "High resolution scanning tunneling microscopy studies of quasicrystal surfaces: an efficient tool to investigate quasiperiodic atomic structures". Progress in Surface Science 75, n.º 3-8 (agosto de 2004): 177–89. http://dx.doi.org/10.1016/j.progsurf.2004.05.006.
Texto completoKelly, Thomas F., Keith Thompson, Emmanuelle A. Marquis y David J. Larson. "Atom Probe Tomography Defines Mainstream Microscopy at the Atomic Scale". Microscopy Today 14, n.º 4 (julio de 2006): 34–41. http://dx.doi.org/10.1017/s1551929500050264.
Texto completoHuang, Haiming, Mingming Shuai, Yulong Yang, Rui Song, Yanghui Liao, Lifeng Yin y Jian Shen. "Cryogen free spin polarized scanning tunneling microscopy and magnetic exchange force microscopy with extremely low noise". Review of Scientific Instruments 93, n.º 7 (1 de julio de 2022): 073703. http://dx.doi.org/10.1063/5.0095271.
Texto completoWang, X., A. P. Liu y X. H. Yang. "System design and new applications for atomic force microscope based on tunneling". International Journal of Modern Physics B 29, n.º 25n26 (14 de octubre de 2015): 1542039. http://dx.doi.org/10.1142/s0217979215420394.
Texto completoDe Feyter, Steven, André Gesquière, Mohamed M. Abdel-Mottaleb, Petrus C. M. Grim, Frans C. De Schryver, Christian Meiners, Michel Sieffert, Suresh Valiyaveettil y Klaus Müllen. "Scanning Tunneling Microscopy: A Unique Tool in the Study of Chirality, Dynamics, and Reactivity in Physisorbed Organic Monolayers". Accounts of Chemical Research 33, n.º 8 (agosto de 2000): 520–31. http://dx.doi.org/10.1021/ar970040g.
Texto completoChen, Kui, Wenkai Xiao, Zhengwu Li, Jiasheng Wu, Kairong Hong y Xuefeng Ruan. "Effect of Graphene and Carbon Nanotubes on the Thermal Conductivity of WC–Co Cemented Carbide". Metals 9, n.º 3 (24 de marzo de 2019): 377. http://dx.doi.org/10.3390/met9030377.
Texto completoCui, Daling, Jennifer M. MacLeod y Federico Rosei. "Probing functional self-assembled molecular architectures with solution/solid scanning tunnelling microscopy". Chemical Communications 54, n.º 75 (2018): 10527–39. http://dx.doi.org/10.1039/c8cc04341h.
Texto completoJeon, Sangjun, Yonglong Xie, Jian Li, Zhijun Wang, B. Andrei Bernevig y Ali Yazdani. "Distinguishing a Majorana zero mode using spin-resolved measurements". Science 358, n.º 6364 (12 de octubre de 2017): 772–76. http://dx.doi.org/10.1126/science.aan3670.
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